JPS6256576B2 - - Google Patents
Info
- Publication number
- JPS6256576B2 JPS6256576B2 JP13096180A JP13096180A JPS6256576B2 JP S6256576 B2 JPS6256576 B2 JP S6256576B2 JP 13096180 A JP13096180 A JP 13096180A JP 13096180 A JP13096180 A JP 13096180A JP S6256576 B2 JPS6256576 B2 JP S6256576B2
- Authority
- JP
- Japan
- Prior art keywords
- diffraction grating
- light
- lens
- point
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 35
- 238000001514 detection method Methods 0.000 claims description 14
- 230000005855 radiation Effects 0.000 claims description 4
- 239000011295 pitch Substances 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 description 9
- 238000000926 separation method Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
- G02B7/32—Systems for automatic generation of focusing signals using parallactic triangle with a base line using active means, e.g. light emitter
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Optical Recording Or Reproduction (AREA)
- Automatic Focus Adjustment (AREA)
- Moving Of The Head For Recording And Reproducing By Optical Means (AREA)
Description
【発明の詳細な説明】
本発明は、ビデオデイスク装置等の光学的に情
報を再生、又は記録する装置に適用するもので、
記録、又は再生するための放射光束の集光点に記
録面を合わせる手段を有する焦点検出装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION The present invention is applied to a device that optically reproduces or records information, such as a video disc device.
The present invention relates to a focus detection device having means for aligning a recording surface with a convergence point of a radiation beam for recording or reproduction.
光学記録再生装置においては、記録担体を集光
点に正確に合わせることが必要であり、そのため
にレンズを可動とし、記録担体の面振れに応じて
レンズを動かし、常に記録面上に焦点があるよう
にするフオーカスサーボ(焦点制御装置)が必要
である。フオーカスサーボの誤差信号は、記録面
からの反射光の位置や形状が反射面の位置の変化
によつて変化するような光学系と、それを検知す
る光検知器によつて得ることができることが知ら
れている。 In optical recording and reproducing devices, it is necessary to precisely align the record carrier with the focal point, and for this purpose, the lens is movable, and the lens is moved according to the surface fluctuation of the record carrier, so that the focus is always on the recording surface. A focus servo (focus control device) is required to do this. The focus servo error signal can be obtained using an optical system in which the position and shape of the reflected light from the recording surface changes depending on the position of the reflecting surface, and a photodetector that detects it. It has been known.
フオーカスサーボをかけるためには、その前提
条件として記録面が焦点に一致した時に誤差信号
がゼロとなるように、光学系、又はサーボ回路を
調整しておく必要がある。従来の再生装置では、
記録されたデイスクを回転させて再生信号が最大
になるように、焦点誤差信号を検出する光検知器
を調整している。記録装置でも種々の方法がある
が、一例として記録レンズへの入射光と反射光が
完全に平行となつた時焦点が合つた状態と見な
し、反射光が平行になるように光検知器を調整し
ている。 In order to apply focus servo, as a prerequisite, it is necessary to adjust the optical system or servo circuit so that the error signal becomes zero when the recording surface coincides with the focus. With conventional playback devices,
The photodetector that detects the focus error signal is adjusted so that the recorded disc is rotated to maximize the reproduced signal. There are various methods for recording devices, but one example is to consider that the state is in focus when the incident light and the reflected light on the recording lens are completely parallel, and adjust the photodetector so that the reflected light is parallel. are doing.
本発明は、上記のようにデイスクを回転させ、
フオーカスサーボをかけながら光学系やサーボの
機能を調整することをやめ、光学系の組み立て段
階で光学系の調整をすべて終えるために、正確に
集光点に反射面を置くことのできる検出装置を提
案するものである。理論的には、正確に集光点に
反射面が来るならば、反射光は焦点が合つた状態
での光路をとるため、この位置がフオーカス誤差
信号のゼロクロス点になるようにフオーカス誤差
信号検出の光学系を調整することが可能となる。 The present invention rotates the disk as described above,
A detection device that can accurately place the reflective surface at the focal point in order to eliminate the need to adjust the optical system and servo functions while applying focus servo, and complete all optical system adjustments at the optical system assembly stage. This is what we propose. Theoretically, if the reflective surface is exactly at the focal point, the reflected light will take a focused optical path, so the focus error signal is detected so that this position becomes the zero-crossing point of the focus error signal. It becomes possible to adjust the optical system of
本発明は、特に光源、光検知器、レンズ等の光
学系を一体化した鏡筒が、記録面の面振れや、記
録トラツクの偏心に追随して動くような構造の光
学ヘツドに使用する場合に重要となる。というの
は、この場合フオーカス検出光学系も一体化され
て動くので、動いている光学系を外部から調整す
ることは不可能であるからである。 The present invention is particularly useful when used in an optical head having a structure in which a lens barrel that integrates an optical system such as a light source, a photodetector, and a lens moves in accordance with the wobbling of the recording surface or the eccentricity of the recording track. becomes important. This is because in this case the focus detection optical system is also integrated and moves, so it is impossible to adjust the moving optical system from the outside.
