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JPS629854B2 - - Google Patents
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JPS629854B2 - - Google Patents

Info

Publication number
JPS629854B2
JPS629854B2 JP21192481A JP21192481A JPS629854B2 JP S629854 B2 JPS629854 B2 JP S629854B2 JP 21192481 A JP21192481 A JP 21192481A JP 21192481 A JP21192481 A JP 21192481A JP S629854 B2 JPS629854 B2 JP S629854B2
Authority
JP
Japan
Prior art keywords
light
dew point
transparent object
temperature
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP21192481A
Other languages
Japanese (ja)
Other versions
JPS58113840A (en
Inventor
Tetsuo Yamaguchi
Akio Furuichi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN
Original Assignee
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN filed Critical RIKEN
Priority to JP21192481A priority Critical patent/JPS58113840A/en
Publication of JPS58113840A publication Critical patent/JPS58113840A/en
Publication of JPS629854B2 publication Critical patent/JPS629854B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/56Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 本発明は、光学式の露点検出装置に関する。一
般に、気体中で物体を冷却していつて表面に露が
できはじめるときの表面の温度を測定することに
より、気体の露点を求めることができる。この露
点を検知する装置としては、光学式の露点検出装
置が多く用いられている。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical dew point detection device. Generally, the dew point of a gas can be determined by cooling an object in a gas and measuring the temperature of the surface when dew begins to form on the surface. As a device for detecting this dew point, an optical dew point detection device is often used.

光学式の露点検出装置には、被測定気体中にサ
ーモモジユールなどで電子冷却し温度調節されて
いる金属鏡などの光反射体を配置して、この光反
射体に光を投射し、被測定気体の水分が光反射体
表面に結露しはじめて反射光量が低下するときの
光反射体の温度を測定することにより、被測定気
体の露点を測定することが行われている。
Optical dew point detection devices place a light reflector such as a metal mirror whose temperature is controlled by electronic cooling using a thermo module in the gas to be measured, and project light onto the light reflector to detect the target. The dew point of the gas to be measured is measured by measuring the temperature of the light reflector when the moisture in the gas to be measured begins to condense on the surface of the light reflector and the amount of reflected light decreases.

このように光学式露点検出装置では、結露によ
る反射光量の低下を検知するものであり、装置の
感度を向上させるためには、結露による反射光量
の低下が顕著に出力されることが望まれる。
As described above, the optical dew point detection device detects a decrease in the amount of reflected light due to dew condensation, and in order to improve the sensitivity of the device, it is desired that the decrease in the amount of reflected light due to dew condensation be outputted noticeably.

本発明は上記に鑑みなされたものであり、従来
の光学式露点検出装置の光反射体に代え透明物体
を用い、この透明物体に光を投射して該物体の光
の入・出側両表面の結露によつて生じる光の散乱
の度合を大きくし、結果として透過光量の低下分
を顕著に出力するようにして感度を向上せしめる
ようにしたものである。
The present invention has been made in view of the above, and uses a transparent object instead of the light reflector of a conventional optical dew point detection device, and projects light onto this transparent object to detect both the light entrance and exit surfaces of the object. The degree of light scattering caused by dew condensation is increased, and as a result, the decreased amount of transmitted light is outputted significantly, thereby improving sensitivity.

以下、添付図により従来装置と対比して本発明
を詳しく説明する。
Hereinafter, the present invention will be explained in detail in comparison with a conventional device with reference to the accompanying drawings.

第1図は従来の光学式露点検出装置の一例を示
す系統図である。被測定気体を入れるケース1内
に、金属鏡などの光反射体4,5を配置し、一方
の光反射体4のみサーモモジユールなどの温度調
節装置2で電子冷却し、測温体3で光反射体4の
表面の温度を測定する。発光ダイオードやランプ
などの光源6,7からの光をそれぞれ光反射体
4,5に投射し、各反射光をホトダイオードやホ
トトランジスタなどの光検出器8,9でそれぞれ
受光し、各受光量を比較増幅器10で比較・増幅
し出力する。被測定気体をケース1内に導入した
状態で光反射体4を徐々に冷却すると、光反射体
表面に結露が生じ反射光量が減少し、光検出器
8,9の受光量のバランスがくずれ、比較増幅器
10に出力が生じる。そのときの光反射体4の温
度を測温体3で測定して露点としている。
FIG. 1 is a system diagram showing an example of a conventional optical dew point detection device. Light reflectors 4 and 5 such as metal mirrors are arranged in a case 1 containing the gas to be measured, and only one light reflector 4 is electronically cooled with a temperature control device 2 such as a thermo module, and a temperature measuring element 3 is cooled. The temperature of the surface of the light reflector 4 is measured. Light from light sources 6 and 7 such as light emitting diodes and lamps is projected onto light reflectors 4 and 5, respectively, and each reflected light is received by photodetectors 8 and 9 such as photodiodes and phototransistors, respectively, and the amount of each received light is calculated. Comparison amplifier 10 compares and amplifies and outputs. When the light reflector 4 is gradually cooled while the gas to be measured is introduced into the case 1, dew condensation occurs on the surface of the light reflector, the amount of reflected light decreases, and the balance between the amount of light received by the photodetectors 8 and 9 is lost. An output is provided to comparison amplifier 10. The temperature of the light reflector 4 at that time is measured by the temperature measuring element 3 and determined as the dew point.

第2図は本発明の光学式露点検出装置の一例を
示す系統図である。被測定気体を入れるケース2
1内には、石英、ガラスなどの棒状の透明物体2
4,25をそれぞれ銅、黄銅など熱伝導性のよい
金属体31,32内に挿入・配置している。一方
の金属体31をサーモモジユールなどの温度調節
装置22で電子冷却して透明物体24を冷却し、
その表面の温度を測温体23で測定する。透明物
体24,25の両端面33,34と35,36は
いずれも平面研磨され、発光ダイオード、ランプ
などの光源26,27からの光を端面33,35
にそれぞれ投射し、透明物体24,25を透過し
た光をホトダイオード、ホトトランジスタなどの
光検出器28,29でそれぞれ受光し、各受光量
を比較増幅器30で比較・増幅し出力する。
FIG. 2 is a system diagram showing an example of the optical dew point detection device of the present invention. Case 2 containing gas to be measured
Inside 1, there is a rod-shaped transparent object 2 such as quartz or glass.
4 and 25 are inserted and arranged in metal bodies 31 and 32 having good thermal conductivity, such as copper and brass, respectively. One metal body 31 is electronically cooled with a temperature control device 22 such as a thermo module to cool the transparent object 24,
The temperature of the surface is measured by the temperature measuring element 23. Both end surfaces 33, 34 and 35, 36 of the transparent objects 24, 25 are both flat-polished, and light from light sources 26, 27 such as light emitting diodes and lamps is transmitted to the end surfaces 33, 35.
The light transmitted through transparent objects 24 and 25 is received by photodetectors 28 and 29, such as photodiodes and phototransistors, respectively, and the amounts of each received light are compared and amplified by a comparison amplifier 30 and output.

いま、温度調節装置22によつて金属体31を
介して透明物体24を徐々に冷却すると、端面3
3,34に結露が生じる。光源26からの光は入
射側の端面33の結露によつて散乱された後、更
に出射側の端面34の結露によつて散乱されるの
で、透明物体の透過光は2度にわたる散乱現象を
経たことになる。その結果、光検出器28の受光
量は従来の反射体を用いる場合に比較してほゞ半
減し、出力バランスしてある比較増幅器30の出
力差は大きくなり、露点をより高い感度で検出す
ることができる。
Now, when the transparent object 24 is gradually cooled through the metal body 31 by the temperature control device 22, the end surface 3
Condensation occurs on 3 and 34. The light from the light source 26 is scattered by condensation on the end face 33 on the incident side, and then further scattered by the condensation on the end face 34 on the output side, so that the light transmitted through the transparent object undergoes two scattering phenomena. It turns out. As a result, the amount of light received by the photodetector 28 is reduced by approximately half compared to when a conventional reflector is used, and the output difference of the balanced comparison amplifier 30 becomes larger, allowing dew point detection with higher sensitivity. be able to.

