JPS6248556B2 - - Google Patents
Info
- Publication number
- JPS6248556B2 JPS6248556B2 JP8754182A JP8754182A JPS6248556B2 JP S6248556 B2 JPS6248556 B2 JP S6248556B2 JP 8754182 A JP8754182 A JP 8754182A JP 8754182 A JP8754182 A JP 8754182A JP S6248556 B2 JPS6248556 B2 JP S6248556B2
- Authority
- JP
- Japan
- Prior art keywords
- analyzer
- parts
- light
- component
- facing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sorting Of Articles (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
本発明は移送される部品の表裏判別方法に関す
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for determining the front and back sides of parts to be transferred.
この種の判別方法には例えば、第1図、第2A
図及び第2B図に示す方法がある。図において検
光装置1が部品移送路2の上方に配設され、その
発光素子1aからの光線が直下を移送される部品
3に投射される。移送路2は例えば振動部品供給
機のトラツクであり、矢印aで示すようにこの振
動により部品3は第1図において左方へと移送さ
れる。例示される部品3は可変抵抗装置に用いら
れる抵抗素子であつて、茶色のベークライト板3
aの表面にΩ状の錫メツキ3bが施されている。
従つて、この部品3では錫メツキ3b部分が光反
射部とされ、その他のベークライト部分3aが光
非反射部とされている。検光装置1は線C−Cの
直上方に配設され、表向きの部品3が第2A図に
示すように検光装置1の下方を通過するときには
錫メツキ3b部分に投射された光は反射して検光
装置1の感光素子1bに至り、これにより検光装
置1はその下方にある部品3が表向きであること
を検知する。また第2B図に示すように部品3が
裏向きで検光装置1の下方に移送されて来たとき
には、発光素子1aからの光線は部品3に投射さ
れるが、殆んど反射されることなく、感光素子1
bは殆んど反射光を受けない。これにより検光装
置1はその下方にある部品1が裏向きであること
を検知する。 This type of discrimination method includes, for example, Fig. 1, 2A
There is a method shown in Fig. and Fig. 2B. In the figure, an analyzer 1 is disposed above a component transfer path 2, and a light beam from its light emitting element 1a is projected onto a component 3 being transferred directly below. The transfer path 2 is, for example, a track of a vibrating component feeder, and the vibrations cause the component 3 to be transferred to the left in FIG. 1, as indicated by arrow a. The illustrated component 3 is a resistance element used in a variable resistance device, and is a brown Bakelite plate 3.
Ω-shaped tin plating 3b is applied to the surface of a.
Therefore, in this component 3, the tin-plated portion 3b is a light-reflecting portion, and the other Bakelite portion 3a is a non-light-reflecting portion. The analyzer 1 is disposed directly above the line C-C, and when the front-facing component 3 passes below the analyzer 1 as shown in FIG. 2A, the light projected onto the tin plated portion 3b is reflected. The light then reaches the photosensitive element 1b of the analyzer 1, whereby the analyzer 1 detects that the component 3 located below it is facing up. Furthermore, when the component 3 is transferred face down below the analyzer 1 as shown in FIG. 2B, the light beam from the light emitting element 1a is projected onto the component 3, but most of it is reflected. No, photosensitive element 1
b receives almost no reflected light. Thereby, the analyzer 1 detects that the component 1 below it is face down.
なお、移送路2自体もその表面性状に応じて一
定の光反射度を有するが、部品3の反射度と区別
できるようにしておけばよく、場合によつては移
送路2の表面を黒く塗るか、凹みを設けるかすれ
ばよい。あるいは、部品3が検光装置1の直下方
に来たことを何らかの方法で検知して、これによ
り検光装置1を作動可能とするようにしてもよ
い。これらには種々の公知の手段がある。 Note that the transfer path 2 itself has a certain degree of light reflection depending on its surface properties, but it is sufficient to make it distinguishable from the reflectance of the component 3, and in some cases, the surface of the transfer path 2 may be painted black. Alternatively, you can create a recess. Alternatively, the fact that the component 3 has come directly below the analyzer 1 may be detected by some method, thereby enabling the analyzer 1 to operate. There are various known means for these.