本発明の原理と、これを実現した一実施例を図
面にもとづいて説明する。第1図で、レンズ1に
より絞られたスポツトは、拡大像とする光学系3
(例えば顕微鏡が使用できる)で拡大され、肉眼
4、又は投写観測系で観測される。投写観測系と
は、レンズ1によるスポツトの拡大された実像を
ビジコン面に投写し、CRT画面に写すとか、可
視光の場合には単なるスクリーンに拡大像を投写
する等が可能である。2は回折格子でスポツト付
近に置かれている。回折格子2の位置がスポツト
位置の前後にある場合は、第2図b,cに示すよ
うに、観測位置では、スポツトは回折され、0次
と1次の回折光で3点かそれ以上に分離されて見
える。スポツトの分離距離は回折格子位置の焦点
位置からのずれに比例し、焦点位置にきた時スポ
ツトは一点に集まるので、回折格子面を焦点位置
に合わせることが可能となる。 The principle of the present invention and an embodiment that realizes the same will be explained based on the drawings. In Fig. 1, the spot narrowed down by lens 1 is shown by optical system 3, which produces an enlarged image.
(for example, a microscope can be used) and observed with the naked eye 4 or with a projection observation system. The projection observation system is capable of projecting a magnified real image of a spot by the lens 1 onto a vidicon surface and displaying it on a CRT screen, or in the case of visible light, projecting an enlarged image onto a simple screen. 2 is a diffraction grating placed near the spot. If the position of the diffraction grating 2 is before or after the spot position, the spot will be diffracted at the observation position, and the 0th-order and 1st-order diffracted light will form three or more points, as shown in Figure 2 b and c. Looks separated. The separation distance of the spots is proportional to the deviation of the diffraction grating position from the focal position, and since the spots converge at one point when they reach the focal position, it is possible to align the diffraction grating surface with the focal position.
回折格子面に半透過膜を蒸着することにより、
透過光が一点に重なるように調整し、焦点位置に
置いて反射光で光学系を最適位置に調整すること
が可能である。又、回折格子面を全反射面にし
て、レンズ1を通る反射光をビームスプリツタで
分離し、拡大結像系で観測することも可能であ
る。 By depositing a semi-transparent film on the diffraction grating surface,
It is possible to adjust the transmitted light so that they overlap at one point, place it at the focal position, and use the reflected light to adjust the optical system to the optimal position. It is also possible to make the diffraction grating surface a total reflection surface, separate the reflected light passing through the lens 1 with a beam splitter, and observe it with an enlarged imaging system.
回折格子2で決定できる焦点位置精度について
述べる。光の波長をλ、レンズ開口数をNAとす
ると、レンズの分離はλ/NAとなる。回折格子
2の本数をn/mm(ピツチをPとすると、n=1/P
である)とすると、0次と1次回折光との分離角
度はnλラジアンとなるので、デフオーカス量を
Δfとすると、スポツトの分離巾はΔfnλとな
る。従つて、Δfnλ=λ/NAが分離限界であ
る。例えばλ=0.8μm、NA=0.5とすると、n
=50でΔf=40μm、n=1000でΔf=2μmと
なる。 The focal position accuracy that can be determined by the diffraction grating 2 will be described. If the wavelength of light is λ and the lens numerical aperture is NA, then the lens separation is λ/NA. If the number of diffraction gratings 2 is n/mm (if the pitch is P, then n=1/P), then the separation angle between the 0th-order and 1st-order diffracted light is nλ radians, so if the defocus amount is Δf, then , the spot separation width is Δfnλ. Therefore, Δfnλ=λ/NA is the separation limit. For example, if λ=0.8μm and NA=0.5, then n
When n=50, Δf=40 μm, and when n=1000, Δf=2 μm.
