JPH0125790B2 - - Google Patents
Info
- Publication number
- JPH0125790B2 JPH0125790B2 JP55164598A JP16459880A JPH0125790B2 JP H0125790 B2 JPH0125790 B2 JP H0125790B2 JP 55164598 A JP55164598 A JP 55164598A JP 16459880 A JP16459880 A JP 16459880A JP H0125790 B2 JPH0125790 B2 JP H0125790B2
- Authority
- JP
- Japan
- Prior art keywords
- weight
- parts
- epoxy resin
- curing agent
- resist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007747 plating Methods 0.000 claims description 58
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 claims description 42
- 239000003795 chemical substances by application Substances 0.000 claims description 38
- 239000000126 substance Substances 0.000 claims description 33
- 239000003822 epoxy resin Substances 0.000 claims description 26
- 229920000647 polyepoxide Polymers 0.000 claims description 26
- 150000004982 aromatic amines Chemical class 0.000 claims description 18
- 239000003112 inhibitor Substances 0.000 claims description 13
- 239000000203 mixture Substances 0.000 claims description 9
- 239000000945 filler Substances 0.000 claims description 8
- 239000004593 Epoxy Substances 0.000 claims description 7
- 239000003960 organic solvent Substances 0.000 claims description 6
- UMGDCJDMYOKAJW-UHFFFAOYSA-N thiourea Chemical compound NC(N)=S UMGDCJDMYOKAJW-UHFFFAOYSA-N 0.000 claims description 6
- 239000013008 thixotropic agent Substances 0.000 claims description 6
- 230000009974 thixotropic effect Effects 0.000 claims description 5
- CMGDVUCDZOBDNL-UHFFFAOYSA-N 4-methyl-2h-benzotriazole Chemical compound CC1=CC=CC2=NNN=C12 CMGDVUCDZOBDNL-UHFFFAOYSA-N 0.000 claims description 3
- XSQUKJJJFZCRTK-UHFFFAOYSA-N Urea Natural products NC(N)=O XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 claims description 3
- 239000012964 benzotriazole Substances 0.000 claims description 3
- 150000003852 triazoles Chemical class 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 2
- 238000002156 mixing Methods 0.000 claims 7
- YXIWHUQXZSMYRE-UHFFFAOYSA-N 1,3-benzothiazole-2-thiol Chemical compound C1=CC=C2SC(S)=NC2=C1 YXIWHUQXZSMYRE-UHFFFAOYSA-N 0.000 claims 2
- 239000011248 coating agent Substances 0.000 description 46
- 238000000576 coating method Methods 0.000 description 46
- 239000000976 ink Substances 0.000 description 35
- 238000000034 method Methods 0.000 description 20
- 229920005989 resin Polymers 0.000 description 17
- 239000011347 resin Substances 0.000 description 17
- 239000000243 solution Substances 0.000 description 13
- 239000002184 metal Substances 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000004020 conductor Substances 0.000 description 9
- 229910000679 solder Inorganic materials 0.000 description 9
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 8
- 239000007788 liquid Substances 0.000 description 8
- 239000000758 substrate Substances 0.000 description 7
- -1 trimethylhexamethylene Chemical group 0.000 description 7
- 239000010949 copper Substances 0.000 description 6
- 238000005336 cracking Methods 0.000 description 6
- 238000005476 soldering Methods 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 239000002518 antifoaming agent Substances 0.000 description 4
- 239000003054 catalyst Substances 0.000 description 4
- 229920000298 Cellophane Polymers 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 3
- 239000000654 additive Substances 0.000 description 3
- 150000008064 anhydrides Chemical class 0.000 description 3
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 3
- 239000003086 colorant Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 229920002545 silicone oil Polymers 0.000 description 3
- QQZOPKMRPOGIEB-UHFFFAOYSA-N 2-Oxohexane Chemical compound CCCCC(C)=O QQZOPKMRPOGIEB-UHFFFAOYSA-N 0.000 description 2
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 2
- XLSZMDLNRCVEIJ-UHFFFAOYSA-N 4-methylimidazole Chemical compound CC1=CNC=N1 XLSZMDLNRCVEIJ-UHFFFAOYSA-N 0.000 description 2
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 2
- 229910002012 Aerosil® Inorganic materials 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- GLUUGHFHXGJENI-UHFFFAOYSA-N Piperazine Chemical compound C1CNCCN1 GLUUGHFHXGJENI-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N butyl acetate Chemical compound CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- FPAFDBFIGPHWGO-UHFFFAOYSA-N dioxosilane;oxomagnesium;hydrate Chemical compound O.[Mg]=O.[Mg]=O.[Mg]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O FPAFDBFIGPHWGO-UHFFFAOYSA-N 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 2
- 150000002460 imidazoles Chemical class 0.000 description 2
- GJRQTCIYDGXPES-UHFFFAOYSA-N isobutyl acetate Chemical compound CC(C)COC(C)=O GJRQTCIYDGXPES-UHFFFAOYSA-N 0.000 description 2
- ZFSLODLOARCGLH-UHFFFAOYSA-N isocyanuric acid Chemical compound OC1=NC(O)=NC(O)=N1 ZFSLODLOARCGLH-UHFFFAOYSA-N 0.000 description 2
- HJOVHMDZYOCNQW-UHFFFAOYSA-N isophorone Chemical compound CC1=CC(=O)CC(C)(C)C1 HJOVHMDZYOCNQW-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 239000002362 mulch Substances 0.000 description 2
- QOHMWDJIBGVPIF-UHFFFAOYSA-N n',n'-diethylpropane-1,3-diamine Chemical compound CCN(CC)CCCN QOHMWDJIBGVPIF-UHFFFAOYSA-N 0.000 description 2
- 239000007800 oxidant agent Substances 0.000 description 2
- 239000003973 paint Substances 0.000 description 2
- XNLICIUVMPYHGG-UHFFFAOYSA-N pentan-2-one Chemical compound CCCC(C)=O XNLICIUVMPYHGG-UHFFFAOYSA-N 0.000 description 2
- 239000004848 polyfunctional curative Substances 0.000 description 2
- YKYONYBAUNKHLG-UHFFFAOYSA-N propyl acetate Chemical compound CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 2
- 230000007261 regionalization Effects 0.000 description 2
