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JPS6256658B2 - - Google Patents
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JPS6256658B2 - - Google Patents

Info

Publication number
JPS6256658B2
JPS6256658B2 JP56148361A JP14836181A JPS6256658B2 JP S6256658 B2 JPS6256658 B2 JP S6256658B2 JP 56148361 A JP56148361 A JP 56148361A JP 14836181 A JP14836181 A JP 14836181A JP S6256658 B2 JPS6256658 B2 JP S6256658B2
Authority
JP
Japan
Prior art keywords
amount
bonding
descent
capillary
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56148361A
Other languages
Japanese (ja)
Other versions
JPS5848929A (en
Inventor
Saneyasu Hirota
Kazumichi Machida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP56148361A priority Critical patent/JPS5848929A/en
Publication of JPS5848929A publication Critical patent/JPS5848929A/en
Publication of JPS6256658B2 publication Critical patent/JPS6256658B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/0711Apparatus therefor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/0711Apparatus therefor
    • H10W72/07141Means for applying energy, e.g. ovens or lasers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07521Aligning
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/536Shapes of wire connectors the connected ends being ball-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/5363Shapes of wire connectors the connected ends being wedge-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Wire Bonding (AREA)

Description

【発明の詳細な説明】 この発明は、半導体装置の製造に適用されるワ
イヤボンデイング装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wire bonding apparatus applied to the manufacture of semiconductor devices.

第1図にワイヤボンデイング法の概略を示す。
同図において、1はキヤピラリチツプ、2はAu
などからなるワイヤ、3はAuワイヤ2の先端に
形成されたAuボール、4はAl蒸着パツド、5は
このパツド4が設けられたSiチツプ、6aはリー
ドフレームのチツプ装着部、6bはリードフレー
ムのリード部、7はAuボール3を形成するため
の電気トーチである。
FIG. 1 shows an outline of the wire bonding method.
In the figure, 1 is a capillary chip, 2 is an Au
3 is an Au ball formed at the tip of the Au wire 2, 4 is an Al vapor deposited pad, 5 is a Si chip provided with this pad 4, 6a is a chip mounting part of a lead frame, and 6b is a lead frame The lead portion 7 is an electric torch for forming the Au ball 3.

第1図Aのボンデイング開始前の位置からキヤ
ピラリチツプ1が下降して、Al蒸着パツド4上
にAuワイヤ2を接合する(第1図B)。パツド4
にワイヤ2を接合した後、キヤピラリチツプ1が
リード部6bに向つて移動し(第2図C)、リー
ド部6bにワイヤ2を接合する(第2図D)。
The capillary chip 1 is lowered from the position shown in FIG. 1A before the start of bonding, and the Au wire 2 is bonded onto the Al vapor deposited pad 4 (FIG. 1B). Padded 4
After bonding the wire 2 to the capillary chip 1, the capillary chip 1 moves toward the lead portion 6b (FIG. 2C), and the wire 2 is bonded to the lead portion 6b (FIG. 2D).

上記リード部6bにワイヤ2を接合した後、
Auワイヤ2を切断し(第2図E)、再び電気トー
チ7によるボール形成が行なわれる(第2図
F)。
After joining the wire 2 to the lead part 6b,
The Au wire 2 is cut (FIG. 2E) and ball formation is performed again using the electric torch 7 (FIG. 2F).

