JPS6356951B2 - - Google Patents
Info
- Publication number
- JPS6356951B2 JPS6356951B2 JP8623379A JP8623379A JPS6356951B2 JP S6356951 B2 JPS6356951 B2 JP S6356951B2 JP 8623379 A JP8623379 A JP 8623379A JP 8623379 A JP8623379 A JP 8623379A JP S6356951 B2 JPS6356951 B2 JP S6356951B2
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- lead wires
- contact
- lead
- lead wire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 10
- 239000012212 insulator Substances 0.000 claims description 7
- 241000272161 Charadriiformes Species 0.000 claims 1
- BQYJATMQXGBDHF-UHFFFAOYSA-N difenoconazole Chemical compound O1C(C)COC1(C=1C(=CC(OC=2C=CC(Cl)=CC=2)=CC=1)Cl)CN1N=CN=C1 BQYJATMQXGBDHF-UHFFFAOYSA-N 0.000 claims 1
- 239000004020 conductor Substances 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Relating To Insulation (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
【発明の詳細な説明】
本発明はチドリ足配列されたリード線を有する
電子部品の特性測定装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for measuring characteristics of electronic components having lead wires arranged in a staggered arrangement.
従来、電子部品のリード線の形状は一定の間隔
で一列に配列されていたが、近年は電子部品の実
装面積の縮少化等の理由により、チドリ足配列の
リード線を有する電子部品が増えつつある。この
ような電子部品の特性測定装置として、従来のも
のは使用できない状況にあり、なおかつチドリ足
配列されたリード線の間隔は従来のリード線の間
隔と比較して約1/2に近接しており、その為リー
ド線相互の電気的影響を受け易い状況である。 Traditionally, the lead wires of electronic components were arranged in a line at regular intervals, but in recent years, due to the reduction in the mounting area of electronic components, the number of electronic components with lead wires in a staggered arrangement has increased. It's coming. Conventional equipment cannot be used to measure the characteristics of such electronic components, and the spacing between the lead wires arranged in a staggered pattern is approximately 1/2 that of the conventional lead wire spacing. Therefore, the lead wires are easily influenced by each other electrically.
本発明の目的は、上記のように密に配列された
チドリ足配列のリード端子を有する電子部品に対
し、各リード線間の相互干渉のないように該リー
ド線のそれぞれに２個の接触子が接触されるよう
にした電子部品の測定装置を提供することであ
る。 An object of the present invention is to provide an electronic component having lead terminals in a densely arranged plover-like arrangement as described above, by providing two contacts to each of the lead wires so as to prevent mutual interference between the lead wires. An object of the present invention is to provide a measuring device for electronic components, which allows the electronic components to be brought into contact with each other.
つぎに図により本発明を詳細に説明する。図は
５本のリード端子を有する電子部品に対して本発
明の測定装置を適用したリード線との接続部の図
であり、図において、１は被測定電子部品であ
り、２は電子部品１のチドリ足配列されたリード
線を示す。この電子部品１のリード線と相対して
位置する固定された接触子５は導電体箔を絶縁体
３の外面側に圧着して形成され、さらに導体板４
が接地電極として２枚の絶縁体３の間にはさまれ
ている。接地電極板４を間にはさんだ２枚の絶縁
体３の厚さは、被測定電子部品のチドリ足配列の
リード線の列間隔にほぼ等しくされており、電子
部品１のリード線２の列の間に２枚の絶縁体３を
はさむようにしてリード線２と固定接触子５はそ
れぞれ接触され、このような接触状態のリード線
２に対し、外側から突き出されて接触される可動
接触子６が備えられ、接触子５と６、および接地
電極４は接続線７を介して外部特性測定器へ接続
し、被測定電子部品１のリード線２の各々に対し
ては固定接触子５と可動接触子６とでもつてケル
ビン接続される。 Next, the present invention will be explained in detail with reference to the drawings. The figure is a diagram of a connecting part with a lead wire when the measuring device of the present invention is applied to an electronic component having five lead terminals. In the figure, 1 is the electronic component to be measured, and 2 is the electronic component 1. The plover-legged leads are shown. A fixed contact 5 located opposite to the lead wire of the electronic component 1 is formed by crimping a conductive foil to the outer surface of the insulator 3, and further includes a conductor plate 4.
is sandwiched between two insulators 3 as a ground electrode. The thickness of the two insulators 3 with the ground electrode plate 4 sandwiched therebetween is approximately equal to the row spacing of the lead wires in the staggered arrangement of the electronic component to be measured. The lead wire 2 and the fixed contact 5 are brought into contact with each other with the two insulators 3 sandwiched between them, and the movable contact 6 is brought into contact with the lead wire 2 in such a contact state by protruding from the outside. The contacts 5 and 6 and the ground electrode 4 are connected to an external characteristic measuring device via a connecting wire 7, and a fixed contact 5 and a movable contact are connected to each of the lead wires 2 of the electronic component 1 to be measured. A Kelvin connection is also established with the contactor 6.
本発明の効果として、被測定電子部品の各リー
ド線にケルビン接続されることによる高い測定精
度が得られる。また、各リード線間の電気的影響
を接地電極を備えることで軽減できる。 As an effect of the present invention, high measurement accuracy can be obtained by Kelvin connection to each lead wire of the electronic component to be measured. Further, the electrical influence between each lead wire can be reduced by providing a ground electrode.
図は本発明にかかる電子部品の特性測定装置の
接触機構部と、被測定電子部品を示す斜視図であ
る。
１…被測定電子部品、２…被測定電子部品のリ
ード線、３…絶縁体、４…接地用電極板、５…固
定接触子、６…可動接触子、７…接続線。
The figure is a perspective view showing a contact mechanism section of the electronic component characteristic measuring device according to the present invention and an electronic component to be measured. DESCRIPTION OF SYMBOLS 1... Electronic component to be measured, 2... Lead wire of the electronic component to be measured, 3... Insulator, 4... Grounding electrode plate, 5... Fixed contact, 6... Movable contact, 7... Connection wire.
Claims (1)
もつ電子部品の測定装置において、接地用電極板
を間にはさんで全体の厚さが前記リード線の列間
隔にほぼ等しい２枚の絶縁体の両外側に、前記チ
ドリ足配列の列内のリード線間隔に合せて設けら
れた固定接触子と、前記絶縁体をまたぐよう挿入
されて前記固定接触子に接触された前記電子部品
のリード線に対し、両外側から該リード線のそれ
ぞれに接触される可動の接触子とを備えた接触機
構を有することを特徴とする電子部品の特性測定
装置。1. In a measuring device for electronic components having lead wires with at least a staggered arrangement of tips, two insulators with a grounding electrode plate sandwiched between them and having a total thickness approximately equal to the row spacing of the lead wires are used. a fixed contact provided on both outsides of the electronic component according to the lead wire spacing in the row of the plover leg arrangement, and a lead wire of the electronic component inserted so as to straddle the insulator and come into contact with the fixed contact. On the other hand, an electronic component characteristic measuring device characterized by having a contact mechanism including a movable contactor that contacts each of the lead wires from both outsides.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8623379A JPS5610262A (en) | 1979-07-06 | 1979-07-06 | Measuring device for charactersitic of electronic part |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8623379A JPS5610262A (en) | 1979-07-06 | 1979-07-06 | Measuring device for charactersitic of electronic part |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5610262A JPS5610262A (en) | 1981-02-02 |
| JPS6356951B2 true JPS6356951B2 (en) | 1988-11-09 |
Family
ID=13881065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8623379A Granted JPS5610262A (en) | 1979-07-06 | 1979-07-06 | Measuring device for charactersitic of electronic part |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5610262A (en) |
-
1979
- 1979-07-06 JP JP8623379A patent/JPS5610262A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5610262A (en) | 1981-02-02 |
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