JPH0145590B2 - - Google Patents
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- Publication number
- JPH0145590B2 JPH0145590B2 JP5140880A JP5140880A JPH0145590B2 JP H0145590 B2 JPH0145590 B2 JP H0145590B2 JP 5140880 A JP5140880 A JP 5140880A JP 5140880 A JP5140880 A JP 5140880A JP H0145590 B2 JPH0145590 B2 JP H0145590B2
- Authority
- JP
- Japan
- Prior art keywords
- wire
- needle
- dielectric breakdown
- present
- insulated wire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Description
【発明の詳細な説明】
本発明は、絶縁電線の絶縁破壊電圧を測定する
方法に関するものである。特に本発明は、モータ
ー、トランス等の各種コイルに用いられる巻線や
リード線の絶縁破壊電圧を測定する方法に関する
もので、その要点は絶縁電線表面に、針状電極を
置き、絶縁電線と針電極との間に、電圧を印加す
ることによつて、その部分の絶縁破壊電圧を測定
することに関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of measuring dielectric breakdown voltage of an insulated wire. In particular, the present invention relates to a method for measuring dielectric breakdown voltage of windings and lead wires used in various coils of motors, transformers, etc. The key point is to place a needle-like electrode on the surface of an insulated wire, It relates to measuring the dielectric breakdown voltage of a portion by applying a voltage between the electrode and the electrode.
従来、モーター、トランス等に使用される絶縁
電線は、その皮膜が薄膜でありながら、かつ皮膜
にピンホール等のない高品質を要求されて来た。
絶縁電線の電気的特性を評価するために、古くか
ら、2本の線をよりあわせた2個撚法、あるいは
1本の線を水中で絶縁破壊特性が求められて来
た。また近年は、水にかわつて、食塩水を混入し
たグリセリンの中で測定が行なわれるようになつ
て来た。 Conventionally, insulated wires used in motors, transformers, etc. have been required to have a thin film and high quality without pinholes or the like in the film.
In order to evaluate the electrical characteristics of insulated wires, the dielectric breakdown characteristics have long been sought using the two-strand method, in which two wires are twisted together, or the dielectric breakdown characteristics of a single wire in water. In recent years, measurements have also been performed in glycerin mixed with saline instead of water.
これらの方法は、いずれも絶縁破壊値を求める
に簡便かつ有効なものであるが、以下述べる欠陥
が存在した。すなわち、2個撚サンプルでは2本
の線をよりあわせた部分の長さの中で、最も電気
的に弱点がある部分が破壊されることになる。水
中あるいはグリセリン中での測定においても、液
槽に浸漬した長さの中で、最も弱い部分が電気的
破壊を受けることになる。すなわち、従来法では
欠陥部分の特性把握が出来るのみで、残り大部分
の正常部の特性を把握することは困難であつた。
すなわち絶縁特性を議論する場合、その特性値が
ローカルの欠陥部の特性を示しているのか、ある
いは皮膜全体の特性を示しているのかを分離する
ことが出来ず、品質を正確かつ適確に評価するの
に問題を残して来た。 All of these methods are simple and effective for determining dielectric breakdown values, but they have the following drawbacks. In other words, in the case of a two-stranded sample, the electrically weakest part of the length of the two wires twisted together will be destroyed. Even when measuring in water or glycerin, the weakest part of the length immersed in the liquid bath will be electrically damaged. That is, in the conventional method, it was only possible to understand the characteristics of the defective part, but it was difficult to understand the characteristics of the remaining normal part.
In other words, when discussing insulation properties, it is not possible to separate whether the property values indicate the properties of a local defect or the properties of the entire film, making it difficult to accurately and accurately evaluate the quality. However, I was left with a problem.
しかるに、本発明は従来法では測定出来なかつ
た、ある任意の一点の個所の絶縁破壊を求めるこ
とが出来る方法を提供するものである。従来法の
測定及び本発明になる方法があいまつて、絶縁電
線の品質レベルの把握、製造条件の変動、等を精
度よく、かつ適確に検討することが出来るように
なるものと確信する。 However, the present invention provides a method that can determine dielectric breakdown at any one point, which could not be measured using conventional methods. We believe that the combination of the conventional measurement method and the method of the present invention will make it possible to grasp the quality level of insulated wires and to accurately and accurately examine changes in manufacturing conditions, etc.