第2図に、Auワイヤ2をSiチツプ5上のAl蒸
着パツド4にボンデイングする際の接合時間と接
合強度およびキヤピラリチツプ1の下降量すなわ
ち、Auボール3の変形進行の関係について、実
験より求めた結果を示す。同図について簡単に説
明すると、時間とともに、キヤピラリチツプ1が
下降し、Auボール3の変形が進行するととも
に、接合強度は上昇している。この後、Auボー
ル3の変形は停止するとともに、接合強度も飽和
する。キヤピラリチツプ1の下降量と接合強度は
1対1の関係となり、ボンデイング前のAuボー
ル3の径を一定にすると、キヤピラリチツプ1の
下降量で接合強度を評価することが可能となる。
Figure 2 shows the relationship between the bonding time and bonding strength when bonding the Au wire 2 to the Al vapor-deposited pad 4 on the Si chip 5, and the amount of descent of the capillary chip 1, that is, the progress of deformation of the Au ball 3, which was determined through experiments. Show the results. Briefly explaining the figure, as time passes, the capillary chip 1 descends, the deformation of the Au ball 3 progresses, and the bonding strength increases. After this, the deformation of the Au ball 3 stops and the bonding strength also saturates. There is a one-to-one relationship between the amount of descent of the capillary chip 1 and the bonding strength, and if the diameter of the Au ball 3 before bonding is kept constant, it becomes possible to evaluate the bonding strength based on the amount of descent of the capillary tip 1.

従来、キヤピラリチツプ1のZ軸の動きは、カ
ムによる駆動方式が多く用いられ、Siチツプ5面
の高さのばらつきに基づく接合時間のばらつきを
考慮し、かなり長めに接合時間をとつている。し
かし、接合強度が第2図に示す合格強度に達して
から、更に荷重を加え、超音波を印加しつづける
時間は、全く無駄なものであり、ワイヤボンデイ
ング工程の高速化の要求に反する。
Conventionally, the Z-axis movement of the capillary chip 1 has been driven by a cam drive method, and the bonding time has been set to be quite long in consideration of variations in bonding time based on variations in the heights of the five surfaces of the Si chip. However, the time it takes to continue applying additional load and applying ultrasonic waves after the bonding strength reaches the acceptable strength shown in FIG. 2 is completely wasteful, and goes against the demand for speeding up the wire bonding process.

この発明は接合強度が合格強度に達したこと
を、キヤピラリチツプの下降量から判断し、下降
量が設定量に達すると、キヤピラリチツプを上昇
させることにより、接合時間を短縮でき、しかも
良好な接合状態を得ることができるワイヤボンデ
イング装置を提供することを目的としている。
This invention determines whether the bonding strength has reached an acceptable level by the amount of descent of the capillary tip, and when the amount of descent reaches a set amount, raises the capillary tip, thereby shortening the bonding time and maintaining a good bonding condition. The present invention aims to provide a wire bonding device that can be obtained.

以下、この発明の一実施例を図面にしたがつて
説明する。
An embodiment of the present invention will be described below with reference to the drawings.

第3図はこの発明に係るワイヤボンデイング装
置の一例を示すブロツク図である。1はキヤピラ
リチツプ、8はキヤピラリチツプ1における超音
波ホーン、9は超音波ホーン8の側部に取りつけ
た反射板である。10は非接触変位計のセンサ
で、反射板9とでキヤピラリチツプ1の下降量の
検出手段11を構成している。
FIG. 3 is a block diagram showing an example of a wire bonding apparatus according to the present invention. 1 is a capillary chip, 8 is an ultrasonic horn in the capillary chip 1, and 9 is a reflection plate attached to the side of the ultrasonic horn 8. Reference numeral 10 denotes a non-contact displacement sensor, which together with a reflecting plate 9 constitutes means 11 for detecting the amount of descent of the capillary tip 1.

この場合のキヤピラリチツプ1の下降量は、ボ
ンデイング前の第1図のAuボール3の径のばら
つきを考慮し、Auボール3の径がばらつき範囲
で最小となる場合の値を選び、設定値として設定
し、これを適正下降量とする。
In this case, the amount of descent of the capillary tip 1 is determined by taking into consideration the variation in the diameter of the Au ball 3 shown in Figure 1 before bonding, selecting a value that will minimize the diameter of the Au ball 3 within the variation range, and setting it as the set value. This is the appropriate amount of descent.

13はキヤピラリチツプ1の昇降用のアクチユ
エータで、モータ(Z軸)が用いられている。1
4は比較器であり、設定器12の設定値とセンサ
10からの出力値、つまり測定下降量とを比較す
るものである。15は比較器14からの判定出力
を受けて上記モータ13の駆動を制御する制御回
路である。
13 is an actuator for raising and lowering the capillary chip 1, and a motor (Z-axis) is used. 1
4 is a comparator, which compares the set value of the setting device 12 and the output value from the sensor 10, that is, the measured fall amount. Reference numeral 15 denotes a control circuit that receives the determination output from the comparator 14 and controls the drive of the motor 13.

つぎに、上記構成の動作を説明する。 Next, the operation of the above configuration will be explained.

モータ13によりキヤピラリチツプ1が下降し
ている間、その下降量が遂次検出される。つま
り、センサ10から投射された光が、反射板9よ
り反射して戻つてくる光量を検出することによつ
て、反射板9とセンサ10との距離hが計測され
る。この場合、反射板9の表面は鏡面であること
が必要であるが、材質は問わない。センサ10か
らの出力信号が比較器14に入力されると、比較
器14は、センサ10と反射板9の距離、すなわ
ちキヤピラリチツプ1の降下量を、予め設定器1
2で設定しておいた適正下降量と比較し、これら
の量が等しくなつた時点を判定して判定出力を制
御回路12に印加する。制御回路15はキヤピラ
リチツプ1を上昇させる信号をチツプ駆動用モー
タ13に送出する。
While the capillary tip 1 is being lowered by the motor 13, the amount of the lowering is successively detected. That is, by detecting the amount of light projected from the sensor 10 reflected from the reflector 9 and returned, the distance h between the reflector 9 and the sensor 10 is measured. In this case, the surface of the reflecting plate 9 needs to be a mirror surface, but the material may be used. When the output signal from the sensor 10 is input to the comparator 14, the comparator 14 sets the distance between the sensor 10 and the reflector 9, that is, the amount of descent of the capillary chip 1, to the setting device 1 in advance.
2, and determines the point in time when these amounts become equal, and applies a determination output to the control circuit 12. The control circuit 15 sends a signal to the chip drive motor 13 to raise the capillary chip 1.

これにより、接合強度が合格強度に達するや否
やキヤピラリチツプ1が上昇されることになり、
接合時間の無駄が省かれる。また同時に接合の信
頼性も確保される。第4図にこの発明の装置によ
る効果をグラフで示す。Dpは適正下降量、Tp
適正接合時間を示す。
As a result, the capillary tip 1 is raised as soon as the bonding strength reaches the acceptable strength.
Wasted bonding time is eliminated. At the same time, the reliability of the bonding is also ensured. FIG. 4 graphically shows the effects of the apparatus of the present invention. D p represents the appropriate amount of descent, and T p represents the appropriate bonding time.

なお、以上の説明においては、便宜上Auワイ
ヤ3をAl蒸着パツド4上にボールボンデイング
する場合について述べてきたが、他のワイヤ材質
や他のパツド材質でも同様の効果が得られること
は言うまでもない。また、キヤピラリチツプ1の
下降量の検出手段として、上記実施例では、セン
サ10より投射された光が、反射板9から反射し
て戻つてくる光量を検出するものを例に説明した
が、キヤピラリチツプ1の下降量を静電容量の変
化より検出する手段などであつてもよい。
In the above description, for the sake of convenience, we have described the case where the Au wire 3 is ball-bonded onto the Al vapor deposited pad 4, but it goes without saying that similar effects can be obtained with other wire materials or other pad materials. In addition, in the above embodiment, as a means for detecting the amount of descent of the capillary chip 1, an example was explained in which the amount of light projected by the sensor 10 is reflected from the reflector plate 9 and returned. It may also be a means for detecting the amount of decrease in the capacitance based on a change in capacitance.

以上のように、この発明によれば、接合強度が
合格強度に達する点をキヤピラリチツプの下降量
から判定して、予め設定された適正降下量になれ
ば、キヤピラリチツプを上昇させるようにしたか
ら、無駄な接合時間が省かれ、接合時間を実質的
に短縮でき、それにともない、半導体装置の生産
性の向上に寄与できる効果がある。
As described above, according to the present invention, the point at which the bonding strength reaches a passing strength is determined from the amount of descent of the capillary tip, and when the amount of descent reaches a preset appropriate amount, the capillary tip is raised. The bonding time can be saved, the bonding time can be substantially shortened, and this has the effect of contributing to improving the productivity of semiconductor devices.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、ワイヤボンデイングの工程説明図、
第2図は接合時間と接合強度およびキヤピラリチ
ツプの下降量の関係を示すグラフ、第3図は、こ
の発明に係るワイヤボンデイング装置の一例を示
すブロツク図、第4図はこの発明の装置による接
合時間と接合強度およびキヤピラリチツプの適正
下降量の関係を示すグラフである。 1……キヤピラリチツプ、11……検出手段、
13……アクチユエータ、14……比較器、15
……制御回路。なお、図中同一符号は同一もしく
は相当部分を示す。
Figure 1 is an explanatory diagram of the wire bonding process;
FIG. 2 is a graph showing the relationship between bonding time, bonding strength, and amount of descent of the capillary chip, FIG. 3 is a block diagram showing an example of the wire bonding apparatus according to the present invention, and FIG. 4 is the bonding time using the apparatus of the present invention. 3 is a graph showing the relationship between the bonding strength and the appropriate amount of lowering of the capillary tip. 1...capillary chip, 11...detection means,
13... Actuator, 14... Comparator, 15
...control circuit. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 1 キヤピラリチツプの昇降駆動用のアクチユエ
ータと、上記キヤピラリチツプの下降量を予め設
定する設定器と、上記キヤピラリチツプの下降量
を検出する検出手段と、上記検出手段で検出され
た下降量と設定器の設定量とを比較して、上記下
降量と設定量とが一致した時点を判定する比較器
と、この比較器からの判定出力を受けた際、キヤ
ピラリチツプが上昇するように上記アクチユエー
タの駆動を制御する制御回路とを具備したワイヤ
ボンデイング装置。
1. An actuator for driving the capillary tip up and down, a setting device for presetting the amount of descent of the capillary tip, a detection means for detecting the amount of descent of the capillary tip, and a detection means for detecting the amount of descent detected by the detection means and the setting amount of the setting device. a comparator that compares the lowering amount with the set amount and determines when the lowering amount matches the set amount; and a control that controls the drive of the actuator so that the capillary tip rises when receiving the determination output from the comparator. A wire bonding device equipped with a circuit.
JP56148361A 1981-09-18 1981-09-18 Wire bonding apparatus Granted JPS5848929A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56148361A JPS5848929A (en) 1981-09-18 1981-09-18 Wire bonding apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56148361A JPS5848929A (en) 1981-09-18 1981-09-18 Wire bonding apparatus

Publications (2)

Publication Number Publication Date
JPS5848929A JPS5848929A (en) 1983-03-23
JPS6256658B2 true JPS6256658B2 (en) 1987-11-26

Family

ID=15451036

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56148361A Granted JPS5848929A (en) 1981-09-18 1981-09-18 Wire bonding apparatus

Country Status (1)

Country Link
JP (1) JPS5848929A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20210155053A1 (en) * 2018-07-02 2021-05-27 The Yokohama Rubber Co., Ltd. Pneumatic tire

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6397445A (en) * 1986-10-13 1988-04-28 Suehiro Sharyo Seisakusho:Kk Trailer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20210155053A1 (en) * 2018-07-02 2021-05-27 The Yokohama Rubber Co., Ltd. Pneumatic tire

Also Published As

Publication number Publication date
JPS5848929A (en) 1983-03-23

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