JPS6317773B2 - - Google Patents
Info
- Publication number
- JPS6317773B2 JPS6317773B2 JP56009569A JP956981A JPS6317773B2 JP S6317773 B2 JPS6317773 B2 JP S6317773B2 JP 56009569 A JP56009569 A JP 56009569A JP 956981 A JP956981 A JP 956981A JP S6317773 B2 JPS6317773 B2 JP S6317773B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- solution
- bapb
- hcl
- etching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Inorganic Compounds Of Heavy Metals (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Description
【発明の詳細な説明】
本発明は酸化物超伝導体BaPb1-xBixO3(0.05
x0.3)のようにBaとPbを同時に含む酸化物薄
膜のパターン形成法に関するものである。[Detailed description of the invention] The present invention is based on the oxide superconductor BaPb 1-x Bi x O 3 (0.05
This relates to a method of patterning an oxide thin film containing Ba and Pb at the same time, such as x0.3).
Baを含む酸化物ではチタン酸バリウムBaTiO3
が有名で、エツチング液としてHClとHFの混合
液、HNO3とHFの混合液またはHCl、HNO3、
HFの混合液または濃リン酸(H3PO4)などが用
いられており、Pbを含んだ酸化物ではジルコ
ン・チタン酸鉛(Pb(ZrTi)O3)が有名でエツ
チング液としてHFの水溶液が用いられている。 Among oxides containing Ba, barium titanate BaTiO 3
The etching solution is a mixture of HCl and HF, a mixture of HNO 3 and HF, or HCl, HNO 3 ,
A mixed solution of HF or concentrated phosphoric acid (H 3 PO 4 ) is used. Zircon lead titanate (Pb(ZrTi)O 3 ) is a famous oxide containing Pb, and an aqueous solution of HF is used as an etching solution. is used.
ところが超伝導酸化物であるBaPb1-xBixO3の
ようにBaとPbを同時に含む酸化物では適当なエ
ツチング液がない。 However, there is no suitable etching solution for oxides containing both Ba and Pb, such as the superconducting oxide BaPb 1-x Bi x O 3 .
BaPb1-xBixO3薄膜はHCl水溶液でエツチされ
るが、その際BaCl2が溶出した後に、HClと反応
して生じたPbCl2が水に溶けないため薄膜端面に
残り、薄膜パターンの寸法精度が出ない。 The BaPb 1-x Bi x O 3 thin film is etched with an aqueous HCl solution, but after the BaCl 2 is eluted, the PbCl 2 produced by the reaction with HCl remains on the edge of the thin film because it is not soluble in water, and the thin film pattern is Dimensional accuracy is not achieved.
Pb(NO3)2は水溶性であるが、BaPb1-xBixO3
はHNO3の水溶液には殆んど溶けない。 Pb( NO3 ) 2 is water soluble, but BaPb1 -x Bi x O3
is almost insoluble in an aqueous solution of HNO 3 .
本発明はBaとPbを同時に含む複合酸化物の薄
膜に関して、不溶物を端面に残すことなく高い寸
法精度でエツチングしてパターンを形成する方法
を提供しようとするものである。 The present invention aims to provide a method for forming a pattern by etching a thin film of a composite oxide containing both Ba and Pb with high dimensional accuracy without leaving any insoluble matter on the end face.
BaCl2、Ba(ClO4)2の25℃における水に対する
溶解度は夫々27.1および約75である。ただし、こ
こで溶解度としては飽和溶液100gに含まれる
BaCl2、Ba(ClO4)2の重量であらわしている。 The solubility of BaCl 2 and Ba(ClO 4 ) 2 in water at 25° C. is 27.1 and about 75, respectively. However, here, the solubility is the amount contained in 100g of saturated solution.
It is expressed by the weight of BaCl 2 and Ba(ClO 4 ) 2 .
Pbの化合物でBaCl2、Ba(ClO4)2と同程度の水
に対する溶解度を示すものは「化学便覧」(基礎
編)(丸善発行)によると25℃でPb(NO3)2が
37.73、Pb(ClO4)2・3H2Oが81.5、Pb(SO3NH2)2
が710(但し、飽和溶液1中に含まれる溶質の質
量数)、PbSiF6が68.97(100g中の質量数)などで
ある。 According to the Chemical Handbook (Basic Edition) (published by Maruzen), Pb compounds that exhibit the same level of solubility in water as BaCl 2 and Ba(ClO 4 ) 2 have Pb(NO 3 ) 2 at 25°C.
37.73, Pb(ClO 4 ) 2・3H 2 O is 81.5, Pb(SO 3 NH 2 ) 2
is 710 (however, the mass number of the solute contained in the saturated solution 1), and PbSiF 6 is 68.97 (the mass number in 100 g).
このうち後の二者の塩をつくる適当な水溶液は
複雑で適当でない。またPbはHNO3に容易に溶
けてPb(NO3)2となるが、Pbの酸化物はHNO3溶
液には殆んど溶けない。 A suitable aqueous solution for preparing the latter two salts is complex and unsuitable. Furthermore, Pb easily dissolves in HNO 3 to form Pb(NO 3 ) 2 , but Pb oxide hardly dissolves in HNO 3 solution.
従つて、BaとPbを共通に溶解するものとして
HClO4が考えられる。しかしHClO4の水溶液の
みではBaPb1-xBixO3が溶解する速度は極めて小
さい。そこでHClをHClO4に適量加えることで薄
膜パターンの側面が白濁することなくエツチでき
ることを発見した。 Therefore, assuming that Ba and Pb are commonly dissolved,
Possibly HClO4 . However, the rate at which BaPb 1-x Bi x O 3 dissolves in an aqueous solution of HClO 4 is extremely low. We discovered that by adding an appropriate amount of HCl to HClO 4 , it was possible to etch the sides of a thin film pattern without making it cloudy.
実施例 1
濃塩酸HCl(37重量%、12規定)を容積で水に
2%迄薄めたHCl水溶液を作る。BaPb0.75Bi0.35
O3の厚さ5000Åの薄膜の上にポジのレジストを
塗布し、回路パターンを描いたマスクを通して
光、電子線あるいはX線により露光し、現像して
不要部のレジストを除いた。このようにレジスト
でパターンを形成した後、基板を上記のHCl水溶
液に数秒間浸してエツチングを行ない、その後レ
ジストをアセトンで除去した。Example 1 A HCl aqueous solution is prepared by diluting concentrated hydrochloric acid HCl (37% by weight, 12N) in water to 2% by volume. BaPb 0.75 Bi 0.35
A positive resist was applied onto a thin film of O 3 with a thickness of 5000 Å, exposed to light, electron beams, or X-rays through a mask with a circuit pattern drawn thereon, and developed to remove unnecessary portions of the resist. After forming a pattern with the resist in this manner, the substrate was immersed in the above HCl aqueous solution for several seconds to perform etching, and then the resist was removed with acetone.
BaPb0.75Bi0.25O3薄膜のパターンは線幅50μmで
あつたが、側面に沿つて幅約0.1μmの白い高抵抗
層が残つた。 The BaPb 0.75 Bi 0.25 O 3 thin film pattern had a line width of 50 μm, but a white high-resistance layer with a width of about 0.1 μm remained along the sides.
実施例 2
HClO4(60.0〜62.0%溶液)を水に加え、容積
で50%にうすめ、HCl(35.0〜37.0%溶液)を容積
で1%加えた溶液を用い、上記と同じような
BaPb0.75Bi0.25O3薄膜のパターンを形成した。約
7秒間エツチングしたところ薄膜側面が白濁する
こともなく、エツチ面は基板にほぼ垂直であつ
た。又15秒以上では膜の上面が下面よりも細くな
り、断面が台形となる。なおHClO4を水に対し
て容積比で20〜60%加え、これに対してHClを1
〜0.3%(容積比)を加えた溶液でエツチングを
行うのが好ましい。なおHClO4の容積が20〜60
%を超えると、膜の側面が白濁するのが認められ
る。さらにHClが1%を超えるとエツチング速度
が非常に速くなり、操作が困難となる。又0.3%
未満のときは膜の側面が白濁するのが認められ
る。Example 2 Using a solution in which HClO 4 (60.0-62.0% solution) was added to water and diluted to 50% by volume, and 1% by volume of HCl (35.0-37.0% solution) was added, the same procedure as above was carried out.
A BaPb 0.75 Bi 0.25 O 3 thin film pattern was formed. After etching for about 7 seconds, the side surface of the thin film did not become cloudy and the etched surface was almost perpendicular to the substrate. Moreover, if the film is heated for more than 15 seconds, the top surface of the film becomes thinner than the bottom surface, and the cross section becomes trapezoidal. In addition, add 20 to 60% HClO 4 to water by volume, and add 1 HCl to this.
Etching is preferably carried out with a solution containing ~0.3% (by volume). Note that the volume of HClO 4 is 20 to 60
%, it is observed that the sides of the membrane become cloudy. Furthermore, if the HCl content exceeds 1%, the etching rate becomes extremely high, making operation difficult. Also 0.3%
When it is less than 100%, it is observed that the side surface of the membrane becomes cloudy.
叙上のように本発明のエツチング液により薄膜
の配線側面に白い高抵抗層を生ずることなく
BaPb1-xBixO3のパターンを形成できる効果を有
する。 As mentioned above, the etching solution of the present invention does not form a white high-resistance layer on the side surface of thin film wiring.
It has the effect of forming a BaPb 1-x Bi x O 3 pattern.
Claims (1)
積比で20〜60%加え、この溶液に対してHCl
(35.0〜37.0%溶液)を容積比で1〜0.3%加えた
溶液により、BaとPbを同時に含む酸化物薄膜を
エツチングすることを特徴とする酸化物薄膜パタ
ーン形成法。 2 基板上にBaPb1-xBixO3薄膜を形成し、その
上にボジ形レジストを塗布し、回路パターンを描
いたマスクを通して露光し、現像した後BaPb1-x
BixO3薄膜の不要部分を前記のエツチング液を用
いて除去することによる特許請求の範囲第1項記
載の酸化物薄膜パターン形成法。[Claims] 1. HClO 4 (60.0-62.0% solution) is added at a volume ratio of 20-60% to water, and HCl
An oxide thin film pattern forming method characterized by etching an oxide thin film containing Ba and Pb at the same time with a solution containing 1 to 0.3% by volume of (35.0 to 37.0% solution). 2 Form a BaPb 1-x Bi x O 3 thin film on the substrate, apply a positive resist on it, expose it to light through a mask with a circuit pattern drawn on it, develop it, and then BaPb 1-x
2. The method of forming an oxide thin film pattern according to claim 1, wherein unnecessary portions of the Bi x O 3 thin film are removed using the etching solution.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56009569A JPS57123826A (en) | 1981-01-27 | 1981-01-27 | Method for forming oxide thin film pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56009569A JPS57123826A (en) | 1981-01-27 | 1981-01-27 | Method for forming oxide thin film pattern |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57123826A JPS57123826A (en) | 1982-08-02 |
| JPS6317773B2 true JPS6317773B2 (en) | 1988-04-15 |
Family
ID=11723923
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56009569A Granted JPS57123826A (en) | 1981-01-27 | 1981-01-27 | Method for forming oxide thin film pattern |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57123826A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5947783A (en) * | 1982-09-10 | 1984-03-17 | Nippon Telegr & Teleph Corp <Ntt> | Formation of pattern of oxide superconductor |
| US5646095A (en) * | 1991-06-18 | 1997-07-08 | International Business Machines Corporation | Selective insulation etching for fabricating superconductor microcircuits |
| JP4902159B2 (en) * | 2005-09-12 | 2012-03-21 | 日本板硝子株式会社 | Method for separating and collecting ceramic sintered body and glass |
| US8409401B2 (en) | 2005-09-12 | 2013-04-02 | Nippon Sheet Glass Co., Ltd. | Separating method for dark ceramics sintered body |
-
1981
- 1981-01-27 JP JP56009569A patent/JPS57123826A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57123826A (en) | 1982-08-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101825493B1 (en) | Etchant for electrode and method of fabricating thin film transistor array panel using the same | |
| US4220706A (en) | Etchant solution containing HF-HnO3 -H2 SO4 -H2 O2 | |
| US4230522A (en) | PNAF Etchant for aluminum and silicon | |
| JP5687685B2 (en) | Etchant composition and method | |
| TWI649406B (en) | Etchant and method for manufacturing display device using the same | |
| KR101157207B1 (en) | Etchant for thin film transistor-liquid crystal display | |
| US4497687A (en) | Aqueous process for etching cooper and other metals | |
| KR101339316B1 (en) | Etching solution for two layer of copper/molybdenum or three layer of molybdenum/copper/molybdenum without damage of glass substrate | |
| JPS6317773B2 (en) | ||
| JPS61591A (en) | Etching process of copper | |
| US3772104A (en) | Fabrication of thin film devices | |
| JPH05214565A (en) | Method for etching less reactive material in the presence of more reactive material | |
| KR20110115814A (en) | Etching solution and electronic device manufacturing method | |
| US4940510A (en) | Method of etching in the presence of positive photoresist | |
| JPS592349A (en) | Formation of oxide superconductor circuit | |
| DE2529865C2 (en) | Aqueous etching solution for the selective etching of silicon dioxide layers on semiconductor bodies | |
| US5620558A (en) | Etching of copper-containing devices | |
| US3081211A (en) | Method of selective etching | |
| JPS60186019A (en) | Etching method of ito | |
| SU816983A1 (en) | Pickling solution | |
| JPS6317348B2 (en) | ||
| JPS6038022B2 (en) | etching liquid | |
| JP2630459B2 (en) | Pattern formation method | |
| CA1221896A (en) | Aqueous process for etching copper and other metals | |
| KR920006202B1 (en) | Method of manufacturing electrode rad of hall element |