JPS6312258B2 - - Google Patents
Info
- Publication number
- JPS6312258B2 JPS6312258B2 JP3628180A JP3628180A JPS6312258B2 JP S6312258 B2 JPS6312258 B2 JP S6312258B2 JP 3628180 A JP3628180 A JP 3628180A JP 3628180 A JP3628180 A JP 3628180A JP S6312258 B2 JPS6312258 B2 JP S6312258B2
- Authority
- JP
- Japan
- Prior art keywords
- ampoule
- star wheel
- detection
- pinhole
- pinholes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000003708 ampul Substances 0.000 claims description 64
- 238000001514 detection method Methods 0.000 claims description 36
- 239000000126 substance Substances 0.000 claims description 7
- 230000007547 defect Effects 0.000 claims description 4
- 229920003002 synthetic resin Polymers 0.000 claims description 4
- 239000000057 synthetic resin Substances 0.000 claims description 4
- 239000000615 nonconductor Substances 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims 1
- 238000007689 inspection Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 10
- 230000002950 deficient Effects 0.000 description 8
- 239000007788 liquid Substances 0.000 description 7
- 230000032258 transport Effects 0.000 description 4
- 241000894006 Bacteria Species 0.000 description 3
- 238000003908 quality control method Methods 0.000 description 3
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000003814 drug Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000011179 visual inspection Methods 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000000941 radioactive substance Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000010186 staining Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/20—Investigating the presence of flaws
- G01N27/205—Investigating the presence of flaws in insulating materials
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
【発明の詳細な説明】
この発明は、薬液等を内部に密封したアンプル
に高周波高圧の電圧を印加してピンホール等の欠
陥の検出を行うピンホール検出機に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a pinhole detector that detects defects such as pinholes by applying a high frequency and high voltage to an ampoule in which a chemical solution or the like is sealed.
医薬品は生命に関わるものであるから、極めて
高度な品質管理のもとに生産されるが、これを収
容する密封アンプルは一見欠陥がないように見え
ても、実際にはピンホールやクラツク等の欠陥の
ある不良品がかなりあるのが実情であり、密封状
態が完全でない限り細菌等の侵入による二次汚染
は避けられない。もし汚染された薬品が人体内に
注射された場合は重大な結果をまねくことから、
密封アンプルのピンホールやクラツク等を検出す
るリークテストは絶対かゝすことが出来ない。 Since pharmaceuticals are life-related, they are produced under extremely high quality control, but even though the sealed ampoules containing them may appear to have no defects at first glance, they actually have pinholes, cracks, etc. The reality is that there are a large number of defective and defective products, and unless they are completely sealed, secondary contamination due to the intrusion of bacteria and the like is unavoidable. If a contaminated drug is injected into the human body, it can lead to serious consequences.
A leak test that detects pinholes and cracks in sealed ampoules is absolutely impossible.
従来、アンプルのピンホール検出には真空染色
法が最も多く用いられて来た。この方法は、薬品
を密封したアンプルを容器に入れ、その容器をい
つたん真空にした後、色の着いた液を入れ、再び
空気を入れると、アンプルにピンホールがあれば
その瞬間着色液がアンプル内に入り、薬品が染色
されるので不良品を検出することができるもので
ある。この方法では判定を目視に頼るため、検査
員の能力や、内液のPH度、検査条件によつて検査
精度が異つたり、着色ガラス製アンプルや着色薬
液の場合は検査が困難である等の欠点があつた。
又5μ乃至3μ以下のピンホールは検出できないた
め、直径1μ程度である細菌の侵入可能なピンホ
ールは見逃され、又折角高度の品質管理下で生産
された薬品に染液が混入して汚染される欠点もあ
つた。 Conventionally, vacuum staining has been most commonly used to detect pinholes in ampoules. In this method, a sealed ampoule containing a chemical is placed in a container, the container is once evacuated, a colored liquid is poured in, and air is introduced again.If there is a pinhole in the ampoule, the colored liquid will immediately disappear. The chemical enters the ampoule and stains it, making it possible to detect defective products. Since this method relies on visual inspection, the accuracy of the test may vary depending on the ability of the inspector, the PH level of the internal liquid, and the test conditions, and it may be difficult to test colored glass ampoules or colored chemical solutions. There were some shortcomings.
