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JPH0222333B2 - - Google Patents
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JPH0222333B2 - - Google Patents

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Publication number
JPH0222333B2
JPH0222333B2 JP57169355A JP16935582A JPH0222333B2 JP H0222333 B2 JPH0222333 B2 JP H0222333B2 JP 57169355 A JP57169355 A JP 57169355A JP 16935582 A JP16935582 A JP 16935582A JP H0222333 B2 JPH0222333 B2 JP H0222333B2
Authority
JP
Japan
Prior art keywords
analyzer
gas
cells
abnormality
light sources
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57169355A
Other languages
Japanese (ja)
Other versions
JPS5956153A (en
Inventor
Yasuo Baba
Hiroaki Takahashi
Hidekatsu Myake
Teruo Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Toyota Motor Corp
Original Assignee
Horiba Ltd
Toyota Motor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd, Toyota Motor Corp filed Critical Horiba Ltd
Priority to JP57169355A priority Critical patent/JPS5956153A/en
Publication of JPS5956153A publication Critical patent/JPS5956153A/en
Publication of JPH0222333B2 publication Critical patent/JPH0222333B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 本発明はゼロガスと測定ガスとを2つのセルに
交互に流すことにより検出出力を変調し測定ガス
の分析を行なうクロスフロー方式の赤外線ガス分
析計において、光源の劣化、セル窓の汚れ等の光
学系の故障や検出器のコンデンサ膜のシヨート、
印加電圧用電線のシヨート、断線、増幅器の故障
等の電気系の故障に起因した動作異常を判定する
装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a cross-flow type infrared gas analyzer that modulates the detection output and analyzes the measured gas by flowing zero gas and measuring gas alternately through two cells. Failure of the optical system such as dirt on the cell window, shorting of the detector capacitor film, etc.
The present invention relates to a device that determines operational abnormalities caused by electrical system failures such as shorts and disconnections in applied voltage wires, and amplifier failures.

複数台の分析計が一システムとして稼動されて
いる場合、一台の分析計でも動作に異常が発生す
れば緊急にその異常を観測者に知らせることが望
まれると共に、異常を生じている分析計を特定で
きることが迅速な修復を可能とする上で望まれ
る。また、単一の分析計を稼動している場合でも
故障箇所が分析計内にあるか、分析計外のサンプ
リング系にあるかを特定できることが望まれる。
When multiple analyzers are operated as one system, if an abnormality occurs in the operation of even one analyzer, it is desirable to notify the observer of the abnormality immediately, and to notify the observer of the abnormality. It is desirable to be able to identify the problem in order to enable prompt repair. Furthermore, even when a single analyzer is in operation, it is desirable to be able to identify whether the failure location is within the analyzer or in the sampling system outside the analyzer.

本発明は、このうち分析計内に異常箇所がある
場合に限つて警報を発して動作異常の告知と異常
箇所の特定化とを行なおうとするものである。
The present invention aims to issue an alarm only when there is an abnormality within the analyzer to notify the operator of the abnormal operation and to identify the abnormality.

以下、図面に基づき説明する。第1図は本発明
の一実施例を示し、図中1は2つのセル2,3に
ゼロガスと測定ガスを交互に流して検出出力を変
調し測定ガスの分析を行なうクロスフロー方式の
赤外線ガス分析計で、前記セル2,3と、各セル
に光照射する光源4,5と、各セル2,3を透過
した光を検出する検出器として例えばコンデンサ
マイクロフオン型検出器6と、該検出器6の出力
のうちガス流路切換周波数に等しい成分領域の信
号のみ選択的に増幅する選択増幅器7とから成つ
ている。尚、前記ガス流路切換周波数とは2つの
セルに交互に流されるゼロガスと測定ガスの切換
周波数である。
The following will explain based on the drawings. Figure 1 shows an embodiment of the present invention, in which 1 is a cross-flow type infrared gas system in which zero gas and measurement gas are alternately flowed into two cells 2 and 3 to modulate the detection output and analyze the measurement gas. The analyzer includes the cells 2 and 3, light sources 4 and 5 for irradiating each cell with light, a detector for detecting the light transmitted through each cell 2 and 3, such as a condenser microphone type detector 6, and the detection device. A selective amplifier 7 selectively amplifies only the signal in the component region equal to the gas flow path switching frequency out of the output of the device 6. Note that the gas flow path switching frequency is a switching frequency between the zero gas and the measurement gas that are alternately flowed into the two cells.