然しながら、常に以上述べたように部品3の表
裏が判別できればよいが、実際には部品3が裏向
きであつても部品3のエツヂのところで光が反射
して、感光素子1bに投光されたり、あるいは部
品表面の傷などで反射されることがある。また部
品3の傾きなどによつても非反射部とされる部分
から反射されたり、反射部とされる部分からの反
射光が感光素子1bに投射されない場合がある。
このような場合、部品3の表裏が誤つて判断され
ることになる。 However, as described above, it is only necessary to be able to distinguish between the front and back sides of the component 3, but in reality, even if the component 3 is face down, light may be reflected at the edge of the component 3 and projected onto the photosensitive element 1b. , or may be reflected by scratches on the surface of parts. Furthermore, due to the inclination of the component 3, light may be reflected from a non-reflective portion or reflected light from a reflective portion may not be projected onto the photosensitive element 1b.
In such a case, the front and back sides of the component 3 will be incorrectly determined.
検光装置1の検光出力は矢印bで示すように、
部品排除手段もしくは表裏矯正手段に供給される
が、表裏の判別が誤つていると、排除すべき部品
がそのまゝ次工程に供給されたり、誤つて矯正し
たりすることになる。結局、所望の姿勢での部品
の供給能率が低下する。 The analysis output of the analyzer 1 is as shown by arrow b.
The parts are supplied to the parts removing means or the front and back correcting means, but if the front and back sides are incorrectly determined, the parts to be removed may be fed as they are to the next process or may be erroneously corrected. As a result, the efficiency of supplying parts in desired orientations is reduced.
本発明は上述の点に鑑みてなされ、常に正確に
部品の表裏を判別することのできる、移送される
部品の表裏判別方法を提供することを目的とす
る。この目的は本発明によれば、部品移送路の上
方に部品の光反射部からの反射光を受光する検光
手段を配設し、該部品が表面を上方に向けて前記
検光手段の下方を通過したときに得られる前記検
光手段の受光回数と、該部品が裏面を上方に向け
て前記検光手段の下方を通過したときに得られる
前記検光手段の受光回数とのヒストグラムを多数
の表向き及び裏向きの部品につき予め作成し、こ
れにより表向きと裏向きの部品の反射部からの反
射光の前記検光素子の受光回数のしきい値を求
め、このしきい値より受光回数が大きいか小さい
かにより部品の表裏を判別するようにしたことを
特徴とする移送される部品の表裏判別方法、によ
つて達成される。 The present invention has been made in view of the above-mentioned points, and an object of the present invention is to provide a method for determining the front and back sides of transferred parts, which can always accurately determine the front and back sides of parts. According to the present invention, this object is achieved by disposing a light analyzer for receiving reflected light from a light reflecting portion of a component above a component transfer path, and with the surface of the component facing upward, a light analyzer is provided below the light analyzer. A histogram of the number of times the light is received by the analyzer when the part passes through the analyzer, and the number of times the analyzer receives the light when the part passes under the analyzer with the back side facing upward. A threshold value for the number of times the analyzer receives light reflected from the reflective parts of the front and back parts is determined, and the number of times the light is received is determined from this threshold value. This is achieved by a method for determining the front and back sides of parts to be transported, which is characterized in that the front and back sides of parts are determined based on whether they are large or small.
以下、本発明の実施例につき図面を参照して説
明する。なお、第3図以下は本発明の実施例を示
すが、第1〜第2B図に対応する部分については
同一の符号を付すものとする。 Embodiments of the present invention will be described below with reference to the drawings. Note that although FIG. 3 and subsequent figures show embodiments of the present invention, parts corresponding to those in FIGS. 1 to 2B are given the same reference numerals.
第3図は本発明の第1実施例を示すが、本実施
例では、移送路2の中心線C−Cから側方に片寄
つたD−D線の直上方に検光装置1が配設され
る。従つて、理想的には表向きの部品3が検光装
置1の下方を通過するときに、錫メツキ部3bの
X、Y、Zの3箇所から反射光を感光素子1bが
受光するはずである。また裏向きの部品3につい
ては一回も反射光を受光しないはずである。 FIG. 3 shows a first embodiment of the present invention. In this embodiment, the analyzer 1 is disposed directly above the line D-D which is offset laterally from the center line C-C of the transfer path 2. be done. Therefore, ideally, when the front-facing component 3 passes below the analyzer 1, the photosensitive element 1b should receive reflected light from the three locations X, Y, and Z of the tin-plated portion 3b. . Furthermore, the component 3 facing down should not receive reflected light even once.
