JPH021341B2 - - Google Patents
Info
- Publication number
- JPH021341B2 JPH021341B2 JP57081964A JP8196482A JPH021341B2 JP H021341 B2 JPH021341 B2 JP H021341B2 JP 57081964 A JP57081964 A JP 57081964A JP 8196482 A JP8196482 A JP 8196482A JP H021341 B2 JPH021341 B2 JP H021341B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- focusing
- electron beam
- grid electrode
- grid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/50—Electron guns two or more guns in a single vacuum space, e.g. for plural-ray tube
- H01J29/503—Three or more guns, the axes of which lay in a common plane
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2229/00—Details of cathode ray tubes or electron beam tubes
- H01J2229/48—Electron guns
- H01J2229/4834—Electrical arrangements coupled to electrodes, e.g. potentials
- H01J2229/4837—Electrical arrangements coupled to electrodes, e.g. potentials characterised by the potentials applied
- H01J2229/4841—Dynamic potentials
Description
【発明の詳細な説明】
本発明は、陰極線管装置に関し、蛍光体スクリ
ーン面上の全域において良好な解像度が得られる
ように構成したものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a cathode ray tube device, which is constructed so that good resolution can be obtained over the entire area on the phosphor screen surface.
一般に、陰極線管装置の解像度は、蛍光体スク
リーン面上に生じるビームスポツト(輝点)の大
きさおよび形状に依存し、高い解像度を得るため
には、ビームスポツトはできるだけ小さくかつ歪
みのないことが重要である。また、カラー陰極線
管装置では、3電子ビームによるビームスポツト
が蛍光体スクリーン面上の任意の一点で正しく集
中することが解像度の面で重要であり、このこと
から、インライン形カラー陰極管を使用するもの
では、水平偏向磁界分布を第1図aに示すような
ピンクツシヨン状に、そして、垂直偏向磁界分布
を第1図bに示すようなバレル状にそれぞれ歪ま
せることによつて、3電子ビーム1,2,3を自
己集中(セルフコンバージエンス)させている。
しかし、このような自己集中方式を採用すると、
3電子ビームの集中性は良好となつても、3電子
ビームの断面形状がビーム偏向角の増大に伴つて
歪み、蛍光体スクリーン面上のとくに周辺部に現
われるビームスポツトに、第2図に示す傾向の歪
みを生じやすくなる。すなわち、蛍光体スクリー
ン面4の中央部に現われるビームスポツト5が真
円となるのに対し、周辺部に現われるビームスポ
ツト6は、水平方向に長い楕円状の高輝度コア部
7のほかに、垂直方向に長い低輝度ヘイズ部8が
付随するかたちとなり、とくにスクリーン周辺部
において高い解像度を得ることが困難になる。 In general, the resolution of a cathode ray tube device depends on the size and shape of the beam spot (bright spot) produced on the phosphor screen surface, and in order to obtain high resolution, the beam spot must be as small as possible and free of distortion. is important. In addition, in a color cathode ray tube device, it is important from the viewpoint of resolution that the beam spot of the three electron beams be correctly concentrated at any one point on the phosphor screen surface, and for this reason, an in-line type color cathode tube is used. By distorting the horizontal deflection magnetic field distribution into a pincushion shape as shown in Figure 1a and the vertical deflection magnetic field distribution into a barrel shape as shown in Figure 1b, three electron beams can be generated. , 2 and 3 are self-converging.
However, if we adopt this self-concentration method,
Even if the concentration of the 3-electron beam is good, the cross-sectional shape of the 3-electron beam is distorted as the beam deflection angle increases, resulting in beam spots that appear on the phosphor screen surface, especially at the periphery, as shown in Figure 2. Distortion of trends is likely to occur. That is, while the beam spot 5 appearing at the center of the phosphor screen surface 4 is a perfect circle, the beam spot 6 appearing at the periphery has a vertically long elliptical high-brightness core part 7 as well as a horizontally long elliptical high-brightness core part 7. A long low-luminance haze portion 8 accompanies the screen, making it difficult to obtain high resolution, especially at the periphery of the screen.
なお、前述のようなビームスポツト形状の歪み
は、自己集中方式における偏向ヨークが3電子ビ
ームに対して第1図a,bに示すような非斉−磁
界を与えることに原因し、偏向磁界内の電子ビー
ムは、電子銃内で付与された集束を水平方向にお
いて弱められ、垂直方向において強められること
になる。 The above-mentioned distortion of the beam spot shape is caused by the deflection yoke in the self-concentration method applying an asymmetric magnetic field to the three electron beams as shown in Figure 1 a and b. The electron beam given within the electron gun is weakened in the horizontal direction and strengthened in the vertical direction.
本発明は、前述のような従来の欠点を除去する
ためになされたもので、つぎに本発明の陰極線管
装置を図面に示した実施例とともに説明する。 The present invention has been made to eliminate the above-mentioned drawbacks of the conventional art. Next, a cathode ray tube device of the present invention will be described with reference to embodiments shown in the drawings.
第3図において、電子銃9は、水平一直線上に
配列された3個の陰極10′,10″,10、制
御格子電極11、加速電極系12、前段集束電極
系13および後段集束電極系14を有し、前段集
束系13は、電子ビーム通路に沿つて順次に配列
された第1、第2および第3の格子電極15,1
6,17からなり、第1の格子電極15は加速電
極系12の最終電極板とともに箱形に形成されて
いる。第4図に示すように、第1および第3の格
子電極15,17は、各3個の円形の電子ビーム
通過孔18′,18″,18;19′,19″,1
9を有し、第2の格子電極16は垂直方向に長
い(以下縦長という)矩形状の電子ビーム通過孔
20′,20″,20を有している。そして、第
1および第3の格子電極15,17には一定の集
束電圧Vfocが与えられ、第2の格子電極16に
は、ビーム偏向量に応じて変化するダイナミツク
電圧V′fpcが与えられる。 In FIG. 3, the electron gun 9 includes three cathodes 10', 10'', 10 arranged horizontally in a straight line, a control grid electrode 11, an accelerating electrode system 12, a front-stage focusing electrode system 13, and a rear-stage focusing electrode system 14. The pre-focusing system 13 includes first, second and third grid electrodes 15, 1 arranged sequentially along the electron beam path.
6 and 17, the first grid electrode 15 is formed in a box shape together with the final electrode plate of the accelerating electrode system 12. As shown in FIG. 4, the first and third grid electrodes 15, 17 each have three circular electron beam passing holes 18', 18'', 18; 19', 19'', 1
9, and the second grid electrode 16 has vertically long (hereinafter referred to as vertically long) rectangular electron beam passing holes 20', 20'', 20. A constant focusing voltage Vfoc is applied to the electrodes 15 and 17, and a dynamic voltage V' fpc that changes depending on the amount of beam deflection is applied to the second grid electrode 16.
ダイナミツク電圧V′fpcは、第5図に実線21ま
たは一点鎖線22で示すように偏向電流23が零
のとき、つまり、ビームスポツトが蛍光体スクリ
ーン面の中央部に現われるとき、電圧Vfpcと同一
の値をとり、偏向電流の増減に伴つて電圧Vfpcか
ら徐々に下降または上昇する。したがつて、ビー
ムスポツトが蛍光体スクリーン面の中央部に現わ
れるとき、第1、第2および第3の格子電極1
5,16,17は同一電位Vfpcとなり、これらの
格子電極間にはレンズ電界が生成されず、第2の
格子電極16の電子ビーム通過孔20′,20″,
20が非円形であるにもかかわらず、電子ビー
ムに対して軸非対称電界が作用せず、スクリーン
面中央部において真円形のビームスポツトが得ら
れる。 The dynamic voltage V' fpc is the same as the voltage V fpc when the deflection current 23 is zero, as shown by the solid line 21 or the dashed-dotted line 22 in FIG. 5, that is, when the beam spot appears at the center of the phosphor screen surface. The voltage V fpc gradually decreases or increases as the deflection current increases or decreases. Therefore, when the beam spot appears in the center of the phosphor screen surface, the first, second and third grid electrodes 1
5, 16, and 17 have the same potential V fpc , no lens electric field is generated between these grid electrodes, and the electron beam passing holes 20', 20'', and
Although the electron beam 20 is non-circular, no axially asymmetric electric field acts on the electron beam, and a perfectly circular beam spot is obtained at the center of the screen surface.
一方、ビーム偏向量の増大に伴つて電圧V′fpcが
Vfpcから下降または上昇すると、一定の集束電圧
Vfpcが印加されている第1および第3の格子電極
15,17と第2の格子電極16との間にレンズ
電界が生成される。このレンズ電界は、第2の格
子電極16の電子ビーム通過孔20′,20″,2
0が軸非対称形であることから、ここを通過す
る3電子ビームはそれぞれ軸非対称性の集束作用
を受ける。第2の格子電格16の電子ビーム通過
孔20′,20″,20が、第4図に示すような
縦長矩形または縦長楕円形の場合、ここを通過す
る3電子ビームは、水平方向で強く垂直方向で弱
い集束作用を、レンズ24′,24″,24によ
り受ける。電子ビームは、さらに後段集束電極系
14で生成される軸対称の集束レンズ25′,2
5″,25により集束されるが、軸非対称のレ
ンズ24′,24″,24と軸対称の集束レンズ
25′,25″,25とを等価的に合成した3個
のレンズの一つは、第6図に合成レンズ26とし
て代表的に示すように水平方向で強く、垂直方向
で弱い軸非対称のレンズとなる。このため、電子
ビーム27が合成レンズ26を通過するとき、水
平方向で強く、垂直方向で弱い集束作用を受け、
垂直方向のフオーカス点28は水平方向のフオー
カス点29よりも遠い点に生じる。この現象は、
偏向磁界内での電子ビームが前述のようにビーム
偏向量の増大に伴い水平方向で弱く、垂直方向で
強く集束されるのを打ち消すように作用する。 On the other hand, as the amount of beam deflection increases, the voltage V′ fpc increases.
Constant focusing voltage as it falls or rises from V fpc
A lens electric field is generated between the first and third grid electrodes 15, 17 and the second grid electrode 16 to which V fpc is applied. This lens electric field is applied to the electron beam passing holes 20', 20'', 2 of the second grid electrode 16.
Since 0 is axially asymmetric, each of the three electron beams passing through it is subjected to an axially asymmetrical focusing effect. When the electron beam passing holes 20', 20'', and 20 of the second grid grid 16 are vertically rectangular or vertically elliptical as shown in FIG. 4, the three electron beams passing through them are strongly horizontally A weak focusing effect in the vertical direction is provided by lenses 24', 24'', 24. The electron beam is further passed through axially symmetrical focusing lenses 25' and 2 generated by the subsequent focusing electrode system 14.
5'', 25, one of the three lenses is an equivalent combination of axially asymmetrical lenses 24', 24'', 24 and axially symmetrical focusing lenses 25', 25'', 25. As shown in FIG. 6 as a composite lens 26, it is an axially asymmetric lens that is strong in the horizontal direction and weak in the vertical direction.Therefore, when the electron beam 27 passes through the composite lens 26, it is strong in the horizontal direction, It receives a weak focusing effect in the vertical direction,
The vertical focus point 28 occurs at a point farther away than the horizontal focus point 29. This phenomenon is
This acts to cancel out the fact that the electron beam within the deflection magnetic field is focused weakly in the horizontal direction and strongly focused in the vertical direction as the amount of beam deflection increases, as described above.
この結果、水平方向に大きく偏向された電子ビ
ームによるビームスポツトといえども、これを真
円に近づけることが可能となり、蛍光体スクリー
ン面のとくに左右両側および対角線上領域の解像
度が高められる。蛍光体スクリーン面の上部中間
付近に現われるビームスポツトの歪みはもともと
軽微であるから、蛍光体スクリーン面上の全域に
おいて非常に鮮明な再生画像を得ることができ
る。また、前記合成レンズのレンズ電界がビーム
偏向量の増大に伴つて変化するので、ダイナミツ
クフオーカス作用を併せ得ることができる。 As a result, even though the beam spot is caused by an electron beam that is largely deflected in the horizontal direction, it is possible to make the beam spot close to a perfect circle, and the resolution of the phosphor screen surface is improved, particularly on both left and right sides and on the diagonal. Since the distortion of the beam spot appearing near the upper middle of the phosphor screen surface is originally slight, a very clear reproduced image can be obtained over the entire area on the phosphor screen surface. Furthermore, since the lens electric field of the composite lens changes as the amount of beam deflection increases, a dynamic focus effect can also be obtained.
以上は、本発明をインライン形カラー陰極線管
装置に適用した実施例につき述べたが、本発明の
目的とするところは、非斉一偏向磁界内で偏向作
用を受けた電子ビームによるビームスポツトの形
状歪みを補正する点にあり、1ビームまたは2ビ
ームで動作する陰極線管装置にも前述と同様に適
用できる。 The above has described an embodiment in which the present invention is applied to an in-line color cathode ray tube device. However, the purpose of the present invention is to reduce shape distortion of a beam spot due to an electron beam subjected to a deflection action within a non-uniform deflection magnetic field. The present invention is applicable to cathode ray tube devices operating with one beam or two beams in the same manner as described above.
なお、本実施例では、前段集束レンズ系を構成
する第2の格子電極の電子ビーム通過孔を軸非対
称形状としたが、第1、第2および第3の格子電
極のいずれか一つの格子電極の電子ビーム通過孔
のみを軸非対称形状となし、その他の格子電極の
電子ビーム通過孔を円形となしても、前述と同様
のビームスポツト歪み補正効果を得ることができ
る。 In this example, the electron beam passing hole of the second grating electrode constituting the front-stage focusing lens system has an axially asymmetric shape. The same beam spot distortion correction effect as described above can be obtained even if only the electron beam passing holes in the grating electrode are made in an axially asymmetrical shape and the electron beam passing holes in the other grid electrodes are made circular.
第1図a,bは非斉一偏向磁界分布と3電子ビ
ームとの関係を示す図、第2図は自己集中方式を
採用したカラー陰極線管装置の蛍光体スクリーン
面上に現われるビームスポツトの形状歪みを模式
的に示す図、第3図は本発明を実施したインライ
ン形カラー陰極線管装置の電子銃部の側断面図、
第4図は同カラー陰極線管装置の前段集束電極系
の斜視図、第5図は偏向電流とダイナミツク電圧
との関係を示す信号波形図、第6図は前段集束レ
ンズと後段集束レンズとを合成した合成レンズに
よる電子ビームの集束状態を説明するための線図
である。
10′,10″,10……陰極、11……制御
格子電極、12……加速電極系、13……前段集
束電極系、14……後段集束電極系、15……第
1の格子電極、16……第2の格子電極、17…
…第3の格子電極、18′,18″,18,1
9′,19″,19,20′,20″,20……
電子ビーム通過孔、Vfpc……一定の集束電圧、
V′fpc……ダイナミツク電圧。
Figures 1a and b are diagrams showing the relationship between the non-uniform deflection magnetic field distribution and the three electron beams, and Figure 2 shows the shape distortion of the beam spot appearing on the phosphor screen surface of a color cathode ray tube device using the self-concentration method. FIG. 3 is a side sectional view of an electron gun section of an in-line color cathode ray tube device embodying the present invention;
Figure 4 is a perspective view of the front-stage focusing electrode system of the same color cathode ray tube device, Figure 5 is a signal waveform diagram showing the relationship between deflection current and dynamic voltage, and Figure 6 is a composite of the front-stage focusing lens and the rear-stage focusing lens. FIG. 3 is a diagram for explaining the focusing state of an electron beam by a synthetic lens. 10', 10'', 10... cathode, 11... control grid electrode, 12... accelerating electrode system, 13... front focusing electrode system, 14... rear focusing electrode system, 15... first grid electrode, 16... second grid electrode, 17...
...Third grid electrode, 18', 18'', 18, 1
9', 19'', 19, 20', 20'', 20...
Electron beam passage hole, V fpc ...constant focusing voltage,
V′ fpc ...dynamic voltage.
Claims (1)
格子電極とを備えてなるとともに、前記制御格子
電極に隣り合う加速電極系と後段集束電極系との
間に配設された前段集束電極系が、第1、第2お
よび第3の格子電極からなり、前記加速電極系の
最終電極板とともに箱形に形成された前記第1の
格子電極および前記第3の格子電極に一定の集束
電圧を印加し、前記第2の格子電極にはビーム偏
向量の増大に伴つて前記一定の集束電圧から徐々
に下降または上昇するダイナミツク電圧を印加
し、前記第1、第2および第3の格子電極のうち
の少なくとも一つが垂直方向に長い軸非対称形の
電子ビーム通過孔を有していることを特徴とする
陰極線管装置。1. A front-stage focusing electrode system comprising three cathodes arranged in a horizontal line and a control grid electrode, and disposed between an acceleration electrode system and a rear-stage focusing electrode system adjacent to the control grid electrode. is composed of first, second, and third grid electrodes, and applies a constant focusing voltage to the first grid electrode and the third grid electrode, which are formed in a box shape together with the final electrode plate of the accelerating electrode system. A dynamic voltage that gradually decreases or increases from the constant focusing voltage as the amount of beam deflection increases is applied to the second grid electrode, and A cathode ray tube device characterized in that at least one of the holes has an axis-asymmetric electron beam passage hole that is long in the vertical direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8196482A JPS58198832A (en) | 1982-05-14 | 1982-05-14 | Cathode-ray tube device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8196482A JPS58198832A (en) | 1982-05-14 | 1982-05-14 | Cathode-ray tube device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58198832A JPS58198832A (en) | 1983-11-18 |
| JPH021341B2 true JPH021341B2 (en) | 1990-01-11 |
Family
ID=13761183
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8196482A Granted JPS58198832A (en) | 1982-05-14 | 1982-05-14 | Cathode-ray tube device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58198832A (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6139347A (en) * | 1984-07-30 | 1986-02-25 | Matsushita Electronics Corp | Electromagnetic deflection type cathode-ray tube device |
| JPH0719541B2 (en) * | 1985-04-30 | 1995-03-06 | 株式会社日立製作所 | In-line color picture tube |
| NL8600117A (en) * | 1986-01-21 | 1987-08-17 | Philips Nv | COLOR IMAGE TUBE WITH REDUCED DEFLECTION DEFOCUSING. |
| JPS62237645A (en) * | 1986-04-08 | 1987-10-17 | Mitsubishi Electric Corp | Electron gun |
| JP2569027B2 (en) * | 1986-12-05 | 1997-01-08 | 株式会社日立製作所 | Electron gun for color picture tube |
| KR0147541B1 (en) * | 1989-12-31 | 1998-08-01 | 김정배 | Multi-collection type electron gun for cathode-ray tube |
| US5412277A (en) * | 1993-08-25 | 1995-05-02 | Chunghwa Picture Tubes, Ltd. | Dynamic off-axis defocusing correction for deflection lens CRT |
| JPH09190773A (en) * | 1996-01-08 | 1997-07-22 | Hitachi Ltd | Electron gun for cathode ray tube and cathode ray tube |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS563949A (en) * | 1979-06-22 | 1981-01-16 | Toshiba Corp | Color picture tube device |
| JPS5953656B2 (en) * | 1980-09-11 | 1984-12-26 | 松下電子工業株式会社 | cathode ray tube equipment |
-
1982
- 1982-05-14 JP JP8196482A patent/JPS58198832A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58198832A (en) | 1983-11-18 |
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