JPS6318134B2 - - Google Patents
Info
- Publication number
- JPS6318134B2 JPS6318134B2 JP57094874A JP9487482A JPS6318134B2 JP S6318134 B2 JPS6318134 B2 JP S6318134B2 JP 57094874 A JP57094874 A JP 57094874A JP 9487482 A JP9487482 A JP 9487482A JP S6318134 B2 JPS6318134 B2 JP S6318134B2
- Authority
- JP
- Japan
- Prior art keywords
- intensity
- pulsed laser
- fluorescence
- laser beam
- excited
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 10
- 238000000691 measurement method Methods 0.000 claims description 6
- 230000003111 delayed effect Effects 0.000 claims description 2
- 238000012544 monitoring process Methods 0.000 description 7
- 230000010355 oscillation Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004020 luminiscence type Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000005375 photometry Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【発明の詳細な説明】
本発明はレーザ励起螢光測定方法及び装置に関
するものであり、更に詳しくは変化の早いプラズ
マ分布等をモニタするのに好適なレーザ励起螢光
測定方法及び装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method and apparatus for measuring laser-excited fluorescence, and more particularly to a method and apparatus for measuring laser-excited fluorescence suitable for monitoring rapidly changing plasma distribution.
従来のレーザ励起螢光測定方法及び装置におい
ては、雑音を除去しS/N比を向上させるため、
ボツクス 積分器やロツクインアンプが使用され
ている。しかし、ボツクス 積分器やロツクイン
アンプは、いずれも測定現象が規則正しい周期性
を特たなければならず、プラズマモニタの対象と
なるプラズマ物質は時々刻々と発光状態が変化す
るので、単発発光現象として測定しなければなら
ない。そこで、レーザ光パルスの1発で1度プラ
ズマ物質から螢光を発生させ、それに応じて測定
可能な装置にする必要がある。しかし、この様な
従来のレーザ励起螢光測定方法及び装置では、変
化の早いプラズマ分布をモニタするのは不可能で
あつた。 In conventional laser-excited fluorescence measurement methods and devices, in order to remove noise and improve the S/N ratio,
Box integrators and lock-in amplifiers are used. However, with both box integrators and lock-in amplifiers, the measurement phenomenon must exhibit regular periodicity, and since the plasma material that is the subject of plasma monitoring changes its luminescence state from moment to moment, it is difficult to detect a single luminescence phenomenon. Must be measured. Therefore, it is necessary to create a device that can generate fluorescent light from the plasma material once with a single pulse of laser light and measure it accordingly. However, with such conventional laser-excited fluorescence measurement methods and devices, it has been impossible to monitor rapidly changing plasma distribution.
本発明はかかる従来のレーザ励起螢光測定方法
及び装置の欠点に鑑みなされたもので、変化の早
いプラズマ分布を正確にモニタすることができる
レーザ励起螢光測定方法及び装置を提供すること
を目的としている。 The present invention was made in view of the drawbacks of the conventional laser-excited fluorescence measurement method and apparatus, and an object of the present invention is to provide a laser-excited fluorescence measurement method and apparatus that can accurately monitor rapidly changing plasma distribution. It is said that
本発明のレーザ励起螢光測定方法は、パルスレ
ーザ発振の開始時に発生する雑音を避けるため、
パルスレーザ光で励起される螢光の強度測定開始
時期を所定時間遅らせ、更にパルスレーザ光の強
度とパルスレーザ光で励起される螢光の強度をそ
れぞれ別々に積算し、パルスレーザ光の強度積算
値を基準にして螢光強度の積算値との比をとるこ
とによつて、螢光強度側定の精度を向上させたこ
とを特徴としている。 In order to avoid noise generated at the start of pulsed laser oscillation, the laser-excited fluorescence measurement method of the present invention includes the following steps:
The start time of measuring the intensity of the fluorescent light excited by the pulsed laser light is delayed by a predetermined period of time, and the intensity of the pulsed laser light and the intensity of the fluorescent light excited by the pulsed laser light are integrated separately, and the intensity of the pulsed laser light is integrated. It is characterized in that the accuracy of determining the fluorescence intensity is improved by taking the ratio of the value to the integrated value of the fluorescence intensity.
