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JPH0133955B2 - - Google Patents
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JPH0133955B2 - - Google Patents

Info

Publication number
JPH0133955B2
JPH0133955B2 JP59146403A JP14640384A JPH0133955B2 JP H0133955 B2 JPH0133955 B2 JP H0133955B2 JP 59146403 A JP59146403 A JP 59146403A JP 14640384 A JP14640384 A JP 14640384A JP H0133955 B2 JPH0133955 B2 JP H0133955B2
Authority
JP
Japan
Prior art keywords
thin film
cds
cdse
cdcl
photoconductive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59146403A
Other languages
Japanese (ja)
Other versions
JPS6124286A (en
Inventor
Kosuke Ikeda
Yoichi Harada
Mikihiko Nishitani
Toshio Yamashita
Noboru Yoshigami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP59146403A priority Critical patent/JPS6124286A/en
Publication of JPS6124286A publication Critical patent/JPS6124286A/en
Publication of JPH0133955B2 publication Critical patent/JPH0133955B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/125The active layers comprising only Group II-VI materials, e.g. CdS, ZnS or CdTe

Landscapes

  • Light Receiving Elements (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

産業上の利用分野 本発明は可視域の光センサとして使用される光
導電性薄膜の製造方法に関するものである。 従来例の構成とその問題点 従来、CdSやCdSeを主体とする光センサは光
電流が大きいため、特にこの2種の化合物の固溶
体CdS−CdSeを主体とする光センサでは可視光
全域をカバーする感度を有するため、フアクシミ
リの密着型ラインセンサ用などとして注目され開
発されてきた。 このCdS−CdSe光センサの代表的製法は以下
の通りである。すなわち、適当な基板上にCdS−
CdSe固溶体の薄膜を蒸着形成し、CdCl2の蒸発源
としての例えばCdS:CdCl2(混合、焼結、粉砕し
た)粉末を該薄膜と共にアルミナ等の半密閉容器
に入れて500℃程度の高温度に加熱して蒸発した
CdCl2の蒸気中で結晶成長させ、同時に増感中心
を形成させ大きな光電流を得るに至るのである
(この工程を活性化と称する)。上記の製法のまゝ
では暗電流がかなり大きいのでCdS−CdSeの薄
膜の蒸着時に同時に蒸着源にCuを例えばCdS1-x
Sex:CuCl2(0x1;CdS、CdSe、CuCl2
混合、焼結、粉砕したもの)の形で混入しておき
蒸着膜中にCuを添加しておけば暗電流をかなり
小さくすることができる。 さて、CdCl2蒸気による活性化で増感中心を形
成し、光電子の寿命を長くし、結果として大きな
光電流を得ることができる反面、基本的には光電
子の寿命が光応答時間に対応するので光電流が大
きいと応答時間が長くなつてしまう。その上に薄
膜表面へのCdCl2の付着残存などの影響で電極の
付着強度も弱くて、暗電流も大きく特性の再現性
も悪く、場所的ばらつきも大きいという欠点を有
している。 発明の目的 本発明は従来の製法による光導電性薄膜に比べ
て、電極の付着強度が強くて、暗電流が小さく、
光電流の光応答時間が短く、かつ特性の再現性に
優れ、ばらつきの小さい光導電性薄膜を製造する
方法を提供する。 発明の構成 本発明はCdS、CdSeあるいはCdS−CdSe固溶
体を主成分として成る薄膜を基板上に形成し、
CdCl2の粉末と共に半密閉容器に入れ、高温度に
て該薄膜をCdCl2の蒸気に暴露して結晶成長と共
に活性化して後、電極形成して光導電性薄膜を製
造するに際して、、電極形成の前に薄膜を水洗処
理することを特徴とする光導電性薄膜の製造方法
である。 実施例の説明 薄膜の厚さは2000〜10000Åであることが好ま
しい。2000Å以下だと結晶成長の段階で若干の膜
厚減少などの影響が見られ光電流Jpが小さくな
り、かつその立上り時間τrは逆に大きくなり、
10000Å以上だとJpが大きく、かつその立下り時
間τdが長くなる傾向があるからである。結晶成長
の温度は450〜600℃が好ましい。450℃以下だと
CdCl2の蒸気圧が不足して結晶成長が起り難く、
600℃以上では逆にCdCl2の蒸気圧が高すぎて結
晶成長が促進され過ぎてピンホールが生じたりす
るからである。水洗処理時の温度は室温でも良い
が40〜80℃が更に好ましい。40℃以下では効果を
得るのに時間がかゝり、80℃以上では薄膜の剥離
を生じたりすることがあるからである。水洗時に
超音波を併用すると短時間の処理で済む。この水
洗処理によつて光センサの暗電流Jdが著しく減少
し、特性(Jp、τr、τd)が安定化すると共に応答
(τr、τd)が早くなる。 以下、本発明の効果を実施例をもつて説明す
る。 実施例 ガラス基板(コーニング社7059、230×50×1.2
mm3)の上にCdS0.6Se0.4:CuCl2(0.2モル%)を蒸
発源として約4000Åの厚さに蒸着した。蒸着膜中
に含まれるCuの量は0.008モル%であつた。図に
見られる様にアルミナ製ボード本体1(上ぶた2
つき内容積52×310×20mm3の直方体)の中央底部
にCdS:CdCl2(2モル%)粉末を0.2g/cmの割
合で長さ方向に置き、その上に上記蒸着膜を設け
たガラス基板3を上向きに置きふた2とのギヤツ
プが2mmである様にしてふたをして加熱する。 500℃で1時間加熱した。この様にして得た膜
をボートから取出しさらに20、40、60および80℃
の水中で超音波をかけながら2分間洗浄し乾燥後
NiCr/Auの電極を蒸着形成した(巾2mm、ギヤ
ツプ1mm)。この様にして得た光センサにDC10V
を印加して100ルツクスの緑色光(波長555nm)
を照射(1Hzで0.5secずつ)してJpとそのτr(0か
ら飽和値の90%まで上がる時間)、τd(飽和値から
そお10%まで下がる時間)を測定した。結果を水
洗処理のない場合の結果と共に表に載せる。
INDUSTRIAL APPLICATION FIELD The present invention relates to a method for producing a photoconductive thin film used as a visible range optical sensor. Conventional configurations and their problems Conventional optical sensors based on CdS and CdSe have large photocurrents, so optical sensors based on CdS-CdSe, a solid solution of these two compounds, cover the entire visible light range. Due to its high sensitivity, it has been attracting attention and being developed as a contact-type line sensor for facsimile machines. A typical manufacturing method for this CdS-CdSe optical sensor is as follows. That is, CdS− is placed on a suitable substrate.
A thin film of CdSe solid solution is formed by vapor deposition, and a CdS:CdCl 2 (mixed, sintered, and pulverized) powder as an evaporation source of CdCl 2 is placed together with the thin film in a semi-closed container made of alumina or the like and heated to a high temperature of about 500°C. evaporated by heating to
Crystals are grown in CdCl 2 vapor, and at the same time sensitizing centers are formed to obtain a large photocurrent (this process is called activation). If the above manufacturing method is used, the dark current is quite large, so when depositing the CdS-CdSe thin film, Cu is used as the evaporation source at the same time, for example, CdS 1-x.
