JPS6333295B2 - - Google Patents
Info
- Publication number
- JPS6333295B2 JPS6333295B2 JP54063895A JP6389579A JPS6333295B2 JP S6333295 B2 JPS6333295 B2 JP S6333295B2 JP 54063895 A JP54063895 A JP 54063895A JP 6389579 A JP6389579 A JP 6389579A JP S6333295 B2 JPS6333295 B2 JP S6333295B2
- Authority
- JP
- Japan
- Prior art keywords
- wire
- bonding
- clamper
- point
- capillary
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07168—Means for storing or moving the material for the connector
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07502—Connecting or disconnecting of bond wires using an auxiliary member
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Wire Bonding (AREA)
Description
【発明の詳細な説明】
本発明はワイヤボンデイング方法およびその装
置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wire bonding method and apparatus.
半導体装置、半導体集積回路装置などの組立に
おいて、ペレツト(回路素子)とリード間を極細
のワイヤ(金線など)で繋ぐ際、適正な長さのワ
イヤでボンデイングしないと、第1ボンデイング
点と第2ボンデイング点を結ぶワイヤループは長
すぎたり、あるいは短かすぎたりして、ワイヤが
不所望な部分(素子あるいは外部のリード等)に
接触し、シヨート不良を起こす。 When assembling semiconductor devices, semiconductor integrated circuit devices, etc., when connecting pellets (circuit elements) and leads with extremely thin wires (gold wire, etc.), if the bonding is not done with wires of the appropriate length, the first bonding point and the first bonding point If the wire loop connecting the two bonding points is too long or too short, the wire may come into contact with an undesired part (device or external lead, etc.), causing shoot failure.
このようなことから、保持されるワイヤに常に
一定のテンシヨン(張力)を加えた状態でワイヤ
ボンデイングを行ない、ワイヤを保持するキヤピ
ラリ内でのワイヤの突出、あるいは戻りの動作を
スムースにし、所望のワイヤループを形成するよ
うに配慮している。 For this reason, wire bonding is performed with a constant tension always applied to the wire being held, so that the wire can smoothly protrude or return within the capillary that holds the wire, and achieve the desired result. Care is taken to form a wire loop.
しかし、ボンデイング間距離は単一の半導体装
置の組立においてもそれぞれ異なり、前記のテン
シヨン付与方法では全てのワイヤループが望まし
い形状とはなりにくい。すなわち、たとえばボン
デイング間距離が長ければボンデイングツールで
あるキヤピラリ内への引き込みは大きくする必要
があり、ボンデイング間距離が短かければ、キヤ
ピラリ内への引き込みは少なくてよい。 However, the distance between bondings varies even in the assembly of a single semiconductor device, and it is difficult for all the wire loops to have a desired shape with the above-described tensioning method. That is, for example, if the distance between bondings is long, it is necessary to draw more into the capillary, which is a bonding tool, and if the distance between bondings is short, the amount of drawing into the capillary needs to be smaller.
一方、ワイヤを掴んで破断させるクランパは第
1図に示すように動作する。すなわち、クランパ
は第1ボンデイング(BP)、第2ボンデイング
(BL)が完了した時点でワイヤをクランプしてワ
イヤを掴んで引つ張り、ワイヤを破断させた時点
から第1ボンデイングが行なえるような状態とな
る時点(たとえばAuワイヤの先端をボール状化
してワイヤがキヤピラリから抜けないような状態
とする。)までの間ワイヤをクランプする。なお、
実線はキヤピラリの上下動を、鎖線はクランパの
開閉動作を示す。 On the other hand, a clamper that grips and breaks the wire operates as shown in FIG. That is, the clamper clamps the wire when the first bonding (B P ) and the second bonding (B L ) are completed, grasps the wire, and pulls it, and the first bonding can be performed from the time when the wire breaks. The wire is clamped until such a state is reached (for example, the tip of the Au wire is made into a ball shape so that the wire does not come out of the capillary). In addition,
The solid line indicates the vertical movement of the capillary, and the chain line indicates the opening/closing operation of the clamper.
そこで、本発明者はこのクランパによるワイヤ
のクランプを第2ボンデイング前に行なうことに
よつて、ワイヤが必要以上キヤピラリから抜け出
たものを再びキヤピラリの中へ引戻すことによつ
て適正なワイヤループを形作らせることを考え
た。 Therefore, by clamping the wire with this clamper before the second bonding, the wire that has come out of the capillary more than necessary is pulled back into the capillary, thereby creating a proper wire loop. I thought about shaping it.
したがつて、本発明の目的は適正なワイヤルー
プを形成することのできるワイヤボンデイング方
法およびその装置を提供することにある。 SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a wire bonding method and apparatus that can form a proper wire loop.
このような目的を達成するための本発明の要旨
は、ボンデイングツールでワイヤを保持しながら
第1ボンデイング点にワイヤの先端を圧着固定し
た後、ボンデイングツールからワイヤを解き出し
ながらワイヤの途中を第2ボンデイング点に圧着
固定し、その後ワイヤをクランプで掴んで引つ張
つて第2ボンデイング部近傍で破断させるワイヤ
ボンデイング方法において、前記ボンデイングツ
ールが前記第1ボンデイング点から前記第2ボン
デイング点に到る間に前記ワイヤを破断させるた
めに用いられるクランパで前記ワイヤを掴みか
つ、前記第1ボンデイング点から前記第2ボンデ
イング点までのボンデイング間距離に応じて前記
ワイヤをクランプする時点を変えて前記第1ボン
デイング点と第2ボンデイング点間のワイヤルー
プを制御することを特徴とするワイヤボンデイン
グ方法にある。 The gist of the present invention to achieve such an object is to crimp and fix the tip of the wire to the first bonding point while holding the wire with a bonding tool, and then crimping and fixing the tip of the wire at the first bonding point while untying the wire from the bonding tool. In the wire bonding method, the wire is crimped and fixed at two bonding points, and then the wire is grabbed with a clamp and pulled to break near the second bonding part, wherein the bonding tool reaches the second bonding point from the first bonding point. The wire is gripped by a clamper used to break the wire in between, and the time point at which the wire is clamped is varied depending on the distance between the bonding points from the first bonding point to the second bonding point. A wire bonding method characterized by controlling a wire loop between a bonding point and a second bonding point.
以下実施例により本発明を説明する。 The present invention will be explained below with reference to Examples.
第2図a,bは本発明のワイヤボンデイング方
法の一実施例を示す。いずれも、キヤピラリ1で
ワイヤ2を保持(クランプ)し、タブ3上に固定
したペレツト4の電極(第1ボンデイング点)に
ワイヤ2の先端を固定した後、キヤピラリ1を矢
印で示すように上昇、水平移動、下降させてワイ
ヤ2の途中をリード(第2ボンデイング点)5に
圧着させて固定し、その後、クランパ6でワイヤ
2を掴みキヤピラリ1の上昇時にワイヤ2を第2
ボンデイング点近傍で破断することによつて一張
りのワイヤボンデイングを完了する。ところで、
同図aは第2ボンデイング作業時にキヤピラリ1
が高い位置でクランパ6が閉動作してワイヤ2を
クランプする状態を示し、同図bはキヤピラリ1
の高さが低い位置でクランパ6が閉動作してワイ
ヤ2をクランプする状態を示す。キヤピラリ1が
高い位置にある前者では、クランパ6が早く閉動
作するため、キヤピラリ1内にワイヤ2が後者の
場合に較べてより多く引き戻される。このよう
に、クランパの閉動作(クランプ)の時点をボン
デイング間距離に合せて対応させて行なわせれ
ば、所望のワイヤループを得ることができ、ワイ
ヤループの大きすぎによるワイヤの崩れによるシ
ヨート不良、丘状のワイヤループが形成されない
ワイヤ不足によるシヨート不良は発生しない。な
お、第4図は、クランパ6の一例を示すものであ
つて、このクランパ6は図示はしないクランプア
ームに固定され、キヤピラリの上部に位置する。
そして、電磁石7によつて相互に開閉する1対の
爪8によつてワイヤ2を保持する。図中9は1対
の爪8を閉じるスプリング、10は一方の爪に固
定されるリング状のワイヤガイドである。 2a and 2b show an embodiment of the wire bonding method of the present invention. In both cases, the capillary 1 holds (clamps) the wire 2, and after fixing the tip of the wire 2 to the electrode (first bonding point) of the pellet 4 fixed on the tab 3, the capillary 1 is raised as shown by the arrow. , horizontally move and lower the wire 2 to press and fix the middle of the wire 2 to the lead (second bonding point) 5. Then, the clamper 6 grabs the wire 2 and as the capillary 1 rises, the wire 2 is moved to the second bonding point.
A stretch of wire bonding is completed by breaking near the bonding point. by the way,
Figure a shows capillary 1 during the second bonding work.
shows the state in which the clamper 6 closes and clamps the wire 2 at a high position;
This shows a state in which the clamper 6 closes and clamps the wire 2 at a low height position. In the former case, where the capillary 1 is at a high position, the clamper 6 closes earlier, so that the wire 2 is pulled back into the capillary 1 more than in the latter case. In this way, if the closing operation (clamping) of the clamper is performed in accordance with the distance between bondings, the desired wire loop can be obtained, and shot defects caused by wire collapse due to the wire loop being too large can be avoided. Shooting defects due to insufficient wires do not occur because hill-shaped wire loops are not formed. Note that FIG. 4 shows an example of the clamper 6, which is fixed to a clamp arm (not shown) and located above the capillary.
The wire 2 is held by a pair of claws 8 that are mutually opened and closed by an electromagnet 7. In the figure, 9 is a spring that closes the pair of claws 8, and 10 is a ring-shaped wire guide fixed to one of the claws.
クランパ6の開閉動作は第3図で示すように、
クランパ開閉回路によつて制御される。クランパ
開閉回路にはエンコーダからパルス信号が送られ
るとともに、メモリからボンデイングデータがコ
ンパレータに送られる。コンパレータによつてボ
ンデイング間距離(L)とあらかじめ設定された
複数の基準距離との比較がなされる。そして、L
がl1(あるいはl1以下)のとき、T1時間後のN1番
目のパルス数時にクランパが閉動作してワイヤを
保持する。また、Lがl2(あるいはl2以上)のとき
T2時間後のN2番目のパルス時にクランパが閉動
作する。実際のワイヤボンデイング時には基準距
離は2〜3あれば充分である。また、一張りのワ
イヤボンデイング時のパルス数は常に一定であ
る。 The opening/closing operation of the clamper 6 is as shown in Fig. 3.
Controlled by the clamper opening/closing circuit. A pulse signal is sent from the encoder to the clamper opening/closing circuit, and bonding data is sent from the memory to the comparator. A comparator compares the bonding distance (L) with a plurality of preset reference distances. And L
When is l 1 (or less than l 1 ), the clamper closes and holds the wire at the N 1st pulse number after T 1 hour. Also, when L is l 2 (or more than l 2 )
T 2 hours later N The clamper closes at the second pulse. In actual wire bonding, a reference distance of 2 to 3 is sufficient. Further, the number of pulses during one-tension wire bonding is always constant.
このような実施例によれば、ワイヤのクランプ
開始時点を自由に制御できることから、ボンデイ
ング間距離に対応させてワイヤループを形作るワ
イヤの長さを制御でき、所望のワイヤループを形
作ることができる。また、この実施例では、第2
ボンデイング前にワイヤをクランプし、その状態
でキヤピラリが下降するため、ワイヤはしごかれ
るようにして押し潰し(圧着)がなされる。この
結果、ワイヤの圧着部の破断耐ワイヤの立ち上が
り角度が大きくなり、ワイヤ破断にあつてはワイ
ヤは第2ボンデイング点の押し潰れ近傍で破断
し、ワイヤの破断部が圧着部から長く伸びる(テ
イル)ように残らない。このため、他のワイヤ等
との接触も発生しない。 According to such an embodiment, since the point at which clamping of the wire starts can be freely controlled, the length of the wire forming the wire loop can be controlled in accordance with the bonding distance, and a desired wire loop can be formed. In addition, in this embodiment, the second
Before bonding, the wire is clamped and the capillary is lowered in this state, so the wire is squeezed and crushed (crimped). As a result, the rising angle of the crimped part of the wire increases, and when the wire breaks, the wire breaks near the crushing of the second bonding point, and the broken part of the wire extends long from the crimped part (tail). ) so it doesn't remain. Therefore, contact with other wires etc. does not occur.
なお、本発明は前記実施例に限定されない。 Note that the present invention is not limited to the above embodiments.
以上のように、本発明によればワイヤボンデイ
ング時に自由にワイヤ長さを調整できるので、シ
ヨート不良原因とはならない適正なワイヤループ
を形成できる。また、テイルも残さないことから
シヨート不良が防止でき、歩留の向上を図ること
ができる。 As described above, according to the present invention, the wire length can be freely adjusted during wire bonding, so that an appropriate wire loop that does not cause shoot defects can be formed. Further, since no tail is left behind, shot defects can be prevented and yields can be improved.
第1図はキヤピラリおよびクランパの動きを示
すグラフ、第2図a,bは本発明の一実施例によ
るワイヤボンデイング状態を示す説明図、第3図
は同じくブロツク図、第4図は同じくクランパの
斜視図、第5図は同じくクランパの動きを示すグ
ラフである。
1……キヤピラリ、2……ワイヤ、3……タ
ブ、4……ペレツト、5……リード、6……クラ
ンパ、7……電磁石、8……爪、9……スプリン
グ、10……ワイヤガイド。
Fig. 1 is a graph showing the movement of the capillary and clamper, Fig. 2 a and b are explanatory diagrams showing the wire bonding state according to an embodiment of the present invention, Fig. 3 is a block diagram, and Fig. 4 is a graph showing the movement of the clamper. The perspective view, FIG. 5, is also a graph showing the movement of the clamper. 1... Capillary, 2... Wire, 3... Tab, 4... Pellet, 5... Lead, 6... Clamper, 7... Electromagnet, 8... Claw, 9... Spring, 10... Wire guide .
Claims (1)
第1ボンデイング点にワイヤの先端を圧着固定し
た後、ボンデイングツールからワイヤを解き出し
ながらワイヤの途中を第2ボンデイング点に圧着
固定し、その後ワイヤをクランパで掴んで引つ張
つて第2ボンデイング部近傍で破断させるワイヤ
ボンデイング方法において、前記ボンデイングツ
ールが前記第1ボンデイング点から前記第2ボン
デイング点に到る間に前記ワイヤを破断させるた
めに用いられるクランパで前記ワイヤを掴みか
つ、前記第1ボンデイング点から前記第2ボンデ
イング点までのボンデイング間距離に応じて前記
ワイヤをクランプする時点を変えて前記第1ボン
デイング点と第2ボンデイング点間のワイヤルー
プを制御することを特徴とするワイヤボンデイン
グ方法。1 After crimping and fixing the tip of the wire to the first bonding point while holding the wire with a bonding tool, crimping and fixing the middle of the wire to the second bonding point while untying the wire from the bonding tool, and then grasping the wire with a clamper. In the wire bonding method in which the wire is pulled and broken near the second bonding part, the bonding tool is a clamper used to break the wire while the wire is being pulled from the first bonding point to the second bonding point. controlling the wire loop between the first bonding point and the second bonding point by gripping the wire and changing the point at which the wire is clamped according to the distance between the bonding points from the first bonding point to the second bonding point; A wire bonding method characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6389579A JPS55156334A (en) | 1979-05-25 | 1979-05-25 | Wire bonding method and apparatus thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6389579A JPS55156334A (en) | 1979-05-25 | 1979-05-25 | Wire bonding method and apparatus thereof |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61023752A Division JPS61179548A (en) | 1986-02-07 | 1986-02-07 | Wire bonding device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55156334A JPS55156334A (en) | 1980-12-05 |
| JPS6333295B2 true JPS6333295B2 (en) | 1988-07-05 |
Family
ID=13242484
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6389579A Granted JPS55156334A (en) | 1979-05-25 | 1979-05-25 | Wire bonding method and apparatus thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55156334A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0324212U (en) * | 1989-07-19 | 1991-03-13 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS589331A (en) * | 1981-07-08 | 1983-01-19 | Mitsubishi Electric Corp | Wire bonding apparatus for semiconductor device |
| CN102047400B (en) * | 2008-03-17 | 2013-01-30 | 库力索法工业公司 | Wire Payout Measurement and Calibration Techniques for Wire Bonding Machines |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5435679A (en) * | 1977-08-25 | 1979-03-15 | Toshiba Corp | Semiconductor connection method |
| JPS5451476A (en) * | 1977-09-30 | 1979-04-23 | Shinkawa Seisakusho Kk | Device for bonding wires |
-
1979
- 1979-05-25 JP JP6389579A patent/JPS55156334A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0324212U (en) * | 1989-07-19 | 1991-03-13 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55156334A (en) | 1980-12-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH06216185A (en) | Formation of low posture wire mutual junction | |
| GB2116101A (en) | Wire bonding apparatus | |
| US5192018A (en) | Wire bonding method | |
| US4068371A (en) | Method for completing wire bonds | |
| JP2841126B2 (en) | Wire bonding method and apparatus | |
| US6595400B2 (en) | Wire bonding apparatus | |
| JPS6333295B2 (en) | ||
| US6182885B1 (en) | Wire bonding method | |
| US6036080A (en) | Wire bonding method | |
| JP3377747B2 (en) | Wire bonding method | |
| JP3377748B2 (en) | Wire bonding method | |
| JPH04370941A (en) | Wire bonding | |
| JPS61179548A (en) | Wire bonding device | |
| US5234155A (en) | Wire bonding method and apparatus | |
| JPH0617291Y2 (en) | Wire-bonding equipment | |
| JPS6098634A (en) | Wire bonding method | |
| JPH09162225A (en) | Wire bonding method for coated wires | |
| JPS5992541A (en) | Wire bonding process | |
| JPS5834935A (en) | Bonding method | |
| JPH06342819A (en) | Wire bonding method and device | |
| JPS59220939A (en) | Wire bonding method and device therefor | |
| JPH03263844A (en) | Insertion of wire into capillary in wire bonder | |
| JPS6284526A (en) | Mounting method for gold wire for die bonding | |
| JPS5944836A (en) | Wire bonding method | |
| JP2817314B2 (en) | Wire bonder and wire bonding method |