又、本発明のレーザ励起螢光測定装置は、パル
スレーザ発振開始時に発生する雑音を避けるた
め、パルスレーザ光で励起される螢光の強度を所
定時間遅らせて測定を開始する第1の手段と、第
1の手段から出力される螢光強度を示す電気信号
をデイジタル変換して積算する第2の手段と、パ
ルスレーザ光の強度を電気信号として検出しデイ
ジタル変換して積算する第3の手段と、第3の手
段から出力されるパルスレーザ光強度の積算値を
基準にして第2の手段から出力される螢光強度の
積算値との比をとり螢光強度を補正する第4の手
段とを有していることを特徴としている。 Furthermore, the laser-excited fluorescence measuring device of the present invention includes a first means for starting measurement by delaying the intensity of the fluorescence excited by the pulsed laser light for a predetermined period of time in order to avoid noise generated at the start of pulsed laser oscillation. , a second means for digitally converting and integrating an electrical signal indicating the fluorescence intensity outputted from the first means; and a third means for detecting the intensity of the pulsed laser beam as an electrical signal, digitally converting it, and integrating it. and a fourth means for correcting the fluorescent light intensity by taking the ratio of the integrated value of the fluorescent light intensity output from the second means based on the integrated value of the pulsed laser light intensity output from the third means. It is characterized by having the following.
以下添付の図面に示す実施例により、更に詳細
に本発明について説明する。 The present invention will be described in more detail below with reference to embodiments shown in the accompanying drawings.
第1図は、本発明のレーザ励起螢光測定装置を
組み込んだプラズマ分布モニタである。同図にお
いて、紫外線用色素レーザ1は、制御部17のト
リガにより放電管22が放電発光すると色素がポ
ンピングされ、レーザ発振管23からパルス状の
レーザ光24を発射する。 FIG. 1 shows a plasma distribution monitor incorporating the laser-excited fluorescence measuring device of the present invention. In the figure, in the dye laser 1 for ultraviolet rays, when a discharge tube 22 discharges and emits light due to a trigger from a control unit 17, the dye is pumped, and a pulsed laser beam 24 is emitted from a laser oscillation tube 23.
レーザ光24は、一方においてスキヤン装置3
で二次元的に走査され、プラズマ利用装置5の入
射窓4から入射される。プラズマ利用装置5に入
射されたレーザ光24は、プラズマ物質6を励起
し、螢光25を発生させる。螢光25は測定窓7
を通して放射され、スキヤン装置8により二次元
的に受光され、分光器9の入射され、検出器26
で電気信号に変換される。この電気信号は増幅器
10で増幅され、その後アナログ・デイジタル変
換器11でデイジタル信号に変換され、積分器1
2に入力される。 The laser beam 24 is transmitted to the scanning device 3 on the one hand.
The light is scanned two-dimensionally and is incident through the entrance window 4 of the plasma utilization device 5. The laser beam 24 incident on the plasma utilization device 5 excites the plasma substance 6 and generates fluorescence 25 . The fluorescent light 25 is the measurement window 7
is emitted, is received two-dimensionally by the scanning device 8, is incident on the spectrometer 9, and is emitted to the detector 26.
is converted into an electrical signal. This electrical signal is amplified by an amplifier 10, then converted to a digital signal by an analog-to-digital converter 11, and then converted to a digital signal by an integrator 1.
2 is input.
レーザ光24は、他方においてハーフミラ2で
反射され、モニタ用検出器13に入射されて電気
信号に変換される。この電気信号は増幅器14で
増幅され、一方においてアナログデイジタル変換
器15を介して積分器16に入力され、他方にお
いてレベル検出器18に入力され、タイマ19を
作動させる。タイマ19が所定時間を計数した
後、制御部17は検出器26の測光を開始させ、
また放電管22にトリガを送り、螢光強度が測定
処理された後制御部17によりスキヤン装置3,
8を次の測定場所に移動させる。 On the other hand, the laser beam 24 is reflected by the half mirror 2, enters the monitoring detector 13, and is converted into an electric signal. This electrical signal is amplified by an amplifier 14 and is input to an integrator 16 via an analog-to-digital converter 15 on the one hand, and a level detector 18 on the other hand to activate a timer 19. After the timer 19 has counted a predetermined time, the control unit 17 starts photometry of the detector 26,
Further, a trigger is sent to the discharge tube 22, and after the fluorescence intensity is measured, the control unit 17 controls the scan device 3,
8 to the next measurement location.
レーザ光24の1パルスの波形をモニタ用検出
器13の出力波形でみると、第2図aに示す様な
波形となる。第2図aにおいて、波形30は色素
をポンピングするのに使用する放電管22の放電
に起因する雑音であり、波形31はレーザ光自体
の波形である。螢光強度波形を検出器26の出力
波形でみると、第2図bに示す様な波形となる。
第2図bにおいて、波形32は放電管22の放電
に起因する雑音であり、波形33は螢光自体の波
形である。波形30の強度は、波形31の強度と
比べて比較的弱いが、螢光強度自体が弱いため、
波形32の強度は螢光の波形33の強度と比べて
逆に強く、場合によつては強度が逆転する。従つ
て、放電管22に基づく雑音波形32はどうして
も除去しなければ螢光強度を正確に測定できな
い。 When the waveform of one pulse of the laser beam 24 is viewed from the output waveform of the monitoring detector 13, it becomes a waveform as shown in FIG. 2a. In FIG. 2a, a waveform 30 is noise caused by the discharge of the discharge tube 22 used to pump the dye, and a waveform 31 is the waveform of the laser beam itself. When the fluorescence intensity waveform is viewed as the output waveform of the detector 26, the waveform is as shown in FIG. 2b.
