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JPH0131580B2 - - Google Patents
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JPH0131580B2 - - Google Patents

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Publication number
JPH0131580B2
JPH0131580B2 JP57117700A JP11770082A JPH0131580B2 JP H0131580 B2 JPH0131580 B2 JP H0131580B2 JP 57117700 A JP57117700 A JP 57117700A JP 11770082 A JP11770082 A JP 11770082A JP H0131580 B2 JPH0131580 B2 JP H0131580B2
Authority
JP
Japan
Prior art keywords
light
temperature
optical
intensity
temperature sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57117700A
Other languages
Japanese (ja)
Other versions
JPS599526A (en
Inventor
Kazuyoshi Shibata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP11770082A priority Critical patent/JPS599526A/en
Publication of JPS599526A publication Critical patent/JPS599526A/en
Publication of JPH0131580B2 publication Critical patent/JPH0131580B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/12Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)

Description

【発明の詳細な説明】 本発明は光温度センサより発する光信号が光フ
アイバ等を介して伝送される温度測定装置に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a temperature measuring device in which an optical signal emitted from an optical temperature sensor is transmitted via an optical fiber or the like.

光温度センサから光伝送路を介してアナログ量
を伝送する場合、温度変化および曲げ応力等によ
り光伝送路の伝送特性が変動し、正確な温度測定
が困難になるため、この変動を補償し、測定精度
を高める必要がある。
When transmitting an analog quantity from an optical temperature sensor via an optical transmission line, the transmission characteristics of the optical transmission line fluctuate due to temperature changes and bending stress, making accurate temperature measurement difficult. It is necessary to improve measurement accuracy.

第1図はそのような伝送特性変動の補償を行つ
た温度測定装置の一例を示し、例えばハロゲンラ
ンプを用いた光源1より出た光はレンズ2で平行
光線となり、フイルタ3、二色複合ミラ4,5,
6で可視光線が除かれ、紫外光線のみがレンズ7
により光フアイバ8の端面コア上に焦点を合わせ
られる。この紫外線が光フアイバ8の先端に取り
付けられたセンサ9の螢光物質に照射する。その
螢光物質は紫外線により励起される、例えば酸化
ガドリウムイオンとそれを活性化させるユーロピ
ウムから成つている。この螢光物質は第2図Aの
左側の励起波長が示すスペクトルを有する紫外線
によつて右側の放射波長が示すスペクトルを有す
る可視光線を発光する。この可視光線は再び光フ
アイバ8を経由しビームスプリツタ10により二
分され一方はミラ11に反射されてそれぞれ干渉
フイルタ12,13により第2図Aの放射波長
a、cの可視光線のみをそれぞれ取り出し、この
2つの可視光線はそれぞれレンズ14,15によ
り光検出器16,17に到達する。光信号は光検
出器16,17で電気信号に変換され、さらに前
段増幅器18,19を経てA/D変換器マルチプ
レクサ20によりA/D変換された後、Ic/Ia
(Ic:波長cの光強度、Ia:波長aの光強度)の
演算を行ない、マイクロコンピユータ21に入力
される。読出し専用メモリ(ROM)22には、
第2図Bに示す温度と放射波長の相対強度Ic/Ia
との関係が書きこまれており、マイクロコンピユ
ータにより温度情報に変換され、D/A変換器2
4を経て表示される。ここで、波長aとcの相対
強度Ic/Iaを取ることにより、光フアイバ等の伝
送特性の変動は補償されている。なぜなら、Iaと
Icは伝送特性の変動によりそれぞれ変化するが、
Ic/Iaは変化しないからである。
Figure 1 shows an example of a temperature measuring device that compensates for such transmission characteristic fluctuations. For example, light emitted from a light source 1 using a halogen lamp is converted into a parallel beam by a lens 2, and then passed through a filter 3 and a dichroic composite mirror. 4,5,
Visible light is removed by lens 6, and only ultraviolet light is filtered through lens 7.
is focused onto the end face core of the optical fiber 8. The ultraviolet rays irradiate the fluorescent substance of the sensor 9 attached to the tip of the optical fiber 8. The fluorescent substance is excited by ultraviolet light and consists of, for example, gadolinium oxide ions and europium which activates them. This fluorescent material emits visible light having a spectrum indicated by the emission wavelength on the right side in response to ultraviolet light having a spectrum indicated by the excitation wavelength on the left side of FIG. 2A. This visible light passes through the optical fiber 8 again, is split into two by the beam splitter 10, one is reflected by the mirror 11, and is filtered through interference filters 12 and 13, respectively, to extract only the visible light at emission wavelengths a and c shown in FIG. 2A. , these two visible light rays reach photodetectors 16 and 17 through lenses 14 and 15, respectively. The optical signal is converted into an electric signal by photodetectors 16 and 17, and further passed through preamplifiers 18 and 19 and A/D converted by an A/D converter multiplexer 20, and then converted to Ic/Ia.
(Ic: light intensity of wavelength c, Ia: light intensity of wavelength a) is calculated and input to the microcomputer 21. The read-only memory (ROM) 22 includes
Relative intensity Ic/Ia of temperature and radiation wavelength shown in Figure 2B
The relationship between the
It will be displayed after 4. Here, by taking the relative intensities Ic/Ia of wavelengths a and c, fluctuations in the transmission characteristics of the optical fiber etc. are compensated for. Because Ia and
Ic varies depending on the fluctuation of transmission characteristics, but
This is because Ic/Ia does not change.