In addition, pinholes smaller than 5μ to 3μ cannot be detected, so pinholes with a diameter of about 1μ through which bacteria can enter are overlooked, and chemicals produced under high quality control may be contaminated by dye liquor. There were also some drawbacks.
上記の真空染液法を改良した、半減期の短い放
射性物質を使用する方法や、結晶晶出法等も含め
て、従来のピンホール検出の方式はいずれもバツ
チ式目視検査であるために検査に時間が掛り、自
動化できないなどの問題点があつた。 Conventional pinhole detection methods, including methods that use radioactive substances with a short half-life that are an improvement on the vacuum dye method mentioned above, and crystallization methods, are all batch-type visual inspections. There were problems such as it was time consuming and could not be automated.
そこで、本発明者等は、先に従来の方法の問題
点を解決した、連続無人検査が可能であり、かつ
検出限界が高く、内液に影響を与えない高周波高
電圧によるピンホール検出法を開発し、製薬業界
の要望に応えた。 Therefore, the present inventors have developed a pinhole detection method using high frequency and high voltage that solves the problems of conventional methods, allows continuous unattended inspection, has a high detection limit, and does not affect the internal fluid. developed in response to the demands of the pharmaceutical industry.
この方式の原理を簡単に説明すると、第1図に
示す如く、導電性のある薬液2を内部に収容し密
封した絶縁性材料で作られたアンプル1の検査箇
所(図では枝先端部に先端表面積の小さい電極A
を、胴部等に表面積の大きいアース電極Bを配
し、高周波高圧交流電圧Vを印加すると、電気的
等価回路は第2図の如くになる。図において、V
は印加電圧
C1は電極Aと内容液2との間の静電容量
C2は電極Bと内容液2との間の静電容量
Rは内容液の電気抵抗
I1は検査品が良品の場合に回路に流れる微少電
流
である。 To briefly explain the principle of this method, as shown in Fig. 1, an ampoule 1 made of an insulating material that contains a conductive chemical solution 2 inside and is sealed is inspected at the inspection point (in the figure, the tip is placed at the tip of a branch). Electrode A with small surface area
If a ground electrode B with a large surface area is arranged on the body or the like and a high frequency, high voltage AC voltage V is applied, the electrical equivalent circuit becomes as shown in FIG. In the figure, V
is the applied voltage C 1 is the capacitance between electrode A and the liquid content 2 C 2 is the capacitance between the electrode B and the liquid content 2 R is the electrical resistance of the liquid content I 1 is whether the inspected product is good or not This is the minute current that flows through the circuit when
アンプル1の材料の厚さが均一であつても、対
向する2つの電極A,Bの表面積が異るため、
C2の静電容量はC1より大きくなる。したがつて、
高周波交流電源を用いた場合にはC2のインピー
ダンスはC1及びRに比べて無視することができ、
近似的には等価回路は第3図に示す如く、C1と
Rの直列回路とみなすことができる。 Even if the thickness of the material of the ampoule 1 is uniform, the surface areas of the two opposing electrodes A and B are different.
The capacitance of C 2 will be larger than that of C 1 . Therefore,
When using a high frequency AC power supply, the impedance of C 2 can be ignored compared to C 1 and R.
Approximately, the equivalent circuit can be regarded as a series circuit of C1 and R, as shown in FIG.
そこで、電源電圧Vを、アンプル1にピンホー
ルがあればC1の放電間隙に閃絡が発生し、ピン
ホールがなければ閃絡が起きないような電圧に設
定しておけば、電極A,B間にアンプル1を送入
すると、ピンホールが電極Aに対向する位置に来
たときに閃絡が起き、回路に放電電流I2が流れ
る。アンプルにピンホールがない場合は閃絡は発
生しないので、コンデンサーとしての機能を有す
るC1にもとずく微少電流I1しか流れない。従つて
回路に流れる電流を測定することによつてピンホ
ールの有無を判定することが出来る。 Therefore, if the power supply voltage V is set to a voltage such that if there is a pinhole in ampoule 1, a flash will occur in the discharge gap of C1 , but if there is no pinhole, flash will not occur. When ampoule 1 is introduced between electrodes B, a flashover occurs when the pinhole comes to a position facing electrode A, and a discharge current I 2 flows through the circuit. If there are no pinholes in the ampoule, no flashover will occur, so only a small current I1 will flow based on C1 , which functions as a capacitor. Therefore, the presence or absence of a pinhole can be determined by measuring the current flowing through the circuit.
