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JPH0215631B2 - - Google Patents
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JPH0215631B2 - - Google Patents

Info

Publication number
JPH0215631B2
JPH0215631B2 JP56030208A JP3020881A JPH0215631B2 JP H0215631 B2 JPH0215631 B2 JP H0215631B2 JP 56030208 A JP56030208 A JP 56030208A JP 3020881 A JP3020881 A JP 3020881A JP H0215631 B2 JPH0215631 B2 JP H0215631B2
Authority
JP
Japan
Prior art keywords
target
target body
sputtering
cooling member
metal film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56030208A
Other languages
Japanese (ja)
Other versions
JPS57145981A (en
Inventor
Katsuya Okumura
Masaaki Ueda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP3020881A priority Critical patent/JPS57145981A/en
Publication of JPS57145981A publication Critical patent/JPS57145981A/en
Publication of JPH0215631B2 publication Critical patent/JPH0215631B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、スパツタリング装置用ターゲツトに
関し、特にプラナーマグネトロン型スパツタリン
グ装置用ターゲツトの改良に係わる。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a target for a sputtering apparatus, and more particularly to an improvement of a target for a planar magnetron type sputtering apparatus.

(従来の技術) 最近、プラナーマグネトロン型のスパツタリン
グ装置の進歩によつて、Al合金配線工程の被覆
時に該スパツタリング技術を応用することが
Semiconductor、Internatinal、may、1979に発
表されている。かかる装置によりスパツタリング
を行なう時には、ターゲツトに多量のパワーを投
入させるため、ターゲツトを効率よく冷却する必
要がある。このため、従来では、Al合金などの
ターゲツト本体の裏面にNi等の金属膜を被覆し、
該本体の裏面側を銅製の冷却フランジにスズ系の
半田を介してボンデイングした構造にしている。
(Prior art) Recently, with the progress of planar magnetron type sputtering equipment, it has become possible to apply this sputtering technology to the coating of Al alloy wiring process.
Published in Semiconductor, International, may, 1979. When performing sputtering using such a device, a large amount of power is applied to the target, so it is necessary to cool the target efficiently. For this reason, in the past, a metal film such as Ni was coated on the back side of the target body such as Al alloy.
The back side of the main body is bonded to a copper cooling flange using tin-based solder.

一方、現在のLSIのゲート電極等は多結晶シリ
コンが多く用いられているが、多結晶シリコンは
比抵抗が大きいため、シート抵抗が高くなり、高
速のLSIを開発する場合の障害となる。このよう
なことから比抵抗が小さい金属シリサイドをゲー
ト電極に用いようとする研究が盛んに行われてい
る。
On the other hand, polycrystalline silicon is often used for the gate electrodes of current LSIs, but polycrystalline silicon has a high specific resistance, resulting in high sheet resistance, which is an obstacle to developing high-speed LSIs. For this reason, much research is being conducted into using metal silicide, which has a low resistivity, for gate electrodes.

ところで、上記金属シリサイド膜を形成する方
法として真空蒸着法、CVD法やスパツタリング
で膜形成する方法等がある。この中で、前述した
プラナーマグネトロン型のスパツタリング法で金
属シリサイド膜を被着する方法があるが、既述し
たのと同様、ターゲツト本体に多量の電力が投入
されるため、ターゲツト本体の冷却を行なう必要
がある。そのため、Al合金のターゲツト本体と
同様に金属シリサイドのターゲツト本体の裏面に
金属膜を被覆し、この裏面側を銅製の冷却フラン
ジに半田を介してボンデイングした構造のものが
考えられるが、このターゲツトを用いてスパツタ
リングを行なうと、ターゲツト本体にクラツクが
発生する問題があつた。これは、金属シリサイド
からなるターゲツト本体と冷却フランジとの熱膨
張係数が異なると共に、両者がボンデイングされ
て固着され、かつ金属シリサイドはAl合金のよ
うに粘り特性がなく硬く、脆いために、ターゲツ
ト本体に多量のパワーが投入され、少し温度が上
昇して金属シリサイドのターゲツト本体に前記熱
膨張係数の差による引張り応力が生じることに起
因するものである。
By the way, methods for forming the metal silicide film include a vacuum evaporation method, a CVD method, a sputtering method, and the like. Among these methods, there is a method of depositing a metal silicide film using the planar magnetron type sputtering method described above, but as mentioned above, a large amount of electric power is input to the target body, so the target body must be cooled. There is a need. Therefore, a structure can be considered in which the back side of a metal silicide target body is coated with a metal film, similar to the Al alloy target body, and this back side is bonded to a copper cooling flange via solder. When sputtering was performed using this method, there was a problem in that cracks occurred in the target body. This is because the thermal expansion coefficients of the target body and the cooling flange, which are made of metal silicide, are different, and the two are bonded and fixed, and metal silicide does not have sticky properties like Al alloy, is hard, and is brittle. This is due to the fact that a large amount of power is applied to the target, the temperature rises slightly, and tensile stress is generated in the metal silicide target body due to the difference in the thermal expansion coefficients.

(発明が解決しようとする問題点) 本発明は、上記従来の問題点を解決するために
なされたもので、硬くて、脆い金属シリサイドか
らなるターゲツト本体に多量の電力を投入するス
パツタリング時にクラツクが発生するのを防止し
たスパツタリング装置用ターゲツトを提供しよう
とするものである。
(Problems to be Solved by the Invention) The present invention was made in order to solve the above-mentioned conventional problems, and the cracks occur during sputtering in which a large amount of power is applied to the target body made of hard and brittle metal silicide. It is an object of the present invention to provide a target for a sputtering apparatus that prevents the occurrence of sputtering.

[発明の構成] (問題点を解決するための手段) 本発明は、スパツタリング装置に用いられるタ
ーゲツトにおいて、金属シリサイドからなる断面
台形状のターゲツト本体の裏面に金属膜を設け、
かつ該ターゲツト本体の裏面側を前記金属膜を介
して冷却部材に直接当接させ、更に前記ターゲツ
ト周囲に内周側面が逆テーパ状をなす押えリング
を嵌合させると共に該押えリングから前記冷却部
材にネジを螺着することにより押えリングで前記
ターゲツト本体を前記冷却部材に対して支持固定
したことを特徴とするものである。
[Structure of the Invention] (Means for Solving the Problems) The present invention provides a target for use in a sputtering device, in which a metal film is provided on the back surface of a target body made of metal silicide and having a trapezoidal cross section.
The back side of the target main body is brought into direct contact with the cooling member through the metal film, and a retainer ring having an inversely tapered inner circumferential surface is fitted around the target, and the cooling member is removed from the retainer ring. The target body is supported and fixed to the cooling member by a presser ring by screwing the target body into the cooling member.

(作用) 本発明のスパツタリング装置用ターゲツトは、
金属シリサイドからなる断面台形状のターゲツド
本体の裏面に熱伝導性が良好な金属膜を被覆し、
かつ該ターゲツト本体の裏面側を半田層を介さず
に直接冷却部材に当接させ、更に該ターゲツト本
体周囲に内周側面が逆テーパ状をなす押えリング
を嵌合させると共に該押えリングから前記冷却部
材にネジを螺着することにより押えリングで前記
ターゲツト本体を前記冷却部材に対して支持固定
した構造になつている。つまり、前記断面台形状
をなすターゲツト本体はそのテーパ状側面に押え
リングの逆テーパ状の内周側面が嵌合されて前記
冷却部材にネジにより機械的に支持固定されてい
る。その結果、多量の電力をターゲツト本体に投
入するスパツタリング時においてターゲツト本体
が温度上昇して該本体と冷却部材の間の熱膨張係
数の差により引張り応力が該本体に生じた場合、
前記断面台形状をなすターゲツト本体が押えリン
グの逆テーパ状の内周側面に沿つて移動して、該
本体に加わる引張り応力を吸収できる。従つて、
多量の電力を投入するスパツタリング時において
硬くて、脆い金属シリサイドからなるターゲツト
本体にクラツクが発生するのを防止できる。
(Function) The target for sputtering equipment of the present invention is as follows:
A metal film with good thermal conductivity is coated on the back side of the target body, which is made of metal silicide and has a trapezoidal cross section.
The back side of the target body is brought into direct contact with the cooling member without intervening a solder layer, and a retaining ring whose inner circumferential side surface is inversely tapered is fitted around the target body, and the cooling is carried out from the retaining ring. The structure is such that the target body is supported and fixed to the cooling member by a presser ring by screwing the member. That is, the target main body, which has a trapezoidal cross section, is mechanically supported and fixed to the cooling member by means of screws, with the reversely tapered inner circumferential surface of the presser ring being fitted into the tapered side surface of the target main body. As a result, when the temperature of the target body rises during sputtering in which a large amount of power is input into the target body, and tensile stress is generated in the target body due to the difference in thermal expansion coefficient between the body and the cooling member,
The target main body, which has a trapezoidal cross section, moves along the reversely tapered inner circumferential surface of the holding ring, and can absorb the tensile stress applied to the main body. Therefore,
It is possible to prevent cracks from occurring in the target body made of hard and brittle metal silicide during sputtering in which a large amount of power is input.

(発明の実施例) 以下、本発明の実施例を図面を参照して詳細に
説明する。
(Embodiments of the Invention) Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

図中の1は、断面台形状をなす例えばモリブデ
ンシリサイド製のターゲツト本体であり、該本体
1の裏面には厚さ30〜50μm程度のNi系金属膜2
が被覆されている。こうしたターゲツト本体を製
作するには、例えばホツトプレス法でモリブデン
シリサイドのターゲツト本体1を作り、この裏面
にNi系のペーストを塗布し、焼結して金属膜2
を被覆する。そして、前記ターゲツト本体1はそ
の裏面の金属膜2を冷却部材、例えば銅製の冷却
フランジ3に直接当接され、かつ該ターゲツト本
体1周囲に嵌合された内周側面が逆テーパ状の押
えリング4及び該押えリング4から冷却フランジ
に螺着されたネジ5により支持固定されている。
なお、前記冷却フランジ3内には冷却水が流通す
る空洞部6が設けられている。
1 in the figure is a target body made of molybdenum silicide, for example, which has a trapezoidal cross section, and a Ni-based metal film 2 with a thickness of approximately 30 to 50 μm is coated on the back surface of the body 1.
is covered. To manufacture such a target body, for example, a target body 1 of molybdenum silicide is made by hot pressing, a Ni-based paste is applied to the back side of the target body 1, and the metal film 2 is sintered.
Cover. The target main body 1 has a metal film 2 on its back surface directly abutted against a cooling member, for example, a cooling flange 3 made of copper, and a presser ring whose inner circumferential side is inverted tapered and fitted around the target main body 1. 4 and a screw 5 screwed from the holding ring 4 to the cooling flange.
Note that a cavity 6 is provided within the cooling flange 3 through which cooling water flows.

しかして、本発明のスパツタリング装置用ター
ゲツトを用いてモリブデンシリサイドのスパツタ
リングを行なえば、ターゲツト本体1の裏面に熱
伝導性の良好な金属膜2が被膜され、かつターゲ
ツト1裏面側は半田を介さず直接冷却フランジ3
に当接され、更にターゲツト本体1は冷却フラン
ジ3の間での熱膨張係数の差による該本体1への
引張り応力を吸収し得るようにそのテーパ状側面
に嵌合した内面が逆テーパ状の押えリング4及び
ネジ5で冷却フランジ3に対して支持固定されて
いるため、例えば10kWの電力を投入してもター
ゲツト本体1に引張り応力が発生せず、クラツク
が入ることなく良好にスパツタリングを行なうこ
とができる。
Therefore, when molybdenum silicide is sputtered using the target for sputtering equipment of the present invention, a metal film 2 with good thermal conductivity is coated on the back surface of the target body 1, and the back surface side of the target 1 is coated with no solder. Direct cooling flange 3
Further, the target body 1 has an inversely tapered inner surface that fits into the tapered side surface of the target body 1 so as to absorb the tensile stress on the body 1 due to the difference in thermal expansion coefficient between the cooling flanges 3. Since it is supported and fixed to the cooling flange 3 by the holding ring 4 and the screws 5, no tensile stress is generated in the target body 1 even when power of 10 kW is applied, for example, and sputtering can be performed well without cracking. be able to.

なお、本発明に係わるターゲツトは上記実施例
の如くモリブデンシリサイドからなるターゲツト
本体を用いる場合に限定されず、タングステンシ
リサイド、白金シリザイド、タンタルシリサイ
ド、チタンシリサイドなどの金属シリサイドから
形成しても実施例と同様な効果を達成できる。
Note that the target according to the present invention is not limited to the case where the target main body is made of molybdenum silicide as in the above embodiment, but may be formed from metal silicide such as tungsten silicide, platinum silicide, tantalum silicide, titanium silicide, etc. A similar effect can be achieved.

[発明の効果] 以上詳述した如く、本発明によればスパツタリ
ング時において冷却部材と熱膨張係数が異なり、
硬くて、脆い金属シリサイドからなるターゲツト
本体にクラツクが発生するのを防止でき、ひいて
は長期間に亙つて良好なスパツタリングを遂行し
得るスパツタリング装置用ターゲツトを提供でき
る。
[Effects of the Invention] As detailed above, according to the present invention, the thermal expansion coefficient is different from that of the cooling member during sputtering,
To provide a target for a sputtering device which can prevent cracks from occurring in a target body made of hard and brittle metal silicide, and which can perform good sputtering over a long period of time.

【図面の簡単な説明】[Brief explanation of drawings]

図面は、本発明の一実施例を示すスパツタリン
グ装置用ターゲツトの断面図である。 1……モリブデンシリサイド製のターゲツト本
体、2……Ni系の金属膜、3……銅製の冷却フ
ランジ、4……押えリング、5……ネジ、6……
空洞部。
The drawing is a sectional view of a target for a sputtering apparatus showing an embodiment of the present invention. 1... Target body made of molybdenum silicide, 2... Ni-based metal film, 3... Copper cooling flange, 4... Holding ring, 5... Screw, 6...
cavity.

Claims (1)

【特許請求の範囲】[Claims] 1 スパツタリング装置に用いられるターゲツト
において、金属シリサイドからなる断面台形状の
ターゲツト本体の裏面に金属膜を設け、かつ該タ
ーゲツト本体の裏面側を前記金属膜を介して冷却
部材に直接当接させ、更に前記ターゲツト周囲に
内周側面が逆テーパ状をなす押えリングを嵌合さ
せると共に該押えリングから前記冷却部材にネジ
を螺着することにより押えリングで前記ターゲツ
ト本体を前記冷却部材に対して支持固定したこと
を特徴とするスパツタリング装置用ターゲツト。
1. In a target used in a sputtering device, a metal film is provided on the back side of a target body made of metal silicide and has a trapezoidal cross section, and the back side of the target body is brought into direct contact with a cooling member through the metal film, and A presser ring having an inversely tapered inner circumferential surface is fitted around the target, and a screw is screwed from the presser ring to the cooling member, thereby supporting and fixing the target body to the cooling member by the presser ring. A target for sputtering equipment characterized by:
JP3020881A 1981-03-03 1981-03-03 Target for sputtering device Granted JPS57145981A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3020881A JPS57145981A (en) 1981-03-03 1981-03-03 Target for sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3020881A JPS57145981A (en) 1981-03-03 1981-03-03 Target for sputtering device

Publications (2)

Publication Number Publication Date
JPS57145981A JPS57145981A (en) 1982-09-09
JPH0215631B2 true JPH0215631B2 (en) 1990-04-12

Family

ID=12297309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3020881A Granted JPS57145981A (en) 1981-03-03 1981-03-03 Target for sputtering device

Country Status (1)

Country Link
JP (1) JPS57145981A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59133369A (en) * 1983-01-21 1984-07-31 Hitachi Ltd Structural body for sputtering target
JPS59179784A (en) * 1983-03-31 1984-10-12 Fujitsu Ltd Sputtering device
JPS60102249U (en) * 1983-12-19 1985-07-12 日本真空技術株式会社 Target device for sputtering
DE3787390T2 (en) * 1986-04-04 1994-06-16 Materials Research Corp Cathode and target arrangement for a coating device for atomization.
JP2635362B2 (en) * 1988-04-15 1997-07-30 シャープ株式会社 Target unit
JPH0586465A (en) * 1991-06-28 1993-04-06 Mitsubishi Materials Corp Target for sputtering and its manufacture
JPH06108240A (en) * 1992-09-30 1994-04-19 Shibaura Eng Works Co Ltd Sputtering source
DE19958857B4 (en) * 1999-06-16 2014-09-25 Applied Materials Gmbh & Co. Kg sputter cathode
JP6508774B2 (en) * 2015-06-09 2019-05-08 株式会社高純度化学研究所 Sputtering target assembly

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940682U (en) * 1972-07-13 1974-04-10
JPS5488885A (en) * 1977-12-26 1979-07-14 Matsushita Electric Ind Co Ltd Insulator target for sputtering device
JPS58697Y2 (en) * 1978-09-04 1983-01-07 松下電器産業株式会社 Target for sputtering
JPS6018749B2 (en) * 1979-01-16 1985-05-11 株式会社村田製作所 Target for sputtering
JPS5597473A (en) * 1979-01-18 1980-07-24 Murata Mfg Co Ltd Target for sputtering

Also Published As

Publication number Publication date
JPS57145981A (en) 1982-09-09

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