In FIG. 2b, a waveform 32 is the noise caused by the discharge of the discharge tube 22, and a waveform 33 is the waveform of the fluorescent light itself. The intensity of waveform 30 is relatively weak compared to the intensity of waveform 31, but since the fluorescence intensity itself is weak,
The intensity of the waveform 32 is stronger than the intensity of the fluorescent waveform 33, and in some cases, the intensity is reversed. Therefore, the fluorescence intensity cannot be accurately measured unless the noise waveform 32 based on the discharge tube 22 is removed.
従つて、本実施例においては、制御部17で放
電管22にトリガをかけ、発振したレーザ光の強
度をモニタしているレベル検出器18により、レ
ーザ光24の強度があるレベル以上になつたとき
螢光強度測定回路にトリガをかける。これに加え
て、検出器26の時定数をあらかじめ最適値に決
めて、このため該時定数分だけ更に遅れて螢光測
定が開始される。この様にして得られる検出器2
6の出力波形を第2図cに示す。 Therefore, in this embodiment, the controller 17 triggers the discharge tube 22, and the level detector 18, which monitors the intensity of the oscillated laser beam, detects when the intensity of the laser beam 24 exceeds a certain level. At this time, a trigger is applied to the fluorescence intensity measurement circuit. In addition, the time constant of the detector 26 is predetermined to an optimum value, so that fluorescence measurement is started with a further delay corresponding to the time constant. Detector 2 obtained in this way
The output waveform of No. 6 is shown in FIG. 2c.
一方、螢光強度測定回路にトリガをかけると同
時に、積分器16にもトリガをかけ、レーザ光2
4の強度波形を測定する。こうして得た螢光強度
の積分信号とレーザ光24の強度を示す積分信号
は共に演算器20に入力され、両積分信号の比を
とるために各種補正や計算等の演算処理が行なわ
れ、その結果が表示装置21に表示される。 On the other hand, at the same time as a trigger is applied to the fluorescent light intensity measuring circuit, a trigger is also applied to the integrator 16, and the laser beam 2
Measure the intensity waveform of step 4. Both the integral signal of the fluorescence intensity and the integral signal indicating the intensity of the laser beam 24 obtained in this way are inputted to the arithmetic unit 20, and arithmetic processing such as various corrections and calculations is performed to calculate the ratio of the two integral signals. The results are displayed on the display device 21.
積分器12,16は最高17nsの時分割でサンプ
リングを行ない、最大1024チヤンネル分のサンプ
リングが可能であり、従つて17×1204=17μsの時
間変化を測定できる。通常、レーザ光パルス幅や
測定する螢光寿命は数μs程度なため、本積分器で
十分測定可能である。しかし、測定開始後螢光強
度がしだいに弱くなり、バツクグラウンド強度と
同レベルになると、この状態で測定しても逆に
S/N比を悪くするので、測定開始後2〜3μsの
範囲で螢光強度の積分を行なわせる。 The integrators 12 and 16 perform sampling on a time division basis of 17 ns at maximum, and are capable of sampling up to 1024 channels, thus measuring a time change of 17×1204=17 μs. Normally, the pulse width of the laser beam and the lifetime of the fluorescent light to be measured are on the order of several microseconds, so this integrator is sufficient for measurement. However, if the fluorescence intensity gradually weakens after the start of measurement and reaches the same level as the background intensity, even if you measure in this state, the S/N ratio will deteriorate, so it is necessary to Integrate the fluorescence intensity.
以上の説明から明らかな様に、本発明によれば
色素レーザ励起用放電管に起因する雑音の影響を
完全に除去でき、単発現象として螢光強度の測定
が正確かつ迅速に行なえる。従つて、変化の早い
プラズマ分布をモニタするのに好適であり、従来
技術の側定精度が20〜30%であつたものが数%ま
で向上する効果を有する。 As is clear from the above description, according to the present invention, the influence of noise caused by the dye laser excitation discharge tube can be completely eliminated, and the fluorescence intensity can be measured accurately and quickly as a single phenomenon. Therefore, it is suitable for monitoring rapidly changing plasma distribution, and has the effect of improving the accuracy of detection from 20 to 30% in the prior art to several percent.
第1図は本発明のレーザ励起螢光測定装置を組
み込んだプラズマ分布モニタを示すブロツク図、
第2図aはレーザ光のモニタ用検出器の出力波形
を示す図、第2図bは雑音を除去する前の螢光の
検出器の出力波形を示す図、第2図cは雑音を除
去した後の螢光の検出器の出力波形を示す図であ
る。
1……紫外線用色素レーザ、2……ハーフミ
ラ、3,8……スキヤン装置、5……プラズマ利
用装置、6……プラズマ物質、9……分光器、1
0,14……増幅器、11,15……アナログ・
デイジタル変換器、12,16……積分器、13
……モニタ用検出器、17……制御部、18……
レベル検出器、19……タイマ、20……演算
器、21……表示装置、22……放電管、23…
…レーザ発振管、24……レーザ光、25……螢
光。
FIG. 1 is a block diagram showing a plasma distribution monitor incorporating the laser-excited fluorescence measuring device of the present invention;
Figure 2a shows the output waveform of the detector for monitoring laser light, Figure 2b shows the output waveform of the fluorescence detector before noise is removed, and Figure 2c shows the output waveform of the fluorescence detector before noise is removed. FIG. 3 is a diagram showing an output waveform of a fluorescence detector after the above-mentioned detection. 1...Dye laser for ultraviolet light, 2...Half mirror, 3, 8...Scan device, 5...Plasma utilization device, 6...Plasma material, 9...Spectroscope, 1
0,14...Amplifier, 11,15...Analog
Digital converter, 12, 16... Integrator, 13
...Monitoring detector, 17...Control unit, 18...
Level detector, 19...Timer, 20...Arithmetic unit, 21...Display device, 22...Discharge tube, 23...
...laser tube, 24...laser light, 25...fluorescence.
Claims (1)
時期をパルスレーザ発光開始時から所定時間遅ら
せ、更に上記パルスレーザ光の強度と上記パルス
レーザ光で励起される螢光の強度をそれぞれ別々
に積算し、上記パルスレーザ光の強度積算値を基
準にして螢光強度の積算値との比をとることによ
つて、螢光強度測定を行なうことを特徴とするレ
ーザ励起螢光測定方法。 2 パルスレーザ光で励起される螢光の強度測定
を、パルスレーザ発行開始時から所定時間遅らせ
て開始する第1の手段と、第1の手段から出力さ
れる螢光強度を示す電気信号をデイジタル変換し
て積算する第2の手段と、上記パルスレーザ光の
強度を電気信号として検出しデイジタル変換して
積算する第3の手段と、第3の手段から出力され
るパルスレーザ光強度の積算値を基準にして第2
の手段から出力される螢光強度の積算値との比を
とり、螢光強度を補正する第4の手段とを有して
なるレーザ励起螢光測定装置。[Claims] 1. The measurement start timing of the fluorescence excited by the pulsed laser beam is delayed by a predetermined period from the start of the pulsed laser emission, and the intensity of the pulsed laser beam and the fluorescence excited by the pulsed laser beam are further adjusted. A laser-excited fluorescent lamp characterized in that the fluorescence intensity is measured by integrating the respective intensities separately and taking the ratio of the integrated value of the fluorescence intensity with the integrated intensity value of the pulsed laser beam as a reference. Light measurement method. 2. A first means for starting the measurement of the intensity of the fluorescent light excited by the pulsed laser beam by a predetermined time delay from the start of pulsed laser emission, and a digital electric signal indicating the fluorescent light intensity output from the first means. a second means for converting and integrating; a third means for detecting the intensity of the pulsed laser light as an electrical signal, converting it into a digital signal and integrating; and an integrated value of the pulsed laser light intensity output from the third means; 2nd based on
and fourth means for correcting the fluorescence intensity by calculating the ratio with the integrated value of the fluorescence intensity output from the means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57094874A JPS58211631A (en) | 1982-06-04 | 1982-06-04 | Laser-excited fluorescence measurement method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57094874A JPS58211631A (en) | 1982-06-04 | 1982-06-04 | Laser-excited fluorescence measurement method and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58211631A JPS58211631A (en) | 1983-12-09 |
| JPS6318134B2 true JPS6318134B2 (en) | 1988-04-16 |
Family
ID=14122192
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57094874A Granted JPS58211631A (en) | 1982-06-04 | 1982-06-04 | Laser-excited fluorescence measurement method and device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58211631A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7057926B1 (en) | 2021-03-26 | 2022-04-21 | 株式会社汀線科学研究所 | Fluorescence measuring device |
-
1982
- 1982-06-04 JP JP57094874A patent/JPS58211631A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58211631A (en) | 1983-12-09 |
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