- GHMLBKRAJCXXBS-UHFFFAOYSA-N resorcinol Chemical compound OC1=CC=CC(O)=C1 GHMLBKRAJCXXBS-UHFFFAOYSA-N 0.000 description 2
- 239000000454 talc Substances 0.000 description 2
- 229910052623 talc Inorganic materials 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- RUEBPOOTFCZRBC-UHFFFAOYSA-N (5-methyl-2-phenyl-1h-imidazol-4-yl)methanol Chemical compound OCC1=C(C)NC(C=2C=CC=CC=2)=N1 RUEBPOOTFCZRBC-UHFFFAOYSA-N 0.000 description 1
- KYVBNYUBXIEUFW-UHFFFAOYSA-N 1,1,3,3-tetramethylguanidine Chemical compound CN(C)C(=N)N(C)C KYVBNYUBXIEUFW-UHFFFAOYSA-N 0.000 description 1
- GIWQSPITLQVMSG-UHFFFAOYSA-N 1,2-dimethylimidazole Chemical compound CC1=NC=CN1C GIWQSPITLQVMSG-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- DJQULQXOZQDEBV-UHFFFAOYSA-N 1-[2-(2-methoxyethoxy)ethoxy]-2-methylpropane Chemical compound COCCOCCOCC(C)C DJQULQXOZQDEBV-UHFFFAOYSA-N 0.000 description 1
- FBHPRUXJQNWTEW-UHFFFAOYSA-N 1-benzyl-2-methylimidazole Chemical compound CC1=NC=CN1CC1=CC=CC=C1 FBHPRUXJQNWTEW-UHFFFAOYSA-N 0.000 description 1
- MCTWTZJPVLRJOU-UHFFFAOYSA-N 1-methyl-1H-imidazole Chemical compound CN1C=CN=C1 MCTWTZJPVLRJOU-UHFFFAOYSA-N 0.000 description 1
- SEULWJSKCVACTH-UHFFFAOYSA-N 1-phenylimidazole Chemical compound C1=NC=CN1C1=CC=CC=C1 SEULWJSKCVACTH-UHFFFAOYSA-N 0.000 description 1
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 1
- HYZJCKYKOHLVJF-UHFFFAOYSA-N 1H-benzimidazole Chemical compound C1=CC=C2NC=NC2=C1 HYZJCKYKOHLVJF-UHFFFAOYSA-N 0.000 description 1
- VILCJCGEZXAXTO-UHFFFAOYSA-N 2,2,2-tetramine Chemical compound NCCNCCNCCN VILCJCGEZXAXTO-UHFFFAOYSA-N 0.000 description 1
- NBUGUQFIYUNXCW-UHFFFAOYSA-N 2,3,3-trimethylpentane-2,4-diamine Chemical compound CC(N)C(C)(C)C(C)(C)N NBUGUQFIYUNXCW-UHFFFAOYSA-N 0.000 description 1
- BJELTSYBAHKXRW-UHFFFAOYSA-N 2,4,6-triallyloxy-1,3,5-triazine Chemical compound C=CCOC1=NC(OCC=C)=NC(OCC=C)=N1 BJELTSYBAHKXRW-UHFFFAOYSA-N 0.000 description 1
- KUBDPQJOLOUJRM-UHFFFAOYSA-N 2-(chloromethyl)oxirane;4-[2-(4-hydroxyphenyl)propan-2-yl]phenol Chemical compound ClCC1CO1.C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 KUBDPQJOLOUJRM-UHFFFAOYSA-N 0.000 description 1
- AUABZJZJXPSZCN-UHFFFAOYSA-N 2-(dimethylamino)phenol Chemical compound CN(C)C1=CC=CC=C1O AUABZJZJXPSZCN-UHFFFAOYSA-N 0.000 description 1
- PTTPXKJBFFKCEK-UHFFFAOYSA-N 2-Methyl-4-heptanone Chemical compound CC(C)CC(=O)CC(C)C PTTPXKJBFFKCEK-UHFFFAOYSA-N 0.000 description 1
- HVOBSBRYQIYZNY-UHFFFAOYSA-N 2-[2-(2-aminoethylamino)ethylamino]ethanol Chemical compound NCCNCCNCCO HVOBSBRYQIYZNY-UHFFFAOYSA-N 0.000 description 1
- SFPKYQLUNZBNQA-UHFFFAOYSA-N 2-[4,5-bis(2-cyanoethoxymethyl)-2-phenylimidazol-1-yl]propanenitrile Chemical compound N#CC(C)N1C(COCCC#N)=C(COCCC#N)N=C1C1=CC=CC=C1 SFPKYQLUNZBNQA-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- PQAMFDRRWURCFQ-UHFFFAOYSA-N 2-ethyl-1h-imidazole Chemical compound CCC1=NC=CN1 PQAMFDRRWURCFQ-UHFFFAOYSA-N 0.000 description 1
- QXSNXUCNBZLVFM-UHFFFAOYSA-N 2-methyl-1h-imidazole;1,3,5-triazinane-2,4,6-trione Chemical compound CC1=NC=CN1.O=C1NC(=O)NC(=O)N1 QXSNXUCNBZLVFM-UHFFFAOYSA-N 0.000 description 1
- BNCADMBVWNPPIZ-UHFFFAOYSA-N 2-n,2-n,4-n,4-n,6-n,6-n-hexakis(methoxymethyl)-1,3,5-triazine-2,4,6-triamine Chemical compound COCN(COC)C1=NC(N(COC)COC)=NC(N(COC)COC)=N1 BNCADMBVWNPPIZ-UHFFFAOYSA-N 0.000 description 1
- ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 2-phenyl-1h-imidazole Chemical compound C1=CNC(C=2C=CC=CC=2)=N1 ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 0.000 description 1
- ZAXCZCOUDLENMH-UHFFFAOYSA-N 3,3,3-tetramine Chemical compound NCCCNCCCNCCCN ZAXCZCOUDLENMH-UHFFFAOYSA-N 0.000 description 1
- CNKKFFNIHJXBFX-UHFFFAOYSA-N 3-(2-aminoethyl)-3,5,5-trimethylcyclohexan-1-amine Chemical compound CC1(C)CC(N)CC(C)(CCN)C1 CNKKFFNIHJXBFX-UHFFFAOYSA-N 0.000 description 1
- UIDDPPKZYZTEGS-UHFFFAOYSA-N 3-(2-ethyl-4-methylimidazol-1-yl)propanenitrile Chemical compound CCC1=NC(C)=CN1CCC#N UIDDPPKZYZTEGS-UHFFFAOYSA-N 0.000 description 1
- SESYNEDUKZDRJL-UHFFFAOYSA-N 3-(2-methylimidazol-1-yl)propanenitrile Chemical compound CC1=NC=CN1CCC#N SESYNEDUKZDRJL-UHFFFAOYSA-N 0.000 description 1
- WVRNUXJQQFPNMN-VAWYXSNFSA-N 3-[(e)-dodec-1-enyl]oxolane-2,5-dione Chemical compound CCCCCCCCCC\C=C\C1CC(=O)OC1=O WVRNUXJQQFPNMN-VAWYXSNFSA-N 0.000 description 1
- VMQUSGWKCTXCRS-UHFFFAOYSA-N 3-imidazol-1-ylpropanamide Chemical compound NC(=O)CCN1C=CN=C1 VMQUSGWKCTXCRS-UHFFFAOYSA-N 0.000 description 1
- CPIVYSAVIPTCCX-UHFFFAOYSA-N 4-methylpentan-2-yl acetate Chemical compound CC(C)CC(C)OC(C)=O CPIVYSAVIPTCCX-UHFFFAOYSA-N 0.000 description 1
- GZVHEAJQGPRDLQ-UHFFFAOYSA-N 6-phenyl-1,3,5-triazine-2,4-diamine Chemical compound NC1=NC(N)=NC(C=2C=CC=CC=2)=N1 GZVHEAJQGPRDLQ-UHFFFAOYSA-N 0.000 description 1
- MRABAEUHTLLEML-UHFFFAOYSA-N Butyl lactate Chemical compound CCCCOC(=O)C(C)O MRABAEUHTLLEML-UHFFFAOYSA-N 0.000 description 1
- MQJKPEGWNLWLTK-UHFFFAOYSA-N Dapsone Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=C1 MQJKPEGWNLWLTK-UHFFFAOYSA-N 0.000 description 1
- RPNUMPOLZDHAAY-UHFFFAOYSA-N Diethylenetriamine Chemical compound NCCNCCN RPNUMPOLZDHAAY-UHFFFAOYSA-N 0.000 description 1
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 1
- BRLQWZUYTZBJKN-UHFFFAOYSA-N Epichlorohydrin Chemical compound ClCC1CO1 BRLQWZUYTZBJKN-UHFFFAOYSA-N 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 1
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 1
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 description 1