8は前記光源4,5を発光させるための直流電
源、9はこの電源8から各光源4,5に通じられ
る電流を所定の周期で偏倚させる偏倚手段であ
る。図示例においては2つのトランジスタTr1
Tr2と1個の抵抗Rとから構成されている。各ト
ランジスタTr1,Tr2は同期信号発生器10から
発せられる同期信号によつて交互にオン、オフさ
れる。一方のトランジスタTr1がオンすると、抵
抗Rが一方の光源4と並列接続され、光源4に流
れる電流が分流されるため、該光源4の発光エネ
ルギーが減少する。このとき他方の光源5の発光
エネルギーは通常増加する。一方トランジスタ
Tr2が導通すると抵抗Rが光源5と並列接続され
るので、該光源5の発光エネルギーが減少する。
各光源4,5の発光エネルギーの減少度合は抵抗
Rの値を選ぶことにより適当に定められる。
8 is a DC power source for causing the light sources 4 and 5 to emit light, and 9 is a biasing means for biasing the current passed from the power source 8 to each of the light sources 4 and 5 at a predetermined period. In the illustrated example, two transistors Tr 1 ,
It consists of Tr 2 and one resistor R. Each of the transistors Tr 1 and Tr 2 is alternately turned on and off by a synchronization signal generated from a synchronization signal generator 10. When one transistor Tr 1 is turned on, the resistor R is connected in parallel with one of the light sources 4, and the current flowing through the light source 4 is shunted, so that the light emission energy of the light source 4 is reduced. At this time, the emission energy of the other light source 5 usually increases. On the other hand transistor
When Tr 2 becomes conductive, the resistor R is connected in parallel with the light source 5, so that the light emission energy of the light source 5 decreases.
The degree of reduction in the emission energy of each light source 4, 5 is appropriately determined by selecting the value of the resistor R.

前記トランジスタTr1,Tr2をオン、オフする
周期即ち同期信号の周期はガス流路切換周期と等
しくしてある。そしてガス切換周波数と一致した
信号成分のみ増幅する選択増幅器7を通じて増幅
される。11は例えば押釦からなる指令部で、こ
の押釦を押したときだけ同期信号発生器10が動
作して同期信号を発生する。従つて押釦を押さな
い限り光源4,5の電流が偏倚させられることは
ない。12は所定の判定基準値を記憶しているメ
モリ、13はこの判定基準値と、前記選択増幅器
7より出力される模擬信号(光源4,5の電流が
偏倚させられているときに得られる信号をいう。)
とを比較し、その比較結果に基づき分析計の動作
の正常、異常を判定する判定器である。この判定
器13として図示例では電圧信号を周波数変換す
るV−Fコンバータ14と、その出力にあらわれ
るパルスをカウントするカウンタ15と、このカ
ウンタ15のカウント値と判定基準値とが一致す
るかどうかを判定する一致回路16とから成つて
いる。この一致回路16は両方の値の差異が所定
値以内であれば一致したと判別するようにしてあ
る。17は、判定器13が動作異常と判定した場
合に警報を発する警報手段で、ランプ等視覚に訴
えるもの、或いはブザー等聴覚に訴えるもの等が
使用される。
The cycle of turning on and off the transistors Tr 1 and Tr 2 , that is, the cycle of the synchronization signal, is set equal to the gas flow path switching cycle. The signal is then amplified through a selection amplifier 7 that amplifies only the signal component that matches the gas switching frequency. Reference numeral 11 denotes a command unit consisting of, for example, a push button, and only when this push button is pressed, the synchronization signal generator 10 operates to generate a synchronization signal. Therefore, the currents of the light sources 4 and 5 are not biased unless the push button is pressed. 12 is a memory that stores a predetermined judgment reference value; 13 is a memory that stores this judgment reference value and a simulated signal output from the selection amplifier 7 (a signal obtained when the currents of the light sources 4 and 5 are biased); )
This is a determiner that compares the spectrometer and determines whether the analyzer's operation is normal or abnormal based on the comparison results. In the illustrated example, this determiner 13 includes a V-F converter 14 that converts a voltage signal into a frequency, and a counter 15 that counts pulses appearing in its output. It consists of a matching circuit 16 for judging. This matching circuit 16 is configured to determine that there is a match if the difference between both values is within a predetermined value. Reference numeral 17 denotes an alarm means for issuing an alarm when the determiner 13 determines that there is an abnormality in operation, and a means that appeals to the senses such as a lamp or something that appeals to the senses such as a buzzer is used.

