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JPH0213244B2 - - Google Patents
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JPH0213244B2 - - Google Patents

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Publication number
JPH0213244B2
JPH0213244B2 JP9236679A JP9236679A JPH0213244B2 JP H0213244 B2 JPH0213244 B2 JP H0213244B2 JP 9236679 A JP9236679 A JP 9236679A JP 9236679 A JP9236679 A JP 9236679A JP H0213244 B2 JPH0213244 B2 JP H0213244B2
Authority
JP
Japan
Prior art keywords
magnetized body
magnetic field
magnetic
magnetized
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9236679A
Other languages
Japanese (ja)
Other versions
JPS5616801A (en
Inventor
Shuhei Tsuchimoto
Tetsuo Muramatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP9236679A priority Critical patent/JPS5616801A/en
Publication of JPS5616801A publication Critical patent/JPS5616801A/en
Publication of JPH0213244B2 publication Critical patent/JPH0213244B2/ja
Granted legal-status Critical Current

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)

Description

【発明の詳細な説明】 本発明は着磁体の漏洩磁場を検出することによ
つて位置情報を検出する磁気スケールに関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a magnetic scale that detects position information by detecting a leakage magnetic field of a magnetized body.

従来磁気スケールの構造としては、磁性体をカ
ツテイングすることによつて形成した複数の永久
磁石(着磁体)を所定個所に配置してなる被検出
体と、該被検出体の永久磁石から発せられる漏洩
磁場を検出する電磁誘導型バルク磁気ヘツドとを
組み合わせてなるものがあつた。この構造の従来
磁気スケールは着磁体と磁気ヘツドの相対位置の
変化に応じた検出出力(dφ/dt)を得るもので
ある。
Conventional magnetic scales have a structure in which a plurality of permanent magnets (magnetized bodies) formed by cutting a magnetic material are arranged at predetermined locations, and a detection object is formed by cutting the magnetic material. There was one that was combined with an electromagnetic induction type bulk magnetic head that detects leakage magnetic fields. A conventional magnetic scale with this structure obtains a detection output (dφ/dt) according to a change in the relative position between the magnetized body and the magnetic head.

しかし、以上の従来磁気スケールの構造では
個々の着磁体の大きさが比較的大きいもの、つま
りそれ程測定精度が要求されないものならばとも
かく、夫々の着磁体の大きさを小さくして(例え
ば数十μmのオーダ)精度の高い磁気スケールを
得るには適合しなかつた。
However, in the structure of the conventional magnetic scale described above, if the size of each magnetized body is relatively large, that is, if high measurement accuracy is not required, the size of each magnetized body is made small (for example, several dozen scales). It was not suitable for obtaining a highly accurate magnetic scale (on the order of μm).

本発明は以上の従来欠点を解消すべくなされた
ものであり、精度の高い判定が可能な磁気スケー
ルを提供することを目的とする。
The present invention has been made in order to eliminate the above-mentioned conventional drawbacks, and an object of the present invention is to provide a magnetic scale capable of making highly accurate judgments.

以下、本発明を実施例に従つて図面を参照しな
がら詳説する。
Hereinafter, the present invention will be explained in detail according to embodiments with reference to the drawings.

第1図は本発明の1実施例を示す磁気スケール
の斜視図である。
FIG. 1 is a perspective view of a magnetic scale showing one embodiment of the present invention.

3は基板であり、該基板3上にフオトリソグラ
フイによりパターン化された着磁体1が等間隔に
並設される。上記フオトリソグラフイによるパタ
ーン形成技術は、半導体集積回路の製造工程で用
いられるもので、フオトマスク基板のパターンを
光を用いて基板に転写する技術をいう。ここで
は、上記半導体集積回路の製造における技術を用
いて上記着磁体1のパターンを形成したものであ
る。上記フオトリソグラフイによるパターン形成
技術によれば着磁体1は数十μmのオーダの形状
にすることができ、そのパターン位置精度を極め
て高くすることができる。尚、磁性体の薄膜パタ
ーンを形成した後に外部の強磁界の印加を行なつ
て一斉に着磁を行えば所定の着磁体パターンを精
度良く得ることができる。
Reference numeral 3 denotes a substrate, on which magnetized bodies 1 patterned by photolithography are arranged in parallel at equal intervals. The pattern forming technique using photolithography is used in the manufacturing process of semiconductor integrated circuits, and refers to a technique in which a pattern on a photomask substrate is transferred onto a substrate using light. Here, the pattern of the magnetized body 1 is formed using the technique used in manufacturing the semiconductor integrated circuit. According to the above pattern forming technique using photolithography, the magnetized body 1 can be formed into a shape on the order of several tens of micrometers, and the pattern position accuracy can be extremely high. Incidentally, if a strong external magnetic field is applied after forming the thin film pattern of the magnetic material and magnetization is performed all at once, a predetermined pattern of the magnetized material can be obtained with high accuracy.

上記着磁体1と対向する位置にMR素子(磁気
抵抗効果素子)2が配置され着磁体1から生じる
y方向の漏洩磁場をMR素子2がx方向に移動す
ることによつて検出する。尚、着磁体1の磁化方
向は図中に矢印で示すx方向である。
An MR element (magnetoresistive effect element) 2 is arranged at a position facing the magnetized body 1, and detects the leakage magnetic field in the y direction generated from the magnetized body 1 by moving the MR element 2 in the x direction. Note that the magnetization direction of the magnetized body 1 is the x direction indicated by the arrow in the figure.

第2図は着磁体1の配列パターンである。着磁
体1の繰り返しパターンを平行に着磁体1の端か
ら4分の1ずらした繰り返しパターン4を配列す
る。
FIG. 2 shows the arrangement pattern of the magnetized bodies 1. A repeating pattern 4 is arranged in parallel with the repeating pattern of the magnetized body 1 shifted by one quarter from the end of the magnetized body 1.

着磁体1の繰り返しパターン4からのy方向の
漏洩磁場はそれぞれ第3図に示す磁界分布曲線
6,8の如く4分の1ずれた同一周期になる。こ
の磁界変化を各々2個のMR素子で読み取り、基
準からの位置を検出する。MR素子の特体として
第4図に示す2つのタイプがある。第4図Aは外
部信号磁界9が正負に変化しても検出信号10は
常に負の方向にのみ変化するMR素子であり、第
4図Bは外部信号磁界が零でも予めMR素子2に
バイアス磁界が印加されている為、外部磁界11
が正負に変化するとき、検出信号も正負に変化す
るものである。第4図A,Bの特性をもついずれ
のMR素子を利用しても本実施例の磁気スケール
を実現できるが、検出信号の安定性、大きさから
考えて第4図Bの特性をもつMR素子が有効であ
る。
The leakage magnetic fields in the y direction from the repeating pattern 4 of the magnetized body 1 have the same period shifted by one quarter, as shown in the magnetic field distribution curves 6 and 8 shown in FIG. 3, respectively. This magnetic field change is read by two MR elements, and the position from the reference is detected. There are two types of MR elements shown in FIG. Fig. 4A shows an MR element in which the detection signal 10 always changes only in the negative direction even if the external signal magnetic field 9 changes to positive or negative, and Fig. 4B shows the MR element 2 biased in advance even when the external signal magnetic field is zero. Since a magnetic field is applied, the external magnetic field 11
When changes to positive or negative, the detection signal also changes to positive or negative. Although the magnetic scale of this embodiment can be realized by using any of the MR elements having the characteristics shown in FIG. 4A and B, the MR element having the characteristics shown in FIG. element is valid.

第5図は本発明の磁気スケールに係る制御回路
の1実施例を示すブロツク回路図である。
FIG. 5 is a block circuit diagram showing one embodiment of a control circuit relating to the magnetic scale of the present invention.

定電流電源5―1よりMR素子5―a,5―
b,5―cに定電流が供給される。MR素子5―
cは漏洩磁場の検出器5―a,5―bと温度補償
を行う役目をしており、MR素子5―cに対する
検出器5―a,5―bの差動を増幅回路5―3で
増幅している。増幅回路5―3からの増幅信号は
波形整形回路5−4で波形整形される。検出器5
―a,―bからの検出信号を各々波形整形した信
号を第3図に磁界分布曲線5,7として示す。磁
界分布曲線5,7として示された信号を用いて分
周回路5―5で精度を向上させるために分周を行
う。また、磁界分布曲線5,7の信号を結合回路
5―7で結合し、アツプダウンカウンタ5―8へ
入力してスケールの読み取り信号を表示する。ま
た、着磁体1,4を等角度に配列することによ
り、全く同様にして角度読み出しも可能となる。
MR elements 5-a, 5- from constant current power supply 5-1
A constant current is supplied to b and 5-c. MR element 5-
c has the role of temperature compensation with the leakage magnetic field detectors 5-a and 5-b, and the differential between the detectors 5-a and 5-b with respect to the MR element 5-c is generated by the amplifier circuit 5-3. It's amplified. The amplified signal from the amplifier circuit 5-3 is waveform-shaped by a waveform shaping circuit 5-4. Detector 5
Signals obtained by shaping the detection signals from -a and -b, respectively, are shown as magnetic field distribution curves 5 and 7 in FIG. Using the signals shown as the magnetic field distribution curves 5 and 7, a frequency dividing circuit 5-5 performs frequency division to improve accuracy. Further, the signals of the magnetic field distribution curves 5 and 7 are combined by a combination circuit 5-7 and inputted to an up-down counter 5-8 to display a read signal of the scale. Further, by arranging the magnetized bodies 1 and 4 at equal angles, it is possible to read out the angle in exactly the same way.

以上詳細に説明した本発明によれば、着磁体は
そのパターンがフオトリソグラフイによつて数十
μmのオーダ程度に微細に形成されているので、
スケールの検出位置精度は極めて優れたものであ
る。又、着磁体からの漏洩磁場の検出に磁気抵抗
効果素子を用いているので微細な(数十μmのオ
ーダの)パターンの着磁体の動きに対しても充分
に追随して検出できるものである。又、上記磁気
抵抗効果素子は従来の一般の電磁誘導型のヘツド
の如く磁束の変化によつて初めて電圧が発生する
ものでなく、たとえ磁束の変化が無くとも(着磁
体が静止状態)磁気的な信号検出が可能な磁束応
答型であるので、磁束の変化が少ない場合、つま
り着磁体と検出器との間の相対速度が非常に遅い
場合でも充分対応が可能である為磁気スケールの
性質向上に大きく貢献できるものである。
According to the present invention described in detail above, since the pattern of the magnetized body is formed finely on the order of several tens of μm by photolithography,
The detection position accuracy of the scale is extremely excellent. In addition, since a magnetoresistive element is used to detect the leakage magnetic field from the magnetized body, it is possible to sufficiently follow and detect the movement of the magnetized body in minute patterns (on the order of several tens of micrometers). . In addition, the magnetoresistive element described above does not generate a voltage for the first time due to a change in magnetic flux, unlike conventional general electromagnetic induction heads, and even if there is no change in magnetic flux (the magnetized body is in a stationary state), a magnetic Since it is a magnetic flux response type that can detect signals, it can sufficiently handle cases where there are small changes in magnetic flux, that is, when the relative speed between the magnetized object and the detector is very slow, improving the properties of the magnetic scale. It can greatly contribute to

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明のパターン化された着磁体と信
号検出器の配置関係を示す斜視図である。第2図
は等間隔にパターン化された着磁体の端をずらし
平行に2列に配列した例を示す配置図である。第
3図は、第2図に示す着磁体のy方向の磁界分布
及び検出器で検出した後増幅,波形整形した信号
例を示す説明図である。第4図A,Bは薄膜磁気
効果素子の特性を示す特性図である。第5図は本
発明に係る磁気スケールの制御回路例を示すブロ
ツク回路図である。 1…着磁体、2…MR素子、3…基板、4…着
磁体の配列パターン。
FIG. 1 is a perspective view showing the arrangement relationship between a patterned magnetized body and a signal detector according to the present invention. FIG. 2 is an arrangement diagram showing an example in which the ends of magnetized bodies patterned at equal intervals are shifted and arranged in two parallel rows. FIG. 3 is an explanatory diagram showing the magnetic field distribution in the y direction of the magnetized body shown in FIG. 2 and an example of a signal detected by a detector and then amplified and waveform-shaped. FIGS. 4A and 4B are characteristic diagrams showing the characteristics of the thin film magnetic effect element. FIG. 5 is a block circuit diagram showing an example of a control circuit for a magnetic scale according to the present invention. 1... Magnetized body, 2... MR element, 3... Substrate, 4... Arrangement pattern of magnetized body.

Claims (1)

【特許請求の範囲】[Claims] 1 基板上においてフオトリソグラフイにより数
十μmのオーダの微細形状パターンに形成された
着磁体と、該着磁体からの漏洩磁場を検出する検
出器と、該検出器よりの出力を信号処理する制御
回路部と、を具備し、前記検出器を一軸異方性を
有する強磁性体薄膜からなる磁気抵抗効果素子で
構成し、前記着磁体からの漏洩磁場を検出するこ
とによつて基準値からの位置を測定するように構
成したことを特徴とする磁気スケール。
1. A magnetized body formed into a microscopic pattern on the order of tens of micrometers by photolithography on a substrate, a detector that detects the leakage magnetic field from the magnetized body, and a control that performs signal processing on the output from the detector. a circuit section, the detector is configured with a magnetoresistive element made of a ferromagnetic thin film having uniaxial anisotropy, and the leakage magnetic field from the magnetized body is detected to detect a deviation from the reference value. A magnetic scale configured to measure position.
JP9236679A 1979-07-19 1979-07-19 Magnetic scale Granted JPS5616801A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9236679A JPS5616801A (en) 1979-07-19 1979-07-19 Magnetic scale

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9236679A JPS5616801A (en) 1979-07-19 1979-07-19 Magnetic scale

Publications (2)

Publication Number Publication Date
JPS5616801A JPS5616801A (en) 1981-02-18
JPH0213244B2 true JPH0213244B2 (en) 1990-04-03

Family

ID=14052410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9236679A Granted JPS5616801A (en) 1979-07-19 1979-07-19 Magnetic scale

Country Status (1)

Country Link
JP (1) JPS5616801A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57189010A (en) 1981-05-15 1982-11-20 Fuji Heavy Ind Ltd Position detecting mechanism
JPS60170702A (en) * 1984-02-16 1985-09-04 S G:Kk Linear position detector and manufacture of rod part of detector
DE3447325A1 (en) * 1984-12-24 1986-06-26 Standard Elektrik Lorenz Ag POSITION SENSOR
JP2781526B2 (en) * 1994-11-28 1998-07-30 シーケーディ株式会社 Air operated valve
DE102007049741B4 (en) * 2007-10-16 2011-07-28 Micromotion GmbH, 55124 Magnetic scale carrier

Also Published As

Publication number Publication date
JPS5616801A (en) 1981-02-18

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