この方法によれば、0.5μ以下の極く微小なピン
ホール迄検出することができるので、概ね1〜
10μの範囲にある各種の細菌の侵入できるピンホ
ールはすべて検出することが可能となつた。又、
判定は電流値によるので瞬間的に計測され、その
情報を利用して不良品を自動的に排除することも
出来る。さらに、内容液に異物が混入することも
ない等数々の長所がある。 According to this method, it is possible to detect pinholes as small as 0.5μ or less, so approximately 1~
It has now become possible to detect all pinholes within a 10μ range through which various types of bacteria can enter. or,
Since the determination is based on the current value, it is measured instantaneously, and using this information, it is also possible to automatically eliminate defective products. Furthermore, there are many advantages such as no foreign matter being mixed into the liquid content.
上述の高周波高電圧法によるピンホール検査の
ために従来使用されてきた装置は、第4図及び第
5図に示す如く、供給ホツパ3よりアンプル1を
1個づゝチエーンコンベア4の各リンク4aに設
けたV形凹部4bに落し込んで支承し、矢示で示
す方向に搬送し、その途中に設けられた検査電極
5,6により前述の方法でピンホール検出を行
い、ピンホールの検出されたアンプルは選別部7
で自動的に排除され、良品は排出スクリユー8に
乗り移り直立姿勢に移行してアンプル受台9に排
出し整列させるようになつていた。 The apparatus conventionally used for pinhole inspection by the above-mentioned high-frequency high-voltage method is as shown in FIGS. 4 and 5. It is supported by falling into a V-shaped recess 4b provided in the holder, and is transported in the direction shown by the arrow, and pinhole detection is performed using the above-mentioned method using the inspection electrodes 5 and 6 provided along the way. The ampoules are sorted in the sorting section 7.
The non-defective products are transferred to the ejection screw 8, which assumes an upright position, and are ejected onto the ampoule holder 9 where they are arranged.
上記の従来の装置においては、アンプル1を保
持し検出部に搬送するチエーンコンベア4は強度
上合成樹脂等の絶縁体を使用することが出来ない
ので、ステンレス鋼で作り、これをピンホール検
出用のアース電極に利用していた。そのため、電
極間距離を十分にとることができず、又チエーン
コンベアはその構造、取付方法の関係で汚れ易く
洗浄しにくいため検出精度を常に維持することが
むつかしい。又、アンプル1はチエーンコンベア
4の凹部4bに単に自重で乗つているだけである
ため、安定性が悪く高速処理に限度があり、さら
に、検査電極、選別部を水平方向に一直線に配置
する必要があるため、装置の横幅が広くなり、検
査個所の数を多くすることが困難である等の問題
を抱えていた。 In the conventional device described above, the chain conveyor 4 that holds the ampoule 1 and transports it to the detection section cannot be made of insulators such as synthetic resin due to its strength, so it is made of stainless steel and used for pinhole detection. It was used as a ground electrode. Therefore, it is not possible to maintain a sufficient distance between the electrodes, and the chain conveyor is easily soiled and difficult to clean due to its structure and mounting method, making it difficult to maintain detection accuracy at all times. In addition, since the ampoule 1 simply rests on the recess 4b of the chain conveyor 4 under its own weight, it is unstable and has a limit to high-speed processing.Furthermore, it is necessary to arrange the inspection electrodes and the sorting section in a straight line in the horizontal direction. Because of this, the width of the device becomes wide, making it difficult to increase the number of inspection points.
この発明は、従来の高周波高電圧方式のピンホ
ール検出機の上述の問題点を解決した、高い検出
精度を常に維持することができ、かつ高速自動処
理に適した同方式の密封アンプルのピンホール検
出機を提供することを目的とする。 This invention solves the above-mentioned problems of conventional high-frequency, high-voltage pinhole detectors, can always maintain high detection accuracy, and is suitable for high-speed automatic processing of pinholes in sealed ampoules. The purpose is to provide a detector.
以下、この発明を、その実施例を示す図面にも
とづいて詳細に説明する。 Hereinafter, the present invention will be described in detail based on drawings showing embodiments thereof.