Se x : If Cu is mixed in the form of CuCl 2 (0x1; CdS, CdSe, and CuCl 2 mixed, sintered, and crushed) and added to the deposited film, the dark current can be significantly reduced. can. Now, activation by CdCl 2 vapor forms sensitizing centers, lengthens the lifetime of photoelectrons, and as a result, it is possible to obtain a large photocurrent, but basically the lifetime of photoelectrons corresponds to the photoresponse time. If the photocurrent is large, the response time will be long. In addition, the adhesion strength of the electrode is weak due to the residual adhesion of CdCl 2 on the surface of the thin film, the dark current is large, the reproducibility of characteristics is poor, and there are large spatial variations. Purpose of the Invention The present invention has stronger electrode adhesion strength, lower dark current, and lower dark current than photoconductive thin films manufactured using conventional methods.
Provided is a method for manufacturing a photoconductive thin film that has a short photocurrent response time, excellent reproducibility of characteristics, and small variations. Structure of the Invention The present invention forms a thin film mainly composed of CdS, CdSe or CdS-CdSe solid solution on a substrate,
When manufacturing a photoconductive thin film by placing the thin film together with CdCl 2 powder in a semi-closed container and exposing the thin film to CdCl 2 vapor at high temperature to activate it along with crystal growth, electrode formation is performed. This is a method for producing a photoconductive thin film, which is characterized by washing the thin film with water before washing. Description of Examples The thickness of the thin film is preferably 2000-10000 Å. If it is less than 2000 Å, there will be effects such as a slight decrease in film thickness during the crystal growth stage, and the photocurrent J p will become smaller, and its rise time τ r will conversely become larger.
This is because when it is 10,000 Å or more, J p tends to be large and its fall time τ d tends to become long. The crystal growth temperature is preferably 450 to 600°C. If it is below 450℃
Crystal growth is difficult to occur due to insufficient vapor pressure of CdCl 2 ,
On the other hand, at temperatures above 600°C, the vapor pressure of CdCl 2 is too high and crystal growth is promoted too much, resulting in pinholes. The temperature during the water washing treatment may be room temperature, but is more preferably 40 to 80°C. This is because if it is below 40°C, it will take time to obtain the effect, and if it is above 80°C, the thin film may peel off. If ultrasonic waves are used in conjunction with water washing, the process can be completed in a short time. This water washing process significantly reduces the dark current J d of the optical sensor, stabilizes the characteristics (J p , τ r , τ d ), and speeds up the response (τ r , τ d ). Hereinafter, the effects of the present invention will be explained using examples. Example Glass substrate (Corning 7059, 230×50×1.2
mm 3 ), CdS 0.6 Se 0.4 :CuCl 2 (0.2 mol %) was evaporated to a thickness of about 4000 Å using an evaporation source. The amount of Cu contained in the deposited film was 0.008 mol%. As shown in the figure, the alumina board body 1 (upper lid 2
CdS:CdCl 2 (2 mol %) powder was placed in the length direction at a ratio of 0.2 g/cm at the center bottom of a rectangular parallelepiped with an internal volume of 52 x 310 x 20 mm 3 , and the above vapor deposited film was provided on top of the glass. Place the substrate 3 facing upward, leave a gap of 2 mm with the lid 2, cover with the lid, and heat. Heated at 500°C for 1 hour. The membrane thus obtained was taken out from the boat and further heated to 20, 40, 60 and 80°C.
After washing in water for 2 minutes with ultrasonic waves and drying
NiCr/Au electrodes were formed by vapor deposition (width 2 mm, gap 1 mm). DC10V is applied to the optical sensor obtained in this way.
Apply 100 lux of green light (wavelength 555nm)
was irradiated (at 1 Hz, 0.5 seconds each), and J p , its τ r (time to rise from 0 to 90% of the saturation value), and τ d (time to fall from the saturation value to 10%) were measured. The results are listed in the table along with the results without water washing.

【表】 また電極のテープ剥離テストにより未処理のも
のは剥離することがあるが、水洗処理したもので
は剥離することがない。 発明の効果 表に見られる様に、この水洗処理によつて電極
の付着強度が高まる上に暗電流が著しく減少する
と共に光電流の応答特性(立上り時間、立下り時
間)が早くなり、しかも特性の再現性が優れ、ば
らつきも小さくなる。
[Table] In addition, untreated electrodes may peel off in the tape peel test, but those that have been washed with water do not. Effects of the invention As can be seen in the table, this water washing treatment not only increases the adhesion strength of the electrode, but also significantly reduces the dark current, and speeds up the photocurrent response characteristics (rise time, fall time). The reproducibility is excellent and the variation is small.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明に用いるボードの断面図である。 1……ボード本体、2……ボードふた、3……
ガラス基板、4……CdS:CdCl2粉末。
The figure is a sectional view of a board used in the present invention. 1...Board body, 2...Board lid, 3...
Glass substrate, 4...CdS: CdCl2 powder.

Claims (1)

【特許請求の範囲】 1 CdS−CdSeあるいはこれら2種の化合物の
固溶体CdS−CdSeを主体として成り、これに微
量のCuを含んだ薄膜を基板上に形成し、前記薄
膜をCdCl2の蒸気中にて加熱処理して結晶成長と
共に活性化した後、電極形成して光導電性薄膜を
製造するに際して、前記電極形成の前に前記薄膜
を水洗処理することを特徴とする光導電性薄膜の
製造方法。 2 薄膜の厚さが2000〜10000Å、結晶成長の温
度が450〜600℃、水洗処理の温度が40〜80℃であ
ることを特徴とする特許請求の範囲第1項記載の
光導電性薄膜の製造方法。
[Claims] 1. A thin film mainly composed of CdS-CdSe or a solid solution of these two types of compounds, CdS-CdSe, containing a trace amount of Cu, is formed on a substrate, and the thin film is soaked in CdCl 2 vapor. Production of a photoconductive thin film, which is characterized in that the thin film is washed with water before forming the electrodes, after being activated with crystal growth through heat treatment at , and then forming electrodes to produce the photoconductive thin film. Method. 2. The photoconductive thin film according to claim 1, wherein the thin film has a thickness of 2000 to 10000 Å, a crystal growth temperature of 450 to 600°C, and a water washing temperature of 40 to 80°C. Production method.
JP59146403A 1984-07-13 1984-07-13 Manufacture of photoconductive thin-film Granted JPS6124286A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59146403A JPS6124286A (en) 1984-07-13 1984-07-13 Manufacture of photoconductive thin-film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59146403A JPS6124286A (en) 1984-07-13 1984-07-13 Manufacture of photoconductive thin-film

Publications (2)

Publication Number Publication Date
JPS6124286A JPS6124286A (en) 1986-02-01
JPH0133955B2 true JPH0133955B2 (en) 1989-07-17

Family

ID=15406912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59146403A Granted JPS6124286A (en) 1984-07-13 1984-07-13 Manufacture of photoconductive thin-film

Country Status (1)

Country Link
JP (1) JPS6124286A (en)

Also Published As

Publication number Publication date
JPS6124286A (en) 1986-02-01

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