上述したように、本発明は透明物体の両端面で
の結露による二度にわたる光の散乱現象による透
過光量の低下分を検出する方式であるので、従来
の鏡面反射形式の一度の散乱現象による反射光量
の低下分を検出するのに比較して、感度よく露点
を検知することができ、その効果は極めて大き
い。
As mentioned above, the present invention detects the decrease in the amount of transmitted light due to the two-time light scattering phenomenon caused by dew condensation on both end faces of a transparent object. Compared to detecting a decrease in the amount of light, the dew point can be detected with higher sensitivity, and the effect is extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の光学式露点検出装置の一例を示
す系統図、第2図は本発明の露点検出装置の一例
を示す系統図である。 図中の符号:1,21…ケース、4,5…光反
射体、2,22…温度調節装置、24,25…透
明物体、3,23…測温体、6,7,26,27
…光源、8,9,28,29…光検出器、31,
32…金属体、10,30…比較増幅器、33,
34,35,36…端面。
FIG. 1 is a system diagram showing an example of a conventional optical dew point detection device, and FIG. 2 is a system diagram showing an example of the dew point detection device of the present invention. Codes in the diagram: 1, 21... Case, 4, 5... Light reflector, 2, 22... Temperature adjustment device, 24, 25... Transparent object, 3, 23... Temperature measuring element, 6, 7, 26, 27
...Light source, 8,9,28,29...Photodetector, 31,
32... Metal body, 10, 30... Comparison amplifier, 33,
34, 35, 36... end surface.

Claims (1)

【特許請求の範囲】[Claims] 1 露点を測定しようとする気体を入れる包囲空
間内に配置した透明物体、この透明物体に光を投
射する光源及び前記の透明物体を透過した光を受
け、そして透明物体の温度降下につれて該物体の
光の入・出側表面が結露して透過光量が減少する
ことを検知する装置を備えたことを特徴とする露
点検出装置。
1. A transparent object placed in an enclosed space containing the gas whose dew point is to be measured, a light source that projects light onto the transparent object, and a light source that receives the light transmitted through the transparent object, and as the temperature of the transparent object decreases, the temperature of the object decreases. A dew point detection device comprising a device that detects a decrease in the amount of transmitted light due to dew condensation on the light entrance and exit surfaces.
JP21192481A 1981-12-28 1981-12-28 dew point detection device Granted JPS58113840A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21192481A JPS58113840A (en) 1981-12-28 1981-12-28 dew point detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21192481A JPS58113840A (en) 1981-12-28 1981-12-28 dew point detection device

Publications (2)

Publication Number Publication Date
JPS58113840A JPS58113840A (en) 1983-07-06
JPS629854B2 true JPS629854B2 (en) 1987-03-03

Family

ID=16613918

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21192481A Granted JPS58113840A (en) 1981-12-28 1981-12-28 dew point detection device

Country Status (1)

Country Link
JP (1) JPS58113840A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02156574A (en) * 1988-12-08 1990-06-15 Matsushita Electric Ind Co Ltd Moisture condensation detecting element
GB9525823D0 (en) * 1995-12-18 1996-02-21 Protimeter Plc Apparatus for dewpoint determination
US7736051B2 (en) 2004-03-30 2010-06-15 Yamatake Corporation Thermoelectric device and mirror surface state detection device
JP2008144638A (en) * 2006-12-08 2008-06-26 Across Corp Piston

Also Published As

Publication number Publication date
JPS58113840A (en) 1983-07-06

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