第3図は別の温度測定装置を示し、パルス発生
器31、発光ダイオード・駆動部32により波長
λ1とλ2の二つの発光ダイオード33,34を交互
に発光させる。双方の光は光フアイバ35,36
を経て合波器37で同一の光フアイバ38に入
り、波長λ1とλ2の光は光コネクタ39を通つて温
度検出部40に達する。検出部40には、
GaAs、CdTe等のような半導体が置かれ、光は
この半導体中を通過し、光フアイバ、光コネクタ
41を通つて光検出器42に入り、電気信号に変
換される。そして、受光回路43を経てサンプル
ホールド増幅器44で増幅した後、割算回路45
でλ1、λ2の光強度Iλ1、Iλ2の比Iλ1/Iλ2を求め
る。ここで、GaAs、CdTe等のような半導体は、
光を吸収する波長の範囲が温度依存性をもつてい
る。つまり、第4図Aに曲線Pで示したように半
導体の吸収端の波長は温度によつて変化し、例え
ば曲線Qで示す適当な波長の発光ダイオード光を
用いると、半導体を通過した発光ダイオードの光
強度は第4図Bのように温度依存性を有する。そ
こでλ1の波長を温度変動によつて透過光強度が変
化する波長にとり、λ2をλ1より長波長の透過光強
度が温度依存性をもたない波長にとる。Iλ1は温
度と光伝送特性の変動によつて変化し、Iλ2は光
伝送特性のみの変動によつて変化する。すると、
1/Iλ2を求めることにより光フアイバ等の伝送
特性変動は分子、分母で約され、消去されるので
伝送特性変動の影響を受けない正確な温度測定が
可能になる。
FIG. 3 shows another temperature measuring device, in which a pulse generator 31 and a light emitting diode driver 32 cause two light emitting diodes 33 and 34 to alternately emit light at wavelengths λ 1 and λ 2 . Both lights are optical fibers 35, 36
The light of wavelengths λ 1 and λ 2 enter the same optical fiber 38 at a multiplexer 37 through the optical connector 39 and reach the temperature detection section 40 . The detection unit 40 includes
A semiconductor such as GaAs, CdTe, etc. is placed, and light passes through this semiconductor and enters a photodetector 42 through an optical fiber, an optical connector 41, and is converted into an electrical signal. After passing through the light receiving circuit 43 and being amplified by the sample and hold amplifier 44, it is then amplified by the dividing circuit 45.
Find the ratio Iλ 1 /2 of the light intensities Iλ 1 and Iλ 2 of λ 1 and λ 2 . Here, semiconductors such as GaAs, CdTe, etc.
The wavelength range in which light is absorbed is temperature dependent. In other words, as shown by curve P in FIG. The light intensity has temperature dependence as shown in FIG. 4B. Therefore, the wavelength of λ 1 is set to a wavelength at which the intensity of transmitted light changes with temperature fluctuation, and λ 2 is set to a wavelength at which the intensity of transmitted light at a wavelength longer than λ 1 does not have temperature dependence. Iλ 1 changes due to changes in temperature and optical transmission characteristics, and Iλ 2 changes due to changes only in optical transmission characteristics. Then,
By determining Iλ 1 /Iλ 2 , variations in transmission characteristics of the optical fiber, etc. are reduced and eliminated by the numerator and denominator, making it possible to accurately measure temperature without being affected by variations in transmission characteristics.

しかしこれらの装置における補償方法は、他の
原理による光温度センサを用いた温度測定装置に
おいては適用不可能である。第1図に示した装置
における補償方法は、螢光物質の発光スペクトル
の温度変化を利用した光温度センサに対してのみ
適用可能であり、第3図に示した装置における補
償方法は、透過光強度が温度依存性をもつ波長と
温度依存性のない波長とを利用する原理に基づく
光温度センサにのみ適用可能である。しかし、自
然複屈折あるいは多波干渉の原理を用いた光温度
センサなどにおいては、透過光強度が温度依存性
を持たない波長範囲が存在しないのでこのような
補償方法は適用できない。
However, the compensation methods used in these devices cannot be applied to temperature measuring devices using optical temperature sensors based on other principles. The compensation method in the device shown in FIG. 1 is applicable only to optical temperature sensors that utilize temperature changes in the emission spectrum of fluorescent substances, and the compensation method in the device shown in FIG. It is applicable only to optical temperature sensors based on the principle of using wavelengths whose intensity is temperature-dependent and wavelengths whose intensity is not temperature-dependent. However, such a compensation method cannot be applied to an optical temperature sensor using the principle of natural birefringence or multiwave interference because there is no wavelength range in which the transmitted light intensity does not have temperature dependence.

