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JPS6341042B2 - - Google Patents
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JPS6341042B2 - - Google Patents

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Publication number
JPS6341042B2
JPS6341042B2 JP57043395A JP4339582A JPS6341042B2 JP S6341042 B2 JPS6341042 B2 JP S6341042B2 JP 57043395 A JP57043395 A JP 57043395A JP 4339582 A JP4339582 A JP 4339582A JP S6341042 B2 JPS6341042 B2 JP S6341042B2
Authority
JP
Japan
Prior art keywords
conical
light beam
aperture stop
optical integrator
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57043395A
Other languages
Japanese (ja)
Other versions
JPS58160914A (en
Inventor
Makoto Uehara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nippon Kogaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Kogaku KK filed Critical Nippon Kogaku KK
Priority to JP57043395A priority Critical patent/JPS58160914A/en
Priority to US06/416,029 priority patent/US4498742A/en
Publication of JPS58160914A publication Critical patent/JPS58160914A/en
Publication of JPS6341042B2 publication Critical patent/JPS6341042B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70091Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Light Sources And Details Of Projection-Printing Devices (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Microscoopes, Condenser (AREA)
  • Projection-Type Copiers In General (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

本発明は照明光学系、特に投影露光装置等に用
いられるミラー集光型照明光学系の改良に関す
る。 超高圧水銀ランプのような放電型光源を用いた
照明光学系においては、楕円反射鏡等の凹面反射
鏡によつて集光することが最も効率が良いが、光
軸の近傍に光束が存在せず中心部の抜けた照明光
束となる。この欠点については、本願と同一発明
者による特許願昭和56年第141677号特開昭58−
043416号として出願された発明、すなわち、円錐
状凸面と円錐状凹面とからなる屈折部材を平行光
束中に配置することによつて、解決することがで
きる。 他方、従来より投影対物レンズの入射瞳の径
φeに対し、照明系中の開口絞りの像の該投影対
物レンズの入射瞳位置での径をφaとすると、
φa/φe=σが、σ(シグマ)値と呼ばれている。
一般にσ値は1より小さく0.5〜0.7に選ばれるこ
とが多く、この値が大きい程微細パターンにおい
て解像が悪くなり、焦点深度も浅くなるが、微細
パターン間の干渉による像変形は受けにくい。逆
にσの値が小さくなると、解像、焦点深度とも良
くなるが、像変形を受け易くなる。そして、投影
対物レンズの露光効率から見ると、入射瞳での照
度が一定であれば、σ値を大きくとつた方が有利
になる。つまり表1のように、相反する性質を持
つたことが知られている。
The present invention relates to an illumination optical system, particularly to an improvement of a mirror condensing type illumination optical system used in a projection exposure apparatus or the like. In an illumination optical system using a discharge type light source such as an ultra-high pressure mercury lamp, it is most efficient to focus the light using a concave reflector such as an elliptical reflector, but the light flux does not exist near the optical axis. This results in an illumination light beam that is not centered. Regarding this drawback, patent application No. 141677 of 1982 filed by the same inventor as the present application,
This problem can be solved by the invention filed as No. 043416, that is, by arranging a refractive member consisting of a conical convex surface and a conical concave surface in a parallel light beam. On the other hand, conventionally, with respect to the diameter φe of the entrance pupil of the projection objective lens, let φa be the diameter of the image of the aperture stop in the illumination system at the entrance pupil position of the projection objective lens.
φa/φe=σ is called the σ (sigma) value.
In general, the σ value is often selected to be smaller than 1 and between 0.5 and 0.7, and the larger this value is, the worse the resolution and the shallower the depth of focus will be in fine patterns, but image deformation due to interference between fine patterns is less likely to occur. Conversely, as the value of σ becomes smaller, both resolution and depth of focus improve, but image deformation becomes more likely. From the perspective of the exposure efficiency of the projection objective lens, if the illuminance at the entrance pupil is constant, it is advantageous to increase the σ value. In other words, as shown in Table 1, it is known that they have contradictory properties.

