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JPS639859B2 - - Google Patents
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JPS639859B2 - - Google Patents

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Publication number
JPS639859B2
JPS639859B2 JP53148169A JP14816978A JPS639859B2 JP S639859 B2 JPS639859 B2 JP S639859B2 JP 53148169 A JP53148169 A JP 53148169A JP 14816978 A JP14816978 A JP 14816978A JP S639859 B2 JPS639859 B2 JP S639859B2
Authority
JP
Japan
Prior art keywords
radiation
angle
profile data
detector
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53148169A
Other languages
Japanese (ja)
Other versions
JPS5573245A (en
Inventor
Masahiro Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP14816978A priority Critical patent/JPS5573245A/en
Publication of JPS5573245A publication Critical patent/JPS5573245A/en
Publication of JPS639859B2 publication Critical patent/JPS639859B2/ja
Granted legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Description

【発明の詳細な説明】 この発明はコンピユータ断層撮影装置に関し、
特にいわゆる第2世代のコンピユータ断層撮影装
置の改良に関する。
[Detailed Description of the Invention] The present invention relates to a computer tomography device,
In particular, it relates to improvements in so-called second generation computerized tomography devices.

第2世代のコンピユータ断層撮影装置では、第
1図Aに示すように、X線管1と複数個のX線検
出器2とを対向配置し、広がり角度θで扇形に広
がつている複数本のX線ビームを前記各検出器2
により検出するようにしておく。そして撮影領域
3内に被写体(患者)4を配置し、この被写体4
に対し、X線管1と検出器2とを一体にして矢印
に示すように平行移動させる直線走査を行う。こ
の直線走査が1回終了すると第1図Bに示すよう
に、前記の扇形の広がり角度Θだけ、X線管1と
検出器2とを一体に、被写体4を中心として回転
させる。そしてこの回転した位置から、第2図B
の矢印で示すように、第1図Aの直線走査の方向
とは角度Θだけずれた方向に、逆方向に直線走査
が行われる。こうして角度Θだけ順次ずらしてい
つて直線走査を繰り返し、被写体4に対しあらゆ
る方向を向くX線ビームによる直線走査が行われ
ることになる。そして被写体4に対するあらゆる
方向のX線ビームによるプロフアイルデータが各
検出器2から得られる。
In the second generation computerized tomography apparatus, as shown in FIG. 1A, an X-ray tube 1 and a plurality of X-ray detectors 2 are arranged facing each other, and a plurality of X-ray tubes are spread out in a fan shape at a spread angle θ. The X-ray beam of
It should be detected by Then, a subject (patient) 4 is placed within the imaging area 3, and this subject 4
On the other hand, a linear scan is performed in which the X-ray tube 1 and the detector 2 are moved together in parallel as shown by the arrow. When this linear scan is completed once, as shown in FIG. 1B, the X-ray tube 1 and detector 2 are rotated together about the subject 4 by the fan-shaped spread angle Θ. From this rotated position, Figure 2B
As shown by the arrow in FIG. 1A, the linear scan is performed in a direction opposite to the direction of the linear scan in FIG. 1A by an angle Θ. In this way, the linear scanning is repeated by sequentially shifting the angle Θ, and the object 4 is linearly scanned by the X-ray beam pointing in all directions. Profile data from X-ray beams in all directions for the subject 4 is obtained from each detector 2.

ところでこの第2世代のコンピユータ断層撮影
装置でピンフアントムを撮影してみると、その像
は1点に収束せず、第2図に示すような星状等の
アーテイフアクト(偽像)がしばしば観察され
る。これは、第3図に示すようにX線管1に対し
て検出器2の現実の位置(実線で示す)が計算上
の位置(点線で示す)よりも遠くにあつたり、あ
るいは図示しないが近くにあつたり、X線管1の
現実の位置が計算上のそれよりも遠かつたり、近
かつたりするという、X線管1及び検出器2の位
置ずれに起因して生じる。すなわち、このような
位置ずれがあると、X線ビームの方向が計算上の
ものと現実のものとで異なるにもかかわらずプロ
フアイルデータの演算処理はあくまで計算上の値
に従つて行われてしまうからである。このアーテ
イフアクトは著しく画質を低下させるため、位置
ずれをなくして生じないようにするのが好ましい
が、実際の機構においてはわずかな位置ずれをも
生じないようにすることは極めて困難なことであ
る。
By the way, when this second-generation computerized tomography system is used to image a pin-phantom, the image does not converge to one point, and artifacts such as star-shaped images are often observed as shown in Figure 2. be done. This may be caused by the fact that the actual position of the detector 2 (indicated by the solid line) is farther from the X-ray tube 1 than the calculated position (indicated by the dotted line), as shown in FIG. This occurs due to positional deviations between the X-ray tube 1 and the detector 2, such that the actual position of the X-ray tube 1 is farther or closer than the calculated position. In other words, when there is such a positional shift, the calculation processing of the profile data is performed according to the calculated value even though the calculated direction of the X-ray beam is different from the actual direction. This is because it will be put away. Since this artifact significantly degrades image quality, it is preferable to eliminate positional deviation to prevent it from occurring, but in actual mechanisms it is extremely difficult to prevent even the slightest positional deviation from occurring. be.

本発明は上記に鑑み、機構的に放射線源や検出
器の位置ずれがあつたとしても、アーテイフアク
トが生じないよう改善したコンピユータ断層撮影
装置を提供することを目的とする。
In view of the above, an object of the present invention is to provide a computerized tomography apparatus that is improved so that artifacts do not occur even if there is a mechanical displacement of the radiation source or the detector.

以下本発明の一実施例について説明する。第4
図に示すように、検出器2の計算上の位置(点線
で示す)に対し実際の位置(実線で示す)が遠方
にずれている場合につき説明する。X線ビームの
広がり角度(計算上)をθとし、各ビーム間の角
度をΔθ(等角度)とする。また、検出器2の回転
運動は、角度2Δθ、4Δθ等が考えられるが、ここ
ではたとえば角度Δθとする。すなわち第4図で
はX線管1及び検出器2はまず実線の位置(方
向)で直線走査を行つた後、角度3ΔΘだけ回転
させられた後2点鎖線で示す位置(方向)で直線
走査を行なう。第1回目の直線走査でB11、B12
B13、B14、B15の5つのX線ビーム方向に対応す
る5個のプロフアイルデータが得られ、第2回目
ではB21、B22、B23、B24、B25の5つのX線ビー
ム方向に対応する5個のプロフアイルデータが得
られる。第1回目のB11、B12に対応するプロフ
アイルデータは、計算上のX線ビーム方向R1
R2のものとして処理される筈のものである。と
ころで第2回目のB24、B25に対応するプロフア
イルデータは、回転角度が3ΔΘであるから、本
来(位置ずれがなかつたならば)B24はR1に、
B25はR2にぴつたり重なる筈のものであり、それ
故、計算上はR1、R2に対応するものとして処理
されるべきものである。この第1回目と第2回目
とで得られるプロフアイルデータのうち、計算上
の同一X線ビーム方向のものを平均値化する。す
ると、検出器2は、X線管1に対し、第1回目と
第2回目の直線走査で同じじように遠い方向にず
れているのであるから、第1回目の実際のX線ビ
ームB11、B12は計算上のX線ビームR1、R2の右
側にずれ、第2回目の実際のX線ビームB24
B25は計算上のX線ビームR1、R2の左側にずれ、
両者のずれは必ず反対方向になる。そのため平均
値化することによりB11とB24、B12とB25のそれ
ぞれの中間の方向すなわち計算上のX線ビーム方
向R1、R2のものと見做せるプロフアイルデータ
が得られる。
An embodiment of the present invention will be described below. Fourth
As shown in the figure, a case will be described in which the actual position (indicated by a solid line) of the detector 2 is far away from the calculated position (indicated by a dotted line). Let the spread angle (calculated) of the X-ray beam be θ, and the angle between each beam be Δθ (equal angle). Further, although the rotational movement of the detector 2 may be at an angle of 2Δθ, 4Δθ, etc., here, for example, the angle is assumed to be Δθ. In other words, in FIG. 4, the X-ray tube 1 and detector 2 first perform linear scanning at the position (direction) indicated by the solid line, and then rotated by an angle of 3ΔΘ and then perform linear scanning at the position (direction) indicated by the two-dot chain line. Let's do it. In the first linear scan, B 11 , B 12 ,
Five profile data corresponding to the five X-ray beam directions of B 13 , B 14 , and B 15 were obtained, and in the second time, five X-ray beam directions of B 21 , B 22 , B 23 , B 24 , and B 25 were obtained. Five pieces of profile data corresponding to the line beam direction are obtained. The profile data corresponding to the first B 11 and B 12 is the calculated X-ray beam direction R 1 ,
It is supposed to be treated as R2 . By the way, the second profile data corresponding to B 24 and B 25 has a rotation angle of 3ΔΘ, so originally (if there was no positional deviation) B 24 would be in R 1 ,
B 25 should overlap R 2 exactly, and therefore should be treated as corresponding to R 1 and R 2 in calculations. Among the profile data obtained in the first and second times, the data in the same calculated X-ray beam direction are averaged. Then, since the detector 2 is shifted in the same far direction with respect to the X-ray tube 1 in the first and second linear scans, the first actual X-ray beam B 11 , B 12 is shifted to the right side of the calculated X-ray beams R 1 and R 2 , and the second actual X-ray beam B 24 ,
B 25 is shifted to the left of the calculated X-ray beams R 1 and R 2 ,
The deviation between the two is always in the opposite direction. Therefore, by averaging, profile data can be obtained that can be considered to be from directions intermediate between B 11 and B 24 and B 12 and B 25 , that is, the calculated X-ray beam directions R 1 and R 2 .

