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JPS6324696B2 - - Google Patents
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JPS6324696B2 - - Google Patents

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Publication number
JPS6324696B2
JPS6324696B2 JP54096616A JP9661679A JPS6324696B2 JP S6324696 B2 JPS6324696 B2 JP S6324696B2 JP 54096616 A JP54096616 A JP 54096616A JP 9661679 A JP9661679 A JP 9661679A JP S6324696 B2 JPS6324696 B2 JP S6324696B2
Authority
JP
Japan
Prior art keywords
radiation
detector
atf
aperture
absorber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54096616A
Other languages
Japanese (ja)
Other versions
JPS5619470A (en
Inventor
Masahiro Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP9661679A priority Critical patent/JPS5619470A/en
Publication of JPS5619470A publication Critical patent/JPS5619470A/en
Publication of JPS6324696B2 publication Critical patent/JPS6324696B2/ja
Granted legal-status Critical Current

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  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

この発明は、放射線検出器、とくにコンピユー
タトモグラフなどに用いるような複数の単位放射
線検出器を平面上に排列して、走査的に入射放射
線の検出を行う放射線検出器の改良に関するもの
である。 従来のこの種放射線検出器は矩形型検出特性を
もたせていたためその開口幅を小さくしない限り
信号の高い周波数成分の位相が反転したり、まつ
たく伝達されない周波数成分が生ずるなど、画質
を劣化させる種々の欠点をもつている。この発明
は各単位検出器個々に対応してその矩形型検出特
性を修正する吸収物体を置くことによつて、検出
器システムの開口伝達関数(Aperture Transfer
−Function<A.T.F>)を改善し、これらの欠点
を解決しようとするものである。すなわちこの発
明は、複数の単位放射線検出器を平面上において
一列に並設し、被写体を通過した放射線を各単位
放射線検出器に入射せしめるようにした放射線検
出器において、前記各単位放射線検出器の開口部
にそれぞれ対応して、入射放射線強度をその各開
口部にわたつてそれぞれガウス分布的な変化をも
たせる放射線吸収体を介在せしめたことを特徴と
する放射線検出器にかかるものである。 第1図はこの発明の理論を説明するための模式
図であつて、図中1はX線管焦点面におけるX線
強度分布曲線、2は放射線検出器開口における検
出特性を示す曲線、3は被写体のデータ採集時間
内において移動することから生じるボケ関数を示
す曲線を関連して示す。 X線管焦点の強度分布1をf(x)、検出器の検
出特性2をd(x)、データ採集時間に移動するこ
とから生ずるボケ関数をt(x)とすると、X線
ビームの開口伝達関数ATFは各応答関数の一次
元フーリエ変換の積で次式のように表わせる。 ATF=F(f)×F(d)×F(t)〔Fは一次元フー
リエ変換〕 一般に上記f(x)はガウス関数、d(x)、t
(x)は矩形関数である。 すなわち、f(x)=exp〔−(x/x02〕、
The present invention relates to a radiation detector, and particularly to an improvement in a radiation detector that detects incident radiation in a scanning manner by arranging a plurality of unit radiation detectors on a plane, such as those used in computer tomography. Conventional radiation detectors of this type had rectangular detection characteristics, and unless the aperture width was made small, the phase of high frequency components of the signal would be reversed, frequency components would not be transmitted properly, and other problems would occur that would degrade image quality. It has the disadvantages of This invention improves the aperture transfer function of the detector system by placing absorbing objects corresponding to each unit detector to modify its rectangular detection characteristics.
-Function<ATF>) to solve these shortcomings. That is, the present invention provides a radiation detector in which a plurality of unit radiation detectors are arranged in a row on a plane and radiation that has passed through a subject is made to enter each unit radiation detector. The present invention relates to a radiation detector characterized in that, corresponding to each opening, a radiation absorber is interposed to cause the intensity of incident radiation to vary in a Gaussian distribution over each opening. FIG. 1 is a schematic diagram for explaining the theory of the present invention, in which 1 is an X-ray intensity distribution curve at the focal plane of the X-ray tube, 2 is a curve showing the detection characteristics at the aperture of the radiation detector, and 3 is a curve showing the detection characteristics at the radiation detector aperture. A curve illustrating the blur function resulting from the object moving during the data collection time is shown in conjunction. Let f(x) be the intensity distribution 1 of the X-ray tube focal point, d(x) be the detection characteristic 2 of the detector, and t(x) be the blur function resulting from movement during data acquisition time, then the aperture of the X-ray beam is The transfer function ATF is the product of one-dimensional Fourier transform of each response function and can be expressed as follows. ATF=F(f)×F(d)×F(t) [F is one-dimensional Fourier transform] Generally, the above f(x) is a Gaussian function, d(x), t
(x) is a rectangular function. That is, f(x)=exp[−(x/x 0 ) 2 ],

