JPH0146829B2 - - Google Patents
Info
- Publication number
- JPH0146829B2 JPH0146829B2 JP1476084A JP1476084A JPH0146829B2 JP H0146829 B2 JPH0146829 B2 JP H0146829B2 JP 1476084 A JP1476084 A JP 1476084A JP 1476084 A JP1476084 A JP 1476084A JP H0146829 B2 JPH0146829 B2 JP H0146829B2
- Authority
- JP
- Japan
- Prior art keywords
- conductor
- contact probe
- tip
- main body
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004020 conductor Substances 0.000 claims description 85
- 239000000523 sample Substances 0.000 claims description 57
- 238000007689 inspection Methods 0.000 claims description 17
- 238000003780 insertion Methods 0.000 claims description 15
- 230000037431 insertion Effects 0.000 claims description 15
- 238000005259 measurement Methods 0.000 claims description 7
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000012212 insulator Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 101100008047 Caenorhabditis elegans cut-3 gene Proteins 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、接触プローブの先端をIC、LSI等の
回路基板の検査点に接触させて電気的試験、検査
などを行なう検査装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an inspection device that performs electrical tests, inspections, etc. by bringing the tips of contact probes into contact with inspection points on circuit boards such as ICs and LSIs.
〔発明の技術的背景とその問題点〕
検査すべき回路基板に対向して移動自在に設け
られた支持板に、筒体の外部導体の内部に中心導
体を絶縁状態で設けた同軸型可動接触プローブを
回路基板に向かつて貫通状態で支持し、支持板の
移動により接触プローブの先端を回路基板の検査
点に接触させて電気的な測定検査を行なう回路基
板等の検査装置は、例えば特公昭58−175273号公
報に記載されているように公知である。[Technical background of the invention and its problems] A coaxial movable contact in which a center conductor is provided in an insulated state inside an external conductor of a cylinder on a supporting plate that is movably provided facing a circuit board to be inspected. An inspection device for circuit boards, etc., which carries out electrical measurement and inspection by supporting a probe in a penetrating manner toward the circuit board and bringing the tip of the contact probe into contact with a test point on the circuit board by moving a support plate, is known, for example, from the Tokuko Showa Institute of Technology. It is known as described in Japanese Patent No. 58-175273.
この種の同軸型可動接触プローブは、その同軸
構造のために、インピーダンス整合がよい、信号
の漏洩、信号レベルの減衰が少ない等の利点があ
り、電気的に良好な測定、検査を行なうことがで
きる。 Due to its coaxial structure, this type of coaxial movable contact probe has advantages such as good impedance matching, low signal leakage, and low signal level attenuation, and can perform electrically good measurements and inspections. can.
しかしながら、従来の同軸型可動接触プローブ
では、最も故障、破損し易い中心導体が、故障、
破損して交換しなければならない時には、外部導
体等の他の部分をも外さないと交換作業を行なう
ことができない。 However, in conventional coaxial movable contact probes, the center conductor is the most prone to failure and damage.
When it is damaged and must be replaced, the replacement work cannot be performed unless other parts such as the outer conductor are also removed.
一方、従来の同軸型可動接触プローブは、その
支持板への装着構造が比較的複雑で、着脱にも手
間がかかるという欠点がある。 On the other hand, the conventional coaxial type movable contact probe has the disadvantage that the structure for mounting it on the support plate is relatively complicated, and it takes time and effort to attach and detach it.
本発明が、以上のような問題点に鑑みなされた
もので、その主目的は、同軸型可動接触プローブ
の中心導体のみを簡単に挿脱することができ、こ
れによりその交換を瞬時に行なうことができるよ
うにすることである。
The present invention was created in view of the above problems, and its main purpose is to easily insert and remove only the center conductor of a coaxial movable contact probe, thereby allowing instant replacement. The goal is to be able to do this.
また、本発明の他の目的は、同軸型可動接触プ
ローブの支持板に対する装着を簡単な構造により
確実に行なうことができるようにすることにあ
る。 Another object of the present invention is to enable a coaxial movable contact probe to be reliably mounted on a support plate with a simple structure.
本発明では、その主目的の達成のために、接触
プローブの外部導体の内側に、中心部に中心導体
挿入用の貫通孔を有する絶縁筒を固定し、中心導
体は、筒状の主体と主体の先端部にばね力に抗し
て後退自在に支持した先端ピンとにより構成し、
中心導体の主体を絶縁筒の貫通孔内に挿脱自在に
摩擦的に挿入支持し、貫通孔内への中心導体主体
の挿入位置決め手段をさらに設ける。
In order to achieve the main purpose of the present invention, an insulating tube having a through hole for inserting the center conductor in the center is fixed inside the outer conductor of the contact probe, and the center conductor has a cylindrical main body and a main body. It consists of a tip pin that is supported at the tip so that it can be freely retracted against the spring force,
The main body of the center conductor is frictionally inserted and supported in a removable manner into the through hole of the insulating cylinder, and means for positioning the main body of the center conductor into the through hole is further provided.
