JPH0136230B2 - - Google Patents
Info
- Publication number
- JPH0136230B2 JPH0136230B2 JP56017790A JP1779081A JPH0136230B2 JP H0136230 B2 JPH0136230 B2 JP H0136230B2 JP 56017790 A JP56017790 A JP 56017790A JP 1779081 A JP1779081 A JP 1779081A JP H0136230 B2 JPH0136230 B2 JP H0136230B2
- Authority
- JP
- Japan
- Prior art keywords
- lens
- magnetomotive force
- projection lens
- distortion aberration
- distortion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000004075 alteration Effects 0.000 claims description 40
- 230000007423 decrease Effects 0.000 claims description 11
- 238000003384 imaging method Methods 0.000 claims description 5
- 230000005284 excitation Effects 0.000 description 22
- 230000003287 optical effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 3
- 238000010894 electron beam technology Methods 0.000 description 3
- 241000226585 Antennaria plantaginifolia Species 0.000 description 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Description
【発明の詳細な説明】
本発明はS字歪収差を殆んど零にした3磁極レ
ンズを投影レンズとして使用し、歪収差を極めて
小さく、或いは殆んど発生させることなしに倍率
可変を可能にする新規な電子顕微鏡の結像レンズ
系に関するものである。[Detailed Description of the Invention] The present invention uses a three-magnetic pole lens with almost zero S-shaped distortion aberration as a projection lens, and allows variable magnification with extremely small or almost no distortion aberration. This invention relates to a new imaging lens system for an electron microscope.
通常、対物レンズ、投影レンズ及び両者間に置
かれた中間レンズからなる3段結像レンズ系にお
ける倍率可変は、中間レンズの励磁NIiを一定と
して投影レンズの励磁NIpを増加させる領域
(M1レンジ)、投影レンズの励磁を最大値に固定
した状態で中間レンズの励磁NIiを減少させる領
域(M2レンジ)及び投影レンズの励磁NIpは最
大に固定したまま中間レンズの励磁をM1レンジ
のときの励磁より増加させる領域(M3レンジ)
の3つの領域で構成されている。この内、M1レ
ンジにおいては既にデイストーシヨンフリーの条
件を満足する方式(例えば特公昭36−7569号公報
参照)が確立されており、充分に小さな歪収差が
得られている。しかし乍ら、M2レンジにおいて
は中間レンズの励磁を減少させるため、投影レン
ズの作る糸巻歪を該中間レンズの樽形歪によつて
充分打消すことができなくなり、又M3レンズに
おいては投影レンズ、中間レンズのいずれもが糸
巻歪となり、デイストーシヨンフリーの条件は存
在しない。更に、従来のレンズ系においてはS字
歪収差について何等補正されず、従つて、直線の
像はS字形に醜く歪んでいた。 Normally, variable magnification in a three-stage imaging lens system consisting of an objective lens, a projection lens, and an intermediate lens placed between them is achieved in a region (M 1 range), a region where the excitation of the intermediate lens NI i is decreased with the excitation of the projection lens fixed at the maximum value (M 2 range), and an area where the excitation of the intermediate lens is reduced with the excitation of the projection lens NI p fixed at the maximum value (M 2 range). Area to be increased from excitation in 1 range (M 3 range)
It consists of three areas. Among these, in the M1 range, a system that satisfies the distortion-free condition has already been established (see, for example, Japanese Patent Publication No. 7569/1983), and a sufficiently small distortion aberration can be obtained. However, in the M2 range, because the excitation of the intermediate lens is reduced, the pincushion distortion created by the projection lens cannot be sufficiently canceled by the barrel distortion of the intermediate lens, and in the M3 lens, the projection Both the lens and the intermediate lens suffer from pincushion distortion, and distortion-free conditions do not exist. Furthermore, in conventional lens systems, no correction is made for S-shaped distortion aberration, and therefore, straight images are unsightly distorted into an S-shape.
