JPH0223807B2 - - Google Patents
Info
- Publication number
- JPH0223807B2 JPH0223807B2 JP22220883A JP22220883A JPH0223807B2 JP H0223807 B2 JPH0223807 B2 JP H0223807B2 JP 22220883 A JP22220883 A JP 22220883A JP 22220883 A JP22220883 A JP 22220883A JP H0223807 B2 JPH0223807 B2 JP H0223807B2
- Authority
- JP
- Japan
- Prior art keywords
- sensors
- insulator
- distance
- zero point
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000012212 insulator Substances 0.000 claims description 31
- 239000004020 conductor Substances 0.000 claims description 20
- 238000005259 measurement Methods 0.000 description 19
- 239000011810 insulating material Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、絶縁物の厚み測定装置に関するもの
であり、特に金属ロール上の圧延ゴムの厚みを測
定する装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an apparatus for measuring the thickness of an insulator, and particularly to an apparatus for measuring the thickness of rolled rubber on a metal roll.
従来、絶縁物の厚み測定装置としては、特開昭
58−103601号公報に示される装置のように、渦電
流センサと静電センサあるいは渦電流センサと光
学センサとの組合せで、装置から導体表面上まで
の距離および装置から絶縁物までの距離の差を求
めることにより、絶縁物の厚みを測定する装置が
提案されている。
Conventionally, as a thickness measuring device for insulators, the
Like the device shown in Publication No. 58-103601, a combination of an eddy current sensor and an electrostatic sensor or an eddy current sensor and an optical sensor is used to detect the difference in the distance from the device to the conductor surface and the distance from the device to the insulator. A device has been proposed that measures the thickness of an insulator by determining .
前記厚み測定装置は、導体表面上の絶縁物の厚
み、特にゴムの圧延工程における金属ロール上の
圧延ゴムの厚みを、非接触で正確に測定すること
を可能にする、コンパクトで携帯可能な装置であ
る。ところが、前記光学センサおよび静電センサ
は温度ドリフト、組成による特性の違い等で測定
前に更正を必要とし、そしてこの更正は、各々の
センサの絶対量の差を厚みとするため、各々のセ
ンサのフルレンジの特性を測定前に調べなければ
ならず、多くの労力が必要であるという問題があ
る。
The thickness measuring device is a compact and portable device that makes it possible to accurately measure, without contact, the thickness of an insulator on a conductor surface, especially the thickness of rolled rubber on a metal roll in a rubber rolling process. It is. However, the aforementioned optical sensors and electrostatic sensors require correction before measurement due to temperature drift, differences in characteristics due to composition, etc., and this correction requires correction of each sensor because the difference in absolute amount of each sensor is taken as the thickness. The problem is that the full range of characteristics must be investigated before measurement, which requires a lot of effort.
この発明の目的は、導体表面上までの装置から
の距離および絶縁物までの装置からの距離を2種
のセンサで非接触にて行ない、絶縁物の厚みを測
定する装置における、測定前の各センサの出力特
性を容易に調べることができ、各センサの更正が
短時間で正確に、しかもきわめて簡単に行なうこ
とができる優れた絶縁物の厚み測定装置を提供す
ることである。 The purpose of this invention is to measure the distance from the device to the surface of the conductor and the distance from the device to the insulator using two types of sensors, and to measure the thickness of the insulating material by measuring the distance from the device to the surface of the conductor and the distance from the device to the insulating material. To provide an excellent insulator thickness measuring device that allows the output characteristics of sensors to be easily examined and that allows each sensor to be calibrated accurately and extremely easily in a short period of time.
以上の目的を達成すくだめの本発明の絶縁文の
厚み測定装置は、導体上の絶縁物までの距離を測
定する絶縁物センサと渦電流センサとを備え、前
記2種のセンサの測定する距離の差から前記絶縁
物の厚みを測定する厚み測定装置であつて、前記
2種のセンサを既知距離を移動させる移動機構
と、ゼロ点測定手段及びゲイン測定手段の選択手
段とを設け、前記ゼロ点測定手段が選択される
と、前記2種のセンサについてゼロ点出力値を記
憶するゼロ点測定手段が作動し、前記ゲイン測定
手段が選択されると、前記移動機構を作動させ、
前記2種のセンサのそれぞれについて前記移動前
後の出力を測定し、この測定値の差と移動距離と
からゲインを算出し記憶するゲイン測定手段と、
前記2種のセンサのそれぞれの測定値に対してゼ
ロ点補正及びゲイン補正を行う更正手段とを備え
たものである。
To achieve the above object, the insulation thickness measuring device of the present invention includes an insulator sensor and an eddy current sensor that measure the distance to the insulator on the conductor, and the distance measured by the two types of sensors. The thickness measuring device measures the thickness of the insulating material from the difference between When the point measuring means is selected, the zero point measuring means for storing zero point output values for the two types of sensors is activated, and when the gain measuring means is selected, the moving mechanism is activated,
gain measuring means for measuring the output before and after the movement of each of the two types of sensors, calculating and storing a gain from the difference between the measured values and the movement distance;
and correction means for performing zero point correction and gain correction on the respective measured values of the two types of sensors.