次に、この構成の装置によつて分析計の動作異
常を判定する動作を説明する。先ず、セル内の測
定ガスをゼロガスで置換し、各セル2,3ともゼ
ロガスが入つている状態とする。次いで、押釦1
1を押して偏倚手段9を作動させ光源4,5の発
光エネルギーを所定周期で変化させる。このと
き、分析計内の光学系、電気系ともに異常がない
から、各光源4,5の発光エネルギーはそのまま
各セル2,3内を通過して検出器6に入射し、各
光源の発光エネルギーの変化に応じてコンデンサ
膜の蓄積電荷量を変化する。そしてこの蓄積電荷
量の変化に基づく電流を選択増幅器7に入力す
る。この電流は偏倚手段9によつて偏倚された周
波数で変化しており、その周波数はガス流路切換
周波数と同一であるから、選択増幅器7でもその
まま増幅され、模擬信号として判定器13に加え
られて、判定基準値と比較される。
Next, the operation of determining abnormal operation of the analyzer using the apparatus having this configuration will be explained. First, the measurement gas in the cell is replaced with zero gas, so that both cells 2 and 3 contain zero gas. Next, push button 1
1 is pressed to operate the biasing means 9 and change the emission energy of the light sources 4 and 5 at a predetermined period. At this time, since there is no abnormality in the optical system or electrical system within the analyzer, the emitted light energy of each light source 4, 5 passes through each cell 2, 3 as it is and enters the detector 6, and the emitted light energy of each light source The amount of charge stored in the capacitor film is changed according to the change in . A current based on this change in the amount of accumulated charge is input to the selection amplifier 7. This current is changing at a frequency biased by the biasing means 9, and since the frequency is the same as the gas flow path switching frequency, it is amplified as it is in the selection amplifier 7 and is added to the determiner 13 as a simulated signal. and compared with the judgment reference value.

判定基準値は、分析計の動作が正常である場合
の模擬信号に相当する値に設定されているから、
判定器13は分析計の動作が正常であると判定す
る。また、このとき分析計外のサンプリング系に
異常があつても、セル内は全てゼロガスが入つて
いるので、サンプリング系の異常が上記判定動作
に影響を及ぼすことはない。
The judgment reference value is set to a value that corresponds to a simulated signal when the analyzer is operating normally.
The determiner 13 determines that the analyzer is operating normally. Further, even if there is an abnormality in the sampling system outside the analyzer at this time, the cell contains zero gas, so the abnormality in the sampling system will not affect the above determination operation.

一方、分析計内に異常がある場合、例えば光源
の劣化、セル窓の汚れ等光学系に異常がある場合
その異常によつて検出器6の蓄積電荷量の変化が
正常時に比べて大きくなり、或いは小さくなる。
このためそのときの模擬信号量が判定基準値と一
致しなくなり、判定器13が動作異常と判定して
警報手段17により警報が発せられる。同様にコ
ンデンサ膜のシヨートや増幅器の故障等電気系に
異常がある場合、模擬信号が全く発しないか或い
はその信号量が正常時に比べて大きいか小さくな
る。そのため判定器13が動作異常と判定して警
報手段17より警報を発する。
On the other hand, if there is an abnormality within the analyzer, for example, if there is an abnormality in the optical system such as deterioration of the light source or dirt on the cell window, the change in the amount of accumulated charge in the detector 6 will be larger than normal due to the abnormality. Or become smaller.
Therefore, the simulated signal amount at that time no longer matches the determination reference value, the determiner 13 determines that the operation is abnormal, and the alarm means 17 issues an alarm. Similarly, if there is an abnormality in the electrical system, such as a capacitor membrane short or an amplifier failure, the simulated signal may not be generated at all, or the amount of the signal may be larger or smaller than in normal conditions. Therefore, the determiner 13 determines that the operation is abnormal, and the alarm means 17 issues an alarm.

尚、この実施例では2つの光源4,5を交互に
偏倚させることによつて模擬信号をつくり出して
いるが、模擬信号は、2つの光源の発光エネルギ
ーに差があり、その差が所定の周期で変化するも
のであればつくることができるから、2つの光源
の偏倚が非対称(直流レベルからの偏倚におい
て)な構成のものを採用することもできる。従つ
て、第2図に示す回路構成でも偏倚手段として実
施できるものである。
In this embodiment, the simulated signal is created by alternately biasing the two light sources 4 and 5, but the simulated signal has a difference in the emission energy of the two light sources, and the difference is determined by a predetermined period. Since it is possible to create a light source as long as the polarity changes in the direction of current, it is also possible to adopt a structure in which the two light sources have asymmetrical deviations (with respect to the deviation from the DC level). Therefore, the circuit configuration shown in FIG. 2 can also be implemented as a biasing means.

また、上記判定装置で動作異常と判定された場
合、その装置の設けられている分析計が動作異常
を起していることがわかるが、当該分析計内の光
学系の異常か電気系の異常かまでは判別できな
い。従つてこのような判別が要求される場合は、
上記判定装置に併せて第3図に示す判定装置を設
ければ良い。第3図中、18は分析計に備わつて
いる検出器印加用の直流高圧電源、19はこの電
源18の電圧をガス流路切換周波数と同一周波数
で偏倚させる偏倚手段、20はこの偏倚手段19
を偏倚させるための同期信号を発する同期信号発
生器、21は押釦からなる指令部、22は判定基
準値を記憶するメモリ、23は判定器、24は警
報手段である。この22,23,24は、第1図
に示した12,13,17と同一構成のものを使
用することができるが、判定器23と警報手段2
4は第1図に示したものを兼用し、メモリ、1
2,22だけを切換えて使用する構成で実施する
こともできる。この判定装置は、検出器6に印加
される高圧直流電圧を偏倚手段19により所定周
期で偏倚させ、これによつて検出器のコンデンサ
膜に生じる蓄積電荷量を変化させ、その変化に基
づいて選択増幅器7より出力される模擬信号を判
定基準値と比較するものである。
In addition, if the above determination device determines that the analyzer is malfunctioning, it means that the analyzer in which the device is installed is malfunctioning, but it may be due to an abnormality in the optical system within the analyzer or an abnormality in the electrical system. It is not possible to determine the size. Therefore, if such a determination is required,
A determining device shown in FIG. 3 may be provided in addition to the determining device described above. In FIG. 3, reference numeral 18 denotes a DC high-voltage power supply provided in the analyzer for applying voltage to the detector, 19 denotes biasing means for biasing the voltage of this power supply 18 at the same frequency as the gas flow path switching frequency, and 20 denotes this biasing means. 19
21 is a command section consisting of a push button, 22 is a memory for storing judgment reference values, 23 is a judge, and 24 is an alarm means. These 22, 23, 24 can have the same configuration as 12, 13, 17 shown in FIG.
4 also serves as the one shown in FIG.
It is also possible to implement a configuration in which only 2 and 22 are switched and used. This determination device biases the high-voltage DC voltage applied to the detector 6 at a predetermined period by a biasing means 19, thereby changing the amount of accumulated charge generated in the capacitor film of the detector, and making a selection based on the change. The simulated signal output from the amplifier 7 is compared with a determination reference value.

従つて、この判定装置によれば検出器6のコン
デンサ膜のシヨート印加電圧用電線のシヨート、
断線、選択増幅器7の故障等の電気系の異常のみ
を判定することができる。よつてこの判定装置と
第1図に示した判定装置を併用することにより、
分析計内の光学系の異常か、電気系の異常かまで
特定することができる。
Therefore, according to this determination device, the short of the capacitor film of the detector 6, the short of the applied voltage wire,
It is possible to determine only abnormalities in the electrical system, such as wire breakage and failure of the selective amplifier 7. Therefore, by using this judgment device together with the judgment device shown in Fig. 1,
It is possible to identify whether there is an abnormality in the optical system or the electrical system within the analyzer.

本発明は以上説明した如く構成したため、複数
台の分析計が一システムとして稼動されている場
合においては、各分析計に本発明装置をセツトし
ておくことを条件として動作異常を起している分
析計を速やかに発見できるものであるし、また一
台の分析計のみ稼動している場合においても分析
計内の異常であるか分析計外の異常であるかが判
別できるという効果がある。加えて、分析計の動
作異常チエツクを行なうに際してはセル内の測定
ガスをゼロガスで置換するだけでよく、分析計を
稼動停止させる必要がないという効果もある。更
に、光源の電流の偏倚を、半導体素子よりなるス
イツチング素子を含む偏倚手段によつて行つてい
るので、早い周期の連続作用が可能であり、迅速
かつ的確に動作異常を判別することができるとい
つた利点がある。
Since the present invention is configured as explained above, when a plurality of analyzers are operated as one system, abnormal operation may occur as long as the device of the present invention is installed in each analyzer. The analyzer can be quickly discovered, and even when only one analyzer is in operation, it is effective in determining whether an abnormality is inside the analyzer or outside the analyzer. In addition, when checking for abnormal operation of the analyzer, it is sufficient to simply replace the measurement gas in the cell with zero gas, and there is also the advantage that there is no need to stop the operation of the analyzer. Furthermore, since the current of the light source is biased by a biasing means including a switching element made of a semiconductor element, a continuous action with a fast cycle is possible, and abnormal operation can be quickly and accurately determined. There are some advantages.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示すブロツク図、
第2図は偏倚手段の他の一具体例を示す図、第3
図は本発明装置と併用することのできる判定装置
を示す図である。 2,3……セル、4,5……光源、6……検出
器、9……偏倚手段、13……判定器、17……
警報手段。
FIG. 1 is a block diagram showing one embodiment of the present invention;
FIG. 2 is a diagram showing another specific example of the biasing means, and FIG.
The figure shows a determination device that can be used in combination with the device of the present invention. 2, 3... Cell, 4, 5... Light source, 6... Detector, 9... Biasing means, 13... Judgment device, 17...
Alarm means.

Claims (1)

【特許請求の範囲】[Claims] 1 測定ガスとゼロガスとが交互に流れる2つの
セルと、これら2つのセルにそれぞれ光を照射す
る2つの光源と、前記2つのセルを透過した光を
受ける検出器を備えたクロスフロー方式の赤外線
ガス分析計において、前記光源を互いに直列に接
続すると共に、前記光源のうち少なくとも一方の
光源の電流を、半導体素子よりなるスイツチング
素子を含む偏倚手段により前記2つのセルに流す
ガスの切換周期と同一の周期で偏倚させ、前記光
源の電流を偏倚させているとき分析計より出力さ
れる模擬信号を所定の基準値と比較して当該分析
計の動作の正常、異常を判定し、異常時警報を発
するようにしたことを特徴とするクロスフロー方
式の赤外線ガス分析計における動作異常判定装
置。
1 Cross-flow type infrared rays equipped with two cells in which measurement gas and zero gas flow alternately, two light sources that irradiate light to each of these two cells, and a detector that receives the light transmitted through the two cells. In the gas analyzer, the light sources are connected in series with each other, and the current of at least one of the light sources is caused to flow through the two cells by a biasing means including a switching element made of a semiconductor element, the same as the gas switching period. A simulated signal output from the analyzer while biasing the current of the light source is compared with a predetermined reference value to determine whether the operation of the analyzer is normal or abnormal, and an alarm is issued in the event of an abnormality. An operation abnormality determination device for a cross-flow type infrared gas analyzer, characterized in that the device emits an infrared gas analyzer.
JP57169355A 1982-09-25 1982-09-25 Discriminating device of abnormal operation in cross-flow infrared gas analyzer Granted JPS5956153A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57169355A JPS5956153A (en) 1982-09-25 1982-09-25 Discriminating device of abnormal operation in cross-flow infrared gas analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57169355A JPS5956153A (en) 1982-09-25 1982-09-25 Discriminating device of abnormal operation in cross-flow infrared gas analyzer

Publications (2)

Publication Number Publication Date
JPS5956153A JPS5956153A (en) 1984-03-31
JPH0222333B2 true JPH0222333B2 (en) 1990-05-18

Family

ID=15885032

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57169355A Granted JPS5956153A (en) 1982-09-25 1982-09-25 Discriminating device of abnormal operation in cross-flow infrared gas analyzer

Country Status (1)

Country Link
JP (1) JPS5956153A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60250233A (en) * 1984-05-26 1985-12-10 Shimadzu Corp infrared gas analyzer
JP2009150828A (en) * 2007-12-21 2009-07-09 Dkk Toa Corp Infrared gas analyzer infrared control system

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52152273A (en) * 1976-06-11 1977-12-17 Matsushita Electric Works Ltd Action checking method of light dimming type smoke sensor
JPS5494387A (en) * 1978-01-10 1979-07-26 Horiba Ltd Gas analyzer

Also Published As

Publication number Publication date
JPS5956153A (en) 1984-03-31

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