JPS6328241B2 - - Google Patents
Info
- Publication number
- JPS6328241B2 JPS6328241B2 JP1265582A JP1265582A JPS6328241B2 JP S6328241 B2 JPS6328241 B2 JP S6328241B2 JP 1265582 A JP1265582 A JP 1265582A JP 1265582 A JP1265582 A JP 1265582A JP S6328241 B2 JPS6328241 B2 JP S6328241B2
- Authority
- JP
- Japan
- Prior art keywords
- surface roughness
- standard plate
- metal
- capacitance
- roughness measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003746 surface roughness Effects 0.000 claims description 52
- 239000002184 metal Substances 0.000 claims description 10
- 238000004439 roughness measurement Methods 0.000 claims description 9
- 238000005259 measurement Methods 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 6
- 238000003825 pressing Methods 0.000 claims description 2
- 239000011800 void material Substances 0.000 claims 1
- 241001422033 Thestylus Species 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 1
- 238000009760 electrical discharge machining Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Description
【発明の詳細な説明】
(a) 産業上の利用分野
この発明は電気容量式表面あらさ測定機を用い
た表面あらさ測定システムにおける該表面あらさ
測定機の目盛校正のための電気容量式表面あらさ
測定機用標準板に関するものである。[Detailed Description of the Invention] (a) Industrial Application Field This invention relates to capacitive surface roughness measurement for scale calibration of a surface roughness measuring machine in a surface roughness measuring system using a capacitive surface roughness measuring machine. This relates to standard plates for machines.
(b) 従来の技術およびその問題点
従来、金属表面の表面あらさの基準は、被測定
面における表面あらさに追従する触針の上下振幅
を寸法的に表示する触針法によつて行われてい
る。一方、電気容量式表面あらさ測定機を用いた
表面あらさ測定システムの場合も、被測定物の被
測定面と測定機における測定電極面との間に得ら
れる静電容量を、触針法で得られた上下振幅値に
よる表面あらさに相当する値として指示されるこ
とが要求されている。そのために前記触針法で得
られる表面あらさの検出値と、電気容量式表面あ
らさ測定システムで得られる静電容量との関係
が、安定かつ一定であるような表面凹凸程度およ
び形状をもつ表面あらさ標準板が必要となり、当
該表面あらさ標準板によつて電気容量式表面あら
さ測定機の目盛校正、あるいは比較が行われてい
る。(b) Conventional technology and its problems Conventionally, the surface roughness of metal surfaces has been determined by the stylus method, which dimensionally displays the vertical amplitude of a stylus that follows the surface roughness of the surface to be measured. There is. On the other hand, in the case of a surface roughness measurement system using a capacitive surface roughness measuring device, the capacitance obtained between the surface to be measured of the object to be measured and the measurement electrode surface of the measuring device is obtained using the stylus method. It is required that the value be indicated as a value corresponding to the surface roughness based on the vertical amplitude values. Therefore, the surface roughness has a degree and shape of surface roughness such that the relationship between the detected value of surface roughness obtained by the stylus method and the capacitance obtained by the capacitive surface roughness measurement system is stable and constant. A standard plate is required, and the scale of the capacitive surface roughness measuring machine is calibrated or compared using the surface roughness standard plate.
従来、この種の目的のための表面あらさ標準板
については、たとえば第1図に示すように旋盤仕
上面、機械切削面、研削面および研摩面等のよう
に表面あらさの凹凸形状に一定の方向性があるよ
うな場合には、比較的容易に製造することがで
き、選定することができる。しかしながら、第2
図に示すようにプラスト仕上面、放電加工仕上
面、およびエツチング仕上面等のように表面あら
さの凹凸形状の分布に方向性がなく不均一である
場合には、当該表面あらさ標準板の製造および選
定がきわめて困難であつた。 Conventionally, for surface roughness standard plates for this type of purpose, for example, as shown in Fig. 1, surface roughness irregularities such as lathe-finished surfaces, machine-cut surfaces, ground surfaces, polished surfaces, etc. have been prepared in a certain direction. If there is a property, it can be manufactured and selected relatively easily. However, the second
As shown in the figure, when the distribution of surface roughness is non-uniform and has no directionality, such as on a plastic-finished surface, an electrical discharge machining finished surface, an etched finished surface, etc., the production of the surface roughness standard plate and the The selection was extremely difficult.