以下添付図面を用いて本発明の実施例を説明す
る。
Embodiments of the present invention will be described below with reference to the accompanying drawings.
第1図は本発明の絶縁物の厚み測定装置の概要
を説明するブロツク図、第2,3図は具体的実施
例を示すものである。 FIG. 1 is a block diagram illustrating the outline of the insulator thickness measuring device of the present invention, and FIGS. 2 and 3 show specific embodiments.
これらの図において1,2はそれぞれ導体Mの
表面までの距離を測定するセンサ、絶縁物Rまで
の距離を測定するセンサであり、例えばセンサ2
には静電センサあるいは光学センサが用いられ、
センサ1には渦電流センサが用いられる。センサ
1,2は基台3に取り付けられており、基台3は
アクチユエータ4とスライダベアリング7とによ
る移動機構により矢印AA′方向に既値の距離α
(例えば1mm)移動できるようになつている。こ
の基台3の移動量は、出限を検知するリミツトス
イツチ6、戻り限を検知するリミツトスイツチ5
により正確に把握される。 In these figures, 1 and 2 are sensors that measure the distance to the surface of the conductor M and sensors that measure the distance to the insulator R, respectively.For example, sensor 2
An electrostatic sensor or an optical sensor is used for
An eddy current sensor is used as the sensor 1. The sensors 1 and 2 are attached to a base 3, and the base 3 is moved by a predetermined distance α in the direction of arrow AA′ by a movement mechanism using an actuator 4 and a slider bearing 7.
(for example, 1 mm). The amount of movement of this base 3 is determined by a limit switch 6 that detects the output limit and a limit switch 5 that detects the return limit.
more accurately.
また、センサ1,2の出力線8,9は連動する
切換スイツチ11,12を介して演算装置10に
接続し、切換スイツチの残りの接点は更生回路2
0に接続している。(出力線8,9、切換スイツ
チ11,12、更正回路20は第2,3図では図
示されていない。)前記リミツトスイツチ5,6
はこの更正回路20に接続しており、更正回路2
0はリミツトスイツチ5,6の出力によりアクチ
ユエータ4を制御する。 In addition, the output lines 8 and 9 of the sensors 1 and 2 are connected to the arithmetic unit 10 via interlocking changeover switches 11 and 12, and the remaining contacts of the changeover switches are connected to the rehabilitation circuit 2.
Connected to 0. (The output lines 8, 9, the changeover switches 11, 12, and the correction circuit 20 are not shown in FIGS. 2 and 3.) The limit switches 5, 6
is connected to this correction circuit 20, and the correction circuit 2
0 controls the actuator 4 by the outputs of the limit switches 5 and 6.
そして、センサ1,2の更正を行なう場合は、
切換スイツチ11,12の接点c−bを接続して
センサ1,2の出力が更正回路20に入力される
ようにし、アクチユエータ4、スライドベアリン
グ7、リミツトスイツチ5,6からなる移動機構
を作動させてセンサ1,2の更正値を求めるので
ある。更正回路20により求められたセンサ1,
2の出力特性の更性値は演算装置10に入力され
るので、切換スイツチ11,12の接点c−aを
接続すればセンサ1,2による距離の測定値によ
り演算装置10が導体M上の絶縁体Rの厚みを検
出し、これをデジタル変換して表示器15に例え
ばデジタル数字で絶縁物Rの厚みを表示させる。
前記切換えスイツチ11,12によつて、本実施
例の選択手段を構成した。 Then, when correcting sensors 1 and 2,
The contacts c-b of the changeover switches 11 and 12 are connected so that the outputs of the sensors 1 and 2 are input to the correction circuit 20, and the moving mechanism consisting of the actuator 4, the slide bearing 7, and the limit switches 5 and 6 is operated. The correction values for sensors 1 and 2 are determined. The sensor 1 determined by the correction circuit 20,
2 is input to the calculation device 10, so if the contacts c-a of the changeover switches 11 and 12 are connected, the calculation device 10 will detect the distance on the conductor M based on the distance measurement values from the sensors 1 and 2. The thickness of the insulator R is detected, and this is digitally converted to display the thickness of the insulator R on the display 15 using, for example, digital numbers.
