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JPS6338657B2 - - Google Patents
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JPS6338657B2 - - Google Patents

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Publication number
JPS6338657B2
JPS6338657B2 JP11818180A JP11818180A JPS6338657B2 JP S6338657 B2 JPS6338657 B2 JP S6338657B2 JP 11818180 A JP11818180 A JP 11818180A JP 11818180 A JP11818180 A JP 11818180A JP S6338657 B2 JPS6338657 B2 JP S6338657B2
Authority
JP
Japan
Prior art keywords
image
indentation
square
coordinate positions
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11818180A
Other languages
Japanese (ja)
Other versions
JPS5742838A (en
Inventor
Toshihiko Fukuhara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Komatsu Ltd
Original Assignee
Komatsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Ltd filed Critical Komatsu Ltd
Priority to JP11818180A priority Critical patent/JPS5742838A/en
Publication of JPS5742838A publication Critical patent/JPS5742838A/en
Publication of JPS6338657B2 publication Critical patent/JPS6338657B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 本発明は金属材料等の硬度を自動計測する微小
硬度計に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a microhardness meter that automatically measures the hardness of metal materials and the like.

微小域において金属材料等の硬度を計測する硬
度計は四角錐状のダイヤモンド圧子を押し込んで
第1図に示すような凹部(以下圧痕という)1を
形成し、この圧痕1を読取顕微鏡で拡大し読取顕
微鏡内に配された2本のヘアライン2,3で頂角
A,B及びC,Dを挾み、対角線及びの
長さを読み取り、これらの対角線の平均の長さd
を求め、この長さdを下式(1)に代入してビツカー
ス硬度Hvを算出するようにしている。
A hardness tester that measures the hardness of metal materials, etc. in a microscopic area presses a square pyramid-shaped diamond indenter to form a recess (hereinafter referred to as an indentation) 1 as shown in Figure 1, and then magnifies this indentation 1 with a reading microscope. The apex angles A, B and C, D are sandwiched between two hairlines 2 and 3 placed in a reading microscope, and the lengths of the diagonals are read, and the average length of these diagonals is d.
The length d is then substituted into the formula (1) below to calculate the Vickers hardness Hv.

Hv=1.8544×F/d2 ここに、Fはダイヤモンド圧子に加える押圧荷
重である。かかる対角線の読み取りに関しては2
本のヘアライン2,3で圧痕1を挾んで測定する
ために、圧痕1の頂角A,BまたはC,Dとヘア
ライン2,3とが接する処で読む必要があり、従
つて、熟練を要すると共に人差の影響も非常に大
きい。例えば、圧痕の頂角とヘアラインとが接し
ても分らずに第2図に示すような状態の場合もあ
り、また、第3図のように頂角とヘアラインとが
離れていても接したように見えたりすることがあ
り、測定誤差の原因となつている。そして、これ
らの誤差は人間が測定を行なう場合には避けるこ
とができない。更に、長時間の測定においては、
目の疲労によるバラ付きが非常に大きくなり、こ
れに応じて測定誤差が大きくなる等の欠点があつ
た。
Hv=1.8544×F/d 2 Here, F is the pressing load applied to the diamond indenter. For reading such diagonals, 2
In order to measure the indentation 1 by holding the indentation 1 between the hairlines 2 and 3 of the book, it is necessary to read at the point where the apex angles A, B or C, D of the indentation 1 touch the hairlines 2 and 3, and therefore, skill is required. At the same time, the influence of differences among people is also very large. For example, there are cases where the apex angle of the indentation and the hairline are in contact with each other but it is not obvious, as shown in Figure 2, and there are cases where the apex angle and the hairline are far apart but do not appear to be in contact as shown in Figure 3. This can cause measurement errors. These errors are unavoidable when measurements are performed by humans. Furthermore, in long-term measurements,
There were drawbacks such as very large variations due to eye fatigue and correspondingly large measurement errors.

本発明は上記従来の欠点を除去する目的でなさ
れたもので、圧痕の対角線の長さを電気的に計測
し、且つビツカース硬度を演算算出してプリント
アウトするようにした微小硬度計を提供するもの
である。
The present invention was made for the purpose of eliminating the above-mentioned conventional drawbacks, and provides a microhardness meter that electrically measures the length of the diagonal line of an indentation, and also calculates and prints out the Vickers hardness. It is something.

以下本発明を添付図面の一実施例に基づいて詳
述する。
The present invention will be described in detail below based on an embodiment of the accompanying drawings.

第4図において、テレビカメラ11は硬度計1
0に配設されており、当該硬度計10のダイヤモ
ンド圧子(図示せず)により形成した圧痕1(第
5図)を例えば矢印F方向に走査しながら撮像し
てビデオ信号evを出力し、画像処理部12のシエ
デイング補正回路13に加える。シエデイング補
正回路13は撮像管の感度ムラ等により生ずるビ
デオ信号evのムラを補正し、信号ev′として出力
して信号処理回路14に加える。信号処理回路1
4は入力信号ev′を微分して圧痕1の他の部分
1′(第5図)との境界を検出し、所定のスレシ
ヨルトレベルで切つて2値化し、2値化した信号
ebを出力して記憶装置15に加える。記憶装置1
5は例えば(32×512)ビツトのメモリ15a,
15bを縦横に互いに直角にクロスして構成した
もので、これらのクロスメモリ15a,15bに
圧痕1の各エツジの部分を記憶するものである。
なお、上記中心の位置合わせおよび各頂角A,
B,C,Dの幅方向の中心合わせは、オペレータ
が後記ブラウン管の表示画像(第6図に示すよう
なクロスメモリとエツジ像との合成画像が表示さ
れ、オペレータの操作によりクロスメモリ、エツ
ジ像のいずれかが画面上で移動される。)をみな
がら適宜行う。この場合圧痕1の中心Oがメモリ
の中心Pに一致し、かつ各頂角A,B,C,Dが
メモリの幅方向の中心に一致することは必ずしも
必要でなく、θ=45度が成立し、かつ4つのメモ
リ領域に各頂点A,B,C,Dが位置していれば
よい。また、圧痕の境界を所定ビツト数例えば3
ビツト数の幅で記憶させる(第6図,第8図)。
この第8図は第6図の頂角Aを含むエツジ部の拡
大説明図で、各マスは記憶素子を表わし、黒く塗
りつぶした部分に信号ebが記憶されており、白い
部分は信号が記憶されていないことを示してい
る。このようにして、クロスメモリ15a,15
bに圧痕1の各頂角A〜Dを含むエツジの部分を
これらのメモリ15a,15bと45゜の角度をな
すように記憶させる。また、圧痕1以外にも研磨
傷、介在物或は汚れ等により画像に濃淡が生じ、
これらも共にメモリ内に記憶され、例えば第8図
の符号25で表わされる。
In FIG. 4, the television camera 11 is connected to the hardness meter 1.
0, and images an indentation 1 (FIG. 5) formed by a diamond indenter (not shown) of the hardness meter 10 while scanning, for example, in the direction of arrow F, and outputs a video signal e v , It is added to the shedding correction circuit 13 of the image processing section 12. The shedding correction circuit 13 corrects the unevenness of the video signal e v caused by uneven sensitivity of the image pickup tube, etc., and outputs it as a signal e v ', which is applied to the signal processing circuit 14. Signal processing circuit 1
4 differentiates the input signal e v ', detects the boundary between the indentation 1 and the other part 1' (Fig. 5), cuts it at a predetermined threshold level, and converts it into a binary signal.
e b is output and added to the storage device 15. Storage device 1
For example, 5 is a (32×512) bit memory 15a,
15b are arranged to cross each other at right angles in the vertical and horizontal directions, and each edge portion of the impression 1 is stored in these cross memories 15a and 15b.
In addition, the above center alignment and each apex angle A,
To center B, C, and D in the width direction, the operator displays an image displayed on the cathode ray tube (a composite image of the cross memory and edge images as shown in Fig. 6), and through operator operations, the cross memory and edge images are ) will be moved on the screen.) Do this as appropriate. In this case, it is not necessary that the center O of the indentation 1 coincides with the center P of the memory, and that each apex angle A, B, C, D coincides with the center of the memory in the width direction, and θ = 45 degrees. It is sufficient that the vertices A, B, C, and D are located in four memory areas. Also, the boundary of the indentation is set by a predetermined number of bits, for example, 3.
It is stored in the width of the number of bits (Figures 6 and 8).
This Fig. 8 is an enlarged explanatory diagram of the edge part including the apex angle A in Fig. 6. Each square represents a memory element, the blacked out part stores the signal e b , and the white part stores the signal. It shows that it has not been done. In this way, the cross memories 15a, 15
The edge portion including the apex angles A to D of the indentation 1 is stored in the memory 15b so as to form an angle of 45° with these memories 15a and 15b. In addition to the impression 1, shading may occur in the image due to polishing scratches, inclusions, dirt, etc.
These are also stored in memory and are represented by 25 in FIG. 8, for example.

さて、クロスメモリ15a,15bから圧痕1
の頂角A〜Dを検出する場合、信号処理回路17
がクロスメモリ15a,15bの縦、横のアドレ
スを右下り45゜(第6図の矢印R方向)、左下り45゜
(第6図の矢印L方向)に読み出し、このアドレ
スにデータがある場合には1をカウントする。こ
のようにして、第7図a,bに示すように横用の
クロスメモリ15aからエツジ部A,Bのデータ
DA1,DB1,DA2,DB2を得る。そして、データ
DA1,DB1のアドレスAa1,Ab1の中点アドレス
Aa(第7図c),データDA2,DB2のアドレス
Aa2,Ab2の中点アドレスAbから夫々頂点A,B
のアドレスを求める。同様にして縦用のクロスメ
モリ15bから頂点C,DのアドレスAc,Adを
求める。また、信号処理回路17はゴミ取り処理
も行なう。前述したように右下り、左下り45゜方
向の加算結果、各エツジのデータDA1〜Dd2は10
〜16ビツトの量がある。すなわち、圧痕1の頂角
が完全に直角である場合には16ビツトあり、圧子
が摩耗して頂角が丸くなるにつれて10ビツト程度
に少なくなる(第8図の・印の画素の部分)。そ
こで、例えば10ビツト以上のデータ量をもつもの
を調べた場合、第8図に示すゴミによる部分25
のデータnb,na(第9図a,b)が出る。そこで、
データDA1,na,DB1,nbのうち、メモリ15a
の中心P(第6図)に近い方のアドレスAa1
Ab1を圧痕の先端と判断してゴミによるデータ
na,nbと区別する。これは、圧痕内にゴミがあつ
たとしても、圧子により押圧均一化されてしまい
ゴミ信号として検出し得ない程度となり、従つ
て、圧痕内にゴミがないとして差し仕えない。す
なわち、ゴミによる信号は常に圧痕外にあるとし
てよい。従つて、エツジのデータはゴミのデータ
に対して常にメモリの中心寄りにあるとしてい
る。このようにして信号処理回路17は各エツジ
A,B,C,D,のアドレスデータAa〜Adを出
力する。加算部18(第4図)はブラウン管にシ
エデイング補正回路13からの信号ev′により圧
痕1の原画像を、信号処理回路17からのアドレ
スデータAa〜Adによりマスク30(第10図)
を写し出す。原画像1の頂点A,Bのアドレス
Aa,Abの差、頂点C,DのアドレスAC,Adの
差は撮像面における対角線,の長さとな
り、従つて、これらの値にメモリの1画素の実寸
係数を乗算することにより圧痕1の対角線,
CDの実寸を求めることができる。このようにし
て得る対角線の長さは圧痕の各頂角A〜Dがシヤ
ープのときすなわち、完全に直角な場合にはその
まま使用してもよいが、圧子の摩耗により各頂角
が丸くなると(第8図)肉眼で見た場合と違いが
出る。そこで、かかる場合にはオペレータがブラ
ウン管を見ながら、圧痕1の各頂角A〜Dがマス
ク30の各辺′′,′′,′′,′′
と一致す
るように当該マスク30のワクの大きさを調節す
る。この調節は、シヤープネス係数δを頂角A,
DのアドレスAa,Adには加え、頂角B,Cのア
ドレスAb,Acからは減じる(第7図c,d,第
9図c,d)。このシヤープネス係数δは圧子の
摩耗の程度により適宜の値に設定し得るものであ
る。信号処理回路17は上記オペレータの操作に
応じて前記演算処理を行ない、各頂角A〜Dの補
正したアドレスデータAa′〜Ad′を出力して加算
部18に加え、マスク30のワクを修正する。ま
た、これらの各データAa′〜Ad′はデータ処理部
20の演算回路21に加えられる。演算回路21
は入力データAa′〜Ad′により前述したように圧
痕1の対角線,の長さd1,d2を算出し、こ
れらの長さd1,d2の平均値dを算出する。次い
で、この対角線の平均の長さdを用い前式(1)に沿
つてビツカース硬度Hvの演算を実行し、対応す
る信号VHを出力してプリント部22に加える。
プリント部22は入力信号VHに応じて前記ビツ
カース硬度Hvをプリントアウトする。
Now, from the cross memories 15a and 15b, the impression 1
When detecting the apex angles A to D, the signal processing circuit 17
reads the vertical and horizontal addresses of the cross memories 15a and 15b downward 45 degrees to the right (direction of arrow R in Figure 6) and downward 45 degrees to the left (direction of arrow L in Figure 6), and if there is data at this address. is counted as 1. In this way, as shown in FIG.
Obtain DA 1 , DB 1 , DA 2 , DB 2 . And data
Address of DA 1 , DB 1 Midpoint address of Aa 1 , Ab 1
Aa (Figure 7c), data DA 2 , DB 2 addresses
From the midpoint address Ab of Aa 2 , Ab 2 to vertices A and B respectively
Ask for the address. Similarly, addresses Ac and Ad of vertices C and D are obtained from the vertical cross memory 15b. The signal processing circuit 17 also performs dust removal processing. As mentioned above, as a result of addition in the downward right and downward 45° directions, the data DA 1 to Dd 2 for each edge is 10.
There is an amount of ~16 bits. That is, when the apex angle of the indentation 1 is completely right angle, there are 16 bits, but as the indenter wears and the apex angle becomes rounded, the number decreases to about 10 bits (the pixel portion marked with * in FIG. 8). For example, when examining data with an amount of 10 bits or more, the part 25 due to dust shown in Figure 8 is
The data n b and n a (Fig. 9 a, b) are output. Therefore,
Among the data DA 1 , n a , DB 1 , n b , memory 15a
The address Aa 1 that is closer to the center P (Fig. 6) of
Ab 1 is determined to be the tip of the indentation and the data is based on dust.
Distinguish between n a and n b . This means that even if there is dust in the indentation, the pressing pressure is made uniform by the indenter, so that it cannot be detected as a dust signal, and therefore it can be assumed that there is no dust in the indentation. In other words, it may be assumed that the signal due to dust is always outside the indentation. Therefore, edge data is always located closer to the center of memory than garbage data. In this way, the signal processing circuit 17 outputs address data Aa to Ad of each edge A, B, C, and D. The adder 18 (FIG. 4) displays the original image of the indentation 1 on the cathode ray tube using the signal e v ' from the shedding correction circuit 13, and masks 30 (FIG. 10) using the address data Aa to Ad from the signal processing circuit 17.
Take a picture. Addresses of vertices A and B of original image 1
The difference between Aa and Ab and the address AC and Ad of vertices C and D are the lengths of the diagonals on the imaging plane. Therefore, by multiplying these values by the actual size coefficient of one pixel in the memory, the indentation 1 can be calculated. diagonal,
You can find the actual size of a CD. The length of the diagonal line obtained in this way can be used as is when the apex angles A to D of the indentation are sharp, that is, when they are completely right angles, but if the apex angles are rounded due to wear of the indenter. Fig. 8) There is a difference from what you see with the naked eye. Therefore, in such a case, the operator, while looking at the cathode ray tube, determines the apex angles A to D of the indentation 1 on each side of the mask 30 '', '', '', ''.
The size of the backbone of the mask 30 is adjusted so that it matches. This adjustment changes the sharpness coefficient δ by the apex angle A,
In addition to the addresses Aa and Ad of D, it is subtracted from the addresses Ab and Ac of the apex angles B and C (Fig. 7 c, d, Fig. 9 c, d). This sharpness coefficient δ can be set to an appropriate value depending on the degree of wear of the indenter. The signal processing circuit 17 performs the arithmetic processing according to the operator's operation, outputs corrected address data Aa' to Ad' for each apex angle A to D, and adds the corrected address data Aa' to Ad' to the adder 18 to correct defects in the mask 30. do. Further, each of these data Aa' to Ad' is applied to the arithmetic circuit 21 of the data processing section 20. Arithmetic circuit 21
calculates the diagonal lengths d 1 and d 2 of the indentation 1 as described above using the input data Aa' to Ad', and calculates the average value d of these lengths d 1 and d 2 . Next, the average length d of the diagonal line is used to calculate the Vickers hardness Hv according to the above equation (1), and the corresponding signal VH is output and applied to the print section 22.
The printing section 22 prints out the Vickers hardness Hv in response to the input signal VH .

以上説明したように本発明によれば、測定誤差
を極めて小さくすることができ、且つ測定の際の
目の疲労を軽減することができ、更に、ビツカー
ス硬度を正確且つ迅速に計測することができる。
また、クロスメモリを使用して圧痕のエツジ部の
みを記憶させ、且つ記憶したデータをエツジに対
して斜め45゜方向に読み出して加算することによ
りゴミ等の影響を受けることなく、測定精度を上
げることができる。更に、オペレータとの対話形
式であるために肉眼との一致性を得ることができ
る等の優れた効果がある。
As explained above, according to the present invention, measurement errors can be extremely reduced, eye fatigue during measurement can be reduced, and Vickers hardness can be measured accurately and quickly. .
In addition, by using a cross memory to memorize only the edge part of the indentation, and reading out and adding the memorized data diagonally at 45 degrees to the edge, measurement accuracy is improved without being affected by dust, etc. be able to. Furthermore, since it is an interactive method with the operator, there are excellent effects such as consistency with the naked eye.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はビツカース硬度の測定説明図、第2図
及び第3図はビツカース硬度の測定誤差の発生原
因の説明図、第4図は本発明に係る微小硬度計の
一実施例を示すブロツク図、第5図は第4図のテ
レビカメラによる圧痕の走査方向の一実施例を示
す図、第6図は第4図の記憶装置の一実施例を示
す図、第7図a〜dは圧痕のエツジのアドレスを
求める場合の説明図、第8図は第6図のメモリの
拡大説明図、第9図a〜dは圧痕のエツジのアド
レスを求める場合の説明図、第10図は第4図の
加算部における圧痕の原画像とマスクとの関係を
示す図である。 1……圧痕、10……硬度計、11……テレビ
カメラ、13……シエデイング補生回路、14,
17……信号処理回路、15……記憶装置、16
……メモリ制御装置、18……加算部、21……
演算回路、22……プリント部。
Fig. 1 is an explanatory diagram of the measurement of Vickers hardness, Figs. 2 and 3 are explanatory diagrams of the causes of measurement errors in Vickers hardness, and Fig. 4 is a block diagram showing an embodiment of the microhardness meter according to the present invention. , FIG. 5 is a diagram showing an example of the scanning direction of the indentation by the television camera in FIG. 4, FIG. 6 is a diagram showing an example of the storage device in FIG. 4, and FIGS. FIG. 8 is an enlarged explanatory diagram of the memory in FIG. 6, FIGS. 9 a to d are explanatory diagrams when determining the address of the edge of an indentation, and FIG. It is a figure which shows the relationship between the original image of an indentation, and a mask in the addition part of a figure. 1... Indentation, 10... Hardness meter, 11... Television camera, 13... Shedding regeneration circuit, 14,
17...Signal processing circuit, 15...Storage device, 16
... Memory control device, 18 ... Addition section, 21 ...
Arithmetic circuit, 22...Printing section.

Claims (1)

【特許請求の範囲】 1 硬度計の圧子による正方形状の圧痕を撮像し
対応する画像信号を出力する撮像手段と、 該撮像した正方形状の圧痕の軸郭部を抽出する
輪郭抽出手段と、 前記輪郭部が抽出された画像を2値化する2値
化手段と、 2つの長方形画像領域を直角に交差させた十字
状の画像領域に対応する記憶領域を有し、これら
画像領域のうちの前記交差領域以外の4つの画像
領域にそれぞれ前記正方形状の輪郭部の各頂点部
分が位置するように前記2値化画像の一部を記憶
するクロスメモリと、 このクロスメモリに記憶された2値化画像を正
および負の斜め45度方向の画素列に沿つてそれぞ
れ走査し、前記4つの画像領域からそれぞれ一対
の前記輪郭部に対応する座標位置をそれぞれ求
め、これら座標位置の中点位置を各対毎に算出す
ることにより前記正方形状の輪郭部の4頂点の座
標位置を求める信号処理手段と、 該求めた4頂点の座標位置に基づき正方形状の
圧痕の対角線の長さを算出し、該算出値に基づき
硬度を算出するデータ処理手段と を具える微小硬度計。
[Scope of Claims] 1. Imaging means for capturing an image of a square indentation made by an indenter of a hardness tester and outputting a corresponding image signal; and contour extraction means for extracting an axial portion of the imaged square indentation; It has a binarization means for binarizing the image from which the outline has been extracted, and a storage area corresponding to a cross-shaped image area formed by intersecting two rectangular image areas at right angles. a cross memory that stores a part of the binarized image so that each vertex of the square outline is located in each of four image areas other than the intersection area; and a binarized image stored in the cross memory. The image is scanned along the pixel rows in the positive and negative 45-degree diagonal directions, and the coordinate positions corresponding to the pair of contour parts are respectively obtained from the four image areas, and the midpoint position of each of these coordinate positions is determined. a signal processing means that calculates the coordinate positions of the four vertices of the square contour by calculating for each pair; and a signal processing means that calculates the length of the diagonal line of the square indentation based on the coordinate positions of the four calculated vertices; A microhardness meter comprising a data processing means for calculating hardness based on the calculated value.
JP11818180A 1980-08-27 1980-08-27 Microhardness meter Granted JPS5742838A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11818180A JPS5742838A (en) 1980-08-27 1980-08-27 Microhardness meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11818180A JPS5742838A (en) 1980-08-27 1980-08-27 Microhardness meter

Publications (2)

Publication Number Publication Date
JPS5742838A JPS5742838A (en) 1982-03-10
JPS6338657B2 true JPS6338657B2 (en) 1988-08-01

Family

ID=14730138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11818180A Granted JPS5742838A (en) 1980-08-27 1980-08-27 Microhardness meter

Country Status (1)

Country Link
JP (1) JPS5742838A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5150608A (en) * 1991-02-19 1992-09-29 Giancarlo Mazzoleni Centering device for use with brinell hardness-measuring probe
JP2603224Y2 (en) * 1991-04-03 2000-03-06 カルソニック株式会社 Heat exchanger
JP2776234B2 (en) * 1994-01-31 1998-07-16 株式会社島津製作所 Indentation type hardness measuring device
JP2013050379A (en) * 2011-08-31 2013-03-14 Mitsutoyo Corp Hardness-testing machine
US20140267679A1 (en) * 2013-03-13 2014-09-18 Leco Corporation Indentation hardness test system having an autolearning shading corrector

Also Published As

Publication number Publication date
JPS5742838A (en) 1982-03-10

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