本発明によれば、目で見て異常と思われる部
分、例えばクレーター発生部、粒発生部、突起部
等のBDV値を求めることが出来、正常部の品質
と比較が出来うる。また平角線ではフラツト面、
コーナ部の絶縁破壊値を別々に求めることも出来
る。さらに、本発明によれば、コイルの絶縁破壊
電圧値を絶縁電線をまきもどすことなく求めるこ
とが出来る。 According to the present invention, it is possible to determine the BDV value of a visually abnormal part, such as a crater occurrence part, a grain occurrence part, a protrusion part, etc., and to compare the quality with that of a normal part. Also, for rectangular wires, the flat surface,
It is also possible to separately determine the dielectric breakdown value at the corner. Further, according to the present invention, the dielectric breakdown voltage value of the coil can be determined without winding the insulated wire.
従来から、高度の信頼性を要求される電線、例
えばプラスチツク被覆の電力ケーブルにおいて
は、高電界下における絶縁破壊の解明に、針電極
法が採用され、多くのデーターが報告されて来
た。すなわち、いわゆる針電極の先端に生じるト
リーから、絶縁皮膜の破壊が議論されて来た。 Conventionally, the needle electrode method has been used to elucidate dielectric breakdown under high electric fields in electric wires that require a high degree of reliability, such as plastic-coated power cables, and a large amount of data has been reported. That is, it has been discussed that the insulating film is destroyed due to the tree that occurs at the tip of the so-called needle electrode.
一方、コイル等に用いられる巻線等では、針電
極法は今日まで、その有効性を認識されずに来
た。このことは、巻線がコイルに巻回され電圧が
印加される場合、電力ケーブルに比較すると、比
較にならない程低圧であり、絶縁破壊現象を左程
重要視しなかつたことに起因するものと考えられ
る。また、導体も細く、皮膜もうすく、欠陥の存
在はやゝもすれば当然という意識があつたものと
思われる。 On the other hand, the effectiveness of the needle electrode method for winding wires used in coils and the like has not been recognized until now. This is because when the winding is wound around a coil and a voltage is applied, the voltage is incomparably lower than that of a power cable, and the dielectric breakdown phenomenon was not given as much importance. Conceivable. In addition, the conductors were thin, the coating was thin, and it seems that there was an awareness that the existence of defects was a given.
ところが、近年、巻線が小型高性能機器用コイ
ルに用いられるようになると、次第に皮膜の欠陥
が無視されなくなつて来た。とりわけ絶縁破壊電
圧特性や、耐久電圧特性がクローズアツプし、こ
れらの特性の良い絶縁電線を求める機運が盛上つ
て来た。 However, in recent years, as winding wires have come to be used in coils for small, high-performance devices, defects in the coating have gradually become no longer ignored. In particular, dielectric breakdown voltage characteristics and durability voltage characteristics have become more and more important, and there has been an increasing demand for insulated wires with good characteristics.
本発明者等は、高品質の絶縁電線を出現すべ
く、まず、品質の評価法を鋭意研究することによ
つて本発明になる測定法を提供するに到つた。 In order to produce high-quality insulated wires, the present inventors first conducted intensive research on quality evaluation methods and came to provide the measuring method of the present invention.
本発明を、図面を用いて詳細に説明する。 The present invention will be explained in detail using the drawings.
図は本発明における針電極法による絶縁電線の
破壊電圧を測定する方法を示すもので、1は針電
極、2は被測定物となる絶縁電線である。3,4
は電圧印加に必要なリード線である。5,6は、
絶縁電線を左右、前後に移動可能とせしめる治具
であり、絶縁電線の任意の測定個所に精度よく簡
便に針電極を設定するに効果を発揮するものであ
る。 The figure shows a method of measuring the breakdown voltage of an insulated wire using the needle electrode method according to the present invention, where 1 is a needle electrode and 2 is an insulated wire to be measured. 3,4
is a lead wire necessary for voltage application. 5 and 6 are
This is a jig that allows the insulated wire to be moved left and right and back and forth, and is effective in easily and accurately setting the needle electrode at any measurement location on the insulated wire.
7は移動可能な荷重であり、図において、この
荷重を左の方向に移すと、針電極の絶縁電線を押
える力はよわくなり、右へ移すと、絶縁電線にか
かる力は大きくなるように工夫されたものであ
る。また8は針電極をささえるアームであり、9
は針電極を絶縁電線の表面に設置したり、はずし
たりする場合に、針によつて絶縁皮膜に損傷を与
えない配慮から、付加された治具であり、右へま
わせば針は絶縁電線から離れ、左へまわせば針が
電線表面に設定される。 7 is a movable load, and in the figure, when this load is moved to the left, the force pressing the insulated wire of the needle electrode becomes stiffer, and when it is moved to the right, the force applied to the insulated wire becomes larger. It is what was done. Also, 8 is an arm that supports the needle electrode, and 9
is a jig added to prevent the needle from damaging the insulation film when installing or removing the needle electrode on the surface of the insulated wire.If you turn it to the right, the needle will be attached to the insulated wire. Move away from it and turn it to the left to set the needle on the surface of the wire.
本発明は、上述した測定法により、ある任意の
個所の絶縁破壊電圧値あるいは耐久電圧特性(電
圧一時間特性)を求めることが出来るものであ
り、以下本発明になる測定によつて、得られる効
果につき詳述する。 The present invention is capable of determining the dielectric breakdown voltage value or durability voltage characteristic (voltage one hour characteristic) of any arbitrary location by the above-mentioned measurement method. The effects will be explained in detail.
絶縁電線は一般的に長尺物であり、自ずから長
さ方向に対して、品質の均一性が要求される。例
えばローカルな絶縁皮膜欠陥としては絶縁塗料の
中に含まれる不純物、導体のソゲ、くぼみ、銅
粉、焼付炉中の焼カス等のホコリに起因し従つて
これらの存在により絶縁皮膜の品質は低下して来
る。また、皮膜全体にわたる絶縁皮膜欠陥として
は、特に、焼付不足から来ることが多い。また、
電気特性を低下せしめる不適当な硬化剤等が絶縁
皮膜に混入することによつて生じる。従来法であ
れば、絶縁破壊がローカルな欠陥部のものである
のか、あるいは、皮膜全体がその絶縁破壊値レベ
ルであるのかを区別することは出来なかつたわけ
である。しかし、ローカルな欠陥の場合は、本発
明になる方法で測定すると、多くは正常部の絶縁
破壊電圧を測定することになり、測定値は高いレ
ベルを示すものである。また、皮膜全体に欠陥が
存在する場合には、本発明になる方法で測定する
も、測定値は従来法で求めたものとほぼ同一の低
いレベルを示すものである。 Insulated wires are generally long objects, and are naturally required to have uniform quality in the length direction. For example, local defects in the insulation coating are caused by impurities contained in the insulation paint, burnt spots on the conductor, dents, copper powder, dust such as burnt residue in the baking oven, and the quality of the insulation coating deteriorates due to the presence of these. I'll come. Furthermore, defects in the insulation film over the entire film often result from insufficient baking. Also,
This occurs when an unsuitable curing agent or the like is mixed into the insulating film, which deteriorates the electrical properties. With the conventional method, it was not possible to distinguish whether the dielectric breakdown was caused by a local defect or whether the entire film was at that dielectric breakdown value level. However, in the case of local defects, when measured using the method of the present invention, the dielectric breakdown voltage of a normal area is often measured, and the measured value shows a high level. Furthermore, when defects exist in the entire film, even when measured by the method of the present invention, the measured values show almost the same low level as those determined by the conventional method.
次に、本発明によれば塗膜の欠陥部の絶縁破壊
値を把握しうる。例えば、クレーター部、粒発生
部等の欠陥部が正常部の絶縁破壊値に比較してど
の程度のものかを把握しうる。また、平角導体を
用いた絶縁電線では、一般にコーナ部の皮膜厚が
うすくなりやすく、絶縁破壊値が低いといわれ
る。しかし、従来法ではこれを確認することが出
来なかつたわけである。 Next, according to the present invention, the dielectric breakdown value of the defective portion of the coating film can be determined. For example, it is possible to know how much the dielectric breakdown value of a defective part such as a crater part or a grain generation part compares with the dielectric breakdown value of a normal part. In addition, insulated wires using rectangular conductors are said to have a low dielectric breakdown value because the coating thickness tends to be thin at the corners. However, this cannot be confirmed using conventional methods.