The changeover switches 11 and 12 constitute the selection means of this embodiment.
本発明の装置の構成および機能は以上の通りで
あるが、次に本発明の装置を使用して実際に導体
M上の絶縁物Rの厚みを測定する具体的な手順を
第4図の流れ図を用いて説明する。 The configuration and functions of the device of the present invention are as described above. Next, the flowchart in FIG. Explain using.
(1) ゼロ点の測定
センサ1,2からの導体M、絶縁物Rまでの
距離の測定値は電圧で出力されるので、まず基
準となる電圧値(ゼロ点電圧)を測定する。こ
のゼロ点電圧は導体M上に絶縁物Rがない状態
のセンサ1の出力電圧V0A、センサ2の出力電
圧V0Bと定める。後にセンサ1、センサ2によ
る測定時の出力電圧VA,VBからこのゼロ点電
圧を引いたものを、ゼロ点から測定点までの距
離に相当する電圧として使用する。この手順は
第4図ではステツプ→→→→で示さ
れる。即ち、前記ステツプ及びによつて本
実施例のゼロ点測定手段を構成した。(1) Measurement of the zero point Since the measured values of the distances from the sensors 1 and 2 to the conductor M and the insulator R are output as voltage, first measure the reference voltage value (zero point voltage). This zero point voltage is defined as the output voltage V 0A of the sensor 1 and the output voltage V 0B of the sensor 2 in a state where there is no insulator R on the conductor M. Later, the value obtained by subtracting this zero point voltage from the output voltages V A and V B during measurement by sensors 1 and 2 is used as a voltage corresponding to the distance from the zero point to the measurement point. This procedure is indicated in FIG. 4 by the steps →→→→. That is, the above steps constitute the zero point measuring means of this embodiment.
(2) センサのゲイン測定
センサ1,2の測定時の出力特性(ゲイン)
を調べるために、本発明の装置では導体M上に
絶縁物Rがある状態で、更正回路20によりセ
ンサ1,2を既知の基準距離α(例えば1mm)
移動させる。アクチユエータ4を作動させて基
台3を導体側に移動させ(ステツプ)、出限
のリミツトスイツチ6がオンになつた時点(ス
テツプでYES)でセンサ1,2の出力電圧
V2A,V2Bを測定し(ステツプ)、次にアクチ
ユエータ4を解除して(ステツプ)、基台3
が戻り限に達してリミツトスイツチ5がオンに
なつた時点(ステツプでYES)でセンサ1,
2の出力電圧V1A,V1Bを測定する(ステツプ
)。そしてステツプに移り、センサ1,2
のゲインを更正回路20にて計算する。センサ
1,2の距離−出力電圧特性のゲインをそれぞ
れKA,KBとすると、KA、KBは以下の式で表さ
れる。(2) Sensor gain measurement Output characteristics (gain) during measurement of sensors 1 and 2
In order to examine
move it. The actuator 4 is operated to move the base 3 to the conductor side (step), and when the limit switch 6 is turned on (YES in step), the output voltage of sensors 1 and 2 is changed.
Measure V 2A and V 2B (step), then release the actuator 4 (step), and release the base 3.
When sensor 1 reaches its return limit and limit switch 5 is turned on (YES in step), sensor 1,
Measure the output voltages V 1A and V 1B of 2 (step). Then move on to the step, sensors 1 and 2.
The correction circuit 20 calculates the gain of . Assuming that the gains of the distance-output voltage characteristics of sensors 1 and 2 are K A and K B , respectively, K A and K B are expressed by the following equations.
KA=α/V2A−V1A,KB=α/V2B−V1B
なお、測定物がロール上のゴムシートである
場合は、この更正はロールの回転を止めた静止
状態で行なうものとする。即ち、前記ステツプ
〜によつて本実施例のゲイン測定手段を構
成した。 K A = α/V 2A −V 1A , K B = α/V 2B −V 1B If the object to be measured is a rubber sheet on a roll, this correction should be performed with the roll stopped rotating and in a stationary state. shall be. That is, the gain measuring means of this embodiment was constructed by the above steps.