(c) 本発明の技術的課題
そこで、この発明は、電気容量式表面あらさ測
定機を用いた表面あらさ測定システムにおいて、
特に、上記するプラスト仕上面等の表面あらさ測
定に関連して、きわめて効果的に適用される表面
あらさ測定用標準板を提供することにある。(c) Technical problems of the present invention Therefore, the present invention provides a surface roughness measuring system using a capacitive surface roughness measuring machine.
Particularly, it is an object of the present invention to provide a standard plate for surface roughness measurement that can be applied very effectively in relation to the surface roughness measurement of the above-mentioned plastic finished surfaces.
(d) 本発明の技術的手段
この発明は、上記する目的を達成するにあたつ
て、具体的には、所定の広域な測定電極面を一定
の圧力で金属被測定物の被測定面に対向させて押
しあて、前記測定電極面と被測定面間に生ずる電
気容量の変化を電気信号として検出して金属被測
定物の表面あらさを測定する電気容量式表面あら
さ測定機を用いた表面あらさ測定システムにおい
て、前記表面あらさ測定機の目盛校正のための標
準板であつて、剛直性を有する硬質な基板の一基
準面上に、互いに平行に配列される経線および前
記経線に対してそれぞれ平織状に交差する緯線と
によつて組織され互いに離間する複数の電極接触
点と空隙ホールとを形成する金網を取付けてな
り、前記金網の線径および各線間ピツチを、電気
容量式表面あらさ測定機の電極面を所定の表面あ
らさの金属表面に押しあてた際に、前記電極面と
金属表面との間に生じる電気容量の値に対応する
ように予め設定してなる電気容量式表面あらさ測
定機用標準板である。(d) Technical Means of the Invention In order to achieve the above-mentioned object, the present invention specifically applies a predetermined wide-area measurement electrode surface to the measurement surface of a metal object under constant pressure. Surface roughness measurement using a capacitance type surface roughness measuring machine that measures the surface roughness of a metal object by pressing the electrodes facing each other and detecting the change in capacitance that occurs between the measurement electrode surface and the surface to be measured as an electrical signal. In the measurement system, meridians arranged in parallel to each other and plain weaves are respectively arranged on a reference surface of a rigid substrate that is a standard plate for calibrating the scale of the surface roughness measuring machine, and are arranged parallel to each other. A wire mesh is attached that forms a plurality of electrode contact points and gap holes that are organized by latitude lines that intersect with each other in a shape, and are spaced apart from each other. A capacitance type surface roughness measuring device that is preset to correspond to the value of capacitance generated between the electrode surface and the metal surface when the electrode surface is pressed against a metal surface having a predetermined surface roughness. This is a standard plate for
(e) 本発明の実施例
以下、この発明になる電気容量式表面あらさ測
定機用標準板について、図面に示す具体的な実施
例にもとづいて詳細に説明する。(e) Embodiments of the present invention Hereinafter, the standard plate for a capacitive surface roughness measuring device according to the present invention will be described in detail based on specific embodiments shown in the drawings.
