Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6357398B2 - - Google Patents
[go: Go Back, main page]

JPS6357398B2 - - Google Patents

Info

Publication number
JPS6357398B2
JPS6357398B2 JP58158733A JP15873383A JPS6357398B2 JP S6357398 B2 JPS6357398 B2 JP S6357398B2 JP 58158733 A JP58158733 A JP 58158733A JP 15873383 A JP15873383 A JP 15873383A JP S6357398 B2 JPS6357398 B2 JP S6357398B2
Authority
JP
Japan
Prior art keywords
growth
solution
gaas
tank
raw material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58158733A
Other languages
Japanese (ja)
Other versions
JPS6051693A (en
Inventor
Toshio Sagawa
Tsunehiro Unno
Tosha Toyoshima
Junkichi Nakagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP15873383A priority Critical patent/JPS6051693A/en
Publication of JPS6051693A publication Critical patent/JPS6051693A/en
Publication of JPS6357398B2 publication Critical patent/JPS6357398B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/02Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は結晶成長方法とその装置に係り、特に
溶液法によるGa1-xAlxAs混晶単結晶の成長方法
とその装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a crystal growth method and an apparatus thereof, and particularly relates to a method and apparatus for growing a Ga 1-x Al x As mixed single crystal by a solution method. be.

[従来の技術] Ga1-xAlxAs等の化合物半導体混晶は、発光ダ
イオード、半導体レーザ等種々の用途に使用され
ており、これらGaAlAsの混晶単結晶は、格子定
数が近似していること、熱膨張率が近似している
ことからGaAs基板上にスライドボート法による
液相エピタキシヤル成長により一般に結晶成長が
行われている。
[Prior art] Compound semiconductor mixed crystals such as Ga 1-x Al x As are used in various applications such as light emitting diodes and semiconductor lasers, and these mixed single crystals of GaAlAs have similar lattice constants. Crystals are generally grown on GaAs substrates by liquid-phase epitaxial growth using the slide boat method because of their similar thermal expansion coefficients.

しかし、これらエピタキシヤル結晶基板は、
Alの混晶比xが0.3程度と低いうちは特に問題な
いが、混晶比xが0.4以上と大きくなるにしたが
い、基板と成長結晶との間の熱膨張率の違いによ
る歪が現われ、結晶のそりが大きくなつてくる。
そして、それが著しいときは結晶にクラツクが入
り、使用できなくなる。しかも、混晶比率は、
0.5〜0.6と高いものが要求されてきている。
However, these epitaxial crystal substrates
There is no particular problem when the mixed crystal ratio x of Al is as low as about 0.3, but as the mixed crystal ratio x increases to 0.4 or more, distortion appears due to the difference in thermal expansion coefficient between the substrate and the growing crystal, The sled is getting bigger.
If this is significant, the crystal will crack and become unusable. Moreover, the mixed crystal ratio is
A value as high as 0.5 to 0.6 is being demanded.

又、GaAlAs単結晶を基板とした素子が望まれ
ているが、液相エピタキシヤル成長法では数百
μm以上の厚いGaAlAsウエハを得るのは難しく、
生産性が悪いこともあつて、工業化は極めて困難
であつた。
In addition, devices using GaAlAs single crystal as a substrate are desired, but it is difficult to obtain GaAlAs wafers with a thickness of several hundred μm or more using liquid phase epitaxial growth.
Industrialization was extremely difficult, partly due to poor productivity.

