JPH0125227B2 - - Google Patents
Info
- Publication number
- JPH0125227B2 JPH0125227B2 JP16456780A JP16456780A JPH0125227B2 JP H0125227 B2 JPH0125227 B2 JP H0125227B2 JP 16456780 A JP16456780 A JP 16456780A JP 16456780 A JP16456780 A JP 16456780A JP H0125227 B2 JPH0125227 B2 JP H0125227B2
- Authority
- JP
- Japan
- Prior art keywords
- capacitance
- terminal
- semiconductor integrated
- semiconductor
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
- Wire Bonding (AREA)
- Lead Frames For Integrated Circuits (AREA)
Description
【発明の詳細な説明】
本発明は基板上に複数個のメモリ等の半導体回
路素子を配設し、それぞれを電気的に接続した半
導体回路装置の改良に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in a semiconductor circuit device in which a plurality of semiconductor circuit elements such as memories are arranged on a substrate and are electrically connected to each other.
第1図は、半導体集積回路素子の接続端子を示
した図であり、1は半導体集積回路本体(以下
「IC」と呼ぶ)、2,3はその入出力ピンである。
これらの入出力ピンの静電容量はそのピンが配設
される位置によつてそれぞれ異なる。例えば、前
ピン2の静電容量C1は小さく、ピン3の静電容
量C2は大きくなる。 FIG. 1 is a diagram showing connection terminals of a semiconductor integrated circuit element, in which 1 is a semiconductor integrated circuit main body (hereinafter referred to as "IC"), and 2 and 3 are its input/output pins.
The capacitance of these input/output pins differs depending on the position where the pin is arranged. For example, the capacitance C 1 of front pin 2 is small, and the capacitance C 2 of pin 3 is large.
従来、前記のような入出力ピンを有するIC1
の複数個を、第2図に示されるように、ハイブリ
ツド基板4に実装し、前記IC1のピン2及び3
を共通的に接続してハイブリツドIC回路の共通
入出力ピン5及び6を構成している。 Conventionally, IC1 having input/output pins as described above
A plurality of ICs are mounted on the hybrid board 4 as shown in FIG.
are commonly connected to constitute common input/output pins 5 and 6 of the hybrid IC circuit.
このようなハイブリツド回路では、前記IC1
の個数をN個とすれば、ピン5から見た内部静電
容量はピン2の有する静電容量のN倍となり、同
様にピン6から見た内部容量はピン3の有する静
電容量のN倍となる。しかるに、ピン5とピン6
の静電容量の差は内部IC1のピン2と3の間の
静電容量差のN倍となる。一般に電気回路素子の
動作においてその素子の各ピン間の静電容量差が
大きいことは、動作速度の大小を招く結果とな
り、不都合な問題となる。しかしながら、ハイブ
リツド回路の従来の技術では配線パターンの規則
的な利点や設計の容易さのため、前記のような性
能的な問題があるにもかかわらず使用されるが、
特に、高速記憶素子のハイブリツド回路等ではこ
の問題が重要になる。 In such a hybrid circuit, the IC1
If the number of is N, then the internal capacitance seen from pin 5 is N times the capacitance of pin 2, and similarly the internal capacitance seen from pin 6 is N times the capacitance of pin 3. It will be doubled. However, pin 5 and pin 6
The difference in capacitance is N times the difference in capacitance between pins 2 and 3 of internal IC1. Generally, in the operation of an electric circuit element, a large difference in capacitance between the pins of the element causes an increase or decrease in operation speed, resulting in an inconvenient problem. However, in the conventional technology of hybrid circuits, it is used despite the above-mentioned performance problems due to the advantages of regular wiring patterns and ease of design.
This problem becomes particularly important in hybrid circuits of high-speed memory elements.
本発明の目的は前記問題を解消した半導体回路
装置を提供することにある。 An object of the present invention is to provide a semiconductor circuit device that solves the above problems.
以下実施例により本発明を詳細に説明する。 The present invention will be explained in detail below with reference to Examples.
なお、第3図及び第4図において、第2図と同
等の機能を有するものは同一記号を付してある。 In FIGS. 3 and 4, parts having the same functions as those in FIG. 2 are given the same symbols.
第3図は本発明の一実施例の回路構成図であ
り、基板(ボードでもよい)4の上にIC1が複
数個配設され、それぞれIC1の静電容量小のピ
ン2と静電容量大のピン3とが交互に接続されて
ハイブリツド基板4の入出力ピン5及び6を構成
したものである。IC1の静電容量小のピン2や
静電容量大のピン3はIC1の設計時のパターン
や各層膜の構成によりあらかじめ知られているの
で、ハイブリツド基板4においてピン5とピン6
の静電容量の差が小さくなるように内部のIC1
の各ピンを選択接続することは容易にできる。ま
た内部のIC1の個数やピンの数は偶数でも奇数
でもよい。このように、内部IC1の各入出力ピ
ンの静電容量があらかじめ知られている場合に、
各ピン2及び3を共通接続するときに、その接続
後の総合静電容量のバラツキが最も小さくなるよ
うに基板4の上で各IC1の静電容量の小のピン
2と大のピン3とを選択してやることにより、バ
イブリツド基板4の入出力ピン5,6の間での静
電容量のバラツキを小さくすることができる。 FIG. 3 is a circuit configuration diagram of an embodiment of the present invention, in which a plurality of ICs 1 are arranged on a substrate (or a board) 4, and pins 2 of IC 1 have a small capacitance and pins 2 have a large capacitance. The input/output pins 5 and 6 of the hybrid board 4 are configured by alternately connecting the pins 3 and 3 of the hybrid board 4. Pin 2 with a small capacitance and pin 3 with a large capacitance of IC1 are known in advance from the design pattern of IC1 and the configuration of each layer, so pins 5 and 6 on the hybrid board 4
internal IC1 so that the difference in capacitance between
It is easy to select and connect each pin. Further, the number of internal IC1s and the number of pins may be an even number or an odd number. In this way, when the capacitance of each input/output pin of internal IC1 is known in advance,
When connecting pins 2 and 3 in common, pin 2 with a small capacitance and pin 3 with a large capacitance of each IC 1 are connected on the board 4 so that the variation in total capacitance after connection is minimized. By selecting this, it is possible to reduce variations in capacitance between the input/output pins 5 and 6 of the hybrid board 4.
第4図は本発明の他の実施例の構成図であり、
第3図の実施例の入出力ピン5と6の間の静電容
量のバラツキを補正するためにハイブリツド基板
4内に補正用静電容量7を入出力ピン5若しくは
入出力ピン6の共通線に接続し、入出力静電容量
の均一化をより正確にしたものである。 FIG. 4 is a configuration diagram of another embodiment of the present invention,
In order to correct variations in capacitance between input/output pins 5 and 6 in the embodiment shown in FIG. This makes it possible to more accurately equalize input and output capacitance.
なお、本実施例ではハイブリツド回路に本発明
を適用したが、他の半導体回路素子の複数個をボ
ード等の基板上に配設する装置においても、本発
明を適用できることは言うまでもない。 Although the present invention is applied to a hybrid circuit in this embodiment, it goes without saying that the present invention can also be applied to other devices in which a plurality of semiconductor circuit elements are arranged on a substrate such as a board.
以上説明したように、本発明によれば、複数個
の半導体回路素子を基板上に配設して電気的に接
続した半導体装置においても入出力ピン間の入出
力静電容量の差を小さくすることによりほぼ均一
にすることができるので、特性の向上及び設計上
のマージンの向上ができる。よつて高速記憶素子
のハイブリツドIC回路等においても高性能のも
のが提供できる。 As explained above, according to the present invention, the difference in input and output capacitance between input and output pins can be reduced even in a semiconductor device in which a plurality of semiconductor circuit elements are arranged on a substrate and electrically connected. As a result, it is possible to make the film substantially uniform, thereby improving characteristics and design margins. Therefore, high performance can also be provided in hybrid IC circuits for high-speed memory elements.
第1図は半導体集積回路素子の接続端子を示し
た図、第2図は従来のハイブリツドIC1回路の
接続図、第3図は本発明の一実施例の回路接続
図、第4図は本発明の他の実施例の回路接続図で
ある。
1……半導体集積回路素子、2,3……入出力
ピン、4……ハイブリツド基板、5,6……共通
入出力ピン、7……補正用静電容量。
Fig. 1 is a diagram showing connection terminals of a semiconductor integrated circuit element, Fig. 2 is a connection diagram of a conventional hybrid IC 1 circuit, Fig. 3 is a circuit connection diagram of an embodiment of the present invention, and Fig. 4 is a diagram of the present invention. FIG. 3 is a circuit connection diagram of another embodiment. 1... Semiconductor integrated circuit element, 2, 3... Input/output pin, 4... Hybrid board, 5, 6... Common input/output pin, 7... Correction capacitance.
Claims (1)
的小さい静電容量を持つ第2端子とを持つ第1半
導体集積回路と、比較的大きい静電容量を持つ第
1端子と比較的小さい静電容量を持つ第2端子と
を持つ第2半導体集積回路と、第1、第2共通配
線とを備え、上記第1半導体集積回路の第1端子
と上記第2半導体集積回路の第2端子とが上記第
1共通配線に結合され、上記第1半導体集積回路
の第2端子と上記第2半導体集積回路の第1端子
が上記第2共通配線に結合されてなることを特徴
とする半導体回路装置。 2 上記第1、第2半導体集積回路が互いに対応
されるべき配置の端子を持つメモリを構成してな
ることを特徴とする特許請求の範囲第1項記載の
半導体回路装置。 3 上記第1、第2端子がそれぞれ入出力端子を
構成してなることを特徴とする特許請求の範囲第
1項又は第2項記載の半導体回路装置。 4 複数の共通配線と、それぞれ上記共通配線に
結合されるべき複数の端子を持ち上記各端子の静
電容量が一様でない複数の半導体集積回路とを備
えてなり、上記複数の共通配線の少なくとも1つ
に、共通配線の相互の静電容量の差を減少せしめ
るように補正用静電容量が付加されるようにされ
てなることを特徴とする特許請求の範囲第1項記
載の半導体回路装置。[Claims] 1. A first semiconductor integrated circuit having a first terminal having a relatively large capacitance and a second terminal having a relatively small capacitance; a second semiconductor integrated circuit having a terminal and a second terminal having a relatively small capacitance, and first and second common wiring, the first terminal of the first semiconductor integrated circuit and the second semiconductor integrated circuit A second terminal of the circuit is coupled to the first common wiring, and a second terminal of the first semiconductor integrated circuit and a first terminal of the second semiconductor integrated circuit are coupled to the second common wiring. Characteristic semiconductor circuit device. 2. The semiconductor circuit device according to claim 1, wherein the first and second semiconductor integrated circuits constitute a memory having terminals arranged to correspond to each other. 3. The semiconductor circuit device according to claim 1 or 2, wherein the first and second terminals each constitute an input/output terminal. 4 comprising a plurality of common wirings and a plurality of semiconductor integrated circuits each having a plurality of terminals to be coupled to the common wirings, the capacitance of each of the terminals being uneven, and at least one of the plurality of common wirings. First, the semiconductor circuit device according to claim 1, wherein a correction capacitance is added to reduce the difference in capacitance between the common wirings. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16456780A JPS5789231A (en) | 1980-11-25 | 1980-11-25 | Semiconductor circuit device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16456780A JPS5789231A (en) | 1980-11-25 | 1980-11-25 | Semiconductor circuit device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5789231A JPS5789231A (en) | 1982-06-03 |
| JPH0125227B2 true JPH0125227B2 (en) | 1989-05-16 |
Family
ID=15795614
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16456780A Granted JPS5789231A (en) | 1980-11-25 | 1980-11-25 | Semiconductor circuit device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5789231A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5714564B2 (en) * | 2009-03-30 | 2015-05-07 | クゥアルコム・インコーポレイテッドQualcomm Incorporated | Integrated circuit chip using top post-passivation technology and bottom structure technology |
-
1980
- 1980-11-25 JP JP16456780A patent/JPS5789231A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5789231A (en) | 1982-06-03 |
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