Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS627686B2 - - Google Patents
[go: Go Back, main page]

JPS627686B2 - - Google Patents

Info

Publication number
JPS627686B2
JPS627686B2 JP56141840A JP14184081A JPS627686B2 JP S627686 B2 JPS627686 B2 JP S627686B2 JP 56141840 A JP56141840 A JP 56141840A JP 14184081 A JP14184081 A JP 14184081A JP S627686 B2 JPS627686 B2 JP S627686B2
Authority
JP
Japan
Prior art keywords
reaction chamber
chamber
conveyor
thin film
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56141840A
Other languages
Japanese (ja)
Other versions
JPS5843509A (en
Inventor
Shinji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Corporate Research and Development Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Corporate Research and Development Ltd filed Critical Fuji Electric Co Ltd
Priority to JP56141840A priority Critical patent/JPS5843509A/en
Publication of JPS5843509A publication Critical patent/JPS5843509A/en
Publication of JPS627686B2 publication Critical patent/JPS627686B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/24Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3404Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
    • H10P14/3411Silicon, silicon germanium or germanium

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Photovoltaic Devices (AREA)

Description

【発明の詳細な説明】 本発明は、例えばアモルフアスシリコン太陽電
池の製造におけるように反応室内に対向配置され
た電極間に電圧を印加してグロー放電を発生せし
め、反応室内に供給された反応ガスを分解して反
応ガス成分の少くとも一つを電極に支持された基
板上に薄膜として堆積させる工程を流れ作業で行
うことができる量産型薄膜生成装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention applies a voltage between electrodes placed opposite each other in a reaction chamber to generate a glow discharge, for example in the production of amorphous silicon solar cells, and The present invention relates to a mass-produced thin film production apparatus that can perform the process of decomposing a gas and depositing at least one of the reactive gas components as a thin film on a substrate supported by an electrode in an assembly line operation.

プラズマCVD法により多数の基板の上に薄膜
を形成する装置としては、通常のCVD法と同様
に大きな反応室内で同時に多数の基板を処理する
バツチ式のものが考えられる。しかしこの方式で
は、多数の基板の出し入れ操作が複雑であり、ま
た基板を取出すためにその都度反応室の真空を破
らねばならず、高い運転効率を得ることは困難で
ある。
As an apparatus for forming thin films on a large number of substrates by plasma CVD, a batch-type system can be considered that processes a large number of substrates simultaneously in a large reaction chamber, similar to the conventional CVD method. However, with this method, the operation of loading and unloading a large number of substrates is complicated, and the vacuum in the reaction chamber must be broken each time to take out the substrates, making it difficult to obtain high operating efficiency.

本発明は、これに対して反応室の真空を保持し
たまま流れ作業により基板上への薄膜の生成を行
うことのできる量産型薄膜生成装置を提供するこ
とを目的とする。
In contrast, an object of the present invention is to provide a mass-produced thin film production apparatus that can produce a thin film on a substrate by assembly line operation while maintaining a vacuum in a reaction chamber.

この目的は反応室の両側に、それぞれ開閉可能
の気密扉を介して隣接する前室および後室が設け
られ、反応室、前室および後室の三室はそれぞれ
独立して真空排気可能であり、さらに三室にまた
がつて可動のコンベヤと、三室にまたがつて敷設
され反応室内に位置する部分が給電導体をなす二
本のレールとが設けられ、コンベヤ上に支持され
て等間隔の対をなす電極のそれぞれがレールの上
を摺動する接触子を介して給電導体のそれぞれと
接続されることによつて達成される。
The purpose of this is to provide a front chamber and a rear chamber adjacent to each other through airtight doors that can be opened and closed on both sides of the reaction chamber, and the three chambers, the reaction chamber, front chamber, and rear chamber, can be evacuated independently. Furthermore, a movable conveyor that spans the three chambers and two rails that are laid across the three chambers and whose portions located inside the reaction chamber form a power supply conductor are provided, and are supported on the conveyor to form a pair at equal intervals. This is achieved by connecting each of the electrodes to each of the feed conductors via a contact that slides on a rail.

以下、図を引用して本発明の実施例について説
明する。図において、反応室1に隣接して前室2
および後室3が設けられている。反応室1と前室
2および後室3との境界には開閉可能の扉4およ
び5が存在し、また前室2と後室3には正面に図
示しない開閉可能の扉を有する。各扉は気密に閉
じられるものであり、各室1〜3は各扉を閉じた
際にはそれぞれ独立に排気口6,7,8より図示
しない真空系によつて真空排気できる。さらに各
室1〜3の底面には各室にまたがつてベルトコン
ベヤ9が存在し、天井には各室にまたがる二本の
レール10,11が敷設されている。レール1
0,11は反応室内では給電導体12,13とし
て導電体からなり、前室、後室内では絶縁体から
なるが、それぞれ同断面で連続するレールとして
形成されている。コンベヤ9の上に絶縁体14を
はさんで等間隔で垂直に立てられたサセプタ15
は、一つおきにレール10の上を摺動する接触子
16を備えた接続導体17、あるいはレール11
の上を摺動する接触子18を備えた接続導体19
にそれぞれ接続されている。
Embodiments of the present invention will be described below with reference to the drawings. In the figure, the front chamber 2 is adjacent to the reaction chamber 1.
and a rear chamber 3 are provided. Openable and closable doors 4 and 5 are present at the boundaries between the reaction chamber 1 and the front chamber 2 and rear chamber 3, and the front chamber 2 and rear chamber 3 have openable and closable doors (not shown) in front. Each door is closed airtight, and each chamber 1 to 3 can be evacuated independently from the exhaust ports 6, 7, and 8 by a vacuum system (not shown) when each door is closed. Furthermore, a belt conveyor 9 is provided on the bottom of each chamber 1 to 3, spanning the respective chambers, and two rails 10, 11 are laid on the ceiling spanning the respective chambers. rail 1
Reference numerals 0 and 11 are made of a conductor as power supply conductors 12 and 13 in the reaction chamber, and made of an insulator in the front and rear chambers, each of which is formed as a continuous rail with the same cross section. Susceptors 15 are vertically erected at equal intervals on top of the conveyor 9 with insulators 14 in between.
is a connecting conductor 17 with contacts 16 sliding on every other rail 10, or a rail 11
A connecting conductor 19 with a contact 18 sliding over the
are connected to each.

この装置によつて薄膜生成を行うには、先ず前
室2の正面扉を開いてベルトコンベヤ9の上の所
定の位置に絶縁体14をはさんで両面に基板20
を取付けたサセプタ15を垂直に立て、接続導体
17,19の接触子16,18をレール10およ
び11に嵌める。次いで正面扉を閉じて前室2内
を排気口7より真空排気し、サセプタ15に内蔵
したヒータに通電して基板20を所定の温度まで
加熱する。ヒータへの通電はコンベヤ9内あるい
は別に設けた給電導体を介して行われる。次いで
既に真空になつている反応室1との間の扉を開
き、コンベヤ9を運転して前室2内にあつたサセ
プタ15を反応室内に移動させる。この際、各サ
セプタ15に接続された接触子16あるいは18
はレール10あるいは11上を摺動して反応室内
の給電導体12あるいは13に達する。ここで反
応室2内にガス導入口21より所定の真空度に達
するまで反応ガス、例えばシランガスを導入し、
給電導体12,13によつて隣接するサセプタ1
5の間に無線周波数電圧を印加してグロー放電を
発生させて各基板20の上にアモルフアスシリコ
ンを堆積させる。次いで扉5を開き、コンベヤ9
を運転してアモルフアスシリコン薄膜で覆われた
基板を取付けたサセプタ15を反応室1から後室
3まで移動させる。この際、接触子16および1
8も給電導体12,13の上から摺動して後室3
内部のレール10,11の絶縁体部分に達する。
この後扉5を閉じ、後室3内の真空を破つてから
正面扉を開いてサセプタ15および処理済みの基
板20を取り出す。このような操作を繰返す際に
は、反応室1における膜生成工程の進行中に前室
2におけるサセプタ15および基板20の挿入、
後室3におけるサセプタ15および基板20の取
り出しを行えば、基板への薄膜生成操作がタクト
式流れ作業として連続的に行うことができる。
To form a thin film using this device, first open the front door of the front chamber 2, place the insulator 14 at a predetermined position on the belt conveyor 9, and place the substrates 20 on both sides.
The susceptor 15 with the attached susceptor 15 is stood vertically, and the contacts 16 and 18 of the connecting conductors 17 and 19 are fitted into the rails 10 and 11. Next, the front door is closed, the inside of the front chamber 2 is evacuated through the exhaust port 7, and the heater built in the susceptor 15 is energized to heat the substrate 20 to a predetermined temperature. The heater is energized within the conveyor 9 or via a separately provided power supply conductor. Next, the door between the chamber 1 and the reaction chamber 1, which is already in a vacuum state, is opened, and the conveyor 9 is operated to move the susceptor 15, which has been in the front chamber 2, into the reaction chamber. At this time, the contactor 16 or 18 connected to each susceptor 15
slides on the rail 10 or 11 and reaches the power supply conductor 12 or 13 in the reaction chamber. Here, a reaction gas, for example silane gas, is introduced into the reaction chamber 2 through the gas inlet 21 until a predetermined degree of vacuum is reached.
Susceptor 1 adjacent by feed conductors 12, 13
Amorphous silicon is deposited on each substrate 20 by applying a radio frequency voltage during step 5 to generate a glow discharge. Next, open the door 5 and move the conveyor 9.
The susceptor 15, on which the substrate covered with the amorphous silicon thin film is attached, is moved from the reaction chamber 1 to the rear chamber 3 by operating the susceptor 15. At this time, contacts 16 and 1
8 also slides from above the power supply conductors 12 and 13 to the rear chamber 3.
It reaches the insulator portion of the inner rails 10,11.
Thereafter, the door 5 is closed, the vacuum in the rear chamber 3 is broken, and the front door is opened to take out the susceptor 15 and the processed substrate 20. When repeating such operations, inserting the susceptor 15 and the substrate 20 in the front chamber 2 while the film production step in the reaction chamber 1 is in progress;
By taking out the susceptor 15 and the substrate 20 in the rear chamber 3, the operation of forming a thin film on the substrate can be performed continuously as a tact-type flow operation.

図の実施例ではサセプタ15のすべての両面に
基板20を取り付け、できるだけ多数の基板の同
時処理を行うようにしているが、一方のサセプタ
15にのみ基板を取り付け、隣接するサセプタは
ヒータを内蔵しない専用電極に置き換えてもよ
い。この場合は給電導体12,13を介して、専
用電極側や正になるような直流電圧を印加してグ
ロー放電を発生させることもできる。
In the illustrated embodiment, substrates 20 are attached to both sides of the susceptor 15 in order to simultaneously process as many substrates as possible, but the substrate is attached to only one susceptor 15, and the adjacent susceptor does not have a built-in heater. It may be replaced with a dedicated electrode. In this case, glow discharge can also be generated by applying a positive DC voltage to the exclusive electrode side via the power supply conductors 12 and 13.

給電導体12,13間の間隔はサセプタ(電
極)15相互間の間隔に比較して十分大きく、例
えば1.5倍以上にとつておき、給電導体間に放電
が生じないようにする必要がある。
The distance between the power supply conductors 12 and 13 must be sufficiently larger than the distance between the susceptors (electrodes) 15, for example, 1.5 times or more, to prevent discharge from occurring between the power supply conductors.

また、図の実施例では反応室を一つとしたが、
これは必要に応じて増加させることができる。例
えばpinの3層アモルフアスシリコンを生成する
場合、反応室を3室設け、その間を開閉可能の扉
で区切り、各室における反応ガス成分および放電
條件の制御により、必要な膜厚のp,i,n各層
を生成して、境界の扉を開いてコンベヤにより基
板を移動させ、所望のpin構造を積層する。この
場合、放電の制御のためレールは反応室各室の間
でも絶縁し、各反応室の給電導体を独立にしてお
くことが必要である。
In addition, although the example shown in the figure has one reaction chamber,
This can be increased as needed. For example, when producing pin three-layer amorphous silicon, three reaction chambers are provided, separated by doors that can be opened and closed, and the required film thickness p, i is controlled by controlling the reaction gas components and discharge conditions in each chamber. , n layers, open the boundary door, move the substrates by a conveyor, and stack the desired pin structure. In this case, in order to control the discharge, it is necessary to insulate the rail between each reaction chamber and to make the power supply conductor of each reaction chamber independent.

本発明による装置ではコンベヤが真空にするこ
とができる各室の壁を貫通して動かされる。従つ
てその際に貫通部分で真空漏れが生ずる虞がある
が、コンベヤの運転は反応進行中には行われない
ので、真空漏れが直接生成膜質に影響を及ぼすこ
とがない。
In the device according to the invention a conveyor is moved through the walls of each chamber which can be evacuated. Therefore, at that time, there is a possibility that vacuum leakage may occur at the penetrating portion, but since the conveyor is not operated during the reaction, the vacuum leakage will not directly affect the quality of the produced film.

以上説明したように、本発明は反応室の前後に
設けられた室を利用してサセプタあるいは電極と
基板の挿入、薄膜生成反応工程、サセプタあるい
は電極とでき上り基板の取出しを反応室の真空を
破ることなく順次行い、その間をコンベヤによつ
て移動させることにより薄膜生成のタクト式流れ
作業を可能にしたもので、特に太陽電池用のアモ
ルフアスシリコン膜の量産に対して高い運転効率
によつて適用することができるので、得られる効
果は極めて大きい。
As explained above, the present invention utilizes the chambers provided before and after the reaction chamber to perform the insertion of the susceptor or electrode and the substrate, the thin film production reaction process, and the removal of the susceptor or electrode and the finished substrate using the vacuum in the reaction chamber. It enables tact-type assembly line work for thin film production by sequentially performing the process without breaking and moving between them using a conveyor, and is particularly effective for mass production of amorphous silicon films for solar cells due to its high operating efficiency. Since it can be applied, the effects obtained are extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明による薄膜生成装置の一実施例の断
面図である。 1……反応室、2……前室、3……後室、4,
5……扉、6,7,8……排気口、9……ベルト
コンベヤ、、10,11……レール、12,13
……給電導体、15……サセプタ、16,18…
…接触子、20……基板、21……ガス導入口。
The figure is a sectional view of an embodiment of a thin film production device according to the present invention. 1... Reaction chamber, 2... Front chamber, 3... Back chamber, 4,
5...Door, 6,7,8...Exhaust port, 9...Belt conveyor, 10,11...Rail, 12,13
...Feeding conductor, 15...Susceptor, 16, 18...
...Contactor, 20...Substrate, 21...Gas inlet.

Claims (1)

【特許請求の範囲】[Claims] 1 反応室内に対向配置された電極間に電圧を印
加してグロー放電を発生させ、反応室内に供給さ
れた反応ガスを分解して反応ガス成分の少くとも
一つを電極に支持された基板上に薄膜として堆積
させるものにおいて、反応室の両側に、それぞれ
開閉可能の気密扉を介して隣接する前室および後
室はそれぞれ独立して真空排気可能であり、さら
に前記三室にまたがつて可動のコンベヤと、三室
にまたがつて敷設され前記反応室内に位置する部
分が給電導体をなす二本のレールとが設けられ、
前記コンベヤ上に支持されて等間隔の対をなす電
極のそれぞれが前記レールの上を摺動する接触子
を介して前記給電導体のそれぞれと接続されたこ
とを特徴とする量産型薄膜生成装置。
1 A voltage is applied between electrodes arranged oppositely in the reaction chamber to generate a glow discharge, decompose the reaction gas supplied into the reaction chamber, and transfer at least one of the reaction gas components onto the substrate supported by the electrodes. In the case where a thin film is deposited on the reaction chamber, the front and rear chambers, which are adjacent to each other through airtight doors that can be opened and closed, can be independently evacuated, and a movable A conveyor and two rails are provided, which are laid across three chambers and whose portions located within the reaction chamber form a power supply conductor;
A mass-produced thin film production apparatus, characterized in that each of a pair of equally spaced electrodes supported on the conveyor is connected to each of the power supply conductors via a contact that slides on the rail.
JP56141840A 1981-09-09 1981-09-09 Mass-production type film fabricating device Granted JPS5843509A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56141840A JPS5843509A (en) 1981-09-09 1981-09-09 Mass-production type film fabricating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56141840A JPS5843509A (en) 1981-09-09 1981-09-09 Mass-production type film fabricating device

Publications (2)

Publication Number Publication Date
JPS5843509A JPS5843509A (en) 1983-03-14
JPS627686B2 true JPS627686B2 (en) 1987-02-18

Family

ID=15301368

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56141840A Granted JPS5843509A (en) 1981-09-09 1981-09-09 Mass-production type film fabricating device

Country Status (1)

Country Link
JP (1) JPS5843509A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02122459A (en) * 1988-10-31 1990-05-10 Matsushita Electric Ind Co Ltd cassette holder device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60240121A (en) * 1984-05-15 1985-11-29 Fujitsu Ltd Horizontal-type oven

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02122459A (en) * 1988-10-31 1990-05-10 Matsushita Electric Ind Co Ltd cassette holder device

Also Published As

Publication number Publication date
JPS5843509A (en) 1983-03-14

Similar Documents

Publication Publication Date Title
JP2948842B2 (en) In-line type CVD equipment
JPH0950992A (en) Film forming equipment
JPH03120362A (en) Plasma processing equipment and plasma processing method
KR20020062559A (en) Method of cleaning a cvd device
KR102236013B1 (en) A apparatus for depositing the atomic layer
JPS627686B2 (en)
US4834023A (en) Apparatus for forming deposited film
US5327624A (en) Method for forming a thin film on a semiconductor device using an apparatus having a load lock
JPH0366819B2 (en)
JPH0427293B2 (en)
JP2000195851A (en) Plasma processor and plasma processing method
JPH01103828A (en) Plasma cvd device
US6316748B1 (en) Apparatus for manufacturing a semiconductor device
JP2737540B2 (en) Method and apparatus for forming thin film transistors
JPS59167012A (en) Plasma cvd equipment
JPH01297818A (en) Plasma cvd device
JP4311223B2 (en) Thin film manufacturing apparatus, thin film manufacturing method, and thin film manufacturing apparatus cleaning method
JPH0324274A (en) Vapor phase growing device
KR100384500B1 (en) Self-cleaning method of thin film forming device
JPS6257213A (en) Plasma cvd apparatus
JPH01259175A (en) Plasma cvd device for forming multilayered film
JPH0152052B2 (en)
JPS6153784A (en) Manufacture of photovoltaic element
JP3059597B2 (en) Method and apparatus for manufacturing thin film
JPS5918195A (en) Thin film growth device in extremely high vacuum