然しながら実際には、上述の理由により100%
表向きの部品3については3回、裏向きの部品3
については零回、受光するとは限らない。そこで
本発明によれば、実際に多数の表向き、裏向きの
部品3について検光装置1の受光検知回数がテス
トされ、各々についてヒストグラムが作成され
る。第4図はその一例であるが、図においてハツ
チをした棒グラフは裏向きの部品3についてゞあ
り、ハツチをしない棒グラフは表向きの部品3に
ついてである。予想されるように裏向きの部品3
のうち大部分は受光検知回数は0回であり、表向
きの部品3のうち大部分は受光検知回数は3回で
ある。そして1回、2回、4回についてもそれぞ
れの個数が観測されるが、2回が表か裏かのしき
い値であることが理解される。また僅差である
が、2回受光検知回数は表向きの部品3の方が多
いので、2回以上を表向きと判断され、1回以下
を裏向きと判別される。従つて検知装置1の受光
出力回数が1個の部品について2回以上であれば
表向きと判別され、1回以下であれば裏向きと判
別される。 However, in reality, due to the reasons mentioned above, 100%
3 times for face-up part 3, 3 times for face-down part 3
There is no guarantee that the light will be received zero times. Therefore, according to the present invention, the number of times of light reception and detection by the analyzer 1 is actually tested for a large number of face-up and face-down parts 3, and a histogram is created for each of them. FIG. 4 is an example of this. In the figure, the hatched bar graphs are for parts 3 that are facing down, and the bar graphs that are not hatched are for parts 3 that are facing up. Part 3 face down as expected
For most of them, the number of times of light reception and detection is 0 times, and for most of the parts 3 facing upward, the number of times of light reception and detection is 3 times. The respective numbers are also observed for 1st, 2nd, and 4th times, but it is understood that 2 times is the threshold for heads or tails. Also, although the difference is slight, the number of times of light reception and detection twice is higher for the face-up component 3, so that twice or more is determined to be face-up, and once or less is determined to be face-down. Therefore, if the detection device 1 receives and outputs light twice or more for one component, it is determined that the component is facing up, and if it is less than once, it is determined that the component is facing down.
第4図のようなヒストグラムの作成について
は、実際に表向きの部品3を例えば100個、裏向
きの部品3を100個流して各受光検知回数につい
ての個数をそれぞれカウントするようにしてもよ
いが、全く表裏ランダムに多数の部品3を流し
て、各部品3についての受光検知回数をコンピユ
ータに供給し、受光検知回数−部品個数を演算さ
せて、その結果によりしきい値を決定させてもよ
い。この場合には、このコンピユータのしきい値
出力を、検光装置1に接続される判別回路に供給
するようにすれば完全に本発明は自動化される。 Regarding the creation of a histogram as shown in Fig. 4, it is also possible to actually flow, for example, 100 face-up parts 3 and 100 face-down parts 3 and count the number of parts for each number of light reception detections. , a large number of parts 3 may be passed completely randomly from front to back, the number of light reception detections for each part 3 may be supplied to a computer, the number of light reception detection times - number of parts may be calculated, and the threshold value may be determined based on the result. . In this case, the present invention can be completely automated by supplying the threshold output of this computer to a discrimination circuit connected to the analyzer 1.
第5図は本発明の第2実施例を示すが、本実施
例によれば、移送路2の中心線C−Cに関して線
D−Dとは対称的な線E−Eの直上方に更に別の
検光装置が配設される。この場合には両検光装置
の合計の受光検知回数は表向き部品3については
零回であり、表向き部品3については6回が最高
個数となるが、しきい値がより正確に定められ、
第1実施例より判別能力は更に向上することが理
解されよう。 FIG. 5 shows a second embodiment of the present invention, and according to this embodiment, there is a Another analyzer is provided. In this case, the total number of light reception and detection by both analyzers is zero for the front-facing component 3, and the maximum number for the front-facing component 3 is six times, but the threshold value is more accurately determined.
It will be understood that the discrimination ability is further improved than in the first embodiment.
以上、本発明の実施例について説明したが勿
論、本発明はこれに限定されることなく、本発明
の技術的思想に基づいて種々の変形が可能であ
る。 Although the embodiments of the present invention have been described above, it goes without saying that the present invention is not limited thereto, and various modifications can be made based on the technical idea of the present invention.
