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JPS631536B2 - - Google Patents
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JPS631536B2 - - Google Patents

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Publication number
JPS631536B2
JPS631536B2 JP54088634A JP8863479A JPS631536B2 JP S631536 B2 JPS631536 B2 JP S631536B2 JP 54088634 A JP54088634 A JP 54088634A JP 8863479 A JP8863479 A JP 8863479A JP S631536 B2 JPS631536 B2 JP S631536B2
Authority
JP
Japan
Prior art keywords
detection element
detection
object detection
time
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54088634A
Other languages
Japanese (ja)
Other versions
JPS5612569A (en
Inventor
Takeshi Aoki
Shigeru Yoneda
Takashi Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP8863479A priority Critical patent/JPS5612569A/en
Publication of JPS5612569A publication Critical patent/JPS5612569A/en
Publication of JPS631536B2 publication Critical patent/JPS631536B2/ja
Granted legal-status Critical Current

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Geophysics And Detection Of Objects (AREA)

Description

【発明の詳細な説明】 本発明は物体に接触することに依つて検出素子
の熱容量が変化し、その変化に依つて変動する電
圧をデジタル的に処理して物体の有無を検出する
物体検出装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention is an object detection device in which the heat capacity of a detection element changes when it comes into contact with an object, and digitally processes the voltage that fluctuates depending on the change to detect the presence or absence of an object. Regarding.

一般に物体の有無を検出する必要がある場合、
例えば製氷機等に於いて氷が製造されて貯氷室に
氷が一定レベルに達したか否かは光電素子あるい
は機械的サーモ手段に依つて検出するが、製氷機
等は湿気が多く且つ低温度であるため霜が付着し
たり、あるいは機械的接点が凍りついたりして誤
動作する危具を有していた。
Generally when you need to detect the presence or absence of an object,
For example, in an ice maker, it is detected whether ice has reached a certain level in the ice storage compartment using a photoelectric element or a mechanical thermometer. As a result, there was a danger that frost could build up or the mechanical contacts could freeze, causing malfunctions.

また近年半導体技術及びエレクトロニクス技術
が進歩しLSIあるいはマイクロコンピユーター等
が実用化され、種々の方面に応用利用されてい
る。例えばエア・コンや冷蔵庫更にはシヨーケー
ス及び製氷機等の温度制御あるいは電力制御に使
用されているが、製氷機等の様に物体即ち氷の量
を検出してこれを制御する機能も温度制御及び電
力制御等と共にLSIあるいはマイクロコンピユー
タで総合的に制御することが望ましい。
In addition, semiconductor technology and electronics technology have advanced in recent years, and LSIs or microcomputers have been put into practical use and are used in a variety of fields. For example, it is used to control the temperature or power of air conditioners, refrigerators, case boxes, ice makers, etc., but the function of detecting and controlling the amount of ice in an object, such as an ice machine, is also used for temperature control and power control. It is desirable to perform comprehensive control using an LSI or microcomputer along with power control, etc.

本発明は上述した点に鑑みて為されたものであ
り、従来の物体検出装置とは全く異なる新規な物
体検出装置を提供するものである。以下図面を参
照して本発明を詳細に説明する。
The present invention has been made in view of the above points, and provides a novel object detection device that is completely different from conventional object detection devices. The present invention will be described in detail below with reference to the drawings.

第1図は本発明の実施例を示すブロツク図であ
り、1は物体検出素子、2は電源部、3はA/D
変換器、4は制御回路である。
FIG. 1 is a block diagram showing an embodiment of the present invention, in which 1 is an object detection element, 2 is a power supply section, and 3 is an A/D
Converter, 4 is a control circuit.