(3) 絶縁物の厚さ測定
以上のようにしてセンサ1,2のゼロ点電圧
V0A,V0BおよびゲインKA,KBが求められると
ステツプからステツプに移り、センサ1で
導体Mの表面までの距離に相当する電圧値VA,
センサ2で絶縁物Rの表面までの距離に相当す
る電圧値VBを同時に測定する。ステツプで
はこれらの測定値から前述のゼロ点電圧を引
き、ゼロ点からの導体Mの表面までの距離LA
およびゼロ点から絶縁体Rの表面までの距離
LBをステツプで求めたゲインを用いて算出
する。即ち、前記ステツプによつて本実施例
の更正手段を構成した。(3) Measurement of the thickness of the insulator As described above, the zero point voltage of sensors 1 and 2 is measured.
Once V 0A , V 0B and the gains K A , K B are determined, the process moves from step to step, and the voltage values V A , corresponding to the distance to the surface of the conductor M at the sensor 1 are determined.
The sensor 2 simultaneously measures a voltage value V B corresponding to the distance to the surface of the insulator R. In the step, the aforementioned zero point voltage is subtracted from these measured values, and the distance L A from the zero point to the surface of the conductor M is calculated.
and the distance from the zero point to the surface of insulator R
Calculate L B using the gain obtained in the step. That is, the above steps constitute the correction means of this embodiment.
LA=KA(VA−V0A)=α/V2A−V1A(VA−V0A)
LB=KB(VB−V0B)=α/V2B−V1B(VB−V0B)
この距離LA,LBによりステツプでは導体
M上の絶縁物Rの厚さLがL=LB−LAにより
求められる。 L A = K A (V A - V 0A ) = α/V 2A - V 1A (V A - V 0A ) L B = K B (V B - V 0B ) = α/V 2B - V 1B (V B -V 0B ) From these distances L A and L B , the thickness L of the insulator R on the conductor M is determined by L=L B -L A in step.
なお、シート出しロール上のゴムシートの厚
さを測定する時は、導体Mに相当するロール、
絶縁体Rに相当するゴムシートが偏心しながら
回転し、この偏心分はゼロ点に対する導体M、
絶縁体Rの表面位置の変化として表われるが、
本発明の装置では導体M、絶縁体Rのゼロ点か
らの距離を求め、これらの差をとることによつ
て絶縁体Rの厚みを求めるので、ロール上のゴ
ムシートの厚みは連続的に測定することができ
る。このときは第4図においてステツプ→
→→→→の手順がくり返されることに
なる。ステツプでYESになれば測定は終了
する。 In addition, when measuring the thickness of the rubber sheet on the sheet output roll, the roll corresponding to the conductor M,
The rubber sheet corresponding to the insulator R rotates eccentrically, and this eccentricity changes the conductor M with respect to the zero point,
This appears as a change in the surface position of the insulator R,
In the device of the present invention, the distances of the conductor M and the insulator R from the zero point are determined, and the thickness of the insulator R is determined by taking the difference between them, so the thickness of the rubber sheet on the roll can be continuously measured. can do. In this case, step →
The steps →→→→ will be repeated. If the answer to step is YES, the measurement ends.
本発明の装置では前記(1)で述べたゼロ点の測定
及び(2)で述べたセンサのゲイン測定は必要に応じ
て測定前、あるいは測定を中断して随時行なうこ
とができる。しかも、前記更正は演算装置、およ
び更正回路を用いて自動的に行なうことができる
ので、誰にでも簡単にこれを行なうことができ、
非常に便利である。 In the apparatus of the present invention, the zero point measurement described in (1) and the sensor gain measurement described in (2) can be performed at any time before the measurement or after interrupting the measurement, as necessary. Moreover, since the correction can be automatically performed using a calculation device and a correction circuit, anyone can easily perform this correction.
Very convenient.
以上説明したように本発明の絶縁物の厚み測定
装置は、導体表面上の絶縁物の厚みを非接触で測
定する装置であつて、装置から導体表面までの距
離および絶縁物までの距離をそれぞれ測定する2
種類のセンサを備えており、さらに、装置を導体
表面方向に既知距離移動させる機構と、前記装置
の既知距離の移動による各センサの出力により各
センサの出力特性を調べる回路とを有し、測定前
に各センサの更正を装置内で自動的に行なうこと
ができるので、測定前あるいは測定を中断して、
各センサの更正が短時間で正確に、しかもきわめ
て容易に行なうことが可能となり、測定時間の短
縮化、測定精度の向上が図れるという効果があ
る。
As explained above, the insulator thickness measuring device of the present invention is a device that non-contactly measures the thickness of the insulator on the surface of a conductor, and measures the distance from the device to the conductor surface and the distance to the insulator, respectively. Measure 2
It also has a mechanism for moving the device a known distance in the direction of the conductor surface, and a circuit for checking the output characteristics of each sensor based on the output of each sensor when the device is moved a known distance. Since each sensor can be automatically calibrated within the device before measurement, or after interrupting measurement,
It is possible to calibrate each sensor accurately and extremely easily in a short period of time, which has the effect of shortening measurement time and improving measurement accuracy.