所で、近時、本発明者はS字歪収差は零にし得
る3磁極レンズを開発し、更に歪収差とS字歪収
差とを同時に零にできる磁極形状が存在すること
も見出した。しかし乍ら、斯る条件は特定の起磁
力においてのみ存在し、投影レンズとしてその励
磁を該特定の起磁力より大きくしても、又小さく
しても著じるしく大きな歪収差を発生するので固
定倍率においてしか利用できなかつた。 By the way, the present inventor has recently developed a three-magnetic pole lens that can eliminate the S-shaped distortion aberration, and has also discovered that there is a magnetic pole shape that can simultaneously eliminate the distortion aberration and the S-shaped distortion aberration. However, such a condition exists only under a specific magnetomotive force, and even if the excitation of the projection lens is made larger or smaller than the specific magnetomotive force, a significantly large distortion aberration will occur. It was only available at fixed magnification.
而して、通常の電子顕微鏡においては、倍率を
種々変更した像を観察することが不可欠であり、
従つて、3磁極レンズを用いて歪収差とS字歪収
差をいずれも零、又は著じるしく小さく保つたま
ま、倍率を可変できる方法の出現がまたれた。 Therefore, with ordinary electron microscopes, it is essential to observe images at various magnifications.
Therefore, a method has emerged in which the magnification can be varied while keeping both distortion and S-shaped distortion at zero or significantly small using a three-pole lens.
本発明はこの様な要求を満足し得る電子顕微鏡
の結像レンズ系を提供するものである。 The present invention provides an imaging lens system for an electron microscope that can satisfy these requirements.
第1図は歪収差及びS字歪収差を零、又は著じ
るしく小さくし得る3磁極レンズの磁極形状の一
例を示すもので、1,2及び3は夫々第1磁極、
第2磁極及び第3磁極を示す。第2磁極と第3磁
極の孔径b2及びb3は等しくされ、第1磁極の孔径
b1と第2磁極の孔径b2との比b1/b2が1.5〜5の
範囲に設定される。第2図はb1/b2=3.3に選定
したときの歪収差ΔX/X、S字歪収差ΔY/X
及び焦点距離fpの起磁力依存性を示すグラフであ
る。同図からわかるように、歪収差とS字歪収差
は起磁力がNI1のとき共に零になる。上記NI1は
実験では2500AT弱であつた。しかし、倍率を小
さくするため励磁を弱めるとNI2(約1500AT)に
おいて焦点距離fpはNI1のときの1.6倍にしかなら
ないのに歪収差は10%にも増大してしまう。従つ
て、この様な3磁極レンズは倍率を変化させるた
めにその励磁を変えることはできないことにな
る。 FIG. 1 shows an example of the magnetic pole shape of a three-pole lens that can reduce distortion aberration and S-shaped distortion aberration to zero or significantly. 1, 2, and 3 are the first magnetic pole,
A second magnetic pole and a third magnetic pole are shown. The hole diameters b 2 and b 3 of the second magnetic pole and the third magnetic pole are made equal, and the hole diameter of the first magnetic pole is
The ratio b 1 /b 2 of b 1 to the hole diameter b 2 of the second magnetic pole is set in the range of 1.5 to 5. Figure 2 shows the distortion aberration ΔX/X and S-shaped distortion aberration ΔY/X when b 1 /b 2 = 3.3.
and is a graph showing the dependence of focal length f p on magnetomotive force. As can be seen from the figure, distortion aberration and S-shaped distortion aberration both become zero when the magnetomotive force is NI 1 . The above NI 1 had a power of just under 2500 AT in experiments. However, if the excitation is weakened to reduce the magnification, the focal length f p at NI 2 (approximately 1500 AT) is only 1.6 times that at NI 1 , but the distortion increases by as much as 10%. Therefore, such a three-pole lens cannot change its excitation to change the magnification.
そこで、本発明者は、この様な3磁極レンズを
投影レンズに使用すると共に該投影レンズと対物
レンズの間に2磁極の中間レンズを設け、この中
間レンズの励磁可変によつて倍率を変えることを
試みた。第3図はその装置の概略を示す図であ
り、4は対物レンズである。該対物レンズは電源
5により励磁され、磁極間隙6内に強いレンズ磁
界を発生する。7は試料で、実際には前記磁極間
隙6内に挿入される。8は3磁極投影レンズで、
電源9により励磁され、磁極間隙10a,10b
に互いに逆極性の磁場を発生する。対物レンズ4
と投影レンズ8の間に2磁極の中間レンズ11が
置かれ、電源12により励磁される。13は終像
が投影される蛍光板である。 Therefore, the present inventor proposed a method of using such a three-magnetic pole lens as a projection lens, and providing an intermediate lens with two magnetic poles between the projection lens and the objective lens, and changing the magnification by variable excitation of this intermediate lens. I tried. FIG. 3 is a diagram schematically showing the apparatus, and 4 is an objective lens. The objective lens is excited by a power source 5 and generates a strong lens magnetic field within the magnetic pole gap 6. Reference numeral 7 denotes a sample, which is actually inserted into the magnetic pole gap 6. 8 is a 3 magnetic pole projection lens,
Excited by power source 9, magnetic pole gaps 10a, 10b
generate magnetic fields of opposite polarity. Objective lens 4
A two-pole intermediate lens 11 is placed between the projection lens 8 and the projection lens 8, and is excited by a power source 12. 13 is a fluorescent screen on which the final image is projected.
斯る装置において、中間レンズとして磁極間隙
長Siと磁極孔径biの和Si+bi=45mmを有し、中間
レンズ11のレンズ中心と投影レンズ8のレンズ
中心の距離が130mmとしたときの軸上磁場分布
Bz、光軸Zに平行に入射する電子線の軌道r〓、光
軸Zと平行して出射する電子線の軌道r〓、歪収差
係数Dr及びS字歪収差係数Dspを第4図に示して
ある。同図aは中間レンズの励磁NIiが零の場合、
bはNIi=600ATの場合であり、又投影レンズの
励磁NIpはいずれも約2250ATの場合である。a
図の如く、中間レンズの励磁が零の場合、歪は投
影レンズのみによつて作られ、収差係数Drは第
1間隙で負の値をとり増加するが、電子線軌道r〓
が光軸Zと交叉する時点で極大となり次第に減少
し、零を切つた後正の値で増加する。そしてr〓軌
道が光軸と交叉する点で極大となり、再び減少す
る。歪収差ΔX/Xは歪収差係数Drと
ΔX/X=Dr(Xf/L)2
で結ばれている。ここでXは蛍光板(又は写真フ
イルム)上中心からの距離で、通常X=50mmで測
定される。fは中間レンズと投影レンズを合せた
系の焦点距離、Lは投影レンズと蛍光板の距離で
ある。a図の場合、Drは最終的に0.0178mm-2であ
り、収差ΔX/Xは0.8%強であつた。 In such a device, the sum of the magnetic pole gap length Si and the magnetic pole hole diameter b i is S i +b i =45 mm as the intermediate lens, and the distance between the lens center of the intermediate lens 11 and the lens center of the projection lens 8 is 130 mm. Axial magnetic field distribution
B z , the trajectory r〓 of the electron beam incident parallel to the optical axis Z, the trajectory r〓 of the electron beam emitted parallel to the optical axis Z, the distortion aberration coefficient D r and the S-shaped distortion aberration coefficient D sp as the fourth It is shown in the figure. In the same figure a, when the excitation NI i of the intermediate lens is zero,
b is the case when NI i =600AT, and the excitation NI p of the projection lens is about 2250AT in both cases. a
As shown in the figure, when the excitation of the intermediate lens is zero, distortion is created only by the projection lens, and the aberration coefficient D r takes a negative value at the first gap and increases, but the electron beam trajectory r〓
reaches a maximum at the point where it intersects the optical axis Z, gradually decreases, and then increases to a positive value after crossing zero. Then, it reaches a maximum at the point where the r = orbit intersects the optical axis, and then decreases again. The distortion aberration ΔX/X is connected to the distortion aberration coefficient D r by ΔX/X=D r (Xf/L) 2 . Here, X is the distance from the center of the fluorescent screen (or photographic film), and is usually measured at X=50 mm. f is the focal length of the system including the intermediate lens and the projection lens, and L is the distance between the projection lens and the fluorescent screen. In the case of figure a, D r was finally 0.0178 mm -2 and the aberration ΔX/X was a little over 0.8%.
而して、中間レンズを600ATに励磁すると、
この中間レンズの存在によつて、b図から明らか
な如く、投影レンズに入射するとき既に、Drは
負の値をとつている。しかし乍ら、DrはNIiが零
の場合に比較して、負の極大、正の極大共に減少
し、最終的に0.003mm-2となりa図の場合の1/6に
なる。この収差係数の減少に対し、焦点距離は逆
に長くなるため、前記収差の式から明らかな如く
歪収差ΔX/Xの減少の程度は少く、0.3%強であ
つた。 Then, when the intermediate lens is excited to 600AT,
Due to the presence of this intermediate lens, as is clear from Figure b, D r already takes a negative value when it enters the projection lens. However, compared to the case where NI i is zero, both the negative maximum and the positive maximum D r decreases, and finally reaches 0.003 mm -2 , which is 1/6 of that in the case of diagram a. In contrast to this decrease in the aberration coefficient, since the focal length conversely becomes longer, as is clear from the above aberration formula, the degree of decrease in the distortion aberration ΔX/X was small, at just over 0.3%.
以上のことから、中間レンズの収差係数Drが
あまり大きくない限り、即ち、中間レンズの磁極
間隙長と磁極孔径が極端に小さくない限り、中間
レンズの付加によつて3磁極投影レンズの収差係
数Drは著じるしく減少し、焦点距離の増大にも
拘わらず歪収差ΔX/Xは減少する。このこと
は、投影レンズ側ではr〓軌道は中間レンズの存在
に関係なく同じであるから、Drの減少をもたら
したのはr〓軌道が中間レンズの付加によつて多少
傾斜し、投影レンズに電子が入射したとき光軸に
より近ずいたことに起因する。 From the above, as long as the aberration coefficient D r of the intermediate lens is not too large, that is, unless the magnetic pole gap length and magnetic pole hole diameter of the intermediate lens are extremely small, the aberration coefficient of the three-pole projection lens can be improved by adding the intermediate lens. D r decreases significantly, and the distortion aberration ΔX/X decreases despite the increase in focal length. This means that on the projection lens side, the r〓 orbit is the same regardless of the presence of the intermediate lens, so the reason for the decrease in D r is that the r〓 orbit is tilted somewhat by the addition of the intermediate lens, and the projection lens This is due to the fact that the electrons were closer to the optical axis when they entered the optical axis.
一方、S字歪収差に関しては、これも同様にr〓
軌道の投影レンズ側での減少によつて減少する。
即ち、S字歪収差ΔY/Xは第4図aの場合、0.1
%であつたのが第4図bの場合、0.07%に減少し
た。従つて、このレンズ系においては歪収差を小
さく、又は零にする条件を設定すれば良いことに
なる。 On the other hand, regarding S-shaped distortion aberration, this is also r〓
It is reduced by the reduction on the projection lens side of the trajectory.
That is, the S-shaped distortion aberration ΔY/X is 0.1 in the case of Fig. 4a.
%, but in the case of Figure 4b, it decreased to 0.07%. Therefore, in this lens system, it is sufficient to set conditions to reduce or eliminate distortion.
第5図は投影レンズの励磁NIpをパラメータに
して、中間レンズの励磁NIiに対する歪収差
ΔX/Xの変化を示したものである。図中、a,
b,c,d,e,f及びgは夫々投影レンズの励
磁が異つた場合の変化を示し、aはNIp=
1500ATで最も低い場合で、b,c,d……と起
磁力が高くなり、fではNIp=2390ATであつた。
この図からわかるように、中間レンズの励磁の増
大に対して投影レンズ起磁力がいずれの場合にも
歪収差ΔX/Xは減少する。又、特に有用な特徴
はNIi=0、つまり中間レンズをオフにしたとき
歪収差ΔX/Xが零に近くなるように投影レンズ
の励磁条件を設定した方が、中間レンズ起磁力の
増加による歪収差の変化が少いことがわかる。
尚、NIi=0におけるΔX/Xが負(樽形歪)の
励磁条件(g)では、NIiの増加によつて該負の
値は若干大きくなる。 FIG. 5 shows the change in the distortion aberration ΔX/X with respect to the excitation NI i of the intermediate lens, using the excitation NI p of the projection lens as a parameter. In the figure, a,
b, c, d, e, f, and g show changes when the excitation of the projection lens is different, and a is NI p =
In the lowest case of 1500AT, the magnetomotive force increased as b, c, d..., and at f, NI p = 2390AT.
As can be seen from this figure, the distortion aberration ΔX/X decreases in any case where the projection lens magnetomotive force increases as the excitation of the intermediate lens increases. Also, a particularly useful feature is that it is better to set the excitation conditions of the projection lens so that NI i = 0, that is, when the intermediate lens is turned off, the distortion aberration ΔX/X is close to zero, because the increase in the intermediate lens magnetomotive force It can be seen that the change in distortion aberration is small.
Note that under the excitation condition (g) in which ΔX/X is negative (barrel distortion) when NI i =0, the negative value becomes slightly larger as NI i increases.
以上のことから、NIi=0においてΔX/X=
0となる励磁条件の付近で投影レンズ電流の値を
固定したまま中間レンズ電流NIiを増加すれば、
最終的な歪収差を0.5%、更には0.2%以内におさ
えた状態で中間レンズ起磁力NIiをNIi=0〜
700ATの範囲で可変できることが判明した。従
つて、歪収差を小さく保つた状態で系の焦点距離
を大幅に可変できることになる。 From the above, at NI i = 0, ΔX/X=
If the intermediate lens current NI i is increased while the value of the projection lens current is fixed near the excitation condition where it becomes 0,
Adjust the intermediate lens magnetomotive force NI i to NI i = 0 to 0 while keeping the final distortion within 0.5% or even 0.2%.
It turned out that it can be varied within the range of 700AT. Therefore, the focal length of the system can be varied significantly while keeping distortion small.
第6図は中間レンズの起磁力NIiの変化に対す
る系の焦点距離fの変化を示すもので、投影レン
ズの起磁力NIpは2390ATの場合である。この様
な条件ではΔX/Xを非常に小さく(0.2%以下)
保つたまま焦点距離fを約5mmから10mmに2倍増
すことができる。又、ΔX/Xを0.5%程度にする
とfを約3倍増すことができる。逆に言えば、倍
率を1/2〜1/3程度減少させることができる。通常
の電子顕微鏡においては、M2レンジでの倍率は
5000倍〜10000倍程度であるので上記焦点距離の
可変幅は充分実用できる範囲である。 FIG. 6 shows the change in the focal length f of the system with respect to the change in the magnetomotive force NI i of the intermediate lens, in the case where the magnetomotive force NI p of the projection lens is 2390AT. Under these conditions, ΔX/X should be very small (0.2% or less)
The focal length f can be doubled from approximately 5mm to 10mm while maintaining the same focal length. Furthermore, if ΔX/X is set to about 0.5%, f can be increased by about 3 times. Conversely, the magnification can be reduced by about 1/2 to 1/3. In a normal electron microscope, the magnification in the M2 range is
Since it is approximately 5,000 times to 10,000 times, the variable range of the focal length is within a sufficiently practical range.
前述の如く、3磁極投影レンズを用いた本発明
レンズ系においては、S字歪収差は中間レンズの
付加によつて増大せず、NIp=2390ATの場合、
NIi=0においてS字歪収差ΔY/Xは−0.023%
であつたものが、NIi=600ATで+0.006%にまで
減少し、NIi=700ATでは+0.026%に変化する。
即ち、全領域において、S字歪収差は0.1%を充
分に下まわつており、通常のレンズ系のS字歪収
差が1.3〜1.5%の間で変化することに比較すれば
極めて優れた値であることがわかる。 As mentioned above, in the lens system of the present invention using a three-magnetic-pole projection lens, the S-shaped distortion aberration does not increase due to the addition of the intermediate lens, and when NI p = 2390AT,
At NI i = 0, S-shaped distortion ΔY/X is -0.023%
However, it decreases to +0.006% when NI i =600AT, and changes to +0.026% when NI i =700AT.
In other words, the S-distortion aberration is well below 0.1% in the entire range, which is an extremely excellent value compared to the S-distortion aberration of a normal lens system, which varies between 1.3 and 1.5%. I understand that there is something.
以上のように本発明ではS字歪収差が小さな3
磁極レンズを投影レンズとして用い、該投影レン
ズの前方に中間レンズを設けることによつて、S
字歪収差を増すことなく、歪収差を通常の2磁極
レンズの1/2〜1/3程度の小さな値に保つたまま焦
点距離を2〜3倍可変でき、良好なM2レンジが
構成できる。 As described above, in the present invention, the S-shaped distortion aberration is small.
By using a magnetic pole lens as a projection lens and providing an intermediate lens in front of the projection lens, S
The focal length can be varied by 2 to 3 times while maintaining the distortion aberration to a small value of about 1/2 to 1/3 of a normal two-pole lens without increasing the character distortion, making it possible to construct a good M2 range. .
本発明において、歪収差を零に保つたまま焦点
距離を変えるようにすることも可能である。これ
を行うには、中間レンズの励磁を高めると同時に
投影レンズの励磁を連続的(又は断続的)に弱め
るようにすれば良い。第7図はその制御の仕方を
示すグラフで、NIpをパラメータとし、NIiに対
する焦点距離の変化を示してある。図中b′,c′,
d′及びf′の曲線は第5図における曲線b,c,d
及びfと同一の投影レンズ起磁力の場合である。
又、f′は第6図の曲線と同一であり、NIpは
2390ATの場合である。図中、点線が本実施例に
おける制御方式を示すもので、歪収差ΔX/Xが
零になる点を結ぶようにNIiの変化に対し、NIp
を変化させている。即ち、NIiの増加に伴つて、
NIpを次第に減少させねばならない。この為に、
第3図の装置において、投影レンズの電源9と中
間レンズの電源12とを点線で示す如く連動的に
制御可能に構成する必要がある。尚、上記制御は
NIiの変化に対し、NIpを連続的に変化している
が、中間レンズ起磁力NIiを幾つかに分け、各領
域では一定の投影レンズ起磁力を保つように該投
影レンズ起磁力NIpを断続的に変化するように構
成しても良い。 In the present invention, it is also possible to change the focal length while keeping the distortion at zero. This can be done by increasing the excitation of the intermediate lens and simultaneously decreasing the excitation of the projection lens continuously (or intermittently). FIG. 7 is a graph showing the method of control, using NI p as a parameter and showing changes in focal length with respect to NI i . In the figure b′, c′,
The curves d' and f' are the curves b, c, d in Fig.
and the projection lens magnetomotive force is the same as f.
Also, f' is the same as the curve in Figure 6, and NI p is
This is the case for 2390AT. In the figure, the dotted line indicates the control method in this example, and NI p
is changing. That is, as NI i increases,
NI p must be gradually reduced. For this purpose,
In the apparatus shown in FIG. 3, it is necessary to configure the power source 9 for the projection lens and the power source 12 for the intermediate lens so that they can be controlled in conjunction with each other as shown by dotted lines. Furthermore, the above control is
In response to changes in NI i , NI p is continuously changed, but the intermediate lens magnetomotive force NI i is divided into several parts, and the projection lens magnetomotive force NI is adjusted to maintain a constant projection lens magnetomotive force in each region. p may be configured to change intermittently.
以上の様な制御を行えば、歪収差を零にしたま
ま、或いは著じるしく小さくしたまま焦点距離を
5mmから20mm以上に大きく可変することができ、
倍率可変範囲を更に拡大できる。 By performing the above control, it is possible to greatly vary the focal length from 5 mm to 20 mm or more while keeping the distortion to zero or significantly reducing it.
The variable magnification range can be further expanded.
尚、上記説明において3磁極レンズb1/b2=
1.5〜5の非対称レンズを用いたが、本発明にお
いては、例えば第2磁極間隙長S2に対し、第1間
隙長S1を3倍前後大きくしたレンズ等、S字歪収
差及び歪収差を共に小さく或いは零にし得るレン
ズであれば使用できること論を俟たない。 In addition, in the above explanation, 3 magnetic pole lens b 1 /b 2 =
Although an asymmetric lens with a diameter of 1.5 to 5 was used, in the present invention, for example, a lens in which the first gap length S 1 is approximately 3 times larger than the second magnetic pole gap length S 2 is used to reduce S-shaped distortion aberration and distortion aberration. It goes without saying that any lens that can be made small or zero can be used.
第1図は本発明に先立つて提案された3磁極レ
ンズの磁極形状を示す図、第2図はそのレンズの
特性を示す図、第3図乃至第6図は本発明の一実
施例を説明するための図、第7図は本発明の他の
実施例を説明するための図である。
4:対物レンズ、8:3磁極投影レンズ、1
1:中間レンズ、5,9及び12:レンズ電源。
Fig. 1 is a diagram showing the magnetic pole shape of a three-pole lens proposed prior to the present invention, Fig. 2 is a diagram showing the characteristics of the lens, and Figs. 3 to 6 illustrate an embodiment of the present invention. FIG. 7 is a diagram for explaining another embodiment of the present invention. 4: Objective lens, 8: 3 magnetic pole projection lens, 1
1: intermediate lens, 5, 9 and 12: lens power supply.
Claims (1)
て作られる2つの磁極間隙内に異つた極性のレン
ズ磁場を生ずる投影レンズと、該投影レンズの前
段に置かれた少くとも1個の中間レンズとを備
え、前記中間レンズの起磁力が零のとき歪収差が
所望に小さくなるような値に前記投影レンズの起
磁力を略固定した状態で前記中間レンズの起磁力
を可変する構成を特徴とする電子顕微鏡の結像レ
ンズ系。 2 前記中間レンズの起磁力の可変に関連して、
該中間レンズの起磁力が大きくなつたときその値
が小さくなるように前記投影レンズの起磁力を可
変する特許請求の範囲第1項記載の電子顕微鏡の
結像レンズ系。[Claims] 1. An objective lens, a projection lens that has three magnetic poles and generates lens magnetic fields of different polarities within the gap between the two magnetic poles, and a lens that is placed in front of the projection lens. and one intermediate lens, and the magnetomotive force of the intermediate lens is set with the magnetomotive force of the projection lens substantially fixed at a value such that distortion aberration is reduced to a desired value when the magnetomotive force of the intermediate lens is zero. An imaging lens system for an electron microscope that features a variable configuration. 2 In relation to the variation of the magnetomotive force of the intermediate lens,
2. The imaging lens system for an electron microscope according to claim 1, wherein the magnetomotive force of the projection lens is varied so that the value of the magnetomotive force of the intermediate lens decreases as the magnetomotive force of the intermediate lens increases.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56017790A JPS57132656A (en) | 1981-02-09 | 1981-02-09 | Image focussing lens system of electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56017790A JPS57132656A (en) | 1981-02-09 | 1981-02-09 | Image focussing lens system of electron microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57132656A JPS57132656A (en) | 1982-08-17 |
| JPH0136230B2 true JPH0136230B2 (en) | 1989-07-28 |
Family
ID=11953504
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56017790A Granted JPS57132656A (en) | 1981-02-09 | 1981-02-09 | Image focussing lens system of electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57132656A (en) |
-
1981
- 1981-02-09 JP JP56017790A patent/JPS57132656A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57132656A (en) | 1982-08-17 |
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