また、接触プローブの支持板への装着を簡単に
するために、接触プローブの外部導体の外側に外
筒を一体的にはめ、この外筒の外周面に突出部を
設け、支持板に貫設した接触プローブ挿通孔内に
前記外筒を、挿入孔へ突出部が圧接されるように
して挿入する構成がとられる。 In addition, in order to easily attach the contact probe to the support plate, an outer cylinder is integrally fitted on the outside of the outer conductor of the contact probe, and a protrusion is provided on the outer circumferential surface of the outer cylinder, which is inserted through the support plate. The outer tube is inserted into the contact probe insertion hole in such a manner that the protruding portion is pressed into contact with the insertion hole.
第1図の回路基板等の検査装置の一実施例を示
すもので、同図において、1は平行に例えば4本
設けられるガイドポストであり、検査装置の四隅
等に固設されている。
This figure shows an embodiment of the apparatus for inspecting circuit boards and the like shown in FIG. 1. In the figure, reference numeral 1 denotes, for example, four guide posts provided in parallel, which are fixedly installed at the four corners of the inspection apparatus.
ガイドポスト1の上端部には回路基板等の支承
フレーム2が固定されており、これに、検査すべ
きIC回路基板Bが支持される。 A support frame 2 for a circuit board or the like is fixed to the upper end of the guide post 1, and an IC circuit board B to be inspected is supported by this frame.
支承フレーム2の下方には、ガイドポスト1に
より案内されて上下方向に移動する接触プローブ
装着基板としての支持板3が設けられている。こ
の支持板3には同軸型可動接触プローブPが上下
方向に多数支持されている。各プローブPは先端
(上端)に接触部を有し、支持板3が支承フレー
ム2上の回路基板Bに向かつて上昇すると、各プ
ローブPの先端が回路基板Bの下面の回路パター
ンに電気的に接触して測定検査が行なわれるよう
になつている。なお、支持板3を固定し、支承フ
レーム2を上下動させるようにしてもよい。 A support plate 3 serving as a contact probe mounting board is provided below the support frame 2 and is guided by the guide post 1 and moves up and down. A large number of coaxial movable contact probes P are supported on the support plate 3 in the vertical direction. Each probe P has a contact portion at its tip (upper end), and when the support plate 3 rises toward the circuit board B on the support frame 2, the tip of each probe P electrically contacts the circuit pattern on the bottom surface of the circuit board B. Measurements and inspections are now performed by contacting the Note that the support plate 3 may be fixed and the support frame 2 may be moved up and down.
支持板3の下方には、支持板3と一緒にガイド
ポスト1に沿つて上下動するコネクタ保持板4が
設けられており、この保持板4に測定器(図示し
ない)へ到る同軸ケーブル5に各プローブPを電
気的に接続するコネクタ6が保持されている。 A connector holding plate 4 is provided below the support plate 3 and moves up and down along the guide post 1 together with the support plate 3. A coaxial cable 5 leading to a measuring device (not shown) is attached to this holding plate 4. A connector 6 for electrically connecting each probe P is held therein.
支持板3に対する同軸型可動接触プローブPの
支持の詳細、および接触プローブPの構造の詳細
は第2図に示す。同図において、10は同軸型可
動接触プローブPの中心導体であり、11はその
外周に同軸的に設けられた筒状の外部導体であ
る。外部導体11の内面には、電気絶縁材からな
る絶縁筒12が固定されている。絶縁筒12はそ
の中心部に中心導体挿入用貫通孔13を有してお
り、これに中心導体10が挿入されている。 Details of how the coaxial movable contact probe P is supported on the support plate 3 and details of the structure of the contact probe P are shown in FIG. In the figure, 10 is a center conductor of a coaxial movable contact probe P, and 11 is a cylindrical outer conductor provided coaxially around the outer periphery of the center conductor. An insulating tube 12 made of an electrically insulating material is fixed to the inner surface of the outer conductor 11. The insulating tube 12 has a center conductor insertion through hole 13 in its center, into which the center conductor 10 is inserted.
