JPS637603B2 - - Google Patents
Info
- Publication number
- JPS637603B2 JPS637603B2 JP56115550A JP11555081A JPS637603B2 JP S637603 B2 JPS637603 B2 JP S637603B2 JP 56115550 A JP56115550 A JP 56115550A JP 11555081 A JP11555081 A JP 11555081A JP S637603 B2 JPS637603 B2 JP S637603B2
- Authority
- JP
- Japan
- Prior art keywords
- printed
- measurement area
- measured
- measurement
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 64
- 238000012937 correction Methods 0.000 claims description 26
- 238000006243 chemical reaction Methods 0.000 claims description 25
- 238000001514 detection method Methods 0.000 claims description 11
- 238000007639 printing Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000007645 offset printing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
- G01B11/285—Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Inking, Control Or Cleaning Of Printing Machines (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
本発明はオフセツト印刷に使用される刷版や、
印刷前に刷られる校正刷り、清刷り等の印刷部と
非印刷部との比率を測定して、印刷に必要な適正
インキ供給量を出力するインキ供給量測定装置に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention provides a printing plate used for offset printing,
The present invention relates to an ink supply amount measuring device that measures the ratio of printed portions and non-printed portions of proofs, clean sheets, etc. printed before printing, and outputs an appropriate ink supply amount necessary for printing.
従来より刷版や、校正刷り、清刷り等の印刷部
と非印刷部の比率を測定する場合、区画領域毎ま
たは全面に対して光源より刷版等の被測定物に光
を当ててその反射光量を測定することで行い、こ
れに基いてインキ供給量を決定している。しかし
光源の輝度が全体的に変化したり、輝度分布が変
化すると、それが測定誤差の大きな要因とな。こ
の対策として一般に定期的に輝度のキヤリブレー
シヨンを行うことが必要である。また、輝度変化
検出器を設けて輝度変化を検出し、これに基いて
測定結果を自動的に補正しようとする場合、輝度
変化検出器の設置場所や、特性がインキ供給量測
定器と一致しないと正確な補正が出来ない。さら
に、光源の輝度分布が変化した場合には当然なが
ら被測定全領域の反射状態も変るので、その場合
は測定領域全体に互つてきめ細い補正が必要とな
る。被測定領域周囲の印刷部および非印刷部の比
率の大小により周囲の反射状態も変化するので、
測定装置への不要な反射光の変化となつて測定誤
差を生じることになる。被測定領域周囲の反射影
響を除くには測定器に指向性を持たせることで可
能となる。マスク板やレンズを使用して指向性を
持たせることが可能であるが、レンズを使用する
とレンズの光軸からレンズの周辺へ近づくに従つ
て入光量が減じ、この結果としてレンズの中央と
周辺との測定値に誤差を生じることになる等の多
くの問題があつた。 Conventionally, when measuring the ratio of printed parts and non-printed parts of printing plates, proofs, reprints, etc., the light source is applied to the object to be measured, such as the printing plate, for each divided area or the entire surface, and the light is reflected. This is done by measuring the amount of light, and the amount of ink supplied is determined based on this. However, if the overall brightness of the light source changes or the brightness distribution changes, this can become a major cause of measurement error. As a countermeasure against this problem, it is generally necessary to periodically calibrate the brightness. In addition, when installing a brightness change detector to detect brightness changes and automatically correcting the measurement results based on this, the installation location and characteristics of the brightness change detector may not match those of the ink supply amount measuring device. It is not possible to make accurate corrections. Furthermore, if the luminance distribution of the light source changes, the reflection state of the entire measurement area will naturally change, so in that case, fine corrections will be required for the entire measurement area. The surrounding reflection state changes depending on the ratio of printed and non-printed areas around the measurement area.
This results in unnecessary changes in the reflected light to the measuring device, resulting in measurement errors. It is possible to eliminate the influence of reflection around the area to be measured by providing the measuring instrument with directivity. It is possible to provide directivity using a mask plate or lens, but when using a lens, the amount of incident light decreases as it approaches the periphery of the lens from the optical axis of the lens. There were many problems such as errors in the measured values.
