JPS6318869B2 - - Google Patents
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- JPS6318869B2 JPS6318869B2 JP15818981A JP15818981A JPS6318869B2 JP S6318869 B2 JPS6318869 B2 JP S6318869B2 JP 15818981 A JP15818981 A JP 15818981A JP 15818981 A JP15818981 A JP 15818981A JP S6318869 B2 JPS6318869 B2 JP S6318869B2
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- temperature
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- heat treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/09—Forming piezoelectric or electrostrictive materials
- H10N30/098—Forming organic materials
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Description
本発明は、高分子圧電体の製造方法に関する。
更に詳しくは、フツ化ビニリデン(VDF)と三
フツ化エチレン(TrFE)との共重合体〔P
(VDF−TrFE)〕を用いて、厚み圧電効果の大き
い、また、比較的低いポーリング電圧でも所望の
厚み圧電効果を有する高分子圧電体を得ることが
できる高分子圧電体の製造方法に関する。
P(VDF−TrFE)をポーリング処理して高分
子圧電体を製造することはすでに知られている。
また、本発明者等は、先に、この高分子圧電体の
圧電効果の内容を検討した結果、VDFとTrFEと
の組成比により、横圧電効果(d31)と厚み圧電
効果(Ktまたはd33)の大きさにはそれぞれ別々
の変化があり、d31の値は、VDF=50〜55モル%
において大きくなる傾向を示すのに対し、Ktの
値は、VDF=70〜80モル%において大きくなる
傾向を示すという知見を得ている。これらの関係
を、横軸にVDF組成比(モル%)、縦軸にd31並
びにKtの値をとつて第1図に示す。また、この
共重合体のDSC(Differential Scanning
Calorimetry)あるいはDTA(Differential
Thermal Analysis)による吸発熱曲線には、溶
融を示す吸熱カーブ(温度Tm℃)以外に、該融
点よりも低温側に、強誘電・常誘電相転移を示す
吸熱カーブ(温度T′m℃)を示すものがあり、
T′m(℃)とTm(℃)との間の温度で熱処理した
後あるいは該熱処理をしながらポーリング処理す
ると、厚み圧電効果を示す電気機械結合定数Kt
の値が、ほぼ0.3前後に達する高分子圧電体が得
られる場合があるという知見を得ている。
しかるに、その後更に検討を進めた結果、P
(VDF−TrFE)のVDFの組成比が、約80モル%
を越え、更には、約83モル%を越えると、ポーリ
ング電圧を著しく高くしないと、あるいは、高く
しても、期待したような厚み圧電効果を示すKt
の値が得られない場合があることが判明した。
本発明の目的:
本発明は、上述の期待したような厚み圧電効果
が得られない場合の問題点を解決することを目的
としなされたものである。
本発明の構成:
VDF65〜95モル%とTrFE35〜5モル%との共
重合体またはこれを主体とした重合体からなる成
形物を、加圧下で、処理温度T(℃)が強誘電・
常誘電相転移を意味する吸熱カーブを示す温度
T′m(℃)と溶融を意味する吸熱カーブを示す温
度Tm(℃)との間の温度に選択された熱処理を
行なつた後、あるいは、該熱処理をしながら、ポ
ーリング処理してなる高分子圧電体の製造方法。
本発明に云うT′m並びにTmは、使用する加圧
圧力下に得たDTA曲線から求められる。
本発明に云う加圧下の熱処理は、成形物を加圧
下で加熱、熱処理する場合に、通常よく用いられ
る高圧セル装置で行なうことができ、加圧圧力の
程度は、好ましくは1Kbar以上、より好ましくは
2Kbar以上である。
本発明に云うポーリング処理は、従来よく知ら
れている圧電体製造のために用いられるポーリン
グ処理装置、手段でなすことができる。
本発明の効果:
VDF組成比が65〜95モル%のP(VDF−
TrFE)成形物を用いて、従来法の場合に比べ
て、同程度あるいは、はるかに大きい厚み圧電効
果を示す高分子圧電体を、より低いポーリング電
圧下で、製造することができるようになつたこ
と、並びに、特にVDF組成比が、約80モル%以
上のP(VDF−TrFE)について、従来、良好な
厚み圧電効果が得られない場合があるという問題
点を解決したことに本発明の主たる効果がある。
次に、本発明を、具体的実施例並びに比較実施
例を用いて、更に説明する。
VDF組成比が、74モル%、79モル%、および、
82モル%であるP(VDF−TrFE)のそれぞれを、
15〜20wt%のDMF溶液とし、真空中でキヤスト
し約24時間その状態に保持し、60〜100μmの厚
さを有するフイルム状成形物を得た。次いで、こ
れらを、オーブン中100℃、3〜4時間乾燥し、
溶媒を十分に取り除いた。79モル%物は、延伸効
果を見るため、一部を、80℃で4〜5倍に延伸し
た。
加圧処理は、高圧セルを用いて、所望の圧力P
に試料を加圧設定後、所定の温度に加熱し、所定
の熱処理時間に放置した後、冷却した。このとき
の昇・降温速度は、約5〜10℃/minとした。室
温に冷却後、加圧力Pを取り除き、試料を高圧セ
ルから取り出した。
ここに得られた試料の両面に、Al電極を蒸着
法によつて形成し、ポーリング温度100〜120℃、
