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JPS6346559B2 - - Google Patents
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JPS6346559B2 - - Google Patents

Info

Publication number
JPS6346559B2
JPS6346559B2 JP9478681A JP9478681A JPS6346559B2 JP S6346559 B2 JPS6346559 B2 JP S6346559B2 JP 9478681 A JP9478681 A JP 9478681A JP 9478681 A JP9478681 A JP 9478681A JP S6346559 B2 JPS6346559 B2 JP S6346559B2
Authority
JP
Japan
Prior art keywords
value
mas
memory
time constant
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9478681A
Other languages
Japanese (ja)
Other versions
JPS57210599A (en
Inventor
Hiroyuki Nishioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP9478681A priority Critical patent/JPS57210599A/en
Publication of JPS57210599A publication Critical patent/JPS57210599A/en
Publication of JPS6346559B2 publication Critical patent/JPS6346559B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/26Measuring, controlling or protecting
    • H05G1/30Controlling
    • H05G1/38Exposure time

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)

Description

【発明の詳細な説明】 この発明は、コンデンサ式X線装置において、
KV(管電圧)及びmAS(放電電荷量)の設定を行
なつたとき実際の撮影に先だつて撮影時間を算
出・表示する装置に関する。
[Detailed Description of the Invention] The present invention provides a condenser type X-ray apparatus that includes:
This invention relates to a device that calculates and displays the shooting time prior to actual shooting when setting KV (tube voltage) and mAS (discharged charge amount).

コンデンサ式X線装置においては、撮影条件の
設定は、KV設定器にて充電電圧を、またmAS設
定器にてX線ばく射時の放電電荷量を設定する
が、従来のものではこのときに撮影時間がどれく
らいかかるかをあらかじめ知ることができなかつ
た。ところが実際のX線撮影では、特に動きの速
い部位の撮影を行なうとき撮影条件の中で撮影時
間が非常に大きな意味を持つので、この撮影時間
を知ることができないことはきわめて不便な点と
なつている。
In a capacitor type X-ray device, the imaging conditions are set by setting the charging voltage with the KV setting device and the amount of discharge charge during X-ray exposure with the mAS setting device. It was not possible to know in advance how long the shooting would take. However, in actual X-ray photography, especially when imaging fast-moving areas, the exposure time is extremely important in the imaging conditions, so not being able to know this exposure time is extremely inconvenient. ing.

本発明は上記に鑑み、当該X線管球のエミツシ
ヨン特性に応じてKV及びmASの設定値から直ち
に撮影時間を算出してこれを表示するコンデンサ
式X線装置の撮影時間前置表示装置を提供するこ
とを目的とする。
In view of the above, the present invention provides an imaging time pre-display device for a capacitor type X-ray device that immediately calculates the imaging time from the set values of KV and mAS according to the emission characteristics of the X-ray tube and displays it. The purpose is to

以下本発明の一実施例について図面を参照しな
がら説明する。まず、高圧コンデンサの放電特性
は第1図に示すようなものであり、初期電圧を
Vn、t秒後の電圧をV、時定数をAnとして次の
ような指数関数で近似できる。
An embodiment of the present invention will be described below with reference to the drawings. First, the discharge characteristics of a high-voltage capacitor are as shown in Figure 1, and the initial voltage
Vn, the voltage after t seconds is V, and the time constant is An, which can be approximated by the following exponential function.

V=Vne-Ant ここでmASを設定することによつて放電電荷
量の設定が行なわれるので、高圧コンデンサの合
成容量をCとすると、実際のX線ばく射時の放電
電荷量がmASに達したことはVnからmAS/C
だけ電圧降下することを意味するので、t秒後に
この状態になつたとすれば、 V=Vn−mAS/C=Vne-Ant と表わすことができる。そのため、 eAnt=Vn/Vn−mAS/C Ant=log e{Vn/Vn−mAS/C} An=1/tlog e{Vn/Vn−mAS/C}…(1) t=1/Anlog e{Vn/Vn−mAS/C}…(2) の(1),(2)式を導くことができる。
V=Vne -Ant Here, the discharge charge amount is set by setting mAS, so if the combined capacitance of the high-voltage capacitor is C, the discharge charge amount during actual X-ray exposure will reach mAS. What I did was mAS/C from Vn.
This means that the voltage drops by 10 seconds, so if this state is reached after t seconds, it can be expressed as V=Vn-mAS/C=Vne -Ant . Therefore, e Ant =Vn/Vn-mAS/C Ant=log e{Vn/Vn-mAS/C} An=1/tlog e{Vn/Vn-mAS/C}...(1) t=1/Anlog e {Vn/Vn-mAS/C}...(2) Equations (1) and (2) can be derived.

そこで、第2図に示すように、CPU(演算装
置)1と、上記(2)式の演算プログラムを記憶して
いるP−ROMなどのプログラムメモリ2とによ
り、バツテリバツクアツプのCMOS−RAMやEP
−ROMなどの放電時定数メモリ3に記憶された
時定数Anにもとづき、KV設定器4、mAS設定
器5から入力ポート6,7を介してKVとmASの
設定値を入力して上記(2)式演算を行なつて、算出
した撮影時間tを出力ポート8を介してSEC表示
器9により表示するよう構成する。メモリ3に記
憶すべき放電時定数Anは、X線管のエミツヨン
特性が管球毎にばらついているため、管球毎に求
めたものとする必要がある。このためX線装置を
個々に調整する際にその管球についての時定数を
充電電圧のサンプル値(たとえば10KV)毎に測
定する。具体的にはたとえば mAS/C=1/2V となるようなmASを設定し、実際にX線をばく
射して撮影時間を撮影時間計等で実測する。この
実測時間をtnとし、充電電圧をVnとして上記(1)
式に代入して時定数Anを算出する。これを、充
電電圧を10KVずつ変えて繰り返し、その結果得
られた10KV毎の時定数Anをメモリ3に記憶す
る。このメモリ3がバツテリバツクアツプの
CMOS−RAMの場合、デジタルスイツチ10に
より入力ポート11を介して書込み、P−ROM
の場合P−ROMライタにより書込む。
Therefore, as shown in FIG. 2, a CPU (arithmetic unit) 1 and a program memory 2 such as a P-ROM that stores the arithmetic program of equation (2) above are used to store battery backup CMOS-RAM and EP
- Based on the time constant An stored in the discharge time constant memory 3 such as ROM, input the KV and mAS setting values from the KV setting device 4 and mAS setting device 5 through the input ports 6 and 7 and ) calculation is performed, and the calculated imaging time t is displayed on the SEC display 9 via the output port 8. The discharge time constant An to be stored in the memory 3 needs to be determined for each tube, since the emission characteristics of the X-ray tube vary from tube to tube. For this reason, when individually adjusting the X-ray device, the time constant for the tube is measured for each sample value of charging voltage (for example, 10 KV). Specifically, for example, mAS is set such that mAS/C=1/2V, and the X-rays are actually exposed and the imaging time is actually measured using an imaging time meter or the like. Assuming that this actual measurement time is tn and the charging voltage is Vn, see (1) above.
Calculate the time constant An by substituting it into the formula. This is repeated by changing the charging voltage in increments of 10 KV, and the time constant An obtained in increments of 10 KV is stored in the memory 3. This memory 3 is for battery backup.
In the case of CMOS-RAM, write via input port 11 by digital switch 10, P-ROM
In this case, write using a P-ROM writer.

この構成において、撮影条件をKV設定時4及
びmAS設定器5によりそれぞれ設定すると、設
定されたKV値とmAS値とが入力ポート6,7を
経てCPU1により読取られ、このKV値に最も近
い電圧Vnに対応する時定数Anがメモリ3から読
出されて、上記(2)式の演算が行なわれて撮影時間
tが算出される。すなわち撮影条件を設定する毎
に、実際のX線ばく射に先だつて撮影時間の算出
が行なわれて、SEC表示器9により表示される。
In this configuration, when the imaging conditions are set using the KV setting 4 and the mAS setting device 5, the set KV value and mAS value are read by the CPU 1 via the input ports 6 and 7, and the voltage closest to this KV value is read. The time constant An corresponding to Vn is read out from the memory 3, and the above equation (2) is calculated to calculate the photographing time t. That is, each time the imaging conditions are set, the imaging time is calculated and displayed on the SEC display 9 prior to actual X-ray exposure.

なお、上記において、10KV毎に時定数を求め
てこれを記憶するとしたが、これはサンプリング
の例示であり、サンプル間隔を細かくとる程精度
が高くなつて好ましい。
Note that in the above, the time constant is determined and stored every 10 KV, but this is an example of sampling, and the finer the sampling interval, the higher the precision is, and is therefore preferable.

以上、実施例について説明したように、本発明
によれば、KV設定器とmAS設定器とにより撮影
条件を設定すれば撮影時間を知ることができるの
で、撮影時間を所望のものとするような条件設定
が可能となり動きの速い部位の撮影などにおいて
効果が大きい。
As described above with respect to the embodiments, according to the present invention, it is possible to know the shooting time by setting the shooting conditions using the KV setting device and the mAS setting device. Conditions can be set, which is very effective when photographing parts that move quickly.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はコンデンサの放電特性を示すグラフ、
第2図は実施例の構成を示すブロツク図である。 1……CPU、2……プログラムメモリ、3…
…放電時定数用メモリ、4……KV設定器、5…
…mAS設定器、6,7,11……入力ポート、
8……出力ポート、9……SEC表示器、10……
デジタルスイツチ。
Figure 1 is a graph showing the discharge characteristics of a capacitor.
FIG. 2 is a block diagram showing the configuration of the embodiment. 1...CPU, 2...Program memory, 3...
...Discharge time constant memory, 4...KV setting device, 5...
...mAS setting device, 6, 7, 11...input port,
8... Output port, 9... SEC display, 10...
Digital switch.

Claims (1)

【特許請求の範囲】[Claims] 1 コンデンサの放電特性を指数関数で近似して
当該X線管球に関する放電時定数をKV値の所定
サンプル値毎に測定しこの測定された放電時定数
を記憶する第1のメモリと、指数関数にもとづい
て撮影時間を演算する演算プログラムを記憶する
第2のメモリと、この第2のメモリに記憶された
演算プログラムにしたがい、上記第1のメモリに
記憶された放電時定数と設定されたKV値及び
mAS値とにより演算を行なつて該KV値及びm
AS値に対応する撮影時間を求める演算装置と、
この撮影時間を表示する表示装置とを有してなる
コンデンサ式X線装置の撮影時間前置表示装置。
1. A first memory that approximates the discharge characteristics of a capacitor by an exponential function, measures the discharge time constant for the X-ray tube for each predetermined sample value of the KV value, and stores the measured discharge time constant; a second memory that stores a calculation program for calculating the shooting time based on the discharge time constant stored in the first memory and the set KV according to the calculation program stored in the second memory; value and
Perform calculations using the mAS value and calculate the KV value and m
a calculation device that calculates the shooting time corresponding to the AS value;
An imaging time pre-display device for a capacitor type X-ray apparatus, comprising a display device for displaying the imaging time.
JP9478681A 1981-06-19 1981-06-19 Display apparatus of elapsing photographing time for condenser-type x-ray device Granted JPS57210599A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9478681A JPS57210599A (en) 1981-06-19 1981-06-19 Display apparatus of elapsing photographing time for condenser-type x-ray device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9478681A JPS57210599A (en) 1981-06-19 1981-06-19 Display apparatus of elapsing photographing time for condenser-type x-ray device

Publications (2)

Publication Number Publication Date
JPS57210599A JPS57210599A (en) 1982-12-24
JPS6346559B2 true JPS6346559B2 (en) 1988-09-16

Family

ID=14119754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9478681A Granted JPS57210599A (en) 1981-06-19 1981-06-19 Display apparatus of elapsing photographing time for condenser-type x-ray device

Country Status (1)

Country Link
JP (1) JPS57210599A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009022672A (en) * 2007-07-23 2009-02-05 Hitachi Medical Corp X-ray high voltage device for medical use

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6486498A (en) * 1987-09-28 1989-03-31 Shimadzu Corp Continuous photographing system in capacitor type x-ray device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009022672A (en) * 2007-07-23 2009-02-05 Hitachi Medical Corp X-ray high voltage device for medical use

Also Published As

Publication number Publication date
JPS57210599A (en) 1982-12-24

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