厚いウエハを製造する方法としては、引き上げ
法が適していると考えられるが、従来の引き上げ
技術では種々の問題があり、実用化は困難であつ
た。例えば、GaAlAs融液又はGaAlAsを溶解し
たGa溶液から単結晶を引き上げた場合(溶液
(Al)からの単結晶(Si)引き上げ方法に関して
は特開昭55−50619号公報に開示されている。)
GaAsに対するAlの偏析係数が大きいため、種結
晶側のAl混晶比が高く、結晶後端に行くほどAl
混晶比が低くなつてしまい、1つの単結晶インゴ
ツトから同じAl混晶比のウエハを得ることがで
きない。そこで、成長進行に伴なつて減少する
Al(又はGaAs及びAl)を補うために、GaAlAs
融液(又はGa溶液)の上部からAl(又はGaAl及
びAl)を供給する(原料を融液供給する方法に
関しては特公昭56−11675号公報に開示されてい
る。)ことが考えられる。しかし、融液からの成
長の場合、GaAlAs融液の減少に伴なつて供給す
るAlの量を徐々に減少させなければならないが、
Alの供給量を正確に制御することは至極困難で
あり、得られたインゴツト内の長さ方向のAl混
晶比は不均一になつてしまう。又Ga溶液からの
成長の場合、供給するGaAs及びAlが固体であつ
ても融液であつても、成長速度にあわせて補充し
なければならない量を連続的に常に一定して供給
するよう制御することは、現実には困難であり、
インゴツト内の長さ方向のAl混晶比の不均一化
は回避できない状況にあつた。
Although the pulling method is considered to be suitable as a method for manufacturing thick wafers, conventional pulling techniques have various problems and have been difficult to put into practical use. For example, when a single crystal is pulled from a GaAlAs melt or a Ga solution containing GaAlAs (a method for pulling a single crystal (Si) from a solution (Al) is disclosed in JP-A-55-50619).
Because the segregation coefficient of Al with respect to GaAs is large, the Al mixed crystal ratio on the seed crystal side is high, and the closer to the rear end of the crystal, the more Al
The mixed crystal ratio becomes low, and wafers with the same Al mixed crystal ratio cannot be obtained from one single crystal ingot. Therefore, it decreases as growth progresses.
GaAlAs to supplement Al (or GaAs and Al)
It is conceivable to supply Al (or GaAl and Al) from the upper part of the melt (or Ga solution) (a method of supplying raw materials to the melt is disclosed in Japanese Patent Publication No. 11675/1983). However, in the case of growth from melt, the amount of Al supplied must be gradually reduced as the GaAlAs melt decreases;
It is extremely difficult to accurately control the amount of Al supplied, and the Al mixed crystal ratio in the longitudinal direction within the obtained ingot becomes non-uniform. In addition, in the case of growth from a Ga solution, whether the GaAs and Al to be supplied are solid or melt, the amount that needs to be replenished according to the growth rate is controlled so that it is continuously and constantly supplied. In reality, it is difficult to
The situation was such that non-uniformity of the Al mixed crystal ratio in the longitudinal direction within the ingot could not be avoided.

[発明の目的] 本発明は上記した従来技術の問題点に鑑みなさ
れたものであり、Ga溶液から引き上げられる
GaAlAs混晶単結晶の長手(成長進行)方向にお
けるAl混晶比を一定にすることができ、しかも
混晶比が高いGaAlAs混晶単結晶を容易に且つ大
量に得ることができる結晶成長方法とその装置を
提供することを目的とする。
[Object of the Invention] The present invention has been made in view of the problems of the prior art described above.
A crystal growth method that can keep the Al mixed crystal ratio in the longitudinal (growth progress) direction of the GaAlAs mixed crystal single crystal constant, and that can easily obtain a large amount of GaAlAs mixed crystal single crystals with a high mixed crystal ratio. The purpose is to provide such equipment.

[発明の概要] 本発明の第1の特徴は、成長用Ga溶液を入れ
た温度制御可能な成長用Ga溶液槽にそれぞれ温
度制御可能なGaAs溶解槽及びAl溶解槽を連通さ
せて上記成長用Ga溶液槽及び上記GaAs溶解槽の
それぞれにも前記成長用Ga溶液が満たされるよ
うにし、上記成長用Ga溶液槽を一定温度に保持
しておき、上記各溶解槽内の上記成長用Ga溶液
にそれぞれ入れた原料GaAs及び原料Alをそれぞ
れ上記各溶解槽を所定の温度に加熱することによ
り上記成長用Ga溶液に溶解させて一定に供給し、
その後飽和状態に達した上記成長用Ga溶液槽内
の成長用Ga溶液に種結晶を接触させてGaAlAs
混晶単結晶を引き上げ成長させることにある。
[Summary of the Invention] The first feature of the present invention is that a temperature-controllable growth Ga solution tank containing a growth Ga solution is connected to a temperature-controllable GaAs melting tank and an Al melting tank, respectively. The Ga solution bath for growth and the GaAs dissolution bath are each filled with the Ga solution for growth, and the Ga solution bath for growth is maintained at a constant temperature. The raw material GaAs and raw material Al put in each are dissolved in the growth Ga solution by heating each of the melting tanks to a predetermined temperature, and are constantly supplied.
After that, the seed crystal is brought into contact with the Ga growth solution in the growth Ga solution bath which has reached the saturated state, and GaAlAs
The purpose is to pull and grow a mixed single crystal.