第6図に全体を示す実施例において、動力部を
収納するケーシング10上に、図に向つて左よ
り、前下りに傾斜した供給ホツパ11、その出口
の直下より右方へ水平に設けられた供給スクリユ
ー12、その末端に続いて互いに周囲を接し、同
じ周速でそれぞれ矢印の方向に回転する供給スタ
ーホイール13、搬送スターホイール14、検出
メインスターホイール15、排出スターホイール
16の4個のホイール、排出スターホイール16
の直下より右方に向つて水平に設けられた排出ス
クリユー17及びこれに続いて設けられたアンプ
ル受台18が順次配設されている。 In the embodiment shown in its entirety in FIG. 6, on the casing 10 housing the power unit, from the left as viewed in the figure, a supply hopper 11 inclined forward and downward, and a supply hopper 11 horizontally provided to the right from just below the outlet thereof. A supply screw 12, followed by four wheels surrounding each other following the end thereof, a supply star wheel 13, a conveyance star wheel 14, a detection main star wheel 15, and a discharge star wheel 16, which rotate in the directions of arrows at the same circumferential speed. , discharge star wheel 16
An ejection screw 17 is disposed horizontally to the right from directly below the dispensing screw 17, and an ampoule holder 18 is disposed following the ejection screw 17.
アンプル1の搬送手段を構成する上記の各スク
リユー12,17及び各スターホイール13,1
4,15,16はケーシング10内に設けられた
1台の駆動モータにより、第8図に示す軸19及
び歯車機構20を介して同期して連続的に駆動さ
れる。 The above screws 12, 17 and star wheels 13, 1 constituting the conveying means for the ampoule 1
4, 15, and 16 are synchronously and continuously driven by one drive motor provided in the casing 10 via a shaft 19 and a gear mechanism 20 shown in FIG.
メインスターホイール15の外周に沿つて、ア
ンプル搬送方向に順次第1検出部21、第2検出
部22、第3検出部23及び選別部24が配設さ
れており、各検出部はそれぞれアンプルにおいて
ピンホールの発生し易い部位、即ち底部、枝端
部、肩部の検査を分担し、各部位の検査に適した
形状、配置の電極を有する。これら3個の検出部
への印加電圧の制御、ピンホールの検出、検出結
果にもとづく不良品の選別の制御は装置上部に配
置された検出制御部25において行なわれる。検
出部21,22,23のいずれかがピンホールを
検出した場合は、当該アンプルが選別部24の位
置に来た時点で選別部を作動させエアジエツトに
より当該アンプルをホイール15からはじき飛ば
して排除する。 Along the outer periphery of the main star wheel 15, a first detection section 21, a second detection section 22, a third detection section 23, and a sorting section 24 are arranged in order in the ampoule conveyance direction, and each detection section is arranged in order in the ampoule conveyance direction. It is responsible for inspecting areas where pinholes are likely to occur, ie, the bottom, branch ends, and shoulders, and has electrodes with shapes and arrangements suitable for inspection of each area. Control of the voltage applied to these three detection sections, detection of pinholes, and selection of defective products based on the detection results are performed by a detection control section 25 located at the top of the device. When any of the detection sections 21, 22, and 23 detects a pinhole, when the ampoule comes to the position of the sorting section 24, the sorting section is activated to flick the ampoule off the wheel 15 and remove it with an air jet.
各スターホイール13,14,15,16及び
これらの前後に設けられた搬送スクリユー12,
17との間の乗り移り部の詳細の正面図を第7図
に、側面図を第8図に示す。各スターホイール1
3,14,15,16の外周には同じ間隔でアン
プル保時用凹部26が設けられている。ピンホー
ル検出のためアンプル1を保持し、検出部に搬送
する検出メインスターホイール15は合成樹脂等
の電気的絶縁体で作られ、その外周部には第9図
に示す如く、全周にわたつて溝27が設けられて
おり、その両側のフランジ28,29にはアンプ
ル1の肩部及び腰部を抱持するに適した半円形断
面の凹部26a,26bが設けられている。この
凹部にアンプル1が保持された状態で、溝27の
底面がアンプルに接触しないように溝の深さは設
定されている。凹部26a,26bの最奥部より
ホイール15の中心に向つて孔30,31が穿設
され、これら2本の孔はホイール15の後面より
軸に平行に穿設した孔32に連通している。した
がつて、ホイール15の後面には、その周囲に設
けられたアンプル保持用凹部26の数と同数の孔
32が等間隔に1つの円周上に開口している。 Each star wheel 13, 14, 15, 16 and the conveyance screw 12 provided before and after these,
7 shows a detailed front view of the transition section between the main body 17 and FIG. 8, and FIG. Each star wheel 1
Ampoule time-keeping recesses 26 are provided at the same intervals on the outer peripheries of 3, 14, 15, and 16. The detection main star wheel 15, which holds the ampoule 1 and transports it to the detection section for pinhole detection, is made of electrically insulating material such as synthetic resin, and has a main star wheel 15 on its outer periphery, as shown in FIG. A groove 27 is provided, and flanges 28 and 29 on both sides thereof are provided with recesses 26a and 26b having semicircular cross sections suitable for holding the shoulder and waist portions of the ampoule 1. The depth of the groove is set so that the bottom surface of the groove 27 does not come into contact with the ampoule when the ampoule 1 is held in this recess. Holes 30 and 31 are drilled from the innermost parts of the recesses 26a and 26b toward the center of the wheel 15, and these two holes communicate with a hole 32 that is drilled from the rear surface of the wheel 15 parallel to the axis. . Therefore, the same number of holes 32 as the number of ampoule holding recesses 26 provided around the rear surface of the wheel 15 are opened on one circumference at equal intervals.
スターホイール15の軸33を軸支する軸受部
材34の前面には、上記の孔32の開口と対向す
る位置に円弧状の溝35が設けられ、溝35の周
囲とスターホイールの後面とは摺動自在にかつ気
密に接触している。又、溝35はエア吸引ホース
36及び吸気管37(第8図に示す)を介して、
ケーシング10内に設けられた真空ポンプに接続
されている。上記円弧状溝35を設ける範囲は、
スターホイール15が搬送スターホイール14よ
りアンプルを受取る点(第7図中のD点)とアン
プルを排出スターホイール16に渡す点(第7図
中のE点)の間に対応する範囲となつていて、孔
32が上記の溝35に開口する範囲では孔30,
31の内部は負圧となり、アンプル1は吸引され
確実に安定して凹部26a,26bに保持され、
孔32の開口の位置が溝35の範囲から外れると
アンプルに対する吸引力は解除される。 An arcuate groove 35 is provided on the front surface of the bearing member 34 that pivotally supports the shaft 33 of the star wheel 15 at a position facing the opening of the hole 32, and there is no sliding contact between the circumference of the groove 35 and the rear surface of the star wheel. They are in movable and airtight contact. Further, the groove 35 is connected to the air suction hose 36 and the intake pipe 37 (shown in FIG. 8).
It is connected to a vacuum pump provided within the casing 10. The range in which the arcuate groove 35 is provided is as follows:
The area corresponds to the point between the point at which the star wheel 15 receives the ampoule from the conveying star wheel 14 (point D in FIG. 7) and the point at which the ampoule is transferred to the discharge star wheel 16 (point E in FIG. 7). In the range where the hole 32 opens into the groove 35, the hole 30,
The inside of the ampoule 31 becomes negative pressure, and the ampoule 1 is sucked and held securely and stably in the recesses 26a and 26b.
When the position of the opening of the hole 32 moves out of the range of the groove 35, the suction force on the ampoule is released.
メインスターホイール15以外の3個のスター
ホイール13,14,16は必らずしも絶縁体で
作られる必要はなく、又凹部26に保持されたア
ンプル1を吸着する必要はない。本実施例におい
ては、供給スクリユー12よりガイドプレート3
8を経て供給スターホイール13に供給されたア
ンプル1は自重で凹部26に保持され次の搬送ス
ターホイール14に渡される。搬送スターホイー
ル14及び排出スターホイール16ではアンプル
1の搬送範囲が円周の下方を向いた部分となるた
め、それぞれの搬送範囲にはガードレール39,
40が設けられている。又、排出スクリユー17
に沿つて設けられたガイド41は途中から漸次傾
斜を変えて、アンプル受台18に直立姿勢でアン
プルを排出するようにされていることは従来の装
置と同様である。 The three star wheels 13, 14, 16 other than the main star wheel 15 do not necessarily need to be made of an insulator, and there is no need to attract the ampoule 1 held in the recess 26. In this embodiment, the guide plate 3 is
The ampoule 1 supplied to the supply star wheel 13 via the feeder 8 is held in the recess 26 by its own weight and is passed to the next conveying star wheel 14. In the conveyance star wheel 14 and the discharge star wheel 16, the conveyance range of the ampoule 1 is a downwardly facing part of the circumference, so guardrails 39,
40 are provided. Also, the ejection screw 17
Similar to the conventional device, the guide 41 provided along the ampoule holder 18 gradually changes its inclination midway to eject the ampoule in an upright position onto the ampoule holder 18.
