JPS643025B2 - - Google Patents
Info
- Publication number
- JPS643025B2 JPS643025B2 JP11707578A JP11707578A JPS643025B2 JP S643025 B2 JPS643025 B2 JP S643025B2 JP 11707578 A JP11707578 A JP 11707578A JP 11707578 A JP11707578 A JP 11707578A JP S643025 B2 JPS643025 B2 JP S643025B2
- Authority
- JP
- Japan
- Prior art keywords
- ion
- magnetic field
- mass
- electric field
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
【発明の詳細な説明】
本発明は磁場偏向型の質量分析装置に関する。
磁場の強さを変化させて質量数の走査を行う型の
質量分析装置では質量数走査の速さを余り速くで
きない欠点がある。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a magnetic field deflection type mass spectrometer.
A type of mass spectrometer that scans mass numbers by changing the strength of a magnetic field has the disadvantage that the speed of mass number scanning cannot be very fast.
本発明は磁場偏向型の質量分析装置であつて、
しかも質量数の走査を高速に行い得る質量分析装
置を提供しようとするものである。 The present invention is a magnetic field deflection type mass spectrometer, comprising:
Furthermore, the present invention aims to provide a mass spectrometer that can scan mass numbers at high speed.
本発明質量分析装置は質量分散用磁場の強度を
時間的に一定とし、この磁場へのイオン入射側と
イオン射出側の何れか或は両側に夫々イオン軌道
を偏向させる電場を形成し、これらの電場を変化
させることによつて質量数走査を行うようにした
ものである。以下実施例によつて本発明を説明す
る。 The mass spectrometer of the present invention keeps the intensity of the magnetic field for mass dispersion constant over time, forms electric fields that deflect ion trajectories on either or both sides of the ion incidence side and the ion exit side of the magnetic field. Mass number scanning is performed by changing the electric field. The present invention will be explained below with reference to Examples.
第1図において、1は質量分散用磁場への入射
イオン軌道、2は質量分散用磁場を形成する磁石
の磁極端面を示す。質量分散用磁場においてAは
イオン入射端面、Bはイオン射出端面で両者はイ
オン入射点0をはさんで135゜の角で交つており、
イオンビーム1は入射端面Aに垂直に入射し、イ
オンは円軌道を画いて磁場中を進み入射ビーム1
に対して90゜偏向されて射出端面Bより出る。磁
場内におけるイオンの軌道半径rは磁場の強さを
B、イオンの質量数をM、イオン加速電圧をVと
すると
Br=143.9√
で与えられる。図でr1は分析可能な質量数範囲
内の最小質数のイオンの軌道半径、r2は同じく
最大質量数のイオンの軌道半径である。 In FIG. 1, numeral 1 indicates the trajectory of an ion incident on a mass dispersion magnetic field, and 2 indicates a magnetic pole end face of a magnet forming the mass dispersion magnetic field. In the mass dispersion magnetic field, A is the ion entrance end face, B is the ion exit end face, and they intersect at an angle of 135° with the ion incidence point 0 in between.
The ion beam 1 is incident perpendicularly to the incident end surface A, and the ions advance through the magnetic field in a circular orbit, forming the incident beam 1.
It exits from the injection end face B after being deflected by 90°. The orbital radius r of an ion in a magnetic field is given by Br=143.9√, where B is the strength of the magnetic field, M is the mass number of the ion, and V is the ion acceleration voltage. In the figure, r1 is the orbital radius of the ion with the minimum mass number within the analyzable mass number range, and r2 is the orbital radius of the ion with the maximum mass number.
質量分散用磁場の射出端面Bに対向してこれと
平行に平板電極3が配置され、また射出端面Bを
右方に延長した形で平板電極2′が配置されてお
り、磁場形成用磁石2及び平板電極2′は共に接
地されて電位0になつており、電極3にUボルト
の電位が与えてあり、図で上下方向に電場が形成
されている。4は電極2,2′と3との間にあつ
て電場の電極端付近の乱れを防ぐための電極であ
る。イオンは磁場の射出端面Bより45゜の角度を
なして電極2,2′と3との間の空間に射出し、
そこの電場によつて下方へ曲げられて放物線の軌
道を画き電極2′に衝突する。イオンは0点から
磁場内に入りその質量数によつてP1点からP2点
の間で射出端面Bより電場内に射出する。これら
のイオンは電極2,2′と3との間の電圧Uを変
えることにより順次0′点に到達するようにするこ
とができる。電極板2′には0′点の所に窓Wが穿
つてあり、0′点に到達したイオンはイオン検出用
のエレクトロンマルチプライヤ5に入射し検出さ
れるようになつている。一般にイオンの磁場射出
端面Bよりの射出点と0′点との間の距離をxと
し、電極2,2′と3との間の電場の強さをEと
し、イオン加速電圧をVとすると、
x=2V/E 或はE=2V/x
の関係が成立する。0点と0′との間の距離をLと
すると資量分散磁場内で半径rの円軌道を画いた
イオンの同磁場射出点から0′までの距離xは(L
−√2r)であり、rは143.9√で与え
られるので
x=L−203.5√/B=2V/E
である。上式よりEを連続的に変えることにより
(磁場B、イオン加速電圧Vは固定したまゝ)
0′点に到達するイオンの質量数を連続的に変える
ことができる。即ち電極2,2′と3との間に与
える電圧Uを変えることにより質量数の走査を行
うことができる。 A flat plate electrode 3 is arranged facing and parallel to the exit end face B of the mass dispersion magnetic field, and a flat plate electrode 2' is arranged to extend the exit end face B to the right, and the magnetic field forming magnet 2 Both the plate electrode 2' and the plate electrode 2' are grounded and have a potential of 0, and a potential of U volt is applied to the electrode 3, so that an electric field is formed in the vertical direction in the figure. An electrode 4 is located between the electrodes 2, 2' and 3 to prevent disturbance of the electric field near the electrode ends. The ions are ejected into the space between the electrodes 2, 2' and 3 at an angle of 45° from the exit end face B of the magnetic field.
It is bent downward by the electric field there, follows a parabolic trajectory, and collides with the electrode 2'. Ions enter the magnetic field from point 0 and are ejected into the electric field from the exit end surface B between points P1 and P2 depending on their mass number. These ions can be made to reach the 0' point one after another by changing the voltage U between the electrodes 2, 2' and 3. The electrode plate 2' is provided with a window W at the 0' point, so that ions that have reached the 0' point enter an electron multiplier 5 for ion detection and are detected. Generally, if the distance between the ion emission point from the magnetic field emission end surface B and the 0' point is x, the strength of the electric field between electrodes 2, 2' and 3 is E, and the ion acceleration voltage is V. , x=2V/E or E=2V/x. Letting the distance between 0 point and 0' be L, the distance x from the emission point of the ion in the same magnetic field to 0', which has drawn a circular orbit of radius r in the resource dispersion magnetic field, is (L
-√2r), and since r is given by 143.9√, x=L−203.5√/B=2V/E. By continuously changing E from the above formula (magnetic field B and ion acceleration voltage V remain fixed)
The mass number of ions reaching the 0′ point can be changed continuously. That is, by changing the voltage U applied between the electrodes 2, 2' and 3, the mass number can be scanned.
第2図は本発明の他の実施例を示す。2は質量
分散用磁場を作る磁石の磁極端面、2,3は相対
向した平行平板電極で、磁極端面2の頂点が平板
電極2′に接しており、電極2′は接地され電極3
に電圧Uが与えてある。1は入射イオンビームで
イオンは加速電圧Vで加速されている。イオンビ
ーム1は平板電極2′に対して45゜の角度で電極
2′及び3の間の電場内に進入し放物線を画いて
再び電極2′の(図の)上側に出る。電極板2′に
は図の紙面に沿つてスリツトが切つてあつてイオ
ンは自由に電極2′,3間に出入できるるように
してある。イオンが電場内で画く放物線はイオン
の有する電荷及び運動のエネルギーが同一であれ
ば質量数に関係なく同じ放物線になり、今の場合
イオン加速電圧が一定なので或る電極間電圧Uに
対して入射イオンが画く放物線は一本である。こ
の放物線を画いたイオンは電極板2′に対し45゜の
角度で極板2′の上側に出、その後質量分散用磁
石2の作る磁場内に進入する。この磁場は図示の
ように頂角90゜の三角形をなし入射イオンのうち
特定の質量数を有するイオンが磁場の入射端面A
に対し垂直に磁場内に入射し1/4円周の円軌道を
画いて射出端面Bに垂直に磁場より射出して再び
電極2と3との間の電場内に進入する。イオンの
持つている運動のエネルギーは不変であるからこ
のイオンは再び先に画いたのと同形の放物線を画
いて定点0′で再々度電極板2′の上側に出る。
こゝで電極2′と3との間にかける電圧Uを掃引
すると小質量数のイオンに対して図示aの軌道
を、また大質量数のイオンに対して図示bの軌道
を画かせることができ、イオン検出器5に各質量
数のイオンを順次入射させることができ、一定磁
場強度の質量数分散用磁界を用いて質量数の走査
ができる。 FIG. 2 shows another embodiment of the invention. Reference numeral 2 denotes a magnetic pole end face of a magnet that creates a magnetic field for mass dispersion, 2 and 3 represent parallel plate electrodes facing each other, and the apex of the pole end face 2 is in contact with the flat plate electrode 2', and the electrode 2' is grounded and the electrode 3' is in contact with the flat plate electrode 2'.
A voltage U is given to . 1 is an incident ion beam, and ions are accelerated by an acceleration voltage V. The ion beam 1 enters the electric field between the electrodes 2' and 3 at an angle of 45 degrees with respect to the plate electrode 2', forms a parabola, and exits again above the electrode 2' (in the figure). A slit is cut in the electrode plate 2' along the plane of the drawing so that ions can freely enter and exit between the electrodes 2' and 3. The parabola drawn by an ion in an electric field will be the same parabola regardless of its mass number if the ion's charge and kinetic energy are the same.In this case, since the ion accelerating voltage is constant, the ion is incident for a certain interelectrode voltage U. The parabola drawn by the ion is one. The parabolic ions exit above the electrode plate 2' at an angle of 45 degrees with respect to the electrode plate 2', and then enter the magnetic field created by the mass dispersion magnet 2. This magnetic field has a triangular shape with an apex angle of 90° as shown in the figure, and ions with a specific mass number among the incident ions are located at the incident end face A of the magnetic field.
The light enters the magnetic field perpendicularly to the direction of the magnetic field, moves in a circular orbit of 1/4 circumference, is ejected from the magnetic field perpendicularly to the exit end face B, and enters the electric field between the electrodes 2 and 3 again. Since the kinetic energy of the ion remains unchanged, the ion again draws a parabola of the same shape as the one previously drawn and exits again and again to the upper side of the electrode plate 2' at the fixed point 0'.
By sweeping the voltage U applied between the electrodes 2' and 3, it is possible to draw the trajectory shown in the figure a for ions with a small mass number, and the trajectory shown in the figure b for ions with a large mass number. Ions of each mass number can be made to sequentially enter the ion detector 5, and mass numbers can be scanned using a mass number dispersion magnetic field with a constant magnetic field strength.
本発明質量分析装置は上述したように質量数分
散用磁場の強度を一定にしておきイオン軌道偏向
用電界を変化させて質量数走査を行うので高速走
査が可能となる。 As described above, the mass spectrometer of the present invention performs mass number scanning by keeping the strength of the magnetic field for mass number dispersion constant and changing the electric field for deflecting ion orbits, so that high-speed scanning is possible.
第1図は本発明の一実施例の平面図、第2図は
本発明の他の実施例の平面図である。
1……入射イオンビーム、2……質量分散用磁
場を形成する磁石の磁極端面、2′,3……平行
平板電極、5……イオン検出器。
FIG. 1 is a plan view of one embodiment of the invention, and FIG. 2 is a plan view of another embodiment of the invention. DESCRIPTION OF SYMBOLS 1...Incoming ion beam, 2...Pole end face of a magnet forming a magnetic field for mass dispersion, 2', 3...Parallel plate electrode, 5...Ion detector.
Claims (1)
ン入射及びイオン出射側のうち少なくともイオン
出射側の空間に形成されたイオン軌道偏向収束用
電場とを有し、上記磁場により形成された質量ス
ペクトル像を上記電場によつて再結像し、電場の
強さを変化させることにより、イオン検出器前面
で上記電場により再結像されたスペクトル像をそ
の像面に沿つて移動させるようにして異なる質量
のイオンがイオン検出器に入射せしめられるよう
にした質量分析装置。1 A mass spectrum having a mass dispersion magnetic field of constant strength and an ion trajectory deflection/focusing electric field formed in a space on at least the ion exit side of the ion entrance and ion exit sides of the same magnetic field, and formed by the above magnetic field. The image is re-imaged by the electric field, and the intensity of the electric field is changed so that the spectral image re-imaged by the electric field is moved along the image plane in front of the ion detector. A mass spectrometer that allows a mass of ions to enter an ion detector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11707578A JPS5543773A (en) | 1978-09-22 | 1978-09-22 | Mass spectroscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11707578A JPS5543773A (en) | 1978-09-22 | 1978-09-22 | Mass spectroscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5543773A JPS5543773A (en) | 1980-03-27 |
| JPS643025B2 true JPS643025B2 (en) | 1989-01-19 |
Family
ID=14702779
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11707578A Granted JPS5543773A (en) | 1978-09-22 | 1978-09-22 | Mass spectroscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5543773A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6126510U (en) * | 1984-07-23 | 1986-02-17 | 均 中井 | Healthy underwear for the lower body |
| JPS6182618U (en) * | 1984-11-02 | 1986-05-31 | ||
| JPS6284414U (en) * | 1985-11-15 | 1987-05-29 | ||
| JPH01213950A (en) * | 1988-02-23 | 1989-08-28 | Jeol Ltd | Mass analyzer and ms/ms device using same |
-
1978
- 1978-09-22 JP JP11707578A patent/JPS5543773A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5543773A (en) | 1980-03-27 |
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