ポーリング電圧250〜500kV/cm、ポーリング時
間約30分でポーリング処理を行なつた。
厚み圧電効果を判定するための電気機械結合定
数Ktは、J.Appl.Phys.47、949(1976)記載の手法
に従つて、試料に、高周波電圧(1〜50MHz)を
印加し、共振点付近での電気アドミツタンスを解
析することにより求めた。また、横圧電効果を示
すd31の値は、東洋測器(株)製Vibron−を用い
て、110Hzで、試料面に生じた電荷量と試料断面
での応力との測定から求めた。
(A) VDF/TrFE=79/21共重合体の場合の詳
細:
表1に、この試料(いづれも未延伸)を、従
来法、すなわち、常圧下で熱処理したものと、
本発明に係る方法、すなわち、加圧下で熱処理
したものとをポーリング処理した場合の各条件
とその結果得られた高分子圧電体の圧電効果の
測定結果を示す。
The present invention relates to a method for manufacturing a polymer piezoelectric material.
More specifically, a copolymer of vinylidene fluoride (VDF) and trifluoroethylene (TrFE) [P
(VDF-TrFE)] The present invention relates to a method for manufacturing a polymer piezoelectric material that can obtain a polymer piezoelectric material that has a large thickness piezoelectric effect and has a desired thickness piezoelectric effect even at a relatively low poling voltage. It is already known that a polymer piezoelectric material is produced by poling P(VDF-TrFE).
In addition, the present inventors previously investigated the content of the piezoelectric effect of this polymeric piezoelectric material, and found that depending on the composition ratio of VDF and TrFE, the transverse piezoelectric effect (d 31 ) and the thickness piezoelectric effect (Kt or d 33 ) there are separate changes in the magnitude, and the value of d31 is VDF = 50-55 mol%
It has been found that the Kt value tends to increase when VDF=70 to 80 mol%, while the Kt value tends to increase when VDF=70 to 80 mol%. These relationships are shown in FIG. 1, with the VDF composition ratio (mol %) plotted on the horizontal axis and the values of d 31 and Kt plotted on the vertical axis. In addition, DSC (Differential Scanning) of this copolymer
Calorimetry) or DTA (Differential
In addition to the endothermic curve (temperature Tm℃) that indicates melting, the endothermic curve (temperature T'm℃) that indicates ferroelectric/paraelectric phase transition is also included in the endothermic curve (temperature T'm℃) based on thermal analysis. There is something to show
After heat treatment at a temperature between T′m (°C) and Tm (°C) or during poling treatment, the electromechanical coupling constant Kt exhibiting the thickness piezoelectric effect
It has been found that a polymer piezoelectric material having a value of approximately 0.3 can be obtained in some cases. However, as a result of further consideration, P.
The composition ratio of VDF in (VDF-TrFE) is approximately 80 mol%
, and furthermore, when it exceeds about 83 mol%, the expected thickness piezoelectric effect is exhibited unless or even if the poling voltage is significantly increased.