外部導体11の外側には外筒14が一体的には
めてあり、その外周面には突出部15が形成され
ている。外筒14は金属等の導体により形成して
もよいし、不導体の合成樹脂などにより形成して
もよい。外筒14は、その突出部15が支持板3
の挿通孔17の内面に圧接された状態で挿通孔1
7内に支持されており、その挿入位置は段部18
の支持板3への当接により決められる。 An outer cylinder 14 is integrally fitted on the outside of the outer conductor 11, and a protrusion 15 is formed on the outer peripheral surface of the outer cylinder 14. The outer cylinder 14 may be formed of a conductor such as a metal, or may be formed of a non-conductive synthetic resin or the like. The outer cylinder 14 has a protrusion 15 that is connected to the support plate 3.
The insertion hole 1 is pressed against the inner surface of the insertion hole 17.
7, and its insertion position is at the stepped portion 18.
is determined by the contact with the support plate 3.
外筒14の先端(上端)部の内側には凹入部1
9が形成されて外部導体11との間に環状空間が
形成され、この環状空間に、外部導体11の先端
可動部20を構成する導体からなる筒体の大径基
部20aが摺動自在に挿入されている。先端可動
部20は、背後からコイルばね21により外方へ
弾圧され、その脱出は外筒14の先端の内折りフ
ランジ22により阻止されている。 There is a recessed part 1 inside the tip (upper end) of the outer cylinder 14.
9 is formed to form an annular space between the outer conductor 11 and the outer conductor 11, into which the large-diameter base 20a of the cylindrical conductor constituting the movable tip portion 20 of the outer conductor 11 is slidably inserted. has been done. The distal end movable portion 20 is pressed outward from behind by a coil spring 21, and its escape is prevented by an inwardly folded flange 22 at the distal end of the outer cylinder 14.
中心導体10は、筒状の主体24とその先端ピ
ン25とを有し、先端ピン24の基部24aは主
体24内に抜け止め状態で挿入され、主体内のコ
イルばね27によつて先端ピン24はボール26
を介して外方へ弾圧されている。コイルばね27
の奥端は、主体24の内側へ向かつて変形させた
ビード28に受け止めされている。主体24の貫
通孔13の軸線方向での位置決めは位置決め手段
30によりなされている。位置決め手段30は図
示の例ではフランジとして形成され、このフラン
ジ30が絶縁筒12の先端面に当たるまで中心導
体10を貫通孔13内に挿入すると、中心導体1
0の位置決めがなされる。 The center conductor 10 has a cylindrical main body 24 and a tip pin 25. A base 24a of the tip pin 24 is inserted into the main body 24 in a manner that prevents it from coming off, and a coil spring 27 in the main body holds the tip pin 24. is ball 26
They are being oppressed outwardly through the coil spring 27
The inner end of the main body 24 is received by a bead 28 that has been deformed toward the inside of the main body 24. Positioning of the through hole 13 of the main body 24 in the axial direction is performed by a positioning means 30. In the illustrated example, the positioning means 30 is formed as a flange, and when the center conductor 10 is inserted into the through hole 13 until the flange 30 hits the tip end surface of the insulating cylinder 12, the center conductor 1
0 positioning is done.
中心導体10が貫通孔13から簡単に抜けない
ようにするために、中心導体10は貫通孔13に
摩擦的に挿入する。摩擦力を発生させる手段とし
ては、貫通孔13を中心導体10より幾分大き目
にするとともに、中心導体10の主体24を若干
湾曲させ、貫通孔13内への挿入時に直線状に撓
ませるようにすることが考えられる。主体24の
湾曲加工は、主体素材に予め塑性変形を与えるこ
とにより行なつてもよいし、主体24に先端ピン
25を組み込んでから主体に湾曲を与えることに
より行なつてもよい。また、湾曲を与える代り
に、湾曲のない主体24の内側から外側へ向かつ
て打出し突起を形成し、この突起を幾分弾性のあ
る絶縁筒12に当接させることにより摩擦保持機
能を与えてもよい。 In order to prevent the center conductor 10 from easily slipping out of the through hole 13, the center conductor 10 is frictionally inserted into the through hole 13. As a means for generating frictional force, the through hole 13 is made somewhat larger than the center conductor 10, and the main body 24 of the center conductor 10 is slightly curved so that it bends linearly when inserted into the through hole 13. It is possible to do so. The main body 24 may be bent by plastically deforming the main body material in advance, or by incorporating the tip pin 25 into the main body 24 and then bending the main body. Moreover, instead of providing curvature, a protrusion is formed from the inside to the outside of the main body 24, which has no curvature, and this protrusion is brought into contact with the somewhat elastic insulating cylinder 12, thereby providing a friction retaining function. Good too.