本発明は上記の欠点を解消するためのもので、
他の原理に基づく光温度センサを用いた場合にも
光伝送路特性の変動の補償が行われる温度測定装
置を提供することを目的とする。
The present invention is intended to eliminate the above-mentioned drawbacks,
It is an object of the present invention to provide a temperature measuring device that can compensate for fluctuations in optical transmission path characteristics even when an optical temperature sensor based on another principle is used.

この目的は、異なる二つの波長における光学特
性が温度依存性を示す光温度センサを具備した温
度測定装置が、波長の異なる二つの光の発光源
と、前記二つの光をそれぞれ二つの部分に分ける
分岐器と、前記一方の部分の光が導かれ一方の波
長の光を内部に導く手段が設けられて前記一方の
波長の光の強度のみを温度に依存して変化させる
前記光温度センサと、該光温度センサを経た一方
の部分の光と他方の部分の光の強度の比を計算
し、さらに両波長の光に対するそれぞれの比を比
較して温度を算出する手段とを備えることによつ
て達成される。
The purpose of this is to use a temperature measuring device equipped with an optical temperature sensor whose optical properties at two different wavelengths are temperature-dependent, to separate the two light sources into two parts, and to separate the two lights into two parts. the optical temperature sensor, which is provided with a splitter and a means for guiding the light of the one portion and guiding the light of one wavelength to the inside, so that only the intensity of the light of the one wavelength is changed depending on the temperature; By comprising means for calculating the ratio of the intensity of the light in one part and the light in the other part that have passed through the optical temperature sensor, and further calculating the temperature by comparing the respective ratios for the light of both wavelengths. achieved.

以下図を引用して本発明の実施例について説明
する。各図において前の引用した各図と共通の部
分には同一符号が付されている。第5図におい
て、異なる波長λ1、λ2の発光素子33,34を駆
動部32によつて発光させる。発光素子駆動部3
2の一例を第6図に示す。パルス発生器31でパ
ルスを発生させ、一方の発光素子駆動回路51に
はそのパルスを直接加えるが、他方の発光素子駆
動回路52には、インバータ53を通してからパ
ルスを加える。これにより発光素子33を駆動す
る回路51、発光素子34を駆動する回路52を
交互に働かせ、発光素子33,34を交互に発光
させる。発光素子33,34を出射した光は、光
フアイバ35,36に入り光合波器37で一つの
光フアイバ38に入る。次いで光分岐器54でλ1
とλ2の光の一部を分岐し、分岐した光は光フアイ
バ56を通つて光源モニタ用受光素子60に入射
し、電気信号に変換される。光分岐器54から出
射したもう一方の光は光フアイバ55を通つて温
度センサ57に入射し、温度センサの内部を通つ
て温度センサ57から出射する。出射した光は入
射時の光フアイバ55と異なる光フアイバ58に
入り、受光素子59に入射し、信号処理部61に
よつて電気信号に変換される。第7図は信号処理
部の一例を示す。受光素子59で受けるλ1、λ2
光に対する電気信号をそれぞれV1λ1,V1λ2とし、
光源モニタ用受光素子60で受けるλ1、λ2の光に
対する電気信号をそれぞれV2λ1,V2λ2とする。
電気信号を増幅器62で増幅してから、割算器4
5へ入力し、V1λ1/V2λ1とV1λ2/V2λ2の割算を
交互に行なう。なぜなら、λ1とλ2の光が交互に受
光素子59と光源モニタ用受光素子60に入射す
るからである。両割算の結果をサンプルホールド
増幅器44,44′でホールドし、両割算の結果
を再び第2の割算器45′に入力する。割算結果
のホールドは発光素子駆動部32からの信号によ
つて行なう。その結果、(V1λ1/V2λ1)/
(V1λ2/V2λ2)の値が割算器45′から出力され
る。この出力は増幅器63で増幅し、表示部64
に入力して温度を表示する。
Embodiments of the present invention will be described below with reference to the drawings. In each figure, parts common to the previously cited figures are given the same reference numerals. In FIG. 5, light emitting elements 33 and 34 having different wavelengths λ 1 and λ 2 are caused to emit light by a driving section 32. In FIG. Light emitting element drive section 3
An example of 2 is shown in FIG. A pulse is generated by a pulse generator 31, and the pulse is directly applied to one light emitting element drive circuit 51, but the pulse is applied to the other light emitting element drive circuit 52 after passing through an inverter 53. As a result, the circuit 51 for driving the light emitting element 33 and the circuit 52 for driving the light emitting element 34 are operated alternately, causing the light emitting elements 33 and 34 to emit light alternately. The light emitted from the light emitting elements 33 and 34 enters into optical fibers 35 and 36 and enters into one optical fiber 38 at an optical multiplexer 37. Next, the optical splitter 54 outputs λ 1
A part of the light with wavelengths λ 2 and λ 2 is branched, and the branched light passes through the optical fiber 56 and enters the light receiving element 60 for monitoring the light source, where it is converted into an electrical signal. The other light emitted from the optical splitter 54 enters the temperature sensor 57 through the optical fiber 55, passes through the inside of the temperature sensor, and exits from the temperature sensor 57. The emitted light enters an optical fiber 58 different from the optical fiber 55 at the time of input, enters a light receiving element 59, and is converted into an electrical signal by a signal processing section 61. FIG. 7 shows an example of a signal processing section. The electric signals for the light of λ 1 and λ 2 received by the light receiving element 59 are respectively defined as V 1 λ 1 and V 1 λ 2 ,
The electric signals for the lights of λ 1 and λ 2 received by the light-receiving element 60 for monitoring the light source are assumed to be V 2 λ 1 and V 2 λ 2 , respectively.
After the electrical signal is amplified by the amplifier 62, the divider 4
5, and divides V 1 λ 1 /V 2 λ 1 and V 1 λ 2 /V 2 λ 2 alternately. This is because the lights of λ 1 and λ 2 are alternately incident on the light receiving element 59 and the light receiving element 60 for monitoring the light source. The results of both divisions are held in sample-and-hold amplifiers 44, 44', and the results of both divisions are input again to the second divider 45'. The holding of the division result is performed by a signal from the light emitting element driving section 32. As a result, (V 1 λ 1 /V 2 λ 1 )/
The value (V 1 λ 2 /V 2 λ 2 ) is output from the divider 45'. This output is amplified by an amplifier 63 and displayed on a display section 64.
to display the temperature.

次に光温度センサ57の具体例について述べ
る。第8図は多波干渉の原理に基づく光温度セン
サの一例で、光フアイバ55,58の端に接続し
たレンズ65により光は平行ビームとなつてレン
ズ65より出射する。出射光はビームスプリツタ
10を通過し、λ1の光はフイルタ66を透過し、
光学的平行平面を有する透明固体67に入射す
る。一方、λ2の光はフイルタ66で反射される。
すなわち、フイルタ66はλ1の光を透過し、λ2
光を反射するという特性を持つている。光学的平
行平面(を有する)透明固体67に入射したλ1
光は、多波干渉を起こし、入射した光の一部が反
射光となつて透明固体67より出射する。この出
射光の強度は、光学的平行平面固体67の温度に
より変化する。こうして反射光となつたλ1とλ2
光は、ビームスプリツタ10によつて光路を曲げ
られ、ミラ11、レンズ65を経て、検出端57
に入射した時と異なる光フアイバ58に入射す
る。
Next, a specific example of the optical temperature sensor 57 will be described. FIG. 8 shows an example of an optical temperature sensor based on the principle of multiwave interference, in which light is converted into a parallel beam by a lens 65 connected to the ends of optical fibers 55 and 58, and is emitted from the lens 65. The emitted light passes through the beam splitter 10, the light of λ 1 passes through the filter 66,
The light is incident on a transparent solid 67 with optically parallel planes. On the other hand, the light of λ 2 is reflected by the filter 66.
That is, the filter 66 has a characteristic of transmitting light of λ 1 and reflecting light of λ 2 . The light of λ 1 incident on the transparent solid body 67 (having an optically parallel plane) causes multiwave interference, and a part of the incident light becomes reflected light and exits from the transparent solid body 67 . The intensity of this emitted light changes depending on the temperature of the optical parallel plane solid 67. The reflected lights λ 1 and λ 2 have their optical paths bent by the beam splitter 10, pass through the mirror 11 and the lens 65, and then pass through the detection end 57.
It enters into a different optical fiber 58 than when it entered.

第9図は自然複屈折の原理に基づく光温度セン
サの例である。第9図では、レンズ65より出射
した平行ビームは偏光ビームスプリツタ68を通
り、直線偏光となつた後、波長板69を通つて位
相差を与えられる。この後、λ2の光はフイルタ6
6によつて反射される。λ1の光はフイルタ66を
透過し、光学的異方性結晶70に入射してその中
を進行し、反射膜71によつて反射し、再び光学
的異方性結晶70中を入射光とは逆向きに進行
し、フイルタ66を透過する。このとき、λ1の光
は光学的異方性結晶中でさらに位相差を与えられ
る。こうして反射光となつたλ1、λ2の光は波長板
69を再び通り、さらに位相差を加え楕円偏光と
なる。この後、偏光ビームスプリツタ68によ
り、一定方向の光の振動成分(S成分)を取り出
し、ミラ11、レンズ65を経て、検出端57に
入射した時と異なる光フアイバ58に入射する。
この時、波長板69によつて与えられる位相差
は、ほとんど温度依存性はないが、光学的異方性
結晶70によつて与えられる位相差は温度依存性
をもつ。つまり、λ1の光に与えられる位相差は温
度依存性をもつがλ2の光に与えられる位相差はほ
とんど温度依存性がない。このために、偏光ビー
ムスプリツタ68により取り出したλ1のS成分は
温度依存性をもつが、λ2のS成分はほとんど温度
依存性をもたない。
FIG. 9 is an example of an optical temperature sensor based on the principle of natural birefringence. In FIG. 9, a parallel beam emitted from a lens 65 passes through a polarizing beam splitter 68 to become linearly polarized light, and then passes through a wave plate 69 to be given a phase difference. After this, the light of λ 2 passes through the filter 6
6. The light of λ 1 passes through the filter 66, enters the optically anisotropic crystal 70, travels through it, is reflected by the reflective film 71, and passes through the optically anisotropic crystal 70 again as the incident light. travels in the opposite direction and passes through the filter 66. At this time, the light of λ 1 is further given a phase difference in the optically anisotropic crystal. The reflected lights of λ 1 and λ 2 pass through the wavelength plate 69 again, and are further subjected to a phase difference to become elliptically polarized light. Thereafter, the vibration component (S component) of the light in a certain direction is extracted by the polarizing beam splitter 68, passes through the mirror 11 and the lens 65, and enters the optical fiber 58 different from the one used when entering the detection end 57.
At this time, the phase difference provided by the wave plate 69 has almost no temperature dependence, but the phase difference provided by the optically anisotropic crystal 70 has temperature dependence. In other words, the phase difference given to the light of λ 1 has temperature dependence, but the phase difference given to the light of λ 2 has almost no temperature dependence. For this reason, the S component of λ 1 taken out by the polarizing beam splitter 68 has temperature dependence, but the S component of λ 2 has almost no temperature dependence.

上述した構成をとることにより、発光素子の出
力変動、光フアイバの光損失特性の変動等に基づ
く測定誤差を補償することができる。その理由を
以下に述べる。第5図において発光素子33から
発せられるλ1の光の強度をIλ1、受光素子59で
受光するλ1の光の強度をI1λ1とすると、I1λ1は、 I1λ1=M(T)Bλ111 (1) で与えられる。ここで、Dλ1のλ1の光が光フアイ
バ35、光合波器37、光フアイバ38、光分岐
器54を通過する時の光損失、Bλ1は光分岐器5
4を出射してから、光フアイバ55、センサ5
7、光フアイバ58を通り、受光素子59に入射
するまでの光損失、M(T)は温度センサ57で
の光強度の温度依存性をあらわす。Bλ1、Dλ1
1はそれぞれ時間依存性をもつ。一方、光源モ
ニタ用受光素子60で受光するλ1の光の強度を
I2λ1とすると、I2λ1は、 I2λ1=Cλ111 (2) で与えられる。ここで、Cλ1は光分岐器54を出
射してから光フアイバ56を通過し、光源モニタ
用受光素子60に入射するまでの光損失である。
同様に発光素子34から発せられたλ2の波長の光
の強度をIλ2、受光素子59、光源モニタ用受光
素子60で受光するλ2の光の強度を各々、I1λ2
I2λ2とすると I1λ2=Bλ222 (3) I2λ2=Cλ222 (4) で与えられる。ここで、Bλ2、Cλ2、Dλ2はλ1
場合と同様に、λ2の光に対する光伝送路の損失を
あらわしている。
By employing the above-described configuration, it is possible to compensate for measurement errors due to variations in the output of the light emitting element, variations in the optical loss characteristics of the optical fiber, and the like. The reason for this is explained below. In FIG. 5, if the intensity of the light of λ 1 emitted from the light emitting element 33 is Iλ 1 and the intensity of the light of λ 1 received by the light receiving element 59 is I 1 λ 1 , then I 1 λ 1 is I 1 λ 1 =M(T)Bλ 111 (1). Here, Bλ 1 is the optical loss when the light of λ 1 of Dλ 1 passes through the optical fiber 35, the optical multiplexer 37, the optical fiber 38, and the optical splitter 54, and Bλ 1
4, then the optical fiber 55 and the sensor 5
7. Light loss M(T) from passing through the optical fiber 58 to entering the light receiving element 59 represents the temperature dependence of the light intensity at the temperature sensor 57. Bλ 1 , Dλ 1 ,
Each Iλ 1 has time dependence. On the other hand, the intensity of the light of λ 1 received by the light receiving element 60 for monitoring the light source is
I 2 λ 1 is given by I 2 λ 1 = Cλ 1 11 (2). Here, Cλ 1 is the optical loss from outputting the optical splitter 54 to passing through the optical fiber 56 and entering the light receiving element 60 for monitoring the light source.
Similarly, the intensity of the light with wavelength λ 2 emitted from the light emitting element 34 is Iλ 2 , the intensity of the light with wavelength λ 2 received by the light receiving element 59 and the light receiving element 60 for light source monitoring is respectively I 1 λ 2 ,
If I 2 λ 2 , it is given by I 1 λ 2 =Bλ 222 (3) I 2 λ 2 =Cλ 222 (4). Here, Bλ 2 , Cλ 2 , and Dλ 2 represent the loss of the optical transmission path for the light of λ 2 , as in the case of λ 1 .

(1)、(2)、(3)、(4)式より I1λ1/I2λ1/I1λ2/I2λ2=M(T)Bλ1/C
λ1/Bλ2/Cλ2 となる。光伝送路の損失の波長依存性はほとんど
ないので Bλ1=Bλ2、Cλ1=Cλ2 (5) が成立し、 I1λ1/I2λ1/I1λ2/I2λ2=M(T) (6) となる。(6)式の右辺は、温度検出端の温度依存性
をあらわしており、光源変動、光伝送路の損失変
動は消去されている。このことから、本構成をと
ることによつて光源変動、光伝送路の損失変動に
かかわりなく、精度のよい温度測定が可能である
ことがわかる。
From equations (1), (2), (3), and (4), I 1 λ 1 /I 2 λ 1 /I 1 λ 2 /I 2 λ 2 =M(T)Bλ 1 /C
λ 1 /Bλ 2 /Cλ 2 . Since there is almost no wavelength dependence of loss in the optical transmission line, Bλ 1 = Bλ 2 , Cλ 1 = Cλ 2 (5) holds, and I 1 λ 1 /I 2 λ 1 /I 1 λ 2 /I 2 λ 2 =M(T) (6). The right side of equation (6) represents the temperature dependence of the temperature detection end, and light source fluctuations and optical transmission line loss fluctuations are eliminated. From this, it can be seen that by adopting this configuration, accurate temperature measurement is possible regardless of variations in the light source and variations in loss in the optical transmission line.

次に第5図の変形例を述べる。第10図はλ1
λ2の光を交互に発光するのではなく、同時に発光
するようにした例である。第5図と異なるところ
は、光が受光素子59、光源モニタ用受光素子6
0に入射する前に、光分波器72でλ1とλ2の光を
分波し、λ1とλ2で異なる受光素子59,59′、
光源モニタ用受光素子60,60′に光が入射す
る点である。これに従つて、信号処理部61が変
化し、その例を第11図に示す。すなわちI1λ1
I2λ1を計算するためとI1λ2/I2λ2を計算するため
に別個に二つの割算器45を備え、その商をさら
に別の割算器45′によつて割算する。さらに受
光素子駆動部73も波長λ1とλ2の発光素子33,
34を同時に駆動できるように変形されたもので
ある。
Next, a modification of FIG. 5 will be described. FIG. 10 shows an example in which the lights of λ 1 and λ 2 are not emitted alternately, but are emitted simultaneously. The difference from FIG. 5 is that the light is transmitted to the light receiving element 59 and the light receiving element 6 for monitoring the light source.
0, the light of λ 1 and λ 2 are separated by an optical demultiplexer 72, and different light receiving elements 59, 59' for λ 1 and λ 2 are used.
This is the point where light enters the light receiving elements 60, 60' for monitoring the light source. Accordingly, the signal processing section 61 changes, an example of which is shown in FIG. That is, I 1 λ 1 /
Two dividers 45 are provided separately for calculating I 2 λ 1 and I 1 λ 2 /I 2 λ 2 , and the quotient is further divided by another divider 45'. do. Further, the light receiving element driving section 73 also includes the light emitting elements 33 with wavelengths λ 1 and λ 2 ,
This has been modified so that 34 motors can be driven at the same time.

第12図は第10図を同様に、波長λ1とλ2の光
を同時に発光させる構成であるが、光が光合波器
54に入射する前に光分岐器54により分岐した
光源モニタ用受光素子60,60′に入射させる
方式であり、光源モニタ用受光素子60,60′
の前に光分波器72を必要としない。第13図
は、λ1とλ2の光を交互に発光させる方式である
が、検出端57へ入射する光と出射する光を同一
の光フアイバにした構成である。発光素子33,
34から出射した光は光フアイバ35,36、光
合波器37、光フアイバ38を通り、光方向結合
器74に入射する。ここで、光の一部を分岐し、
分岐された光は光フアイバ56を通り、光源モニ
タ用受光素子60に入射する。光方向結合器74
を出射するもう一方の光は、光フアイバ55を通
り、温度検出端57に入射し、その内部で反射さ
れ、入射した光フアイバ55に再び入射し、光方
向結合器74に達する。ここで光は、光源モニタ
用受光素子60にする向きとは異なる向きに分岐
され、光フアイバ56′を通り、受光素子59に
入射する。この構成においては、発光素子駆動部
32、信号処理部61とも第5図の構成と同一で
ある。第14図は第13図の方式を第10図の方
式と組み合わせて同時発光の光に対して適用でき
るようにしたものである。第13、第14図の方
式における温度センサの例を第15、第16図に
示す。第15図は自然複屈折の原理を、第16図
は多波干渉の原理を使用したものである。両図に
おいてλ2の光はフイルタ66によつて反射され、
光学的異方性結晶70あるいは光学的平行平面を
有する透明固体67に入射せず戻るが、λ1の光は
フイルタ66を通過し、異方性結晶70あるいは
透明固体67に入射し、反射膜71あるいは透明
固体67の端面に反射されて戻る。
FIG. 12 is similar to FIG. 10, but has a configuration in which light with wavelengths λ 1 and λ 2 are emitted simultaneously, but before the light enters the optical multiplexer 54, the light is split by the optical splitter 54 and is received for light source monitoring. This is a method in which the light enters the light receiving elements 60, 60' for light source monitoring.
There is no need for an optical demultiplexer 72 in front of the optical demultiplexer 72. FIG. 13 shows a system in which light of λ 1 and λ 2 are emitted alternately, but the configuration is such that the light incident on the detection end 57 and the light emitted from the detection end 57 are transmitted through the same optical fiber. light emitting element 33,
The light emitted from the optical fiber 34 passes through the optical fibers 35 and 36, the optical multiplexer 37, and the optical fiber 38, and enters the optical directional coupler 74. Here, part of the light is split,
The branched light passes through the optical fiber 56 and enters the light receiving element 60 for monitoring the light source. Optical directional coupler 74
The other light emitted passes through the optical fiber 55, enters the temperature detection end 57, is reflected therein, enters the optical fiber 55 into which it entered again, and reaches the optical directional coupler 74. Here, the light is branched in a direction different from the direction toward the light receiving element 60 for monitoring the light source, passes through the optical fiber 56', and enters the light receiving element 59. In this configuration, both the light emitting element driving section 32 and the signal processing section 61 are the same as the configuration shown in FIG. FIG. 14 shows a combination of the method shown in FIG. 13 and the method shown in FIG. 10 so that it can be applied to simultaneously emitted light. Examples of temperature sensors using the methods shown in FIGS. 13 and 14 are shown in FIGS. 15 and 16. FIG. 15 uses the principle of natural birefringence, and FIG. 16 uses the principle of multiwave interference. In both figures, the light of λ 2 is reflected by the filter 66,
The light of λ 1 does not enter the optically anisotropic crystal 70 or the transparent solid 67 having optically parallel planes but returns, but the light of λ 1 passes through the filter 66, enters the anisotropic crystal 70 or the transparent solid 67, and passes through the reflective film. 71 or the end face of the transparent solid 67 and returns.

以上述べたように本発明は波長の異なる二つの
光を用い、同一の光伝送路を通過させ、温度セン
サにおいて一方の波長の光の強度のみを温度に依
存して変化させ、温度センサに入射する前に分岐
したそれぞれの波長の光の強度との比を計算し、
さらにそれらの商を比較することによつて温度を
測定するもので、これにより自然複屈折の温度変
化あるいは多波干渉の温度依存性等の原理に基づ
く光温度センサの光伝送特性の変動を補償するこ
とができる。さらに発光源の変動が生じても精度
のよい温度測定が得られるもので、二つの波長の
うち一方の波長に対してのみ温度に依存した強度
変化を与える光温度センサを利用した温度測定装
置に広く適用して極めて有効である。
As described above, the present invention uses two lights of different wavelengths, passes them through the same optical transmission path, changes only the intensity of the light of one wavelength at the temperature sensor depending on the temperature, and then inputs the light into the temperature sensor. Before doing so, calculate the ratio of the light intensity of each branched wavelength,
Furthermore, the temperature is measured by comparing their quotients, thereby compensating for fluctuations in the optical transmission characteristics of the optical temperature sensor based on principles such as temperature changes in natural birefringence or temperature dependence of multiwave interference. can do. Furthermore, even if the light source fluctuates, highly accurate temperature measurements can be obtained, and temperature measurement devices that use an optical temperature sensor that produces a temperature-dependent intensity change for only one of two wavelengths. It is widely applicable and extremely effective.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の光温度センサを用いた温度測定
装置の一例の系統図、第2図Aはそれに利用され
る螢光物質の特性を示す励起紫外線と放射光との
スペクトル図、第2図Bは放射光の波長a、cの
光強度およびその比と温度との関係線図、第3図
は別の従来例の系統図、第4図Aはそれに利用さ
れる半導体の吸収端特性の温度依存性、第4図B
はそれに基づく半導体を通過した光の光強度の依
存性をそれぞれ示す線図、第5図は本発明による
温度測定装置の一実施例の構成図、第6図はその
発光素子駆動部の系統図、第7図はその信号処理
部の系統図、第8図はその光温度センサの一実施
例を示す系統図、第9図は別の実施例を示す系統
図、第10図は温度測定装置の別の実施例を示す
系統図、第11図はその変形例における信号処理
部の系統図、第12ないし第14図はそれぞれ温
度測定装置のさらに異なる実施例の系統図、第1
5、第16図は第13、第14図に示す装置に用
いられる光温度センサの二つの実施例をそれぞれ
示す系統図である。 33,34……発光素子、35,36,38,
55,56,56′……光フアイバ、37……光
合波器、54……光分岐器、57……光温度セン
サ、59,59′……受光素子、60,60′……
光源モニタ用受光素子、61……信号処理部、6
4……表示部、67……光学的平行平面を有する
透明固体、70……光学的異方性結晶、74……
光方向性結合器。
Fig. 1 is a system diagram of an example of a temperature measuring device using a conventional optical temperature sensor, Fig. 2A is a spectrum diagram of excitation ultraviolet rays and emitted light showing the characteristics of the fluorescent substance used in it, Fig. 2 B is a diagram of the relationship between the light intensity of wavelengths a and c of the synchrotron radiation and their ratio and temperature, Figure 3 is a systematic diagram of another conventional example, and Figure 4A is a diagram of the absorption edge characteristics of the semiconductor used for it. Temperature dependence, Figure 4B
5 is a diagram showing the dependence of the light intensity of light passing through a semiconductor based on the above, FIG. 5 is a block diagram of an embodiment of the temperature measuring device according to the present invention, and FIG. 6 is a system diagram of the light emitting element driving section thereof. , Fig. 7 is a system diagram of the signal processing section, Fig. 8 is a system diagram showing one embodiment of the optical temperature sensor, Fig. 9 is a system diagram showing another embodiment, and Fig. 10 is the temperature measuring device. FIG. 11 is a system diagram showing another embodiment of the temperature measuring device, FIG. 11 is a system diagram of the signal processing section in the modified example, and FIGS.
5 and 16 are system diagrams showing two embodiments of the optical temperature sensor used in the apparatus shown in FIGS. 13 and 14, respectively. 33, 34... Light emitting element, 35, 36, 38,
55, 56, 56'... Optical fiber, 37... Optical multiplexer, 54... Optical splitter, 57... Optical temperature sensor, 59, 59'... Light receiving element, 60, 60'...
Light receiving element for light source monitor, 61...Signal processing section, 6
4... Display portion, 67... Transparent solid having optically parallel planes, 70... Optically anisotropic crystal, 74...
Optical directional coupler.

