JPS631679B2 - - Google Patents
Info
- Publication number
- JPS631679B2 JPS631679B2 JP51069795A JP6979576A JPS631679B2 JP S631679 B2 JPS631679 B2 JP S631679B2 JP 51069795 A JP51069795 A JP 51069795A JP 6979576 A JP6979576 A JP 6979576A JP S631679 B2 JPS631679 B2 JP S631679B2
- Authority
- JP
- Japan
- Prior art keywords
- photoresist
- reflectance
- metal thin
- thin film
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229920002120 photoresistant polymer Polymers 0.000 claims description 22
- 239000000758 substrate Substances 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 16
- 239000002184 metal Substances 0.000 claims description 16
- 239000010409 thin film Substances 0.000 claims description 16
- 230000003287 optical effect Effects 0.000 claims description 4
- 239000007769 metal material Substances 0.000 claims description 2
- 239000010408 film Substances 0.000 description 10
- 239000011521 glass Substances 0.000 description 7
- 239000011651 chromium Substances 0.000 description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005406 washing Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- WTQZSMDDRMKJRI-UHFFFAOYSA-N 4-diazoniophenolate Chemical compound [O-]C1=CC=C([N+]#N)C=C1 WTQZSMDDRMKJRI-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Landscapes
- Manufacturing Of Printed Circuit Boards (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Manufacturing Optical Record Carriers (AREA)
Description
【発明の詳細な説明】
本発明は、ホトレジスト(感光性組成物)を基
板に塗布し、微細加工を行なう場合の感光性記録
媒体に関し、特に膜剥離しにくい感光性記録媒体
に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a photosensitive recording medium in which a photoresist (photosensitive composition) is applied to a substrate and microfabrication is performed, and particularly relates to a photosensitive recording medium that is difficult to peel off.
従来、感光性記録媒体の構造体は、第1図に示
した構造をもつものが一般的であつた。同図にお
いて、1は基板、2はホトレジスト膜である。つ
まり、基板の表面を洗浄した後にホトレジストを
直接塗布した構造である。 Conventionally, the structure of a photosensitive recording medium has generally had the structure shown in FIG. In the figure, 1 is a substrate and 2 is a photoresist film. In other words, it has a structure in which photoresist is directly applied after cleaning the surface of the substrate.
このような構造に微細加工を行なう場合、基板
とホトレジストの接着力が十分に保持されなくて
はならない。しかし、従来の感光性記録媒体で
は、この接着力が不十分なために、現像あるいは
水洗処理後にしばしばホトレジストの剥離を生ず
るという欠点がある。 When performing microfabrication on such a structure, it is necessary to maintain sufficient adhesion between the substrate and the photoresist. However, conventional photosensitive recording media have the disadvantage that the photoresist often peels off after development or water washing due to insufficient adhesion.
本発明は、基板と、ホトレジストとの間の剥離
を防止するとともに、高精度の記録溝を形成でき
る光デイスク用感光性記録媒体を提供することを
目的とする。 SUMMARY OF THE INVENTION An object of the present invention is to provide a photosensitive recording medium for an optical disk that can prevent peeling between a substrate and a photoresist and can form recording grooves with high precision.
本発明は、上記目的を達成するために、透明基
板と、該透明基板上に直接積載された単一の金属
材料で構成された反射率が8%以下の金属薄膜
と、該金属薄膜上に直接積載されたホトレジスト
とからなることを特徴とした構成である。 In order to achieve the above object, the present invention provides a transparent substrate, a metal thin film with a reflectance of 8% or less made of a single metal material directly stacked on the transparent substrate, and a metal thin film on the metal thin film. This structure is characterized by consisting of directly loaded photoresist.
以下発明を添付図面と参照して詳しく説明す
る。第2図は、本発明の一実施例である記録媒体
の断面図を示す。同図において、1は基板、2は
ホトレジスト、11はアルミニウム、金、銀、
銅、クロム等からなる金属薄膜である。基板1が
ガラスのとき、ガラス基板と金属薄膜11との間
の接着力はガラス基板上に直接ホトレジストを塗
布する場合に比較して大となる。さらに金属薄膜
11とホトレジスト膜この接着力は強い。このこ
とは、ホトレジストに高密度な微細加工を行つて
も、現像、水洗処理中にホトレジスト膜の剥離が
おきないことを意味する。例えば、ビデオデイス
クの原板の作成においては、厚さ15mmのガラス基
板上に反射率8%以下のクロム膜、たとえば30Å
の薄膜を真空蒸着技術によつて形成し、その上に
厚さ0.2μmのホトレジスト膜を形成する。ホトレ
ジストとしては、たとえばキノンジアジドとノボ
ラツク樹脂を含むポジ型ホトレジストAZ1350
(Shipley社)を用いた。現像液としては、AZデ
イベロツパーを用いた。そして1μm程度のスポ
ツトのレーザビームを照射して高密度なビデオ信
号を記録する。このような場合、現像および水洗
処理後にホトレジスト膜の剥離が全く生じなかつ
た。他のアルミニウム、金、銀、銅等の金属薄膜
も同様である。これらの金属薄膜のうち、クロム
膜が最もガラスとの接着性が強いため最も効果が
大きい。 The invention will now be described in detail with reference to the accompanying drawings. FIG. 2 shows a cross-sectional view of a recording medium that is an embodiment of the present invention. In the figure, 1 is a substrate, 2 is a photoresist, 11 is aluminum, gold, silver,
It is a thin metal film made of copper, chromium, etc. When the substrate 1 is made of glass, the adhesive force between the glass substrate and the metal thin film 11 is greater than when photoresist is applied directly onto the glass substrate. Furthermore, the adhesive force between the metal thin film 11 and the photoresist film is strong. This means that even if the photoresist is subjected to high-density microfabrication, the photoresist film will not peel off during development and water washing. For example, when creating a video disk master plate, a chromium film with a reflectance of 8% or less, for example 30 Å, is placed on a 15 mm thick glass substrate.
A thin film is formed by vacuum evaporation technique, and a photoresist film with a thickness of 0.2 μm is formed thereon. As a photoresist, for example, positive photoresist AZ1350 containing quinone diazide and novolak resin is used.
(Shipley) was used. As the developer, AZ developer was used. Then, a laser beam with a spot size of about 1 μm is irradiated to record a high-density video signal. In such a case, no peeling of the photoresist film occurred after development and water washing. The same applies to other metal thin films such as aluminum, gold, silver, and copper. Among these metal thin films, the chromium film has the strongest adhesion to glass and is therefore most effective.
また、ホトレジスト膜の剥離の防止ができたた
めに、ドロツプアウトの減少に有益である。 Furthermore, since peeling of the photoresist film can be prevented, it is useful for reducing dropouts.
しかし、反射率が8%以上の場合は、金属薄膜
からホトレジスト膜への反射光が強くなるため
に、記録溝とくに溝幅に悪影響を与える。本発明
の記録媒体に従来の記録媒体の露光、現像条件を
用いた場合には、金属薄膜11の反射率によつて
は溝幅が目的の寸法より大きく加工されることが
ある。第3図に上記実施において、金属薄膜とし
てCrを用いた時の反射率と溝幅の関係を示す。
但し、金属薄膜がひじように薄い場合の反射率
は、ガラス基板だけと考えられるため、反射率は
4%(ガラス基板の反射率)からとなる。第3図
から反射率が8%以下では、目的の寸法の溝幅に
加工できるが、反射率が8%以上では目的とする
寸法の溝幅(たとえば0.8μ)より大きくなり、反
射率が増すにしたがつて大きくなる。とくに反射
率が31%の時は、反射率8%以下の時の2倍の溝
幅になる。 However, when the reflectance is 8% or more, the reflected light from the metal thin film to the photoresist film becomes strong, which adversely affects the recording groove, especially the groove width. When the exposure and development conditions of conventional recording media are used for the recording medium of the present invention, the groove width may be processed to be larger than the intended dimension depending on the reflectance of the metal thin film 11. FIG. 3 shows the relationship between reflectance and groove width when Cr is used as the metal thin film in the above implementation.