【式】である。 X線管焦点と検出器開口部との中間に位置する
被写体の位置での検出器系の開口伝達関数ATF
は次式で表わせる。 ATF=exp〔−π2f2x20(M−1)2/M2〕 ×sinπfa/M/πfa/M×sinπft0/πft0 今放射線検出器の開口幅aを3mmとし、X線管
焦点、放射線検出器開口部位置間の距離DとX線
管焦点、被写体中心位置間の距離Lとの比率すな
わち倍率M=D/Lを4/3とし、X線管焦点の半径 (X0)を0.75mm、被写体のデータ採集期間内にお
ける像の移動距離t0を0.5mmとして、これらの標
準的な値を入れたときの各ATFを第2図に示す。
第2図においてタテ軸はATF%を示し、ヨコ軸
は周波数サイクルを示し、曲線はX線管焦点の
半径の大きさを関数とするATF曲線、曲線は
データ採集期間中の被写体の動き距離を関数とす
るATF曲線であり、曲線が放射線検出器開口
部のATF曲線を示す。画像の精度を上げるため
サンプリング間隔を細かくすればするほど、すな
わちナイキスト周波数が高くなるほど検出器の開
口部のこのATF特性(曲線)の影響が出てく
る。図では0.5mm間隔でデータをとつた場合で4.4
〜8.8サイクルの周波数成分は位相が反転し、ま
たまつたく検出されない周波数成分も存在し、画
像を劣化させる。 第3図はこの発明の実施例の吸収体を示す模式
図である。2′は検出器開口部であつて前記のよ
うに多数平面上において一列に並設されるが図で
はその内の一個を示す。4が放射線吸収体であつ
てその厚さは開口部中心を通る軸線を中心とし、
その部分でもつとも薄く外方に行くにしたがつて
2次関数的に厚さが増加している形状である。図
においてI0は任意の時期における放射線強度、x
はその位置と前記中心との距離、yは厚みを示
す。この吸収体の形状はATF特性を第2図の
で示すような零や負の値をとることのない、ゆる
やかに落とすようにするものである。ゆるやかに
減小する関数は種々あるがたとえばガウス関数に
する場合をこの第3図で示した。ガウス関数のフ
ーリエ逆変換はガウス関数であるからATF特性
をガウス関数とすればよい。すなわち均一な検出
特性をもつ検出器の前に図示のような2次関数的
に厚さが変化する物体を置くと、検出特性は I1(x)=I0e-x2 となり、ガウス関数的なATF特性が得られるの
である。 このX線吸収体は検出器の開口部の前であれば
よく、その直前でもまた被写体とX線管焦点との
間に置いてもその主旨に変りはない。第4図にそ
の位置関係を示す。図において1′はX線管焦点、
5は被写体でありこの発明において吸収体は通常
実線で示す検出器開口部前部の位置に対応的に置
くが4′で示す位置に置くことも可能なのである。
この場合は被写体の放射線被曝線量を減小させる
効果もある。このX線吸収体は個々の放射線検出
器開口ごとに対応的に1コずつ設ける。X線吸収
体の材料は放射線に吸収を与える任意の材料のも
のが使用される。第5図に示すように各検出器が
短冊状に小さく切つたシンチレーター6を複数個
平面上において一列に並設し、それによつて一旦
可視波長線に変換し、その後に光電子増倍管7を
置くような検出方式をとるときには各シンチレー
ター素子6の後部に前記のように2次関数的に透
過特性の異る光学フイルター8を置くことも可能
であり、この発明の要旨内事項である。 この発明は以上のように構成され動作するの
で、コンピユータトモグラフなどの走査式の複合
放射線検出器システムにおいて、サンプリング間
隔を細かくすることができ、走査線数を多くして
画像の分解能を主とする質を向上することがで
き、ビーム幅のボケ修正を容易に行うことがで
き、従来の矩形検出特性の放射線検出器と同一の
フオトン数を取り込む場合、従来のものより空間
分解能をよくすることができる効果を奏するもの
である。
[Formula]. Aperture transfer function ATF of the detector system at the position of the object located midway between the X-ray tube focal point and the detector aperture
can be expressed by the following formula. ATF=exp [-π 2 f 2 x 2 / 0 (M-1) 2 /M 2 ] × sin π fa / M / π fa / M × sin π ft 0 / π ft 0 Now, let the aperture width a of the radiation detector be 3 mm, and The ratio of the distance D between the ray tube focal point and the radiation detector opening position to the distance L between the X-ray tube focal point and the subject center position, that is, the magnification M=D/L, is set to 4/3, and the radius of the X-ray tube focal point ( Figure 2 shows each ATF when these standard values are entered, assuming that X 0 ) is 0.75 mm and the image movement distance t 0 within the subject data collection period is 0.5 mm.
In Figure 2, the vertical axis shows the ATF%, the horizontal axis shows the frequency cycle, the curve shows the ATF curve as a function of the radius of the X-ray tube focus, and the curve shows the moving distance of the subject during the data collection period. The curve shows the ATF curve of the radiation detector aperture. The finer the sampling interval is to improve image accuracy, that is, the higher the Nyquist frequency, the more the ATF characteristic (curve) of the detector aperture will be affected. In the figure, it is 4.4 when data is taken at 0.5 mm intervals.
The phase of the frequency components of ~8.8 cycles is reversed, and there are also frequency components that are not detected at all, degrading the image. FIG. 3 is a schematic diagram showing an absorber according to an embodiment of the present invention. Reference numeral 2' denotes a detector opening, which is arranged in a row on a plurality of planes as described above, one of which is shown in the figure. 4 is a radiation absorber whose thickness is centered on the axis passing through the center of the opening;
It has a shape that is thin at that part and increases in thickness as a quadratic function as it goes outward. In the figure, I 0 is the radiation intensity at any time, x
is the distance between the position and the center, and y is the thickness. The shape of this absorber allows the ATF characteristics to drop gently without taking zero or negative values as shown in Figure 2. There are various functions that gradually decrease, but for example, a Gaussian function is shown in Fig. 3. Since the Fourier inverse transform of a Gaussian function is a Gaussian function, the ATF characteristics can be made into a Gaussian function. In other words, if an object whose thickness changes quadratically as shown in the figure is placed in front of a detector with uniform detection characteristics, the detection characteristics will be I 1 (x) = I 0 e -x2 , which is a Gaussian function. Therefore, typical ATF characteristics can be obtained. This X-ray absorber can be placed in front of the opening of the detector, and the gist remains the same even if it is placed just before the opening or between the subject and the focal point of the X-ray tube. Figure 4 shows their positional relationship. In the figure, 1' is the X-ray tube focal point,
Reference numeral 5 denotes an object, and in this invention, the absorber is usually placed at the position in front of the detector opening shown by the solid line, but it can also be placed at the position shown at 4'.
In this case, there is also the effect of reducing the radiation exposure dose of the subject. One X-ray absorber is provided for each radiation detector aperture. Any material that absorbs radiation can be used as the material for the X-ray absorber. As shown in FIG. 5, each detector has a plurality of scintillators 6 cut into small strips arranged in a row on a flat surface, which converts the visible wavelength light, and then a photomultiplier tube 7. When using a detection method in which the scintillator elements 6 are placed in the same direction, it is possible to place an optical filter 8 having a transmission characteristic that is quadratically different as described above at the rear of each scintillator element 6, and this is within the scope of the present invention. Since the present invention is configured and operates as described above, it is possible to make the sampling interval finer in a scanning type composite radiation detector system such as a computer tomography machine, and to increase the number of scanning lines to improve image resolution. The beam width can be easily corrected, and when capturing the same number of photons as a conventional radiation detector with rectangular detection characteristics, the spatial resolution can be improved compared to the conventional one. It is effective.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の理論を説明するための模式
図、第2図は開口伝達特性(ATF)曲線図、第
3図はこの発明の実施例の放射線吸収体の説明
図、第4図はこの発明の吸収体とX線管焦点、被
写体、放射線検出器の位置関係を示す平面説明
図、第5図は変形実施例を示す図である。 1′……X線管焦点、2′……検出器開口、3…
…データ採集中の被写体の移動を含む走査パル
ス、4……放射線吸収体、5……被写体、6……
シンチレータ、7……光電子増倍管、8……光学
フイルター。
Figure 1 is a schematic diagram for explaining the theory of this invention, Figure 2 is an aperture transfer characteristic (ATF) curve diagram, Figure 3 is an explanatory diagram of a radiation absorber according to an embodiment of this invention, and Figure 4 is FIG. 5 is an explanatory plan view showing the positional relationship between the absorber of the present invention, the X-ray tube focal point, the subject, and the radiation detector, and FIG. 5 is a diagram showing a modified embodiment. 1'...X-ray tube focal point, 2'...detector aperture, 3...
...Scanning pulse including movement of the subject during data collection, 4...Radiation absorber, 5...Subject, 6...
Scintillator, 7...photomultiplier tube, 8...optical filter.