第2の特徴は、原料GaAs及び原料Alを溶解さ
せた飽和状態の成長用Ga溶液を入れるための成
長用Ga溶液槽と、該成長用Ga溶液槽を加熱する
第1ヒータと、上記成長用Ga溶液槽に連通され
て上記成長用Ga溶液が満たされるようにし且つ
上記原料GaAs及び上記原料Alをそれぞれ収容す
るためのGaAs溶解槽及びAl溶解槽と、該溶解槽
内の上記成長用Ga溶液に上記原料GaAs及び上記
原料Alを溶解させて一定に供給するために上記
各溶解槽をそれぞれ加熱する第2ヒータ及び第3
ヒータと、飽和状態に達した上記成長用Ga溶液
槽内の成長用Ga溶液に種結晶を接触させて
GaAlAs混晶単結晶を引き上げる引き上げ手段と
を具備したGaAlAs混晶単結晶成長装置としたこ
とにある。
The second feature is a growth Ga solution tank into which a saturated growth Ga solution containing raw material GaAs and raw material Al is dissolved, a first heater that heats the growth Ga solution tank, and A GaAs dissolving tank and an Al dissolving tank connected to a Ga solution tank to be filled with the growth Ga solution and for respectively accommodating the raw material GaAs and the raw material Al; and the growth Ga solution in the melting tank. A second heater and a third heater respectively heat the respective melting tanks in order to melt and constantly supply the raw material GaAs and the raw material Al.
A seed crystal is brought into contact with the heater and the growth Ga solution in the growth Ga solution tank that has reached a saturated state.
The object of the present invention is to provide a GaAlAs mixed single crystal growth apparatus equipped with a pulling means for pulling up a GaAlAs mixed single crystal.

ここで、本発明のGa溶液からのGaAlAs混晶
単結晶の製造方法について第1図に基づき説明す
る。
Here, the method for producing a GaAlAs mixed single crystal from a Ga solution according to the present invention will be explained based on FIG.

第1図はGa―Al―As系の相平衡図である。第
1図のA点は900℃における砒素濃度が0.1mol
%、溶液のAl濃度が5%のときに成長するGa1-x
AlxAsのAl混晶比xが0.2であることを示してい
る。
Figure 1 is a phase equilibrium diagram of the Ga-Al-As system. At point A in Figure 1, the arsenic concentration at 900℃ is 0.1 mol.
%, Ga 1-x grows when the Al concentration of the solution is 5%
This shows that the Al mixed crystal ratio x of Al x As is 0.2.

ここで、同じ温度において砒素濃度を増加して
いくと、Ga溶液中のAl濃度は減少していき、成
長するGa1-xAlxAsのAl混晶比xが増加していく
ことになる。
Here, as the arsenic concentration increases at the same temperature, the Al concentration in the Ga solution decreases, and the Al mixed crystal ratio x of the growing Ga 1-x Al x As increases. .

例えば、第1図のB点は、0.3mol%の砒素濃
度でAl濃度4%のとき成長するGa1-xAlxAsの混
晶比xが0.35になることを示している。このよう
に、成長結晶中のAl混晶比に比べ、溶液組成は
Al/As比が小さく、成長過程はAlの液相中の拡
散で律速される。
For example, point B in FIG. 1 indicates that the mixed crystal ratio x of Ga 1-x Al x As grown when the arsenic concentration is 0.3 mol % and the Al concentration is 4% is 0.35. In this way, compared to the Al mixed crystal ratio in the growing crystal, the solution composition is
The Al/As ratio is small, and the growth process is rate-limited by diffusion of Al in the liquid phase.

このAlの拡散は一般に次の(1),(2)で表される。 This diffusion of Al is generally expressed as (1) and (2) below.

∂N/∂t=D∂2N/∂x2 ……(1) D=Dpexp(−E/kT) ……(2) ここに、N:濃度、 t:時間、 x:拡散距離、 D:拡散係数、 Dp:0゜Kにおける拡散係数、 E:拡散のエネルギー、 k:ボルツマン係数、 T:絶対温度。 ∂N/∂t=D∂ 2 N/∂x 2 ...(1) D=D p exp(-E/kT) ...(2) Where, N: concentration, t: time, x: diffusion distance , D: diffusion coefficient, D p : diffusion coefficient at 0°K, E: energy of diffusion, k: Boltzmann coefficient, T: absolute temperature.