接触プローブPの基端部にコネクタ6(第1
図)を接続するために、中心導体10の基端10
aを第2図に示すように開放するとともに、外部
導体11の基端に第3図にも示すように切割り3
2を形成して外部導体11基端に拡開弾性を与え
ておく。 Connector 6 (first
(Fig.), the proximal end 10 of the center conductor 10
A is opened as shown in FIG. 2, and a cut 3 is made at the base end of the outer conductor 11 as shown in FIG.
2 to give expansion elasticity to the base end of the outer conductor 11.
コネクタ6による同軸ケーブル5との接続の詳
細は第4図に示す通りである。同軸ケーブル5
は、芯線40と、網線41と、それらの間に介在
する絶縁体42と、外被43とからなつている。
網線41の先端部は図示のように外被43の外側
に折り返され、それにコネクタの接続プラグ金具
44が取り付けられる。 The details of the connection with the coaxial cable 5 by the connector 6 are as shown in FIG. coaxial cable 5
consists of a core wire 40, a mesh wire 41, an insulator 42 interposed between them, and an outer sheath 43.
The tip of the mesh wire 41 is folded back to the outside of the jacket 43 as shown, and a connecting plug fitting 44 of the connector is attached to it.
接続プラグ金具44は、第5図に示すように、
基端部の筒状取付け部45と先端側の筒状大径プ
ラグ46とを備え、それらの境界部の外側に環状
溝47が形成されている。49は、切割り48お
よびフランジ50を有する小径プラグで、その背
後の突出部51は、大径プラグ46の内側にはめ
込まれた環状の絶縁部材52の中心の孔にはめ込
まれている。この際、フランジ50は絶縁部材5
2の先端面に当接する。突出部51は筒状をな
し、孔53を有している。 The connection plug fitting 44 is, as shown in FIG.
It includes a cylindrical attachment part 45 at the base end and a cylindrical large-diameter plug 46 at the distal end, and an annular groove 47 is formed outside the boundary between them. 49 is a small-diameter plug having a cutout 48 and a flange 50, and a protrusion 51 at the rear thereof is fitted into a hole at the center of an annular insulating member 52 fitted inside the large-diameter plug 46. At this time, the flange 50 is
It comes into contact with the tip surface of 2. The protrusion 51 has a cylindrical shape and has a hole 53.
以上のような構成をもつ接続プラグ金具44の
取付け部45は、同軸ケーブル5の先端部に第4
図に示すように被せられて、54で示すように絞
りかしめにより同軸ケーブル5に取り付けられ
る。また、同軸ケーブル芯線40の先端は、突出
部51の孔53内に差し込まれて55で示すよう
にはんだ付けされる。 The attachment part 45 of the connection plug fitting 44 having the above-mentioned configuration is attached to the fourth end of the coaxial cable 5.
It is covered as shown in the figure and attached to the coaxial cable 5 by crimping as shown at 54. Further, the tip of the coaxial cable core wire 40 is inserted into the hole 53 of the protrusion 51 and soldered as shown at 55.
このように同軸ケーブル5に接続された接続プ
ラグ金具44は、その大径プラグ46が外部導体
11の基端部内にはめ込まれ、かつ小径プラグ4
9が中心導体主体24の基端部10aにはめ込ま
れることにより第4図に示すように接触プローブ
Pに電気的に接続される。はめ込みの際、外部導
体11は切込み32の存在により弾性的に拡開
し、その先端の内側屈曲部60は、接続プラグ金
具44の環状溝(第5図)内に係合して不意の脱
出を防ぐ。一方、はめ込みの際、小径プラグ49
は弾性的に収縮し、接続後は小径プラグ49は中
心導体主体24の基端部10aの内面に圧接され
る。かくして、外部導体11は大径プラグ46お
よび取付け部45を介して同軸ケーブル5の網線
41に、また中心導体10は小径プラグ49およ
び突出部51を介して同軸ケーブル5の芯線40
にそれぞれ接続される。 The connection plug fitting 44 connected to the coaxial cable 5 in this way has its large diameter plug 46 fitted into the base end of the external conductor 11, and its small diameter plug 46.
9 is fitted into the base end 10a of the central conductor main body 24, thereby electrically connecting it to the contact probe P as shown in FIG. When fitted, the outer conductor 11 expands elastically due to the presence of the notch 32, and the inner bent portion 60 at its tip engages in the annular groove (FIG. 5) of the connection plug fitting 44 to prevent accidental escape. prevent. On the other hand, when fitting, the small diameter plug 49
is elastically contracted, and after connection, the small diameter plug 49 is pressed against the inner surface of the proximal end portion 10a of the central conductor main body 24. Thus, the outer conductor 11 connects to the mesh wire 41 of the coaxial cable 5 via the large diameter plug 46 and the attachment portion 45, and the center conductor 10 connects to the core wire 40 of the coaxial cable 5 via the small diameter plug 49 and the protrusion 51.
are connected to each.
