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JPS6358389B2 - - Google Patents
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JPS6358389B2 - - Google Patents

Info

Publication number
JPS6358389B2
JPS6358389B2 JP56137330A JP13733081A JPS6358389B2 JP S6358389 B2 JPS6358389 B2 JP S6358389B2 JP 56137330 A JP56137330 A JP 56137330A JP 13733081 A JP13733081 A JP 13733081A JP S6358389 B2 JPS6358389 B2 JP S6358389B2
Authority
JP
Japan
Prior art keywords
type
refractive index
semiconductor layer
semiconductor
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56137330A
Other languages
Japanese (ja)
Other versions
JPS5839086A (en
Inventor
Yutaka Mihashi
Shoichi Kakimoto
Toshio Sogo
Saburo Takamya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP13733081A priority Critical patent/JPS5839086A/en
Publication of JPS5839086A publication Critical patent/JPS5839086A/en
Publication of JPS6358389B2 publication Critical patent/JPS6358389B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/2054Methods of obtaining the confinement
    • H01S5/2059Methods of obtaining the confinement by means of particular conductivity zones, e.g. obtained by particle bombardment or diffusion
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure

Landscapes

  • Semiconductor Lasers (AREA)

Description

【発明の詳細な説明】 この発明は縦マルチモードで発振するストライ
プ形半導体レーザ装置に係り、特にその非点収差
(アステイグマ)を改善するために構造にす関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a striped semiconductor laser device that oscillates in longitudinal multi-mode, and particularly to a structure for improving astigmatism.

近年、半導体レーザ装置の発展は著しく、特に
屈折率ガイドを有する様々なストライプ構造で横
シングルモードはもちろん、縦シングルモード発
振が実現され、光通信等の分野で実用期に入りつ
つある。しかし、縦シングルモード発振では戻り
光の干渉によつて、ノイズが発生しやすいこと、
また、温度変化の際の縦モード遷移時に著しいモ
ード競合雑音が発生することなどの問題点があ
り、特に、ビデオデイスク、オーデイオデイスク
など広い温度範囲で使用される民生用分野では、
縦シングルモードレーザよりも、これらの現象が
発生しにくい縦マルチモード発振をする半導体レ
ーザ装置の方が適していると言われている。
In recent years, semiconductor laser devices have made remarkable progress, and in particular, not only transverse single mode but also longitudinal single mode oscillation has been realized with various striped structures having refractive index guides, and they are entering a period of practical use in fields such as optical communications. However, in longitudinal single mode oscillation, noise is likely to occur due to interference of returned light.
Additionally, there are problems such as significant mode competition noise occurring during longitudinal mode transitions due to temperature changes, especially in the consumer field where video disks, audio disks, etc. are used over a wide temperature range.
It is said that a semiconductor laser device that performs longitudinal multi-mode oscillation, in which these phenomena are less likely to occur, is more suitable than a longitudinal single-mode laser.

一方、縦マルチモード発振をする半導体レーザ
装置の構造としては、屈折率ガイドを持たない
種々な構造のストライプ形レーザ装置が知られて
いる。しかし、このようなストライプ形レーザ装
置では活性層に平行な方向には光はゲインガイド
によつてガイデイングされる(以下「ゲインガイ
ド形レーザ」という。)ので、波面が曲がり、活
性層と垂直な方向に広がつて出てくるレーザ光に
比較して仮想的な放射位置がずれる、いわゆる非
点収差が生ずる。ビデオデイスク、デイジタルオ
ーデイオデイスクなどレーザ光をレンズで絞つて
使用する用途には、この非点収差は好ましくな
い。非点収差があると、光を有効に絞るには円柱
レンズなどの特殊なレンズを使用せねばならない
からである。しかも、円柱レンズを使用するにし
ても、非点収差は素子の製造条件に微妙に依存
し、再現性が乏しいので、色々な規格のレンズを
準備する必要があり、実際上円柱レンズで非点収
差を補償することは困難であつた。
On the other hand, as structures of semiconductor laser devices that perform longitudinal multimode oscillation, striped laser devices having various structures without a refractive index guide are known. However, in such a striped laser device, the light is guided by a gain guide in the direction parallel to the active layer (hereinafter referred to as a "gain guide laser"), so the wavefront is curved and the light is guided in the direction parallel to the active layer. A so-called astigmatism occurs in which the virtual radiation position is shifted compared to the laser beam that is emitted and spread in the direction. This astigmatism is undesirable for applications such as video disks and digital audio disks in which laser light is focused by a lens. This is because astigmatism requires the use of a special lens such as a cylindrical lens in order to effectively focus the light. Moreover, even if a cylindrical lens is used, astigmatism slightly depends on the manufacturing conditions of the element and has poor reproducibility, so it is necessary to prepare lenses of various standards, and in practice, astigmatism is caused by a cylindrical lens. It was difficult to compensate for aberrations.