物体検出素子1はNPN型のトランジスタ5と、
トランジスタ5のコレクタに接続された負荷抵抗
R0と、ベース−コレクタ間及びベース−エミツ
タ間に各々接続された分割抵抗R1及びR2とから
成り、トランジスタ5のコレクタ電圧を、出力と
して取り出している。このトランジスタ5は第2
図に示す如く、良熱伝導性の放熱器6、例えばア
ルミニウムで作られた一端が閉口したパイプの中
に熱的に結合して固着され、リード7は放熱器6
の他端に延在して封止部8でハーメチツクシール
されている。放熱器6に何も接触していない場
合、トランジスタ5に流れるコレクタ電流に依つ
てジヤンクシヨンに発生する熱はトランジスタ5
自身及び放熱器6の熱抵抗及び熱容量によつて決
定される熱的な時定数に従い放熱され、ジヤンク
シヨンの温度は発熱と放熱がつり合うまで上昇す
る。従つて温度依存性を有するコレクタ電流はジ
ヤンクシヨンの温度上昇に従つて増加し、コレク
タ電圧は負荷抵抗R0の電圧降下によつて第3図
aの如く減少する。
The object detection element 1 includes an NPN type transistor 5,
Load resistor connected to collector of transistor 5
It consists of R 0 and dividing resistors R 1 and R 2 connected between the base and the collector and between the base and the emitter, respectively, and takes out the collector voltage of the transistor 5 as an output. This transistor 5 is the second
As shown in the figure, a heat sink 6 having good thermal conductivity, for example made of aluminum, is thermally bonded and fixed at one end into a closed pipe, and a lead 7 is connected to the heat sink 6.
It extends to the other end and is hermetically sealed with a sealing portion 8. When nothing is in contact with the heatsink 6, the heat generated in the junction by the collector current flowing through the transistor 5 is transferred to the transistor 5.
Heat is radiated according to a thermal time constant determined by the thermal resistance and heat capacity of itself and the heat radiator 6, and the temperature of the junction increases until the heat generation and heat radiation are balanced. Therefore, the temperature-dependent collector current increases as the junction temperature rises, and the collector voltage decreases as shown in FIG. 3a due to the voltage drop across the load resistor R0 .

一方放熱器6に熱容量の大きい物体、例えば氷
9が接触すると、その接触部分は氷9の溶解熱の
ために0℃に固定され熱が吸収される。従つて検
出素子全体としての熱容量が増大し、熱的な時定
数が減少するのでジヤンクシヨンの温度が一定に
達するまでの時間が短かくなり、それと共にトラ
ンジスタ5のコレクタ電圧は第3図bの如く短時
間で一定となる。従つて物体検出素子1の出力が
第3図に示すaであるかbであるかを判定すれば
物体の有無が検出できるものであり、その方法
は、予じめ物体検出素子1に物体が接触していな
い場合の種々の初期電圧に於ける標準特性を実験
的あるいは計算等に依つて作成しておき、物体検
出素子1に電流を流し始めてから一定間隔毎、即
ちT1,T2,T3…Toの時間に出力電圧を測定し、
その電圧値が標準特性の値の許容差内であるか否
かを判定することにより、物体の有無が検出でき
る。第3図に於いて標準特性がcで与えられると
すると、時間T4に於いて、物体が無い場合の出
力電圧と標準特性との差はΔV1であり、物体が有
る場合の出力電圧と標準特性との差はΔV2とな
る。一方許容差の基準は物体が無い場合の特性と
標準特性との考えられる差よりも十分大きく、更
に最終判定時Toに於ける物体が有る場合の特性
と標準特性との差より十分小さく設定しなければ
ならない。
On the other hand, when an object with a large heat capacity, such as ice 9, comes into contact with the radiator 6, the contact portion is fixed at 0° C. due to the melting heat of the ice 9, and the heat is absorbed. Therefore, the heat capacity of the detection element as a whole increases and the thermal time constant decreases, so the time it takes for the junction temperature to reach a constant level becomes shorter, and at the same time, the collector voltage of transistor 5 increases as shown in Figure 3b. It becomes constant in a short time. Therefore, the presence or absence of an object can be detected by determining whether the output of the object detection element 1 is a or b shown in FIG. Standard characteristics at various initial voltages when there is no contact are created experimentally or by calculation, and after starting the current flow to the object detection element 1, the characteristics are set at regular intervals, that is, T 1 , T 2 , Measure the output voltage at time T 3 ...T o ,
The presence or absence of an object can be detected by determining whether the voltage value is within the tolerance of the standard characteristic value. In Figure 3, if the standard characteristic is given by c, at time T4 , the difference between the output voltage when there is no object and the standard characteristic is ΔV 1 , and the difference between the output voltage when there is an object and the standard characteristic is ΔV 1. The difference from the standard characteristics is ΔV 2 . On the other hand, the tolerance standard is set to be sufficiently larger than the possible difference between the characteristics when there is no object and the standard characteristics, and also sufficiently smaller than the difference between the characteristics when there is an object and the standard characteristics at the time of final judgment T o Must.