接続プラグ金具44により構成されるコネクタ
6は、第1図に示すようにコネクタ保持板4に取
りつけられ、第2図に示す所定位置にまで接触プ
ローブPを支持板3の挿通孔17に挿入すると、
その下方に位置している接続プラグ金具44に対
し接触プローブPが接続される。なお、コネクタ
6は図示のような構造のため、接触プローブPと
同じ程度の径を有するものにすることができ、コ
ネクタ6が接触プローブPより太くなることがな
いため、接触プローブ装着密度を大きくすること
ができる。 The connector 6 constituted by the connection plug fitting 44 is attached to the connector holding plate 4 as shown in FIG. 1, and when the contact probe P is inserted into the insertion hole 17 of the support plate 3 to the predetermined position shown in FIG. ,
A contact probe P is connected to a connection plug fitting 44 located below it. Since the connector 6 has a structure as shown in the figure, it can be made to have the same diameter as the contact probe P, and since the connector 6 is not thicker than the contact probe P, the contact probe mounting density can be increased. can do.
以上のようにして構成された本発明の回路基板
等の検査装置は、その接触プローブ支持板3およ
びコネクタ保持板4を、支承フレーム2に取り付
けられた回路基板Bの回路パターンに向かつて相
対的に上昇させることにより検査を行なうもので
あり、各接触プローブPの中心導体10および外
部導体11の先端にある先端ピン25および先端
可動部20が回路パターンの所定点に背後のばね
27および21の力により圧接され、電気的接続
状態が得られる。そして、各接触プローブP、コ
ネクタ6および同軸ケーブル5を経て図示しない
測定器に信号が送られ、測定検査が行なわれる。 The inspection device for circuit boards, etc. of the present invention configured as described above has the contact probe support plate 3 and the connector holding plate 4 relatively facing toward the circuit pattern of the circuit board B attached to the support frame 2. The tip pin 25 and the tip movable part 20 at the tips of the center conductor 10 and outer conductor 11 of each contact probe P touch the springs 27 and 21 at a predetermined point of the circuit pattern. They are pressed together by force and an electrical connection is established. Then, a signal is sent to a measuring device (not shown) via each contact probe P, connector 6, and coaxial cable 5, and a measurement test is performed.
この際、接触プローブの中心導体10と外部導
体11の間が絶縁体12により満たされているの
でインピーダンスの変化が生じることがなく、測
定システムから被測定物までのインピーダンスの
乱れもなく信号を送ることができる。また、中心
導体10および外部導体11とも可動接触子とし
ての先端ピン25および先端可動部20を有して
いるので、接触プローブPの装着密度が向上す
る。 At this time, since the space between the center conductor 10 and the outer conductor 11 of the contact probe is filled with the insulator 12, no change in impedance occurs, and the signal is sent from the measurement system to the object to be measured without disturbance in impedance. be able to. Moreover, since both the center conductor 10 and the outer conductor 11 have the tip pin 25 and the tip movable part 20 as movable contacts, the mounting density of the contact probes P is improved.
なお、接触プローブPが細径のものである場合
には、外筒14を省略し、外部導体11の一部に
内側から外側に打ち出された突起を形成し、この
突起を支持板3の挿通孔17の内面に摩擦接触さ
せることにより接触プローブPの支持板3への装
着を行なつてもよい。 In addition, when the contact probe P has a small diameter, the outer cylinder 14 is omitted, and a protrusion is formed on a part of the outer conductor 11 from the inside to the outside, and the support plate 3 is inserted through this protrusion. The contact probe P may be attached to the support plate 3 by making frictional contact with the inner surface of the hole 17.
外部導体11の側はアース側であり、アースは
外部導体11から図示しない導体を介してとるこ
ともできる。 The side of the outer conductor 11 is the ground side, and the ground can also be connected from the outer conductor 11 via a conductor (not shown).
本発明の原理は、第2図に示すように先端部に
先端可動部20および先端ピン25を有し、基端
部がコネクタ6に接続される形式の同軸型可動接
触プローブPのみではなく、第6図に示すように
接触プローブPの基端部も先端側と同じ構造を有
し、基端可動部20′および基端ピン25′をもつ
形式の接触プローブにも適用することができる。 The principle of the present invention is based not only on a coaxial type movable contact probe P having a tip movable part 20 and a tip pin 25 at the distal end and whose base end is connected to a connector 6 as shown in FIG. As shown in FIG. 6, the proximal end of the contact probe P has the same structure as the distal end, and can also be applied to contact probes having a proximal movable portion 20' and a proximal pin 25'.
この実施例でも、中心導体10の主体24は、
第2図について説明したと同様に、絶縁筒12の
貫通孔13内に挿脱自在に挿入され、摩擦により
保持され、位置決め手段30により位置決めされ
る。また、外筒14は支持板3の挿通孔17内に
摩擦により保持される。 In this embodiment as well, the main body 24 of the center conductor 10 is
As described with reference to FIG. 2, it is removably inserted into the through hole 13 of the insulating cylinder 12, held by friction, and positioned by the positioning means 30. Further, the outer cylinder 14 is held within the insertion hole 17 of the support plate 3 by friction.
第6図に示す形式の接触プローブは、第7図に
示すようなコネクタ6′により同軸ケーブル5に
接続することができる。同軸ケーブル5は、第4
図の場合と同様に、芯線40、網線41、絶縁体
42、外被43を有し、外被43は先端側で剥離
されて網線41が露出される。露出した網線41
の外周には筒状導体70が絞りかしめ部71によ
り取り付けられる。一方、筒状導体70の内側に
は絶縁体73を介して芯導体74がはめ込まれて
おり、この芯導体74の中央孔内に芯線40の先
端部が挿入され、その先端がはんだ付け75され
る。また、筒状導体70、芯導体74および絶縁
体73の先端面は同じ平面に形成される。そし
て、以上のようなコネクタ6′の筒状導体70は
コネクタ保持板4の孔に圧入により装着され、そ
の段部76により位置決めされる。 A contact probe of the type shown in FIG. 6 can be connected to the coaxial cable 5 by a connector 6' as shown in FIG. The coaxial cable 5 is the fourth
As in the case shown in the figure, it has a core wire 40, a mesh wire 41, an insulator 42, and an outer sheath 43, and the outer sheath 43 is peeled off at the tip side to expose the mesh wire 41. Exposed mesh wire 41
A cylindrical conductor 70 is attached to the outer periphery of the cylindrical conductor 70 by a constriction caulking portion 71. On the other hand, a core conductor 74 is fitted inside the cylindrical conductor 70 via an insulator 73, and the tip of the core wire 40 is inserted into the center hole of the core conductor 74, and the tip is soldered 75. Ru. Furthermore, the tip surfaces of the cylindrical conductor 70, core conductor 74, and insulator 73 are formed on the same plane. The cylindrical conductor 70 of the connector 6' as described above is press-fitted into the hole of the connector holding plate 4 and positioned by the stepped portion 76 thereof.
このような構成により、支持板3の挿通孔17
に接触プローブPを装着すると、第7図に示すよ
うに基端ピン25′および基端可動部20′はそれ
らの背後のばね27および21を圧縮して幾分か
後退し、それぞれ芯導体74および筒状導体70
の表面に圧接されて電気的接続状態が得られる。 With such a configuration, the insertion hole 17 of the support plate 3
When the contact probe P is attached to the base conductor 74, the base pin 25' and the base movable part 20' compress the springs 27 and 21 behind them and retreat somewhat, as shown in FIG. and cylindrical conductor 70
An electrical connection is established by press-welding the surface of the
この実施例もさきに述べた実施例と同様な効果
を有することは明らかである。 It is clear that this embodiment also has the same effects as the previously described embodiment.
なお、本発明は回路基板のみならず、それと類
似のものの測定、検査にも利用できるものであ
り、また接触プローブPの上下方向の向きは逆で
あつてもよい。 Note that the present invention can be used not only for circuit boards but also for measuring and inspecting similar items, and the vertical direction of the contact probe P may be reversed.
以上に述べたように、本発明では、同軸型可動
接触プローブの中心導体はその特有の構造によ
り、簡単に挿入、取り外しを行なうことができ、
故障、破損時におけるその交換が容易になる。ま
た、その挿入時の位置決めも瞬時に行なうことが
でき、挿入後はみだりに脱出することがない。
As described above, in the present invention, the center conductor of the coaxial movable contact probe can be easily inserted and removed due to its unique structure.
It becomes easy to replace it in the event of failure or damage. In addition, positioning during insertion can be done instantaneously, and the device will not come out unnecessarily after insertion.
また、併合発明によれば、同軸型可動接触プロ
ーブ全体の支持板への装着を確実かつ簡単に行な
うことができ、構造的にも安価なものが得られ
る。 Further, according to the combined invention, the entire coaxial movable contact probe can be reliably and easily mounted on the support plate, and the probe can be structurally inexpensive.
第1図は本発明の回路基板等の検査装置の正面
図、第2図は第1図の同軸型可動接触プローブの
部分の拡大縦断面図、第3図は第2図の−線
断面図、第4図は第2図に示す接触プローブの基
端部に接続されるコネクタの詳細を示す縦断面
図、第5図は第4図に示すコネクタの接続プラグ
金具のみの拡大縦断面図、第6図は異なる形式の
同軸型可動接触プローブの部分を示す第2図と同
様な拡大縦断面図、第7図は第6図の接触プロー
ブの基端部に接続されるコネクタを示す縦断面図
である。
2……回路基板支承フレーム、3……接触プロ
ーブ支持板、4……コネクタ保持板、6,6′…
…コネクタ、5……同軸ケーブル、B……回路基
板、P……同軸型可動接触プローブ、10……中
心導体、11……外部導体、12……絶縁筒、1
3……貫通孔、14……外筒、19……凹入部、
17……挿通孔、20……外部導体先端可動部、
20′……基端可動部、21……コイルばね、2
4……中心導体主体、25……先端ピン、25′
……基端ピン、30……位置決め手段、40……
芯線、41……網線、43……外被、44……接
続プラグ金具、45……取付け部、46……大径
プラグ、49……小径プラグ、50……突出部、
51……絶縁部材、54……絞りかしめ部、55
……はんだ付け部、70……筒状導体、73……
絶縁体、74……芯導体、75……はんだ付け
部。
FIG. 1 is a front view of the inspection apparatus for circuit boards, etc. of the present invention, FIG. 2 is an enlarged longitudinal cross-sectional view of the coaxial movable contact probe portion of FIG. 1, and FIG. 3 is a cross-sectional view taken along the line -- in FIG. , FIG. 4 is a vertical cross-sectional view showing details of the connector connected to the proximal end of the contact probe shown in FIG. 2, FIG. 5 is an enlarged vertical cross-sectional view of only the connecting plug fitting of the connector shown in FIG. 4, Fig. 6 is an enlarged vertical cross-sectional view similar to Fig. 2 showing a portion of a different type of coaxial movable contact probe, and Fig. 7 is a vertical cross-sectional view showing a connector connected to the proximal end of the contact probe of Fig. 6. It is a diagram. 2... Circuit board support frame, 3... Contact probe support plate, 4... Connector holding plate, 6, 6'...
... Connector, 5 ... Coaxial cable, B ... Circuit board, P ... Coaxial type movable contact probe, 10 ... Center conductor, 11 ... Outer conductor, 12 ... Insulation tube, 1
3...Through hole, 14...Outer cylinder, 19...Recessed part,
17... Insertion hole, 20... External conductor tip movable part,
20'... Base end movable part, 21... Coil spring, 2
4...Center conductor main body, 25...Tip pin, 25'
... Base end pin, 30 ... Positioning means, 40 ...
Core wire, 41...Mesh wire, 43...Outer cover, 44...Connection plug fitting, 45...Mounting part, 46...Large diameter plug, 49...Small diameter plug, 50...Protrusion part,
51... Insulating member, 54... Squeezing caulking part, 55
... Soldering part, 70 ... Cylindrical conductor, 73 ...
Insulator, 74... Core conductor, 75... Soldering part.
Claims (1)
自在に設けられた支持板に、筒状の外部導体の内
部に中心導体を絶縁状態で設けた同軸型可動接触
プローブを回路基板に向かつて貫通状態で支持
し、支持板の回路基板に対する相対移動により接
触プローブの先端を回路基板の検査点に接触させ
て電気的な測定検査を行なう回路基板等の検査装
置であつて、接触プローブの外部導体の内側に、
中心部に中心導体挿入用の貫通孔を有する絶縁筒
を固定し、中心導体は、筒状の主体と主体の先端
部にばね力に抗して後退自在に支持した先端ピン
とにより構成し、中心導体の主体を絶縁筒の貫通
孔内に挿脱自在に摩擦的に挿入支持し、貫通孔内
への中心導体主体の挿入位置決め手段をさらに設
けてなる回路基板等の検査装置。 2 挿入位置決め手段を、中心導体主体の先端部
に設けられ、絶縁筒の端面に当接するフランジに
より構成してなる特許請求の範囲第1項記載の回
路基板等の検査装置。 3 検査すべき回路基板に対向して相対的に移動
自在に設けられた支持板に、筒状の外部導体の内
部に中心導体を絶縁状態で設けた同軸型可動接触
プローブを回路基板に向かつて貫通状態で支持
し、支持板の回路基板に対する相対移動により接
触プローブの先端を回路基板の検査点に接触させ
て電気的な測定検査を行なう回路基板等の検査装
置であつて、接触プローブの外部導体の内側に、
中心部に中心導体挿入用の貫通孔を有する絶縁筒
を固定し、中心導体は、筒状の主体と主体の先端
部にばね力に抗して後退自在に支持した先端ピン
とにより構成し、中心導体の主体を絶縁筒の貫通
孔内に挿脱自在に摩擦的に挿入支持し、貫通孔内
への中心導体主体の挿入位置決め手段をさらに設
け、接触プローブの外部導体の外側に外筒を一体
的にはめ、この外筒の外周面に突出部を設け、支
持板に貫設した接触プローブ挿通孔内に前記外筒
を、該挿通孔へ突出部が圧接されるようにして挿
入してなる回路基板等の検査装置。 4 外筒の少なくとも先端側端部とその内側の外
部導体との間に環状空間が形成されるように外筒
を形成し、その環状空間内に外側導体の先端可動
部の基端を挿入し、環状空間内に挿入したばねに
抗して先端可動部が後退自在となるようにしてな
る特許請求の範囲第3項記載の回路基板等の検査
装置。[Scope of Claims] 1. A coaxial movable contact probe in which a central conductor is provided in an insulated state inside a cylindrical outer conductor on a supporting plate that is relatively movably provided facing a circuit board to be inspected. This is an inspection device for circuit boards, etc., in which the contact probe is supported in a penetrating state toward the circuit board, and the tip of the contact probe is brought into contact with the test point on the circuit board by moving the support plate relative to the circuit board to conduct electrical measurement tests. inside the outer conductor of the contact probe.
An insulating tube having a through hole for inserting the center conductor is fixed in the center, and the center conductor is composed of a cylindrical main body and a tip pin supported at the tip of the main body so as to be able to move back against the spring force. An inspection device for a circuit board, etc., which frictionally inserts and supports a conductor main body in a through-hole of an insulating cylinder so that it can be freely inserted and removed, and further includes means for inserting and positioning the center conductor main body into the through-hole. 2. The inspection device for circuit boards, etc. according to claim 1, wherein the insertion positioning means is constituted by a flange provided at the tip of the center conductor main body and abutting the end surface of the insulating tube. 3. A coaxial type movable contact probe, which has a central conductor insulated inside a cylindrical outer conductor, is mounted on a support plate that is relatively movable facing the circuit board to be inspected, and is placed toward the circuit board. An inspection device for circuit boards, etc. that performs electrical measurement and inspection by supporting the contact probe in a penetrating state and bringing the tip of the contact probe into contact with the test point on the circuit board by moving the support plate relative to the circuit board. inside the conductor,
An insulating tube having a through hole for inserting the center conductor is fixed in the center, and the center conductor is composed of a cylindrical main body and a tip pin supported at the tip of the main body so as to be able to move back against the spring force. The main body of the conductor is frictionally inserted and supported in a removable manner into the through-hole of the insulating tube, and means for positioning the center conductor body into the through-hole is further provided, and the outer tube is integrated on the outside of the outer conductor of the contact probe. A protrusion is provided on the outer peripheral surface of the outer cylinder, and the outer cylinder is inserted into a contact probe insertion hole provided through the support plate such that the protrusion is pressed into the insertion hole. Inspection equipment for circuit boards, etc. 4. Form the outer cylinder so that an annular space is formed between at least the distal end of the outer cylinder and the outer conductor inside the outer cylinder, and insert the proximal end of the movable tip part of the outer conductor into the annular space. An inspection device for circuit boards, etc., according to claim 3, wherein the distal end movable portion is freely retractable against a spring inserted into the annular space.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1476084A JPS60158357A (en) | 1984-01-30 | 1984-01-30 | Inspecting equipment for circuit board or the like |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1476084A JPS60158357A (en) | 1984-01-30 | 1984-01-30 | Inspecting equipment for circuit board or the like |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60158357A JPS60158357A (en) | 1985-08-19 |
| JPH0146829B2 true JPH0146829B2 (en) | 1989-10-11 |
Family
ID=11870035
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1476084A Granted JPS60158357A (en) | 1984-01-30 | 1984-01-30 | Inspecting equipment for circuit board or the like |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60158357A (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6265562U (en) * | 1985-10-15 | 1987-04-23 | ||
| US4801876A (en) * | 1986-04-18 | 1989-01-31 | Sagami Tsushin Kogyo Kabushiki Kaisha | Printed wiring board tester |
| JPH02115175U (en) * | 1989-03-03 | 1990-09-14 | ||
| JP5375516B2 (en) * | 2009-10-23 | 2013-12-25 | 日本電産リード株式会社 | Contact |
| JP6272125B2 (en) | 2014-04-24 | 2018-01-31 | 富士通コンポーネント株式会社 | connector |
-
1984
- 1984-01-30 JP JP1476084A patent/JPS60158357A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60158357A (en) | 1985-08-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |