JPH0141932B2 - - Google Patents
Info
- Publication number
- JPH0141932B2 JPH0141932B2 JP1139884A JP1139884A JPH0141932B2 JP H0141932 B2 JPH0141932 B2 JP H0141932B2 JP 1139884 A JP1139884 A JP 1139884A JP 1139884 A JP1139884 A JP 1139884A JP H0141932 B2 JPH0141932 B2 JP H0141932B2
- Authority
- JP
- Japan
- Prior art keywords
- chucks
- chuck
- heat dissipation
- cryogenic
- material testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000017525 heat dissipation Effects 0.000 claims description 7
- 239000003507 refrigerant Substances 0.000 claims description 7
- 238000001816 cooling Methods 0.000 claims description 6
- 239000004078 cryogenic material Substances 0.000 claims description 4
- 238000004154 testing of material Methods 0.000 claims description 4
- 238000012360 testing method Methods 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- 239000001307 helium Substances 0.000 description 4
- 229910052734 helium Inorganic materials 0.000 description 4
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 4
- 239000007789 gas Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 239000002826 coolant Substances 0.000 description 2
- 239000000112 cooling gas Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009864 tensile test Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000009661 fatigue test Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/18—Performing tests at high or low temperatures
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
【発明の詳細な説明】
(イ) 産業上の利用分野
この発明は、極低温材料試験装置に関し、詳し
くは、極低温における材料の引張り強さ、耐力、
伸び等を測定する試験装置の材料つかみ具（チヤ
ツク）に関するものである。[Detailed Description of the Invention] (a) Field of Industrial Application The present invention relates to a cryogenic material testing device, and specifically, the tensile strength, proof stress, etc. of materials at cryogenic temperatures.
This relates to a material chuck for a testing device that measures elongation, etc.
(ロ) 従来技術
第１図は従来から使用されている極低温引張り
試験装置の一例である。この装置はクライオスタ
ツト１内に液体ヘリウム等の極低温冷媒槽２を収
容し、その冷媒槽２内部において上下に対向して
支持板３，４を設け、両支持板３，４は複数本の
支柱５によつて連結している。上部支持板３は連
結部材６を介してクライオスタツト１の本体部分
に連結されている。(b) Prior Art Figure 1 shows an example of a conventionally used cryogenic tensile test device. This device houses a cryogenic refrigerant tank 2 such as liquid helium in a cryostat 1, and inside the refrigerant tank 2, support plates 3 and 4 are provided vertically facing each other. They are connected by struts 5. The upper support plate 3 is connected to the main body portion of the cryostat 1 via a connecting member 6.
クライオスタツト１は遮弊層７によつて閉塞さ
れ、その遮弊層７と上部支持板３を複数のプルロ
ツト８がスライド可能に貫通している。各プルロ
ツト８および下部支持板４にはそれぞれ上下に対
向したチヤツク９，１０が連結ピン１１，１２を
介して取付けられ、試料１３は上下のチヤツク
９，１０により支持される。 The cryostat 1 is closed by a barrier layer 7, and a plurality of pull rods 8 slidably pass through the barrier layer 7 and the upper support plate 3. Chucks 9 and 10, which are vertically opposed to each other, are attached to each pull rod 8 and the lower support plate 4 via connecting pins 11 and 12, and the sample 13 is supported by the upper and lower chucks 9 and 10, respectively.
なお、図中１４は液体窒素槽、１５は液体窒素
の注入口、１６は液体ヘリウム等の冷媒の注入
口、１７は電気ヒータ、１８は冷媒である。 In the figure, 14 is a liquid nitrogen tank, 15 is an inlet for liquid nitrogen, 16 is an inlet for a coolant such as liquid helium, 17 is an electric heater, and 18 is a coolant.
上記の装置によつて引張り試験を行なう場合、
試料１３のチヤツク９，１０に対するセツテイン
グは常温下で行なわれ、セツテイング完了後クラ
イオスタツト中１に挿入され、冷媒１８を注入し
て冷却される。 When performing a tensile test using the above equipment,
Setting of sample 13 in chucks 9 and 10 is carried out at room temperature, and after completion of setting, it is inserted into cryostat 1 and cooled by injecting refrigerant 18.
(ハ) 発明のよつて解決しようとする問題点
上記のチヤツク９，１０は、試験中に試料１３
の保持力が熱収縮によつてゆるまない構造とする
必要があるため、相当複雑かつ寸法の大きい構造
とならざるをえない。(c) Problems to be solved by the invention The above chucks 9 and 10 were solved by sample 13 during the test.
It is necessary to have a structure that has a holding force that does not loosen due to thermal contraction, so the structure must be quite complex and large in size.
このためチヤツク９，１０部分の熱容量が大に
なり、冷媒１８に近い下部チヤツク１０に比べ上
部チヤツク９が冷却され難く、両者の間に大きな
温度差を生ずる。その結果、試料１３内部の温度
分布が不均一になり、このような状態で試験をし
ても再現性のある正確なデータを得ることができ
ない。 For this reason, the heat capacity of the chucks 9 and 10 increases, and the upper chuck 9 is more difficult to cool than the lower chuck 10, which is closer to the refrigerant 18, resulting in a large temperature difference between the two. As a result, the temperature distribution inside the sample 13 becomes non-uniform, and even if a test is conducted under such conditions, it is not possible to obtain accurate data with reproducibility.
そこで、この発明は上記の問題を解決し、上下
チヤツクの温度差を無くすることを目的とするも
のである。 Therefore, the object of the present invention is to solve the above problems and eliminate the temperature difference between the upper and lower chucks.
(ニ) 問題点を解決するための手段
上記の問題点を解決するために、この発明は上
下のチヤツク外周面に放熱フイン、冷媒との熱接
触を図る冷却治具等の放熱手段を付設した構成と
したものである。(d) Means for Solving the Problems In order to solve the above problems, the present invention provides heat radiation means such as heat radiation fins and cooling jigs for making thermal contact with the refrigerant on the outer peripheral surfaces of the upper and lower chucks. It is structured as follows.
(ホ) 実施例
第２図はこの発明の実施例であり、この場合は
上下のチヤツク９，１０の外周に放熱フイン１９
を設け、各チヤツク９，１０の熱交換を容易に
し、両者の温度差を無くするようにしたものであ
る。(E) Embodiment FIG. 2 shows an embodiment of the present invention, in which heat dissipation fins 19 are provided on the outer periphery of the upper and lower chucks 9 and 10.
is provided to facilitate heat exchange between the chucks 9 and 10 and to eliminate the temperature difference between them.
また、チヤツク９，１０の熱交換を促進するた
めに、一点鎖線で示すように、放熱フイン１９と
は別に、また放熱フイン１９とともに、冷却治具
２０，２１を付設することもできる。この冷却治
具２０，２１は銅、アルミニウム等の熱伝導良好
な金属棒により形成され、その一端を冷媒１８に
浸し、他端をチヤツク９，１０に接触させること
により、その放熱を促進するものである。 Further, in order to promote heat exchange between the chucks 9 and 10, cooling jigs 20 and 21 may be attached separately from or together with the heat radiation fin 19, as shown by the dashed line. The cooling jigs 20 and 21 are made of metal rods with good thermal conductivity such as copper and aluminum, and have one end immersed in the refrigerant 18 and the other end in contact with the chucks 9 and 10 to promote heat dissipation. It is.
その他、チヤツク９，１０の放熱手段として、
極低温で使用できるヒートパイプを付設するこ
と、専用の冷凍機からの冷却ガスを供給すること
等の方法がある。 In addition, as a heat dissipation means for chucks 9 and 10,
There are methods such as attaching a heat pipe that can be used at extremely low temperatures and supplying cooling gas from a dedicated refrigerator.
なお、専用の冷却ガスを使用する場合は、液体
ヘリウムの常圧での沸点4.2〓から液体窒素の沸
点77〓あたりの温度範囲が望ましい。この温度範
囲は固体の比熱が小さく、ヘリウムガスの比熱が
大きく、ガス冷却に適している。これより高温に
なると、ガス冷却が困難になる。 In addition, when using a dedicated cooling gas, it is desirable that the temperature range is from 4.2〓, the boiling point of liquid helium at normal pressure, to around 77〓, the boiling point of liquid nitrogen. This temperature range is suitable for gas cooling because the specific heat of the solid is small and the specific heat of helium gas is large. At higher temperatures, gas cooling becomes difficult.
上記以外の装置の構成は従来どおりである。 The configuration of the device other than the above is the same as before.
