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JPS6338655B2 - - Google Patents
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JPS6338655B2 - - Google Patents

Info

Publication number
JPS6338655B2
JPS6338655B2 JP12715779A JP12715779A JPS6338655B2 JP S6338655 B2 JPS6338655 B2 JP S6338655B2 JP 12715779 A JP12715779 A JP 12715779A JP 12715779 A JP12715779 A JP 12715779A JP S6338655 B2 JPS6338655 B2 JP S6338655B2
Authority
JP
Japan
Prior art keywords
wavelength
fiber
light
measuring
phase difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12715779A
Other languages
Japanese (ja)
Other versions
JPS5651636A (en
Inventor
Masamitsu Tokuda
Keiichiro Iwasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, Sumitomo Electric Industries Ltd filed Critical Nippon Telegraph and Telephone Corp
Priority to JP12715779A priority Critical patent/JPS5651636A/en
Publication of JPS5651636A publication Critical patent/JPS5651636A/en
Publication of JPS6338655B2 publication Critical patent/JPS6338655B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/333Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using modulated input signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/335Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using two or more input wavelengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/338Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Description

【発明の詳細な説明】 本発明は光フアイバの材料分散特性の測定方法
に関するものである。光フアイバを構成するガラ
ス材料の屈折率は波長により異なるため、使用す
る光の波長によつてフアイバのベースバンド周波
数特性が異なる。こうした光フアイバの材料分散
特性を測定することはフアイバの構造設計を行な
う際に重要となる。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for measuring material dispersion properties of optical fibers. Since the refractive index of the glass material that makes up the optical fiber differs depending on the wavelength, the baseband frequency characteristics of the fiber differ depending on the wavelength of the light used. Measuring the material dispersion characteristics of such optical fibers is important when designing the structure of the fiber.

本発明は光フアイバの分散のうち、材料分散の
効果だけを分離測定する高精度な測定方法を示す
ものである。以下、図を用いて本発明の詳細を説
明する。図において、1は波長可変光源、2は外
部変調器、3は電気信号発生器、4は分波器、5
および6は長さを異にする同じ光フアイバ、7お
よび8は検波器、9は位相差測定器を示す。
The present invention provides a highly accurate measuring method for separately measuring only the effect of material dispersion among the dispersion of optical fibers. Hereinafter, details of the present invention will be explained using figures. In the figure, 1 is a wavelength tunable light source, 2 is an external modulator, 3 is an electric signal generator, 4 is a demultiplexer, and 5 is a wavelength tunable light source.
and 6 are the same optical fibers of different lengths, 7 and 8 are detectors, and 9 is a phase difference measuring device.

さて、1よりの光は外部変調器3を通過する際
に電気信号発生器3よりの高周波信号によつて振
幅変調される。この変調された光はハーフ・ミラ
ーなどの分波器4によつて二つに分岐され、一方
はフアイバ5に、他方はフアイバ6に入射され、
それぞれ検波器7および8によつて電気信号に変
換される。これらの電気信号はベクトルボルトメ
ータなどの位相差測定器9によつて位相差が測定
される。
Now, when the light from 1 passes through the external modulator 3, it is amplitude-modulated by a high frequency signal from the electric signal generator 3. This modulated light is split into two by a splitter 4 such as a half mirror, one of which is incident on the fiber 5 and the other is incident on the fiber 6.
They are converted into electrical signals by detectors 7 and 8, respectively. The phase difference of these electrical signals is measured by a phase difference measuring device 9 such as a vector voltmeter.

次に、1の光源の波長を少し変化させ、再び位
相差を測定する。以下、順次1の波長を変えるこ
とによつて、その波長に対する位相変化量が測定
される。
Next, the wavelength of the first light source is slightly changed and the phase difference is measured again. Thereafter, by sequentially changing the first wavelength, the amount of phase change for that wavelength is measured.

いま、電気信号発生器の変調周波数を(Hz)、
フアイバ5および6の長さをそれぞれL1,L2
し、波長λiでの光フアイバの群屈折率をN(λi)
とする。
Now, the modulation frequency of the electrical signal generator is (Hz),
Let the lengths of fibers 5 and 6 be L 1 and L 2 , respectively, and the group refractive index of the optical fiber at wavelength λi be N(λi).
shall be.

ただし、 N(λ)=n(λ)−λdn(λ)/dλ (1) であり、nは屈折率、λは光の波長である。さ
て、位相差測定器9の位相量は、 Qi=L1−L2/λg×360゜ (2) となる。ここに、 λg=C/N(λi) (3) である。ここで、光の波長をλiからλjに変化させ
ると、相対位相量は、 θ1−θ2=(L1−L2)・360゜/C {N(λi)−N(λj)} (4) となる。式(4)において、(L1−L2),,Cは既
知であるため、波長λiを固定してλjを順次変化さ
せた場合の位相変化量より群屈折率の変化量{N
(λi)−N(λj)}を知ることができる。例えば、λ
i
=0.85μm,λj=1.3μm,L1−L2=1000mとする
と、代表的な光フアイバの場合、=100MHzで、
約56゜の位相量が測定される。こうした測定結果
をもとに、測定波長に対応する各測定点を結んだ
曲線の変化率が材料分散となるわけである。
However, N(λ)=n(λ)−λdn(λ)/dλ (1) where n is the refractive index and λ is the wavelength of light. Now, the phase amount of the phase difference measuring device 9 is Qi=L 1 −L 2 /λg×360° (2). Here, λg=C/N(λi) (3). Here, when the wavelength of light is changed from λi to λj, the relative phase amount is θ 1 −θ 2 = (L 1 − L 2 )・360°/C {N(λi)−N(λj)} ( 4) becomes. In Equation (4), (L 1 −L 2 ), , C is known, so the amount of change in the group refractive index {N
(λi)−N(λj)}. For example, λ
i
= 0.85μm, λj = 1.3μm, L 1 −L 2 = 1000m, then for a typical optical fiber, at = 100MHz,
A phase amount of approximately 56° is measured. Based on these measurement results, the rate of change of the curve connecting each measurement point corresponding to the measurement wavelength is the material dispersion.

以上示したように、本発明は単一の正弦波で振
幅変調された光を二分割して、それぞれの光を長
さの異なるフアイバに入射し、フアイバ伝搬後の
検波信号の位相差を、光の波長を変えて測定する
ことを特徴とする。本発明によれば、従来のパル
ス遅延時間差測定におけるようなフアイバ伝搬後
のパルス波形の歪の影響をなくすことができ、高
精度な測定が可能である。
As described above, the present invention splits light amplitude-modulated with a single sine wave into two, inputs each light into fibers of different lengths, and calculates the phase difference of the detected signal after propagation through the fiber. It is characterized by measuring by changing the wavelength of light. According to the present invention, it is possible to eliminate the influence of distortion of the pulse waveform after fiber propagation as in conventional pulse delay time difference measurement, and highly accurate measurement is possible.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明の測定方法をあらわすブロツク図を
示す。 図中、1は波長可変光源、2は外部変調器、3
は電気信号発生器、4は分波器、5および6は光
フアイバ、7および8は検波器、9は位相差測定
器を示す。
The figure shows a block diagram representing the measuring method of the present invention. In the figure, 1 is a wavelength tunable light source, 2 is an external modulator, and 3
4 is an electric signal generator, 4 is a branching filter, 5 and 6 are optical fibers, 7 and 8 are wave detectors, and 9 is a phase difference measuring device.

Claims (1)

【特許請求の範囲】[Claims] 1 一定の周波数で振幅変調された光を二個に分
岐し、これらの光を長さの異なる二個のフアイバ
に入射し、該フアイバを伝搬した光の検波信号の
位相差を、前記の光の波長を順次変えながら測定
し、各波長に対する各測定値の変化率を求めるこ
とを特徴とするフアイバの材料分散特性測定方
法。
1. Split the light that has been amplitude modulated at a certain frequency into two, enter these lights into two fibers with different lengths, and calculate the phase difference of the detected signal of the light that has propagated through the fibers. 1. A method for measuring material dispersion characteristics of a fiber, the method comprising measuring the material dispersion characteristics of a fiber while sequentially changing the wavelength, and determining the rate of change of each measured value for each wavelength.
JP12715779A 1979-10-01 1979-10-01 Measuring method for material dispersion characteristic of fiber Granted JPS5651636A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12715779A JPS5651636A (en) 1979-10-01 1979-10-01 Measuring method for material dispersion characteristic of fiber

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12715779A JPS5651636A (en) 1979-10-01 1979-10-01 Measuring method for material dispersion characteristic of fiber

Publications (2)

Publication Number Publication Date
JPS5651636A JPS5651636A (en) 1981-05-09
JPS6338655B2 true JPS6338655B2 (en) 1988-08-01

Family

ID=14953039

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12715779A Granted JPS5651636A (en) 1979-10-01 1979-10-01 Measuring method for material dispersion characteristic of fiber

Country Status (1)

Country Link
JP (1) JPS5651636A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6073333A (en) * 1983-09-30 1985-04-25 Sumitomo Electric Ind Ltd Optical fiber dispersion measuring method
JPS6352034A (en) * 1986-08-21 1988-03-05 Nippon Telegr & Teleph Corp <Ntt> Method and device for measuring single mode optical fiber
FR2689632B1 (en) * 1992-04-02 1997-09-19 Thomson Csf FIBER OPTICAL STRESS DETECTOR.
JP3388227B2 (en) * 1999-11-05 2003-03-17 独立行政法人通信総合研究所 Optical dispersion measuring apparatus and measuring method using the same
WO2011042911A2 (en) * 2009-10-09 2011-04-14 Hitesh Mehta Method and apparatus for demonstration and determination of material dispersion in optical fiber

Also Published As

Publication number Publication date
JPS5651636A (en) 1981-05-09

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