こうして計算上の1X線ビーム方向のプロフア
イルデータを、2直線走査により得た2個のプロ
フアイルデータを平均値化することにより得るこ
とによつて、位置ずれの補正ができる。すなわ
ち、例えば第5図に示すように各検出器2からの
プロフアイルデータをプリアンプ5を通して平均
値化回路6に送つて上述の演算を全ての直線走査
について行ない、その後コンボリユーシヨン回路
7及びバツクプロジエクシヨン回路8により処理
し、CRT9により表示すれば、アーテイフアク
トのない画像を得ることができる。
In this way, positional deviation can be corrected by obtaining calculated profile data in one X-ray beam direction by averaging two profile data obtained by two linear scans. That is, for example, as shown in FIG. 5, the profile data from each detector 2 is sent to the averaging circuit 6 through the preamplifier 5, and the above-mentioned calculation is performed for all linear scans, and then the profile data is sent to the convolution circuit 7 and back. If the image is processed by the projection circuit 8 and displayed by the CRT 9, an image free of artifacts can be obtained.

上述の平均値化の操作によれば、位置ずれがど
のようなものであつても、計算上1X線ビーム方
向として扱われる実際の2本のX線ビームが計算
上のX線ビームの両側に必ず同じずれ角で生じる
ので、常に位置ずれを補正できることになる。
According to the above-mentioned averaging operation, no matter what the positional deviation, the two actual X-ray beams that are treated as one X-ray beam direction in the calculation will be on both sides of the calculated X-ray beam. Since the deviation always occurs at the same deviation angle, the positional deviation can always be corrected.

なお、X線ビームの扇形の広がり角度Θが大き
い場合には、周辺の検出器ほどX線ビームのずれ
角は大きくなり中央部ほど小さくなる。そのため
回転運動の角度をΘ/2付近としておくと、中央
部付近のX線ビーム方向の誤差は、平均値化操作
によりかえつて大きくなつてしまう。このような
場合には、第6図に示すように、ずれ角の大きい
周辺の何本(m本)かのX線ビームにつき平均値
化操作を行なうようにすればよい。そのために
は、回転運動の角度を(n−m)ΔΘとし(nは
1直線走査におけるX線ビーム数、(n−1)Δθ
=Θ)、周辺のm本についてのみ隣接する2直線
走査で重なるように、回転運動の角度をΘ/2よ
りは大きくなるよう調整する。こうすると、全体
の走査時間も短くなつて好ましい。
Note that when the fan-shaped spread angle Θ of the X-ray beam is large, the deviation angle of the X-ray beam becomes larger at the peripheral detectors and becomes smaller at the center. Therefore, if the angle of rotational movement is set to around Θ/2, the error in the direction of the X-ray beam near the center will become larger due to the averaging operation. In such a case, as shown in FIG. 6, an averaging operation may be performed for several (m) X-ray beams around the large deviation angle. To do this, the angle of rotational movement is (n-m)ΔΘ (n is the number of X-ray beams in one linear scan, (n-1)Δθ
= Θ), the angle of the rotational movement is adjusted to be larger than Θ/2 so that only two adjacent linear scans overlap with respect to m peripheral lines. This is preferable because the overall scanning time is also shortened.

