JPS6359550B2 - - Google Patents
Info
- Publication number
- JPS6359550B2 JPS6359550B2 JP56058602A JP5860281A JPS6359550B2 JP S6359550 B2 JPS6359550 B2 JP S6359550B2 JP 56058602 A JP56058602 A JP 56058602A JP 5860281 A JP5860281 A JP 5860281A JP S6359550 B2 JPS6359550 B2 JP S6359550B2
- Authority
- JP
- Japan
- Prior art keywords
- superconducting wire
- fixed
- fixed beam
- critical current
- stud
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
- G01R33/0354—SQUIDS
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Description
【発明の詳細な説明】
この発明は連続して超電導線の臨界電流と曲げ
歪（曲率半径）の関係を測定できる超電導体特性
測定装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a superconductor characteristic measuring device that can continuously measure the relationship between critical current and bending strain (radius of curvature) of a superconducting wire.
超電導線の重要な超電導特性の一つに臨界電流
がある。この臨界電流は種々の要素によつて変化
するが特に歪による変化は実用上最も重要であ
る。歪には引張歪と曲げ歪がある。従来引張歪と
臨界電流の関係は連続的に測定する装置があつた
が、曲げ歪の場合、ある曲げ径を持つたマンドレ
ルに超電導線試料を固着して測定するため１つの
曲げ歪（曲率半径）につき１本の試料が必要であ
つた。従つて、例えば10種類の曲げ歪による臨界
電流変化を測定するためには10本の超電導線試料
と10種類の曲げ歪の異なるマンドレル、10回の測
定回数が必要であつた。この測定に使うマンドレ
ルは曲げ径精度が必要なため製作費が高価で１回
の測定には時間もかかり、冷却用液体ヘリウムも
多量に必要であつた。従つて多数回の測定には時
間も、ヘリウムも多量に消費し、時間をかけて測
定する割には測定点も少なく時間的、経済的に効
率が悪かつた。しかも、試料間でのバラツキ及び
ハンドリング時の劣化があるので測定データの信
頼性に乏しかつた。 One of the important superconducting properties of superconducting wires is critical current. This critical current changes depending on various factors, but the change due to strain is particularly important in practice. Strain includes tensile strain and bending strain. Conventionally, there were devices that continuously measured the relationship between tensile strain and critical current, but in the case of bending strain, a superconducting wire sample was fixed to a mandrel with a certain bending radius, so one bending strain (curvature radius) was measured. ) required one sample per sample. Therefore, for example, in order to measure the critical current change due to 10 types of bending strain, 10 superconducting wire samples, 10 types of mandrels with different bending strains, and 10 measurements were required. The mandrel used for this measurement requires bending diameter accuracy, is expensive to manufacture, takes a long time to perform one measurement, and requires a large amount of liquid helium for cooling. Therefore, a large amount of time and helium are consumed in making multiple measurements, and the number of measurement points is small even though the measurements take a long time, making it inefficient in terms of time and economy. Furthermore, the reliability of the measured data was poor due to variations between samples and deterioration during handling.
本発明の目的は前記の事情に鑑みてなされたも
ので、臨界電流と曲げ歪を連続して測定すること
のできる超電導体特性測定装置を提供することに
ある。 An object of the present invention has been made in view of the above circumstances, and is to provide a superconductor characteristic measuring device that can continuously measure critical current and bending strain.
本発明は超電導線を片持はりとして自由端を変
位させることによつて曲げ歪を超電導線に連続的
に付加させることによつて臨界電流の曲げ歪変化
を連続的に測定することが達成される。 The present invention achieves continuous measurement of changes in bending strain of critical current by continuously adding bending strain to the superconducting wire by displacing the free end of the superconducting wire as a cantilever beam. Ru.
以下図面を参照してこの発明を詳細に説明す
る。 The present invention will be described in detail below with reference to the drawings.
図は本発明に係る一実施例を示すものであり、
まず液体ヘリウム中に浸漬された測定される超電
導線試料１の一端は固定スタツト２と固定はり３
によつてボルト４を通して固定されて固定端５と
なつている。超電導線１の他端６（自由端）はお
さえ治具７で固定されているが可動スタツト８に
よつて自由に上下動く。今、超電導線１を直線状
態にした後可動スタツト８を下に動かす（変位さ
せる）と超電導線１は曲げモーメントを受けて固
定端５の近傍９の部分で最小の曲率半径になる。
そのときの最小曲率半径Ｒは次式で表わされる。 The figure shows one embodiment according to the present invention,
First, one end of the superconducting wire sample 1 to be measured immersed in liquid helium is connected to a fixed stud 2 and a fixed beam 3.
is fixed through a bolt 4 to form a fixed end 5. The other end 6 (free end) of the superconducting wire 1 is fixed by a holding jig 7, but can freely move up and down by a movable stud 8. Now, when the movable stud 8 is moved (displaced) downward after the superconducting wire 1 is in a straight state, the superconducting wire 1 receives a bending moment and becomes the minimum radius of curvature at a portion 9 near the fixed end 5.
The minimum radius of curvature R at that time is expressed by the following equation.
Ｒ＝EIz／lW
Ｅは超電導線の弾性率Izは超電導線の形状によ
る断面二次モーメント、Ｗは荷重、ｌは自由端６
と固定端５の距離である。また、スタツト８を移
動させた距離、変位置はWl3／3EIzで表わされるので
変位置とｌを測定すればＲは計算できる。このと
き超電導マグネツト１０で磁場を印加して超電導
線１にハンダ付け等で接合された常温から導びか
れる電流リード１１から電流を供給し、固定端５
を介して取り付けた電圧端子１２から電流が供給
される超電導線１の電圧を図示しない記録計へ、
前記電流リード１１からは電流の様子の信号を記
録計につなぎ、測定する超電導線１の超電導状態
から常電導状態に移行する様子を記録計より観察
して、いかなる電流値まで超電導状態（臨界電
流）なのかを測定する。このとき少しずつ可動ス
タツト８を変位させて超電導線１を直線状態から
ある曲率半径にして前記の臨界電流を測定するこ
とによつて曲率半径のちがいによる臨界電流の変
化を観察することができる。この装置によつて１
×２mm断面の超電導線を本発明による測定装置に
とりつけ曲率半径を1000Rから50Rまで100段階に
変化させて臨界電流−磁場曲線を測定した。この
間に要した時間は３時間、消費した液体ヘリウム
は50lであつた。これだけのデータを従来品で測
定した場合試料取付、測定時間は100時間、使用
た液体ヘリウムは1000であつたので時間では1/
３０、ヘリウムで1/20の節約になつた。 R=EIz/lW E is the elastic modulus of the superconducting wire, Iz is the moment of inertia of area due to the shape of the superconducting wire, W is the load, and l is the free end 6.
and the distance between the fixed end 5. Further, since the distance traveled by the stat 8 and the displaced position are expressed as Wl 3 /3EIz, R can be calculated by measuring the displaced position and l. At this time, a magnetic field is applied by the superconducting magnet 10, and a current is supplied from the current lead 11 connected to the superconducting wire 1 by soldering or the like and led from room temperature, and the fixed end 5 is
The voltage of the superconducting wire 1, to which current is supplied from the voltage terminal 12 attached via the terminal, is recorded to a recorder (not shown).
A signal indicating the state of the current is connected to a recorder from the current lead 11, and the transition of the superconducting wire 1 to be measured from the superconducting state to the normal conducting state is observed from the recorder, and the superconducting state (critical current ). At this time, by gradually displacing the movable stud 8 to change the superconducting wire 1 from a straight state to a certain radius of curvature and measuring the critical current, it is possible to observe changes in the critical current due to differences in the radius of curvature. With this device 1
A superconducting wire with a cross section of 2 mm was attached to a measuring device according to the present invention, and the radius of curvature was changed in 100 steps from 1000 R to 50 R to measure the critical current-magnetic field curve. The time required during this time was 3 hours, and 50 liters of liquid helium was consumed. When measuring this amount of data with a conventional product, the sample installation and measurement time was 100 hours, and the liquid helium used was 1000 hours, so the time was 1/1
30. Saved 1/20 with helium.
以上のようにこの発明によれば同一の超電導線
の臨界電流と曲率半径（曲げ歪）の関係を連続し
て測定できるため、測定データの信頼性が向上す
ると共に測定回数が大幅に軽減でき、時間的、経
済的に効率があがる。 As described above, according to the present invention, the relationship between the critical current and the radius of curvature (bending strain) of the same superconducting wire can be measured continuously, which improves the reliability of the measurement data and significantly reduces the number of measurements. Improved time and economic efficiency.
図において超電導線の両端が電流リードを兼ね
てもよい。又、曲率半径（曲げ歪）を直接読むた
めに超電導線の一端である固定端の近傍に歪ゲー
ジを装着して測定してもよい。 In the figure, both ends of the superconducting wire may also serve as current leads. Alternatively, in order to directly read the radius of curvature (bending strain), a strain gauge may be attached near the fixed end, which is one end of the superconducting wire, for measurement.
図面は本発明に係る超電導体特性測定装置の構
成図である。
１…超電導線、２…固定スタツト、３…固定は
り、４…第１の手段（ボルト）、５…超電導線の
一端（固定端）、６…超電導線の他端（自由端）、
７…第２の手段（おさえ治具）、８…可動スタツ
ト。
The drawing is a configuration diagram of a superconductor characteristic measuring device according to the present invention. 1... superconducting wire, 2... fixed stud, 3... fixed beam, 4... first means (bolt), 5... one end of superconducting wire (fixed end), 6... other end of superconducting wire (free end),
7...Second means (holding jig), 8...Movable stud.
Claims (1)
れる固定スタツトと、前記固定はりの他端に取付
けられる可動スタツトと、前記固定はりと前記固
定スタツトによつて超電導線の一端を固定する第
１の手段と、前記固定はりと前記可動スタツトに
よつて前記超電導線の他端を固定し、前記第１の
手段に対して可動となる第２の手段とを有し、前
記可動スタツトによつて前記第２の手段を移動さ
せることにより前記超電導線の他端を移動させて
前記超電導線に曲げ歪を発生させるごとく構成し
たことを特徴とする超電導体特性測定装置。1 a fixed beam, a fixed stud attached to one end of the fixed beam, a movable stud attached to the other end of the fixed beam, and a first fixed beam that fixes one end of the superconducting wire by the fixed beam and the fixed stud. means for fixing the other end of the superconducting wire by the fixed beam and the movable stud, and a second means movable with respect to the first means; A superconductor characteristic measuring device characterized in that the second means is moved to move the other end of the superconducting wire to generate bending strain in the superconducting wire.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56058602A JPS57173985A (en) | 1981-04-20 | 1981-04-20 | Device for super conductor characteristic measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56058602A JPS57173985A (en) | 1981-04-20 | 1981-04-20 | Device for super conductor characteristic measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57173985A JPS57173985A (en) | 1982-10-26 |
| JPS6359550B2 true JPS6359550B2 (en) | 1988-11-21 |
Family
ID=13089057
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56058602A Granted JPS57173985A (en) | 1981-04-20 | 1981-04-20 | Device for super conductor characteristic measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57173985A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106443270B (en) * | 2016-10-25 | 2023-09-01 | 云南电网有限责任公司电力科学研究院 | A high-temperature superconducting strip current-carrying capacity test device and its application method |
| CN112542269B (en) * | 2020-11-30 | 2022-07-12 | 中国科学院合肥物质科学研究院 | Preparation method of tensile strain critical current test sample of niobium-tin superconducting wire |
-
1981
- 1981-04-20 JP JP56058602A patent/JPS57173985A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57173985A (en) | 1982-10-26 |
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