JPS6331048B2 - - Google Patents
Info
- Publication number
- JPS6331048B2 JPS6331048B2 JP55181140A JP18114080A JPS6331048B2 JP S6331048 B2 JPS6331048 B2 JP S6331048B2 JP 55181140 A JP55181140 A JP 55181140A JP 18114080 A JP18114080 A JP 18114080A JP S6331048 B2 JPS6331048 B2 JP S6331048B2
- Authority
- JP
- Japan
- Prior art keywords
- defect
- detected
- detecting
- laser beam
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【発明の詳細な説明】
本発明はガラスなどの透光性物質における傷あ
るいは異物の混入などによつて生ずる欠陥の大き
さをレーザ光を利用して検出する欠陥検出装置に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a defect detection device that uses laser light to detect the size of defects caused by scratches or foreign matter in a transparent material such as glass.
透光性物質、例えばガラス管の製造においてガ
ラス管の長さ方向に線状に引き伸ばされた気泡が
混入して線状の欠陥となつたり、あるいは非融解
部がガラス内に生じて点状の欠陥となつたり、あ
るいは外力により表面に傷を生じたりすることが
多く、このためガラス管における欠陥の検出作業
を行なうことは品質管理上非常に重要なことであ
る。 In the manufacture of translucent materials, such as glass tubes, air bubbles stretched in a linear manner in the length direction of the glass tube may be mixed in, resulting in linear defects, or unfused areas may occur within the glass, causing dots. This often results in defects or scratches on the surface due to external forces, so detecting defects in glass tubes is very important for quality control.
一般に物体に生じたこのような欠陥を検出する
ためにレーザ光を物体に照射して、欠陥による散
乱光を検出して欠陥を検出する装置がある。この
ような欠陥検出装置として、従来より種々の装置
があるが、いずれも被検査体としては平板状のも
のが想定されていて、この平板状の被検査体にレ
ーザ光を反射させて被検査体の表面における欠陥
を検出するように構成されている。しかるに、上
記のガラス管の如く円筒状表面を有し且つ内部に
欠陥を持つことが多い被検査体に前記した従来の
検出装置を適用しようとしても反射光の方向が照
射する個所によつて著しく変化し、欠陥による散
乱あるいは回析した光の方向が平板に比し著しく
不規則且つ広範囲なため精度の良い検出は極めて
困難であつた。このため上記のガラス管の如き被
検査体の場合は目視検査に頼つているのが実情で
あり極めて非能率的であつた。 Generally, in order to detect such defects occurring in an object, there is a device that irradiates the object with a laser beam and detects the scattered light caused by the defect to detect the defect. There have been various types of defect detection devices in the past, but in all of them, the object to be inspected is assumed to be a flat plate, and a laser beam is reflected on this flat object to be inspected. The device is configured to detect defects on the surface of the body. However, even if we try to apply the above-mentioned conventional detection device to an object to be inspected that has a cylindrical surface and often has internal defects, such as the above-mentioned glass tube, the direction of the reflected light will be significantly affected by the irradiation location. The direction of the light that changes and is scattered or diffracted by defects is extremely irregular and wide-ranging compared to that of a flat plate, making accurate detection extremely difficult. For this reason, in the case of objects to be inspected such as the above-mentioned glass tubes, visual inspection is actually relied upon, which is extremely inefficient.
さらにまた、従来の装置では、欠陥そのものの
存在は検出できるが、その欠陥がどの程度の大き
さのものであるかの検出は行なえなかつた。この
欠陥の大きさを検出することは、欠陥の有無を検
出することと共にガラスなどの製造工程における
品質管理上非常に重要なことである。 Furthermore, conventional devices can detect the existence of a defect itself, but cannot detect the size of the defect. Detecting the size of this defect, as well as detecting the presence or absence of a defect, is very important for quality control in the manufacturing process of glass and the like.
この発明は上記の点に鑑みてなされたもので、
ガラス管などの透光性物質の長手方向に、線状に
引き伸ばされた気泡が混入するなどして生じた線
状の欠陥の大きさを、レーザ光を用いて高感度に
検出し得、製品の品質管理上きわめて有用な欠陥
検出装置を提供することを目的とする。 This invention was made in view of the above points,
Laser light can be used to detect the size of linear defects caused by elongated air bubbles mixed in the longitudinal direction of translucent materials such as glass tubes with high sensitivity. The purpose of this invention is to provide a defect detection device that is extremely useful for quality control.
以下この発明の一実施例を図面を参照して説明
する。実施例を説明する前に、まずこの発明に係
る欠陥検出の基本的原理を説明する。第1図a,
bに示すように、図示矢印X方向に移動している
ガラス管1の長手方向に、気泡の混入などによる
線状の欠陥部Aが生じている場合、このガラス管
1の移動方向と直交する方向(Y−Y′方向)に
レーザ光2を走査すると、上記欠陥部Aによる散
乱光は一般に第2図のようになる。すなわち、欠
陥部A、特に欠陥部Aの端部に当たつた光は、大
きな散乱角をもつて線状欠陥に直角方向に散乱す
る。したがつて、上記ガラス管1の移動方向と直
角方向の散乱光を検出することにより、欠陥の有
無を検出することができる。 An embodiment of the present invention will be described below with reference to the drawings. Before describing embodiments, the basic principle of defect detection according to the present invention will be explained first. Figure 1a,
As shown in b, if a linear defect A is generated in the longitudinal direction of the glass tube 1 that is moving in the direction of the arrow X in the figure, due to the inclusion of air bubbles, etc. When the laser beam 2 is scanned in the direction (Y-Y' direction), the light scattered by the defective portion A generally becomes as shown in FIG. That is, the light hitting the defective portion A, particularly the end of the defective portion A, is scattered at a large scattering angle in a direction perpendicular to the linear defect. Therefore, by detecting scattered light in a direction perpendicular to the moving direction of the glass tube 1, the presence or absence of a defect can be detected.
次に上記のような欠陥検出原理に基づいて、こ
の発明の目的である欠陥の大きさ検出についての
実施例を説明する。第3図はこの発明の一実施例
の構成を示すもので、1は第1図で示したものと
同じガラス管で、紙面に直角な方向に移動してい
る。10はレーザ光源、11はレーザ光源10か
らのレーザ光2を図示Y−Y′方向に走査させる
ための回転ミラー、12は照射レンズ、13,1
4は上記ガラス管1を中心として対称位置に所定
間隔離間されて配置された第1、第2の散乱光受
光部である。上記散乱光受光部13,14は上記
レーザ光源10からのレーザ光2の走査によつて
作られる平面内に設置されている。また、この散
乱光受光部13,14のそれぞれの受光軸上には
集光レンズ15,16が設置されている。なお、
図において、17はガラス管1を挾んで上記照射
レンズ12と反対側に設置された集光レンズ、1
8はこの集光レンズ17で集光されたレーザ光
(被検出体1を外れたレーザ走査光)を受光する
受光部、19,20は被検出体1での散乱角の小
さい散乱光を受光する受光部である。 Next, an embodiment of detecting the size of a defect, which is an object of the present invention, will be described based on the defect detection principle as described above. FIG. 3 shows the structure of an embodiment of the present invention, in which numeral 1 is the same glass tube as shown in FIG. 1, and it is moving in a direction perpendicular to the plane of the paper. 10 is a laser light source; 11 is a rotating mirror for scanning the laser light 2 from the laser light source 10 in the Y-Y'direction; 12 is an irradiation lens; 13, 1
Reference numeral 4 denotes first and second scattered light receiving sections arranged symmetrically with respect to the glass tube 1 and spaced apart by a predetermined distance. The scattered light receivers 13 and 14 are installed within a plane created by scanning the laser beam 2 from the laser light source 10. Further, condensing lenses 15 and 16 are installed on the respective light receiving axes of the scattered light receiving sections 13 and 14. In addition,
In the figure, reference numeral 17 denotes a condenser lens installed on the opposite side of the irradiation lens 12 with the glass tube 1 in between.
Reference numeral 8 denotes a light receiving unit that receives the laser light (laser scanning light that has left the object 1 to be detected) focused by the condenser lens 17, and 19 and 20 receive the scattered light with a small scattering angle from the object 1 to be detected. This is the light receiving section.
また、21は上記散乱光受光部13,14の出
力のピークを検出するピーク検出回路、22はこ
のピーク検出回路21で検出されたピーク信号間
の時間差をカウントする計測回路である。 Further, 21 is a peak detection circuit that detects the peak of the output of the scattered light receivers 13 and 14, and 22 is a measurement circuit that counts the time difference between the peak signals detected by the peak detection circuit 21.
このような構成において、次にその動作を説明
する。ガラス管1に第1図のような線状の欠陥部
Aがあると、この欠陥部Aの端部での散乱光は第
2図のように大きな散乱角を持つて広がる。この
散乱光は第1、第2の散乱光受光部13,14で
受光され、第4図aのような受光信号として出力
される。この第4図aにおいて、S1は第1の散乱
光受光部13からの受光信号、S2は第2の散乱光
受光部14からの受光信号であり、振幅は光量に
比例している。したがつて、振幅が最大の点が最
も散乱光が多いことを示しており、その点が欠陥
部Aの端部に対応している。 The operation of such a configuration will be explained next. When the glass tube 1 has a linear defect A as shown in FIG. 1, the scattered light at the end of the defect A spreads with a large scattering angle as shown in FIG. This scattered light is received by the first and second scattered light receivers 13 and 14, and is output as a light reception signal as shown in FIG. 4a. In FIG. 4a, S 1 is a light reception signal from the first scattered light receiver 13, and S 2 is a light reception signal from the second scattered light receiver 14, the amplitude of which is proportional to the amount of light. Therefore, the point where the amplitude is maximum indicates that the most amount of scattered light is present, and this point corresponds to the edge of the defective portion A.
上記第1、第2の散乱光受光部13からの受光
信号はピーク検出回路21に入力されて、そのピ
ークが検出され、第4図bのような信号が出力さ
れる。そして、このピーク検出回路21の出力は
計測回路22に入力されて、第4図bの信号
Sp1,Sp2間の時間ΔTをカウントする。すなわ
ち、上記Sp1,Sp2は第1、第2の散乱光受光部
13,14からの受光信号のピーク値に対応する
ものであり、これは欠陥部Aの幅方向一端および
他端に対応している。したがつて、第4図bの信
号Sp1,Sp2間の時間ΔTをカウントすれば、この
カウント値は欠陥部Aの幅に対応したものとな
り、このカウント値から欠陥の幅を知ることがで
きる。これにより、このカウント値を長さに換算
してそれを表示器などで表示させれば欠陥の幅、
すなわちガラス管1の長手方向に生じた線状の欠
陥の大きさを即座に知ることができる。 The light reception signals from the first and second scattered light receivers 13 are input to a peak detection circuit 21, the peak of which is detected, and a signal as shown in FIG. 4b is output. The output of this peak detection circuit 21 is input to the measurement circuit 22, and the signal shown in FIG.
Count the time ΔT between Sp 1 and Sp 2 . That is, the above Sp 1 and Sp 2 correspond to the peak values of the light reception signals from the first and second scattered light receivers 13 and 14, which correspond to one end and the other end of the defective part A in the width direction. are doing. Therefore, if we count the time ΔT between the signals Sp 1 and Sp 2 in FIG. can. By converting this count value into length and displaying it on a display, you can determine the width of the defect.
That is, the size of the linear defect occurring in the longitudinal direction of the glass tube 1 can be immediately known.
なお、上記実施例では被検知物体として管状の
ものを例にとつて説明したが、これは管状のもの
に限られるものでなく透光性であれば平板状のも
のの欠陥検出にも適用できる。また上記実施例で
はレーザ光を1方向からのみ走査するようにした
が、直交する2方向から走査するようにすれば、
管の全周に渡つて欠陥を検知することができる。
さらに上記実施例ではレーザ光を走査する手段と
して回転ミラーを用いたが、これに限られるもの
でなくたとえば音又振動鏡などを用いても良いこ
とは言うまでもない。 In the above embodiment, a tubular object was used as an example of the object to be detected, but this is not limited to a tubular object, and can also be applied to defect detection of a flat object as long as it is translucent. Furthermore, in the above embodiment, the laser beam is scanned from only one direction, but if it is scanned from two orthogonal directions,
Defects can be detected all around the tube.
Further, in the above embodiment, a rotating mirror is used as a means for scanning the laser beam, but it is needless to say that the present invention is not limited to this, and for example, a sound mirror or a vibrating mirror may be used.
2.5KHzで振動する音叉振動鏡により5000回/
secの高速走査を行い、かつレーザビームを走査
方向に垂直な方向に2mmの幅に拡げると共に走査
方向には0.2mmに絞ることにより500m/minの速
度で管引される管に存在する5μm以上の気泡欠
陥をオンラインで寸法計測し、管理規格と合致を
検査できた。 5000 times/by a tuning fork vibrating mirror vibrating at 2.5KHz
sec high-speed scanning, expanding the laser beam to a width of 2 mm in the direction perpendicular to the scanning direction, and narrowing it down to 0.2 mm in the scanning direction to eliminate particles of 5 μm or more that exist in the pipe drawn at a speed of 500 m/min. We were able to measure the dimensions of bubble defects online and check that they conformed to management standards.
他の走査手段は超音波偏向器であり、偏向角度
は少いが走査周波数はたとえば10MHzとなるので
高速検査に適している。 Another scanning means is an ultrasonic deflector, and although the deflection angle is small, the scanning frequency is, for example, 10 MHz, so it is suitable for high-speed inspection.
以上説明したようにこの発明によれば、被検知
物体を挾んで所定距離離間した位置で、かつレー
ザ光の走査を含む面上にレーザ光の照射方向とあ
る角度をなして第1、第2の散乱光受光部を設置
して、これら第1、第2の散乱光受光部からの受
光信号の受光時間差を計測して、この計測値を基
に管状被検知物体の長手方向に繰状に存在した欠
陥の大きさを検知するようにしたので、従来は不
可能であつたガラス管の如き円形、柱状で内部に
その長手方向に存在する線状の欠陥を持つことの
多い被検査体の上記欠陥の大きさを高感度に検出
することができる欠陥検出装置を提供できる。 As explained above, according to the present invention, the first and second sensors are located at a predetermined distance apart from each other, sandwiching the object to be detected, and are arranged at a certain angle to the irradiation direction of the laser beam on the surface that includes the scanning of the laser beam. A scattered light receiver is installed, and the difference in reception time of the light reception signals from these first and second scattered light receivers is measured, and based on this measurement value, a circular pattern is detected in the longitudinal direction of the tubular object to be detected. Since the size of existing defects can be detected, it is possible to detect objects that are circular or columnar, such as glass tubes, which often have linear defects existing in the longitudinal direction, which was previously impossible. It is possible to provide a defect detection device that can detect the size of the defect with high sensitivity.
第1図a,bは線状の欠陥を生じたガラス管を
示す平面図および断面図、第2図は欠陥部での散
乱光の状態を示す図、第3図はこの発明の一実施
例の構成図、第4図a,bは同実施例による散乱
光受光信号のピーク検出信号を示すタイムチヤー
トである。
1……ガラス管、2……レーザ光、10……レ
ーザ光源、11……回転ミラー、13,14……
第1、第2の散乱光受光部、21……ピーク検出
回路、22……計測回路。
Figures 1a and b are a plan view and a cross-sectional view of a glass tube with a linear defect, Figure 2 is a diagram showing the state of scattered light at the defect, and Figure 3 is an embodiment of the present invention. 4A and 4B are time charts showing the peak detection signal of the scattered light reception signal according to the same embodiment. 1... Glass tube, 2... Laser light, 10... Laser light source, 11... Rotating mirror, 13, 14...
First and second scattered light receivers, 21...peak detection circuit, 22...measuring circuit.
Claims (1)
状欠陥の大きさを検出する装置において、レーザ
光を走査して上記被検知物体に照射するレーザ照
射手段10〜12と、レーザ光の照射方向と直交
する方向から上記被検知物体を挟むようにして所
定距離離間された位置でかつ上記レーザ光を走査
して作られる平面内に設置された第1、第2の散
乱回折光受光部13,14と、これら第1、第2
の散乱回折光受光部からの受光信号の各ピークを
検出しこれらピーク間の時間差を計測しこの計測
値から欠陥の幅を検知する手段21,22とを具
備したことを特徴とする欠陥検出装置。1 In an apparatus for detecting the size of a linear defect existing in the longitudinal direction of a translucent object to be detected 1, laser irradiation means 10 to 12 scan and irradiate the object to be detected with a laser beam; first and second scattered diffraction light receivers 13 installed at positions spaced apart from each other by a predetermined distance from the direction perpendicular to the irradiation direction so as to sandwich the object to be detected, and within a plane created by scanning the laser beam; 14 and these first and second
A defect detection device characterized by comprising means 21 and 22 for detecting each peak of a light reception signal from a scattered diffraction light receiving section, measuring the time difference between these peaks, and detecting the width of a defect from this measured value. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18114080A JPS57104839A (en) | 1980-12-20 | 1980-12-20 | Fault detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18114080A JPS57104839A (en) | 1980-12-20 | 1980-12-20 | Fault detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57104839A JPS57104839A (en) | 1982-06-30 |
| JPS6331048B2 true JPS6331048B2 (en) | 1988-06-22 |
Family
ID=16095582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18114080A Granted JPS57104839A (en) | 1980-12-20 | 1980-12-20 | Fault detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57104839A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009186281A (en) * | 2008-02-05 | 2009-08-20 | Nippon Electric Glass Co Ltd | Method and device for inspecting flaw of glass article |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5439681A (en) * | 1977-09-05 | 1979-03-27 | Nippon Sheet Glass Co Ltd | Distinguishing apparatus of defect kinds of glass sheet |
| JPS54106289A (en) * | 1978-02-07 | 1979-08-21 | Nippon Sheet Glass Co Ltd | Defect detector for glass sheet |
-
1980
- 1980-12-20 JP JP18114080A patent/JPS57104839A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009186281A (en) * | 2008-02-05 | 2009-08-20 | Nippon Electric Glass Co Ltd | Method and device for inspecting flaw of glass article |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57104839A (en) | 1982-06-30 |
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