It has been found that there are cases where the value cannot be obtained. Purpose of the present invention: The present invention has been made with the object of solving the above-mentioned problems in the case where the expected thickness piezoelectric effect cannot be obtained. Structure of the present invention: A molded article made of a copolymer of 65 to 95 mol% of VDF and 35 to 5 mol% of TrFE or a polymer mainly composed of the copolymer is heated under pressure to a temperature T (℃) of ferroelectric.
Temperature showing an endothermic curve indicating paraelectric phase transition
After performing heat treatment at a temperature between T′m (℃) and the temperature Tm (℃) showing an endothermic curve indicating melting, or while performing the heat treatment, a high Method for manufacturing molecular piezoelectric material. T'm and Tm referred to in the present invention are determined from the DTA curve obtained under the applied pressure. The heat treatment under pressure referred to in the present invention can be carried out in a high-pressure cell device that is commonly used when heating and heat-treating molded products under pressure, and the degree of pressure is preferably 1 Kbar or more, more preferably teeth
2Kbar or more. The poling process referred to in the present invention can be performed by a conventionally well-known poling process apparatus and means used for manufacturing piezoelectric bodies. Effects of the present invention: P with a VDF composition ratio of 65 to 95 mol% (VDF-
Using a molded product (TrFE), it is now possible to produce a polymer piezoelectric material that exhibits the same or a much larger thickness piezoelectric effect than with conventional methods, and at a lower poling voltage. In addition, the main object of the present invention is to solve the problem that conventionally, a good thickness piezoelectric effect may not be obtained especially for P (VDF-TrFE) with a VDF composition ratio of about 80 mol% or more. effective. Next, the present invention will be further explained using specific examples and comparative examples. The VDF composition ratio is 74 mol%, 79 mol%, and
82 mol% of each of P(VDF-TrFE),
A 15 to 20 wt % DMF solution was prepared, cast in vacuum, and held in that state for about 24 hours to obtain a film-like molded product having a thickness of 60 to 100 μm. Next, these were dried in an oven at 100°C for 3 to 4 hours,
The solvent was thoroughly removed. A portion of the 79 mol% product was stretched 4 to 5 times at 80° C. to examine the stretching effect. The pressure treatment uses a high pressure cell to achieve a desired pressure P.
After setting the sample under pressure, it was heated to a predetermined temperature, left for a predetermined heat treatment time, and then cooled. The temperature raising/lowering rate at this time was about 5 to 10°C/min. After cooling to room temperature, the pressure P was removed and the sample was taken out from the high pressure cell. Al electrodes were formed on both sides of the obtained sample by vapor deposition, and the poling temperature was 100-120°C.
The polling process was performed at a polling voltage of 250 to 500 kV/cm and a polling time of about 30 minutes. The electromechanical coupling constant Kt for determining the thickness piezoelectric effect is determined by applying a high frequency voltage (1 to 50 MHz) to the sample and measuring the resonance point according to the method described in J.Appl.Phys. 47 , 949 (1976). This was determined by analyzing the electrical admittance in the vicinity. Further, the value of d 31 , which indicates the transverse piezoelectric effect, was determined by measuring the amount of charge generated on the sample surface and the stress on the cross section of the sample at 110 Hz using Vibron- manufactured by Toyo Sokki Co., Ltd. (A) Details of the case of VDF/TrFE=79/21 copolymer: Table 1 shows this sample (all unstretched), the conventional method, that is, the one heat-treated under normal pressure,
1 shows the conditions for the method according to the present invention, that is, the poling treatment performed by heat treatment under pressure, and the measurement results of the piezoelectric effect of the piezoelectric polymer obtained as a result.
【表】【table】
【表】
なお表1中のポーリング処理における温度は
100℃、時間は30分である。また、CD 33は厚み方
向の弾性率である。
表1が示すように、常圧で処理した試料の場
合(Nos.1、2)は、ポーリング電圧が
257kV/cmでは、Ktが0.14と余り大きくなく、
376kV/cmで、0.29となる。常圧で処理した試
料の場合、Ktの値が0.3程度のものを得るには、
ポーリング電圧を約400kV/cm以上にする必要
がある。高圧で処理した試料の場合(Nos.3〜
7)、この際の熱処理温度が、T′mとTmとの
間の温度に設定されていれば(Nos.4、6、
7)、ポーリング電圧が約250kV/cmでKtの値
が約0.27以上のものが得られるのである。この
電圧約250kV/cmは、同じ0.3程度のKtを有す
る常圧処理の場合に必要な上述の約400kV/cm
に比べはるかに低いものであることが明らかで
ある。一方、試料No.4と、試料Nos.3、5とを
比べると、加圧処理圧力が同じでも、熱処理温
度が、T′mとTmとの間という条件を満足して
いないと、Ktの値は減少する傾向にあること
が分かる。この傾向は、表1には示していない
が、3Kbarの場合でも同様であつた。加圧下の
熱処理時間とKtとの関係をみると、試料
Nos.4、6の30分と7分とで、Ktに余り差がな
いことが明らかであり、所望のKtを得るには、
時間よりも、圧力と温度との方が重要であるこ
とが分かる。なお、試料No.6から、高圧処理の
d31の値は、6.6pC/Nで、この値は、常圧処理
のd31の値とほぼ同程度であることが分かる。
このことにより、加圧処理は、圧電効果のう
ち、横圧電効果d31の改善よりも、厚み圧電効
果Ktの改善(より低いポーリング電圧での処
理を可能にすること)に顕著な効果を奏してい
ることが分かる。
次に、圧力Pと熱処理温度Tとの関係をみる
ために、高圧下でのDTAをとり、T′mとTm
の圧力依存性を調べた。この結果を、横軸に圧
力P(Kbar)、縦軸に温度(℃)をとつて示し
たのが第2図である。第2図から、Tmは、40
〜50℃/Kbarで、Pと共に上昇することが分
かる。また、T′mのPによる上昇率は、Tmの
場合より低いため、加圧圧力の増大とともに両
者の温度差△T=Tm−T′mが増していること
が認められる。
第3図は、加圧圧力、熱処理温度、Ktとの
関係を示す一例で、加圧圧力が2Kbarと3Kbar
との場合が示されている。熱処理時間は、共に
30分、ポーリングは1bar(常圧)下で100℃、
250kV/cm、30分で行なつた。第3図中の点線
は、同じポーリング条件での常圧処理物の場合
の平均的なKtの値を示す。ポーリング条件が
同じであるならば、高圧処理物の方が、はるか
に大きいKtの値を呈するものが得られること
が明らかである。また、熱処理温度Tとの関係
では、第2図に示す結果と合わせると、T′m<
T<TmとすることがKtを増大せしめるのに有
効であることが分かる。このことは、高圧下で
相転移点T′m以上で熱処理することにより、常
圧の常合よりも、成形物の高結晶化がなされ、
結晶粒サイズの増加等が有効に生じ、より低い
ポーリング電圧でも分極配向が進むことによる
ものではないかと推測される。なお、△T=
Tm−T′mは、加圧圧力Pと共に増加するた
め、Pが2Kbar、3Kbarとなるに従い、熱処理
条件の範囲が拡がることも明らかである。
ここで、加圧圧力Pをさらに4Kbar、5Kbar
と増した場合、DTAからは、△T=Tm−
T′mは大きくなり、結晶化はさらに進行するも
のと推定される。しかし、ポーリングに際し
200kV/cm以上の耐電圧が必要という前提に立
つと、処理温度約280℃、10分以上での加圧熱
処理では、試料の熱分解が激しくなり、得られ
た成形物の耐電圧は著しく低下し、前述の所定
耐電圧を満足できるものでかと推なる。この点
から、ポーリング可能な成形物を得る条件とし
て、熱処理温度の上限は、約280℃といえる。
この限界を、第2図に点線で示しておく。
次に、表2に、VDF組成比79モル%の場合
の延伸処理されたものの高圧処理とKtとの関
係を示す。延伸は、温度80℃、倍率4〜5倍で
なされ、ポーリング条件は、前述の未延伸の場
合と同じである。延伸物も未延伸物の場合と同
様に、T′m<T<Tmによる高圧結晶化処理に
より結晶化が進み(CD 33がほぼ11×109N/m2)、
ポーリング電圧約250kV/cmで、Ktが0.3程度
のものが得られることが分かる。[Table] The temperature in the polling process in Table 1 is
The temperature was 100℃ and the time was 30 minutes. Moreover, C D 33 is the elastic modulus in the thickness direction. As shown in Table 1, in the case of samples treated at normal pressure (Nos. 1 and 2), the poling voltage was
At 257kV/cm, Kt is 0.14, which is not very large.
At 376kV/cm, it becomes 0.29. For samples treated at normal pressure, to obtain a Kt value of about 0.3,
It is necessary to set the polling voltage to approximately 400kV/cm or higher. For samples treated at high pressure (Nos.3~
7) If the heat treatment temperature at this time is set between T′m and Tm (Nos. 4, 6,
7) A Kt value of about 0.27 or more can be obtained with a polling voltage of about 250 kV/cm. This voltage of about 250kV/cm is the same as the above-mentioned approximately 400kV/cm, which is required in the case of normal pressure processing with Kt of about 0.3.
It is clear that the value is much lower than that of . On the other hand, comparing sample No. 4 with samples Nos. 3 and 5, even if the pressure treatment pressure is the same, if the heat treatment temperature does not satisfy the condition of being between T'm and Tm, the Kt will increase. It can be seen that the value tends to decrease. Although not shown in Table 1, this tendency was also the same in the case of 3Kbar. Looking at the relationship between heat treatment time under pressure and Kt, the sample
It is clear that there is not much difference in Kt between 30 minutes and 7 minutes for Nos.4 and 6, and to obtain the desired Kt,
It turns out that pressure and temperature are more important than time. In addition, from sample No. 6, high pressure treatment
The value of d 31 is 6.6 pC/N, and it can be seen that this value is almost the same as the value of d 31 in normal pressure treatment.
As a result, pressure treatment has a more significant effect on improving the thickness piezoelectric effect Kt (enabling processing at a lower poling voltage) than on improving the transverse piezoelectric effect d31 among the piezoelectric effects. I can see that Next, in order to examine the relationship between pressure P and heat treatment temperature T, we take DTA under high pressure, and T′m and Tm
The pressure dependence of was investigated. This result is shown in FIG. 2, with pressure P (Kbar) plotted on the horizontal axis and temperature (° C.) plotted on the vertical axis. From Figure 2, Tm is 40
It can be seen that it increases with P at ~50°C/Kbar. Furthermore, since the rate of increase of T'm due to P is lower than that of Tm, it is recognized that the temperature difference between the two, ΔT=Tm-T'm, increases as the pressurizing pressure increases. Figure 3 is an example showing the relationship between pressurization pressure, heat treatment temperature, and Kt.
The case is shown. The heat treatment time is
30 minutes, poling at 100℃ under 1bar (normal pressure),
It was carried out at 250kV/cm for 30 minutes. The dotted line in FIG. 3 indicates the average Kt value in the case of normal pressure treated products under the same poling conditions. It is clear that if the poling conditions are the same, the high-pressure treated product will yield a product exhibiting a much larger Kt value. In addition, in relation to the heat treatment temperature T, when combined with the results shown in Figure 2, T'm<
It can be seen that setting T<Tm is effective in increasing Kt. This means that heat treatment under high pressure above the phase transition point T′m results in higher crystallization of the molded product than in the normal case at normal pressure.
It is speculated that this is because an increase in crystal grain size, etc. effectively occurs, and the polarization orientation progresses even at a lower poling voltage. In addition, △T=
Since Tm - T'm increases with the pressurizing pressure P, it is also clear that the range of heat treatment conditions expands as P becomes 2Kbar or 3Kbar. Here, the pressurizing pressure P is further increased by 4Kbar and 5Kbar.
From DTA, △T=Tm−
It is estimated that T'm increases and crystallization progresses further. However, when polling
Based on the premise that a withstand voltage of 200 kV/cm or more is required, if the pressure heat treatment is performed at a treatment temperature of approximately 280°C for more than 10 minutes, the thermal decomposition of the sample will be severe, and the withstand voltage of the resulting molded product will drop significantly. However, it is assumed that the above-mentioned predetermined withstand voltage can be satisfied. From this point of view, it can be said that the upper limit of the heat treatment temperature is about 280°C as a condition for obtaining a pollable molded product.
This limit is shown by a dotted line in FIG. Next, Table 2 shows the relationship between high-pressure treatment and Kt of the stretched material when the VDF composition ratio is 79 mol %. Stretching is performed at a temperature of 80° C. and a magnification of 4 to 5 times, and the poling conditions are the same as in the case of unstretched. As in the case of the unstretched product, crystallization of the stretched product progresses by high-pressure crystallization treatment with T′m<T<Tm (C D 33 is approximately 11×10 9 N/m 2 ),
It can be seen that a Kt of about 0.3 can be obtained with a polling voltage of about 250 kV/cm.
【表】
(B) VDF/TrFE=82/18共重合体の場合の詳
細:
第4図a,bは、横軸に温度、縦軸に吸発熱
の大きさをとつて示した圧力2Kbar下での、溶
媒キヤストによる成形物と溶媒結晶化による成
形物とのDTAである。前者は、T′mとTmの
2つのピーク(間にある発熱は残留溶媒による
影響と考えられる)を呈し、後者は、T′m、
Tm以外にもう一つのピークT″mを呈するが、
このT″mは、加圧圧力Pの増大によつて、Tm
から分離して現われたものであると推定され
る。
第5図は、溶液(DMF)キヤスト物、第6
図は、溶融結晶化物それぞれの場合の加圧圧力
PとTm、T′m(T″m)との関係を、横軸に加
圧圧力P(Kbar)、縦軸に温度(℃)をとつて
示したダイヤグラムである。加圧圧力Pの増大
と共に、△T=Tm−T′mは大きくなり、溶融
結晶化物では、約2Kbar以上で、TmとT′mと
は完全に分離してくることが分かる。
表3は、常圧並びに高圧下での熱処理条件と
圧電効果との関係を示すもので、第7図は、加
圧圧力Pが2Kbar、3Kbar、熱処理時間30分で
の熱処理温度TとKtとの関係を示すものであ
る。なお、試料は全て未延伸である。ポーリン
グ条件は、100℃、30分、約250kV/cmである。[Table] (B) Details for the case of VDF/TrFE=82/18 copolymer: Figure 4 a and b show the temperature under a pressure of 2 Kbar with the horizontal axis representing the temperature and the vertical axis representing the magnitude of heat absorption and heat generation. This is the DTA of a molded product by solvent casting and a molded product by solvent crystallization. The former shows two peaks, T′m and Tm (the exothermic heat in between is thought to be due to the influence of residual solvent), and the latter shows T′m,
In addition to Tm, there is another peak T″m,
This T″m is increased by increasing the pressurizing pressure P.
It is presumed that it appeared separately from the Figure 5 shows solution (DMF) cast product, Figure 6 shows
The figure shows the relationship between pressurization pressure P and Tm, T′m (T″m) for each molten crystallized product, with pressurization pressure P (Kbar) on the horizontal axis and temperature (℃) on the vertical axis. This is a diagram showing that as the pressurizing pressure P increases, △T = Tm - T'm increases, and in a molten crystallized product, Tm and T'm completely separate at about 2 Kbar or more. Table 3 shows the relationship between heat treatment conditions and piezoelectric effect under normal pressure and high pressure, and Figure 7 shows the heat treatment temperature when the pressure P is 2Kbar, 3Kbar, and the heat treatment time is 30 minutes. This shows the relationship between T and Kt. All samples are unstretched. Poling conditions are 100° C., 30 minutes, and approximately 250 kV/cm.
【表】
第7図における点線は、常圧処理したものを
ポーリングした場合において得られたKtの値
の概略値を示す。この程度の値では、実用上有
効な厚み圧電効果を有するものとはいえない。
第5,6図並びに第7図及び表3から、この
場合の共重合体のあるものは、高圧処理によつ
てはじめてT′m<T<Tmの熱処理が可能とな
り、未延伸物で大きい圧電効果(Ktが約0.1以
上)が得られることが分かる。なお、この場合
の共重合体も、上述のVDF=79モル%の場合
同様、280℃を越えると熱分解が激しくなつた。
(C) VDF/TrFE=74/26共重合体の場合の詳
細:
この共重合体は、常圧下の熱処理で、熱処理
温度TをT′m<T<Tmに選択することによ
り、かつ、ポーリング条件を選択することによ
り、Ktが0.3以上の高分子圧電体となすことが
できるが、ポーリング電圧を400〜500kV/cm
あるいはそれ以上に設定することが必要な場合
があり、ポーリング電圧が250kV/cm程度で
は、Ktが0.1程度のものにしかならない場合が
ある。表4および横軸に熱処理温度T(℃)、縦
軸にKtをとつて第8図に、各々の処理条件と
圧電効果との関係を示す。加圧処理のものにつ
いては、VDF=79モル%の場合と同様、加圧
圧力Pの増大により、△T=Tm−T′mが大き
くなり、熱処理条件の選択幅が拡大され、製造
条件の選択が楽になる上、ポーリング電圧も、
常圧処理の場合に比べて半分程度の電圧でKt
が約0.3に達する高分子圧電体の製造が可能と
なることが分かる。なお、加圧熱処理時間は30
分、ポーリング条件は、100℃、30分とした。[Table] The dotted line in FIG. 7 indicates the approximate value of Kt obtained when polling was carried out after normal pressure treatment. A value of this level cannot be said to have a practically effective thickness piezoelectric effect. From Figures 5 and 6, Figure 7, and Table 3, some of the copolymers in this case can be heat treated with T'm < T < Tm only by high pressure treatment, and the unstretched material has a large piezoelectric potential. It can be seen that an effect (Kt of about 0.1 or more) can be obtained. Note that the copolymer in this case also showed severe thermal decomposition when the temperature exceeded 280°C, as in the case of VDF=79 mol% described above. (C) Details for VDF/TrFE=74/26 copolymer: This copolymer can be prepared by heat treatment under normal pressure, by selecting the heat treatment temperature T as T′m<T<Tm, and By selecting the conditions, it is possible to make a polymer piezoelectric material with Kt of 0.3 or more, but the poling voltage must be set at 400 to 500 kV/cm.
Alternatively, it may be necessary to set it higher than that, and if the polling voltage is about 250 kV/cm, Kt may only be about 0.1. Table 4 and FIG. 8, with the heat treatment temperature T (° C.) plotted on the horizontal axis and Kt plotted on the vertical axis, show the relationship between each treatment condition and the piezoelectric effect. As for the pressure-treated product, as in the case of VDF = 79 mol%, as the pressure P increases, △T = Tm - T'm increases, the range of selection of heat treatment conditions is expanded, and the manufacturing conditions can be changed. In addition to making the selection easier, the polling voltage also
Kt at about half the voltage compared to normal pressure treatment.
It can be seen that it is possible to manufacture a polymer piezoelectric material with a value of approximately 0.3. In addition, the pressure heat treatment time is 30
The poling conditions were 100°C and 30 minutes.
【表】
以上に本発明に係る高分子圧電体の製造方法の
実施例を説明したが、斯様にして得られた高分子
圧電体は、電気・機械変換素子として、あるい
は、この圧電体が同時に有する焦電的作用効果を
利用する素子として用いることができ、また、特
にKtの値が0.2以上、好ましくは0.25以上、更に
特に好ましくは0.3以上のものは、従来の無機圧
電体に替えてあるいはポリフツ化ビニリデンから
なる圧電体に替えて、生体とのマツチングよく、
得られる像の分解能が向上する超音波受発信素子
として、生体の超音波診断器の構成要素に好まし
く用いられる。[Table] Examples of the method for manufacturing a polymer piezoelectric material according to the present invention have been described above, and the polymer piezoelectric material obtained in this way can be used as an electromechanical transducer or as a piezoelectric material. It can be used as an element that utilizes the pyroelectric effect that it has at the same time, and in particular, those with a Kt value of 0.2 or more, preferably 0.25 or more, and even more preferably 0.3 or more, can be used in place of conventional inorganic piezoelectric materials. Alternatively, you can replace it with a piezoelectric material made of polyvinylidene fluoride, which matches well with living organisms.
As an ultrasonic receiving/transmitting element that improves the resolution of images obtained, it is preferably used as a component of an ultrasonic diagnostic device for a living body.