第1図は本発明の絶縁物の厚み測定装置の概要
を説明するブロツク図、第2図、第3図はそれぞ
れ同測定装置の実施例を示す側面図、正面図、第
4図は同装置の測定手順を示す流れ図である。
1……渦流センサ、2……絶縁物センサ、4…
…アクチユエータ、5,6……リミツトスイツ
チ、10……演算装置、20……更正回路。
Fig. 1 is a block diagram illustrating the outline of the insulating material thickness measuring device of the present invention, Figs. 2 and 3 are side and front views respectively showing an embodiment of the same measuring device, and Fig. 4 is the same device. 2 is a flowchart showing a measurement procedure. 1...Eddy current sensor, 2...Insulator sensor, 4...
... Actuator, 5, 6 ... Limit switch, 10 ... Arithmetic device, 20 ... Correction circuit.
Claims (1)
センサと渦電流センサとを備え、前記2種のセン
サの測定する距離の差から前記絶縁物の厚みを測
定する厚み測定装置であつて、 前記2種のセンサを既知距離を移動させる移動
機構と、ゼロ点測定手段及びゲイン測定手段の選
択手段とを設け、前記ゼロ点測定手段が選択され
ると、前記2種のセンサについてゼロ点出力値を
記憶するゼロ点測定手段が作動し、前記ゲイン測
定手段が選択されると、前記移動機構を作動さ
せ、前記2種のセンサのそれぞれについて前記移
動前後の出力を測定し、この測定値の差と移動距
離とからゲインを算出し記憶するゲイン測定手段
と、前記2種のセンサのそれぞれの測定値に対し
てゼロ点補正及びゲイン補正を行う更正手段とを
備えた絶縁物の厚み測定装置。[Scope of Claims] 1. A device comprising an insulator sensor and an eddy current sensor that measure the distance to an insulator on a conductor, and a thickness that measures the thickness of the insulator from the difference in the distance measured by the two types of sensors. The measuring device is provided with a moving mechanism for moving the two types of sensors by a known distance, and a selection unit for zero point measuring means and gain measuring means, and when the zero point measuring means is selected, the two types of sensors are selected. When the zero point measuring means for storing the zero point output value for the two sensors is activated and the gain measuring means is selected, the moving mechanism is activated and the output before and after the movement is measured for each of the two types of sensors. and a gain measuring means for calculating and storing a gain from the difference between the measured values and the travel distance, and a correction means for performing zero point correction and gain correction for each of the measured values of the two types of sensors. Insulator thickness measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22220883A JPS60114709A (en) | 1983-11-28 | 1983-11-28 | Thickness measuring apparatus for insulating material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22220883A JPS60114709A (en) | 1983-11-28 | 1983-11-28 | Thickness measuring apparatus for insulating material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60114709A JPS60114709A (en) | 1985-06-21 |
| JPH0223807B2 true JPH0223807B2 (en) | 1990-05-25 |
Family
ID=16778823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22220883A Granted JPS60114709A (en) | 1983-11-28 | 1983-11-28 | Thickness measuring apparatus for insulating material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60114709A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07265109A (en) * | 1994-03-31 | 1995-10-17 | Iba Kogyo Kk | Dress button and manufacture of component provided with notched inserting leg for preventing fall-off for accessories |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6415107U (en) * | 1987-07-16 | 1989-01-25 | ||
| JPH0158110U (en) * | 1987-10-07 | 1989-04-11 | ||
| JPH01143908A (en) * | 1987-11-30 | 1989-06-06 | Shinetsu Eng Kk | Thin film thickness measuring instrument |
| FI119260B (en) | 2006-03-10 | 2008-09-15 | Metso Automation Oy | Method for calibrating measuring equipment and measuring equipment |
| CN113983975B (en) * | 2021-11-02 | 2023-09-08 | 东莞市简从科技有限公司 | Thickness measuring device and thickness measuring robot |
| CN113819871B (en) * | 2021-11-02 | 2023-09-08 | 东莞市简从科技有限公司 | Thickness measuring robot and thickness detecting method |
-
1983
- 1983-11-28 JP JP22220883A patent/JPS60114709A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07265109A (en) * | 1994-03-31 | 1995-10-17 | Iba Kogyo Kk | Dress button and manufacture of component provided with notched inserting leg for preventing fall-off for accessories |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60114709A (en) | 1985-06-21 |
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