レンズの焦点深度は±2μmであるのでn=
1000の回折格子を使うならば回折格子を焦点深度
内に置くことができる。しかしながらnが1000よ
り少ない場合、例えばn=400位でも実用上はさ
ほど問題にはならない。というのは、フオーカス
誤差信号は第3図a,bのような形をとり、焦点
誤差にほぼ比例して誤差信号電圧が増す範囲は一
般に数10μmはあり、レンズの焦点深度に比べて
十分大きい。そこで誤差信号は、2つ以上の光検
出器出力の差でとるが、それぞれの検出器の出力
感度に差をつけることにより、誤差信号がゼロク
ロス位置を焦点深度の数倍の範囲で変化させるこ
とができる。従つて回折格子で反射面を完全に焦
点深度内に入れられなくても、サーボ回路系で焦
点深度内に入るように調整できる。 The depth of focus of the lens is ±2 μm, so n=
If you use a 1000 grating, you can place the grating within the depth of focus. However, if n is less than 1000, for example, n = 400, but this does not pose much of a problem in practice. This is because the focus error signal takes the form as shown in Figure 3 a and b, and the range in which the error signal voltage increases approximately in proportion to the focus error is generally several tens of micrometers, which is sufficiently large compared to the focal depth of the lens. . Therefore, the error signal is obtained from the difference between the outputs of two or more photodetectors, but by making a difference in the output sensitivity of each detector, the error signal can change the zero cross position within a range several times the depth of focus. Can be done. Therefore, even if the reflective surface cannot be completely brought within the depth of focus using the diffraction grating, it can be adjusted to be within the depth of focus using the servo circuit system.
ところが上記の構成をとつた場合でも、回折格
子焦点位置に置いた場合、スポツトの大きさが格
子の溝の大きさと同レベルかそれ以下となると、
格子のスポツトの当たる位置によつて反射光の回
折される強度分布に差が出るため、反射光によつ
て焦点誤差信号(場合によつては、トラツキング
誤差信号も含め)を検出する光学系を最適位置に
調整することが困難になる。そこで、回折格子面
と同一平面上で回折格子のない平面反射部を作つ
ておき、回折格子面で焦点合せをしたのち平面反
射部をスポツトの位置に平行移動し、ここで反射
光から焦点誤差信号の検出系、トラツキング誤差
信号検出の光学系等を調整することができる。さ
らに、ピツチの荒い回折格子と細かい回折格子を
同一面上に刻んでおくことによつて、調整時に大
きく焦点がずれている場合、荒い回折格子で大略
の位置決めを行ない、その後細かい回折格子で正
確に焦点合せをすることもできる。 However, even with the above configuration, if the spot size is the same as or smaller than the groove size of the grating when placed at the focal position of the diffraction grating,
Since the diffracted intensity distribution of the reflected light differs depending on the position of the spot on the grating, an optical system is required to detect the focus error signal (including tracking error signal in some cases) using the reflected light. It becomes difficult to adjust to the optimal position. Therefore, a plane reflection section without a diffraction grating is made on the same plane as the diffraction grating surface, and after focusing on the diffraction grating surface, the plane reflection section is moved parallel to the spot position, and the focus error is determined from the reflected light. The signal detection system, tracking error signal detection optical system, etc. can be adjusted. Furthermore, by carving a coarse diffraction grating and a fine diffraction grating on the same surface, if the focus is significantly out of focus during adjustment, the rough diffraction grating can be used to roughly determine the position, and then the finer diffraction grating can be used to accurately position the grating. You can also focus on
前述の一体化された光学ヘツドでは、光源であ
る半導体レーザーが劣化した場合光源を交換する
必要が生ずる場合がある。このときレンズと回折
格子間距離が一定に位置決めされておれば、交換
後の光源を、回折格子により分離された光点が一
致するよう調節することにより、交換後の光源を
最適位置に持ち込むことができる。 In the above-mentioned integrated optical head, if the semiconductor laser serving as the light source deteriorates, it may be necessary to replace the light source. At this time, if the distance between the lens and the diffraction grating is positioned constant, the replaced light source can be brought to the optimal position by adjusting the light spots separated by the diffraction grating so that they match. Can be done.