本発明の目的はこれらの問題点を解決した刷版
や校正刷り、清刷り等の印刷部と非印刷部の比率
測定に基づいてインキ供給量を決定する測定装置
を提供することである。 SUMMARY OF THE INVENTION An object of the present invention is to provide a measuring device that solves these problems and determines the amount of ink supplied based on the measurement of the ratio of printed areas to non-printed areas of printing plates, proofs, clearings, etc.
このために本発明のインキ供給量測定装置は、
測定領域以外からの光を遮光するように測定器の
前にマスクケースを設けて常に同様な状態での測
定領域に関する測定を可能にし、この測定器とし
てレンズおよび複数の光電変換素子アレーを有す
るものとを使用し、該測定器の出力信号として各
素子の連続的な信号列として取り出すとともにこ
れをアナログ波形に変換し、このアナログ波形を
積分することで印刷部と非印刷部との面積比率を
定め、これに基いてインキ供給量を測定するよう
に構成されており、しかも予め被測定物の印刷部
および非印刷部とそれぞれ同じ色を別々に有する
校正板を測定することによつて光電変換素子アレ
ー素子ごとの補正定数を等出することによつて被
測定物測定結果を補正するようにしたことを特徴
とする。 For this purpose, the ink supply amount measuring device of the present invention has the following features:
A mask case is installed in front of the measuring device to block light from outside the measuring area, and the measuring device has a lens and a plurality of photoelectric conversion element arrays, making it possible to measure the measuring area under the same conditions at all times. The output signal of the measuring device is extracted as a continuous signal train of each element, and this is converted into an analog waveform. By integrating this analog waveform, the area ratio of the printed area and the non-printed area can be calculated. It is configured to measure the ink supply amount based on this, and it is also configured to measure the ink supply amount based on the photoelectric conversion by measuring calibration plates that have the same color as the printed and non-printed areas of the object in advance. The present invention is characterized in that the measurement result of the object to be measured is corrected by equalizing the correction constant for each element of the element array.
以下に本発明の実施例につき図面を参照して説
明する。 Embodiments of the present invention will be described below with reference to the drawings.
第1図および第2図に示す装置は、測定部をな
す暗箱1と、操作、制御、演算、記憶を行つてい
るコンソール2と出力装置であるプリンター3と
から成る。測定部の暗箱1はその内面が無反射状
態とされている。暗箱1の底部に被測定物4およ
び測定値と補正するための校正板5を測定面と同
じレベルに配置するようになつている。被測定物
4の装脱はそれを取付ける被測定物セツト台6の
出し入れによつて行うようになつている。暗箱1
の上方には走行ガイド7が備えられ、この走行ガ
イド7に沿つて測定器8、光源箱9およびマスク
ケース10が一体となつた検出ヘツド11が走行
駆動用パルスモータ12により走行するようにな
つている。 The apparatus shown in FIGS. 1 and 2 consists of a dark box 1 which serves as a measuring section, a console 2 which performs operations, control, calculations and storage, and a printer 3 which serves as an output device. The inner surface of the dark box 1 in the measuring section is made non-reflective. An object to be measured 4 and a calibration plate 5 for correcting measured values are placed at the bottom of the dark box 1 at the same level as the measurement surface. The object to be measured 4 can be attached or removed by taking it in and out of the object setting table 6 on which it is attached. dark box 1
A traveling guide 7 is provided above, and a detection head 11 in which a measuring device 8, a light source box 9, and a mask case 10 are integrated is driven along this traveling guide 7 by a traveling driving pulse motor 12. ing.
第2図は第1図のコンソール側から見た検出ヘ
ツド11を示し、測定器8の両側にて光源箱9が
傾斜してマスクケース10に取付けられ、各光源
箱9内に光源13が備えられている。光源箱9を
備えたマスクケース10は第3図に示す如く、底
板10Aに長方形の測定窓10Bを有しており、
この測定窓10Bが第4図に示す如き測定領域S
(a×l)を定めるようになつている。 FIG. 2 shows the detection head 11 seen from the console side in FIG. It is being As shown in FIG. 3, the mask case 10 equipped with the light source box 9 has a rectangular measurement window 10B on the bottom plate 10A.