However, when the metal thin film is as thin as an elbow, the reflectance is considered to be only the glass substrate, so the reflectance starts from 4% (the reflectance of the glass substrate). From Figure 3, when the reflectance is 8% or less, the groove width can be processed to the desired size, but when the reflectance is 8% or more, the groove width is larger than the desired size (for example, 0.8μ), and the reflectance increases. It gets bigger as it increases. In particular, when the reflectance is 31%, the groove width is twice as large as when the reflectance is 8% or less.
すなわち、金属薄膜11の反射率は8%以下と
する必要がある。 That is, the reflectance of the metal thin film 11 needs to be 8% or less.
以上述べた様に、本発明は、ビデオデイスク等
の光デイスクの作成における、レーザ光を用いて
高密度な記録をするホトレジスト処理において、
剥離の防止と、記録溝幅の寸法精度の高いホトレ
ジスト処理をすることができるという効果があ
る。更に、本発明は、光デイスク用感光性記録媒
体のレーザ光照射の際の光量を、透明基板を透過
した光を検出して知ることができるため、光量を
精度よく検知できるという効果がある。 As described above, the present invention is applicable to photoresist processing that uses laser light to perform high-density recording in the production of optical discs such as video discs.
This has the effect of preventing peeling and enabling photoresist processing with high dimensional accuracy of the recording groove width. Furthermore, the present invention has the effect that the amount of light when a photosensitive recording medium for an optical disk is irradiated with laser light can be determined by detecting the light transmitted through the transparent substrate, so that the amount of light can be detected with high accuracy.
第1図は、従来例を示す図、第2図は本発明の
一実施例を示す図、第3図は反射率と溝幅との関
係を示す図である。
1は基板、2はホトレジスト、11は金属薄膜
である。
FIG. 1 is a diagram showing a conventional example, FIG. 2 is a diagram showing an embodiment of the present invention, and FIG. 3 is a diagram showing the relationship between reflectance and groove width. 1 is a substrate, 2 is a photoresist, and 11 is a metal thin film.
Claims (1)
単一の金属材料で構成された反射率が8%以下の
金属薄膜と、該金属薄膜上に直接積載されたホト
レジストとからなることを特徴とする光デイスク
用感光性記録媒体。1. A transparent substrate, a metal thin film with a reflectance of 8% or less made of a single metal material, and a photoresist placed directly on the metal thin film. A photosensitive recording medium for optical discs.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6979576A JPS52154403A (en) | 1976-06-16 | 1976-06-16 | Photoosensitive recording medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6979576A JPS52154403A (en) | 1976-06-16 | 1976-06-16 | Photoosensitive recording medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52154403A JPS52154403A (en) | 1977-12-22 |
| JPS631679B2 true JPS631679B2 (en) | 1988-01-13 |
Family
ID=13413022
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6979576A Granted JPS52154403A (en) | 1976-06-16 | 1976-06-16 | Photoosensitive recording medium |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS52154403A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0253175U (en) * | 1988-10-12 | 1990-04-17 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI228718B (en) * | 2001-11-05 | 2005-03-01 | Tdk Corp | Manufacturing method and device of mold plate for information medium |
| AU2003221338A1 (en) | 2002-03-11 | 2003-09-22 | Tdk Corporation | Processing method for photoresist master, production method for recording medium-use mater, production method for recording medium, photoresist master, recording medium-use master and recording medium |
-
1976
- 1976-06-16 JP JP6979576A patent/JPS52154403A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0253175U (en) * | 1988-10-12 | 1990-04-17 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52154403A (en) | 1977-12-22 |
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