この装置は以上の如く構成されているので、供
給ホツパ11の傾斜面に対して直立し、互いに自
重で押されながら出口の方に下降して来たアンプ
ル1は、供給スクリユー12により搬送されてガ
イドプレート38に案内されて1個ずつ供給スタ
ーホイール13の外周の凹部26に落込み、自重
で保持されたまゝ、隣接する搬送スターホイール
14との接触点迄搬送され、そこで同期して回転
している搬送スターホイール14の凹部に渡さ
れ、ガードレール39により凹部26より抜け落
ちないように支承されながら、メインスターホイ
ール15との接点D迄搬送される。アンプル1は
この点で同期して回つてきたスターホイール15
の凹部26,26a,26bに渡される。この点
では凹部26a,26bの底部よりホイール後面
迄の間に設けた孔は軸受部材34の前面の溝35
と連通しはじめるので、アンプル1は負圧により
凹部26a,26bに吸着されて安定して確実に
保持され、排出スターホイール16との接点E迄
搬送される。この間にアンプル1は、メインスタ
ーホイール15の外周に沿つて配設された第1検
出部21、第2検出部22、第3検出部23のそ
れぞれに設けられた両電極の間を通過し、高周波
高圧の交流電圧を印加され、順次底部、枝先端
部、肩部のピンホールの有無を検査される、いず
れかの検出部でピンホールが検出された場合は、
当該アンプルが選別部24を通過した時点で、検
出制御部25からの信号により選別部が作動して
エアジエツトで当該アンプルをホイールの凹部よ
り排除する。良品はE点で排出スターホイール1
6に渡され、この点でアンプル1を保持する凹部
に連通する吸引穴32は溝35から外れるのでア
ンプル1に対する吸引力が解除され、アンプルは
ガードプレート40に沿つて搬送され、排出スク
リユー17に乗り移り、ガイド41により直立姿
勢に変換させられた後、アンプル受台18に排出
され互に押されて前進し整列する。 Since this device is constructed as described above, the ampoules 1 that stand upright against the inclined surface of the supply hopper 11 and descend toward the outlet while being pushed by their own weight are transported by the supply screw 12. They are guided by the guide plate 38 and fall one by one into the recess 26 on the outer periphery of the supply star wheel 13, and are transported while being held by their own weight to the point of contact with the adjacent transport star wheel 14, where they rotate synchronously. The main star wheel 14 is supported by a guard rail 39 to prevent it from falling out of the recess 26, and is transported to a contact point D with the main star wheel 15. Ampoule 1 is the star wheel 15 that has been rotating synchronously at this point.
are passed through the recesses 26, 26a, 26b. In this respect, the holes provided between the bottoms of the recesses 26a and 26b and the rear surface of the wheel correspond to the grooves 35 on the front surface of the bearing member 34.
As the ampoule 1 begins to communicate with the discharge star wheel 16, the ampoule 1 is attracted to the recesses 26a and 26b by negative pressure, is held stably and reliably, and is conveyed to the contact point E with the discharge star wheel 16. During this time, the ampoule 1 passes between both electrodes provided on each of the first detection section 21, the second detection section 22, and the third detection section 23 arranged along the outer periphery of the main star wheel 15, If a pinhole is detected in any of the detection sections that apply a high-frequency, high-voltage AC voltage and sequentially inspect the bottom, branch tip, and shoulder for the presence of pinholes,
When the ampoule passes through the sorting section 24, the sorting section is actuated by a signal from the detection control section 25, and the ampoule is removed from the recess of the wheel using an air jet. For non-defective products, discharge star wheel 1 at point E.
At this point, the suction hole 32 communicating with the recess holding the ampoule 1 is removed from the groove 35, so the suction force on the ampoule 1 is released, and the ampoule is conveyed along the guard plate 40 to the ejection screw 17. After being transferred and converted into an upright position by the guide 41, the ampoules are discharged onto the ampoule holder 18 and are pushed together to move forward and line up.