この発明は以上のような点に鑑みてなされたも
ので、ゲインガイド形ストライプレーザ装置に、
そのレーザ光放出路にレーザ活性層と平行方向に
不純物濃度の変化をもたせることによつて構成し
た屈折率ガイドを一体に形成することによつて非
点収差の小さい半導体装置を実現することを目的
としている。
This invention was made in view of the above points, and includes a gain guide type stripe laser device.
The purpose is to realize a semiconductor device with small astigmatism by integrally forming a refractive index guide configured by changing the impurity concentration in the laser light emission path in a direction parallel to the laser active layer. It is said that

第1図はこの発明の一実施例を示す斜視図で、
1はn形ガリウム・ヒ素(GaAs)基板、2,3
および4はそれぞれn形GaAs基板1の主面上に
液相エピタキシヤル成長技術を用いて順次積層す
るように成長されたn形アルミニウム・ガリウ
ム・ヒ素(AlxGa1-xAs)層、p形AlyGa1-yAs活
性層、およびp形AlxGa1-xAs層であり、1>x
>yであり、n形AlxGa1-xAs層2およびp形Alx
Ga1-xAs層4の屈折率がp形AlyGa1-yAs活性層
3の屈折率より十分小さくなるようにxおよびy
の値が選ばれている。5はp形AlxGa1-xAs層4
の上に形成されたn形GaAs層、6はn形GaAs
層5の表面部の図にAで示す一部にストライプ状
に、p形AlxGa1-xAs層4に達しないように形成
された溝、7はn形GaAs層5の表面部の図示A
部に溝7の内表面を含めて亜鉛(Zn)の拡散に
よつて形成された浅いp形拡散層、8は図示部分
Aと少し間隔を置いた部分Bの上記ストライプ状
の溝6の延長部分を除いた部分にn形GaAs層5
の表面から少なくともn形AlxGa1-xAs層2に達
するようにZnを高濃度に拡散して形成したp+
拡散層、9はn形GaAs基板1の裏面に形成され
たn側電極である。
FIG. 1 is a perspective view showing an embodiment of this invention.
1 is an n-type gallium arsenide (GaAs) substrate, 2, 3
and 4 are n-type aluminum gallium arsenide ( Al type Al y Ga 1-y As active layer, and p-type Al x Ga 1-x As layer, where 1>x
>y, n-type Al x Ga 1-x As layer 2 and p-type Al x
x and y such that the refractive index of the Ga 1-x As layer 4 is sufficiently smaller than the refractive index of the p-type Al y Ga 1-y As active layer 3.
The value of is selected. 5 is p-type Al x Ga 1-x As layer 4
n-type GaAs layer formed on top, 6 is n-type GaAs
Grooves 7 are formed in stripes in a part of the surface of the layer 5 shown as A in the figure, so as not to reach the p-type Al x Ga 1-x As layer 4 . Illustration A
8 is a shallow p-type diffusion layer formed by diffusion of zinc (Zn) including the inner surface of the groove 7, and 8 is an extension of the above-mentioned striped groove 6 in a portion B slightly spaced from the illustrated portion A. n-type GaAs layer 5 except for the
A p + -type diffusion layer formed by diffusing Zn at a high concentration so as to reach at least the n-type Al x Ga 1-x As layer 2 from the surface of the n-type GaAs substrate 1; It is an electrode.

