JPH0213938B2 - - Google Patents
Info
- Publication number
- JPH0213938B2 JPH0213938B2 JP59213798A JP21379884A JPH0213938B2 JP H0213938 B2 JPH0213938 B2 JP H0213938B2 JP 59213798 A JP59213798 A JP 59213798A JP 21379884 A JP21379884 A JP 21379884A JP H0213938 B2 JPH0213938 B2 JP H0213938B2
- Authority
- JP
- Japan
- Prior art keywords
- tio
- film
- type
- solar cell
- silicon substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/19—Photovoltaic cells having multiple potential barriers of different types, e.g. tandem cells having both PN and PIN junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Photovoltaic Devices (AREA)
Description
【発明の詳細な説明】
<技術分野>
本発明は太陽電池に関し、特にエネルギの変換
効率の向上を図つた太陽電池に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION <Technical Field> The present invention relates to a solar cell, and particularly to a solar cell with improved energy conversion efficiency.
<従来技術>
光エネルギを電気エネルギに変換する半導体装
置として太陽電池が広く用いられている。従来か
ら用いられている太陽電池は、第4図に示す如
く、例えばp型シリコン基板1の一主表面にn型
不純物を拡散してPN接合2を形成し、p型層1
及びn型層3には発生した電力を取り出すための
裏面電極4及び表面電極5が夫々作製されてい
る。尚表面電極5が作製された受光面側は、照射
された光の利用率を高めるために反射防止膜6で
被われている。<Prior Art> Solar cells are widely used as semiconductor devices that convert light energy into electrical energy. As shown in FIG. 4, conventionally used solar cells are made by, for example, diffusing n-type impurities into one main surface of a p-type silicon substrate 1 to form a PN junction 2, and forming a p-type layer 1.
A back electrode 4 and a front electrode 5 are formed on the n-type layer 3, respectively, for extracting the generated power. Note that the light-receiving surface side on which the surface electrode 5 is formed is covered with an anti-reflection film 6 in order to increase the utilization rate of the irradiated light.
処で反射防止膜6は一般にTiO2膜が用いられ
ているが、該TiO2膜は絶縁膜として形成され、
単に反射防止機能と表面保護機能が期待されてい
るだけに過ぎず、有効利用が図られているとはい
い難かつた。 Generally, a TiO 2 film is used as the antireflection film 6, but the TiO 2 film is formed as an insulating film.
The anti-reflection and surface protection functions are merely expected, and it is difficult to say that they are being used effectively.
<発明の目的>
本発明は上記従来の太陽電池の欠点を除去し、
TiO2膜を改良してより変換効率の高い太陽電池
を提供するもので、受光面を被うTiO2膜を還元
処理してn型化し、シリコン半導体基板本体との
間にヘテロ結合を形成し、短波長光の吸収率を高
める。<Object of the invention> The present invention eliminates the drawbacks of the above conventional solar cells,
The TiO 2 film is improved to provide a solar cell with higher conversion efficiency.The TiO 2 film covering the light-receiving surface is reduced to become n-type, and a hetero bond is formed with the silicon semiconductor substrate body. , increases the absorption rate of short wavelength light.
<実施例>
第1図は本発明による一実施例を示す太陽電池
の断面図である。図において、従来装置と同様に
p型シリコン基板1の一主表面はn型不純物が拡
散されてPN接合2が形成されている。p型シリ
コン基板1は続いて拡散されたn型層3の表面を
被つてn型TiO2膜7が形成される。該n型TiO2
膜7は、電気的絶縁性の膜として形成された
TiO2をn型に半導体化することによつて作製さ
れる。<Example> FIG. 1 is a sectional view of a solar cell showing an example according to the present invention. In the figure, as in the conventional device, n-type impurities are diffused into one main surface of a p-type silicon substrate 1 to form a PN junction 2. Next, an n-type TiO 2 film 7 is formed on the p-type silicon substrate 1 so as to cover the surface of the diffused n-type layer 3 . The n-type TiO 2
Membrane 7 was formed as an electrically insulating membrane.
It is produced by converting TiO 2 into an n-type semiconductor.
即ちPN接合2が形成されたシリコン半導体基
板1を加熱し、該加熱保持されたn型層3の表面
に、チタン酸イソプロピル等のチタン化合物をソ
ースとしてCVDによりまず絶縁性のTiO2膜7を
形成する。 That is, the silicon semiconductor substrate 1 on which the PN junction 2 has been formed is heated, and an insulating TiO 2 film 7 is first formed on the surface of the heated n-type layer 3 by CVD using a titanium compound such as isopropyl titanate as a source. Form.
上記n型シリコン基板3の表面に積層される電
気的絶縁性のTiO2膜7の作製方法としては、上
述の如くCVD法による他、Tiを含む有機化合物
溶液を塗布して化学反応によりTiO2膜を作製す
る方法、或いは蒸着法を利用することができる。
上記シリコン基板表面に積層されたTiO2膜をn
型半導体に変換する処理は、CVDによつて形成
されたTiO2膜7を還元処理することによつて絶
縁性から半導体に変換される。該還元処理として
は、真空中での熱処理(約700℃)、減圧水素中下
での熱処理(約1Torr、約700℃)、常圧水素中で
の熱処理、或いは水素プラズマ中での熱処理(約
1Torr、約400℃)等を施こすことができ、該還
元処理によつてTiO2膜中の酸素が抜けて空格子
点となり、絶縁性TiO2膜がn型TiO2半導体層に
変換される。その結果n+シリコン層3との間に
n−TiO2/n+−Siのヘテロ接合が形成される。 The electrically insulating TiO 2 film 7 to be laminated on the surface of the n-type silicon substrate 3 can be produced by the CVD method as described above, or by applying a Ti-containing organic compound solution and forming TiO 2 by a chemical reaction. A method for producing a film or a vapor deposition method can be used.
The TiO 2 film laminated on the surface of the silicon substrate is
In the process of converting the TiO 2 film 7 formed by CVD into a type semiconductor, the TiO 2 film 7 formed by CVD is converted from an insulating property to a semiconductor. The reduction treatment includes heat treatment in vacuum (approximately 700°C), heat treatment in reduced pressure hydrogen (approximately 1 Torr, approximately 700°C), heat treatment in normal pressure hydrogen, or heat treatment in hydrogen plasma (approximately 700°C).
1Torr, approximately 400℃), etc., and through this reduction treatment, oxygen in the TiO 2 film is removed and becomes vacancies, converting the insulating TiO 2 film into an n-type TiO 2 semiconductor layer. . As a result, an n-TiO 2 /n + -Si heterojunction is formed between the n + silicon layer 3 and the n-TiO 2 /n + -Si heterojunction.
上記変換されたn型TiO2層7′の表面に受光面
側電極8が例えば格子状に形成され、p型シリコ
ン基板1側に形成された裏面電極4との間で発生
した電力が取り出される。 On the surface of the converted n-type TiO 2 layer 7', a light-receiving surface side electrode 8 is formed, for example, in a lattice shape, and the electric power generated between it and the back surface electrode 4 formed on the p-type silicon substrate 1 side is taken out. .
上記構造の太陽電池において、入射した光エネ
ルギはn−TiO2/n+p−Siのヘテロ接合でも光電
流を発生し、従来のシリコン基板におけるn+p接
合のみで光電流を発生させていた構造に比べて光
出力電流は大きくなる。即ち第2図を用いて模型
的に示す如く、n−TiO2のバンドギヤツプは
3.20eVを示し、第3図の従来の素子構造に示す
シリコンのバンドギヤツプ1.106eVに比べて非常
に大きな値をもち、シリコン基板に対して感度の
小さかつた短波長光を有効に利用することがで
き、短絡光電流の増大を図り得る。 In the solar cell with the above structure, the incident light energy generates a photocurrent even at the n-TiO 2 /n + p-Si heterojunction, whereas in the conventional silicon substrate, photocurrent was generated only at the n + p junction. The optical output current becomes larger compared to the structure. That is, as shown schematically in Fig. 2, the band gap of n-TiO 2 is
3.20 eV, which is much larger than the silicon band gap of 1.106 eV shown in the conventional device structure shown in Figure 3, making it possible to effectively utilize short wavelength light with low sensitivity to silicon substrates. Therefore, it is possible to increase the short-circuit photocurrent.
またTiO2膜はn型半導体に変換されることに
より、負電荷を帯びて導電性が良好となり、面抵
抗が減少して電流−電圧曲線における曲率因子が
著しく向上する。 In addition, the TiO 2 film is converted into an n-type semiconductor, so it is negatively charged and has good conductivity, and its sheet resistance is reduced and the curvature factor in the current-voltage curve is significantly improved.
尚TiO2膜は上述の如くヘテロ結合のための半
導体層として機能すると共に、本来の反射防止膜
としての機能を果している。 The TiO 2 film functions as a semiconductor layer for heterojunction as described above, and also functions as an original antireflection film.
上記実施例は半導体基板としてシリコン基板を
用いたが、3.20eVより小さいバンドギヤツプを
もつ半導体基板、例えば非晶質Si、GaAs、CdS、
CdSe、ZnS、ZnSe、Ge、GaP等を用いた太陽電
池に対して、受光面側に上記実施例と同様にn型
TiO2膜を被着することにより、ヘテロ接合が付
加された高光電変換効率の太陽電池となる。 Although a silicon substrate was used as the semiconductor substrate in the above embodiment, semiconductor substrates with a band gap smaller than 3.20 eV, such as amorphous Si, GaAs, CdS, etc.
For solar cells using CdSe, ZnS, ZnSe, Ge, GaP, etc., on the light receiving surface side, as in the above example, an n-type
By depositing a TiO 2 film, a solar cell with a heterojunction and high photoelectric conversion efficiency can be created.
<効果>
以上本発明によれば、PN接合を備えた半導体
基板の受光面側にn型TiO2膜を被着して太陽電
池を構成することにより、簡単な構成を付加する
のみで、短絡光電流の増加と、電流−電圧曲線に
おける曲率因子の増加による相乗効果に伴ない、
光電変換効率を著しく向上させることができる。<Effects> According to the present invention, by forming a solar cell by depositing an n-type TiO 2 film on the light-receiving surface side of a semiconductor substrate equipped with a PN junction, short circuits can be prevented by simply adding a simple configuration. With the synergistic effect of increasing photocurrent and increasing curvature factor in the current-voltage curve,
Photoelectric conversion efficiency can be significantly improved.
第1図は本発明による一実施例を示す素子の断
面図、第2図は同実施例のバンドギヤツプ模型
図、第3図は従来素子のバンドギヤツプ模型図、
第4図は従来素子の断面図である。
1:p型シリコン基板、3:n型シリコン基
板、7′:n型TiO2膜、8:電極。
FIG. 1 is a sectional view of an element showing an embodiment of the present invention, FIG. 2 is a bandgap model diagram of the same embodiment, and FIG. 3 is a bandgap model diagram of a conventional element.
FIG. 4 is a sectional view of a conventional element. 1: p-type silicon substrate, 3: n-type silicon substrate, 7': n-type TiO 2 film, 8: electrode.
Claims (1)
体層が表面に形成され、p型半導体基板との間に
PN接合を形成してなる半導体基板と、上記n型
半導体層の表面に形成されてヘテロ接合をなすn
型TiO2膜とを備えてなる太陽電池。 2 前記半導体基板はシリコンからなることを特
徴とする請求の範囲第1項記載の太陽電池。 3 前記n型TiO2膜は絶縁性TiO2膜を還元処理
してn型化されていることを特徴とする請求の範
囲第2項記載の太陽電池。[Claims] 1. An n-type semiconductor layer with a smaller bandgap than TiO 2 is formed on the surface, and between it and the p-type semiconductor substrate.
A semiconductor substrate formed by forming a PN junction, and an n formed on the surface of the above n-type semiconductor layer to form a heterojunction.
A solar cell comprising a type TiO 2 film. 2. The solar cell according to claim 1, wherein the semiconductor substrate is made of silicon. 3. The solar cell according to claim 2, wherein the n-type TiO 2 film is made n-type by reducing an insulating TiO 2 film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59213798A JPS6191972A (en) | 1984-10-11 | 1984-10-11 | Solar battery |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59213798A JPS6191972A (en) | 1984-10-11 | 1984-10-11 | Solar battery |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6191972A JPS6191972A (en) | 1986-05-10 |
| JPH0213938B2 true JPH0213938B2 (en) | 1990-04-05 |
Family
ID=16645219
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59213798A Granted JPS6191972A (en) | 1984-10-11 | 1984-10-11 | Solar battery |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6191972A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0320236U (en) * | 1989-06-30 | 1991-02-27 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5215330B2 (en) * | 2010-02-01 | 2013-06-19 | シャープ株式会社 | Manufacturing method of back electrode type solar cell, back electrode type solar cell and back electrode type solar cell module |
-
1984
- 1984-10-11 JP JP59213798A patent/JPS6191972A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0320236U (en) * | 1989-06-30 | 1991-02-27 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6191972A (en) | 1986-05-10 |
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