この発明になる標準板R.Pは、基本的には、表
面あらさの中心線を代表する剛直性を有する硬質
の基板2と、前記基板2の一基準面2a上に重ね
合わせて取付けられる金網1とによつて構成され
る。前記基板2は、基本的には第3図および第4
図に示すように平坦な基準面2aを備えたものか
らなり、変形的には、第6図A〜Eに示すように
一軸方向ないしは二軸方向に予め彎曲した基準面
を備えたものであつてもよい。前記金網1は、互
いに平行に配列される経線1Aおよび前記経線1
Aに対してそれぞれ平織状に交差する緯線1Bと
によつて組織されている。前記平織状に組織され
ている経線1Aおよび1Bは、それぞれ互いに交
差して重なり合つた部分において、経緯方向にそ
れぞれ交互に離間する電極接触点4,4を形成す
る。一方、互いに隣接する経線1Aおよび緯線1
Bによつて、それぞれの間に離間する空隙ホール
5を形成する。前記金網1は、各線の線径6およ
び各線間ピツチ7の適宜選択的組み合わせによつ
て、前記電極接触点4の単位面積当たりの数(電
極接触点の密度)、各線の重なり合う部分の傾斜
角、および接触点部分の曲率等が決定され、電気
容量式表面あらさ測定電極3に対して固有の静電
容量を供することができる。実際のブラスト仕上
面において、その表面あらさの凹凸状における山
頂部の単位面積当たりの数(密度)、傾斜角、お
よび頂部の曲率は、電気容量式表面あらさ測定電
極に対して固有の静電容量を決定する主な要素で
ある。すなわち、実際のプラスト仕上面における
表面あらさと、上記構成における金網による線径
と各線間ピツチとによつて決定される標準板の構
造とは、その静電容量の変化において相似する関
係にある。従つて、予め統計的に金網の線径6お
よび各線間ピツチ7と実際の表面あらさとの関係
を求めておくことにより、たとえばブラスト仕上
面をもつ電気容量式あらさ測定機の目盛校正用標
準板として適用することができる。 The standard plate RP according to the present invention basically includes a rigid substrate 2 having rigidity representing the center line of the surface roughness, and a wire mesh 1 mounted on one reference surface 2a of the substrate 2 in an overlapping manner. Composed by. The substrate 2 is basically as shown in FIGS. 3 and 4.
As shown in the figure, it is provided with a flat reference surface 2a, and as a modification, it is provided with a reference surface that is pre-curved in one or two axial directions, as shown in FIGS. It's okay. The wire mesh 1 has a meridian 1A and a meridian 1 arranged parallel to each other.
It is organized by latitude lines 1B that intersect with A in a plain weave manner. The meridians 1A and 1B arranged in a plain weave form electrode contact points 4, 4 which are alternately spaced apart in the longitudinal direction at the portions where they intersect with each other and overlap. On the other hand, meridian 1A and latitude 1 which are adjacent to each other
B forms gap holes 5 spaced apart from each other. The wire mesh 1 has the number of electrode contact points 4 per unit area (density of electrode contact points) and the inclination angle of the overlapping portion of each wire by appropriately selectively combining the wire diameter 6 of each wire and the pitch 7 between each wire. , the curvature of the contact point, etc. are determined, and a specific capacitance can be provided to the capacitive surface roughness measuring electrode 3. On an actual blasted surface, the number (density) of peaks per unit area, inclination angle, and curvature of the peaks in the roughness of the surface roughness are determined by the capacitance specific to the capacitive surface roughness measurement electrode. This is the main determining factor. That is, the surface roughness of the actual plastic finished surface and the structure of the standard plate determined by the wire diameter of the wire mesh and the pitch between each wire in the above configuration have a similar relationship in terms of changes in capacitance. Therefore, by statistically determining in advance the relationship between the wire diameter 6 of the wire mesh, each wire pitch 7, and the actual surface roughness, it is possible to use, for example, a standard plate for scale calibration of a capacitance type roughness measuring machine with a blasted surface. It can be applied as
(f) 本発明の効果
以上の構成になるこの発明の電気容量式表面あ
らさ測定機用標準板は、構造がきわめて簡潔であ
る点において量産性、加工性に優れたものであ
り、加えて材料の入手が容易でありかつ安価であ
る点において経済的に有利である。さらに、この
発明になる表面あらさ測定機用標準板は、理論
的、統計的に裏付けが可能なものであつて、構造
の簡潔化と相俟つて同質の標準板を提供すること
ができる。(f) Effects of the present invention The standard plate for a capacitive surface roughness measuring machine of the present invention having the above-described structure has an extremely simple structure and is excellent in mass production and processability. It is economically advantageous in that it is easy to obtain and inexpensive. Furthermore, the standard plate for a surface roughness measuring device according to the present invention can be supported theoretically and statistically, and together with a simplified structure, it is possible to provide a standard plate of the same quality.