さて、上記のピンホール等の欠陥の検出ならび
に不良品の排除は瞬間的に行なわれるので、メイ
ンスターホイール15は一定の速度で連続的に回
転させられることができるので搬送装置の駆動制
御は極めて容易になり、ホイールの発停による加
速度が生ずることもない。かつ、アンプルはメイ
ンスターホイール15の外周部に設けた凹部26
a,26bに負圧により確実に吸着されているこ
とと相まつて従来の装置よりも高速度で搬送する
ことが可能になる。又、アンプルに対する吸着力
は隣接する搬送ホイール14,16との接点で確
実に作動、解除されるので、アンプルの乗り移り
は確実容易になる。 Now, since the above-mentioned detection of defects such as pinholes and removal of defective products are done instantaneously, the main star wheel 15 can be rotated continuously at a constant speed, so the drive control of the conveying device is extremely difficult. This makes it easier, and there is no acceleration caused by starting or stopping the wheels. In addition, the ampoule is formed in a recess 26 provided on the outer periphery of the main star wheel 15.
Coupled with the fact that it is reliably adsorbed by negative pressure on a and 26b, it becomes possible to transport at a higher speed than with conventional devices. In addition, since the suction force for the ampoule is reliably activated and released at the contact point with the adjacent conveyor wheels 14 and 16, the ampoule can be transferred easily and reliably.
アンプルを保持し、検出部へ搬送する手段を回
転円板としたことによつて、検出部及び選別部を
水平に一直線に配設した場合よりも装置の幅が少
くて済み、かつ必要に応じて検出部の数を増すこ
とも容易となる。 By using a rotating disk as the means for holding the ampoule and transporting it to the detection section, the width of the device is smaller than when the detection section and the sorting section are arranged horizontally in a straight line, and the width of the device can be adjusted as needed. It also becomes easy to increase the number of detection units.
又、メインスターホイール15は合成樹脂等の
電気的絶縁体で作られていることにより、従来の
チエーンコンベアを用いた装置の如く、アンプル
の搬送保持部材をピンホール検査のためのアース
電極にする必要がなくなり、電極間距離を十分に
とることが出来、かつ電極の取外し取付け、洗浄
が容易となり、これらのことによつて検出精度が
向上するとともに常時その高精度を維持すること
が可能となる。 Furthermore, since the main star wheel 15 is made of an electrical insulator such as synthetic resin, the ampoule conveying and holding member can be used as a ground electrode for pinhole inspection, as in a conventional chain conveyor-based device. This eliminates the need for this, allows for sufficient distance between the electrodes, and makes it easier to remove, install, and clean the electrodes, which improves detection accuracy and makes it possible to maintain high accuracy at all times. .
さらに、上記メインスターホイール15の外周
には、その凹部に吸着保持されたアンプルにその
底面が接触しないような深さを持つた溝27が全
周にわたつて設けられているので、ホイールの凹
部の縁面の汚れによる両電極間の導電が防止さ
れ、検出精度の低下を防ぐことができる。 Furthermore, the outer periphery of the main star wheel 15 is provided with a groove 27 having a depth that prevents the bottom surface from coming into contact with the ampoule suctioned and held in the recess, so that the recess of the wheel This prevents electrical conduction between the two electrodes due to dirt on the edge surface of the sensor, thereby preventing a decrease in detection accuracy.
なお、高周波高電圧法ピンホール検査において
は、閃絡が発生した場合、人体に有害なオゾンが
発生するが、アンプルを吸着している負圧によつ
てこのオゾンはアンプルと凹部との間隙から孔3
0に吸込まれ、真空ポンプを介して屋外に排除す
ることができる。 In high-frequency, high-voltage method pinhole inspection, when a flashover occurs, ozone, which is harmful to the human body, is generated, but due to the negative pressure that attracts the ampoule, this ozone is released from the gap between the ampoule and the recess. Hole 3
0 and can be expelled outdoors via a vacuum pump.
以上の如く、本発明によれば、アンプルのピン
ホール検査を従来より高精度に、常時その精度を
維持して、自動的に行うことができ、しかも処理
速度が格段に向上するので、製造ラインにその
まゝ組込むことも可能となり、密封アンプルの量
産、自動化、品質管理等に顕著な効果が得られ
る。 As described above, according to the present invention, ampoule pinhole inspection can be performed automatically with higher precision than before, while maintaining that precision at all times, and the processing speed is significantly improved. It is also possible to directly incorporate it into the system, resulting in remarkable effects on mass production, automation, quality control, etc. of sealed ampoules.
第1乃至第3図は高周波高圧法ピンホール検出
法の原理を説明する回路図、第4図は上記検出法
による従来の代表的なアンプルのピンホール検出
機の一例を示す正面図、第5図はその搬送装置を
構成するチエーンコンベアの一部を示す正面図、
第6図は本発明の実施例の全体正面図、第7図は
そのアンプル保持搬送装置を拡大して示した正面
図、第8図はその側面図、第9図はそのメインス
ターホイールの要部断面を拡大して示した図式図
である。
1……アンプル、15……回転円板(メインス
ターホイール)、21,22,23……検出部、
26……アンプル保持用凹部、27……溝、36
……エア吸引ホース。
Figures 1 to 3 are circuit diagrams explaining the principle of the high-frequency, high-pressure pinhole detection method, Figure 4 is a front view showing an example of a typical conventional ampoule pinhole detector using the above detection method, and Figure 5. The figure is a front view showing a part of the chain conveyor that makes up the conveyance device.
Fig. 6 is an overall front view of an embodiment of the present invention, Fig. 7 is an enlarged front view of the ampoule holding and conveying device, Fig. 8 is a side view thereof, and Fig. 9 is an essential part of the main star wheel. FIG. 3 is a schematic diagram showing an enlarged cross-section of a portion. 1... Ampoule, 15... Rotating disk (main star wheel), 21, 22, 23... Detection section,
26... Ampoule holding recess, 27... Groove, 36
...Air suction hose.
Claims (1)
圧の電圧を印加してピンホール等の欠陥の検出を
行うピンホール検出機において、アンプルを保持
し検出部に搬送する手段として、負圧によりアン
プルを吸着する凹部が外周面に設けられていると
ともに少くとも周辺部が合成樹脂等の電気的絶縁
体で作られている回転体を有することを特徴とす
るピンホール検出機。 2 前記のアンプルを保持搬送する回転円板の外
周面全周にわたつて溝が設けられ、かつその溝は
外周に設けた凹部にアンプルが吸着保持された状
態で溝の底面がアンプルに接触しない深さを有す
ることを特徴とする特許請求の範囲第1項記載の
ピンホール検出機。[Claims] 1. In a pinhole detector that detects defects such as pinholes by applying high-frequency, high-voltage voltage to an ampoule in which a chemical solution or the like is sealed, as a means for holding the ampoule and transporting it to a detection unit. 1. A pinhole detector, comprising a rotating body having a concave portion on its outer circumferential surface that attracts an ampoule by negative pressure, and at least a peripheral portion of the rotating body made of an electrical insulator such as a synthetic resin. 2. A groove is provided all around the outer circumferential surface of the rotary disk that holds and conveys the ampoule, and the bottom surface of the groove does not come into contact with the ampoule when the ampoule is suctioned and held in the recess provided on the outer periphery. The pinhole detector according to claim 1, characterized in that the pinhole detector has a depth.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3628180A JPS56133654A (en) | 1980-03-24 | 1980-03-24 | Detecting machine for pinhole of airtight ampul |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3628180A JPS56133654A (en) | 1980-03-24 | 1980-03-24 | Detecting machine for pinhole of airtight ampul |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56133654A JPS56133654A (en) | 1981-10-19 |
| JPS6312258B2 true JPS6312258B2 (en) | 1988-03-18 |
Family
ID=12465393
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3628180A Granted JPS56133654A (en) | 1980-03-24 | 1980-03-24 | Detecting machine for pinhole of airtight ampul |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56133654A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5996925B2 (en) * | 2012-05-07 | 2016-09-21 | 葵精機株式会社 | Cylindrical container feeder |
| DE202012009944U1 (en) * | 2012-10-12 | 2014-01-20 | Seidenader Maschinenbau Gmbh | Device for testing products |
-
1980
- 1980-03-24 JP JP3628180A patent/JPS56133654A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56133654A (en) | 1981-10-19 |
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