電源部2は物体の有無の検出動作開始と同時に
制御回路4からの信号SBに依つて物体検出素子1
へ一定電圧Vccの印加を制御するものであり、電
圧Vccが印加された物体検出素子1には分割抵抗
R1,R2によつて決定されるコレクタ電流が流れ
始める。A/D変換器3は物体検出素子1の出力
即ちトランジスタ5のコレクタ電圧の大きさを周
知の方法に依つてデジタル変換するもので、デジ
タル変換されたコレクタ電圧値は制御回路4に印
加され処理される。
The power supply unit 2 activates the object detection element 1 based on the signal S B from the control circuit 4 at the same time as the start of the detection operation for detecting the presence or absence of an object.
The device controls the application of a constant voltage Vcc to the object detection element 1 to which the voltage Vcc is applied.
A collector current determined by R 1 and R 2 begins to flow. The A/D converter 3 digitally converts the output of the object detection element 1, that is, the magnitude of the collector voltage of the transistor 5, by a well-known method, and the digitally converted collector voltage value is applied to the control circuit 4 and processed. be done.

制御回路4は、電源部2を制御する信号SBを出
力し、更に物体検出素子1のコレクタ電圧を測定
する時間間隔を決定するタイマーを内蔵する制御
部10と、タイマーに依つて決定された時間T1
T2,T3…Toに於いてデジタル変換されたコレク
タ電圧値をサンプリング入力するための入力ゲー
ト11と、種々の初期電圧に於ける標準特性のリ
ストが予じめ記憶され、入力ゲート11からデジ
タル変換されたコレクタ電圧の初期電圧が入力さ
れると、その初期電圧に対応する標準特性のリス
トを検索し、時間T1,T2,T3…To毎にそのデー
タを送出するRAM12と、RAM12から送出
されたデータと時間T1,T2,T3…To毎に入力ゲ
ート11を介して入力されるデジタル変換された
コレクタ電圧値との差を演算し、その差が予じめ
定められた許容差内であるか否か比較する比較回
路13とから構成される。
The control circuit 4 outputs a signal S B for controlling the power supply section 2, and further includes a control section 10 having a built-in timer for determining the time interval for measuring the collector voltage of the object detection element 1, and a timer determined by the timer. Time T 1 ,
An input gate 11 for sampling and inputting the digitally converted collector voltage value at T 2 , T 3 ...T o , and a list of standard characteristics at various initial voltages is stored in advance. When the initial voltage of the collector voltage digitally converted from is input, the RAM 12 searches for a list of standard characteristics corresponding to the initial voltage and sends out the data at each time T 1 , T 2 , T 3 . . . T o Then, the difference between the data sent from the RAM 12 and the digitally converted collector voltage value inputted through the input gate 11 at each time T 1 , T 2 , T 3 . and a comparison circuit 13 that compares whether or not the difference is within a predetermined tolerance.

次に第4図のフローチヤートを参照して制御回
路4の動作を説明する。
Next, the operation of the control circuit 4 will be explained with reference to the flowchart shown in FIG.

