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JPS6331766B2 - - Google Patents
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JPS6331766B2 - - Google Patents

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Publication number
JPS6331766B2
JPS6331766B2 JP59240280A JP24028084A JPS6331766B2 JP S6331766 B2 JPS6331766 B2 JP S6331766B2 JP 59240280 A JP59240280 A JP 59240280A JP 24028084 A JP24028084 A JP 24028084A JP S6331766 B2 JPS6331766 B2 JP S6331766B2
Authority
JP
Japan
Prior art keywords
lens
power
disk
semiconductor laser
aspherical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59240280A
Other languages
Japanese (ja)
Other versions
JPS61118708A (en
Inventor
Yoji Kubota
Toshuki Inoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Instruments Corp
Original Assignee
Sankyo Seiki Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sankyo Seiki Manufacturing Co Ltd filed Critical Sankyo Seiki Manufacturing Co Ltd
Priority to JP24028084A priority Critical patent/JPS61118708A/en
Publication of JPS61118708A publication Critical patent/JPS61118708A/en
Publication of JPS6331766B2 publication Critical patent/JPS6331766B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】[Detailed description of the invention]

(産業上の利用分野) この発明は、光デイスク用レンズ、詳しくは半
導体レーザーを光源とし、この光源とデイスク用
対物レンズとの間にビームスプリツタ、あるいは
スクープ方式の情報再生装置においては透明平板
を配置した光デイスク用レンズに関する。 (従来の技術) 光デイスク用レンズシステムとしては、レンズ
系を通過した半導体レーザーからのレーザー光が
情報記録媒体たるデイスク上のピツト面に収束
し、その反射光が再びレンズ系を通つてその戻り
光の一部がビームスプリツタで偏向されたのち、
デイテクターに入り、合焦信号やトラツキング信
号が得られるように構成されているもの、あるい
はデイスクからの反射光を、レンズ及び平板を介
して光源たる半導体レーザーに帰還させ、半導体
レーザーの出力光の変化をデイテクターで検出す
るように構成されたスクープ方式のものが知られ
ている。 (発明が解決しようとする問題点) 光デイスク用レンズシステムは、その合焦やト
ラツキング動作の際、半導体レーザー及び対物レ
ンズが一体となつて作動するので、制御信号に対
する応動性をよくするために、光デイスク用レン
ズシステムの構成要素は、これをできるだけ小型
軽量化することが望ましい。また、一般にこのシ
ステムのレンズ系は光源からのレーザー光をコリ
メートレンズで一たん平行光束にしたのち、この
平行光束を対物レンズでほぼ回折限界内に納まる
ように収差補正が行われるので、このようなレン
ズ系では、一般にコリメートレンズと対物レン
ズ、その他複数の調整部品が必要であり、そのた
めシステムの性能劣下を起し易く、またコスト高
の要因となる。さらに、光デイスク用レンズは、
高密度に記録されたデイスク上の信号を読み取る
のに少くとも1μ程度の分解能を必要とし、その
上、調整によるばらつきを考慮した必要な範囲の
光学特性を補正するために正弦条件の補正が重要
となり、また、レンズ系とデイスクとの接触を防
止するために作動距離を長くすることを要求され
る。 (問題を解決するための手段) この発明は、コリメートレンズと対物レンズの
作用を有し、前記の諸問題を解決した非球面レン
ズを提供するものである。 この発明の光デイスク用レンズは、 なる式で表わされる第1図の第3面及び第4面が
共に正の屈折力を有する非球面レンズであつて、
少なくとも入射高の10乗に比例する項を含んでお
り、半導体レーザー側のNAを0.1以上とし、光デ
イスク側のNAが0.4以上になるように構成され、
次の条件 を満すものである。 (1) 0.1<f/I.0<0.25 (2) −1.0<K3<0 (3) 0.5<(n3−1)/r3・f<1.0 (4) K4<−1.0 ただし X:光軸からHの高さの点に於ける非球面頂点の
接平面からの距離 H:光軸からの高さ C:非球面の頂点の曲率(1/R) K:円錐係数 f:デイスク用レンズの焦点距離 I.0:導体レーザー発振面からデイスクのピツト
面までの距離 r3:単レンズの光源側頂点近傍の曲率半径 n3:単レンズの屈折率 D,E,F,G:各々の入射高に対する4乗、6
乗、8乗、10乗に比例する頂点の係数 第1図は、本発明の光デイスク用レンズを用い
た光デイスク用レンズシステムの一例を示してお
り、このシステムは半導体レーザー1、ビームス
プリツタ2、光デイスク用レンズ3及びデイスク
ター5で構成されている。なお、符号4はデイス
クのカバーガラスを示す。光源1からの光はビー
ムスプリツタ2、レンズ3及びカバーガラス4を
通過してデイスク上のビツト面に収束し、その反
射光の一部がビームスプリツタ2で偏向されてデ
イテクター5に入射する。 半導体レーザーの発光放射パターンとエネルギ
ーの強度分布を2次元的に表示した第2図及び半
導体レーザーの放射パターンのうち、発光軸上の
NA=0.15に対応するエネルギー強度分布の3次
元図である第3図から推察できるように、半導体
レーザーの発光パターンからエネルギー分布に歪
を生ぜしめることなく最大の効率を得るために
は、半導体レーザー側のNAは0.1〜0.2に設定す
ることが好ましく、本発明におけるレーザー側の
NAは理想的数値である0.15程度になるように構
成される。 この種の光学系は、一般的に、コリメートレン
ズ系、対物レンズ系でそれぞれ独自の補正が行わ
れる。従つて、対物レンズに入射する光束の条件
は通常1.0=∞であるため無収差光として扱かわ
れている。これに対し本発明の対物レンズでは、
I.0が0.1<f/I.0<0.25程度の有限であり、同時にビ ームスプリツタ若しくはスクープ方式の場合は透
明平板が存在するために、入射光束に予じめ大き
な収差が存在し、この収差を含めた収差補正を行
う必要がある。前記条件(1)は、特に装置の大きさ
と正弦条件の補正を示すものであり、また作動距
離WDを大きく保つための条件でもある。 以下、前記の各条件(1)〜(4)について説明する。 (1) 0.1<f/1.0<0.25 この条件のうち、f/I.0が下限0.1をこえる
と装置が大型化してしまい、所期の目的を達成
できなくなる。また、上限0.2をこえると必要
な良像範囲で正弦条件の補正がが困難になると
共に作動距離WDが小さくなる。 (2) −1<K3<0 この条件は第3面の形状を規定するもので
K3が上限0をこえると必要な範囲での正弦条
件の補正が困難となり、下限−0.1をこえると
球面収差が増大して中心部の補正が困難とな
る。 (3) 0.5<(n3−1)/r3f<1.0 この条件はレンズ形状と、第3面にかかるパ
ワーを規定するものであり、 (n3−1)/r3・f が上限1.0をこえると球面収差と軸外収差のバ
ランスが取れなくなり、また非点収差も増大す
る。下限0.5をこえると、球面収差の補正が困
難となる。 (4) K4<−1.0 この条件は第4面の形状を規定し、また残存
収差のバランスに関すものである。この条件を
外れると正弦条件が増大し、軸外のコマ収差が
大きくなり、球面収差とのバランスが取れなく
なる。 (実施例)
(Industrial Application Field) This invention uses an optical disk lens, more specifically a semiconductor laser as a light source, and a beam splitter or a transparent flat plate in a scoop type information reproducing device between the light source and the disk objective lens. This invention relates to an optical disk lens in which a (Prior art) As a lens system for an optical disk, laser light from a semiconductor laser passes through a lens system and converges on a pit surface on the disk, which is an information recording medium, and the reflected light passes through the lens system again and returns. After part of the light is deflected by a beam splitter,
The light that enters the detector and is configured to obtain a focusing signal or tracking signal, or the reflected light from the disk, is returned to the semiconductor laser that is the light source via a lens and a flat plate, and the output light of the semiconductor laser is changed. A scoop-type device configured to detect this with a detector is known. (Problems to be Solved by the Invention) In the optical disk lens system, the semiconductor laser and objective lens work together during focusing and tracking operations, so in order to improve responsiveness to control signals, It is desirable that the components of the optical disk lens system be made as small and lightweight as possible. Additionally, in general, the lens system of this system uses a collimating lens to collimate the laser beam from the light source, and then corrects aberrations using the objective lens to bring the parallel beam within the diffraction limit. A lens system generally requires a collimating lens, an objective lens, and a plurality of other adjustment parts, which tends to deteriorate the performance of the system and also causes high costs. Furthermore, lenses for optical discs are
A resolution of at least 1μ is required to read signals recorded on a disc with high density, and in addition, it is important to correct the sine condition in order to correct the optical characteristics within the necessary range, taking into account variations due to adjustments. In addition, it is required to increase the working distance to prevent contact between the lens system and the disk. (Means for Solving the Problems) The present invention provides an aspherical lens that has the functions of a collimating lens and an objective lens, and solves the above-mentioned problems. The optical disk lens of this invention is An aspherical lens whose third and fourth surfaces in FIG. 1 both have positive refractive power, which is expressed by the formula:
It includes at least a term proportional to the 10th power of the incident height, is configured such that the NA on the semiconductor laser side is 0.1 or more, and the NA on the optical disk side is 0.4 or more,
It satisfies the following conditions. (1) 0.1<f/I.0<0.25 (2) −1.0<K3<0 (3) 0.5<(n3−1)/r3・f<1.0 (4) K4<−1.0 where X: from optical axis Distance of aspherical apex from tangent plane at height H: Height from optical axis C: Curvature of aspherical apex (1/R) K: Conic coefficient f: Focus of disk lens Distance I.0: Distance from the conductor laser oscillation surface to the pit surface of the disk r3: Radius of curvature near the light source side vertex of the single lens n3: Refractive index of the single lens D, E, F, G: 4 for each incident height squared, 6
Vertex coefficient proportional to power, 8th power, and 10th power Figure 1 shows an example of an optical disk lens system using the optical disk lens of the present invention. 2. It is composed of an optical disc lens 3 and a disc 5. Note that the reference numeral 4 indicates a cover glass of the disk. Light from a light source 1 passes through a beam splitter 2, a lens 3, and a cover glass 4 and converges on the bit surface on the disk, and a part of the reflected light is deflected by the beam splitter 2 and enters a detector 5. . Figure 2 shows a two-dimensional display of the emission radiation pattern and energy intensity distribution of a semiconductor laser, and the emission pattern on the emission axis of the semiconductor laser.
As can be inferred from Figure 3, which is a three-dimensional diagram of the energy intensity distribution corresponding to NA=0.15, in order to obtain the maximum efficiency without causing distortion in the energy distribution from the emission pattern of the semiconductor laser, it is necessary to The side NA is preferably set to 0.1 to 0.2, and the laser side NA in the present invention is preferably set to 0.1 to 0.2.
The NA is configured to be approximately 0.15, which is an ideal value. In this type of optical system, the collimating lens system and the objective lens system generally perform their own corrections. Therefore, since the condition for the light beam incident on the objective lens is usually 1.0=∞, it is treated as aberration-free light. In contrast, with the objective lens of the present invention,
I.0 is finite, about 0.1<f/I.0<0.25, and at the same time, in the case of a beam splitter or scoop method, there is a transparent flat plate, so there is a large aberration in the incident light flux, and this It is necessary to perform aberration correction including aberrations. The above condition (1) particularly indicates the correction of the size of the device and the sine condition, and is also a condition for keeping the working distance WD large. Each of the above conditions (1) to (4) will be explained below. (1) 0.1<f/1.0<0.25 Among these conditions, if f/I.0 exceeds the lower limit of 0.1, the device becomes large and the intended purpose cannot be achieved. Furthermore, when the upper limit of 0.2 is exceeded, it becomes difficult to correct the sine condition within the necessary good image range, and the working distance WD becomes small. (2) −1<K3<0 This condition defines the shape of the third surface.
When K3 exceeds the upper limit of 0, it becomes difficult to correct the sine condition within the necessary range, and when K3 exceeds the lower limit of -0.1, the spherical aberration increases, making it difficult to correct the central part. (3) 0.5<(n3-1)/r3f<1.0 This condition defines the lens shape and the power applied to the third surface. If (n3-1)/r3・f exceeds the upper limit of 1.0, the lens becomes spherical. Aberrations and off-axis aberrations become unbalanced, and astigmatism also increases. If the lower limit of 0.5 is exceeded, it becomes difficult to correct spherical aberration. (4) K4<-1.0 This condition defines the shape of the fourth surface and also concerns the balance of residual aberrations. If this condition is exceeded, the sine condition increases, and off-axis coma aberration increases, making it impossible to balance it with spherical aberration. (Example)

【表】 (発明の効果) この発明によれば、光デイスク用レンズシステ
ムを、その性能劣下を招くことなく小型軽量化す
ることができ、従来の諸問題点を解消することが
できる。
[Table] (Effects of the Invention) According to the present invention, an optical disk lens system can be made smaller and lighter without deteriorating its performance, and various conventional problems can be solved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のレンズを用いた光デイスク用
レンズシステムの一例を示す断面図、第2図は、
半導体レーザーの発光放射パターンとエネルギー
の強度分布を2次元的に表示した強度分布図、第
3図は、半導体レーザーの放射パターンのうち、
発光軸上のNA=0.15に対応するエネルギー強度
分布の3次元図、第4図は実施例の収差曲線図で
ある。 1……半導体レーザー、2……ビームスプリツ
ター、3……非球面レンズ、r3……第3面、r4
……第4面。
FIG. 1 is a sectional view showing an example of an optical disk lens system using the lens of the present invention, and FIG.
Figure 3 is an intensity distribution diagram that two-dimensionally displays the emission radiation pattern and energy intensity distribution of a semiconductor laser.
A three-dimensional diagram of the energy intensity distribution corresponding to NA=0.15 on the emission axis, and FIG. 4 is an aberration curve diagram of the example. 1... Semiconductor laser, 2... Beam splitter, 3... Aspherical lens, r3... Third surface, r4
...Fourth page.

Claims (1)

【特許請求の範囲】 1 半導体レーザーと、第3面及び第4面が共に
正の屈折力を有する非球面レンズとの間に、第1
面及び第2面が互に平行平面であるビームスプリ
ツター(スクープ方式では透明平板)を配置して
構成される光デイスク用レンズであり、下式で示
す少なくとも入射高の10乗に比例する項を含む非
球面であつて、上記半導体レーザー側のNAを0.1
以上とし、デイスク側のNAが0.4以上になるよう
に構成され、下記の条件(1)〜(4)を満す光デイスク
用レンズ。 (1) 0.1<f/I.0<0.25 (2) −1.0<K3<0 (3) 0.5<(n3−1)/r3.f<1.0 (4) K4<−1.0 ただし X:光軸からHの高さの点に於ける非球面頂点の
接平面からの距離 H:光軸からの高さ C:非球面の頂点の曲率(1/R) K:円錐係数 f:デイスク用レンズの焦点距離 I.0:半導体レーザー発振面からのデイスクのピ
ツト面までの距離 r3:単レンズの光源側頂点近傍の曲率半径 n3:単レンズの屈折率 D,E,F,G:各々の入射高に対する4乗、6
乗、8乗、10乗に比例する頂の係数
[Claims] 1. Between the semiconductor laser and the aspherical lens whose third and fourth surfaces both have positive refractive power,
It is an optical disk lens that is constructed by arranging a beam splitter (transparent flat plate in the scoop method) whose first and second surfaces are parallel planes, and the term is proportional to at least the 10th power of the incident height as shown in the following formula. The NA of the semiconductor laser side is 0.1.
An optical disk lens that is configured so that the NA on the disk side is 0.4 or more and satisfies the following conditions (1) to (4). (1) 0.1<f/I.0<0.25 (2) −1.0<K3<0 (3) 0.5<(n3−1)/r3. f<1.0 (4) K4<-1.0 where X: Distance from the tangential plane of the aspherical apex at a point H from the optical axis H: Height from the optical axis C: Curvature of the aspherical apex (1/R) K: Conic coefficient f: Focal length of the disk lens I.0: Distance from the semiconductor laser oscillation surface to the pit surface of the disk r3: Radius of curvature near the apex on the light source side of the single lens n3: Single lens refractive index D, E, F, G: 4th power, 6 for each incident height
Vertex coefficient proportional to power, 8th power, 10th power
JP24028084A 1984-11-14 1984-11-14 Lens for optical disk Granted JPS61118708A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24028084A JPS61118708A (en) 1984-11-14 1984-11-14 Lens for optical disk

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24028084A JPS61118708A (en) 1984-11-14 1984-11-14 Lens for optical disk

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP1112514A Division JPH02118508A (en) 1989-05-01 1989-05-01 Lens for optical disk

Publications (2)

Publication Number Publication Date
JPS61118708A JPS61118708A (en) 1986-06-06
JPS6331766B2 true JPS6331766B2 (en) 1988-06-27

Family

ID=17057137

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24028084A Granted JPS61118708A (en) 1984-11-14 1984-11-14 Lens for optical disk

Country Status (1)

Country Link
JP (1) JPS61118708A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6313011A (en) * 1986-07-03 1988-01-20 Sankyo Seiki Mfg Co Ltd Lens for optical disk
JPS6425113A (en) * 1987-07-21 1989-01-27 Mark Kk Finite system large aperture single lens
JPH02223906A (en) * 1989-02-24 1990-09-06 Hoya Corp Finite system large-diameter aspherical lens

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5776512A (en) * 1980-10-31 1982-05-13 Konishiroku Photo Ind Co Ltd Large-aperture aspheric single lens
JPS57201210A (en) * 1981-06-04 1982-12-09 Sony Corp Condenser lens
JPS6156314A (en) * 1984-08-28 1986-03-22 Konishiroku Photo Ind Co Ltd Recording and reproducing objective lens of optical information recording medium

Also Published As

Publication number Publication date
JPS61118708A (en) 1986-06-06

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