本発明を用いると、フラツト部、コーナ部を区
別して測定出来るため、コーナ部の特性を正確に
認識しうることが出来る。ここから得られるデー
ターは、必要な皮膜厚を塗布焼付させる基礎的デ
ーターともなる。このことは不必要な程の厚膜を
もたせたり皮膜厚がうすすぎたりすることを防止
するもので、要求する絶縁特性に見合つた皮膜厚
の設計を可能とする。ひいては機器の信頼性ある
いは機器の小型化につながるものである。 By using the present invention, since the flat portion and the corner portion can be measured separately, the characteristics of the corner portion can be accurately recognized. The data obtained from this will also serve as basic data for applying and baking the required film thickness. This prevents the film from being unnecessarily thick or too thin, and allows the film thickness to be designed to meet the required insulation properties. This ultimately leads to improved reliability of the equipment or miniaturization of the equipment.
また、絶縁電線を巻回したコイルに異常があつ
たような場合、電線の絶縁破壊試験を要求される
ことが多い、この場合コイルをまきもどして従来
法によつて測定するわけであるが、コイルまきも
どし時に電線に力がかかり、皮膜は加工劣化を受
ける。この巻戻しの影響が大きく測定値を左右す
ることが認識されている。特に含浸ワニス処理を
ほどこしたコイルの巻もどしは、実に困難であ
り、電線に損傷を与えずに巻もどすことは、ほと
んど不可能に近い。ところが本発明を用いると巻
もどす前にコイルの任意の個所に針電極を設置さ
せることが出来、測定することが出来る。さらに
測定をしたい場合、測定したあと巻もどし、測定
したい個所へ針電極を設置すれば良い。 Additionally, if there is an abnormality in a coil wound with insulated wire, a dielectric breakdown test of the wire is often required.In this case, the coil is wound up and measured using the conventional method. When unwinding the coil, force is applied to the wire, and the coating is subject to processing deterioration. It is recognized that the influence of this unwinding greatly influences the measured values. It is particularly difficult to unwind a coil that has been treated with impregnated varnish, and it is almost impossible to unwind the wire without damaging the wire. However, with the present invention, a needle electrode can be placed at any location on the coil before unwinding, and measurement can be performed. If you want to take further measurements, simply unwind the tape after taking the measurements and place the needle electrode at the location you want to measure.
以上は、絶縁破壊電圧値を求める場合につき詳
述したが、本発明は耐久電圧特性測定にも偉力を
発揮するものである。 The above description has been made in detail regarding the case of determining the dielectric breakdown voltage value, but the present invention also exhibits great power in measuring durable voltage characteristics.
任意の絶縁電線あるいはコイルの一点に針電極
を設置し、所定の電圧を印加し、電圧一時間特性
を求めることが出来る。 A needle electrode is installed at one point on any insulated wire or coil, a predetermined voltage is applied, and the voltage-time characteristics can be determined.
本発明で用いられる導電性の針としては材質が
金属であればどのような金属でも良く、例えば、
鉄線、ステンレス線、ピアノ線、クロム線、ニツ
ケル線、銅線、アルミ線のようなものが使用でき
る。また、市販のビーズ針も使用でき、本発明に
好適である。導電性の針の導体径は0.1〜2mmが
好ましい。0.1mm以下では、細すぎるため、絶縁
電線との接点で不安定であり、逆に2mm以上では
太すぎて作業性が悪くなる。また導電性の針の先
端の針角度は、5゜〜120゜が好ましい。5゜以下では
針の先端が鋭角すぎ、絶縁皮膜を傷つけ突き破る
可能性がある。120℃以上では針の先端が丸みを
おび、本発明の特徴である任意の1点の個所の絶
縁破壊を求めることができなくなる。 The conductive needle used in the present invention may be made of any metal, for example,
Things like iron wire, stainless steel wire, piano wire, chrome wire, nickel wire, copper wire, and aluminum wire can be used. Additionally, commercially available bead needles can also be used and are suitable for the present invention. The conductor diameter of the conductive needle is preferably 0.1 to 2 mm. If it is less than 0.1 mm, it will be too thin and the contact with the insulated wire will be unstable, and if it is more than 2 mm, it will be too thick and workability will be poor. Further, the needle angle at the tip of the conductive needle is preferably 5° to 120°. If the angle is less than 5 degrees, the tip of the needle will be too sharp and may damage and break through the insulation film. At temperatures above 120°C, the tip of the needle becomes rounded, making it impossible to determine dielectric breakdown at any one point, which is a feature of the present invention.
先の先端は、絶縁皮膜を傷つけない程度のもの
であればよく、針先端にかかる荷重は約1g〜50
g程度が良い。荷重が50gを越えると、皮膜の中
へ針先が進入するので好ましくない。さらに本発
明では、測定のたびごとに針電極をとりかけてお
こなうのが良い。なぜならば、針先端が絶縁破壊
時に流れる過電流により、熔融したり、曲つたり
して変形するためである。 The tip of the needle only needs to be strong enough not to damage the insulation film, and the load on the needle tip should be approximately 1g to 50%.
around g is good. If the load exceeds 50 g, the tip of the needle will penetrate into the film, which is undesirable. Furthermore, in the present invention, it is preferable to attach the needle electrode each time a measurement is made. This is because the tip of the needle melts, bends, and deforms due to the overcurrent that flows during dielectric breakdown.
次に、本発明を実施例をもつて説明する。 Next, the present invention will be explained using examples.
尚、以下の実施例では、導体径1mm、先端角
10゜のビーズ針を導電性の針として用いた。 In the following examples, the conductor diameter is 1 mm and the tip angle is
A 10° bead needle was used as the conductive needle.
実施例 1
導体径1.0mmの銅線に2種類の絶縁塗料、すな
わちポリエステル絶縁塗料、平均粒径が20μmの
銅粉を加えたポリエステル絶縁塗料を夫々別々に
塗布焼付して絶縁電線を製造した。Example 1 Two types of insulating paints, namely a polyester insulating paint and a polyester insulating paint containing copper powder with an average particle size of 20 μm, were separately applied and baked on a copper wire having a conductor diameter of 1.0 mm to produce an insulated wire.
尚、塗布焼付回数は6回とした。皮膜厚は共に
35μmであつた。(尚、銅粉は皮膜重量あたり、
20ppm含有させた)その後、従来法のグリセリン
中絶縁破壊電圧測定、及び本発明の針電極による
絶縁破壊電圧測定を行なつた。次の結果を得た。 The number of times of coating and baking was 6 times. The film thickness is the same
It was 35 μm. (In addition, copper powder is based on the weight of the coating,
After that, dielectric breakdown voltage measurement in glycerin using the conventional method and dielectric breakdown voltage measurement using the needle electrode of the present invention were performed. I got the following results.
グリセリン中BDV、n=100、(浸漬長は1mと
した)
ポリエステル線
平 均 =4.5kV
バラツキ σ=0.7kV
銅粉含有ポリエステル線
平 均 =1.5kV
バラツキ σ=0.6kV
針電極法BDV、n=100、
ポリエステル線
平 均 =4.9kV
バラツキ σ=0.5kV
銅粉含有ポリエステル線
平 均 =4.8kV
バラツキ σ=0.4kV
本実施例から、銅粉は絶縁皮膜に、部分的欠陥
を生じせしめていることが理解出来る。BDV in glycerin, n = 100, (immersion length was 1 m) Polyester wire average = 4.5kV Variation σ = 0.7kV Copper powder-containing polyester wire average = 1.5kV Variation σ = 0.6kV Needle electrode method BDV, n = 100, Polyester wire average = 4.9kV Variation σ = 0.5kV Copper powder-containing polyester wire Average = 4.8kV Variation σ = 0.4kV From this example, it can be seen that copper powder causes partial defects in the insulation film. I can understand.
実施例 2 以下述べる以外はすべて実施例1に同じ。Example 2 Everything is the same as in Example 1 except as described below.
絶縁塗料として、ポリアミドイミド絶縁塗料及
び平均粒径が1μのカーボンブラツクを加えたポ
リアミドイミド絶縁塗料を用いて、絶縁電線を製
造した。カーボンブラツクは皮膜重量あたり1%
含有させた。 An insulated wire was manufactured using a polyamide-imide insulating paint and a polyamide-imide insulating paint to which carbon black with an average particle size of 1 μm was added as an insulating paint. Carbon black is 1% per film weight
Contained.
次の結果を得た。 I got the following results.
2個撚BDV、n=100、ポリアミドイミド線
平 均 =8.5kV
バラツキ σ=0.9kVカーボンブラツク含有ポリアミドイミド線
平 均 =1.8kV
バラツキ σ=0.4kV
針電極法BDV、n=100、ポリアミドイミド線
平 均 =5.1kV
バラツキ σ=0.6kVカーボンブラツク含有ポリアホドイミド線
平 均 =1.9kV
バラツキ σ=0.4kV
本実施例から、カーボンブラツクは、絶縁皮膜
に、全体的欠陥を生じせしめていることが理解出
来る。2-strand BDV, n = 100, polyamide-imide wire average = 8.5kV Variation σ = 0.9kV Carbon black-containing polyamide-imide wire average = 1.8kV Variation σ = 0.4kV Needle electrode method BDV, n = 100, polyamide-imide wire Average = 5.1kV Variation σ = 0.6kV Polyahodoimide wire containing carbon black Average = 1.9kV Variation σ = 0.4kV From this example, it can be understood that carbon black causes overall defects in the insulation film. .
実施例 3
導体が3mm×6mmの平角導線に、ポリビニール
ホルマール絶縁塗料を塗布焼付した平角絶縁電線
のフラツト部とコーナ部の絶縁破壊特性を、本発
明になる方法を用いて測定したところ、次の結果
を得た。尚、絶縁塗料の塗布焼付回数は7回と
し、フラツト部の皮膜厚は40μmとした。Example 3 The dielectric breakdown characteristics of the flat part and corner part of a rectangular insulated wire with a conductor of 3 mm x 6 mm coated with polyvinyl formal insulation paint and baked were measured using the method of the present invention. I got the result. The number of times the insulating paint was applied and baked was 7 times, and the film thickness on the flat part was 40 μm.
測定数はn=100とした。 The number of measurements was n=100.
フラツト部 コーナ部
平 均 =5.5kV 平 均 =3.2kV
バラツキ σ=0.7kV バラツキ σ=0.8kV
本実施例から、従来からいわれているように、
コーナ部はフラツト部に比較して絶縁破壊特性が
劣ることが証明された。 Flat section corner average = 5.5kV Average = 3.2kV Variation σ = 0.7kV Variation σ = 0.8kV From this example, as has been conventionally said,
It has been proven that the dielectric breakdown properties of the corner portions are inferior to those of the flat portions.
実施例 4 以下述べる以外はすべて実施例3に同じ。Example 4 Everything is the same as in Example 3 except as described below.
平角絶縁電線のフラツト部において、クレータ
ー発生部と正常部の絶縁破壊電圧測定を、本発明
になる方法で測定した。 In a flat section of a rectangular insulated wire, dielectric breakdown voltage was measured at a crater-generated section and a normal section using the method according to the present invention.
測定数はn=100とした。 The number of measurements was n=100.
正常部 クレーター部
平 均 =5.5kV 平 均 =4.1kV
バラツキ σ=0.7kV バラツキ σ=0.9kV
本実施例から、クレーター発生部は正常部に比
較すると、絶縁破壊特性の劣ることが確認され
た。Average of normal area and crater area = 5.5 kV Average = 4.1 kV Variation σ = 0.7 kV Variation σ = 0.9 kV From this example, it was confirmed that the crater generated area had inferior dielectric breakdown characteristics compared to the normal area.
実施例 5
導体径0.5mmの銅線にポリエステルイミド絶縁
塗料を塗布焼付した絶縁電線を直径20mmのフエラ
イト棒に100ターン巻きつけてコイルを形成させ、
その後、2種類の含浸ワニス、すなわちエポキシ
変性アルキツドワニスと不飽和ポリエステルワニ
スを用いて、含浸ワニス処理した。Example 5 A copper wire with a conductor diameter of 0.5 mm was coated with polyester imide insulating paint and baked, and then wound 100 turns around a ferrite rod with a diameter of 20 mm to form a coil.
Thereafter, an impregnating varnish treatment was performed using two types of impregnating varnish, namely, an epoxy-modified alkyd varnish and an unsaturated polyester varnish.
尚、皮膜厚は20μm、また含浸ワニスの厚みは
約20μmとした。本コイルを240℃、24時間熱劣
化させた後、本コイルの絶縁破壊電圧特性を、本
発明になる方法で測定した。 The film thickness was 20 μm, and the thickness of the impregnated varnish was approximately 20 μm. After this coil was thermally degraded at 240° C. for 24 hours, the dielectric breakdown voltage characteristics of this coil were measured by the method of the present invention.
使用したコイル数は夫々1ケとし、測定はコイ
ル表面にある電線において行ない、巻きもどしは
行なわなかつた。測定数はn=20とした。 The number of coils used was one for each, and the measurements were made on the wires on the surface of the coils without unwinding. The number of measurements was n=20.
エポキシ変性アルキツド 不飽和ポリエステルワ
ワニスで処理したコイル ニスで処理したコイル
平 均 =1.5kV 平 均 =3.8kV
バラツキσ=0.4kV バラツキσ=0.7kV
本実施例から、含浸ワニスとしてエポキシ変性
アルキツドワニスを用いるよりも、不飽和ポリエ
ステルワニスを用いた方が絶縁破壊特性の良好な
ることがわかる。Coil treated with epoxy-modified alkyd unsaturated polyester varnish Coil treated with varnish Average = 1.5kV Average = 3.8kV Variation σ = 0.4kV Variation σ = 0.7kV From this example, epoxy-modified alkyd varnish is used as the impregnation varnish. It can be seen that the use of unsaturated polyester varnish has better dielectric breakdown characteristics.
図は本発明における針電極を用いた絶縁電線の
破壊電圧を測定する装置を示すものである。
1……針電極、2……被測定物の絶縁電線、
3,4……リード線、5,6……被測定物を前後
左右に動かせる機能をもつ治具、7……移動可能
な荷重、8……アーム、9……針電極をとりつけ
たアーム8を上下させうる際に機能する治具。
The figure shows an apparatus for measuring the breakdown voltage of an insulated wire using a needle electrode according to the present invention. 1... Needle electrode, 2... Insulated wire of the object to be measured,
3, 4...Lead wire, 5, 6...Jig with the function of moving the object to be measured back and forth, left and right, 7...Movable load, 8...Arm, 9...Arm 8 with a needle electrode attached A jig that functions when raising and lowering.
Claims (1)
縁電線と針との間に、電圧を印加することによつ
て、絶縁破壊電圧又は耐久電圧特性を測定する方
法。 2 絶縁電線として、巻線を用いることを特徴と
する特許請求範囲第1項記載の測定法。 3 導電性の針として、導体径0.1〜2.0mmのもの
を用い、先端の針角度が、5゜〜120゜であることを
特徴とする特許請求範囲第1項記載の測定法。 4 針先端にかゝる荷量が1〜50gまで可変出来
ることを特徴とした特許請求範囲第1項記載の測
定法。[Claims] 1. A method of measuring dielectric breakdown voltage or durable voltage characteristics by installing a conductive needle on the surface of an insulated wire and applying a voltage between the insulated wire and the needle. . 2. The measuring method according to claim 1, characterized in that a winding wire is used as the insulated wire. 3. The measuring method according to claim 1, wherein a conductive needle having a conductor diameter of 0.1 to 2.0 mm is used, and the needle angle at the tip is 5° to 120°. 4. The measuring method according to claim 1, wherein the amount of load applied to the tip of the needle can be varied from 1 to 50 g.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5140880A JPS56147059A (en) | 1980-04-17 | 1980-04-17 | Measuring method for insulation destructing voltage of insulated electric wire |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5140880A JPS56147059A (en) | 1980-04-17 | 1980-04-17 | Measuring method for insulation destructing voltage of insulated electric wire |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56147059A JPS56147059A (en) | 1981-11-14 |
| JPH0145590B2 true JPH0145590B2 (en) | 1989-10-04 |
Family
ID=12886104
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5140880A Granted JPS56147059A (en) | 1980-04-17 | 1980-04-17 | Measuring method for insulation destructing voltage of insulated electric wire |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56147059A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60176180U (en) * | 1984-04-28 | 1985-11-21 | 三菱電線工業株式会社 | Electrode device for spark tester for insulated wires |
| US5680053A (en) * | 1995-12-08 | 1997-10-21 | Medicor Corporation | Method for testing insulated electrosurgical instruments |
| CN113092846A (en) * | 2021-04-29 | 2021-07-09 | 国家电网有限公司 | Wire fixing device based on insulated wire voltage measurement and voltage measurement method |
-
1980
- 1980-04-17 JP JP5140880A patent/JPS56147059A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56147059A (en) | 1981-11-14 |
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