【表】 単にσ値を変えるための機構として、例えば実
開昭56−119646号公報に開示されたごとく絞り径
をターレツト式に可変にしたものが提案されてい
るが、σ値を小さくすると遮光される光量が増大
するため露光効率は低下せざるを得なかつた。 本発明はミラー集光型照明光学系において、σ
値を可変にする時等照明光学系中の開口絞りを変
化させても、光量損失が生じず常に最大の光量を
維持できる照明光学系を得ることを目的にしてい
る。 本発明は、少なくとも2次曲面を有する反射鏡
と該反射鏡により集光された光束を平行光束に変
換するためのコレクターレンズと開口絞りとを有
するミラー集光型照明光学系において、 該コレクターレンズと該開口絞りとの間に、円
錐状凸面と円錐状凹面とを有する円錐状屈折部材
を該円錐の頂点がほぼ光軸に一致するごとく配置
するとともに、該開口絞りと該屈折部材との間で
アフオーカル変倍系により前記開口絞りの口径変
化に応じて光束幅を変化させるものである。 以下、本発明を実施例に基づいて説明する。第
1図及び第2図は本発明による照明光学系を投影
型露光装置に用いた概略構成図である。第1図に
おいて、光源Sからの光束は楕円反射鏡1で集光
され、コレクターレンズ2によりほぼ平行光束に
変換される。この平行光束は円錐状凸面3aと円
錐状凹面3bとを有する屈折部材3を通つて、フ
ライアイレンズ群からなるオプテイカルインテグ
レーター4に達する。図中光源Sからオプテイカ
ルインテグレーター4までの光束を斜線で示した
が図から分るように、コレクターレンズ2を射出
する光束は光軸付近の中央部には光線がほとんど
存在しない中空状態であり、円錐状屈折部材3に
より光束が光軸へ向つて回転対称的に変移し、光
軸付近の中空を埋めたほぼ均一な光束となる。こ
の円錐状屈折部材3は、第1図及び第2図に示さ
れるとおり、円錐状凸面3aと該円錐状凸面とほ
ぼ同一頂角の円錐状凹面3bとを持つように構成
されており、円錐状凸面3aをコレクターレンズ
2側に向けて各円錐状面の回転対称軸が照明光学
系の光軸にほぼ一致するごとく配置されている。
オプテイカルインテグレーターは例えば特開昭56
−81813号公報に開示されているように、複数の
2次光源を形成するためのものである。オプテイ
カルインテグレーターの射出面近傍には開口絞り
5が設けられており、開口絞り5を通過した光束
はコンデンサーレンズ6を通つて、被投影原版と
してのレテイクルRを照明する。レテイクルRは
投影対物レンズ10により所定の倍率でウエハW
上に投影される。ここで、開口絞り5と投影対物
レンズ10の入射瞳11とがコンデンサーレンズ
6に関して共役であり、いわゆるケーラー照明が
なされている。投影対物レンズ10の入射瞳の口
径をφeとし、ここに形成される開口絞り5の像
の大きさをφaとするとき、σ(シグマ)値は先に
も述べたとおりφa/φeであり、図示なき手段に
より開口絞り5の大きさを変えることによつてσ
値を変えることができ、レテイクルのパターンに
よつて最適σ値を得ることができる。 第2図は、第1図の構成において、開口絞り5
の口径をDからβ・Dに縮小した時に、屈折部材
3とオプテイカルインテグレーター4との間に正
レンズL1と負レンズL2とからなるアフオーカル
系20を挿入した状態を示している。この場合の
σ値は第1図の状態でのβ倍である。ここでアフ
オーカル系20の倍率は開口絞り5の縮小倍率β
にほぼ等しく、屈折部材3を射出した均一光束の
ほとんど全てが開口絞り5を通過するため、光量
損失がなく極めて良い効率を得ることができる。
ここで、アフオーカル系20は屈折部材3の後方
(射出光側)に配置されることが重要である。仮
りに順序を逆にして配置すると、アフオーカル系
の倍率によつてコレクターレンズ2からの中型光
束の中空状態が変わるため、屈折部材による光束
の中心方向へのシフト量を変化させない限り効率
よく照明光を供給することができない。 第2図では開口絞り5の口径を縮小する時、こ
れに伴つて光束径を縮小するアフオーカル系を挿
入したが、通常の開口絞り径によつてσ値を1よ
り小さく構成しておき、開口絞り径を大きくして
σ値を1程度に大きくする場合に、光束径を拡大
するアフオーカル系を挿入することもできる。さ
らに、アフオーカル系を挿脱することなく、変倍
可能なアフオーカル系を屈折部材3とオプテイカ
ルインテグレーターとの間に配置しておき、開口
絞り5の口径変化に連動してアフオーカル系を変
倍してもよい。この場合にも開口絞りの口径の大
きさの比が、アフオーカル系の倍率にほぼ等しく
構成することはいうまでもない。アフオーカル系
は正負のレンズからなるガリレオ型に限られるも
のではなく2つの正レンズからなるケプラー型で
もよい。 尚、開口絞りの形状は円形に限られるものでは
なく、被投影原版のパターンによつては楕円や矩
形でもよく、またアフオーカル系はトーリツクレ
ンズ系を用いて光束の断面形状を非等方的にする
ことも可能である。例えばトーリツクレンズ系と
して、一方の子午面内でガリレオ型アフオーカル
系を、これと直交する子午面内でケプラー型アフ
オーカル系を構成し、非等方的形状の開口絞りに
光束形状をほぼ合致させればよい。 以上のように本発明によれば光量の損失なしに
σ値を可変にでき、従来表1のような関係でしか
σ値を選べなかつたのに対し露光効率を常に最良
の状態に維持できるようにする。
[Table] As a mechanism for simply changing the σ value, a turret-type variable aperture diameter mechanism has been proposed, for example, as disclosed in Japanese Utility Model Application Publication No. 56-119646, but when the σ value is decreased, light is blocked. As the amount of light emitted increases, the exposure efficiency inevitably decreases. The present invention provides a mirror condensing illumination optical system in which σ
The purpose of this invention is to obtain an illumination optical system that can always maintain the maximum amount of light without causing any loss of light amount even if the aperture diaphragm in the illumination optical system is changed when making the value variable. The present invention provides a mirror condensing illumination optical system comprising a reflecting mirror having at least a quadratic curved surface, a collector lens for converting a light beam collected by the reflecting mirror into a parallel light beam, and an aperture stop, the collector lens having the following features: A conical refractive member having a conical convex surface and a conical concave surface is disposed between the aperture stop and the aperture stop so that the apex of the cone substantially coincides with the optical axis, and between the aperture stop and the refractive member. The light beam width is changed by the afocal variable magnification system according to the change in the aperture diameter of the aperture stop. Hereinafter, the present invention will be explained based on examples. FIGS. 1 and 2 are schematic configuration diagrams in which an illumination optical system according to the present invention is used in a projection exposure apparatus. In FIG. 1, a light beam from a light source S is condensed by an elliptical reflector 1, and converted into a substantially parallel light beam by a collector lens 2. This parallel light flux passes through a refracting member 3 having a conical convex surface 3a and a conical concave surface 3b, and reaches an optical integrator 4 consisting of a group of fly's eye lenses. In the figure, the light flux from the light source S to the optical integrator 4 is indicated by diagonal lines, but as can be seen from the figure, the light flux exiting the collector lens 2 is in a hollow state with almost no light rays in the center near the optical axis. The light beam is rotationally symmetrically shifted toward the optical axis by the conical refraction member 3, and becomes a substantially uniform light beam that fills the hollow near the optical axis. As shown in FIGS. 1 and 2, this conical refraction member 3 is configured to have a conical convex surface 3a and a conical concave surface 3b having approximately the same apex angle as the conical convex surface. Each conical surface is arranged with its convex surface 3a facing toward the collector lens 2 so that the axis of rotational symmetry of each conical surface substantially coincides with the optical axis of the illumination optical system.
For example, optical integrators are
This is for forming a plurality of secondary light sources, as disclosed in Japanese Patent No. -81813. An aperture stop 5 is provided near the exit surface of the optical integrator, and the light beam passing through the aperture stop 5 passes through a condenser lens 6 and illuminates a reticle R as an original to be projected. The reticle R is set on the wafer W at a predetermined magnification by the projection objective lens 10.
projected on top. Here, the aperture stop 5 and the entrance pupil 11 of the projection objective lens 10 are conjugate with respect to the condenser lens 6, and so-called Koehler illumination is performed. When the aperture of the entrance pupil of the projection objective lens 10 is φe, and the size of the image of the aperture stop 5 formed here is φa, the σ (sigma) value is φa/φe, as described above. By changing the size of the aperture stop 5 by means not shown, σ
The value can be changed, and the optimum σ value can be obtained by changing the reticle pattern. FIG. 2 shows the aperture stop 5 in the configuration shown in FIG.
The figure shows a state in which an afocal system 20 consisting of a positive lens L 1 and a negative lens L 2 is inserted between the refractive member 3 and the optical integrator 4 when the aperture of the lens is reduced from D to β·D. The σ value in this case is β times that in the state shown in FIG. Here, the magnification of the afocal system 20 is the reduction magnification β of the aperture stop 5.
Since almost all of the uniform light beam emitted from the refracting member 3 passes through the aperture stop 5, there is no loss in the amount of light and extremely high efficiency can be obtained.
Here, it is important that the afocal system 20 is placed behind the refractive member 3 (on the exit light side). If the order is reversed, the hollow state of the medium-sized light beam from the collector lens 2 will change depending on the magnification of the afocal system, so unless the amount of shift of the light beam toward the center by the refracting member is changed, the illumination light will not be efficiently used. cannot be supplied. In Fig. 2, when reducing the aperture diameter of the aperture stop 5, an afocal system is inserted to reduce the beam diameter. When increasing the aperture diameter to increase the σ value to about 1, it is also possible to insert an afocal system that expands the beam diameter. Furthermore, an afocal system that can change the magnification is placed between the refractive member 3 and the optical integrator without inserting or removing the afocal system, and the magnification of the afocal system can be changed in conjunction with changes in the diameter of the aperture stop 5. It's okay. It goes without saying that in this case as well, the ratio of the aperture diameters of the aperture stop is approximately equal to the magnification of the afocal system. The afocal system is not limited to the Galilean type consisting of positive and negative lenses, but may also be the Keplerian type consisting of two positive lenses. Note that the shape of the aperture diaphragm is not limited to a circle, but may be an ellipse or a rectangle depending on the pattern of the original to be projected.Afocal systems use a Tory lens system to make the cross-sectional shape of the light beam anisotropic. It is also possible to do so. For example, in a Torritz lens system, a Galileo-type afocal system is constructed in one meridional plane and a Keplerian-type afocal system is configured in a meridional plane perpendicular to this, and the shape of the light flux is made to approximately match the aperture stop with an anisotropic shape. Bye. As described above, according to the present invention, the σ value can be made variable without loss of light quantity, and whereas conventionally the σ value could only be selected based on the relationship shown in Table 1, the exposure efficiency can always be maintained at the best condition. Make it.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本発明を投影型露光装置に
用いた一実施例の概略構成図である。 主要部分の符号の説明、1……楕円反射鏡、2
……コレクターレンズ、3……円錐状屈折部材、
4……オプテイカルインテグレーター、5……開
口絞り、6……コンデンサーレンズ、10……投
影対物レンズ、11……入射瞳、20……アフオ
ーカル系。
FIGS. 1 and 2 are schematic diagrams of an embodiment in which the present invention is applied to a projection exposure apparatus. Explanation of symbols of main parts, 1...Elliptical reflector, 2
...Corrector lens, 3...Conical refractive member,
4... Optical integrator, 5... Aperture stop, 6... Condenser lens, 10... Projection objective lens, 11... Entrance pupil, 20... Affocal system.

Claims (1)

【特許請求の範囲】 1 少なくとも2次曲面を有する反射鏡と、該反
射鏡により集光された光束を平行光束に変換する
ためのコレクターレンズと、該平行光束中に配置
されて複数の光源像を形成するためのオプテイカ
ルインテグレータと、該オプテイカルインテグレ
ータによる複数光源の像位置に配置された開口絞
りとを有するミラー集光型照明光学系において、 前記コレクターレンズと前記オプテイカルイン
テグレータとの間に、円錐状凸面と該円錐状凸面
とほぼ同一頂角の円錐状凹面とを持つ屈折部材
を、該円錐状凸面を前記コレクターレンズ側に向
けて該各円錐状面の回転対称軸が光軸にほぼ一致
するごとく配置するとともに、前記屈折部材と前
記オプテイカルインテグレータとの間に配置され
るアフオーカル変倍系により前記開口絞りの口径
変化に応じて光束幅を変化させ得ることを特徴と
する照明光学系。
[Scope of Claims] 1. A reflecting mirror having at least a quadratic curved surface, a collector lens for converting the light beam focused by the reflecting mirror into a parallel light beam, and a plurality of light source images disposed in the parallel light beam. In a mirror condensing illumination optical system having an optical integrator for forming an optical integrator and an aperture stop disposed at an image position of a plurality of light sources by the optical integrator, , a refractive member having a conical convex surface and a conical concave surface having approximately the same apex angle as the conical convex surface, with the conical convex surface facing the collector lens side so that the rotational symmetry axis of each conical surface is aligned with the optical axis. An illumination optical system characterized in that the refracting member and the optical integrator are arranged so as to substantially coincide with each other, and the beam width can be changed in accordance with a change in the diameter of the aperture stop by an afocal variable magnification system arranged between the refractive member and the optical integrator. system.
JP57043395A 1981-09-10 1982-03-18 Mirror converging type optical illumination system Granted JPS58160914A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP57043395A JPS58160914A (en) 1982-03-18 1982-03-18 Mirror converging type optical illumination system
US06/416,029 US4498742A (en) 1981-09-10 1982-09-08 Illumination optical arrangement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57043395A JPS58160914A (en) 1982-03-18 1982-03-18 Mirror converging type optical illumination system

Publications (2)

Publication Number Publication Date
JPS58160914A JPS58160914A (en) 1983-09-24
JPS6341042B2 true JPS6341042B2 (en) 1988-08-15

Family

ID=12662592

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57043395A Granted JPS58160914A (en) 1981-09-10 1982-03-18 Mirror converging type optical illumination system

Country Status (1)

Country Link
JP (1) JPS58160914A (en)

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* Cited by examiner, † Cited by third party
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JPS633205A (en) * 1986-06-23 1988-01-08 Asahi Optical Co Ltd Optical thickness measuring instrument
JPS63162320U (en) * 1987-04-10 1988-10-24
JPH02250016A (en) * 1989-03-23 1990-10-05 Mitsutoyo Corp Vertical dark field illuminating device
JPH02308106A (en) * 1989-05-23 1990-12-21 Citizen Watch Co Ltd Linear polarizing light source
JP2748341B2 (en) * 1989-12-28 1998-05-06 ウシオ電機株式会社 Optical unit and light irradiation device to which the optical unit is joined
JP2748342B2 (en) * 1989-12-28 1998-05-06 ウシオ電機株式会社 Light irradiation device
JP2748343B2 (en) * 1989-12-28 1998-05-06 ウシオ電機株式会社 Light irradiation device
JP2673915B2 (en) * 1991-05-24 1997-11-05 日本電信電話株式会社 Fine pattern projection exposure equipment
JPH0541342A (en) * 1991-08-05 1993-02-19 Nippon Telegr & Teleph Corp <Ntt> Fine pattern projection aligner
JP3278896B2 (en) * 1992-03-31 2002-04-30 キヤノン株式会社 Illumination apparatus and projection exposure apparatus using the same
NL194929C (en) * 1992-10-20 2003-07-04 Samsung Electronics Co Ltd Projection exposure system.
JP3879142B2 (en) * 1996-04-22 2007-02-07 株式会社ニコン Exposure equipment
JP4563557B2 (en) * 2000-07-18 2010-10-13 株式会社トプコン Illumination optical system of exposure equipment

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JPS58160914A (en) 1983-09-24

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