また、この発明は、材料の引張り、耐力、伸び
等の試験機のみならず、試料に比べて大きな質量
を有するチヤツクをもつ疲労試験機、ねじり試験
機、曲げ試験機等にも適用することができる。 Furthermore, this invention can be applied not only to testing machines for testing materials such as tensile strength, yield strength, and elongation, but also to fatigue testing machines, torsion testing machines, bending testing machines, etc. that have chucks that have a larger mass than the sample. can.
(ヘ) 効果
以上述べたように、この発明は上下のチヤツク
の温度差が無くなり、試料の温度分布が均一にな
る結果、正確なデータが得られ試験の信頼性が上
がる効果がある。(f) Effects As described above, this invention has the effect of eliminating the temperature difference between the upper and lower chucks and making the temperature distribution of the sample uniform, resulting in accurate data being obtained and increased test reliability.
第１図は従来例の断面図、第２図は実施例の一
部を示す断面図である。
１……クライオスタツト、３，４……支持板、
５……支柱、７……遮蔽層、８……プルロツド、
９，１０……チヤツク、１３……試料。
FIG. 1 is a sectional view of a conventional example, and FIG. 2 is a sectional view showing a part of an embodiment. 1... Cryostat, 3, 4... Support plate,
5... Support, 7... Shielding layer, 8... Pull rod,
9, 10...chuck, 13...sample.
Claims (1)
け、下部チヤツクを支柱によつて支持するととも
に上部チヤツクをプルロツドに結合し、上下チヤ
ツク間に試料を保持するようにした極低温材料試
験装置において、上記チヤツクに放熱手段を付設
したことを特徴とする極低温材料試験装置。 ２ 上記の放熱手段が放熱フインであることを特
徴とする特許請求の範囲第１項に記載の極低温材
料試験装置。 ３ 上記の放熱手段が冷媒とチヤツクとの熱接触
を図る冷却治具であることを特徴とする特許請求
の範囲第１項に記載の極低温材料試験装置。[Scope of Claims] 1. A cryogenic container with vertically opposed chucks, a lower chuck supported by a support, an upper chuck connected to a pull rod, and a sample held between the upper and lower chucks. A cryogenic material testing device, characterized in that the chuck is provided with a heat dissipation means. 2. The cryogenic material testing apparatus according to claim 1, wherein the heat dissipation means is a heat dissipation fin. 3. The cryogenic material testing apparatus according to claim 1, wherein the heat dissipation means is a cooling jig for making thermal contact between the refrigerant and the chuck.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1139884A JPS60154138A (en) | 1984-01-24 | 1984-01-24 | Testing apparatus of cryogenic material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1139884A JPS60154138A (en) | 1984-01-24 | 1984-01-24 | Testing apparatus of cryogenic material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60154138A JPS60154138A (en) | 1985-08-13 |
| JPH0141932B2 true JPH0141932B2 (en) | 1989-09-08 |
Family
ID=11776904
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1139884A Granted JPS60154138A (en) | 1984-01-24 | 1984-01-24 | Testing apparatus of cryogenic material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60154138A (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0797074B2 (en) * | 1990-07-31 | 1995-10-18 | 株式会社島津製作所 | Micro material testing machine |
| JP5865206B2 (en) * | 2012-08-03 | 2016-02-17 | 株式会社日立製作所 | Load application device |
| US9696218B2 (en) | 2012-08-08 | 2017-07-04 | Mts Systems Corporation | Test specimen holder for high temperature environments |
| CN103884600A (en) * | 2012-12-20 | 2014-06-25 | 核工业西南物理研究院 | A large-scale bolt low temperature fatigue test device |
| US10180379B2 (en) | 2014-06-06 | 2019-01-15 | Mts Systems Corporation | Airflow diverter for reduced specimen temperature gradient |
| CN104634668A (en) * | 2015-02-27 | 2015-05-20 | 马钢(集团)控股有限公司 | Device and method for testing fracture toughness of wheel steel under a series of temperature |
| KR102454208B1 (en) * | 2021-11-24 | 2022-10-14 | 한국화학연구원 | Cryogenic mechanical test apparatus and Material testing machine having the Same |
-
1984
- 1984-01-24 JP JP1139884A patent/JPS60154138A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60154138A (en) | 1985-08-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |