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JPS6312378B2 - - Google Patents
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JPS6312378B2 - - Google Patents

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Publication number
JPS6312378B2
JPS6312378B2 JP57186302A JP18630282A JPS6312378B2 JP S6312378 B2 JPS6312378 B2 JP S6312378B2 JP 57186302 A JP57186302 A JP 57186302A JP 18630282 A JP18630282 A JP 18630282A JP S6312378 B2 JPS6312378 B2 JP S6312378B2
Authority
JP
Japan
Prior art keywords
light source
chamber
gas
gas introduction
photochemical reaction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57186302A
Other languages
Japanese (ja)
Other versions
JPS5975621A (en
Inventor
Hiromi Ito
Masahiro Hatanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP57186302A priority Critical patent/JPS5975621A/en
Publication of JPS5975621A publication Critical patent/JPS5975621A/en
Publication of JPS6312378B2 publication Critical patent/JPS6312378B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
    • C23C16/482Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using incoherent light, UV to IR, e.g. lamps
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
    • C23C16/488Protection of windows for introduction of radiation into the coating chamber
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/24Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3404Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
    • H10P14/3411Silicon, silicon germanium or germanium

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)

Description

【発明の詳細な説明】 この発明は、光化学反応により半導体などの基
板上に膜を形成する、膜形成装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a film forming apparatus that forms a film on a substrate such as a semiconductor by photochemical reaction.

従来、この種の膜形成装置として、第1図に縦
断面図で示すものがあつた。1は光を透過する石
英材からなる密閉容器で、反応気体導入配管2及
び真空引用排気配管3が設けられている。4は密
閉容器1内に設けられた受け座で、半導体基板7
を載せる。5は例えば水銀ランプなど光化学反応
させる光を投射する光源、6はこの光源の背部側
を囲い光を密閉容器1内側に反射させる反射板で
ある。
Conventionally, as a film forming apparatus of this type, there has been one shown in a vertical cross-sectional view in FIG. Reference numeral 1 denotes a closed container made of quartz material that transmits light, and is provided with a reaction gas introduction pipe 2 and a vacuum exhaust pipe 3. Reference numeral 4 denotes a receiving seat provided in the airtight container 1, on which the semiconductor substrate 7 is placed.
Put on. Reference numeral 5 designates a light source such as a mercury lamp, which projects light that causes a photochemical reaction, and reference numeral 6 designates a reflecting plate that surrounds the back side of this light source and reflects the light to the inside of the sealed container 1.

上記従来の装置による薄膜形成は、次のように
していた。容器1内を排気後、反応気体として、
例えばSiH4のようなモノシランを導入する。光
源5から光を投射し、容器1内の半導体基板7上
を照射する。こうして、反応気体を光化学反応さ
せ、半導体基板7上に薄膜、例えば非晶質シリコ
ン膜が形成される。光により選択的照射すること
により、所定のパターンの薄膜が形成できる。
Thin film formation using the above-mentioned conventional apparatus was performed as follows. After evacuating the inside of the container 1, as a reaction gas,
For example, a monosilane such as S i H 4 is introduced. Light is projected from the light source 5 and irradiates onto the semiconductor substrate 7 inside the container 1. In this way, the reactive gas undergoes a photochemical reaction, and a thin film, for example, an amorphous silicon film, is formed on the semiconductor substrate 7. By selectively irradiating with light, a thin film with a predetermined pattern can be formed.

上記従来の装置では、密閉容器1の内壁にも非
晶質シリコンが付着し、光の透過を妨げ、このた
め、半導体基板7上に薄膜の積もる速度が極端に
遅くなつてしまい、また、薄膜にむらができる欠
点があつた。
In the conventional device described above, amorphous silicon also adheres to the inner wall of the sealed container 1, blocking the transmission of light, and as a result, the speed at which the thin film is deposited on the semiconductor substrate 7 is extremely slow. It had the drawback of causing unevenness.

この発明は、容器を光源室と気体導入室と光化
学反応室とに3分割し、光源室内壁を光源を焦点
とするだ円形の反射面にし、光源からの光を透過
する仕切り板により光源室と気体導入室とを仕切
り、気体導入室の下部を上記光源室のだ円形面の
他の焦点位置で絞り、気体導入室の下部に結合し
た光化学反応室の内部下方に基板を置き、気体導
入室に不活性気体を導入して仕切り板の下面側を
覆い、光化学反応室に上方から導入した反応気体
を下方に吹出すようにし、光源からの光を効率よ
く照射し、光化学反応室へ入る光の減衰を防ぎ、
膜の形成速度を向上し、膜厚を均一にし、生産性
を向上し、点検補修を容易にした、光化学反応に
よる膜形成装置を提供することを目的としてい
る。
In this invention, the container is divided into three parts: a light source chamber, a gas introduction chamber, and a photochemical reaction chamber, the wall of the light source chamber is made into an oval reflecting surface with the light source as the focal point, and a partition plate that transmits light from the light source is installed in the light source chamber. and the gas introduction chamber, the lower part of the gas introduction chamber is focused at another focal point of the elliptical surface of the light source chamber, the substrate is placed lower inside the photochemical reaction chamber connected to the lower part of the gas introduction chamber, and the gas is introduced. An inert gas is introduced into the chamber to cover the bottom side of the partition plate, so that the reactive gas introduced from above into the photochemical reaction chamber is blown out downwards, efficiently irradiating light from the light source, and entering the photochemical reaction chamber. Prevents light attenuation,
The object of the present invention is to provide a film forming device using a photochemical reaction that increases the film formation speed, makes the film thickness uniform, improves productivity, and facilitates inspection and repair.

第2図はこの発明の一実施例による膜形成装置
の概要縦断面図である。10は光化学反応をさせ
る光源で、例えば水銀ランプからなる。11はこ
の光源10の位置を一方の焦点としただ円形面を
なし、鏡面仕上された内壁面を反射面とし、上方
及び側周を囲い光源室12を形成する上部囲い体
で、金属材からなる。13は上部囲い体11の下
部にOリング16を介し気密に結合された中間部
囲い体で、金属材などからなり、気体導入室14
を形成している。この気体導入室14は内部の中
間部が次第に絞られて絞り孔部15が形成され、
光源室12のだ円形面の他方の焦点となる位置に
されており、この絞り孔部は光源10の直径t1
同程度の大きさt2にされている。17は気体導入
室14の上部にOリング18を介し気密に取付け
られた仕切り板で、光源室12と気体導入室14
とを仕切つており、光源室12から照射され光化
学反応に使用するための波長の光を透過させる材
質、例えば石英板からなる。19は気体導入室1
4の上方側に設けられた上部の気体導入配管で、
アルゴン、窒素などの不活性気体を外部から導入
し、仕切り板17の下面へ向けて気流を生じさせ
る。20は気体導入室14の絞り孔部15の下方
位置に設けられた中間部の気体導入配管で、上記
配管19と同様の不活性気体を外部から導入し、
下方に吹出す。21は気体導入室14の下方に設
けられた反応気体の導入配管で、たとえば環状を
なし、光化学反応をする反応気体、例えば、Si
H4を外部から導入し、下部に設けられた複数の
吐出し口から下方に吹出す。22は中間部囲い体
13の下部にOリング24を介し気密に結合され
た下部囲い体で、金属材などからなり、光化学反
応室23を形成している。25は光化学反応室2
3の底部に設けられた受台で、金属材からなりヒ
ータ26を組込んでいる。27は受台25上の石
英材などからなるサセプタで、半導体基板7を載
せる。この基板7は、上記光源室12から照射し
て他方の焦点をなす絞り穴部15を通つた光に照
射され、光化学反応により生成された反応物によ
り上面に薄膜が形成される。28は光化学反応室
24の下部に受台25の両側に設けられた排気配
管で、不活性気体及び反応気体を導入する前に、
気体導入室14及び光化学反応室24内を排気し
真空状態にし、不活性気体及び反応気体の導入中
は、反応気体を所定圧に維持するように排気す
る。
FIG. 2 is a schematic longitudinal sectional view of a film forming apparatus according to an embodiment of the present invention. Reference numeral 10 denotes a light source that causes a photochemical reaction, and is composed of, for example, a mercury lamp. Reference numeral 11 denotes an upper enclosure body which has an elliptical surface with one focal point at the position of the light source 10, has a mirror-finished inner wall surface as a reflective surface, and surrounds the upper and side peripheries to form the light source chamber 12. It is made of metal material. Become. An intermediate enclosure 13 is airtightly connected to the lower part of the upper enclosure 11 via an O-ring 16, and is made of a metal material.
is formed. The gas introduction chamber 14 is gradually narrowed down at the middle portion thereof to form a throttle hole portion 15.
It is located at the other focal point of the elliptical surface of the light source chamber 12, and this aperture hole has a size t2 that is approximately the same as the diameter t1 of the light source 10. Reference numeral 17 denotes a partition plate airtightly attached to the upper part of the gas introduction chamber 14 via an O-ring 18, which separates the light source chamber 12 and the gas introduction chamber 14.
It is made of a material, such as a quartz plate, that transmits light of a wavelength used for photochemical reactions that is irradiated from the light source chamber 12. 19 is gas introduction chamber 1
In the upper gas introduction pipe provided on the upper side of 4,
An inert gas such as argon or nitrogen is introduced from the outside to generate an airflow toward the lower surface of the partition plate 17. Reference numeral 20 denotes an intermediate gas introduction pipe provided below the throttle hole 15 of the gas introduction chamber 14, through which an inert gas similar to the pipe 19 is introduced from the outside;
Blows out downward. Reference numeral 21 denotes a reaction gas introduction pipe provided below the gas introduction chamber 14, which has a ring shape, for example, and is used to carry a reaction gas that undergoes a photochemical reaction, such as S i
H 4 is introduced from the outside and blown out from multiple outlets provided at the bottom. A lower enclosure 22 is airtightly connected to the lower part of the intermediate enclosure 13 via an O-ring 24, and is made of metal or the like and forms a photochemical reaction chamber 23. 25 is photochemical reaction chamber 2
3, which is made of metal and has a heater 26 built into it. Reference numeral 27 denotes a susceptor made of quartz or the like on the pedestal 25, on which the semiconductor substrate 7 is placed. This substrate 7 is irradiated with light emitted from the light source chamber 12 and passed through the aperture hole 15 forming the other focal point, and a thin film is formed on the upper surface by reactants generated by a photochemical reaction. Reference numeral 28 denotes exhaust pipes installed on both sides of the pedestal 25 at the bottom of the photochemical reaction chamber 24, and before introducing the inert gas and the reaction gas,
The gas introduction chamber 14 and the photochemical reaction chamber 24 are evacuated to a vacuum state, and during the introduction of the inert gas and the reaction gas, the reaction gas is evacuated so as to maintain the reaction gas at a predetermined pressure.

上記一実施例の装置において、排気された光化
学反応室24に導入配管21から下方へ向けて反
応気体が吹出され、基板7上に拡散して排気配管
28へ向かう流れとなる。また、仕切り板17の
下面は、上部の導入配管19から導入される不活
性気体に常に覆われ、反応気体に接触することが
防せがれる。中間部の導入配管20からの不活性
気体は下方に吹出され、反応気体を下方に追いや
る。こうして、光源室12からの照射光は仕切り
板17を減衰されることなく透過し、基板7上を
照射し、反応気体が光化学反応をし、基板7上に
薄膜が形成される。
In the apparatus of the above embodiment, the reaction gas is blown downward from the introduction pipe 21 into the evacuated photochemical reaction chamber 24, diffuses onto the substrate 7, and flows toward the exhaust pipe 28. Further, the lower surface of the partition plate 17 is always covered with the inert gas introduced from the upper introduction pipe 19, and is prevented from coming into contact with the reaction gas. The inert gas from the intermediate introduction pipe 20 is blown downward, driving the reaction gas downward. In this way, the irradiated light from the light source chamber 12 is transmitted through the partition plate 17 without being attenuated and irradiated onto the substrate 7, the reaction gas undergoes a photochemical reaction, and a thin film is formed on the substrate 7.

なお、上記実施例では、基板として半導体基板
の場合を示したが、これに限らず他の種類の基板
の場合にも適用できるものである。
In the above embodiments, a semiconductor substrate is used as the substrate, but the present invention is not limited to this and can be applied to other types of substrates.

また、基板上に形成される膜は、薄膜の場合を
説明したが、厚膜の場合でも適用できるものであ
る。
Moreover, although the case where the film formed on the substrate is a thin film has been described, the present invention can also be applied to a case where the film is a thick film.

さらに、膜の種類は半導体膜に限らず、絶縁
膜、金属膜の場合であつてもよい。
Further, the type of film is not limited to a semiconductor film, and may be an insulating film or a metal film.

なおまた、上記実施例では、気体導入室14に
中間部の気体導入配管20を設けたが、上部の気
体導入配管19からの不活性気体のみで、反応気
体の上昇を阻止できる場合は、気体導入配管20
は省いてもよい。
Furthermore, in the above embodiment, the gas introduction pipe 20 in the middle part was provided in the gas introduction chamber 14, but if the rise of the reaction gas can be prevented only by the inert gas from the gas introduction pipe 19 in the upper part, the gas Introduction piping 20
may be omitted.

なお、第2図はこの発明の一実施例の装置の縦
断面を示しており、側面断面の形状は第2図の形
状でなくてもよく、場合により適応した形状にす
る。すなわち、光源として棒状ランプの場合は、
ランプ長手方向に対して、光源室と円形反射面は
長手方向に延び、中間囲い体及び絞り孔部は長手
方向に延びた形状にする。
Note that FIG. 2 shows a longitudinal section of an apparatus according to an embodiment of the present invention, and the shape of the side cross section does not have to be the shape shown in FIG. 2, but may be an appropriate shape depending on the situation. In other words, if a bar lamp is used as the light source,
With respect to the longitudinal direction of the lamp, the light source chamber and the circular reflecting surface extend in the longitudinal direction, and the intermediate enclosure and the aperture hole extend in the longitudinal direction.

以上のように、この発明によれば、光源室と気
体導入室及び光化学反応室とに3分割し、光源室
と気体導入室とを、光源室からの光を透過する仕
切り板で仕切り、気体導入室に導入した不活性気
体により仕切り板の下面側を覆い、気体導入室の
下方に導入した反応気体を下方に吹出し、光化学
反応室の下部に置いてある基板側に向けるように
し、光源室の内壁面を光源を焦点とするだ円形の
反射面にし、また、気体導入室の中間を光源室の
だ円形の反射面の他の焦点位置で絞つたので、光
源からの投射光が減衰することなく仕切り板を透
過して照射され、従来に比べ、膜の形成速度が早
くなり、生産性が向上し、膜厚さが均一にでき品
質が向上される。また、光源室、気体導入室、光
化学反応室に3分割して構成したので、点検補修
が容易になる。
As described above, according to the present invention, the light source chamber, the gas introduction chamber, and the photochemical reaction chamber are divided into three parts, and the light source chamber and the gas introduction chamber are partitioned by a partition plate that transmits light from the light source chamber, and the gas introduction chamber is divided into three parts. The inert gas introduced into the introduction chamber covers the bottom side of the partition plate, and the reaction gas introduced below the gas introduction chamber is blown out downward and directed toward the substrate placed at the bottom of the photochemical reaction chamber. The inner wall surface of the light source is an elliptical reflecting surface with the light source as the focal point, and the middle of the gas introduction chamber is focused at the other focal point of the elliptical reflecting surface of the light source chamber, so the projected light from the light source is attenuated. The irradiation is transmitted through the partition plate without any problems, and compared to conventional methods, the film formation speed is faster, productivity is improved, and the film thickness can be made uniform to improve quality. In addition, since the chamber is divided into three parts: a light source chamber, a gas introduction chamber, and a photochemical reaction chamber, inspection and repair are easy.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の膜形成装置を示す概要縦断面
図、第2図はこの発明の一実施例による膜形成装
置を示す概要縦断面図である。 7…基板、10…光源、11…上部囲い体、1
2…光源室、13…中間部囲い体、14…気体導
入室、15…絞り孔部、17…仕切り板、19…
気体導入配管、20…中間部気体導入配管、21
…反応気体導入配管、22…下部囲い体、23…
光化学反応室、25…受台、28…排気配管。な
お、図中同一符号は同一又は相当部分を示す。
FIG. 1 is a schematic vertical cross-sectional view showing a conventional film forming apparatus, and FIG. 2 is a schematic vertical cross-sectional view showing a film forming apparatus according to an embodiment of the present invention. 7... Substrate, 10... Light source, 11... Upper enclosure, 1
2... Light source chamber, 13... Intermediate enclosure, 14... Gas introduction chamber, 15... Diaphragm hole portion, 17... Partition plate, 19...
Gas introduction piping, 20...Intermediate gas introduction piping, 21
...Reaction gas introduction pipe, 22... Lower enclosure, 23...
Photochemical reaction chamber, 25... pedestal, 28... exhaust piping. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】 1 反応気体に光化学反応を生じさせる光を投射
する光源、この光源の上方及び側方を囲い、内壁
面が上記光源を一方の焦点とするだ円形の反射面
にされていて、光源室を形成する上部囲い体、こ
の上部囲い体の下部に気密に結合され、上記だ円
形の反射面に対する他方の焦点位置に、中間部が
上記光源とほぼ同一大きさに絞られた絞り孔部が
設けられ、上記光源からの投射光と上記反射面か
らの反射光とを下方に通すようにしていて、気体
導入室を形成する中間部囲い体、この中間部囲い
体の上部に気密に取付けられ、上記光源室と上記
気体導入室とを仕切つており、上記光源室からの
照射光を透過する仕切り板、上記中間部囲い体に
上記絞り孔部の上方位置に配設され、外部からの
不活性気体を導入し、上記仕切り板の下面側を覆
わせる気体導入配管、上記中間部囲い体の下部に
気密に結合され、下部の受台上の基板を囲い、光
化学反応室を形成する下部囲い体、上記気体導入
室の下方位置に配設され、外部からの反応気体を
導入して下方に吹出し、上記基板上方に充満させ
る反応気体導入配管、及び上記下部囲い体の下部
に配設され、上記光化学反応室の気体の一部を吸
出し所定の気圧に維持するための排気配管を備え
た光化学反応による膜形成装置。 2 仕切り板は石英板からなることを特徴とする
特許請求の範囲第1項記載の光化学反応による膜
形成装置。 3 中間部囲い体には、絞り孔部の下部近傍位置
に中間部気体導入配管を配設してあり、外部から
の不活性気体を吹出し、反応気体の上昇を阻止す
るようにしたことを特徴とする特許請求の範囲第
1項記載の光化学反応による膜形成装置。
[Scope of Claims] 1. A light source that projects light that causes a photochemical reaction in a reactive gas, which surrounds the top and sides of this light source, and whose inner wall surface is an elliptical reflective surface with the light source as one focal point. an upper enclosure forming a light source chamber; the upper enclosure is airtightly connected to the lower part of the upper enclosure, and at the other focal point with respect to the oval reflecting surface, the middle part is narrowed to approximately the same size as the light source; An intermediate enclosure is provided with an aperture hole to allow the projected light from the light source and the reflected light from the reflective surface to pass downward, and forms a gas introduction chamber; a partition plate that is airtightly attached and partitions the light source chamber and the gas introduction chamber and that transmits the irradiated light from the light source chamber, and is disposed in the intermediate enclosure at a position above the aperture hole; A gas introduction pipe for introducing an inert gas from the outside and covering the lower side of the partition plate, airtightly connected to the lower part of the intermediate enclosure, surrounding the substrate on the lower pedestal, and forming a photochemical reaction chamber. a lower enclosure to be formed, a reaction gas introduction pipe arranged below the gas introduction chamber, which introduces a reaction gas from the outside and blows it out downward to fill the area above the substrate; A film forming apparatus using a photochemical reaction, which is provided with an exhaust pipe for sucking out a part of the gas in the photochemical reaction chamber and maintaining the pressure at a predetermined pressure. 2. The film forming device by photochemical reaction according to claim 1, wherein the partition plate is made of a quartz plate. 3. The intermediate enclosure is equipped with an intermediate gas introduction pipe near the bottom of the throttle hole, which blows out inert gas from the outside and prevents the reaction gas from rising. A film forming apparatus using a photochemical reaction according to claim 1.
JP57186302A 1982-10-22 1982-10-22 Film forming device using photochemical reaction Granted JPS5975621A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57186302A JPS5975621A (en) 1982-10-22 1982-10-22 Film forming device using photochemical reaction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57186302A JPS5975621A (en) 1982-10-22 1982-10-22 Film forming device using photochemical reaction

Publications (2)

Publication Number Publication Date
JPS5975621A JPS5975621A (en) 1984-04-28
JPS6312378B2 true JPS6312378B2 (en) 1988-03-18

Family

ID=16185941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57186302A Granted JPS5975621A (en) 1982-10-22 1982-10-22 Film forming device using photochemical reaction

Country Status (1)

Country Link
JP (1) JPS5975621A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61208213A (en) * 1985-03-12 1986-09-16 Tokyo Erekutoron Kk Photochemical vapor deposition apparatus
US5215588A (en) * 1992-01-17 1993-06-01 Amtech Systems, Inc. Photo-CVD system
JP2953426B2 (en) * 1997-05-01 1999-09-27 日本電気株式会社 LSI manufacturing process equipment
TW201122148A (en) * 2009-12-24 2011-07-01 Hon Hai Prec Ind Co Ltd Chemical vapor deposition device
DE102011056811A1 (en) * 2011-12-21 2013-06-27 Forschungszentrum Jülich GmbH Method for protecting the surface of an optical component and device for processing workpieces

Also Published As

Publication number Publication date
JPS5975621A (en) 1984-04-28

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