制御回路4をスタートさせると、制御部10は
信号SBを出力し電源部2を制御して、物体検出素
子1に電圧Vccを印加させ、更に入力ゲート11
を開閉し物体検出素子1の出力のデジタル変換さ
れた初期電圧値を入力させる。デジタル変換され
た初期電圧値がRAM12に印加されるとRAM
12内に記憶された標準特性のリストの中から印
加された初期電圧値に該当するものを検索し抽出
する。また制御部10に内蔵されたタイマーには
時間T1,T2,T3…Toでサンプリングするため
に、その間隔を決定する時間がセツトされる。タ
イマーがタイムアウトすると制御部10は再び入
力ゲート11を開閉し、時間T1に於けるデジタ
ル変換されたコレクタ電圧値を入力ゲート11を
介して比較回路13に印加する。一方比較回路1
3にはRAM12から検索抽出された標準特性の
リストの時間T1に該当するデータが転送され、
各々の差が算出され、その差が予じめ定められた
許容差内であるか否か比較される。算出されたコ
レクタ電圧値と標準特性との差が許容差内であれ
ば、更に今使用したリストのデータが最終のデー
タであつたか否か、即ち時間Toに該当するデー
タであつたか否かが比較回路13で判定される。
最終のデータでなければ比較回路13はRAM1
2のリストのデータを次のデータ、即ち次の時
間、例えば今が時間T1であつたら時間T2に該当
するデータにシフトし、再び制御部10のタイム
アウトしたタイマーをセツトする。以下同様の動
作を順次時間T1,T2,T3…と繰り返えすが、比
較回路13に於いて、デジタル変換されたコレク
タ電圧値とRAM12に記憶された標準特性のリ
ストのデータとの差が許容差を超えると、物体検
出素子1のコレクタ電圧は第3図bであると判断
され、比較回路13は物体有りの信号を制御信号
SAに出力する。物体有りと検出されたならば時
間Toに達しなくても上述の動作をする必要は無
く、制御部10は信号SBに依り電源部2からの物
体検出素子1への電圧Vccの印加を停止し、次の
検出動作を行なうまで物体検出素子1が冷却する
様一定時間待機する。
When the control circuit 4 is started, the control section 10 outputs the signal S B and controls the power supply section 2 to apply the voltage V cc to the object detection element 1, and furthermore, the input gate 11
is opened and closed to input the digitally converted initial voltage value of the output of the object detection element 1. When the digitally converted initial voltage value is applied to RAM12, the RAM
A standard characteristic corresponding to the applied initial voltage value is searched and extracted from the list of standard characteristics stored in 12. Further, a timer built in the control unit 10 is set with a time to determine the sampling interval for sampling at times T 1 , T 2 , T 3 , . . . To . When the timer times out, the control section 10 opens and closes the input gate 11 again, and applies the digitally converted collector voltage value at time T1 to the comparator circuit 13 via the input gate 11. On the other hand, comparison circuit 1
3, the data corresponding to time T 1 of the list of standard characteristics searched and extracted from the RAM 12 is transferred,
Each difference is calculated and compared to see if the difference is within a predetermined tolerance. If the difference between the calculated collector voltage value and the standard characteristic is within the tolerance, then check whether the data in the list just used was the final data, that is, whether it was the data corresponding to time T o . is determined by the comparison circuit 13.
If it is not the final data, the comparator circuit 13
The data in the list No. 2 is shifted to the next data, that is, the data corresponding to the next time, for example, if it is time T1 , time T2 is set, and the timeout timer of the control unit 10 is set again. The same operation is repeated sequentially for times T 1 , T 2 , T 3 . If the difference exceeds the tolerance, it is determined that the collector voltage of the object detection element 1 is as shown in FIG.
Output to SA . If the presence of an object is detected, there is no need to perform the above operation even if the time T o has not been reached, and the control unit 10 applies the voltage V cc from the power supply unit 2 to the object detection element 1 based on the signal S B. The object detection element 1 waits for a certain period of time to cool down before performing the next detection operation.

また比較回路13に於いて算出された差が許容
差内と判定され続け、更に最終のデータ、即ち時
間Toに於いても許容差内と判定された場合、物
体検出素子1のコレクタ電圧は第3図aで示され
た特性であると判断され、従つて比較回路13は
物体無しを示す信号を制御信号SAに出力する。
これに依り検出動作が終了し、制御部10は信号
SBに依り電源部2を制御し物体検出素子1への電
圧VSSの印加を停止し、次の検出動作を行なうま
で物体検出素子1を冷却する様一定時間待機し、
再び同様の検出動作を繰り返えす。従つて制御信
号SAは物体の有無を示す信号となり、この制御
信号SAは例えば警告用のランプを点滅したり、
あるいは製氷機等に於ける貯氷量の制御等に利用
される。
Further, if the difference calculated in the comparison circuit 13 continues to be determined to be within the tolerance, and furthermore, the final data, that is, the time T o, is also determined to be within the tolerance, the collector voltage of the object detection element 1 is It is determined that the characteristics shown in FIG. 3a are true, and therefore the comparator circuit 13 outputs a signal indicating that there is no object as the control signal S A.
This completes the detection operation, and the control section 10 outputs a signal.
S B controls the power supply unit 2 to stop applying the voltage V SS to the object detection element 1, and waits for a certain period of time to cool the object detection element 1 until the next detection operation is performed.
Repeat the same detection operation again. Therefore, the control signal S A becomes a signal indicating the presence or absence of an object, and this control signal S A can be used, for example, to flash a warning lamp,
Alternatively, it can be used to control the amount of ice stored in ice makers and the like.

この様な動作を行なう制御回路4はマイクロコ
ンピユータで構成することもでき、上述した動作
を予じめ組まれたプログラムに依つて実行する。
この場合サンプリングの時間T1,T2,T3…To
決定するタイマーが動作している時間及び検出動
作の間の一定時間待機している時に他のプログラ
ム、例えば温度制御あるいは電力制御等のプログ
ラムが実行できるもので、これに依り製氷機等に
於ける物体検出が他の制御と共に総合的に行なえ
るものである。
The control circuit 4 that performs such operations may be constructed of a microcomputer, and executes the above-mentioned operations according to a preset program.
In this case, the timer that determines the sampling time T 1 , T 2 , T 3 . With this program, object detection in ice making machines and the like can be performed comprehensively along with other controls.