今、Alが溶液中でt秒間に距離Lだけ拡散に
よつて進んだとすれば、拡散係数Dは D=L2/t ……(3) で示される。(3)式を書き換えると、 L=√ ……(4) となり、拡散によつて進む距離Lは、拡散時間t
の平方根に比例する。
Now, if Al travels a distance L in t seconds by diffusion in the solution, the diffusion coefficient D is expressed as D=L 2 /t (3). Rewriting equation (3), L=√...(4), and the distance L traveled by diffusion is the diffusion time t
is proportional to the square root of

また、Ga−Al−As系の1000℃付近における拡
散エネルギーを5eVとすると、900℃と1000℃で
の拡散係数の比は、 D1273/D1173=Dpexp(−5/1273k)/Dpexp(−5
/1173k) =exp(5/1173k−5/1273k) ≒exp(2.56)≒13.0 となる。
Also, assuming that the diffusion energy of the Ga-Al-As system near 1000°C is 5 eV, the ratio of the diffusion coefficients at 900°C and 1000°C is D 1273 /D 1173 = D p exp (-5/1273k) / D pexp (−5
/1173k) =exp(5/1173k-5/1273k)≒exp(2.56)≒13.0.

従つて、Alの拡散速度を上げるには、Alを輸
送する帯域の温度を上昇させればよく、これによ
り大幅にAlの供給速度を増加することができ、
結晶成長速度を増すことができる。
Therefore, in order to increase the diffusion rate of Al, it is sufficient to increase the temperature of the zone where Al is transported, which can significantly increase the Al supply rate.
Crystal growth rate can be increased.

同様に、GaAsの輸送速度も温度を変化させる
ことにより変えることができる。
Similarly, the transport rate of GaAs can be changed by changing the temperature.

このように、Ga溶液に供給するGaAs及びAl
の量を制御することは可能であるがここで、特に
重要となるのは、Ga溶液に供給するGaAs及び
Alの量を連続的に一定にすることである。即ち、
Ga溶液にその上方からGaAs及びAlを供給する
場合等には、成長速度にあわせて連続的に常に一
定した量のGaAs及びAlを供給することは技術的
に至極困難であり、結晶の長手方向におけるAl
混晶比がばらついてしまうからである。
In this way, GaAs and Al supplied to the Ga solution
Although it is possible to control the amount of GaAs and
The goal is to keep the amount of Al continuously constant. That is,
When supplying GaAs and Al to a Ga solution from above, it is technically extremely difficult to continuously supply a constant amount of GaAs and Al in accordance with the growth rate. Al in
This is because the mixed crystal ratio varies.

そこで本発明では、Ga溶液を入れる成長用Ga
溶液槽にGaAs溶解槽及びAl溶解槽を連通させて
これら両溶解槽内にも成長用Ga溶液が満たされ
るようにし、この両溶解槽内の成長用Ga溶液に
GaAs及びAlを入れて各槽を所定の温度に設定す
ることにより、GaAs及びAlの拡散速度を利用し
てGa溶液にGaAs及びAlを連続的に常に一定し
て供給することができるようにしており、これに
よつて引き上げられたGaAlAs混晶単結晶の長手
方向におけるAl混晶比を均一にすることができ
る。
Therefore, in the present invention, a Ga solution for growth is introduced.
The GaAs dissolving tank and the Al dissolving tank are connected to the solution tank so that both of these melting tanks are also filled with the Ga solution for growth.
By placing GaAs and Al and setting each tank at a predetermined temperature, GaAs and Al can be continuously and constantly supplied to the Ga solution by utilizing the diffusion rate of GaAs and Al. As a result, the Al mixed crystal ratio in the longitudinal direction of the pulled GaAlAs mixed single crystal can be made uniform.

[実施例] 以下本発明の実施例について図示した第2図及
び第3図に基づき説明する。
[Example] Hereinafter, an example of the present invention will be described based on illustrated FIGS. 2 and 3.

第2図は本発明の混晶成長装置の一実施例を示
す概略構成図である。第2図において、1は成長
用Ga溶液槽、2はGaAs溶解槽、3はAl溶解槽、
4は結晶成長装置加熱ヒータ、5は成長用Ga溶
液槽加熱ヒータ、6はGaAs溶解槽加熱ヒータ、
7はAl溶解槽加熱ヒータ、8は成長GaAlAs混晶
単結晶、9は原料Al、10は成長用Ga溶液、1
1はGaAs結晶、12は種結晶、13はガス流入
口、14は熱電対で、成長用Ga溶液槽1とGaAs
溶解槽2およびAl溶解槽3とは図示のように連
通させてあり、両溶解槽2,3どちらにも成長用
Ga溶液10が適当量満たされるようにしてある。
FIG. 2 is a schematic diagram showing an embodiment of the mixed crystal growth apparatus of the present invention. In Fig. 2, 1 is a Ga solution tank for growth, 2 is a GaAs dissolution tank, 3 is an Al dissolution tank,
4 is a crystal growth device heater, 5 is a growth Ga solution tank heater, 6 is a GaAs melting tank heater,
7 is an Al melting tank heater, 8 is a growing GaAlAs mixed single crystal, 9 is a raw material Al, 10 is a Ga solution for growth, 1
1 is a GaAs crystal, 12 is a seed crystal, 13 is a gas inlet, 14 is a thermocouple, and the Ga solution tank 1 for growth and GaAs
The melting tank 2 and the Al melting tank 3 are connected as shown in the figure, and both melting tanks 2 and 3 are connected to each other for growth.
An appropriate amount of Ga solution 10 is filled.

このような構成の装置において、成長用Ga溶
液10の温度を適宜設定し、またGaAs11及び
Al9の供給量が所定値になるようGaAs溶解槽加
熱ヒータ6及びAl溶解槽加熱ヒータ7の温度を
所定の温度に設定し、成長用Ga溶液10中の各
成分濃度が平衡状態になつた時点で種結晶を接触
させ適宜設定した引き上げ速度で引き上げること
により、目的混晶比xのGa1-xAlxAs混晶単結晶
を容易に得ることができる。
In an apparatus having such a configuration, the temperature of the Ga growth solution 10 is set appropriately, and the temperature of the GaAs 11 and
The temperature of the GaAs melting tank heater 6 and the Al melting tank heater 7 is set to a predetermined temperature so that the supply amount of Al9 becomes a predetermined value, and the time point when the concentration of each component in the growth Ga solution 10 reaches an equilibrium state. A Ga 1-x Al x As mixed single crystal having the target mixed crystal ratio x can be easily obtained by bringing the seed crystal into contact with the crystal and pulling it at an appropriately set pulling rate.

例えば、種結晶としてGaAs単結晶を用いた場
合、GaAlAs混晶単結晶の長手方向のAl混晶比X
は、第3図に示すようになる。第3図において、
横軸は種結晶(シード側)から単結晶後端(テイ
ル側)方向への距離:lであり、縦軸はAl混晶
比:Xを示す。種結晶がGaAsであるため、成長
開始直後はAl混晶比Xは低いが、その後Ga溶液
中に溶解しているAlの量が多く、且つAlの偏析
係数が大きいためAl混晶比Xは増加し、得よう
とするAl混晶比よりも一亘高くなる。しかし、
Alの供給量が一定であるため、次第にAlの混晶
比は低下し(ここまでが非安定領域)、その後混
晶比の変化は安定し一定になる。
For example, when a GaAs single crystal is used as a seed crystal, the Al mixed crystal ratio in the longitudinal direction of the GaAlAs mixed single crystal is
is as shown in FIG. In Figure 3,
The horizontal axis represents the distance from the seed crystal (seed side) to the rear end (tail side) of the single crystal, and the vertical axis represents the Al mixed crystal ratio: X. Since the seed crystal is GaAs, the Al mixed crystal ratio X is low immediately after the start of growth, but after that the Al mixed crystal ratio The Al mixed crystal ratio increases and becomes even higher than the desired Al mixed crystal ratio. but,
Since the supply amount of Al is constant, the Al mixed crystal ratio gradually decreases (this is the unstable region), and then the change in the mixed crystal ratio becomes stable and constant.

実施例 1 種結晶12として<100>方向に結晶軸をもつ
5mm×5mm×80mmのGaAs単結晶を使用し、Ga2
Kg、GaAs多結晶600g並びにAl200gをそれぞれ
成長用Ga溶液槽1、GaAs溶解槽2、Al溶解槽
3にチヤージし、ガス流入口13より水素ガスを
流しながら、各槽1〜3の加熱ヒータ5〜7によ
り各槽1〜3の加熱を行い、種結晶12の直下が
900℃、Al溶解槽3が1000℃、GaAs溶解槽2が
920℃になるように温度調整を行い、各槽1〜3
の温度が安定したところで、種結晶12である
GaAs結晶を下げて飽和状態の成長用Ga溶液10
に接触させる。そして、単結晶の成長の様子を見
ながら種結晶12を徐々に引き上げる。このと
き、定常状態での引き上げ速度は約10mm/hであ
つた。
Example 1 A 5 mm x 5 mm x 80 mm GaAs single crystal with a crystal axis in the <100> direction was used as the seed crystal 12, and Ga2
Kg, 600 g of GaAs polycrystal, and 200 g of Al were charged to the growth Ga solution tank 1, GaAs dissolving tank 2, and Al dissolving tank 3, respectively, and while flowing hydrogen gas from the gas inlet 13, the heaters 5 of each tank 1 to 3 were charged. -7, each tank 1-3 is heated, and the temperature immediately below the seed crystal 12 is heated.
900℃, Al melting tank 3 is 1000℃, GaAs melting tank 2 is
The temperature was adjusted to 920℃, and each tank 1 to 3
When the temperature of is stabilized, the seed crystal 12
Ga solution for growth in saturated state by lowering GaAs crystal 10
contact with. Then, the seed crystal 12 is gradually pulled up while observing the growth of the single crystal. At this time, the pulling speed in steady state was about 10 mm/h.

このような条件により直径50mm、長さ40mmの
GaAlAs混晶単結晶を得ることができた。
Due to these conditions, a diameter of 50mm and a length of 40mm
We were able to obtain a GaAlAs mixed single crystal.

尚、このときのAl混晶比Xは0.65であり、結晶
の長手方向に亘つて均一であつた。また、Alお
よびGaAsは結晶成長が終了するまで、融液およ
び結晶として十分過剰に存在していた。
Incidentally, the Al mixed crystal ratio X at this time was 0.65, and was uniform over the longitudinal direction of the crystal. Furthermore, Al and GaAs existed in sufficient excess in the form of melt and crystals until the end of crystal growth.

実施例 2 種結晶(GaAs結晶)、Ga、GaAs多結晶、原料
Alは実施例1の場合と同様とし、また、種結晶
12の直下およびGaAs溶解槽2の温度も実施例
1と同様とし、Al溶解槽3の温度のみ960℃に変
えた。この場合は、結晶成長速度は約半分とな
り、直径が40mm、長さが45mmの単結晶を得ること
ができた。
Example 2 Seed crystal (GaAs crystal), Ga, GaAs polycrystal, raw material
Al was the same as in Example 1, and the temperature directly below the seed crystal 12 and in the GaAs melting tank 2 was also the same as in Example 1, with only the temperature of the Al melting tank 3 being changed to 960°C. In this case, the crystal growth rate was about half, and a single crystal with a diameter of 40 mm and a length of 45 mm could be obtained.

尚、この時のAl混晶比Xは約0.4であり、結晶
の長手方向に亘つて均一であつた。
Note that the Al mixed crystal ratio X at this time was about 0.4, and was uniform over the longitudinal direction of the crystal.

実施例 3 Al溶解槽3の温度をGaAs溶解槽2と同じ920
℃に設定した以外は実施例1と同様とし、成長用
Ga溶液10の温度を900℃、引き上げ速度を3
mm/hとした場合には、直径が50mm、長さが60mm
の単結晶を得ることができた。尚、このときの
Al混晶比Xは0.2であり、結晶の長手方向に亘つ
て均一であつた。
Example 3 The temperature of Al melting tank 3 is the same as that of GaAs melting tank 2 at 920°C.
The procedure was the same as in Example 1 except that the temperature was set at ℃.
Temperature of Ga solution 10 is 900℃, pulling speed is 3
In the case of mm/h, the diameter is 50 mm and the length is 60 mm.
We were able to obtain a single crystal of Furthermore, at this time
The Al mixed crystal ratio X was 0.2 and was uniform over the longitudinal direction of the crystal.

このように、各実施例によれば、Al混晶比が
高いGaAlAs混晶単結晶をその長手方向に亘つて
Al混晶比を均一にして、容易に且つ大量に製造
することができ、更に、成長用Ga溶液は消費が
ないため、汚れがない限り何回でも使用すること
ができた。
As described above, according to each embodiment, a GaAlAs mixed single crystal with a high Al mixed crystal ratio is formed in the longitudinal direction.
By making the Al mixed crystal ratio uniform, it could be easily produced in large quantities, and since the Ga solution for growth was not consumed, it could be used as many times as needed as long as it did not become contaminated.

