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JPH0145864B2 - - Google Patents
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JPH0145864B2 - - Google Patents

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Publication number
JPH0145864B2
JPH0145864B2 JP57028890A JP2889082A JPH0145864B2 JP H0145864 B2 JPH0145864 B2 JP H0145864B2 JP 57028890 A JP57028890 A JP 57028890A JP 2889082 A JP2889082 A JP 2889082A JP H0145864 B2 JPH0145864 B2 JP H0145864B2
Authority
JP
Japan
Prior art keywords
metal material
slab
wave
linearly polarized
equiaxed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57028890A
Other languages
Japanese (ja)
Other versions
JPS58147641A (en
Inventor
Katsuhiro Kawashima
Shoji Murota
Hiroshi Soga
Hideki Oyamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP57028890A priority Critical patent/JPS58147641A/en
Publication of JPS58147641A publication Critical patent/JPS58147641A/en
Publication of JPH0145864B2 publication Critical patent/JPH0145864B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/07Analysing solids by measuring propagation velocity or propagation time of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/0289Internal structure, e.g. defects, grain size, texture

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【発明の詳細な説明】 本発明は電磁超音波を利用した鋼材の等軸晶率
を非破壊的に測定する方法の改良に関するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in a method for non-destructively measuring the equiaxed crystallinity of steel materials using electromagnetic ultrasound.

連続鋳造されたフエライト系ステンレス鋼スラ
ブの断面マクロ組織は、表面から内部に向つて成
長した柱状晶部分とランダムな結晶方位を持つ等
軸晶部分に分かれている。これを第1図に示す。
第1図においてスラブ厚さをD、等軸晶部分の厚
さをdとすると、F=d/Dをスラブの等軸晶率
と呼んでいる。
The cross-sectional macrostructure of a continuously cast ferritic stainless steel slab is divided into a columnar crystal part that grows inward from the surface and an equiaxed crystal part with random crystal orientation. This is shown in FIG.
In FIG. 1, when the thickness of the slab is D and the thickness of the equiaxed crystal portion is d, F=d/D is called the equiaxed crystal ratio of the slab.

等軸晶率Fは、スラブが圧延されてステンレス
薄板成品になつた場合の品質と密接な関係をもつ
ており、等軸晶率Fが約50%以下であると、ステ
ンレス薄板の深絞り加工時にリジングと称するし
わが生じ、著しく商品価値が下がるか又は使用不
能となることがわかつている。
The equiaxed crystallinity F has a close relationship with the quality of the stainless steel thin plate product produced by rolling the slab, and if the equiaxed crystallinity F is less than approximately 50%, the deep drawing process of the stainless steel thin plate will be difficult. It has been found that wrinkles, called ridging, sometimes occur, significantly reducing commercial value or rendering the product unusable.

そこで、本発明者らが特願昭55−62306号で述
べたような等軸晶率測定方法により等軸晶率を早
期に測定すれば、等軸晶率が50%以下でもスラブ
を薄板成品とする前にリジング発生を防ぐ対策を
とることが可能である。
Therefore, if the equiaxed crystal rate is measured early using the equiaxed crystal rate measuring method as described in Japanese Patent Application No. 55-62306, the slab can be manufactured into a thin plate even if the equiaxed crystal rate is less than 50%. It is possible to take measures to prevent ridging before it occurs.

しかしこの方法は、スラブ内の柱状晶が表面か
ら内部に向つて垂直に一定の結晶方位(<100>
方向)で成長している場合の縦波超音波と、横波
超音波のスラブ厚さ方向における伝播時間比から
等軸晶率を測定する方法について述べたものであ
る。
However, in this method, the columnar crystals in the slab have a constant crystal orientation (<100>
This paper describes a method for measuring equiaxed crystallinity from the propagation time ratio of longitudinal ultrasound waves and transverse ultrasound waves in the slab thickness direction when the slab is growing in the slab thickness direction.

しかしながら、柱状晶の成長方向はスラブ内温
度勾配と密接なつながりがあり、柱状晶はスラブ
表面にほぼ垂直に成長するだけではなく傾いて成
長することがある。その様子を第2図に示す。
However, the growth direction of the columnar crystals is closely related to the temperature gradient within the slab, and the columnar crystals may not only grow substantially perpendicular to the slab surface but also grow at an angle. The situation is shown in Figure 2.

この柱状晶が傾いて成長している場合、柱状晶
部分を伝播する超音波音速は、柱状晶が表面に垂
直に成長した場合の超音波音速とは異なつてい
る。第3図は柱状晶の傾き角をパラメータとして
特願昭55−62306号に記載されている方法で、等
軸晶率を測定した結果を示している。図中1は
θ;0〜5゜場合、2はθ;15〜20゜の場合を示す。
上記の方法では同一縦波横波伝播時間比であつて
も柱状晶の傾き角によつて異つた等軸晶率の値を
示し、スラブの等軸晶率が低いものほど測定誤差
が大きくなり、所定の測定精度を維持できなくな
るという問題を有している。
When the columnar crystals grow obliquely, the ultrasonic sound speed propagating through the columnar crystal portion is different from the ultrasonic sound speed when the columnar crystals grow perpendicular to the surface. FIG. 3 shows the results of measuring the equiaxed crystal ratio by the method described in Japanese Patent Application No. 55-62306 using the inclination angle of the columnar crystals as a parameter. In the figure, 1 indicates the case where θ is 0 to 5 degrees, and 2 indicates the case where θ is 15 to 20 degrees.
In the above method, even if the longitudinal wave/transverse wave propagation time ratio is the same, the value of equiaxed crystallinity varies depending on the inclination angle of the columnar crystal, and the lower the equiaxed crystallinity of the slab, the larger the measurement error. There is a problem that a predetermined measurement accuracy cannot be maintained.

そこで本発明は、縦波電磁超音波とスラブの長
さ〔L〕方向、幅〔C〕方向に直線偏向した2つ
の横波電磁超音波を透入し、その各超音波のスラ
ブ厚み方向における伝播時間を測定し、この伝播
時間に基づいて、柱状晶の傾き角ならびに等軸晶
率を測定することによつて、柱状晶の傾き角に影
響されない精度良好な等軸晶率測定法を提供する
ものである。
Therefore, the present invention transmits a longitudinal electromagnetic ultrasonic wave and two transverse electromagnetic ultrasonic waves linearly polarized in the length [L] direction and width [C] direction of the slab, and propagates each ultrasonic wave in the thickness direction of the slab. To provide a highly accurate equiaxed crystal rate measurement method that is not affected by the tilt angle of the columnar crystals by measuring time and measuring the tilt angle of the columnar crystals and the equiaxed crystal rate based on the propagation time. It is something.

第4図は本発明による等軸晶率測定の原理図を
示す。ステンレス鋼スラブ(厚さ200mm)4の表
面近傍にマグネツトコア5−1,5−2,5−
3,マグネツト用コイル6−1,6−2,6−
3、超音波発生検出用コイル7−1,7−2,7
−3、から構成される縦波電磁超音波センサー8
及び2つの直線偏向横波電磁超音波センサー9,
10を配置する。センサー9はスラブの長手方向
(L方向)、10は幅方向(C方向)に偏向した直
線偏向横波超音波を発生・検出するものである。
FIG. 4 shows a principle diagram of equiaxed crystallinity measurement according to the present invention. Magnetic cores 5-1, 5-2, 5- are placed near the surface of stainless steel slab (200 mm thick) 4.
3. Magnet coil 6-1, 6-2, 6-
3. Ultrasonic generation detection coils 7-1, 7-2, 7
-Longitudinal wave electromagnetic ultrasonic sensor 8 consisting of 3.
and two linearly polarized transverse electromagnetic ultrasonic sensors 9,
Place 10. A sensor 9 generates and detects linearly polarized transverse ultrasonic waves deflected in the longitudinal direction (L direction) of the slab, and 10 in the width direction (C direction).

マグネツト用コイルにマグネツト用電源11を
つなぎ電流を流すと、ステンレス鋼スラブの表面
近傍には縦波電磁超音波センサー8によつて、水
平方向磁束Bxが生じ、直線偏向横波センサー9,
10では垂直方向の磁速Bzが生じる。また、超
音波発生検出用コイル7−1,7−2,7−3に
パルス電流発生装置12をつなぎ、高周波パルス
電流を流すと、スラブ表面には電磁誘導の法則に
より電磁超音波センサー10では水平方向の誘導
電流Ixが、電磁超音波センサー8,9では紙面に
垂直な誘導電流Iyがステンレス鋼スラブの表面近
傍に生ずる。
When the magnet coil is connected to the magnet power source 11 and current is applied, a horizontal magnetic flux Bx is generated near the surface of the stainless steel slab by the longitudinal wave electromagnetic ultrasonic sensor 8, and the linear deflection transverse wave sensor 9,
10, a magnetic velocity Bz in the vertical direction occurs. In addition, when the pulse current generator 12 is connected to the ultrasonic generation detection coils 7-1, 7-2, and 7-3 and a high-frequency pulse current is passed, the electromagnetic ultrasonic sensor 10 An induced current Ix in the horizontal direction is generated in the electromagnetic ultrasonic sensors 8 and 9, and an induced current Iy perpendicular to the plane of the paper is generated near the surface of the stainless steel slab.

これらの誘導電流Ix,Iyは各々磁束Bz,Bxと
相互作用してローレンツ力Fy,Fx,Fzを発生す
る。ローレンツ力FyはC方向に偏向した直線偏
向横波超音波Wscを生じ、FxはL方向に偏向した
直線偏向横波超音波WSLを生じる。またFzは縦波
超音波WLを生じる。WL,WSL、WSCはそれぞれ
矢印の方向に進行し、柱状晶部分、等軸晶部分を
通過し、スラブ下面で反射されてスラブ表面にも
どつてくる。
These induced currents Ix and Iy interact with magnetic fluxes Bz and Bx, respectively, to generate Lorentz forces Fy, Fx, and Fz. The Lorentz force Fy produces a linearly polarized transverse ultrasonic wave W sc deflected in the C direction, and Fx produces a linearly polarized transverse ultrasonic wave W SL deflected in the L direction. Further, Fz generates a longitudinal ultrasonic wave W L. W L , W SL , and W SC travel in the direction of the arrows, pass through the columnar crystal portion and the equiaxed crystal portion, are reflected at the bottom surface of the slab, and return to the slab surface.

その超音波は、発生の際と全く逆の原理により
超音波発生検出用コイルに検出され電気信号とな
る。
The ultrasonic waves are detected by the ultrasonic generation detection coil and turned into electrical signals based on the completely opposite principle to that used when they are generated.

検出された電気信号は増巾器13により増巾さ
れ、ウエーブメモリ14にてデイジタル信号に変
換された後、インターフエイス16を介してミニ
コンピユーター17に取り込まれる。
The detected electrical signal is amplified by an amplifier 13, converted into a digital signal by a wave memory 14, and then taken into a minicomputer 17 via an interface 16.

一方、デイジタル信号は、ウエーブメモリ内で
再びアナログ信号に変換され、オシロスコープ1
5にその信号波形を表示することもできる。ミニ
コンピユーター17では、その信号波形に基づい
て、縦波及び2つの直線偏向横波超音波のスラブ
内での伝播時間が演算され、その伝播時間を基に
以下に述べる手法により、柱状晶の傾き角を求
め、更にその傾き角に対応した等軸晶率を判定す
ることができる。
On the other hand, the digital signal is converted back into an analog signal within the wave memory, and the oscilloscope 1
5 can also display the signal waveform. The minicomputer 17 calculates the propagation time of the longitudinal wave and the two linearly polarized transverse ultrasonic waves within the slab based on the signal waveforms, and calculates the tilt angle of the columnar crystal using the method described below based on the propagation time. It is possible to determine the equiaxed crystallinity corresponding to the tilt angle.

第4図のオシロスコープ表示において、Pは超
音波を発生させるために、パルス電流発生装置か
ら超音波発生検出用コイルに流したパルス電流に
対応した送信波形であり、Lはスラブ下面で反射
され、超音波発生検出用コイルで検出された縦波
WLの波形である。同様に、SLはL方向に偏向し
た直線偏向横波WSLの波形であり、SCはC方向に
偏向した直線偏向横波WSCの波形である。
In the oscilloscope display in Fig. 4, P is the transmission waveform corresponding to the pulse current passed from the pulse current generator to the ultrasonic generation detection coil in order to generate ultrasonic waves, and L is the waveform reflected from the bottom surface of the slab. Longitudinal waves detected by ultrasonic generation detection coil
This is the waveform of WL . Similarly, SL is the waveform of a linearly polarized transverse wave W SL deflected in the L direction, and SC is a waveform of a linearly polarized transverse wave W SC deflected in the C direction.

また、2TLは、縦波がステンレススラブ内を往
復するのに要する伝播時間であり、同様に2TSL
はL方向に偏向した直線偏向横波の伝播時間、
2TSCはC方向に偏向した直線偏向横波の伝播時
間である。
In addition, 2T L is the propagation time required for a longitudinal wave to travel back and forth within the stainless steel slab, and similarly, 2T SL
is the propagation time of a linearly polarized transverse wave polarized in the L direction,
2T SC is the propagation time of a linearly polarized shear wave polarized in the C direction.

ここで、ステンレス鋼スラブの柱状晶の傾き角
をθ、柱状晶部分を伝播する縦波音速及びL方向
に偏向した直線偏向横波音速、C方向に偏向した
直線偏向横波音速をそれぞれVDL(θ)、VDSL(θ)、
VDSC(θ)とし、等軸晶部分を伝播する縦波音速
をVFLとする。又等軸晶はその結晶方位がランダ
ムであるために、等軸晶部分を伝播するL方向及
びC方向に偏向した直線偏向横波音速は等しく、
その音速をVFSとすると次式が成り立つ。
Here, the inclination angle of the columnar crystals of the stainless steel slab is θ, the sound velocity of longitudinal waves propagating through the columnar crystals, the sound velocity of linearly polarized transverse waves deflected in the L direction, and the sound velocity of linearly polarized transverse waves deflected in the C direction are respectively V DL (θ ), V DSL (θ),
Let V DSC (θ) be the longitudinal wave sound velocity propagating through the equiaxed crystal part. In addition, since the crystal orientation of the equiaxed crystal is random, the sound speed of linearly polarized transverse waves deflected in the L direction and the C direction propagating through the equiaxed crystal part is equal,
If the speed of sound is V FS , the following formula holds true.

2TL=2(D−d/VDL(θ)+d/VFL) ……(1) 2TSL=2(D−d/VDSL(θ)+d/VFS)……(2) 2TSC=2(D−d/VDSC(θ)+d/VFS)……(3) 第5図は柱状晶の傾き角θと、柱状晶部分を伝
播するL及びC方向に偏向した直線偏向横波音速
VDSL(θ)、VDSC(θ)の関係を示している。
2T L = 2 (D-d/V DL (θ) + d/V FL ) ...(1) 2T SL = 2 (D-d/V DSL (θ) + d/V FS ) ...(2) 2T SC = 2 (D-d/V DSC (θ) + d/V FS )...(3) Figure 5 shows the tilt angle θ of the columnar crystal and the linearly polarized transverse waves deflected in the L and C directions propagating through the columnar crystal part. speed of sound
It shows the relationship between V DSL (θ) and V DSC (θ).

この両方向における超音波音速は、種々傾きの
異なる柱状晶部分を所定の厚さD′でスラブより
切り出し、第4図を用いて説明した原理に基づい
て、L及びC方向直線偏向横波の伝播時間TDSL
TDSCを実測し、VDSL(θ)=D′/TDSL(θ)、VDSC
(θ)=D′/TDSC(θ)の関係から算出したもので
ある。
The ultrasonic sound speed in both directions can be determined by cutting out columnar crystal parts with various inclinations from a slab with a predetermined thickness D', and then calculating the propagation time of linearly polarized transverse waves in the L and C directions based on the principle explained using Fig. 4. T DSL ,
Measure T DSC , V DSL (θ) = D′/T DSL (θ), V DSC
It is calculated from the relationship (θ)=D′/T DSC (θ).

また、第6図には柱状晶の傾き角θと、柱状晶
部分を伝播する縦波音速VDL(θ)の関係を示す。
VDL(θ)は横波音速と同様の手法でVDL(θ)=
D′/TDL(θ)の関係より求めたものである。
Further, FIG. 6 shows the relationship between the inclination angle θ of the columnar crystal and the longitudinal wave sound velocity V DL (θ) propagating through the columnar crystal portion.
V DL (θ) is calculated using the same method as the transverse wave sound velocity: V DL (θ) =
It was obtained from the relationship D′/T DL (θ).

第5図、第6図より、VDL(θ)、VDSL(θ)、及
びVDSC(θ)とθとの間には直線的な相関がある
ことがわかる。これらの関係は各々次式で表わす
ことができる。
From FIGS. 5 and 6, it can be seen that there is a linear correlation between V DL (θ), V DSL (θ), and V DSC (θ) and θ. Each of these relationships can be expressed by the following equations.

VDL(θ)=αθ+β ……(4) VDSL(θ)=aθ+b ……(5) VDSC(θ)=pθ+q ……(6) 式(4)、(5)、(6)を式(1)、(2)、(3)に代入するとθ、
D、dを未知数とする3元連立方程式が得られ、
この式を解けば全ての未知数を導出できる。な
お、求めるべき等軸晶率FはF=d/Dであるか
ら、θとFの導出結果を式(7)、(8)に示す。
V DL (θ) = αθ + β ... (4) V DSL (θ) = aθ + b ... (5) V DSC (θ) = pθ + q ... (6) Expressions (4), (5), and (6) Substituting into (1), (2), and (3), θ,
A three-dimensional simultaneous equation with D and d as unknowns is obtained,
By solving this equation, all unknowns can be derived. Note that since the equiaxed crystallinity F to be determined is F=d/D, the results of deriving θ and F are shown in equations (7) and (8).

θ−{(αq+pβ)X+(aβ+αb)Y+(aq+bp)Z
}/2(αpX+aαY+apZ) ±〔{αq+pβ)X+(aβ+αb)Y+(aq+bp)Z
2/−4(αpX+aαY+apZ)(βqX+bβY+bqZ)〕1
/2
/2(αpX+aαY+apZ)……(7) 但し、X=TL・VFL−TSCVFS Y=TSLVFS−TLVFL Z=VFL(TSC−TSL) F={1/αθ+β−1/aθ+b(TL/(TSL)}/
{(1/VFS−1/aθ+b)(TL/TSL)−(1/VFL
1/αθ+β)}……(8) なお、θは二値算出されるが、θ>0の値をと
るものとする。
θ−{(αq+pβ)X+(aβ+αb)Y+(aq+bp)Z
}/2 (αpX+aαY+apZ) ±[{αq+pβ)X+(aβ+αb)Y+(aq+bp)Z
} 2 / -4 (αpX + aαY + apZ) (βqX + bβY + bqZ)] 1
/2
/2 (αpX+aαY+apZ)...(7) However, X=T L・V FL −T SC V FS Y=T SL V FS −T L V FL Z=V FL (T SC −T SL ) F= {1/αθ+β−1/aθ+b(T L /(T SL )}/
{(1/V FS −1/aθ+b) (T L /T SL ) − (1/V FL
1/αθ+β)}...(8) Although θ is calculated as a binary value, it is assumed that θ>0.