This measurement window 10B is a measurement area S as shown in FIG.
(a×l).
このような検出ヘツド11は、パルスモータ1
2によりステツプ状に走行ガイド7に沿つて駆動
され、各測定領域S毎に測定器8が光源13から
測定窓10B内の被測定物4の表面で反射された
光を受けて測定するようにされる。この測定動作
をさらに詳しく説明すれば、まず校正板5を測定
してその測定領域Sの反射輝度分布を測定し、こ
れを補正情報としてコンソール2において記憶す
る。そして検出ヘツド11はパルスモータ12に
より走行し、被測定物4の上まで移動されて停止
する。次に被測定物4に対して同様に測定を開始
し、測定器8からの出力を補正情報とつき合せな
がら測定する。その結果を1回の測定値として記
憶し、検出ヘツド11を第4図におけるaの距離
だけ走行させた後次の測定を行う。このようにし
て次々と被測定物4に対して測定を行い、被測定
物全域に互つて行う。ここで注意すべきこととし
て、印刷装置(図示せず)におけるインキバルブ
の受け持つ区画領域は測定領域Sとは一致せず、
従つてインキ供給量の決定は区画領域毎に行わね
ばならない。このために、第4図に示す如く区画
領域の幅がCであるとするならば、幅aの測定領
域Sを連続して測定し、幅Cの区画領域を網羅し
た時点で当該インキバルブに対するインキ供給量
が決定される。すなわちインキ供給量の出力は第
4図におけるc/a回につき測定したものになる。
検出ヘツド11はマスクケース10、光源13お
よび測定器8が一体となつて走行するので、校正
板5を測定する時も被測定物4を測定する時も測
定領域の輝度分布状態に変化がなく安定した測定
結果が得られる。 Such a detection head 11 is connected to a pulse motor 1.
2, the measuring device 8 is driven stepwise along the traveling guide 7, and the measuring device 8 receives light reflected from the light source 13 on the surface of the object to be measured 4 within the measuring window 10B for each measurement area S to perform measurement. be done. To explain this measurement operation in more detail, first, the calibration plate 5 is measured to measure the reflected luminance distribution of the measurement area S, and this is stored in the console 2 as correction information. The detection head 11 is then driven by a pulse motor 12, moved to above the object to be measured 4, and then stopped. Next, measurement of the object to be measured 4 is started in the same manner, and the output from the measuring device 8 is compared with the correction information. The result is stored as a single measurement value, and the next measurement is made after the detection head 11 has traveled the distance a in FIG. 4. In this way, measurements are performed on the object to be measured 4 one after another, and over the entire area of the object to be measured. It should be noted here that the divided area handled by the ink valve in the printing device (not shown) does not coincide with the measurement area S.
Therefore, the ink supply amount must be determined for each section. For this purpose, if the width of the divided area is C as shown in FIG. The ink supply amount is determined. In other words, the output of the ink supply amount is the one measured for times c/a in FIG.
Since the detection head 11 moves as a unit with the mask case 10, light source 13, and measuring device 8, there is no change in the brightness distribution state of the measurement area when measuring the calibration plate 5 or the object to be measured 4. Stable measurement results can be obtained.
第5図にこの測定方法の動作ブロツク図を示し
てある。測定器8はレンズ20と、光電変換素子
1S〜nSが多数並んだ光電変換素子アレー21
と、個々の光電変換素子出力信号を取り出すアナ
ログスイツチ22と、アナログスイツチ22を選
択するシフトレジスター23と、そしてシフトレ
ジスターを制御する回路24とより成る。コンソ
ール2に内蔵された中央制御部25より測定器コ
ントロール26へ測定開始指令が出されると、光
電変換素子アレー21の素子1S,2S…nSが
順次選択されて個々の光電変換素子の入光量に応
じた光電変換信号を連続的に得られる。このよう
にして第5図のラインl1に生じる光電変換信号の
出力波形は第6図に示す様になる。ここで第4図
の測定領域の測定ポイント1P,2P…nPは光
電変換素子1S,2S…nSに対応する箇所とし
て示してあり第6図に示される個々の波高値が第
4図の1P,2P…nPの反射光量値となるわけ
である。 FIG. 5 shows an operational block diagram of this measuring method. The measuring device 8 includes a lens 20 and a photoelectric conversion element array 21 in which a large number of photoelectric conversion elements 1S to nS are lined up.