Claims (1)

【特許請求の範囲】 1 異なる二つの波長における光学特性が温度依
存性を示す光温度センサを具備した温度測定装置
において、波長の異なる二つの光の発光源と、前
記二つの光をそれぞれ二つの部分に分ける分岐器
と、前記一方の部分の光が導かれ一方の波長の光
を内部に導く手段が設けられて前記一方の波長の
光の強度のみを温度に依存して変化させる前記光
温度センサと、該光温度センサを経た一方の部分
の光と他方の部分の光の強度の比を計算し、さら
に両波長の光に対するそれぞれの比を比較して温
度を算出する手段とを備えたことを特徴とする温
度測定装置。 2 特許請求の範囲第1項記載の装置において、
光温度センサが自然複屈折の温度依存性を利用し
たものであることを特徴とする温度測定装置。 3 特許請求の範囲第1項記載の装置において、
光温度センサが多波干渉の温度依存性を利用した
ものであることを特徴とする温度測定装置。
[Scope of Claims] 1. A temperature measuring device equipped with an optical temperature sensor whose optical characteristics at two different wavelengths exhibit temperature dependence, including a light emitting source of two light having different wavelengths, and two light emitting sources for each of the two lights. The light temperature is provided with a splitter that divides the light into parts, and a means for guiding the light of the one part and guiding the light of one wavelength to the inside, so that only the intensity of the light of the one wavelength is changed depending on the temperature. A sensor, and means for calculating the ratio of the intensity of the light in one part and the light in the other part that have passed through the light temperature sensor, and further calculating the temperature by comparing the respective ratios for the light of both wavelengths. A temperature measuring device characterized by: 2. In the device according to claim 1,
A temperature measuring device characterized in that the optical temperature sensor utilizes the temperature dependence of natural birefringence. 3. In the device according to claim 1,
A temperature measuring device characterized in that the optical temperature sensor utilizes the temperature dependence of multiwave interference.
JP11770082A 1982-07-08 1982-07-08 Temperature measuring device Granted JPS599526A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11770082A JPS599526A (en) 1982-07-08 1982-07-08 Temperature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11770082A JPS599526A (en) 1982-07-08 1982-07-08 Temperature measuring device

Publications (2)

Publication Number Publication Date
JPS599526A JPS599526A (en) 1984-01-18
JPH0131580B2 true JPH0131580B2 (en) 1989-06-27

Family

ID=14718135

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11770082A Granted JPS599526A (en) 1982-07-08 1982-07-08 Temperature measuring device

Country Status (1)

Country Link
JP (1) JPS599526A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3534990A1 (en) * 1985-10-01 1987-04-02 Philips Patentverwaltung METHOD FOR MEASURING THE WAVELENGTH LENGTH OF THE ATTENUATION OF THE INTENSITY OF AN OPTICAL RADIATION Caused IN AN OPTICAL TRANSMISSION SYSTEM
US7489219B2 (en) 2003-07-16 2009-02-10 Marvell World Trade Ltd. Power inductor with reduced DC current saturation
US7307502B2 (en) 2003-07-16 2007-12-11 Marvell World Trade Ltd. Power inductor with reduced DC current saturation
JP2014167605A (en) * 2013-01-30 2014-09-11 Mitsubishi Cable Ind Ltd Optical sensor device and optical fiber cable used for the same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5714729A (en) * 1980-07-01 1982-01-26 Nec Corp Temperature measuring device

Also Published As

Publication number Publication date
JPS599526A (en) 1984-01-18

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