以上実施例について説明したように、本発明に
よれば、放射線源や放射線検出器に機構的な位置
ずれがあつたとしてもこれを補正してアーテイフ
アクトを生ぜしめないようにするコンピユータ断
層撮影装置が得られる。そのため、放射線源の焦
点や放射線検出器の位置合わせの調整が容易とな
る。
As described above with respect to the embodiments, according to the present invention, even if there is a mechanical positional shift in a radiation source or a radiation detector, the computer tomography system corrects this and prevents artifacts from occurring. A device is obtained. Therefore, it becomes easy to adjust the focus of the radiation source and the alignment of the radiation detector.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図A,Bは第2世代のコンピユータ断層撮
影装置における放射線ビームの走査を説明するた
めの模式図、第2図はアーテイフアクトを示す
図、第3図は位置ずれ状態を説明するための模式
図、第4図は本発明の一実施例における放射線ビ
ームの方向を示すための模式図、第5図は一実施
例のデータ処理系統を示すブロツク図、第6図は
他の実施例における放射線ビームの方向を示すた
めの模式図である。 1……X線管、2……X線検出器、3……撮影
領域、4……被写体、5……プリアンプ、6……
平均値化回路、7……コンボリユーシヨン回路、
8……バツクプロジエクシヨン回路、9……
CRT。
Figures 1A and B are schematic diagrams for explaining scanning of a radiation beam in a second-generation computer tomography system, Figure 2 is a diagram showing artifacts, and Figure 3 is a diagram for explaining positional deviation states. 4 is a schematic diagram showing the direction of the radiation beam in one embodiment of the present invention, FIG. 5 is a block diagram showing the data processing system of one embodiment, and FIG. 6 is another embodiment. FIG. 2 is a schematic diagram showing the direction of a radiation beam in FIG. 1...X-ray tube, 2...X-ray detector, 3...imaging area, 4...subject, 5...preamplifier, 6...
Averaging circuit, 7... Convolution circuit,
8... Back projection circuit, 9...
CRT.

Claims (1)

【特許請求の範囲】[Claims] 1 放射線源と複数個の放射線検出器とを対向配
置し、所定の広がり角度で扇形に広がつている複
数本の放射線ビームを前記各検出器により検出す
るようにし、前記放射線源と放射線検出器とを一
体に被写体に対し平行移動させる直線走査を行う
とともに、被写体に対し前記放射線源と放射線検
出器とを所定角度回転させ、この所定角度だけ異
なる方向に前記の直線走査を行ない、被写体のあ
らゆる方向において前記直線走査を行なうコンピ
ユータ断層撮影装置において、前記各直線走査方
向毎の回転角度を前記扇形の広がり角よりも小と
して、所定の計算上の放射線ビーム方向のプロフ
アイルデータを、1直線走査において前記放射線
ビーム方向のプロフアイルデータとして得られる
データと、隣接する他の1直線走査において同一
の放射線ビーム方向のプロフアイルデータとして
得られるデータとを、平均値化して得るようにし
たことを特徴とするコンピユータ断層撮影装置。
1. A radiation source and a plurality of radiation detectors are disposed facing each other so that each of the detectors detects a plurality of radiation beams spreading in a fan shape at a predetermined spread angle, and the radiation source and the radiation detector At the same time, the radiation source and the radiation detector are rotated by a predetermined angle with respect to the object, and the linear scan is performed in a direction that differs by this predetermined angle. In a computer tomography apparatus that performs the linear scanning in the direction, the rotation angle for each linear scanning direction is smaller than the spread angle of the fan shape, and profile data in a predetermined calculated radiation beam direction is scanned in one linear scan. The data obtained as the profile data in the radiation beam direction in the step and the data obtained as the profile data in the same radiation beam direction in another adjacent linear scan are averaged to obtain the data. Computerized tomography equipment.
JP14816978A 1978-11-30 1978-11-30 Computer tomographing device Granted JPS5573245A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14816978A JPS5573245A (en) 1978-11-30 1978-11-30 Computer tomographing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14816978A JPS5573245A (en) 1978-11-30 1978-11-30 Computer tomographing device

Publications (2)

Publication Number Publication Date
JPS5573245A JPS5573245A (en) 1980-06-02
JPS639859B2 true JPS639859B2 (en) 1988-03-02

Family

ID=15446787

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14816978A Granted JPS5573245A (en) 1978-11-30 1978-11-30 Computer tomographing device

Country Status (1)

Country Link
JP (1) JPS5573245A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019098153A1 (en) 2017-11-15 2019-05-23 株式会社クラレ (meth)acrylic block copolymer, and active-energy-ray-curable composition containing same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1468810A (en) * 1973-05-05 1977-03-30 Emi Ltd Radiography

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019098153A1 (en) 2017-11-15 2019-05-23 株式会社クラレ (meth)acrylic block copolymer, and active-energy-ray-curable composition containing same

Also Published As

Publication number Publication date
JPS5573245A (en) 1980-06-02

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