[発明の効果] 以上に説明したように、本発明のGaAlAs混晶
単結晶成長方法をその装置によれば、成長用Ga
溶液槽に連通させたGaAs溶解槽及びAl溶解槽に
も成長用Ga溶液が適当量満たされるようにして、
成長用Ga溶液に原料となるGaAs及びAlをそれ
らの拡散により連続的に常に一定して供給するよ
うにしたことにより、Al混晶比が高くとも結晶
の長手方向に亘つてAl混晶比が均一なGaAlAs混
晶単結晶を容易に且つ大量に得ることができると
いう顕著な効果を有する。
[Effects of the Invention] As explained above, according to the GaAlAs mixed single crystal growth method of the present invention and its apparatus, GaAlAs for growth can be
The GaAs dissolving tank and Al dissolving tank connected to the solution tank are also filled with an appropriate amount of Ga solution for growth.
By continuously and constantly supplying the raw materials GaAs and Al to the growth Ga solution by their diffusion, even if the Al mixed crystal ratio is high, the Al mixed crystal ratio remains constant over the longitudinal direction of the crystal. It has the remarkable effect that uniform GaAlAs mixed single crystals can be easily obtained in large quantities.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はGa―Al―As系の相平衡図、第2図は
本発明の結晶成長装置の一実施例を示す概略構成
図、第3図は単結晶の長さ方向のAl混晶比の変
化を示す説明図である。 1:成長用Ga溶液槽、2:GaAs溶解槽、3:
Al溶解槽、4:結晶成長装置加熱ヒータ、5:
成長用Ga溶液槽加熱ヒータ、6:GaAs溶解槽加
熱ヒータ、7:Al溶解槽加熱ヒータ、8:成長
GaAlAs混晶単結晶、9:原料Al、10:成長用
Ga溶液、11:GaAs多結晶、12:種結晶、1
3:ガス流入口、14:熱電対。
Figure 1 is a phase equilibrium diagram of the Ga-Al-As system, Figure 2 is a schematic configuration diagram showing an embodiment of the crystal growth apparatus of the present invention, and Figure 3 is the Al mixed crystal ratio in the longitudinal direction of the single crystal. FIG. 1: Ga solution tank for growth, 2: GaAs dissolution tank, 3:
Al melting tank, 4: Crystal growth device heater, 5:
Ga solution tank heater for growth, 6: GaAs melting tank heater, 7: Al melting tank heater, 8: Growth
GaAlAs mixed single crystal, 9: Raw material Al, 10: For growth
Ga solution, 11: GaAs polycrystal, 12: seed crystal, 1
3: Gas inlet, 14: Thermocouple.

Claims (1)

【特許請求の範囲】 1 原料GaAs及び原料Alを溶解させた飽和状態
の成長用Ga溶液に種結晶を接触させてGaAlAs
混晶単結晶を引き上げ成長させる方法において、
前記成長用Ga溶液を入れた温度制御可能な成長
用Ga溶液槽にそれぞれ温度制御可能なGaAs溶解
槽及びAl溶解槽を連通させて前記成長用Ga溶液
槽及び前記GaAs溶解槽のそれぞれにも前記成長
用Ga溶液が満たされるようにし、前記成長用Ga
溶液槽を一定温度に保持しておき、前記各溶解槽
内の前記成長用Ga溶液にそれぞれ入れた前記原
料GaAs及び前記原料Alをそれぞれ前記各溶解槽
を所定の温度に加熱することにより前記成長用
Ga溶液に溶解させて一定に供給し、その後飽和
状態に達した前記成長用Ga溶液槽内の成長用Ga
溶液に前記種結晶を接触させてGaAlAs混晶単結
晶を引き上げ成長させることを特徴とする
GaAlAs混晶単結晶成長方法。 2 原料GaAs及び原料Alを溶解させた飽和状態
の成長用Ga溶液を入れるための成長用Ga溶液槽
と、該成長用Ga溶液槽を加熱する第1ヒータと、
前記成長用Ga溶液槽に連通されて前記成長用Ga
溶液が満たされるようにし且つ前記原料GaAs及
び前記原料Alをそれぞれ収容するためのGaAs溶
解槽及びAl溶解槽と、該溶解槽内の前記成長用
Ga溶液に前記原料GaAs及び前記原料Alを溶解
させて一定に供給するために前記各溶解槽をそれ
ぞれ加熱する第2ヒータ及び第3ヒータと、飽和
状態に達した前記成長用Ga溶液槽内の成長用Ga
溶液に種結晶を接触させてGaAlAs混晶単結晶を
引き上げる引き上げ手段とを具備することを特徴
とするGaAlAs混晶単結晶成長装置。
[Claims] 1. GaAlAs is grown by bringing a seed crystal into contact with a saturated Ga growth solution in which raw material GaAs and raw material Al are dissolved.
In the method of pulling and growing a mixed single crystal,
A temperature-controllable GaAs dissolving tank and an Al dissolving tank are connected to the temperature-controllable growth Ga solution tank containing the growth Ga solution, so that the growth Ga solution tank and the GaAs dissolving tank are also connected to each other. The growth Ga solution is filled with the growth Ga solution.
The solution baths are maintained at a constant temperature, and the raw material GaAs and the raw material Al, which are respectively put into the growth Ga solution in each of the melting tanks, are heated to a predetermined temperature to cause the growth. for
Ga for growth is dissolved in a Ga solution and supplied constantly, and then the growth Ga in the growth Ga solution bath reaches a saturated state.
A GaAlAs mixed single crystal is pulled and grown by bringing the seed crystal into contact with a solution.
GaAlAs mixed single crystal growth method. 2. A growth Ga solution tank for containing a saturated growth Ga solution in which raw material GaAs and raw material Al are dissolved, and a first heater that heats the growth Ga solution tank;
The growth Ga solution tank is connected to the growth Ga solution tank.
A GaAs dissolving tank and an Al dissolving tank filled with a solution and accommodating the raw material GaAs and the raw material Al, respectively, and the growth tank in the melting tank.
A second heater and a third heater respectively heat the respective melting tanks in order to dissolve and constantly supply the raw material GaAs and the raw material Al in the Ga solution, and Ga for growth
1. A device for growing a GaAlAs mixed single crystal, comprising a pulling means for bringing a seed crystal into contact with a solution to pull up a GaAlAs mixed single crystal.
JP15873383A 1983-08-30 1983-08-30 GaAlAs mixed single crystal growth method and device Granted JPS6051693A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15873383A JPS6051693A (en) 1983-08-30 1983-08-30 GaAlAs mixed single crystal growth method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15873383A JPS6051693A (en) 1983-08-30 1983-08-30 GaAlAs mixed single crystal growth method and device

Publications (2)

Publication Number Publication Date
JPS6051693A JPS6051693A (en) 1985-03-23
JPS6357398B2 true JPS6357398B2 (en) 1988-11-11

Family

ID=15678138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15873383A Granted JPS6051693A (en) 1983-08-30 1983-08-30 GaAlAs mixed single crystal growth method and device

Country Status (1)

Country Link
JP (1) JPS6051693A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01178440U (en) * 1988-06-08 1989-12-20
WO1992001826A1 (en) * 1990-07-26 1992-02-06 Sumitomo Electric Industries, Ltd. Method and apparatus for making single crystal

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5550619A (en) * 1978-10-11 1980-04-12 Toshiba Corp Manufacturing single crystal
JPS5611675A (en) * 1979-07-04 1981-02-05 Marantz Japan Inc Key-touch strength changing circuit for automatic playing piano

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01178440U (en) * 1988-06-08 1989-12-20
WO1992001826A1 (en) * 1990-07-26 1992-02-06 Sumitomo Electric Industries, Ltd. Method and apparatus for making single crystal
EP0494312B1 (en) * 1990-07-26 1996-10-09 Sumitomo Electric Industries, Ltd. Method and apparatus for making single crystal

Also Published As

Publication number Publication date
JPS6051693A (en) 1985-03-23

Similar Documents

Publication Publication Date Title
US5030315A (en) Methods of manufacturing compound semiconductor crystals and apparatus for the same
Hoshikawa et al. Liquid encapsulated, vertical bridgman growth of large diameter, low dislocation density, semi-insulating GaAs
EP0751242B1 (en) Process for bulk crystal growth
JP2009149452A (en) Semiconductor crystal growth method
JPS6357398B2 (en)
US20090139445A1 (en) Device for Fabricating a Ribbon of Silicon or Other Crystalline Materials and Method of Fabrication
EP0102054A1 (en) Method for growing GaAs single crystal by using floating zone
US4853066A (en) Method for growing compound semiconductor crystal
US4565156A (en) Apparatus for performing solution growth relying on temperature difference technique
JPH07165488A (en) Crystal growth apparatus and crystal growth method
JP4576571B2 (en) Method for producing solid solution
JPS63144191A (en) Compound semiconductor single crystal manufacturing method and equipment
JPS626338B2 (en)
JPS60204692A (en) Preparation of cdte crystal
JPS62171986A (en) Production of single crystal
JP2781857B2 (en) Single crystal manufacturing method
JPS6051697A (en) Compound semiconductor manufacturing method
JP2885452B2 (en) Boat growth method for group III-V compound crystals
JPS6065799A (en) Process for crystal growth
JPS61132588A (en) Production of compound single crystal
JPH0631192B2 (en) Method and apparatus for manufacturing semiconductor single crystal
JPH0559880B2 (en)
JPH03232789A (en) Apparatus for growing semiconductor crystal
JPS61174189A (en) Method and device for production of single crystal
JPS6229394B2 (en)