JPS6332592B2 - - Google Patents
Info
- Publication number
- JPS6332592B2 JPS6332592B2 JP57109720A JP10972082A JPS6332592B2 JP S6332592 B2 JPS6332592 B2 JP S6332592B2 JP 57109720 A JP57109720 A JP 57109720A JP 10972082 A JP10972082 A JP 10972082A JP S6332592 B2 JPS6332592 B2 JP S6332592B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- workpiece
- detecting
- extreme value
- takes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005498 polishing Methods 0.000 claims description 60
- 238000001514 detection method Methods 0.000 claims description 10
- 239000000463 material Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Description
【発明の詳細な説明】
本発明は、研磨方向により研磨能率を異にする
材料の最適研磨方向を自動判定する装置に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus that automatically determines the optimum polishing direction for a material whose polishing efficiency varies depending on the polishing direction.
硬脆材の中には研磨方向により研磨能率を異に
する材料が多い。これらの材料はその結晶形が明
確な場合は、研磨能率が上る方向を織別すること
ができるが、結晶形が不明確な場合には試行錯誤
により研磨能率の上る方向を見出していかなけれ
ばならず非常に困難を伴なつた。 Among hard and brittle materials, there are many materials whose polishing efficiency differs depending on the polishing direction. If the crystalline shape of these materials is clear, it is possible to identify the direction in which the polishing efficiency will increase, but if the crystalline shape is unclear, the direction in which the polishing efficiency will increase must be found through trial and error. However, it was extremely difficult.
本発明の目的は上記従来技術の欠点をなくし、
材料の結晶形の明確さの有無を問わず研磨能率が
最大となる研磨方向を容易に判定可能とする研磨
装置を提供することにある。 The purpose of the present invention is to eliminate the drawbacks of the above-mentioned prior art,
It is an object of the present invention to provide a polishing device that can easily determine the polishing direction in which the polishing efficiency is maximized regardless of whether the crystal form of the material is clear or not.
ワークと砥石の接触面(研磨面)に作用する力
に着目すると、研磨能率の良い場合は研磨面接線
力が大きく研磨面法線力は相対的に小さくなり、
また研磨能率の悪い場合は逆に研磨面接線力が小
さくなり研磨面法線力が相対的に大きくなること
が経験的に知られている。 Focusing on the force acting on the contact surface (polishing surface) between the workpiece and the grindstone, when polishing efficiency is good, the polishing surface normal force is large and the polishing surface normal force is relatively small.
Furthermore, it is empirically known that when the polishing efficiency is poor, the polishing surface linear force decreases and the polishing surface normal force becomes relatively large.
従つて定荷重研磨を行なえば、上記研磨面法線
力は一定となるので研磨面接線力の大きさのみを
測定することにより研磨能率の大小を判定するこ
とが可能となる。本発明はこの研磨面接線力に着
目したもので、研磨面接線力が大きければ単位時
間に消費された加工エネルギが大きい。すなわち
加工除去能率が高いということになる。 Therefore, if constant load polishing is performed, the normal force to the polished surface becomes constant, so it is possible to determine the magnitude of the polishing efficiency by measuring only the magnitude of the linear force to the polished surface. The present invention focuses on this polishing surface linear force, and if the polishing surface linear force is large, the machining energy consumed per unit time is large. In other words, the machining removal efficiency is high.
そこで本発明では研磨面接線力に対応した物理
量として、研磨面に生ずる起電力、振動、アコー
ステイツク・エミツシヨン(AE)、またワーク保
持部のたわみ量等に着目し、これらの物理量の大
小から研磨能率の大小を判定しようとするもので
ある。 Therefore, in the present invention, we focus on the electromotive force, vibration, acoustic emission (AE) generated on the polished surface, and the amount of deflection of the workpiece holding part as physical quantities corresponding to the linear force of the polished surface, and polishing is performed based on the magnitude of these physical quantities. This is an attempt to determine the size of efficiency.
以下、本発明の一実施例を第1図により説明す
る。ワーク1はホルダ3で保持され、ホルダ3は
モータ4で回転方向に駆動され、ロータリエンコ
ーダ5で回転角が検出される。これらワーク支持
系はバネ6で回転砥石11に押付けられ、振動を
該バネで吸収する。さらにワーク支持系は軸受を
介してバー9に固定されカウンタウエイト10と
支点8において平衛位置にあり、カウンタウエイ
ト10の位置または重さを調整することによりワ
ークの研磨圧が調整できる。 An embodiment of the present invention will be described below with reference to FIG. A workpiece 1 is held by a holder 3, which is driven in the rotation direction by a motor 4, and a rotation angle is detected by a rotary encoder 5. These workpiece support systems are pressed against the rotating grindstone 11 by springs 6, and vibrations are absorbed by the springs. Further, the workpiece support system is fixed to the bar 9 via a bearing, and is in a flat position at the counterweight 10 and the fulcrum 8, and by adjusting the position or weight of the counterweight 10, the polishing pressure of the workpiece can be adjusted.
第1図で研磨面に生ずる起電力を測定する場合
について説明する。ワーク1と砥石11が共に導
電性の場合は、導電性ホルダ3と研磨盤主軸12
端部に設けられた接点14との間に測定用インピ
ーダンス(Z1)15を接続し、この両端で検出さ
れる電圧を増幅器17で増幅しさらに信号処理回
路(フイルタ、整流回路等)18を経て検出出力
Voutが得られる。この測定用インピーダンスの
他の接続法として、インピーダンス(Z2)16の
ように、ホルダ3と研磨盤本体13との間に接続
することもできる。検出出力Voutを検出しなが
ら、第4図に示すようにワーク1を回転角の方向
にモータ4で駆動する(β:一定)と、回転角度
に対し検出出力Voutは例えば第5図に示すよう
に変化し、極大値及び極小値をもつ。この極大値
や極小値はマイクルコンピユータ20で容易に判
定でき、その時のワーク回転角度をロータリエン
コーダ5より入力し記憶する。これにより例えば
第5図において、極大値を示すワーク回転角度
90゜、270゜が研磨能率の上る方向であり、極小値
を示す180゜、360゜の角度が研磨能率の下る方向で
あると判定することができる。 The case of measuring the electromotive force generated on the polished surface with reference to FIG. 1 will be explained. If both the workpiece 1 and the grinding wheel 11 are conductive, the conductive holder 3 and the grinding wheel main shaft 12
A measurement impedance (Z 1 ) 15 is connected between the contact point 14 provided at the end, and the voltage detected at both ends is amplified by an amplifier 17, and further a signal processing circuit (filter, rectifier circuit, etc.) 18 is connected. detection output
You can get Vout. As another method of connecting this measuring impedance, it can also be connected between the holder 3 and the polishing disk main body 13 like the impedance (Z 2 ) 16. When the workpiece 1 is driven by the motor 4 in the direction of the rotation angle as shown in Fig. 4 while detecting the detection output Vout (β: constant), the detection output Vout with respect to the rotation angle becomes, for example, as shown in Fig. 5. It changes to , and has a local maximum value and a local minimum value. These local maximum values and local minimum values can be easily determined by the microcomputer 20, and the workpiece rotation angle at that time is input from the rotary encoder 5 and stored. As a result, for example, in Fig. 5, the workpiece rotation angle showing the maximum value is
It can be determined that angles of 90° and 270° are directions in which the polishing efficiency increases, and angles of 180° and 360°, which show minimum values, are directions in which the polishing efficiency decreases.
上述したワーク回転機構とは別に、第4図にお
いてαを一定に保つたまま砥石11の円周方向へ
ワーク1を回転駆動し角度βを変化させることに
よつてもワークに対する研磨方向を変えることが
できる。 Apart from the above-mentioned work rotation mechanism, the polishing direction of the work can also be changed by rotating the work 1 in the circumferential direction of the grindstone 11 while keeping α constant as shown in FIG. 4 and changing the angle β. Can be done.
ワーク1が非導電性の場合、導電性ホルダ3を
ワーク研磨面まで伸ばし、ワークとホルダが同時
に研磨できるようにし、ホルダと砥石間の起電力
を第1図の方法で検出することができる。この場
合は、ワークの研磨能率が大きい方向では、ホル
ダ3の研磨能率も大きくなるため検出出力Vout
は大きい値となり、ワークの研磨能率が小さい方
向では、ホルダ3の研磨能率も小さくなるため検
出出力Voutは小さい値となり、同様に判定でき
ることがわかる。 When the workpiece 1 is non-conductive, the conductive holder 3 is extended to the polishing surface of the workpiece so that the workpiece and the holder can be polished simultaneously, and the electromotive force between the holder and the grindstone can be detected by the method shown in FIG. In this case, in the direction where the workpiece polishing efficiency is high, the polishing efficiency of the holder 3 is also high, so the detection output Vout
is a large value, and in the direction where the polishing efficiency of the workpiece is small, the polishing efficiency of the holder 3 is also small, so the detection output Vout is a small value, and it can be seen that the determination can be made in the same way.
またワーク1が非導電性の場合に第3図に示す
ように導電性シヤンク2でワークを固定し、該シ
ヤンクを導電性ホルダ3に固定する方法としても
よい。第2,3図はワークが非導電性として説明
したが、ワークが導電性の場合でも適用できる。 Alternatively, when the workpiece 1 is non-conductive, a method may be adopted in which the workpiece is fixed with a conductive shank 2 and the shank is fixed to a conductive holder 3 as shown in FIG. Although FIGS. 2 and 3 have been described assuming that the workpiece is non-conductive, the invention can also be applied when the workpiece is conductive.
以上は研磨面の起電力検出の場合について説明
したが、起電力の他にも研磨力に対応する物理量
として、ワーク保持部のたわみ量、研磨面の振
動、アコーステイツク・エミツシヨン等がある。
これらを検出出力として検出し、同様に第5図の
ような出力特性から研磨能率の大きい方向を見出
すこともできる。これら上記物理量の検出をする
ために、第1図、7に示すようにワーク支持系周
辺、またはワーク支持系に直接これら物理量を検
出するトランスデユーサを取付けこの出力をマイ
クロコンピユータ20に入力し上記判定を行なう
ことができる。 The case of detecting the electromotive force on the polishing surface has been described above, but in addition to the electromotive force, there are other physical quantities corresponding to the polishing force, such as the amount of deflection of the workpiece holder, vibration of the polishing surface, and acoustic emission.
By detecting these as detection outputs, it is also possible to similarly find the direction of high polishing efficiency from the output characteristics as shown in FIG. In order to detect these physical quantities, as shown in FIG. Judgment can be made.
本発明により、ワークの結晶形が明確でなくて
も、容易に研磨能率最大となる方向を見出すこと
ができ、例えばダイヤモンド等硬脆材の研磨能率
を向上させることができる。 According to the present invention, even if the crystal shape of the workpiece is not clear, it is possible to easily find the direction in which the polishing efficiency is maximized, and for example, it is possible to improve the polishing efficiency of hard brittle materials such as diamond.
第1図は本発明の判定装置を適用した研磨装置
の構成物、第2図は非導電性ワークのホルダの一
例を示す図、第3図はワークのホルダの別の例を
示す図、第4図はワーク回転による研磨方向の調
整法の説明図、第5図はワーク回転角度に伴なう
研磨力に対応した物理量の検出出力の一例を示す
波形図である。
1…ワーク、2…シヤンク、3…ホルダ、4…
モータ、5…ロータリエンコーダ、6…バネ、7
…トランスデユーサ、8…支点、9…バー、10
…カウンタウエイト、11…砥石、12…主軸、
13…研磨盤本体、14…接点、15,16…測
定用インピーダンス、17…増幅器、18…信号
処理回路、19…モータ駆動用電源、20…マイ
クロ・コンピユータ。
FIG. 1 shows the structure of a polishing apparatus to which the determination device of the present invention is applied, FIG. 2 shows an example of a holder for a non-conductive workpiece, FIG. 3 shows another example of a holder for a workpiece, and FIG. FIG. 4 is an explanatory diagram of a method of adjusting the polishing direction by rotating the workpiece, and FIG. 5 is a waveform diagram showing an example of a detected output of a physical quantity corresponding to the polishing force accompanying the rotation angle of the workpiece. 1...Work, 2...Shank, 3...Holder, 4...
Motor, 5...Rotary encoder, 6...Spring, 7
...transducer, 8...fulcrum, 9...bar, 10
...Counterweight, 11...Whetstone, 12...Main shaft,
DESCRIPTION OF SYMBOLS 13... Polishing machine main body, 14... Contact, 15, 16... Impedance for measurement, 17... Amplifier, 18... Signal processing circuit, 19... Power supply for motor drive, 20... Micro computer.
Claims (1)
用インピーダンスを有し、この測定用インピーダ
ンスの両端の電位差を検出することにより研磨に
よつてワーク研磨面または砥石表面に生じる起電
力を検出する検出回路と、ワークの研磨方向が変
わるように砥石面に対しワークを相対的に回転さ
せる手段と、前記起電力が極値をとる研磨方向を
検出する手段とを備え、前記極値をとる研磨方向
を研磨能率がほぼ最大となる方向と判定すること
を特徴とする最適研磨方向の自動判定装置。 2 非導電性のワークを保持するホルダと砥石支
持部との間に結線された測定用インピーダンスを
有し、この測定用インピーダンスの両端の電位差
を検出することにより研磨によつてワークと同時
に研磨されるホルダに生じる起電力を検出する検
出回路と、ワークの研磨方向が変わるように砥石
面に対しワークを相対的に回転させる手段と、前
記起電力が極値をとる研磨方向を検出する手段と
を備え、前記極値をとる研磨方向を研磨能率がほ
ぼ最大となる方向と判定することを特徴とする最
適研磨方向の自動判定装置。 3 ワークを研磨するときの研磨面接線力または
該接線力に対応した物理量を検出する検出手段
と、ワークの研磨方向が変わるように砥石面に対
しワークを相対的に回転させる手段と、前記検出
手段により検出される物理量が極値をとる研磨方
向を検出する手段とを備え、前記極値をとる研磨
方向を研磨能率がほぼ最大となる方向と判定する
ことを特徴とする最適研磨方向の自動判定装置。[Scope of Claims] 1. A measuring impedance is connected between the workpiece and the grindstone support, and by detecting the potential difference between both ends of the measuring impedance, the polishing surface of the workpiece or the grindstone surface is adjusted by polishing. comprising a detection circuit for detecting the generated electromotive force, means for rotating the workpiece relative to the grinding wheel surface so that the polishing direction of the workpiece changes, and means for detecting the polishing direction in which the electromotive force takes an extreme value, An apparatus for automatically determining an optimum polishing direction, characterized in that the polishing direction that takes the extreme value is determined to be the direction in which the polishing efficiency is approximately maximized. 2. A measuring impedance is connected between the holder that holds the non-conductive workpiece and the grinding wheel support, and by detecting the potential difference between both ends of this measuring impedance, the workpiece is polished at the same time as the workpiece. a detection circuit for detecting an electromotive force generated in a holder, a means for rotating the workpiece relative to a grinding wheel surface so that the polishing direction of the workpiece is changed, and a means for detecting a polishing direction in which the electromotive force takes an extreme value. An automatic determination device for an optimum polishing direction, characterized in that the polishing direction in which the extreme value is determined to be the direction in which the polishing efficiency is approximately maximized. 3. A detection means for detecting a polishing surface linear force or a physical quantity corresponding to the tangential force when polishing a workpiece, a means for rotating the workpiece relative to the grinding wheel surface so that the polishing direction of the workpiece is changed, and the detection means and means for detecting a polishing direction in which a physical quantity detected by the means takes an extreme value, and determining the polishing direction in which the physical quantity takes an extreme value as a direction in which polishing efficiency is approximately maximized. Judgment device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57109720A JPS591149A (en) | 1982-06-28 | 1982-06-28 | Automatic decision unit of optimal polishing direction |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57109720A JPS591149A (en) | 1982-06-28 | 1982-06-28 | Automatic decision unit of optimal polishing direction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS591149A JPS591149A (en) | 1984-01-06 |
| JPS6332592B2 true JPS6332592B2 (en) | 1988-06-30 |
Family
ID=14517509
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57109720A Granted JPS591149A (en) | 1982-06-28 | 1982-06-28 | Automatic decision unit of optimal polishing direction |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS591149A (en) |
-
1982
- 1982-06-28 JP JP57109720A patent/JPS591149A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS591149A (en) | 1984-01-06 |
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