- 239000005062 Polybutadiene Substances 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- UUQQGGWZVKUCBD-UHFFFAOYSA-N [4-(hydroxymethyl)-2-phenyl-1h-imidazol-5-yl]methanol Chemical compound N1C(CO)=C(CO)N=C1C1=CC=CC=C1 UUQQGGWZVKUCBD-UHFFFAOYSA-N 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- IMUDHTPIFIBORV-UHFFFAOYSA-N aminoethylpiperazine Chemical compound NCCN1CCNCC1 IMUDHTPIFIBORV-UHFFFAOYSA-N 0.000 description 1
- 229940072049 amyl acetate Drugs 0.000 description 1
- PGMYKACGEOXYJE-UHFFFAOYSA-N anhydrous amyl acetate Natural products CCCCCOC(C)=O PGMYKACGEOXYJE-UHFFFAOYSA-N 0.000 description 1
- IUBZDQHDPASNFJ-UHFFFAOYSA-N benzene-1,3,5-tricarboxylic acid;5-ethyl-2-methyl-1h-imidazole Chemical compound CCC1=CN=C(C)N1.OC(=O)C1=CC(C(O)=O)=CC(C(O)=O)=C1 IUBZDQHDPASNFJ-UHFFFAOYSA-N 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- LZDHIQDKAYUDND-UHFFFAOYSA-N biphenylene-1,2-diamine Chemical compound C1=CC=C2C3=C(N)C(N)=CC=C3C2=C1 LZDHIQDKAYUDND-UHFFFAOYSA-N 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 239000001191 butyl (2R)-2-hydroxypropanoate Substances 0.000 description 1
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- XCJYREBRNVKWGJ-UHFFFAOYSA-N copper(II) phthalocyanine Chemical compound [Cu+2].C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 XCJYREBRNVKWGJ-UHFFFAOYSA-N 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- HPXRVTGHNJAIIH-UHFFFAOYSA-N cyclohexanol Chemical compound OC1CCCCC1 HPXRVTGHNJAIIH-UHFFFAOYSA-N 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- QGBSISYHAICWAH-UHFFFAOYSA-N dicyandiamide Chemical compound NC(N)=NC#N QGBSISYHAICWAH-UHFFFAOYSA-N 0.000 description 1
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 1
- IUNMPGNGSSIWFP-UHFFFAOYSA-N dimethylaminopropylamine Chemical compound CN(C)CCCN IUNMPGNGSSIWFP-UHFFFAOYSA-N 0.000 description 1
- XXBDWLFCJWSEKW-UHFFFAOYSA-N dimethylbenzylamine Chemical compound CN(C)CC1=CC=CC=C1 XXBDWLFCJWSEKW-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- MNWFXJYAOYHMED-UHFFFAOYSA-M heptanoate Chemical compound CCCCCCC([O-])=O MNWFXJYAOYHMED-UHFFFAOYSA-M 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- ZXEKIIBDNHEJCQ-UHFFFAOYSA-N isobutanol Chemical compound CC(C)CO ZXEKIIBDNHEJCQ-UHFFFAOYSA-N 0.000 description 1
- 238000002386 leaching Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical compound NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 1
- 229940043265 methyl isobutyl ketone Drugs 0.000 description 1
- RXTNIJMLAQNTEG-UHFFFAOYSA-N methylamyl acetate Natural products CCCCC(C)OC(C)=O RXTNIJMLAQNTEG-UHFFFAOYSA-N 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- MCSAJNNLRCFZED-UHFFFAOYSA-N nitroethane Chemical compound CC[N+]([O-])=O MCSAJNNLRCFZED-UHFFFAOYSA-N 0.000 description 1
- LYGJENNIWJXYER-UHFFFAOYSA-N nitromethane Chemical compound C[N+]([O-])=O LYGJENNIWJXYER-UHFFFAOYSA-N 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 239000010970 precious metal Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- DCKVNWZUADLDEH-UHFFFAOYSA-N sec-butyl acetate Chemical compound CCC(C)OC(C)=O DCKVNWZUADLDEH-UHFFFAOYSA-N 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 150000005846 sugar alcohols Polymers 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- FAGUFWYHJQFNRV-UHFFFAOYSA-N tetraethylenepentamine Chemical compound NCCNCCNCCNCCN FAGUFWYHJQFNRV-UHFFFAOYSA-N 0.000 description 1
- KSBAEPSJVUENNK-UHFFFAOYSA-L tin(ii) 2-ethylhexanoate Chemical compound [Sn+2].CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O KSBAEPSJVUENNK-UHFFFAOYSA-L 0.000 description 1
- 235000015112 vegetable and seed oil Nutrition 0.000 description 1
- 239000008158 vegetable oil Substances 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Landscapes
- Inks, Pencil-Leads, Or Crayons (AREA)
- Chemically Coating (AREA)
- Manufacturing Of Printed Wiring (AREA)
Description
本発明は、化学めつき用(無電解金属めつき
用)レジストインクに係り、とくに印刷性に優
れ、かつ硬化皮膜の接着性、耐薬品性(特に耐無
電解銅めつき液性、耐熱性に優れた化学めつき用
レジストインクを提供することにある。
電気絶縁性基板に無電解金属めつきを施すに
は、めつき反応の触媒となるPd、Au、Ptなどの
貴金属を基板上に付着させ、無電解めつき液に浸
漬することにより達成できる。こうした方法でプ
リント回路板に、所望のパターンを形成するに
は、大きく分けて次の2通りがある。一方はめつ
き触媒は所望パターン上に選択的に付着ないし露
出させ、無電解金属めつきのみでプリント回路板
の回路形成を行なういわゆるフルアデイテイブ
法、他方は銅張り積層板に常法のエツチングによ
りパターン形成を行なつた後、スルーホール部に
無電解金属めつきで導体を形成するいわゆるセミ
アデイテイブ法である。
本発明は、後者の方法でスルーホール部に導体
を無電解金属めつきで施す際、基板上にエツチン
グ法により形成された導体パターンを保護するレ
ジストインクに関するものである。
一般にプリント回路板の導体回路の膜厚は30〜
35μm必要である。更に、この導体回路を形成す
る無電解めつき膜の特性は、一般に米国プリント
回路板協会(I.P.C.)提案の伸び率3%以上、引
張り強度21Kg/mm2以上が要求される。これを満足
する無電解金属めつき膜は、一般に、PH12〜13
(20℃)の強アルカリ浴中(60℃〜80℃)でなけ
れば得られないし、その無電解金属めつきの折出
速度は0.5〜5μm/h程度であるため、30〜35μm
もの厚みを得るためには、長時間めつきを行なう
必要がある。
無電解金属めつきによつて回路形成するプリン
ト回路板の製造法およびこれに用いるレジストイ
ンクに関しては、例えば以下(1)、(2)の提案がなさ
れている。
(1) 所望パターン形成部以外に、酸化剤を含むレ
ジストインクを適用し、めつき前処理工程べ
Sn+1を酸化してSn+2として、Pdを付着させな
い方法がある。この方法の代表的なものとして
は、特開昭48−76740号、特開昭48−24924号、
特開昭49−114067号および特公昭47−2001号で
ある。
(2) また所望パターン形成部以外に、疎れ性レジ
ストインクを適用し、無電解金属めつきの付着
を阻止する方法がある。この方法には特開昭46
−2479号、特開昭47−23859号がある。また疎
れ性を有する材料の提案としては特公昭50−
17099号および特公昭50−17100号がある。
しかし上記(1)のレジストインクは、レジスト中
に酸化剤を含むため、これがアルカリ溶液に比較
的弱く、めつき液中に溶出し、液の劣化、分解を
誘発促進する欠点があり、上記(2)のロウやワツク
スを配合した疎水性レジストでは、めつき時の高
温、強アルカリに耐えられず軟化変形したり、め
つき液に溶出するという欠点があつた。また、こ
れらのレジストインク皮膜はいずれも耐熱性が劣
るためプリント回路板に使用した場合、半田付け
工程で、レジストインクのフクレや絶縁基板およ
び導体との接着剥離が生じる欠点があつた。
本発明の第1の目的は、無電解金属めつき浴液
に長時間浸漬しても耐えるレジスト皮膜を形成す
る化学めつき用レジストインク組成物を提供する
ことにあり、第2の目的は、レジストインクとし
て印刷性が優れ、レジスト皮膜として優れた耐熱
接着性を有するレジストインク組成物を提供する
ことにある。
上記の目的は、(a)エポキシ樹脂、(b)エポキシ樹
脂用芳香族アミン系硬化剤、(c)エポキシ樹脂用イ
ミダゾール系硬化剤を必須成分とし、(d)有機溶
剤、(e)揺変剤、(f)充てん材、(g)化学めつき抑制剤
を添加してなることを特徴とする無電解金属めつ
き用レジストインク組成物で達成される。
本発明で用いられる(a)エポキシ樹脂としては平
均して1分子当り2個以上のエポキシ基を有する
もので、例えばビスフエノールA、ハロゲン化ビ
スフエノールA、カテコール、レゾルシノールな
どのような多価フエノールまたはグリセリンのよ
うな多価アルコールとエピクロルヒドリンとを塩
基性触媒の存在下で反応されて得られるポリグリ
シジルエーテルあるいはポリグリシジルエステ
ル、ノボラツク型フエノール樹脂とエピクロルヒ
ドリンとを縮合せしめて得られるエポキシノボラ
ツク、過酸化法でエポキシ化したエポキシ化ポリ
オレフイン、エポキシ化ポリブタジエン、ジシク
ロペンタジエン化オキサイド、あるいはエポキシ
化植物油などである。更に具体的にはエポキシノ
ボラツク樹脂のDow chemical社DEN431、
DEN438およびShell社Epikote152、Epikote154
が良好であつた。
エポキシ樹脂用硬化剤としては、エチレンジア
ミン、ヘキサメチレンジアミン、ジエチレントリ
アミン、トリエチレンテトラミン、テトラエチレ
ンペンタミン、トリプロピレンテトラミン、ジヘ
キサメチレントリアミン、トリメチルヘキサメチ
レン、メタキシレンジアミン、ジメチルアミノプ
ロピルアミン、ジエチルアミノプロピルアミン、
1−アミノ−3・アミノエチル−3.5.5−トリメ
チルシクロヘキサンなどの脂肪族第1、第2級ア
ミン、ジエチルアミノプロピルアミン、N−ヒド
ロキシエチルジエチレントリアミンなどの脂肪族
第1・第3級アミン、ピペラジン、N−アミノエ
チルピペラジン、ピリジン等の環状アミン、メタ
フエニレンジアミン、4.4′−ジアミノジフエニル
メタン、4.4′ジアミノジフエニルスルフオン、
4.4′−ジアミノジフエニルオキサイド、4.4′−ジ
アミノジフエニルイミン、ビフエニレンジアミ
ン、などの芳香族アミンおよびこれらのヒドロキ
シエチル化物、グリシジルエーテルとの付加物等
の変性芳香族アミン、ジシアンジアミド、メラミ
ン、N.N′−ジアリルメラミン、ヘキサメトキシ
メチルメラミン、トリアリルシアヌレート、ベン
ゾグアナミン、テトラメチルグアナミン、また、
イミダゾール、1−メチルイミダゾール、2−メ
チルイミダゾール、1.2−ジメチルイミダゾール、
2−エチルイミダゾール、2−エチル、4−メチ
ルイミダゾール、2−ウンデカンイミダゾール、
2−ヘプタデカンイミダゾール、1−ベンジル−
2−メチルイミダゾール、1−ビニル、2−メチ
ルイミダゾール、ベンツイミダゾール、1−(2
−カルバミルエチル)−イミダゾール、1−(2−
カルバミル)−2エチル−4−メチルイミダゾー
ル、2−アリル・2−エチル−4−メチルイミダ
ゾール、1−シアノエチル−2−フエニル−
4.5・ジ−(シアノエトキシメチル)イミダゾー
ル、2・フエニル−4−メチル−5・ヒドロキシ
メチルイミダゾール、2−フエニル−4.5−ジヒ
ドロキシメチルイミダゾール、2−メチルイミダ
ゾールイソシアヌール酸付加物、2−フエニルイ
ミダゾール・イソシアヌール酸付加物、1−シア
ノエチル−2−メチルイミダゾール、1−シアノ
エチル−2−エチル−4−メチルイミダゾール、
1−アジンエチル−2−エチル−4・メチルイミ
ダゾール、2−メチル−4・エチルイミダゾール
トリメシン酸付加物などのイミダゾール化合物、
またこれらイミダゾール化合物と金属塩ないし有
機酸とのコンプレツクスなどである。さらに、
BF3・アミン錯化合物、ベンジルジメチルアミ
ン、N.N.N′.N′・テトラメチル−1.3−ブタンジ
アミン、第4級アンモニウム塩、オクト酸第1ス
ズ、2.4.6−トリス(ジメチルアミノフエノー
ル)、テトラメチルグアニジン、無水メチルハイ
ミツク酸、無水フタル酸、無水マレイン酸、ポリ
アゼライン酸無水物、ポリセバミツク酸無水物、
ドデセニル無水コハク酸、などがある。これらの
硬化剤の中で特に(b)芳香族アミン系(変性芳香族
アミンを含む)と(c)イミダゾール系硬化剤を併用
したレジストインクの硬化塗膜は、耐めつき液性
に優れており、エポキシ樹脂100重量部に対して、
前者は、エポキシ樹脂1当量に対し0.5〜1.5当
量、後者は5.0〜30重量部加えると良好な結果が
得られた。
(a)有機溶剤としては、エポキシ樹脂、およびエ
ポキシ樹脂用硬化剤を混合溶解し、かつインクの
一般的な性状を考慮すると、揮発性の小さい沸点
が約100℃以上のものが使い易い。例えばi−ブ
チルアルコール、n−ブチルアルコール、メチル
イソブチルカルビトール、シクロヘキサノール、
n−プロピルアセテート、n−ブチルアセテー
ト、i−ブチルアセテート、sec−ブチルアセテ
ート、アミルアセテート、メチルアミルアセテー
ト、エチルラクテート、ブチルラクテート、メチ
ルオキシトールアセテート、オキシトールアセテ
ート、ブチルオキシトールアセテート、メチルオ
キシトール、オキシトール、ブチルオキシトー
ル、メチルジオキシトール、ジオキシトール、ブ
チルオキシトール、メチルn−プロピルケトン、
メチルn−ブチルケトン、メチル−iso−ブチル
ケトン、ジイソブチルケトン、シクロヘキサノ
ン、イソフオロン、ジアセテートアルコール、ニ
トロメタン、ニトロエタンなどがある。エポキシ
樹脂、エポキシ樹脂用硬化剤および必要に応じて
さらに揺変剤、有機溶剤、化学めつき抑制剤を適
量混合溶解分散して、その粘度を3000〜10000ポ
イズ(20℃B型粘度計1rpm)にし得る有機溶剤
量を添加する。
(e)揺変剤はレジストインクの印刷性を向上させ
るために用いる。揺変剤としては、SiO2などの
無機質の超微粉末を適宜添加して、印刷性好良な
レジストインクのチクソトロピー指数(B型粘度
計で回転数100rpmで測定した粘度/回転数1rpm
で測定した粘度)20〜40を得る。
(f)充てん材は、レジストインクの印刷性向上、
レジスト皮膜とした場合の接着性向上および耐化
学めつき液性の向上することが狙いである。充て
ん材としては、タルク、マイカ、SiO2、TiO2、
CaCO3などの無機質の微粉末を3〜40重量部添
加する。40重量部より多く加えると塗膜形成能が
悪く、3重量部より少ないと硬化後の塗膜の密着
性が悪くいずれも実用できない。充てん材の粒子
径は、10μm以下のものを使用し特に2μm以下の
充てん材を用いると、レジスト硬化塗膜の耐化学
めつき液性が著しく向上する。
(g)化学めつき抑制剤は、レジスト塗膜中への化
学めつき液の浸入を防ぎ、基材とレジスト塗膜と
の接着の保持、並びにレジスト塗膜上への化学め
つきの折出防止が狙いである。化学めつき抑制剤
としては、トリアゾール、1.2.3−ベンゾトリア
ゾール、4−メチルベンゾトリアゾール、チオ尿
素、2−メチルカプトベンゾチアゾール等を単独
ないし併用して用いる。添加量の好ましい範囲
は、前記エポキシ樹脂100重量部に対しては、0.1
〜5.0重量部で、0.1重量部より少ないと効果がな
く、5.0重量部を越えると、レジスト塗膜中の化
学めつき抑制剤がめつき浴中に溶出し、めつき反
応が停止する。
上記の(a)〜(g)の他に、(h)着色剤、(i)消泡剤を必
要に応じて単独ないし併用して添加することがで
きる。
(h)着色剤としては、例えばフタロシアニンブル
ー、フタロシアニングリーンなどの顔料がある。
(i)消泡剤は、レジストインク印刷時に巻込む気
泡は除去するために添加する。消泡剤としては、
シリコーンオイルなどを用いる。
以上のレジストインク成分をらいかい機で混練
し、三本ロールで練り上げ調製する。
以下に本発明の具体的実施例を示す。
実施例 1
エポキシ樹脂としてエピコート152(シエル化学
製、エポキシ当量175)100重量部、充てん材用の
タルク粉末として、平均粒子径2μmのL−1(日
本タルク製)10重量部、着色剤としてフタロシア
ニングリーン(試薬特級)2重量部、消泡剤とし
てシリコーンオイルSC−5540(信越化学製)1重
量部、揺変剤として酸化珪素超微粉末アエロジル
A380(日本アエロジルKK製)3重量部のレジス
トインク成分をらいかい機で混練し、更に三本ロ
ールで練り上げる。これをベースレジンとす
る。
次にエピコート152、100重量部、タルク粉末L
−1、10重量部、フタロシシアニングリーン2重
量部、シリコーンオイルSC−5540、1重量部ア
エロジルA380、12重量部のレジストインク成分
をらいかい機で混練し、更に3本ロールで練り上
げる。これをベースレジンとする。
ベースレジン、を単独又は適量混合し、こ
れに芳香族アミン系硬化剤、アデカEH・1013
(旭電化KK製活性水素当量:64)とイミダゾー
ル系硬化剤2E4MZ(四国化成KK製)を単独ない
し併用して、かつ添加量を変化させ、さらに、レ
ジストインクは、印刷性を考慮してチクソトロピ
ー指数を20〜40、また粘度は3000〜10000ポイズ
(B型回転粘度計、1rpm20℃)になる様な量のn
−ブチルセルソルブを加えて調整する。
銅張りガラスエポキシ基板(日立化成工業製)
に導体巾0.3〜10mm導体間隔0.7〜5mmのパターン
を形成したプリント回路板上に、上記のレジスト
インク組成物を導体パターンの一部が露出する様
にスクリーン印刷法により印刷した。これを130
℃30分間加熱炉に入れ硬化した。レジスト塗膜の
厚みは18〜25μmである。
次に下記に示す化学銅めつき液に10時間浸漬し
た。
The present invention relates to a resist ink for chemical plating (for electroless metal plating), which has particularly excellent printability, and has excellent adhesion of cured film, chemical resistance (especially resistance to electroless copper plating liquid, and heat resistance). Our objective is to provide resist inks for chemical plating that are excellent for electroless metal plating on electrically insulating substrates.Precious metals such as Pd, Au, and Pt, which act as catalysts for the plating reaction, are placed on the substrate. This can be achieved by attaching the catalyst and immersing it in an electroless plating solution.There are two main ways to form a desired pattern on a printed circuit board using these methods.On the other hand, a plating catalyst can be used to form a desired pattern on a printed circuit board. The so-called full-additive method involves forming a circuit on a printed circuit board using only electroless metal plating by selectively attaching or exposing the copper-clad laminate to the copper-clad laminate. This is a so-called semi-additive method in which a conductor is formed in a hole part by electroless metal plating.In the present invention, when applying a conductor to a through-hole part by electroless metal plating in the latter method, the conductor is formed on a substrate by an etching method. This relates to resist ink that protects conductor patterns on printed circuit boards.Generally, the film thickness of conductor circuits on printed circuit boards is 30~30~
35μm is required. Furthermore, the characteristics of the electroless plated film forming this conductive circuit are generally required to have an elongation rate of 3% or more and a tensile strength of 21 kg/mm 2 or more as proposed by the American Printed Circuit Board Association (IPC). Electroless metal plating films that meet this requirement generally have a pH of 12 to 13.
It can only be obtained in a strong alkaline bath (60°C to 80°C) at 20°C, and the deposition rate of electroless metal plating is about 0.5 to 5 μm/h, so 30 to 35 μm
In order to obtain the desired thickness, it is necessary to plating for a long time. Regarding the manufacturing method of a printed circuit board in which a circuit is formed by electroless metal plating and the resist ink used therefor, the following proposals (1) and (2) have been made, for example. (1) Apply resist ink containing an oxidizing agent to areas other than the desired pattern formation area, and perform the plating pretreatment process base.
There is a method of oxidizing Sn +1 to form Sn +2 without attaching Pd. Representative examples of this method include JP-A-48-76740, JP-A-48-24924,
These are Japanese Patent Application Laid-open No. 114067/1983 and Japanese Patent Publication No. 47/2001. (2) There is also a method of applying a sparse resist ink to areas other than the desired pattern formation area to prevent electroless metal plating from adhering. This method is
-2479 and JP-A-47-23859. In addition, as a proposal for materials with sparse properties,
There are No. 17099 and Special Publication No. 50-17100. However, the resist ink described in (1) above contains an oxidizing agent in the resist, which is relatively weak against alkaline solutions and dissolves into the plating solution, causing deterioration and decomposition of the solution. Hydrophobic resists containing wax or wax (2) have the drawback of not being able to withstand the high temperatures and strong alkalis during plating, resulting in softening and deformation, and leaching into the plating solution. In addition, all of these resist ink films have poor heat resistance, so when used for printed circuit boards, they have the drawback of blistering of the resist ink and peeling of adhesives from insulating substrates and conductors during the soldering process. A first object of the present invention is to provide a resist ink composition for chemical plating that forms a resist film that can withstand long-term immersion in an electroless metal plating bath solution. It is an object of the present invention to provide a resist ink composition that has excellent printability as a resist ink and excellent heat-resistant adhesion as a resist film. The above purpose uses (a) epoxy resin, (b) aromatic amine curing agent for epoxy resin, (c) imidazole curing agent for epoxy resin as essential components, (d) organic solvent, and (e) thixotropic This is achieved with a resist ink composition for electroless metal plating, which is characterized by adding a filler, (f) a filler, and (g) a chemical plating inhibitor. The epoxy resin (a) used in the present invention has on average two or more epoxy groups per molecule, such as polyhydric phenols such as bisphenol A, halogenated bisphenol A, catechol, resorcinol, etc. or polyglycidyl ether or polyglycidyl ester obtained by reacting a polyhydric alcohol such as glycerin with epichlorohydrin in the presence of a basic catalyst; These include epoxidized polyolefin, epoxidized polybutadiene, dicyclopentadiene oxide, or epoxidized vegetable oil, which are epoxidized by an oxidation method. More specifically, Dow Chemical's DEN431, an epoxy novolak resin,
DEN438 and Shell Epikote152, Epikote154
was good. Curing agents for epoxy resins include ethylenediamine, hexamethylenediamine, diethylenetriamine, triethylenetetramine, tetraethylenepentamine, tripropylenetetramine, dihexamethylenetriamine, trimethylhexamethylene, metaxylenediamine, dimethylaminopropylamine, diethylaminopropylamine. ,
Aliphatic primary and secondary amines such as 1-amino-3-aminoethyl-3.5.5-trimethylcyclohexane, aliphatic primary and tertiary amines such as diethylaminopropylamine and N-hydroxyethyldiethylenetriamine, piperazine, Cyclic amines such as N-aminoethylpiperazine and pyridine, metaphenylenediamine, 4.4'-diaminodiphenylmethane, 4.4'diaminodiphenyl sulfone,
Aromatic amines such as 4.4'-diaminodiphenyl oxide, 4.4'-diaminodiphenylimine, biphenylene diamine, and modified aromatic amines such as their hydroxyethylated products and adducts with glycidyl ether, dicyandiamide, melamine, NN′-diallylmelamine, hexamethoxymethylmelamine, triallyl cyanurate, benzoguanamine, tetramethylguanamine, and
imidazole, 1-methylimidazole, 2-methylimidazole, 1,2-dimethylimidazole,
2-ethylimidazole, 2-ethyl, 4-methylimidazole, 2-undecaneimidazole,
2-heptadecanimidazole, 1-benzyl-
2-methylimidazole, 1-vinyl, 2-methylimidazole, benzimidazole, 1-(2
-carbamylethyl)-imidazole, 1-(2-
carbamyl)-2ethyl-4-methylimidazole, 2-allyl 2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenyl-
4.5-di-(cyanoethoxymethyl)imidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2-phenyl-4.5-dihydroxymethylimidazole, 2-methylimidazole isocyanuric acid adduct, 2-phenylimidazole・Isocyanuric acid adduct, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole,
Imidazole compounds such as 1-azinethyl-2-ethyl-4-methylimidazole, 2-methyl-4-ethylimidazole trimesic acid adduct,
Also, there are complexes between these imidazole compounds and metal salts or organic acids. moreover,
BF 3・amine complex compound, benzyldimethylamine, NNN′.N′・tetramethyl-1,3-butanediamine, quaternary ammonium salt, stannous octoate, 2.4.6-tris(dimethylaminophenol), tetramethyl Guanidine, methyl hymic anhydride, phthalic anhydride, maleic anhydride, polyazelaic anhydride, polysebamic anhydride,
Dodecenyl succinic anhydride, etc. Among these hardeners, the cured coating film of resist ink using a combination of (b) aromatic amine type (including modified aromatic amine) and (c) imidazole type hardener has excellent plating resistance. For 100 parts by weight of epoxy resin,
Good results were obtained when the former was added in an amount of 0.5 to 1.5 equivalents per equivalent of the epoxy resin, and the latter was added in an amount of 5.0 to 30 parts by weight. (a) As the organic solvent, one that mixes and dissolves the epoxy resin and the curing agent for the epoxy resin, and takes into consideration the general properties of the ink, is easy to use with a low volatility and a boiling point of about 100° C. or higher. For example, i-butyl alcohol, n-butyl alcohol, methylisobutyl carbitol, cyclohexanol,
n-propyl acetate, n-butyl acetate, i-butyl acetate, sec-butyl acetate, amyl acetate, methyl amyl acetate, ethyl lactate, butyl lactate, methyloxytol acetate, oxytol acetate, butyloxytol acetate, methyloxytol , oxytol, butyl oxytol, methyl dioxytol, dioxytol, butyl oxytol, methyl n-propyl ketone,
Examples include methyl n-butyl ketone, methyl-iso-butyl ketone, diisobutyl ketone, cyclohexanone, isophorone, diacetate alcohol, nitromethane, and nitroethane. Epoxy resin, curing agent for epoxy resin, and if necessary, thixotropic agent, organic solvent, and chemical plating inhibitor are mixed, dissolved, and dispersed in appropriate amounts, and the viscosity is adjusted to 3,000 to 10,000 poise (20°C, B-type viscometer, 1 rpm). Add as much organic solvent as possible. (e) A thixotropic agent is used to improve the printability of resist ink. As a thixotropic agent, inorganic ultrafine powder such as SiO 2 is appropriately added to improve the thixotropic index (viscosity measured at 100 rpm with a B-type viscometer/1 rpm rotation speed) of a resist ink with good printability.