, an analog switch 22 for taking out the output signal of each photoelectric conversion element, a shift register 23 for selecting the analog switch 22, and a circuit 24 for controlling the shift register. When a measurement start command is issued from the central control unit 25 built in the console 2 to the measuring instrument control 26, the elements 1S, 2S...nS of the photoelectric conversion element array 21 are sequentially selected and the amount of light incident on each photoelectric conversion element is adjusted. A corresponding photoelectric conversion signal can be obtained continuously. In this way, the output waveform of the photoelectric conversion signal generated on line l1 in FIG. 5 becomes as shown in FIG. Here, the measurement points 1P, 2P...nP in the measurement area in FIG. 4 are shown as locations corresponding to the photoelectric conversion elements 1S, 2S...nS, and the individual peak values shown in FIG. This results in a reflected light amount value of 2P...nP.
第6図の信号は、第5図に示すアナログ波形変
換(1)30に入力され、その出力波形は第7図に示
す如くなる。すなわち第7図の波形は第6図の波
高値を連続したアナログ波形にしたものである。
この波形を積分器31で(1)式に示すようにt1から
toまでの時間で積分することで第4図の測定領域
Sの全域における反射光量値を得る。 The signal shown in FIG. 6 is input to the analog waveform converter (1) 30 shown in FIG. 5, and its output waveform becomes as shown in FIG. That is, the waveform of FIG. 7 is a continuous analog waveform of the peak values of FIG. 6.
The integrator 31 converts this waveform from t 1 as shown in equation (1).
By integrating over the time up to t o , the amount of reflected light over the entire measurement area S in FIG. 4 is obtained.
A=∫tn t1f(t)dt …………………(1)
A:測定領域全反射光量値
f(t):第7図におけるt1からto迄の波形
t1,to:全光電変換素子のスキヤン時間
ここで問題となるのは前述したように測定領域
Sの輝度変化分布状態のむらによる測定領域面か
らの反射光量のむらが測定誤差となること、レン
ズ20を使用しているためにその光軸からレンズ
周辺へ近づくにつれて入光量が減り、同一の反射
量を持つた被測定物4をレンズ20の光軸部で測
定したものとその周辺部で測定したものとで誤差
が生じることである。そこで測定領域Sの1P,
2P…nP(第4図)の反射光量が測定器8の光電
変換素子1S,2S…nSにいかなる入光状態で
分布しているかをあらかじめ測定しておき、これ
を補正定数として演算して記憶し、そして第7図
の波形を積分器31で積分する前に補正器32に
おいて補正定数による補正を行う。 A=∫ tn t1 f(t)dt …………………(1) A: Measurement area total reflected light intensity value f(t): Waveform from t 1 to t o in Fig. 7 t 1 , t o : Scan time of all photoelectric conversion elements The problem here is that, as mentioned above, unevenness in the amount of light reflected from the measurement area surface due to unevenness in the brightness change distribution state of the measurement area S causes measurement errors. Because of this, the amount of incident light decreases as it approaches the periphery of the lens from the optical axis, and there will be an error between the measurement of the object 4 having the same amount of reflection at the optical axis of the lens 20 and the measurement at the periphery. This is what happens. Therefore, 1P of the measurement area S,
Measure in advance how the amount of reflected light of 2P...nP (Fig. 4) is distributed to the photoelectric conversion elements 1S, 2S...nS of the measuring device 8 under what light incident conditions, and calculate and store this as a correction constant. Then, before the waveform shown in FIG. 7 is integrated by the integrator 31, the corrector 32 performs correction using a correction constant.