式(7)、(8)におけるα、β、a、b、p、q及び
VFL、VFSは実験的に求まる定数である。
α, β, a, b, p, q and in formulas (7) and (8)
V FL and V FS are constants determined experimentally.

したがつて、等軸晶率が未知のスラブにおい
て、TL、TSL、TSCを測定すれば、柱状晶の傾き
角θ及び等軸晶率Fを求めることができる。
Therefore, by measuring T L , T SL , and T SC in a slab whose equiaxed crystal ratio is unknown, the tilt angle θ of the columnar crystals and the equiaxed crystal ratio F can be determined.

以上のように、本発明によれば柱状晶の傾き角
に影響されず、ステンレス鋼スラブの等軸晶率を
良好な測定精度約±11(%)で、非破壊的にオン
ライン測定することが可能となる。従つて、スラ
ブの等軸晶率が低い場合(通常50%以下)におい
ても、これを早期に検知することによつて、リジ
ング発生の防止策を実施することが可能となり、
工業上極めて有効であることが明らかとなつた。
As described above, according to the present invention, it is possible to nondestructively measure the equiaxed crystallinity of a stainless steel slab on-line with a good measurement accuracy of about ±11 (%) without being affected by the tilt angle of columnar crystals. It becomes possible. Therefore, even if the equiaxed crystallinity of the slab is low (usually less than 50%), by early detection, it is possible to take measures to prevent ridging.
It has become clear that this method is extremely effective industrially.

なお、実施例においては、超音波がスラブ内を
往復する伝播時間を測定することに基づいて(即
ち反射法)等軸晶率を測定する方法を説明してい
るが、超音波発生用センサーをスラブの一面に、
検出用センサーを対向した他面におき、片道の伝
播時間を測定する方法(即ち透過法)によつても
目的は達せられる。
In addition, in the example, a method for measuring equiaxed crystallinity is explained based on measuring the propagation time of ultrasonic waves reciprocating within the slab (i.e., reflection method), but it is not necessary to use a sensor for generating ultrasonic waves. On one side of the slab,
The purpose can also be achieved by placing a detection sensor on the opposite surface and measuring the one-way propagation time (ie, the transmission method).

【図面の簡単な説明】[Brief explanation of drawings]

第1図はスラブ断面のマクロエツチ組織の模式
図、第2図は柱状晶が傾いたスラブ断面のマクロ
エツチ組織図、第3図は柱状晶の傾き角をパラメ
ータとした等軸晶率と縦波横波伝播時間比の関係
図、第4図は電磁超音波による等軸晶率測定の原
理図、第5図は柱状晶の傾き角と柱状晶部分を伝
播するL方向及びC方向直線偏向横波音速の関係
図、第6図は柱状晶の傾き角と柱状晶部分を伝播
する縦波音速との関係図を示す。 1……柱状晶部、2……等軸晶部、3……柱状
晶部、4……ステンレススラブ表面、5……マグ
ネツトコア、6……マグネツト用コイル、7……
超音波発生検出用コイル、8……縦波電磁超音波
センサー、9……L方向直線偏向横波電磁超音波
センサー、10……C方向直線偏向横波電磁超音
波センサー、11……パルス電流発生装置、12
……マグネツト電源、13……増巾器、14……
ウエーブメモリ、15……オシロスコープ、16
……インターフエース、17……ミニコンピユー
ター。
Figure 1 is a schematic diagram of the macroetch structure of a slab cross section, Figure 2 is a macroetch diagram of a slab cross section with tilted columnar crystals, and Figure 3 is the equiaxed crystal ratio and longitudinal and transverse waves using the tilt angle of the columnar crystals as a parameter. Figure 4 is a diagram of the relationship between the propagation time ratio, and Figure 4 is a diagram of the principle of equiaxed crystallinity measurement using electromagnetic ultrasonic waves. Figure 5 is a diagram of the inclination angle of columnar crystals and the sound speed of linearly polarized transverse waves in the L and C directions propagating through the columnar crystals. FIG. 6 shows a relationship diagram between the inclination angle of a columnar crystal and the longitudinal sound velocity propagating through the columnar crystal portion. DESCRIPTION OF SYMBOLS 1... Column crystal part, 2... Equiaxed crystal part, 3... Column crystal part, 4... Stainless steel slab surface, 5... Magnet core, 6... Coil for magnet, 7...
Coil for ultrasonic generation detection, 8...Longitudinal wave electromagnetic ultrasonic sensor, 9...L direction linear polarization transverse wave electromagnetic ultrasonic sensor, 10...C direction linear polarization transverse wave electromagnetic ultrasonic sensor, 11...Pulse current generator , 12
... Magnetic power supply, 13 ... Multiplier, 14 ...
Wave memory, 15...Oscilloscope, 16
...Interface, 17...Mini computer.

Claims (1)

【特許請求の範囲】[Claims] 1 柱状晶組織を含む異なる二種類の組織を有す
る金属材料中に、縦波電磁超音波ならびに金属材
料の長さ方向および幅方向にそれぞれ直線偏向し
た二つの横波電磁超音波を透入し、これら各超音
波の金属材料厚さ方向における伝播時間を測定
し、予め測定された金属材料中の柱状晶の結晶軸
の金属材料表面に垂直な軸とのなす角(θ)と、
前記柱状晶部を透過する縦波超音波ならびに金属
材料の長さ方向および幅方向にそれぞれ直線偏向
した構波超音波の速度との相関関係と、前記伝播
時間測定結果に基づいて上記二種類の組織の含有
比率を測定することを特徴とする金属材料におけ
る二種類の組織の含有比率測定方法。
1. A longitudinal wave electromagnetic ultrasound wave and two transverse wave electromagnetic ultrasound waves linearly polarized in the length direction and the width direction of the metal material are penetrated into a metal material having two different types of structures including a columnar crystal structure, and these waves are The propagation time of each ultrasonic wave in the thickness direction of the metal material is measured, and the angle (θ) between the crystal axis of the columnar crystal in the metal material and the axis perpendicular to the surface of the metal material measured in advance is determined.
Based on the correlation between the velocity of the longitudinal ultrasound transmitted through the columnar crystal part and the structured ultrasound linearly polarized in the length direction and the width direction of the metal material, and the propagation time measurement results, the above two types are determined. A method for measuring the content ratio of two types of structures in a metal material, the method comprising measuring the content ratio of the structures.
JP57028890A 1982-02-26 1982-02-26 Content ratio measurement for two constitutents in metal Granted JPS58147641A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57028890A JPS58147641A (en) 1982-02-26 1982-02-26 Content ratio measurement for two constitutents in metal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57028890A JPS58147641A (en) 1982-02-26 1982-02-26 Content ratio measurement for two constitutents in metal

Publications (2)

Publication Number Publication Date
JPS58147641A JPS58147641A (en) 1983-09-02
JPH0145864B2 true JPH0145864B2 (en) 1989-10-05

Family

ID=12260986

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57028890A Granted JPS58147641A (en) 1982-02-26 1982-02-26 Content ratio measurement for two constitutents in metal

Country Status (1)

Country Link
JP (1) JPS58147641A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7120896B2 (en) * 2018-12-03 2022-08-17 三菱重工業株式会社 Aperture synthesis processing device, aperture synthesis processing method, and its program

Also Published As

Publication number Publication date
JPS58147641A (en) 1983-09-02

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