(viscosity measured at) obtain a value of 20 to 40. (f) The filler improves the printability of resist ink,
The aim is to improve adhesion and chemical plating solution resistance when used as a resist film. Filling materials include talc, mica, SiO 2 , TiO 2 ,
Add 3 to 40 parts by weight of inorganic fine powder such as CaCO 3 . If more than 40 parts by weight is added, the coating film forming ability will be poor, and if less than 3 parts by weight, the adhesion of the cured film will be poor and both cannot be put to practical use. When a filler with a particle size of 10 μm or less is used, particularly a filler with a particle size of 2 μm or less, the chemical plating solution resistance of the cured resist coating film is significantly improved. (g) The chemical plating inhibitor prevents the chemical plating solution from penetrating into the resist coating, maintains the adhesion between the base material and the resist coating, and prevents chemical plating from forming on the resist coating. is the aim. As the chemical plating inhibitor, triazole, 1.2.3-benzotriazole, 4-methylbenzotriazole, thiourea, 2-methylcaptobenzothiazole, etc. are used alone or in combination. The preferred range of addition amount is 0.1 parts by weight for 100 parts by weight of the epoxy resin.
~5.0 parts by weight; if it is less than 0.1 parts by weight, there is no effect; if it exceeds 5.0 parts by weight, the chemical plating inhibitor in the resist coating will be eluted into the plating bath, and the plating reaction will stop. In addition to the above (a) to (g), (h) a coloring agent and (i) an antifoaming agent may be added alone or in combination as necessary. (h) Colorants include pigments such as phthalocyanine blue and phthalocyanine green. (i) An antifoaming agent is added to remove air bubbles that are entrained during resist ink printing. As an antifoaming agent,
Use silicone oil, etc. The above resist ink components are kneaded using a mulch machine and kneaded using three rolls. Specific examples of the present invention are shown below. Example 1 100 parts by weight of Epicoat 152 (manufactured by Ciel Chemical, epoxy equivalent 175) as an epoxy resin, 10 parts by weight of L-1 (manufactured by Nippon Talc) with an average particle size of 2 μm as a talc powder for filler, phthalocyanine as a coloring agent 2 parts by weight of green (special grade reagent), 1 part by weight of silicone oil SC-5540 (manufactured by Shin-Etsu Chemical) as an antifoaming agent, ultrafine silicon oxide powder Aerosil as a thixotropic agent
A380 (manufactured by Nippon Aerosil KK) 3 parts by weight of resist ink components are kneaded using a mulch machine, and further kneaded using three rolls. This will be used as the base resin. Next, Epicote 152, 100 parts by weight, talc powder L
-1, 10 parts by weight of phthalocyanine green, 2 parts by weight of silicone oil SC-5540, 1 part by weight Aerosil A380, and 12 parts by weight of resist ink components were kneaded using a sieve machine and further kneaded using three rolls. This will be used as the base resin. Base resin, alone or mixed in appropriate amounts, and aromatic amine curing agent, Adeka EH 1013.
(manufactured by Asahi Denka KK, active hydrogen equivalent: 64) and imidazole curing agent 2E4MZ (manufactured by Shikoku Kasei KK) were used alone or in combination, and the added amounts were varied. An amount of n that makes the index 20 to 40 and the viscosity 3000 to 10000 poise (B-type rotational viscometer, 1 rpm 20℃)
-Adjust by adding butyl cellosolve. Copper-clad glass epoxy board (manufactured by Hitachi Chemical)
The above resist ink composition was printed by screen printing on a printed circuit board on which a pattern with a conductor width of 0.3 to 10 mm and a conductor interval of 0.7 to 5 mm was formed so that a part of the conductor pattern was exposed. This is 130
It was hardened by placing it in a heating oven for 30 minutes at ℃. The thickness of the resist coating is 18 to 25 μm. Next, it was immersed in the chemical copper plating solution shown below for 10 hours.
【表】
水 全体を1に〓
めつき液槽には自動管理装置を取つけ、めつき
液中のCu+2濃度、PH、ホルマリン濃度、および
EDTA濃度を一定とした。
次に基板をめつき液から取り出し、水洗後加熱
炉で120℃、20分間乾燥した。塗膜上から鋭利な
カツタナイフで1mmピツチで格子を手描きし、さ
らにこの部分にセロテープを十分密着させたの
ち、45度の方向にセロテープを一気に引き剥し、
クロスカツトされたレジストインク塗膜の剥離状
況を観察した。(クロスカツトセロテープ試験)
試験結果は第1図に示した様に、芳香族アミン系
硬化剤とイミダゾール系硬化剤を併用し、かつ、
芳香族アミン系硬化剤をエポキシ樹脂の1エポキ
シ当量に対して0.3〜1.5当量、さらに、イミダゾ
ール系硬化剤をエポキシ樹脂100重量部に対して、
5〜30重量部添加する範囲の硬化剤の組合せのみ
がレジスト塗膜に剥離を生じなかつた。一方、レ
ジストインクの硬化剤に、芳香族アミン系硬化剤
又は、イミダゾール系硬化剤を単独ないし、併用
する場合にも上記の硬化剤添加量の組合せ以外
は、いずれもレジスト塗膜に剥離が生じた。特に
芳香族アミン硬化剤を単独で使用するとレジスト
塗膜とプリント回路基板の銅パターンとの界面か
ら、めつき液が進入し、レジスト塗膜の剥離を起
す。一方、イミダゾール系硬化剤を単独で使用す
ると、レジスト塗膜の強じん性が不足するため、
鋭利なカツターナイフで1mmピツチでクロスカツ
トした時に、レジスト塗膜が剥離する場合が多
い。
また、クロスカツトセロテープ試験でレジスト
塗膜に剥離が生じなかつた基板を更に260℃の半
田槽にレジスト塗膜が半田に接する様にして20秒
間入れ(半田耐熱性試験)外観を見たがレジスト
塗膜には剥離やクラツクは発生しない。
実施例 2
実施例1で述べたベースレジン、を単独又
は適量混合し、これに硬化剤としてアデカEH−
1013と2E4MZを単独ないし併用し、かつ添加量
を変化させ、更にめつき抑制剤として、1.3.5−
ベンゾトリアゾールをベーストレジン中のEP152
100重量部に対し1重量部添加し、次にn−ブチ
ルセルソルブを適量加えて、レジストインクを印
刷可能なチクソトロピー指数20〜40、粘度3000〜
10000ポイズ(B型回転粘度計1rpm 20℃)にな
る様調整する。実施例1と同じ手法でレジストイ
ンクを導体パターンを形成した基板上に印刷、硬
化し、レジスト塗膜の耐化学銅めつき液性をクロ
スカツトセロテープ試験で評価した。レジスト塗
膜の厚みは10〜15μmである。試験結果は図2に
示した様に芳香族アミン系硬化剤とイミダゾール
系硬化剤を併用しかつ芳香族アミン系硬化剤をエ
ポキシ樹脂(EP152)の1エポキシ当量に対し
て、0.3〜1.5当量、さらにイミダゾール系硬化剤
をエポキシ樹脂100重量部に対して5〜30重量部
添加する範囲の硬化剤の組合せのみがレジスト塗
膜に剥離を生じなかつた。一方、レジストインク
の硬化剤に芳香族アミン系硬化剤、又はイミダゾ
ール系硬化剤を単独ないし併用する場合にも上記
の硬化剤添加量の組合せ以外はいずれもレジスト
塗膜に剥離が生じた。
更に、クロスカツトセロテープ試験でレジスト
塗膜に剥離が生じなかつた基板を半田耐熱性試験
にかけたが、レジスト塗膜には剥離やクラツクは
発生しない。以上の検討結果より、化学めつき抑
制剤を添加することにより、実施例1よりもうす
いレジスト塗膜で、化学銅めつき液に耐えるレジ
スト塗膜が形成できる。
実施例 3
実施例1で述べたベースレジン80重量部、実
施例1で述べたベースレジン20重量部、アデカ
EH−1013 31重量部(1.0当量)、2E4MZ5.5重量
部にめつき抑制剤として4−メチルベンゾトリア
ゾール0.85重量部、n−ブチルセルソルブ1.5重
量部を加え十分に混合し、これをレジストインク
とした。実施例1と同じ手法でレジスト塗膜の耐
化学めつき液性を、クロスカツトセロテープ試験
および半田耐熱性試験を行なつたが、レジスト塗
膜の剥離やフクレ、クラツクは生じなかつた。こ
の時のレジスト塗膜の厚みは、11μmであつた。
実施例 4
実施例1で述べたベースレジン90重量部、実
施例1で述べたベースレジン10重量部、アデカ
EH−551(芳香族アミン系硬化剤旭電化KK製、
活性水素当量:104)55.5重量部(0.8当量)、2
−フエニルイミダゾール(四国化成KK製)10重
量部、めつき抑制剤としてトリアゾール1.3重量
部、n−ブチルセルソルブ2.0重量部を加え十分
に混合し、これをレジストインクとした。実施例
1と同じ手法でレジスト塗膜の耐化学めつき液性
をクロスカツトセロテープ試験および半田耐熱性
試験を行なつたが、レジスト塗膜の剥離やフク
レ、クラツクは生じなかつた。この時のレジスト
塗膜の厚みは13μmであつた。
実施例 5
実施例1で述べたベースレジン55重量部、実
施例1で述べたベースレジン45重量部、アデカ
EH−531(芳香族アミン系硬化剤旭電化KK製、
活性水素当量88)36.0重量部(0.5当量)、2E4MZ
20重量部、めつき抑制剤としてチオ尿素0.83重量
部、n−ブチルセルソルブ3重量部を加え、十分
に混合し、これをレジストインクとした。実施例
1と同じ手法でレジスト塗膜の耐化学めつき液性
をクロスカツトセロテープ試験および半田耐熱性
試験を行なつたが、レジスト塗膜の剥離やフク
レ、クラツクは生じなかつた。この時のレジスト
塗膜の厚みは13μmであつた。
実施例 6
実施例1で述べたベースレジン20重量部、実
施例1で述べたベースレジン80重量部、アデカ
EH−1013、11.9重量部(0.4当量)、2E4MZ25重
量部、めつき抑制剤として2−メチルカプトベン
ゾチアゾール、1.6重量部、n−ブチルセルソル
ブ2重量部を加え、十分に混合し、これをレジス
トインクとした。実施例1と同じ手法でレジスト
塗膜の耐化学めつき液性をクロスカツトセロテー
プ試験、および半田耐熱性試験を行なつたが、レ
ジスト塗膜の剥離やフクレ、クラツクは生じなか
つた。この時のレジスト塗膜の厚みは13μmであ
つた。
比較例 1
実施例1で述べたベースレジン85重量部、実
施例1で述べたベースレジン15重量部、アデカ
EH−1013 31.2重量部(1当量)、n−ブチルセ
ルソルブ2.8重量部を十分に混合し、これをレジ
ストインクとした。実施例1と同じ手法で、レジ
スト塗膜の耐化学めつき液性をクロスカツトセロ
テープ試験および半田耐熱性試験を行なつたが、
レジスト塗膜は、クロスカツトセロテープ試験で
剥離を生じた。また半田耐熱性試験後、レジスト
塗膜にフクレを生じた。この時のレジスト塗膜の
厚みは24μmであつた。
比較例 2
実施例1で述べたベースレジン100重量部
2E4MZ5重量部、n−ブチルセルソルブ1.5重量
部を十分に混合し、これをレジストインクとし
た。その後、実施例1と同じ手法でレジスト塗膜
の耐化学めつき液性をクロスカツトセロテープ試
験、および半田耐熱性試験を行なつたが、レジス
ト塗膜はクロスカツトセロテープ試験で剥離を生
じた。また、半田耐熱性試験後、レジスト塗膜に
フクレが発生した。この時のレジスト塗膜の厚み
は23μmであつた。
以上、説明したように、本発明の化学めつき用
レジストインク組成物は、エポキシ樹脂に芳香族
アミン系硬化剤とイミダゾール系硬化剤の併用な
いし、化学めつき抑制剤を添加することにより、
耐化学めつき液性が優れ、かつはんだ耐熱性が良
好であり、アデテイブ法によるプリント回路板の
製造に適用できる。[Table] Water all into 1〓
An automatic control device is installed in the plating liquid tank to monitor the Cu +2 concentration, PH, formalin concentration, and
The EDTA concentration was kept constant. Next, the substrate was taken out of the plating solution, washed with water, and then dried in a heating oven at 120°C for 20 minutes. Hand-draw a lattice on the paint film with a sharp cutter knife at 1mm pitch, and then apply Sellotape to this area, then peel off the Sellotape at once in a 45-degree direction.
The state of peeling of the cross-cut resist ink coating was observed. (Cross-cut cellotape test)
The test results are as shown in Figure 1, when an aromatic amine curing agent and an imidazole curing agent were used together, and
The aromatic amine curing agent is 0.3 to 1.5 equivalents per 1 epoxy equivalent of the epoxy resin, and the imidazole curing agent is added to 100 parts by weight of the epoxy resin.
Only combinations of curing agents added in amounts of 5 to 30 parts by weight did not cause peeling of the resist coating. On the other hand, when an aromatic amine-based curing agent or an imidazole-based curing agent is used alone or in combination as a curing agent for resist ink, peeling occurs in the resist coating unless the combination of the above-mentioned curing agent addition amounts is used. Ta. In particular, when an aromatic amine curing agent is used alone, the plating solution enters from the interface between the resist coating and the copper pattern of the printed circuit board, causing peeling of the resist coating. On the other hand, when imidazole-based curing agents are used alone, the toughness of the resist coating film is insufficient.
When cross-cutting with a sharp cutter knife at 1mm pitch, the resist coating often peels off. In addition, the board whose resist coating did not peel off in the cross-cut sellotape test was further placed in a solder bath at 260°C for 20 seconds with the resist coating in contact with the solder (soldering heat resistance test). No peeling or cracking occurs in the paint film. Example 2 The base resin described in Example 1 was mixed alone or in an appropriate amount, and ADEKA EH- was added as a hardening agent.
1.3.5− Using 1013 and 2E4MZ alone or in combination and varying the amount added, and further as a plating inhibitor.
E P 152 in benzotriazole based resin
Add 1 part by weight to 100 parts by weight, and then add an appropriate amount of n-butyl cellosolve to obtain a printable resist ink with a thixotropic index of 20 to 40 and a viscosity of 3000 to
Adjust to 10,000 poise (B type rotational viscometer 1 rpm 20℃). A resist ink was printed and cured on a substrate on which a conductive pattern was formed using the same method as in Example 1, and the resistance of the resist coating to chemical copper plating was evaluated by a cross-cut cellophane tape test. The thickness of the resist coating is 10 to 15 μm. As shown in Figure 2, the test results show that an aromatic amine curing agent and an imidazole curing agent were used in combination, and the aromatic amine curing agent was used in a ratio of 0.3 to 1.5 per 1 epoxy equivalent of the epoxy resin (E P 152). Only combinations of curing agents in a range of 5 to 30 parts by weight of an imidazole curing agent per 100 parts by weight of epoxy resin did not cause peeling of the resist coating. On the other hand, when an aromatic amine type curing agent or an imidazole type curing agent was used alone or in combination as a curing agent for the resist ink, peeling occurred in the resist coating film except for the combination of the above-mentioned curing agent addition amounts. Furthermore, the substrates whose resist coating did not peel off in the cross-cut sellotape test were subjected to a soldering heat resistance test, but no peeling or cracking occurred in the resist coating. From the above study results, by adding a chemical plating inhibitor, it is possible to form a resist coating film that is thinner than in Example 1 and that can withstand chemical copper plating solution. Example 3 80 parts by weight of the base resin described in Example 1, 20 parts by weight of the base resin described in Example 1, Adeka
Add 0.85 parts by weight of 4-methylbenzotriazole as a plating inhibitor and 1.5 parts by weight of n-butyl cellosolve to 31 parts by weight (1.0 equivalent) of EH-1013 and 5.5 parts by weight of 2E4MZ, mix well, and add this to resist ink. And so. A cross-cut Scotch tape test and a solder heat resistance test were carried out to check the chemical plating liquid resistance of the resist coating using the same method as in Example 1, but no peeling, blistering, or cracking of the resist coating occurred. The thickness of the resist coating film at this time was 11 μm. Example 4 90 parts by weight of the base resin described in Example 1, 10 parts by weight of the base resin described in Example 1, Adeka
EH-551 (aromatic amine curing agent manufactured by Asahi Denka KK,
Active hydrogen equivalent: 104) 55.5 parts by weight (0.8 equivalent), 2
- 10 parts by weight of phenylimidazole (manufactured by Shikoku Kasei KK), 1.3 parts by weight of triazole as a plating inhibitor, and 2.0 parts by weight of n-butyl cellosolve were added and thoroughly mixed to prepare a resist ink. A cross-cut Scotch tape test and a solder heat resistance test were conducted to check the chemical plating liquid resistance of the resist coating using the same method as in Example 1, but no peeling, blistering, or cracking of the resist coating occurred. The thickness of the resist coating film at this time was 13 μm. Example 5 55 parts by weight of the base resin described in Example 1, 45 parts by weight of the base resin described in Example 1, Adeka
EH-531 (aromatic amine curing agent manufactured by Asahi Denka KK,
Active hydrogen equivalent 88) 36.0 parts by weight (0.5 equivalent), 2E4MZ
20 parts by weight, 0.83 parts by weight of thiourea as a plating inhibitor, and 3 parts by weight of n-butyl cellosolve were added and thoroughly mixed to prepare a resist ink. A cross-cut Scotch tape test and a solder heat resistance test were conducted to check the chemical plating liquid resistance of the resist coating using the same method as in Example 1, but no peeling, blistering, or cracking of the resist coating occurred. The thickness of the resist coating film at this time was 13 μm. Example 6 20 parts by weight of the base resin described in Example 1, 80 parts by weight of the base resin described in Example 1, Adeka
Add 11.9 parts by weight (0.4 equivalents) of EH-1013, 25 parts by weight of 2E4MZ, 1.6 parts by weight of 2-methylcaptobenzothiazole as a plating inhibitor, and 2 parts by weight of n-butyl cellosolve, mix thoroughly, and add this. It was made into a resist ink. A cross-cut Scotch tape test and a solder heat resistance test were conducted to check the chemical plating liquid resistance of the resist coating using the same method as in Example 1, but no peeling, blistering, or cracking of the resist coating occurred. The thickness of the resist coating film at this time was 13 μm. Comparative Example 1 85 parts by weight of the base resin described in Example 1, 15 parts by weight of the base resin described in Example 1, Adeka
31.2 parts by weight (1 equivalent) of EH-1013 and 2.8 parts by weight of n-butyl cellosolve were thoroughly mixed to form a resist ink. Using the same method as in Example 1, a cross-cut Scotch tape test and a soldering heat resistance test were conducted to check the resistance of the resist coating to chemical plating liquid.
The resist coating film peeled off in the cross-cut Scotch tape test. Furthermore, after the solder heat resistance test, blistering occurred in the resist coating. The thickness of the resist coating film at this time was 24 μm. Comparative Example 2 100 parts by weight of the base resin described in Example 1
5 parts by weight of 2E4MZ and 1.5 parts by weight of n-butyl cellosolve were thoroughly mixed to prepare a resist ink. Thereafter, the resist coating film was subjected to a cross-cut cellophane tape test and a soldering heat resistance test to check the chemical plating liquid resistance using the same method as in Example 1, but the resist coating film peeled off in the cross-cut cellophane tape test. Furthermore, after the solder heat resistance test, blistering occurred in the resist coating. The thickness of the resist coating film at this time was 23 μm. As explained above, the resist ink composition for chemical plating of the present invention can be prepared by combining an aromatic amine curing agent and an imidazole curing agent or by adding a chemical plating inhibitor to an epoxy resin.
It has excellent chemical plating solution resistance and good solder heat resistance, and can be applied to the manufacture of printed circuit boards by the additive method.
第1図は実施例1の実験結果、第2図は実施例
2の実験結果である。
1,1′:クロスカツトセロテープ試験および
半田耐熱性試験後、レジスト塗膜に剥離やフクレ
が生じなかつた硬化剤添加量の範囲、2,2′:
レジスト塗膜に剥離やフクレが発生した硬化剤添
加量の範囲。
FIG. 1 shows the experimental results of Example 1, and FIG. 2 shows the experimental results of Example 2. 1, 1': Range of curing agent addition amount that did not cause peeling or blistering in the resist coating after the cross-cut Sellotape test and soldering heat resistance test, 2, 2':
The range of curing agent addition amount that caused peeling and blistering in the resist coating.
Claims (1)
エポキシ樹脂用芳香族アミン系硬化剤の配合割合
がエポキシ樹脂の1エポキシ当量に対して0.5〜
1.5当量、(c)エポキシ樹脂用イミダゾール系硬化
剤の配合割合が5.0〜30重量部、(d)充てん材、(e)
揺変剤、(f)有機溶剤の配合割合がレジストインク
のチクソトロピー指数が20〜40で、かつ20℃の粘
度が3000〜10000Poise(B型回転粘度計1rpm)に
なる様な量であることを特徴とする化学めつき用
レジストインク組成物。 2 (a)エポキシ樹脂の配合割合が100重量部、(b)
エポキシ樹脂用芳香族アミン系硬化剤の配合割合
がエポキシ樹脂の1エポキシ当量に対して0.5〜
1.5当量、(c)エポキシ樹脂用イミダゾール系硬化
剤の配合割合が5.0〜30重量部、(d)充てん材、、(e)
揺変剤、(f)有機溶剤の配合割合がレジストインク
のチクソトロピー指数が20〜40で、かつ20℃の粘
度が3000〜10000Poise(B型回転粘度計1rpm)に
なる様な量であり、(g)化学めつき抑制剤がトリア
ゾール、1.2.3−ベンゾトリアゾール、4−メチ
ルベンゾトリアゾール、チオ尿素、2−メルカプ
トベンゾチアゾールから選ばれた化合物であるこ
とを特徴とする化学めつき用レジストインク組成
物。[Claims] 1 (a) The blending ratio of epoxy resin is 100 parts by weight, (b)
The blending ratio of aromatic amine curing agent for epoxy resin is 0.5 to 1 epoxy equivalent of epoxy resin.
1.5 equivalent, (c) blending ratio of imidazole curing agent for epoxy resin is 5.0 to 30 parts by weight, (d) filler, (e)
The proportion of the thixotropic agent and (f) organic solvent is such that the resist ink has a thixotropic index of 20 to 40 and a viscosity of 3000 to 10000 Poise at 20°C (1 rpm using a B-type rotational viscometer). Characteristic resist ink composition for chemical plating. 2 (a) The blending ratio of epoxy resin is 100 parts by weight, (b)
The blending ratio of aromatic amine curing agent for epoxy resin is 0.5 to 1 epoxy equivalent of epoxy resin.
1.5 equivalent, (c) blending ratio of imidazole curing agent for epoxy resin is 5.0 to 30 parts by weight, (d) filler, (e)
The blending ratio of the thixotropic agent and (f) organic solvent is such that the thixotropic index of the resist ink is 20 to 40, and the viscosity at 20°C is 3000 to 10000 Poise (B-type rotational viscometer 1 rpm), g) A resist ink composition for chemical plating, characterized in that the chemical plating inhibitor is a compound selected from triazole, 1.2.3-benzotriazole, 4-methylbenzotriazole, thiourea, and 2-mercaptobenzothiazole. thing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55164598A JPS5790072A (en) | 1980-11-25 | 1980-11-25 | Resist ink composition for chemical plating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55164598A JPS5790072A (en) | 1980-11-25 | 1980-11-25 | Resist ink composition for chemical plating |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5790072A JPS5790072A (en) | 1982-06-04 |
| JPH0125790B2 true JPH0125790B2 (en) | 1989-05-19 |
Family
ID=15796214
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55164598A Granted JPS5790072A (en) | 1980-11-25 | 1980-11-25 | Resist ink composition for chemical plating |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5790072A (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59155994A (en) * | 1983-02-25 | 1984-09-05 | 株式会社日立製作所 | Method for manufacturing multilayer printed wiring board |
| JPS6026669A (en) * | 1983-07-25 | 1985-02-09 | Hitachi Condenser Co Ltd | Resist ink for electroless plating |
| JPS6123666A (en) * | 1984-07-13 | 1986-02-01 | Hitachi Ltd | Plating-resistant solder resist ink composition |
| JPS6082673A (en) * | 1983-10-14 | 1985-05-10 | Hitachi Ltd | Anti-stick solder resist ink composition |
| JP2991313B2 (en) * | 1991-07-15 | 1999-12-20 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Improved compositions for photoimaging |
| JP2772227B2 (en) * | 1993-11-15 | 1998-07-02 | イビデン株式会社 | Printed wiring board |
| EP0795788B1 (en) * | 1996-03-13 | 2002-07-24 | Ibiden Co, Ltd. | Resist compositions for plating |
| EP1796446B1 (en) | 1996-11-20 | 2011-05-11 | Ibiden Co., Ltd. | Printed circuit board |
-
1980
- 1980-11-25 JP JP55164598A patent/JPS5790072A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5790072A (en) | 1982-06-04 |
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