このような補正を行うために校正5が配置され
るのであり、被測定物4を測定する前にまず校正
板5を測定して光電変換素子1S,2S…nSの
出力状態を調べる。このための校正板5は測定器
8の測定領域Sと同一長さおよび同一幅で、被測
定物4の印刷部および非印刷部とそれぞれ同じ色
調の2色の面積部分5A,5Bが印刷されてお
り、第8図に示す如きものとされる。それ故、校
正板5の測定は印刷部の面積部分5Aと非印刷部
の面積部分5Bとの2回の測定となる。その出力
波形を第9図および第10図に示す。ここで校正
板5の印刷部の色調が明るい色調とするならば、
その出力波形は第9の如くなり、非印刷部が暗い
色調とするならばその出力波形は第10図の如く
なる。第9図および第10図に示した校正板5に
おける2つの測定値は第5図のサンプル・ホール
ド33を通して中央制御部25に与えられ、それ
ぞれの光電変換素子1S,2S…nSにつき記憶
される。ここでサンプル・ホールド33および積
分器31からの出力信号は信号選択34により切
換えられ、アナログ/デジタル変換器35により
変換されて中央制御部25に入力される。 A calibration plate 5 is provided to perform such correction, and before measuring the object to be measured 4, the calibration plate 5 is first measured to check the output states of the photoelectric conversion elements 1S, 2S, . . . nS. The calibration plate 5 for this purpose has the same length and width as the measurement area S of the measuring device 8, and is printed with two-color areas 5A and 5B of the same tone as the printed and non-printed areas of the object 4, respectively. 8, as shown in FIG. Therefore, the measurement of the calibration plate 5 is carried out twice: the area portion 5A of the printed portion and the area portion 5B of the non-printed portion. The output waveforms are shown in FIGS. 9 and 10. Here, if the color tone of the printed part of the proof plate 5 is bright,
The output waveform is as shown in FIG. 9, and if the non-printed area has a dark tone, the output waveform is as shown in FIG. 10. The two measured values on the calibration plate 5 shown in FIGS. 9 and 10 are given to the central control unit 25 through the sample hold 33 in FIG. 5, and are stored for each photoelectric conversion element 1S, 2S...nS. . Here, the output signals from the sample/hold 33 and the integrator 31 are switched by the signal selection 34, converted by the analog/digital converter 35, and input to the central control section 25.
第9図に示した印刷部の面積部分5Aにおける
測定で得た光電変換素子1S〜nSの出力VS1〜
VSnから第10図におけるVT1〜VTnをそれぞ
れ差し引く減算を行うことによつて(2)、(3)式を得
る。 The output VS 1 ~ of the photoelectric conversion element 1S~nS obtained by the measurement in the area 5A of the printed part shown in FIG.
Equations (2) and (3) are obtained by subtracting VT 1 to VTn in FIG. 10 from VSn, respectively.
VS1〜o−VT1〜o
Va/VV1〜o×β=α1〜o ………(2)
α1〜o×(S1〜o−VT1〜o)=R1〜o …(3)
R1〜o:補正器32による補正結果
S1〜o:第6図に示す被測定物5の測定出力
α1〜o:補正定数
β:スパン補正定数
V0:測定スパンとして必要な値
Va:VV1〜oの中で最大の値
ここで第9図の波形Vs〜oおよび第10図の波
形VT1〜oは測定した校正板5が単一色であるか
ら、波高値が平坦となるべきである。そこで(2)式
を使用して光電変換素子1S〜nSに係るそれぞ
れの補正定数を中央制御部25において算出す
る。 VS 1〜o −VT 1〜o Va/VV 1〜o ×β=α 1〜o ………(2) α 1〜o ×(S 1〜o −VT 1〜o )=R 1〜o … (3) R 1~o : Correction result by the corrector 32 S 1~o : Measurement output of the measured object 5 shown in Fig. 6 α 1~o : Correction constant β: Span correction constant V 0 : Necessary as measurement span V a : Maximum value among VV 1 to o Here, the waveforms V s to o in Fig. 9 and the waveforms VT 1 to o in Fig. 10 are waveforms because the measured calibration plate 5 is of a single color. The highs should flatten out. Therefore, the central control unit 25 calculates each correction constant for the photoelectric conversion elements 1S to nS using equation (2).
スパン補正定数βは測定スパンを調整するもの
で、光電の輝度が落ちた場合の第9図および第1
0図の波高値全体の変動に対する補正定数であ
る。 The span correction constant β is used to adjust the measurement span.