Claims (1)

【特許請求の範囲】[Claims] 1 複数の単位放射線検出器を平面上において一
列に並設し、被写体を通過した放射線を各単位放
射線検出器に入射せしめるようにした放射線検出
器において、前記各単位放射線検出器の開口部に
それぞれ対応して、入射放射線強度をその各開口
部にわたつてそれぞれガウス分布的変化をもたせ
る放射線吸収体を介在せしめたことを特徴とする
放射線検出器。
1. In a radiation detector in which a plurality of unit radiation detectors are arranged side by side in a row on a plane, and the radiation that has passed through the subject is made to enter each unit radiation detector, each of the unit radiation detectors has a Correspondingly, a radiation detector characterized in that a radiation absorber is interposed to cause the intensity of incident radiation to vary in a Gaussian distribution over each of its openings.
JP9661679A 1979-07-26 1979-07-26 Radiation detector Granted JPS5619470A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9661679A JPS5619470A (en) 1979-07-26 1979-07-26 Radiation detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9661679A JPS5619470A (en) 1979-07-26 1979-07-26 Radiation detector

Publications (2)

Publication Number Publication Date
JPS5619470A JPS5619470A (en) 1981-02-24
JPS6324696B2 true JPS6324696B2 (en) 1988-05-21

Family

ID=14169781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9661679A Granted JPS5619470A (en) 1979-07-26 1979-07-26 Radiation detector

Country Status (1)

Country Link
JP (1) JPS5619470A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5889004U (en) * 1981-12-14 1983-06-16 株式会社日立メデイコ Collimator for CT equipment
US4951222A (en) * 1988-06-09 1990-08-21 Bethlehem Steel Corporation Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography
CN103624949B (en) * 2012-08-28 2016-09-07 比亚迪股份有限公司 A kind of expressing technique of ethylene-vinyl acetate film

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5368994A (en) * 1976-12-02 1978-06-19 Toshiba Corp X-ray apparatus

Also Published As

Publication number Publication date
JPS5619470A (en) 1981-02-24

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