第2図は第1図の−線における断面図で、
図示のようにp形拡散層7は溝6の底の部分では
p形AlxGa1-xAs層4に接している。なお、10
は溝6の内部およびp形拡散層7の上面にわたつ
て形成されたp側電極である。なお、第1図では
煩雑を避けるためにp側電極10を省略してい
る。
Figure 2 is a sectional view taken along the - line in Figure 1.
As shown in the figure, the p-type diffusion layer 7 is in contact with the p-type Al x Ga 1-x As layer 4 at the bottom of the trench 6 . In addition, 10
is a p-side electrode formed inside the groove 6 and over the upper surface of the p-type diffusion layer 7. In addition, in FIG. 1, the p-side electrode 10 is omitted to avoid complexity.

さて、この実施例装置において、p側電極10
とn側電極9との間に前者が正極性になるように
電圧を印加すると電流は、第2図に破線矢印で示
すようにストライプ状溝6の直下およびその近傍
にのみ集中して流れ、この電流によつて電子がn
形AlxGa1-xAs層2からp形AlyGa1-yAs活性層3
のストライプ状溝6の直下近傍のみに注入され、
この部分で電子・正孔の再結合発光が生じる。そ
こで、このような構造において、ストライプ状溝
6を適当な幅に設計し、電流を十分増加させれ
ば、活性層3と平行な方向にはゲインによつてガ
イデイングされたゲインガイド形のレーザ発振が
生じることはよく知られている。そして、ゲイン
ガイド形のレーザ発振モードは、一般にストライ
プ幅を充分狭くすれば、横モードはシングルモー
ドになるが、縦モードはマルチモード発振とな
る。
Now, in this example device, the p-side electrode 10
When a voltage is applied between the n-side electrode 9 and the n-side electrode 9 so that the former has positive polarity, the current flows concentrated only directly under and in the vicinity of the striped groove 6, as shown by the broken line arrow in FIG. This current causes electrons to
Type Al x Ga 1-x As layer 2 to p-type Al y Ga 1-y As active layer 3
is injected only in the vicinity directly below the striped groove 6,
In this part, electrons and holes recombine and emit light. Therefore, in such a structure, if the striped grooves 6 are designed to have an appropriate width and the current is sufficiently increased, gain-guided laser oscillation will occur in the direction parallel to the active layer 3. It is well known that this occurs. In the gain-guided laser oscillation mode, generally, if the stripe width is made sufficiently narrow, the transverse mode becomes a single mode, but the longitudinal mode becomes a multi-mode oscillation.

ところで、この発明の実施例では第1図に示し
たように、上記ゲインガイド形レーザ構造を基体
全領域には形成せず、レーザ発振のスレシヨルド
電流やあまり増大しない程度の長さになるように
図示部分Aにとどめている。そして、残りの部分
の内、部分Bには、上述の部分Aのゲインガイド
形レーザの共振器の延長部分を残すような形状で
その両側にp+形拡散層8が形成されている。こ
れによつて、この領域の活性層3における横方向
のp形不純物濃度分布はp+−p−p+構造となる。
第3図aおよびbは第1図の−線で切つた場
合のその切断面における活性層3内の横方向不純
物濃度分布およびこれに伴なう横方向の屈折率分
布をそれぞれ模式的に示す図である。p+形部分
の不純物濃度を約1×1019cm-3、p形部分(活性
層自体)の不純物濃度を1×1017cm-3程度に設定
すれば、p+形部分の屈折率α1とp形部分の屈折
率α2との差Δαは約0.02となる。従つて、p+−p
−p+構造は屈折率ガイドとして十分働き、活性
層3と平行方向にも光とじ込め効果を有し、p形
領域が導波路として働くことになる。
By the way, in the embodiment of the present invention, as shown in FIG. 1, the gain guide type laser structure is not formed over the entire area of the base, but is formed to have a length that does not increase the threshold current of laser oscillation. It is limited to the illustrated part A. Of the remaining parts, part B has p + -type diffusion layers 8 formed on both sides thereof in a shape that leaves an extension of the resonator of the gain-guided laser in part A described above. As a result, the lateral p-type impurity concentration distribution in the active layer 3 in this region has a p + -p-p + structure.
Figures 3a and 3b schematically show the lateral impurity concentration distribution and the lateral refractive index distribution in the active layer 3 at the cut plane taken along the - line in Figure 1, respectively. It is a diagram. If the impurity concentration of the p + type part is set to about 1 x 10 19 cm -3 and the impurity concentration of the p type part (active layer itself) to about 1 x 10 17 cm -3 , then the refractive index α of the p + type part The difference Δα between the refractive index α 1 and the refractive index α 2 of the p-type portion is approximately 0.02. Therefore, p + −p
The -p + structure sufficiently functions as a refractive index guide and has a light trapping effect even in the direction parallel to the active layer 3, so that the p-type region functions as a waveguide.

第4図はこの屈折率ガイド部分Bが非点収差を
改善する効果を説明する部分平面図で、第4図a
は屈折率ガイド部分Bのない従来のゲインガイド
形レーザ装置における共振器端面近傍でのレーザ
光の波面および光の広がりを示し、第4図bはこ
の発明の実施例における共振器端面近傍から導波
路出力近傍に至るレーザ光の波面および光の広が
りを示す。第4図aから判るように、従来のゲイ
ンガイド形レーザ装置では共振器端面近くで波面
(破線で示す)が次第に曲がり、さらに光とじ込
め効果が弱く、端面よりかなり奥から出る光もレ
ーザ光として寄与するので、レーザ光は共振器端
面より距離dだけ奥から放射されるように見え
る。ところが、第4図bに示すように、この発明
の実施例の構造では、ゲインガイド形レーザ部分
Aから屈折率ガイド部Bに入つた波面の曲つた光
はガイドの外部にも一部しみ出し、この部分では
ガイド内部よりも屈折率が小さく光の速度が速い
ので、位相面は次第にまつすぐ修正されて行く。
従つて、屈折率ガイドB内部でも波面は次第にま
つすぐになり、屈折率ガイド部Bの長さを適当に
設計すれば、端面付近で波面をまつすぐに修整す
ることができる。さらに、この実施例例装置で
は、従来のゲインガイド形レーザ装置と異なり、
端面よりかなり奥から斜め方向に出る光は、p+
型領域8で吸収されて外部へ出て来なくなること
もあり、レーザ光の放射源位置は屈折率ガイド部
B(導波路)の端面のごとく近傍(例えば図示e
程度の差異)となる。
FIG. 4 is a partial plan view illustrating the effect of this refractive index guide portion B on improving astigmatism, and FIG.
4b shows the wavefront of laser light and the spread of light near the resonator end face in a conventional gain guide type laser device without the refractive index guide portion B, and FIG. It shows the wavefront of laser light and the spread of light reaching the vicinity of the wavepath output. As can be seen from Figure 4a, in the conventional gain guide type laser device, the wavefront (indicated by the broken line) gradually curves near the cavity end face, and the light confinement effect is weaker, and the light emitted from far deeper than the end face also becomes laser light. Therefore, the laser light appears to be emitted from a distance d deeper than the cavity end face. However, as shown in FIG. 4b, in the structure of the embodiment of the present invention, the light with a curved wavefront that enters the refractive index guide part B from the gain guide type laser part A partially leaks out of the guide. In this part, the refractive index is smaller and the speed of light is faster than in the inside of the guide, so the phase front is gradually and directly corrected.
Therefore, the wavefront becomes gradually straighter even inside the refractive index guide B, and if the length of the refractive index guide portion B is appropriately designed, the wavefront can be straightened quickly near the end face. Furthermore, in this example device, unlike a conventional gain guide type laser device,
Light emitted diagonally from far deeper than the end face is p +
It may be absorbed in the mold region 8 and not come out to the outside, so the laser beam radiation source position is near the end face of the refractive index guide part B (waveguide) (for example, e in the figure).
difference in degree).

一方、活性層3と垂直方向にはダブルヘテロ構
造の屈折率ガイドでガイデイングされているた
め、レーザ光の放射源位置はやはり導波路の端面
にあるので、活性層3に対して垂直方向と平行方
向との各放射源位置はほぼ一致し、非点収差は生
じないことになる。
On the other hand, since the direction perpendicular to the active layer 3 is guided by a double heterostructure refractive index guide, the radiation source position of the laser beam is still at the end face of the waveguide, so it is parallel to the direction perpendicular to the active layer 3. The directions and the positions of the radiation sources almost match, and no astigmatism occurs.

上記実施例においては、GaAs−AlGaAs系の
材料を用いた例を示したが、インジウム・リン
(InP)−インジウム・ガリウム・ヒ素・リン
(InGaAsP)系の材料を用いた半導体レーザ装置
にもこの発明は適用できる。また、実施例のよう
に電流狭窄方法を用いたもの以外のすべてのゲイ
ンガイド形ストライプ構造のレーザ装置について
もこの発明は適用できる。
In the above embodiment, an example using a GaAs-AlGaAs-based material was shown, but this method can also be applied to a semiconductor laser device using an indium phosphide (InP)-indium gallium arsenic phosphorus (InGaAsP) material. The invention is applicable. Further, the present invention is applicable to all laser devices having a gain guide type stripe structure other than those using the current confinement method as in the embodiment.

以上詳述したように、この発明になる半導体レ
ーザ装置では、一つの半導体基体内に縦マルチモ
ード発振をするゲインガイド形ストライプレーザ
領域と、このストライプレーザ領域で発振し放射
される光の曲つた波面を修正しまつ直ぐにする屈
折率ガイド領域とを一体に形成したので、温度変
動時の遷移ノイズが少なく、しかも非点収差も少
なく、レーザ発振出力を有効に取り出せる新規な
半導体レーザ装置が実現できる。
As detailed above, the semiconductor laser device of the present invention includes a gain guide type striped laser region that performs longitudinal multi-mode oscillation in one semiconductor substrate, and a curved shape of the light oscillated and emitted from this striped laser region. Since it is integrated with the refractive index guide region that corrects and straightens the wavefront, it is possible to create a new semiconductor laser device that has less transition noise during temperature fluctuations, less astigmatism, and can effectively extract laser oscillation output. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例を示す斜視図、第
2図は第1図の−線における断面図、第3図
aおよびbはそれぞれ第1図の−線で切つた
場合のその切断面における活性層内の横方向不純
物濃度分布およびこれに伴なう横方向の屈折率分
布を模式的に示す図、第4図は屈折率ガイド部分
が非点収差を改善する効果を説明する部分平面図
で、第4図aは屈折率ガイド部分のない従来のゲ
インガイド形レーザ装置における共振器端面近傍
でのレーザ光の波面および光の広がりを示し、第
4図bはこの発明の実施例における共振器端面近
傍から導波路出口近傍に至るレーザ光の波面およ
び光の広がりを示す。 図において、1はn形GaAs基板(半導体基
板)、2はn形AlxGa1-xAs層(第1の半導体層)、
3はp形AlyGa1-yAs層(第2の半導体層)、4は
p形AlxGa1-xAs層(第3の半導体層)、Aはスト
ライプ形半導体レーザ領域、Bは屈折率ガイド領
域である。なお、図中同一符号は同一または相当
部分を示す。
FIG. 1 is a perspective view showing an embodiment of the present invention, FIG. 2 is a sectional view taken along the - line in FIG. 1, and FIGS. 3 a and b are cross-sectional views taken along the - line in FIG. A diagram schematically showing the lateral impurity concentration distribution in the active layer on the surface and the lateral refractive index distribution accompanying this, and FIG. 4 is a part explaining the effect of the refractive index guide portion on improving astigmatism. In the plan view, FIG. 4a shows the wavefront of the laser beam and the spread of light near the cavity end face in a conventional gain-guided laser device without a refractive index guide part, and FIG. 4b shows an embodiment of the present invention. The wavefront of the laser beam and the spread of the light from the vicinity of the resonator end face to the vicinity of the waveguide exit are shown in FIG. In the figure, 1 is an n-type GaAs substrate (semiconductor substrate), 2 is an n-type Al x Ga 1-x As layer (first semiconductor layer),
3 is a p-type Al y Ga 1-y As layer (second semiconductor layer), 4 is a p-type Al x Ga 1-x As layer (third semiconductor layer), A is a striped semiconductor laser region, and B is a striped semiconductor laser region. This is a refractive index guide region. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 1 n形の半導体基板上にn形の第1の半導体
層、禁制帯幅が上記第1の半導体層より小さいn
もしくはp形の第2の半導体層、禁制帯幅が上記
第2の半導体層より大きいnもしくはp形の第3
の半導体層が順次形成されてなる基板内の一方の
端面を含まない第1の部分に形成されたゲインガ
イド型半導体レーザ領域と、上記基板内の上記一
方の端面を含む第2の部分の上記第2の半導体層
内に形成され、上記ゲインガイド型半導体レーザ
領域の共振器の延長上の導波路の中心軸を有する
p型不純物拡散により形成されたp+−p−p+
造からなる光励起機能を持たない屈折率ガイド領
域とを備えたことを特徴とする半導体レーザ装
置。
1 an n-type first semiconductor layer on an n-type semiconductor substrate, an n-type semiconductor layer having a smaller forbidden band width than the first semiconductor layer;
or a p-type second semiconductor layer, an n- or p-type third semiconductor layer having a larger forbidden band width than the second semiconductor layer;
a gain-guide semiconductor laser region formed in a first part of the substrate which does not include one end facet in a substrate in which semiconductor layers are sequentially formed; and a second part of the substrate which includes the one end facet thereof Optical excitation consisting of a p + -p-p + structure formed in the second semiconductor layer and formed by p-type impurity diffusion having the central axis of the waveguide as an extension of the resonator of the gain-guided semiconductor laser region. 1. A semiconductor laser device comprising a refractive index guide region having no function.
JP13733081A 1981-08-31 1981-08-31 Semiconductor laser device Granted JPS5839086A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13733081A JPS5839086A (en) 1981-08-31 1981-08-31 Semiconductor laser device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13733081A JPS5839086A (en) 1981-08-31 1981-08-31 Semiconductor laser device

Publications (2)

Publication Number Publication Date
JPS5839086A JPS5839086A (en) 1983-03-07
JPS6358389B2 true JPS6358389B2 (en) 1988-11-15

Family

ID=15196138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13733081A Granted JPS5839086A (en) 1981-08-31 1981-08-31 Semiconductor laser device

Country Status (1)

Country Link
JP (1) JPS5839086A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603177A (en) * 1983-06-21 1985-01-09 Toshiba Corp Semiconductor laser device
JPS60201687A (en) * 1984-03-27 1985-10-12 Sony Corp Semiconductor laser
JPS63194384A (en) * 1987-02-09 1988-08-11 Sanyo Electric Co Ltd Semiconductor laser device
JP2616368B2 (en) * 1992-11-20 1997-06-04 株式会社アテックス Switching device for three-way dump

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52153686A (en) * 1976-06-16 1977-12-20 Nippon Telegr & Teleph Corp <Ntt> Semiconductor light emitting device

Also Published As

Publication number Publication date
JPS5839086A (en) 1983-03-07

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