This is a correction constant for the overall fluctuation of the peak value in Figure 0.
Va/VV1〜oは個々の光電素子出力のバラツキ
を補正するためのもので、当然ながら測定領域S
における照射輝度むらの補正も出来る。 V a /VV 1 to o are for correcting variations in the output of individual photoelectric elements, and of course the measurement area S
It is also possible to correct unevenness in irradiation brightness.
補正定数α1〜oは第11図の様なパターンにな
る。そして中央制御部25内に記憶される。 The correction constants α 1 to o have a pattern as shown in FIG. Then, it is stored in the central control unit 25.
このようにして校正板5を測定することで第1
1図の如き補正定数α1〜oを得た後検出ヘツド11
を走行させて被測定物4に関する測定を開始する
のである。 By measuring the calibration plate 5 in this way, the first
After obtaining the correction constant α 1~o as shown in Fig. 1, the detection head 11
Then, the measurement of the object 4 to be measured is started.
この測定においてラインl2には第7図に示した
如き測定信号が時間t1からtoまで順次あらわれ
る。一方時間t1からtoまで同期しててラインl3に
は中央制御部25からデジタル/アナログコンバ
ータ36を介して補正定数波形(第11図に示
す)が与えられ、アナログ波形変換(2)37により
ラインl4にはその波高値の連続したアナログ波形
があらわれる。また、同時に第10図に示した校
正板5の非印刷部における測定結果がデジタル/
アナログコンバータ38を介してラインl5に与え
られ、アナログ波形変換(3)39によりラインl6に
はその波高値の連続したアナログ波形があらわれ
る。そしてこれらはラインl2により与えられる測
定値とともに補正器32により(3)式の演算が行な
われ、測定波形が補正される。この出力信号をt1
からtoの走査時間で積分器31により積分し、to
までの積分値を中央制御部25において記憶す
る。これにより1回すなわち1つの測定領域に関
する測定が終了するのであり、検出ヘツド11は
第4図に示した距離aだけ走行して、同様に次の
測定を行う。このような測定を被測定物4の全面
にわたり繰返す。この測定におけるタイム・チヤ
ートを第12図に示す。 In this measurement, measurement signals as shown in FIG. 7 appear sequentially on line l2 from time t1 to to . On the other hand, in synchronization from time t1 to t0 , a correction constant waveform (shown in FIG. 11) is applied to line l3 from the central control unit 25 via a digital/analog converter 36, and analog waveform conversion (2) is performed. 37, an analog waveform with continuous peak values appears on line l4 . At the same time, the measurement results on the non-printed part of the calibration plate 5 shown in FIG.
The signal is applied to line l5 via analog converter 38, and by analog waveform conversion (3) 39, an analog waveform with continuous peak values appears on line l6 . Then, the compensator 32 performs the calculation of equation (3) on these together with the measured value given by line l2 , and the measured waveform is corrected. This output signal is t 1
The integrator 31 integrates with a scanning time of t o from t o
The central control unit 25 stores the integral value up to . This completes one measurement, that is, one measurement area, and the detection head 11 travels the distance a shown in FIG. 4 and performs the next measurement in the same manner. Such measurements are repeated over the entire surface of the object to be measured 4. A time chart for this measurement is shown in FIG.
このような本発明によるインキ供給量測定装置
による効果を説明すれば次の通りである。すなわ
ち、従来インキ供給量が適切であるか否かを作業
者が刷り上りを見ながらインキバルブを調整して
いたので適正なインキ量を調整するまでに多くの
損紙を発生していたうえ、この作業はかなりの熟
練を要していたのに対し、本発明の装置を使用す
ることにより熟練作業者でなくとも簡単に適正な
インキ供給量をセツト出来、しかも印刷開始前に
この測定結果でインキバルブをセツトしておけば
損紙をかなり少くさせることが出来る。それは従
来より問題となつていた光源の輝度変化に対する
測定誤差や光電変換素子特性のバラツキ、測定領
域の輝度むらによる測定誤差を、測定開始前に校
正板を測定して適正な補正定数を算出し、補正し
ながら被測定物を測定してゆくいわゆる自動キヤ
ブレーシヨン方式としたことで解決したためであ
り、これにより精度の良い安定した結果が得られ
るためである。 The effects of the ink supply amount measuring device according to the present invention will be explained as follows. In other words, in the past, operators had to adjust the ink valve while checking the finished print to determine whether the ink supply amount was appropriate, which resulted in a lot of wasted paper before they could adjust the appropriate ink amount. This work required considerable skill, but by using the device of the present invention, even unskilled workers can easily set the appropriate ink supply amount, and what's more, the measurement results can be checked before printing starts. By setting the ink valve, you can significantly reduce wasted paper. This is because measurement errors due to variations in the brightness of the light source, variations in photoelectric conversion element characteristics, and uneven brightness in the measurement area, which have been problems in the past, can be resolved by measuring a calibration plate and calculating an appropriate correction constant before starting measurement. This is because the problem was solved by using a so-called automatic cavration method in which the object to be measured is measured while making corrections, and as a result, highly accurate and stable results can be obtained.
また測定器の個々の光電変換素子出力をデジタ
ル化して測定すると多大なメモリーを必要とし、
また補正や積算等演算時間が多くかかることにな
るが、本発明のものでは測定器の光電変換出力を
アナログ波形として積分する方法を使用している
のでメモリーも少なく演算時間も少なくて済む利
点がある。 Furthermore, digitizing and measuring the output of each photoelectric conversion element of a measuring instrument requires a large amount of memory.
Also, it takes a lot of time for calculations such as correction and integration, but the method of the present invention uses a method of integrating the photoelectric conversion output of the measuring instrument as an analog waveform, so it has the advantage of requiring less memory and less calculation time. be.
尚、2色の印刷物でその互いの面積比を反射光
量で測定するものであれば、校正板の色をその2
色にすることで測定出来るのであり、前述した装
置以外に多くの適用が出来ることは勿論である。 In addition, if the area ratio of printed matter of two colors is measured by the amount of reflected light, the color of the calibration plate should be set to the two colors.
It can be measured by color, and it goes without saying that it can be applied in many ways other than the above-mentioned device.
第1図および第2図は本発明の一実施例である
インキ供給量測定装置の立面図および端面図。第
3図はマスクケースの斜視図。第4図は測定器に
よる測定領域を示す斜視図。第5図は第1図およ
び第2図に示した装置のブロツク図。第6図、第
7図および第9図〜第11図は波形を示す説明
図。第8図は校正板を示す斜視図。第12図は測
定を示すタイムチヤート図。
1…暗箱、2…コンソール、4…被測定物、5
…校正板、8…測定器、9…光源箱、10…マス
クケース、11…検出ヘツド、12…パルスモー
タ、13…光源、20…レンズ、21…光電変換
素子アレー、22…アナログスイツチ、23…シ
フトレジスター、24…シフトレジスター制御回
路、25…中央制御部、26…測定器コントロー
ル、30,37,39…アナログ波形変換、31
…積分器、35,36,38…コンバータ。
1 and 2 are an elevational view and an end view of an ink supply amount measuring device which is an embodiment of the present invention. Figure 3 is a perspective view of the mask case. FIG. 4 is a perspective view showing the measurement area by the measuring device. FIG. 5 is a block diagram of the apparatus shown in FIGS. 1 and 2. FIG. 6, FIG. 7, and FIGS. 9 to 11 are explanatory diagrams showing waveforms. FIG. 8 is a perspective view showing the calibration plate. FIG. 12 is a time chart showing the measurement. 1... Dark box, 2... Console, 4... Measured object, 5
... Calibration plate, 8... Measuring device, 9... Light source box, 10... Mask case, 11... Detection head, 12... Pulse motor, 13... Light source, 20... Lens, 21... Photoelectric conversion element array, 22... Analog switch, 23 ...Shift register, 24...Shift register control circuit, 25...Central control unit, 26...Measuring instrument control, 30, 37, 39...Analog waveform conversion, 31
...Integrator, 35, 36, 38...Converter.
Claims (1)
測定領域以外からの光を遮光するマスクケース、
該マスクケースに取付けられて被測定物の測定領
域を照明する光源、および被測定物の測定領域か
らの反射光をレンズを通して内蔵せる複数の光電
変換素子からなるアレー上に導びく測定器を有し
てなる検出ヘツドと、 暗箱に沿つて検出ヘツドをステツプ状に移動さ
せ、順次に測定領域を移動させることで被測定物
の全面にわたる走査が行えるようになすための駆
動装置と、 被測定物の印刷部および非印刷部と同じ色を
別々に印刷されて個々に測定領域に対置できるよ
うに被測定物と同一レベルにて暗箱に配置された
校正板と、 前記測定器による測定領域に関する個々の光電
変換素子の出力信号を連続的な信号列として検出
した後この波高値を連続するアナログ波形に変換
するための回路と、 前記校正板に関する測定に基いて光電変換素子
アレーにおけるそれぞれの素子に関する補正定数
を求めて記憶する回路と、 前記補正定数に基いて前記測定器の出力信号を
補正する補正回路と、 前記補正の行われた前部アナログ波形を積分し
て印刷部と被印刷部との面積比率を測定する回路
と、 前記測定領域における印刷部と非印刷部との面
積比率に基いてインキ供給量を決定するための回
路と、 を含んでなるインキ供給量測定装置。[Scope of Claims] 1. A mask case that has an opening that defines the measurement area of the object to be measured and that blocks light from outside the measurement area;
It has a light source that is attached to the mask case and illuminates the measurement area of the object to be measured, and a measuring device that guides reflected light from the measurement area of the object through a lens onto an array consisting of a plurality of built-in photoelectric conversion elements. a detection head formed of a dark box, a drive device for moving the detection head in steps along a dark box, and scanning the entire surface of the object by sequentially moving the measurement area, and the object to be measured. a calibration plate placed in a dark box at the same level as the object to be measured so that the printed part and the non-printed part are printed separately in the same color as the printed part and the non-printed part, and can be placed individually in the measurement area; a circuit for detecting the output signal of the photoelectric conversion element as a continuous signal train and then converting the peak value into a continuous analog waveform; A correction circuit that calculates and stores a correction constant; A correction circuit that corrects the output signal of the measuring device based on the correction constant; and A correction circuit that integrates the corrected front analog waveform to separate the printing section and the printed section. An ink supply amount measuring device comprising: a circuit for measuring an area ratio of printed parts and non-printed parts in the measurement area; and a circuit for determining an ink supply amount based on the area ratio of printed parts and non-printed parts in the measurement area.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56115550A JPS5817308A (en) | 1981-07-23 | 1981-07-23 | Device for measuring amount of ink supply |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56115550A JPS5817308A (en) | 1981-07-23 | 1981-07-23 | Device for measuring amount of ink supply |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5817308A JPS5817308A (en) | 1983-02-01 |
| JPS637603B2 true JPS637603B2 (en) | 1988-02-17 |
Family
ID=14665310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56115550A Granted JPS5817308A (en) | 1981-07-23 | 1981-07-23 | Device for measuring amount of ink supply |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5817308A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2527939B2 (en) * | 1986-07-17 | 1996-08-28 | 東芝精機株式会社 | Method of measuring pattern area ratio of printing plate |
| JPH0280942A (en) * | 1988-09-17 | 1990-03-22 | Topcon Corp | Surface inspection apparatus |
| US5387976A (en) * | 1993-10-29 | 1995-02-07 | Hewlett-Packard Company | Method and system for measuring drop-volume in ink-jet printers |
| CA2737302C (en) * | 2006-04-28 | 2013-06-18 | Global Sensor Systems Inc. | Device for measuring package size |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3754822A (en) * | 1971-02-26 | 1973-08-28 | Xerox Corp | Scanning system |
| JPS5444914A (en) * | 1977-09-14 | 1979-04-09 | Mitsuo Tanaka | Method of easily adjusting ink in flat plate printing |
| JPS5654309A (en) * | 1979-10-11 | 1981-05-14 | Dainippon Printing Co Ltd | Device for measurement of pattern area from printed board for offset print |
-
1981
- 1981-07-23 JP JP56115550A patent/JPS5817308A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5817308A (en) | 1983-02-01 |
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