半導体レーザーと光学系を一体化して加振する
ような上記の光学ヘツドの場合、光学系はできる
だけ小さく軽いこと、また数KHzまでの加振に耐
えるよう丈夫で共振しない構造が必要とされる。
従つて、その中に、光検知器位置や、レーザー位
置、その他光学系を微調できる機構を備えること
は極めてむずかしい。そこで、一度調整したら接
着剤等で固めるような構造となるが、この場合、
組立て段階で反射面を正しく焦点位置に合わせら
れることがどうしても必要となる。また、前述の
ように、半導体レーザーは劣化することがあるの
で、半導体レーザーを交換できる構造が望ましい
が、レーザーを交換しても、他の光学系は調整で
きないので、半導体レーザー位置を、交換前の位
置から10μm以内のずれでつける必要がある。機
械的にこれだけの精度を出すことは非常に困難で
あるので、半導体レーザーの位置を決定するため
に、上記の検出装置を用いて回折格子による分離
スポツトが一致するように半導体レーザーの位置
を動かして調整することが可能である。 In the case of the above-mentioned optical head, which integrates a semiconductor laser and an optical system for excitation, the optical system must be as small and light as possible, and must have a structure that is durable and does not resonate so as to withstand excitation up to several KHz.
Therefore, it is extremely difficult to provide a mechanism for finely adjusting the photodetector position, laser position, and other optical systems. Therefore, once adjusted, the structure is fixed with adhesive, etc., but in this case,
It is absolutely necessary to be able to correctly align the reflective surface with the focal position during the assembly stage. In addition, as mentioned above, semiconductor lasers can deteriorate, so it is desirable to have a structure that allows the semiconductor laser to be replaced. However, even if the laser is replaced, other optical systems cannot be adjusted, so the position of the semiconductor laser must be changed before replacement. It is necessary to attach it within 10 μm from the position. It is very difficult to achieve this level of precision mechanically, so in order to determine the position of the semiconductor laser, we use the above detection device to move the position of the semiconductor laser so that the separated spots by the diffraction grating coincide. It is possible to adjust the
本発明と同じ用途で、集光点付近に置かれた回
折格子による回折光のフアーフイールドパターン
を観測する方法も考えられる。この方法の原理
は、焦光点が回折格子面の前後にある場合、0次
光と1次回折光との干渉で干渉縞が生じ、縞間隔
が焦点ずれ量に反比例し、フオーカスが合つた時
縞が消えるという現象を利用している。ところが
特に、半導体レーザーのような、波長が赤外に近
い700Å〜8400Åの光の場合、フアーフイールド
パターンを観測するのは、光が発散して微弱とな
るため、高感度のビジコンを使う位しか方法がな
い。そころが、本発明の焦点検出装置を用いれ
ば、結像系で観察するので、すなわち光を集光し
て観察するため強度が強く、目視観察や、IRフ
オスフアーを利用した投写観察、また可視光に近
い場合には白いスクリーンへの投写観察も可能で
ある。 For the same purpose as the present invention, it is also possible to consider a method of observing a far-field pattern of diffracted light by a diffraction grating placed near a focal point. The principle of this method is that when the focal point is before and after the diffraction grating surface, interference fringes are generated due to interference between the 0th-order light and the 1st-order diffracted light, and the distance between the fringes is inversely proportional to the amount of defocus, and when the focus is It takes advantage of the phenomenon of stripes disappearing. However, especially in the case of light with a wavelength of 700 Å to 8400 Å, which is close to infrared, such as from semiconductor lasers, the only way to observe the far-field pattern is to use a highly sensitive vidicon, as the light diverges and becomes weak. There's no way. If the focus detection device of the present invention is used, observation is performed using an imaging system, which means that the light is focused and observed, so the intensity is strong, and it is possible to perform visual observation, projection observation using an IR sphere, or visible observation. Projection observation onto a white screen is also possible if the light is close to the light.
なお上記の実施例では、光学再生装置の光学系
に適用する場合を述べたが、光学記録装置の場合
にも全く同様に有効であることは言うまでもな
い。 In the above embodiment, the case where the present invention is applied to the optical system of an optical reproducing device has been described, but it goes without saying that the present invention is equally effective in the case of an optical recording device.
以上のように本発明の焦点検出装置は、回折格
子により分離された光点の拡大像を一点に合わせ
ることを特徴とするものであり、フオーカスサー
ボに係る光学系や回路系の調整が非常に容易とな
り、特に光源を一体化した光学ヘツドでは極めて
有効である。 As described above, the focus detection device of the present invention is characterized by aligning magnified images of light spots separated by a diffraction grating to a single point, and the adjustment of the optical system and circuit system related to the focus servo is extremely difficult. This is particularly effective for optical heads with integrated light sources.
第1図は本発明の焦点検出装置の一実施例を光
学ヘツドに適用したものの構成図、第2図a,
b,cは回折格子が焦点位置またはその前後にあ
る場合のスポツトの分離状態を説明するための正
面図、第3図a,bは、焦点誤差信号の波形図で
ある。
1……レンズ、2……回折格子、3……拡大光
学系、7……半導体レーザー、9……光検知器、
10……差動増幅器、11……サーボ回路、12
……駆動コイル。
Fig. 1 is a block diagram of an embodiment of the focus detection device of the present invention applied to an optical head, Fig. 2a,
FIGS. 3b and 3c are front views for explaining the spot separation state when the diffraction grating is at or before and after the focal position, and FIGS. 3a and 3b are waveform diagrams of the focus error signal. 1...Lens, 2...Diffraction grating, 3...Magnifying optical system, 7...Semiconductor laser, 9...Photodetector,
10... Differential amplifier, 11... Servo circuit, 12
...Drive coil.
Claims (1)
と、該放射光線の前記レンズの集光点付近に光軸
に対し、ほぼ垂直に置かれた回折格子と、該回折
格子からの反射光を検知し、回折格子面の集光点
からのずれに応じた誤差信号を検出する光学系及
び光検知手段と、前記誤差信号に応じて前記レン
ズを駆動し、前記回折格子面とレンズ間距離を一
定とするためのサーボ系と、前記集光点での光点
を観測可能な拡大像とする光学系とを備え、前記
回折格子により分離された前記光点の拡大像が一
点に重なるように前記回折格子とレンズ間の距離
を調節することを特徴とする焦点検出装置。 2 回折格子面を光の半透過面とし、前記集光点
での光点を観測可能な拡大像とする光学系を回折
格子面からの透過光側に配置したことを特徴とす
る特許請求の範囲第1項記載の焦点検出装置。 3 回折格子面は、回折格子の刻まれていない部
分、またはピツチの異なる回折格子が刻まれてい
る部分を有し、該回折格子面を、光軸に垂直な方
向に移動可能となし、前記の異なる部分を光軸中
心位置まで移動可能としたことを特徴とする特許
請求の範囲第1項記載の焦点検出装置。[Scope of Claims] 1. A radiation beam, a lens for condensing the radiation beam, a diffraction grating placed approximately perpendicular to the optical axis near the convergence point of the lens for the radiation beam, and a diffraction grating for the diffraction beam. an optical system and a light detection means for detecting the reflected light from the grating and detecting an error signal corresponding to the deviation of the diffraction grating surface from the focal point; A magnified image of the light spot separated by the diffraction grating, comprising a servo system for making the distance between the surface and the lens constant, and an optical system for making the light spot at the condensing point into an observable enlarged image. A focus detection device characterized in that the distance between the diffraction grating and the lens is adjusted so that the diffraction gratings and the lens overlap at one point. 2. The diffraction grating surface is a semi-transparent surface for light, and an optical system that makes the light point at the condensing point an observable enlarged image is disposed on the side of the transmitted light from the diffraction grating surface. A focus detection device according to scope 1. 3. The diffraction grating surface has a portion in which no diffraction grating is carved, or a portion in which diffraction gratings of different pitches are carved, and the diffraction grating surface is movable in a direction perpendicular to the optical axis. 2. The focus detection device according to claim 1, wherein different portions of the focus detection device are movable to the center position of the optical axis.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55130961A JPS5754907A (en) | 1980-09-19 | 1980-09-19 | Focus detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55130961A JPS5754907A (en) | 1980-09-19 | 1980-09-19 | Focus detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5754907A JPS5754907A (en) | 1982-04-01 |
| JPS6256576B2 true JPS6256576B2 (en) | 1987-11-26 |
Family
ID=15046670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55130961A Granted JPS5754907A (en) | 1980-09-19 | 1980-09-19 | Focus detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5754907A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2304890A (en) * | 1995-09-12 | 1997-03-26 | Richard Jackson | Testing apparatus for metal items |
-
1980
- 1980-09-19 JP JP55130961A patent/JPS5754907A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5754907A (en) | 1982-04-01 |
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