第1図は、方向性のある表面あらさの例を示す
被測定物の概略的斜視図、第2図は、方向性のな
い表面あらさの例を示す被測定物の概略的斜視
図、第3図は、この発明になる電気容量式表面あ
らさ測定機用標準板の概略的斜視図、第4図は、
標準板に対して電気容量式表面あらさ測定機にお
ける測定電極を押しあてた状態を示す概略的拡大
断面図、第5図は、当該標準板における金網の概
略的拡大平面図、第6図A〜Eは、当該標準板に
おいて基板を彎曲設計した幾つかの具体例を示す
概略的斜視図、第7図は、電気容量式表面あらさ
測定電極を用いた時の、実際の被測定物の各表面
あらさに対する静電容量の変化を示すグラフ、第
8図は、当該標準板に対して、電気容量式表面あ
らさ測定電極を用いた時の、金網の線径と、各線
間ピツチ、すなわち金網のメツシユ番号に対する
静電容量の変化を示すグラフである。
1……金網、2……基板、3……電気容量式表
面あらさ測定電極、4……金網の電極接触点、5
……金網の空隙ホール、6……金網の線径、7…
…金網の各線間ピツチ、R.P……標準板。
FIG. 1 is a schematic perspective view of the object to be measured showing an example of surface roughness with directionality, FIG. 2 is a schematic perspective view of the object to be measured showing an example of surface roughness without directionality, and FIG. The figure is a schematic perspective view of a standard plate for a capacitive surface roughness measuring machine according to the present invention, and FIG.
FIG. 5 is a schematic enlarged cross-sectional view showing the measurement electrode of the capacitive surface roughness measuring device pressed against the standard plate, and FIG. 6 is a schematic enlarged plan view of the wire mesh on the standard plate. E is a schematic perspective view showing some specific examples of curved design of the board in the standard board, and Fig. 7 shows each surface of the actual object to be measured when using a capacitive surface roughness measuring electrode. Figure 8, a graph showing changes in capacitance with respect to roughness, shows the wire diameter of the wire mesh and the pitch between each wire, that is, the mesh of the wire mesh, when a capacitive surface roughness measuring electrode is used for the standard plate. It is a graph showing changes in capacitance with respect to numbers. DESCRIPTION OF SYMBOLS 1... Wire mesh, 2... Substrate, 3... Capacitive surface roughness measurement electrode, 4... Electrode contact point of wire mesh, 5
...Gap hole in wire mesh, 6... Wire diameter of wire mesh, 7...
...Pitch between each line of wire mesh, RP...Standard plate.