例えば以上の実施例では第2A図及び第2B図
に示す部品について説明されたが、表裏において
光学的に差のある他の部品についても本発明は適
用可能である。また部品も図示のように板状でな
くて、ブロツク状であつてもよい。 For example, in the above embodiments, the components shown in FIGS. 2A and 2B have been described, but the present invention is also applicable to other components that have optical differences between the front and back sides. Further, the parts may not be plate-shaped as shown in the figure, but may be block-shaped.
以上述べたように本発明の方法によれば、反射
式の検光装置の受光検知回数もしくは応答回数を
多数の表裏の各部品につき統計的に求め、これか
ら表裏を区別するしきい値回数を決定し、この回
数より検光装置の応答回数が多いか少いかによつ
て部品の表裏を判別するようにしたので、実際的
に精度良く部品の表裏を判別することができる。 As described above, according to the method of the present invention, the number of light reception detections or response times of a reflective analyzer is statistically determined for each of a large number of front and back parts, and the threshold number of times for distinguishing front and back parts is determined from this. However, since the front and back of the component is determined based on whether the number of responses of the analyzer is greater or less than this number, it is possible to determine the front and back of the component with high accuracy in practice.
第1図は従来例を示す部品の表裏判別装置の概
略側断面図、第2A図は表向き部品と検光装置と
の関係を示すための第1図における−線方向
の平面図、第2B図は裏向き部品につき同関係を
示すための第2A図と同様な平面図、第3図は本
発明の第1実施例における第2A図と同様な平面
図、第4図は同実施例を説明するためのグラフ、
及び第5図は本発明の第2実施例における第2A
図と同様な平面図である。
なお図において、1……検光装置、1a……発
光素子、1b……感光素子、2……移送路、3…
…部品、3a……ベークライト板、3b……錫メ
ツキ部分。
Fig. 1 is a schematic side sectional view of a conventional device for determining front and back sides of parts, Fig. 2A is a plan view taken in the - line direction in Fig. 1 to show the relationship between the front side parts and the analyzer, and Fig. 2B. 2A is a plan view similar to that shown in FIG. 2A for showing the same relationship for the face-down parts; FIG. 3 is a plan view similar to FIG. 2A in the first embodiment of the present invention; and FIG. 4 illustrates the same embodiment. graph for,
and FIG. 5 is the second A in the second embodiment of the present invention.
It is a top view similar to the figure. In the figure, 1...analyzer, 1a...light emitting element, 1b...photosensitive element, 2...transport path, 3...
...Parts, 3a...Bakelite board, 3b...Tin plating part.
Claims (1)
射光を受光する検光手段を配設し、該部品が表面
を上方に向けて前記検光手段の下方を通過したと
きに得られる前記検光手段の受光回数と、該部品
が裏面を上方に向けて前記検光手段の下方を通過
したときに得られる前記検光手段の受光回数との
ヒストグラムを多数の表向き及び裏向きの部品に
つき予め作成し、これにより表向きと裏向きの部
品の反射部からの反射光の前記検光素子の受光回
数のしきい値を求め、このしきい値より受光回数
が大きいか小さいかにより部品の表裏を判別する
ようにしたことを特徴とする移送される部品の表
裏判別方法。1. An analyzer for receiving reflected light from a light reflecting portion of a component is disposed above the component transfer path, and the light obtained when the component passes below the analyzer with the surface facing upward. A histogram of the number of light receptions by the analyzer and the number of light reception by the analyzer obtained when the component passes below the analyzer with its back side facing upward is calculated for a large number of front-facing and back-facing parts. Create a threshold value in advance for the number of times the analyzer receives light reflected from the reflective parts of front-side and back-side parts. A method for determining front and back sides of parts to be transferred, characterized in that the front and back sides of transferred parts are determined.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8754182A JPS58205572A (en) | 1982-05-24 | 1982-05-24 | Judgement of front or back sides of transferred parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8754182A JPS58205572A (en) | 1982-05-24 | 1982-05-24 | Judgement of front or back sides of transferred parts |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58205572A JPS58205572A (en) | 1983-11-30 |
| JPS6248556B2 true JPS6248556B2 (en) | 1987-10-14 |
Family
ID=13917838
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8754182A Granted JPS58205572A (en) | 1982-05-24 | 1982-05-24 | Judgement of front or back sides of transferred parts |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58205572A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61170637A (en) * | 1985-01-24 | 1986-08-01 | Inax Corp | Method and device for detecting front and rear faces of tile |
-
1982
- 1982-05-24 JP JP8754182A patent/JPS58205572A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58205572A (en) | 1983-11-30 |
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