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JPS6355210B2 - - Google Patents
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JPS6355210B2 - - Google Patents

Info

Publication number
JPS6355210B2
JPS6355210B2 JP55134851A JP13485180A JPS6355210B2 JP S6355210 B2 JPS6355210 B2 JP S6355210B2 JP 55134851 A JP55134851 A JP 55134851A JP 13485180 A JP13485180 A JP 13485180A JP S6355210 B2 JPS6355210 B2 JP S6355210B2
Authority
JP
Japan
Prior art keywords
feeder
drive system
cassette
sample
electron beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55134851A
Other languages
Japanese (ja)
Other versions
JPS5759329A (en
Inventor
Tooru Tojo
Kazuyoshi Sugihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP55134851A priority Critical patent/JPS5759329A/en
Publication of JPS5759329A publication Critical patent/JPS5759329A/en
Publication of JPS6355210B2 publication Critical patent/JPS6355210B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3435Target holders (includes backing plates and endblocks)

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)

Description

【発明の詳細な説明】 この発明は、電子ビーム露光装置の改良に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to improvements in electron beam exposure apparatus.

近時、ウエハやマスク基板等の試料の微細加工
を行なうものとして電子ビームを利用した電子ビ
ーム露光装置が開発されている。この装置では、
描画室内に配置されたテーブル上に試料を保持し
たカセツトを載置し、上記テーブルを移動せしめ
ると共に上記試料に電子ビームを照射して試料の
描画露光を行ない、その終了を待つてカセツトを
描画室外に取り出すようにしている。さらに、生
産ラインで用いられる電子ビーム露光装置では、
上記の一連の順序動作を連続的に行なうため、前
記描画室にゲートバルブ等を介して機械的に結合
した予備室を設け、この予備室内のマガジン等に
複数個のカセツトを予じめ装填しておき、一連の
順序動作をコントロールする制御部の指令によつ
て実行するようにしている。
2. Description of the Related Art Recently, electron beam exposure apparatuses that use electron beams have been developed to perform microfabrication of samples such as wafers and mask substrates. With this device,
A cassette holding a sample is placed on a table placed in the drawing room, the table is moved and the sample is irradiated with an electron beam to perform drawing exposure of the sample, and after waiting for the completion of exposure, the cassette is removed from the drawing room. I try to take it out. Furthermore, in the electron beam exposure equipment used on the production line,
In order to perform the above series of sequential operations continuously, a preliminary chamber is provided which is mechanically connected to the drawing chamber through a gate valve, etc., and a plurality of cassettes are loaded in advance into a magazine or the like in this preliminary chamber. The system is set up in advance and executed according to commands from a control unit that controls a series of sequential operations.

ところで、上述した連続動作の確実さは、主と
して、制御部を構成するICその他の個々の回路
要素の信頼性によつて定まる。しかしながら、
IC等の回路要素は初期故障を除去するためのス
クリーニングを行なつたものを使用したとしても
偶発事故の発生は避けられない。前述した試料基
板の移送の操作には機械部品の移動を伴うため、
上記偶発事故の発生によつては致命的な機械部品
の破損という事態を招きかねない。例えば、カセ
ツトをフイーダで搬送する際に、ゲートバルブの
閉成、マガジンの上下動或いはテーブルの移動等
が生じると、フイーダ、ゲートバルブ、マガジン
およびテーブル等の破損が起こる。なお、この原
因は、一般に操作ミス、電気的ノイズによる誤動
作および停電等によるものである。そして、上述
した機械系の破損事故は、その復旧に長時間を要
し、装置の移動率を大きく低下させる要因とな
る。
Incidentally, the reliability of the above-mentioned continuous operation is mainly determined by the reliability of the IC and other individual circuit elements that constitute the control section. however,
Even if circuit elements such as ICs are screened to eliminate early failures, the occurrence of accidental accidents is unavoidable. The above-mentioned sample substrate transfer operation involves moving mechanical parts, so
If the accident mentioned above occurs, it may lead to fatal damage to mechanical parts. For example, when a cassette is transported by a feeder, if a gate valve is closed, a magazine is moved up and down, or a table is moved, the feeder, gate valve, magazine, table, etc. may be damaged. Note that this is generally caused by operational errors, malfunctions due to electrical noise, power outages, and the like. The above-mentioned damage to the mechanical system requires a long time to recover, and is a factor that greatly reduces the movement rate of the device.

本発明は上記事情を考慮してなされたもので、
その目的とするところは、偶発事故、操作ミスお
よび電気的ノイズ等に伴う機械系の破損等の各種
のトラブルを未然に防止し得る電子ビーム露光装
置を提供することにある。
The present invention was made in consideration of the above circumstances, and
The purpose is to provide an electron beam exposure apparatus that can prevent various kinds of troubles such as accidental accidents, operational errors, and damage to the mechanical system due to electrical noise.

すなわち、本発明は試料を保持したカセツトを
搬送するフイーダの位置を検出する位置検出器を
設け、この検出器の検出信号をフイーダを駆動す
る駆動系以外の駆動系のインタロツク信号として
用いることによつて前記目的を達成せんとしたも
のである。
That is, the present invention provides a position detector that detects the position of the feeder that transports the cassette holding the sample, and uses the detection signal of this detector as an interlock signal for a drive system other than the drive system that drives the feeder. The aim was to achieve the above objective.

以下、この発明の詳細を図示の実施例によつて
説明する。
Hereinafter, details of the present invention will be explained with reference to illustrated embodiments.

図はこの発明の一実施例を模式的に示す概略構
成図である。図中1は防振部2を介して架台3に
固定された定盤で、この定盤1の上面には描画室
4および予備室5が載置されている。描画室4内
にはX−Yテーブル6が配置され、このテーブル
6はテーブル駆動系7によりX方向(紙面左右方
向)およびY方向(紙面表裏方向)に移動され
る。そして、X−Yテーブル6の移動位置はレー
ザ干渉計8およびレーザ反射体9にて検出される
ものとなつている。
The figure is a schematic configuration diagram schematically showing an embodiment of the present invention. In the figure, reference numeral 1 denotes a surface plate fixed to a pedestal 3 via a vibration isolator 2, and a drawing chamber 4 and a preliminary chamber 5 are placed on the upper surface of this surface plate 1. An X-Y table 6 is arranged in the drawing chamber 4, and the table 6 is moved by a table drive system 7 in the X direction (left-right direction on the page) and Y direction (front and back direction on the page). The moving position of the XY table 6 is detected by a laser interferometer 8 and a laser reflector 9.

前記予備室5はバルブ駆動系10により開閉さ
れるゲートバルブ11を介して前記描画室4に連
接して設けられたもので、その内部にはマガジン
駆動系12により上下に移動されるマガジン13
が配置されている。このマガジン13は水平方向
に分割された複数、例えば4個の収容部からなる
もので、各収容部にはそれぞれ試料を保持したカ
セツト14が収容されている。そして、マガジン
13内のカセツト14はフイーダ駆動系15によ
り紙面左右方向に移動駆動されるフイーダ16に
よつて、前記描画室4内に1個ずつ搬送され同室
4内のX−Yテーブル6の所定部位に載置される
ものとなつている。
The preliminary chamber 5 is connected to the drawing chamber 4 via a gate valve 11 that is opened and closed by a valve drive system 10, and a magazine 13 that is moved up and down by a magazine drive system 12 is installed inside the preliminary chamber 5.
is located. This magazine 13 consists of a plurality of storage sections, for example four, which are divided horizontally, and each storage section accommodates a cassette 14 holding a sample. Then, the cassettes 14 in the magazine 13 are transported one by one into the drawing chamber 4 by a feeder 16 that is driven by a feeder drive system 15 to move in the horizontal direction on the paper, and are placed at a predetermined position on the X-Y table 6 in the same chamber 4. It is intended to be placed on the body part.

また、前記予備室5内のフイーダ16の近傍に
は、位置検出器17が配設されている。この検出
器17は、例えばマイクロスイツチからなるもの
で、前記フイーダ16が所定位置(図に示す如く
最右端に位置しカセツト14の搬送を行わない位
置)にあるか否かを検出している。そして、位置
検出器17の検出信号は操作盤18に送出される
と共に、カセツト移送制御部19を介して前記各
駆動系7,10,12にインタロツク信号として
送出されている。すなわち、フイーダ16が所定
位置にあるときの検出信号を「ON」、それ以外
を「OFF」とすると検出信号が「ON」のときの
み各駆動系7,10,12は作動できるものとな
つている。また、上記信号が「ON」のときは操
作盤18にランプ等が点灯されるものとなつてい
る。
Further, a position detector 17 is arranged near the feeder 16 in the preliminary chamber 5. This detector 17 is composed of, for example, a microswitch, and detects whether or not the feeder 16 is at a predetermined position (as shown in the figure, the rightmost position where the cassette 14 is not transported). The detection signal from the position detector 17 is sent to the operation panel 18, and is also sent to each of the drive systems 7, 10, and 12 as an interlock signal via the cassette transfer control section 19. That is, if the detection signal is set to "ON" when the feeder 16 is in a predetermined position, and "OFF" at other times, each drive system 7, 10, 12 can operate only when the detection signal is "ON". There is. Further, when the above signal is "ON", a lamp or the like is lit on the operation panel 18.

なお、前記描画室4内および予備室5内は図示
しない真空ポンプ等により真空排気されるものと
なつている。また、図中20はX−Yテーブル6
の所定部位に載置されたカセツト14内の試料に
電子ビームを照射し同試料を露光する電子光学鏡
筒を示し、21はレーザ光を透過させる透明板を
示している。
Note that the drawing chamber 4 and the preliminary chamber 5 are evacuated by a vacuum pump or the like (not shown). In addition, 20 in the figure is the X-Y table 6
2 shows an electron optical lens barrel that irradiates an electron beam onto a sample in a cassette 14 placed at a predetermined position of the sample to expose the sample. Reference numeral 21 indicates a transparent plate through which laser light is transmitted.

このような構成であれば、操作盤18のセツト
により描画室4内および予備室5内が真空排気さ
れ、しかるのちゲートバルブ11が開かれマガジ
ン13内のカセツト14がフイーダ16によりX
−Yテーブル6の所定部位に搬送され載置され
る。そして、電子ビームによりカセツト14内の
試料が露光され、その終了を待つてカセツト14
が描画室4外に取り出されると云う一連の動作が
行なわれる。ここで、カセツト14がフイーダ1
6により搬送されている場合には、フイーダ16
の位置が前記所定位置以外にあるため、位置検出
器17の検出信号が「OFF」となり、これによ
つてテーブル駆動系7、バルブ駆動系10および
マガジン駆動系12はインタロツクされる。従つ
て、この状態で操作ミス、電気的ノイズによる誤
動作或いは停電等が生じたとしても、ゲートバル
ブ11の開成、マガジン13の上下動およびテー
ブル6の移動等が生じることはない。このため、
フイーダ16によるカセツト14の移送時におい
て、操作ミスや偶発事故等に起因する機械的駆動
部の破損を未然に防止することができ、信頼性の
向上をはかり得る。さらに、このことは機械的駆
動部の破損を復旧させるため長時間に亘り装置を
停止させる等の不都合を回避でき、生産性の向上
をはかり得ると云う効果につながる。
With such a configuration, the interior of the drawing chamber 4 and the preliminary chamber 5 are evacuated by setting the operation panel 18, and then the gate valve 11 is opened and the cassette 14 in the magazine 13 is transferred to the X by the feeder 16.
- It is transported to a predetermined location on the Y table 6 and placed thereon. Then, the sample in the cassette 14 is exposed to the electron beam, and after the exposure is finished, the cassette 14 is exposed.
A series of operations are performed in which the image is taken out of the drawing chamber 4. Here, the cassette 14 is connected to the feeder 1.
6, the feeder 16
Since the position is other than the predetermined position, the detection signal of the position detector 17 becomes "OFF", thereby interlocking the table drive system 7, valve drive system 10, and magazine drive system 12. Therefore, even if an operational error, malfunction due to electrical noise, power outage, etc. occur in this state, opening of the gate valve 11, vertical movement of the magazine 13, movement of the table 6, etc. will not occur. For this reason,
When the cassette 14 is transferred by the feeder 16, damage to the mechanical drive unit due to operational errors or accidents can be prevented, and reliability can be improved. Furthermore, this makes it possible to avoid inconveniences such as having to stop the apparatus for a long time to recover from damage to the mechanical drive unit, leading to the effect that productivity can be improved.

なお、この発明は上述した実施例に限定される
ものではない。例えば、前記位置検出器は前記フ
イーダが所定位置にあるか否かを検出し得るもの
であればよく、前記マイクロスイツチの代りに発
光素子および受光素子等を用いるようにしてもよ
い。さらに、上記検出器の配設部位は特に限定さ
れるものではない。また、上記検出器による検出
信号の処理のし方は、制御系の仕様に合わせて適
宜変更すればよい。要するに本発明は、その要旨
を逸脱しない範囲で、種々変形して実施すること
ができる。
Note that this invention is not limited to the embodiments described above. For example, the position detector may be any device that can detect whether or not the feeder is at a predetermined position, and a light emitting element, a light receiving element, etc. may be used in place of the micro switch. Furthermore, the location where the detector is disposed is not particularly limited. Further, the method of processing the detection signal by the detector may be changed as appropriate depending on the specifications of the control system. In short, the present invention can be implemented with various modifications without departing from the gist thereof.

以上詳述したように本発明は、試料を保持した
カセツトを搬送するフイーダの位置を検出する位
置検出器を設け、その検出信号をフイーダを駆動
する駆動系以外の駆動系のインタロツク信号とし
て用いるようにしているので、偶発事故、操作ミ
スおよび電気ノイズによる誤動作等に伴う機械系
の破損等の各種トラブルを未然に防止し得る電子
ビーム露光装置を提供することができる。
As described in detail above, the present invention includes a position detector that detects the position of a feeder that transports a cassette holding a sample, and uses the detection signal as an interlock signal for a drive system other than the drive system that drives the feeder. Therefore, it is possible to provide an electron beam exposure apparatus that can prevent various troubles such as damage to the mechanical system due to accidental accidents, operational errors, and malfunctions due to electrical noise.

【図面の簡単な説明】[Brief explanation of the drawing]

図はこの発明の一実施例を模式的に示す概略構
成図である。 1……定盤、2……防振部、3……架台、4…
…描画室、5……予備室、6……X−Yテーブ
ル、7……テーブル駆動系、10……バルブ駆動
系、11……ゲートバルブ、12……マガジン駆
動系、14……カセツト、15……フイーダ駆動
系、16……フイーダ、17……位置検出器、1
8……操作盤、19……カセツト移送制御部、2
0……電子光学鏡筒。
The figure is a schematic configuration diagram schematically showing an embodiment of the present invention. 1... Surface plate, 2... Vibration isolator, 3... Frame, 4...
... Drawing room, 5 ... Preliminary room, 6 ... X-Y table, 7 ... Table drive system, 10 ... Valve drive system, 11 ... Gate valve, 12 ... Magazine drive system, 14 ... Cassette, 15...Feeder drive system, 16...Feeder, 17...Position detector, 1
8...Operation panel, 19...Cassette transfer control section, 2
0... Electron optical lens barrel.

Claims (1)

【特許請求の範囲】[Claims] 1 試料を保持したカセツトをフイーダの移動に
より描画室内のテーブル上に搬送載置し、上記テ
ーブルを移動せしめると共に電子ビームを偏向走
査して上記試料を露光する電子ビーム露光装置に
おいて、前記フイーダの位置を検出する位置検出
器を設け、この位置検出器の検出信号を前記フイ
ーダを駆動する駆動系以外の駆動系のインタロツ
ク信号として用いたことを特徴とする電子ビーム
露光装置。
1. In an electron beam exposure apparatus that transports and places a cassette holding a sample on a table in a drawing chamber by moving a feeder, and exposes the sample by moving the table and deflecting and scanning an electron beam, the position of the feeder is determined. 1. An electron beam exposure apparatus characterized in that a position detector is provided to detect the feeder, and a detection signal from the position detector is used as an interlock signal for a drive system other than the drive system for driving the feeder.
JP55134851A 1980-09-27 1980-09-27 Device for electron beam exposure Granted JPS5759329A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55134851A JPS5759329A (en) 1980-09-27 1980-09-27 Device for electron beam exposure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55134851A JPS5759329A (en) 1980-09-27 1980-09-27 Device for electron beam exposure

Publications (2)

Publication Number Publication Date
JPS5759329A JPS5759329A (en) 1982-04-09
JPS6355210B2 true JPS6355210B2 (en) 1988-11-01

Family

ID=15137948

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55134851A Granted JPS5759329A (en) 1980-09-27 1980-09-27 Device for electron beam exposure

Country Status (1)

Country Link
JP (1) JPS5759329A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2578776A1 (en) * 1985-03-15 1986-09-19 Commissariat Energie Atomique TRANSFER BOX

Also Published As

Publication number Publication date
JPS5759329A (en) 1982-04-09

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