Claims (1)
被測定物の被測定面に対向させて押しあて、前記
測定電極面と被測定面間に生ずる電気容量の変化
を電気信号として検出して金属被測定物の表面あ
らさを測定する電気容量式表面あらさ測定機を用
いた表面あらさ測定システムにおいて、前記表面
あらさ測定機の目盛校正のための標準板であつ
て、 剛直性を有する硬質な基板の一基準面上に、互
いに平行に配列される経線および前記経線に対し
てそれぞれ平織状に交差する緯線とによつて組織
され互いに離間する複数の電極接触点と空隙ホー
ルとを形成する金網を取付けてなり、前記金網の
線径および各線間ピツチを、電気容量式表面あら
さ測定機の電極面を所定の表面あらさの金属表面
に押しあてた際に、前記電極面と金属表面との間
に生じる電気容量の値に対応するように予め設定
してなることを特徴とする電気容量式表面あらさ
測定機用標準板。[Claims] 1. Pressing a predetermined wide-area measurement electrode surface against the surface to be measured of a metal object under constant pressure, and measuring the change in capacitance that occurs between the measurement electrode surface and the surface to be measured. In a surface roughness measurement system using a capacitance type surface roughness measuring machine that measures the surface roughness of a metal workpiece by detecting it as an electrical signal, a standard plate for calibrating the scale of the surface roughness measuring machine, A plurality of electrode contact points and void holes are arranged on one reference surface of a hard substrate having properties and spaced apart from each other and are organized by meridian lines arranged parallel to each other and latitude lines that intersect the meridian lines in a plain weave manner, respectively. When the electrode surface of a capacitance type surface roughness measuring device is pressed against a metal surface with a predetermined surface roughness, the wire diameter and the pitch between the wires of the wire mesh are set to A standard plate for a capacitive surface roughness measuring device, characterized in that the standard plate is preset to correspond to the value of capacitance generated between the metal surface and the metal surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1265582A JPS58129203A (en) | 1982-01-28 | 1982-01-28 | Standard plate for surface roughness measuring machine of electric capacity type |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1265582A JPS58129203A (en) | 1982-01-28 | 1982-01-28 | Standard plate for surface roughness measuring machine of electric capacity type |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58129203A JPS58129203A (en) | 1983-08-02 |
| JPS6328241B2 true JPS6328241B2 (en) | 1988-06-07 |
Family
ID=11811370
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1265582A Granted JPS58129203A (en) | 1982-01-28 | 1982-01-28 | Standard plate for surface roughness measuring machine of electric capacity type |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58129203A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4689988B2 (en) * | 2004-08-25 | 2011-06-01 | 株式会社ミツトヨ | Calibration specimen for surface texture measuring machine |
| JP4767614B2 (en) * | 2005-07-28 | 2011-09-07 | 株式会社ミツトヨ | Roughness standard piece and manufacturing method thereof |
| JP4690276B2 (en) * | 2006-09-13 | 2011-06-01 | 株式会社ミツトヨ | Calibration method for roundness measuring apparatus |
-
1982
- 1982-01-28 JP JP1265582A patent/JPS58129203A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58129203A (en) | 1983-08-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2806560B2 (en) | Tactile sensor | |
| US4963702A (en) | Digitizer pad featuring spacial definition of a pressure contact area | |
| JP2007517216A (en) | Sensor | |
| JPH03277919A (en) | Converter for capacitance-type measurement | |
| US4182981A (en) | Apparatus for gauging the shape of a conducting surface | |
| CN206378838U (en) | Pressure-sensing module, pressure touch sensing system | |
| JP2006020823A (en) | Array type capacitive pressure pulse wave sensor and pulse wave measuring apparatus equipped with the same | |
| JPH0755598A (en) | Tactile sensor and tactile imager | |
| JPS6328241B2 (en) | ||
| US4649752A (en) | Shim gap probe | |
| JPH0450701A (en) | Surface roughness measuring method for honeycomb and measuring prove used for same | |
| JP4958102B2 (en) | Tactile sensor and manufacturing method thereof | |
| JPH0617838B2 (en) | Rubber plate for pressure distribution measurement | |
| JPS59116501A (en) | Flatness measuring device and method therefor | |
| CN106269756A (en) | Pressure detection method, device and glass cleaning equipment between hairbrush and glass substrate | |
| KR100695898B1 (en) | CPM processing pressure distribution measuring device | |
| JPS5994028A (en) | Detector for pressure distribution of contact surface | |
| KR102666643B1 (en) | Pressure sensitive sheet reinforcing the degree of accuracy for local sensing of pressure | |
| JPH037763Y2 (en) | ||
| JP6780743B2 (en) | Touch panel | |
| RU2028587C1 (en) | Thin-film pressure transducer | |
| SU742793A1 (en) | Method of determining the value of non-uniformity of distribution of fibrous material structure and specific energy | |
| JPS5894966A (en) | Measuring method of abrasive grain ejection quantity in grindstone | |
| JPH0345128Y2 (en) | ||
| SU1174791A1 (en) | Resistance strain gauge transducer of force |