第1図は、VDFの組成比とKtおよびd31の値と
の関係を説明するグラフ、第2図は、VDF=79
モル%の場合の加圧圧力とT′mおよびTmとの関
係を説明するグラフ、第3図は、VDF=79モル
%の場合の熱処理温度とKtとの関係を示すグラ
フ、第4図a,bは、VDF=82モル%の場合の
DTA曲線を示す図、第5,6図、VDF=82モル
%の場合の加圧圧力とT′mおよびTmとの関係を
説明するグラフ、第7図は、VDF=82モル%の
場合の熱処理温度とKtとの関係を示すグラフ、
第8図は、VDF=74モル%の場合の熱処理温度
とKtとの関係を示すグラフである。
Figure 1 is a graph explaining the relationship between the composition ratio of VDF and the values of Kt and d 31 , and Figure 2 is a graph explaining the relationship between the composition ratio of VDF and the values of Kt and d 31.
Figure 3 is a graph explaining the relationship between pressurizing pressure and T'm and Tm in the case of VDF = 79 mol%, and Figure 4 is a graph showing the relationship between heat treatment temperature and Kt in the case of VDF = 79 mol%. , b are when VDF=82 mol%
Figures 5 and 6 showing the DTA curve, graphs explaining the relationship between pressurizing pressure and T'm and Tm when VDF = 82 mol%, and Figure 7 show the relationship between the pressurizing pressure and T'm and Tm when VDF = 82 mol%. Graph showing the relationship between heat treatment temperature and Kt,
FIG. 8 is a graph showing the relationship between heat treatment temperature and Kt when VDF=74 mol%.
Claims (1)
チレン35〜5モル%との共重合体またはこれを主
体とした重合体からなる成形物を、加圧下で、処
理温度T(℃)が強誘電・常誘電相転移を意味す
る吸熱カーブを示す温度T′m(℃)と溶融を意味
する吸熱カーブを示す温度Tm(℃)との間の温
度に選択された熱処理を行なつた後、あるいは、
該熱処理をしながら、ポーリング処理してなる高
分子圧電体の製造方法。1 A molded article made of a copolymer of 65 to 95 mol% vinylidene fluoride and 35 to 5 mol% of ethylene trifluoride or a polymer mainly composed of this is heated under pressure at a treatment temperature T (°C). After performing a heat treatment at a temperature selected between the temperature T′m (°C) showing an endothermic curve indicating dielectric-paraelectric phase transition and the temperature Tm (°C) showing an endothermic curve indicating melting, or,
A method for producing a polymer piezoelectric material, which comprises performing a poling treatment while performing the heat treatment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56158189A JPS5860584A (en) | 1981-10-06 | 1981-10-06 | Production of high molecular piezo-electric conductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56158189A JPS5860584A (en) | 1981-10-06 | 1981-10-06 | Production of high molecular piezo-electric conductor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5860584A JPS5860584A (en) | 1983-04-11 |
| JPS6318869B2 true JPS6318869B2 (en) | 1988-04-20 |
Family
ID=15666206
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56158189A Granted JPS5860584A (en) | 1981-10-06 | 1981-10-06 | Production of high molecular piezo-electric conductor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5860584A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20210136714A (en) * | 2020-05-08 | 2021-11-17 | 주식회사 잇츠한불 | Cosmetic composition having ferroelectricity and piezoelectric performance |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2010016291A1 (en) * | 2008-08-06 | 2012-01-19 | コニカミノルタエムジー株式会社 | ORGANIC PIEZOELECTRIC MATERIAL, ITS MANUFACTURING METHOD, ULTRASONIC VIBRATOR, ULTRASONIC PROBE AND ULTRASONIC IMAGE DETECTION DEVICE |
| WO2010029783A1 (en) * | 2008-09-12 | 2010-03-18 | コニカミノルタエムジー株式会社 | Organic piezoelectric material, organic piezoelectric film, ultrasound transducer, method for manufacturing ultrasound transducer, ultrasound probe and ultrasound medical imaging device |
-
1981
- 1981-10-06 JP JP56158189A patent/JPS5860584A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20210136714A (en) * | 2020-05-08 | 2021-11-17 | 주식회사 잇츠한불 | Cosmetic composition having ferroelectricity and piezoelectric performance |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5860584A (en) | 1983-04-11 |
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