上述の如く本発明に依れば物体検出素子に機械
的に強いものが使用でき、また物体検出素子の出
力の初期電圧を測定し、その初期電圧値に該当す
る予じめ実験あるいは計算によつて求められた標
準特性のリストを検索抽出し、そのデータとサン
プリング時間T1,T2,T3…Toに於いて測定値と
を比較することに依つて周囲の温度に影響されず
に安定した物体検出が行なえるものである。
As described above, according to the present invention, a mechanically strong object detection element can be used, and the initial voltage of the output of the object detection element is measured, and a predetermined value corresponding to the initial voltage value is determined by experiment or calculation. By searching and extracting the list of standard characteristics obtained from the standard characteristics and comparing that data with the measured values at sampling times T 1 , T 2 , T 3 ...T o , This allows stable object detection.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例を示すブロツク図、第
2図は第1図に示された実施例に用いられた物体
検出素子の断面図、第3図は第2図に示された物
体検出素子の特性図、第4図は動作を示すフロー
チヤートである。 1……物体検出素子、2……電源部、3……
A/D変換器、4……制御回路、5……トランジ
スタTr、6……放熱器、7……リード、8……
封止部、9……氷、10……制御部、11……入
力ゲート、12……RAM、13……比較回路で
ある。
FIG. 1 is a block diagram showing an embodiment of the present invention, FIG. 2 is a sectional view of an object detection element used in the embodiment shown in FIG. 1, and FIG. 3 is a block diagram showing an object detection element shown in FIG. The characteristic diagram of the detection element and FIG. 4 are flowcharts showing the operation. 1...Object detection element, 2...Power supply unit, 3...
A/D converter, 4... Control circuit, 5... Transistor Tr, 6... Heat sink, 7... Lead, 8...
Sealing part, 9...ice, 10...control unit, 11...input gate, 12...RAM, 13...comparison circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 電源電圧を供給する電源部と、PN接合部を
有する半導体素子及び該半導体素子が熱的結合す
るよう固着されると共に検出すべき物体が接触す
る位置に設置され前記半導体素子に電流を流すこ
とにより生ずる熱を放熱させるための放熱器を備
え、前記電源電圧の供給時、前記PN接合部の温
度上昇に応じた検出電圧を出力する検出素子と、
前記放熱器に物体が接触していない場合における
前記検出素子の一定時間間隔毎の予想検出電圧値
を予め記憶した記憶手段と、前記検出素子の検出
電圧を一定間隔毎にサンプリングし該サンプリン
グ値を前記予想検出電圧値と比較する比較手段と
を有し、前記サンプリング値と前記予想検出電圧
値との差が所定値以上のとき物体有の信号を出力
することを特徴とした物体検出装置。
1. A power supply unit that supplies a power supply voltage, a semiconductor element having a PN junction, and a semiconductor element that is fixed so as to be thermally coupled and installed at a position where an object to be detected is in contact with the semiconductor element, and a current is caused to flow through the semiconductor element. a detection element comprising a heat radiator for dissipating heat generated by the above, and outputting a detection voltage according to a temperature rise of the PN junction when the power supply voltage is supplied;
a storage means that stores in advance an expected detection voltage value of the detection element at fixed time intervals when no object is in contact with the heat radiator; and a storage means that samples the detection voltage of the detection element at fixed intervals and stores the sampled values. An object detection device comprising a comparison means for comparing the predicted detection voltage value, and outputs a signal indicating the presence of an object when a difference between the sampled value and the predicted detection voltage value is greater than or equal to a predetermined value.
JP8863479A 1979-07-11 1979-07-11 Body detecting device Granted JPS5612569A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8863479A JPS5612569A (en) 1979-07-11 1979-07-11 Body detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8863479A JPS5612569A (en) 1979-07-11 1979-07-11 Body detecting device

Publications (2)

Publication Number Publication Date
JPS5612569A JPS5612569A (en) 1981-02-06
JPS631536B2 true JPS631536B2 (en) 1988-01-13

Family

ID=13948235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8863479A Granted JPS5612569A (en) 1979-07-11 1979-07-11 Body detecting device

Country Status (1)

Country Link
JP (1) JPS5612569A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100386170C (en) * 2006-06-09 2008-05-07 清华大学 A wire electric discharge machining wire temperature detection device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50941A (en) * 1973-05-08 1975-01-08

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100386170C (en) * 2006-06-09 2008-05-07 清华大学 A wire electric discharge machining wire temperature detection device

Also Published As

Publication number Publication date
JPS5612569A (en) 1981-02-06

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