JPH0224770B2 - - Google Patents
Info
- Publication number
- JPH0224770B2 JPH0224770B2 JP60124325A JP12432585A JPH0224770B2 JP H0224770 B2 JPH0224770 B2 JP H0224770B2 JP 60124325 A JP60124325 A JP 60124325A JP 12432585 A JP12432585 A JP 12432585A JP H0224770 B2 JPH0224770 B2 JP H0224770B2
- Authority
- JP
- Japan
- Prior art keywords
- silicon nitride
- mold
- substrate
- molding
- mirror surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B11/00—Pressing molten glass or performed glass reheated to equivalent low viscosity without blowing
- C03B11/06—Construction of plunger or mould
- C03B11/08—Construction of plunger or mould for making solid articles, e.g. lenses
- C03B11/084—Construction of plunger or mould for making solid articles, e.g. lenses material composition or material properties of press dies therefor
- C03B11/086—Construction of plunger or mould for making solid articles, e.g. lenses material composition or material properties of press dies therefor of coated dies
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2215/00—Press-moulding glass
- C03B2215/02—Press-mould materials
- C03B2215/03—Press-mould materials defined by material properties or parameters, e.g. relative CTE of mould parts
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2215/00—Press-moulding glass
- C03B2215/02—Press-mould materials
- C03B2215/08—Coated press-mould dies
- C03B2215/10—Die base materials
- C03B2215/12—Ceramics or cermets, e.g. cemented WC, Al2O3 or TiC
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2215/00—Press-moulding glass
- C03B2215/02—Press-mould materials
- C03B2215/08—Coated press-mould dies
- C03B2215/14—Die top coat materials, e.g. materials for the glass-contacting layers
- C03B2215/22—Non-oxide ceramics
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明はプレス成形後に研削研磨不要の高い形
状精度と細かい面粗度を有するガラスレンズ成形
のためのガラスレンズ成形用型およびその製造方
法に関する。Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a mold for molding a glass lens with high shape accuracy and fine surface roughness that does not require grinding and polishing after press molding, and a method for manufacturing the same. .
[従来の技術]
プレス成形後に研削研磨が不要な高い形状精度
と細かい面粗度を有するガラスレンズを成形する
ための成形用型としては、米国特許4139677明細
書に記載されているものが知られている。この明
細書には、炭化ケイ素(SiC)あるいは窒化ケイ
素(Si3N4)を用いて、ホツトプレス法、CVD法
等によりガラス成形のためのモールド面を成形し
た後、得ようとするガラス製品の最終形状に適合
するように研削研磨を行ないモールド面を仕上げ
るというものであつた。[Prior Art] As a mold for molding a glass lens having high shape accuracy and fine surface roughness that does not require grinding and polishing after press molding, the mold described in U.S. Pat. No. 4,139,677 is known. ing. In this specification, silicon carbide (SiC) or silicon nitride (Si 3 N 4 ) is used to form a mold surface for glass forming by a hot press method, CVD method, etc., and then the glass product to be obtained is described. The mold surface was finished by grinding and polishing to match the final shape.
上記ホツトプレス法は、炭化ケイ素または窒化
ケイ素の原料粉末を成形ダイスに入れたまま、高
温可塑性を利用し、プレスし型を成形するもので
あつた。 In the hot press method, raw material powder of silicon carbide or silicon nitride is placed in a molding die and pressed to form a mold using high temperature plasticity.
一方、CVD法は適当な型の基板材の上に、沈
着により被覆を行なうもので、炭化ケイ素もしく
は窒化ケイ素を沈着させる場合、1350℃前後の温
度で反応を行なわせる。沈着後に、仕上加工をす
るため被覆層は充分な厚さに沈着させる必要があ
り、少なくとも10μmの厚さが必要であつた。 On the other hand, in the CVD method, coating is carried out by deposition on a suitable type of substrate material, and when silicon carbide or silicon nitride is deposited, the reaction is carried out at a temperature of around 1350°C. After deposition, the coating layer had to be deposited to a sufficient thickness for finishing, and a thickness of at least 10 μm was required.
[発明が解決しようとする問題点]
前記ホツトプレス法では、複雑な形状のものが
つくれない上、気孔が生じないようにすることが
極めて難しいという問題点があつた。[Problems to be Solved by the Invention] The hot pressing method has problems in that it is not possible to produce products with complex shapes, and it is extremely difficult to prevent the formation of pores.
一方、CVD法では、気孔は生じないが、基板
上に沈着させる場合の反応温度が1350℃前後の高
温であるため、成長粒子径が大きく、仕上加工が
必要であつた。しかしながら、炭化ケイ素および
窒化ケイ素は非常に堅くてもろいため、仕上加工
の際にチツピングを起しやすいという問題点があ
つた。 On the other hand, in the CVD method, no pores are generated, but the reaction temperature when depositing on the substrate is high, around 1350°C, so the grown particles are large in size and finishing processing is required. However, since silicon carbide and silicon nitride are very hard and brittle, there is a problem in that they tend to chip during finishing.
また、被覆層の厚さが10μm以上で比較的厚い
場合、被覆を行なう基板のモールド面も高精度に
加工しておく必要があり、被覆後の仕上加工と合
せて、2度の精密加工を行なわなければならなか
つた。 In addition, if the coating layer is relatively thick (10 μm or more), the mold surface of the substrate to be coated must also be processed with high precision, and in addition to the finishing process after coating, two precision processes are required. I had to do it.
本発明は、以上のような問題点を解決すること
を目的をして成されたものである。 The present invention has been made with the aim of solving the above-mentioned problems.
[問題を解決するための手段]
本発明は200Å以下の面粗度に仕上げられた基
板の鏡面に、鏡面の面粗度を損わない程度の厚
さ、すなわち0.2〜2μmの窒化ケイ素層を被覆す
ることによりガラスレンズ成形型を製造するもの
である。[Means for solving the problem] The present invention provides a silicon nitride layer with a thickness of 0.2 to 2 μm, which does not impair the surface roughness of the mirror surface, on the mirror surface of a substrate finished with a surface roughness of 200 Å or less. A glass lens mold is manufactured by coating.
本発明を実施する際には、200Å以下の面粗度
に加工された基板の鏡面に、約900℃の反応温度
で窒化ケイ素層を低温プラズマCVD法により、
沈着させ、基板の鏡面に被覆層を形成させる。 When carrying out the present invention, a silicon nitride layer is applied to the mirror surface of a substrate processed to a surface roughness of 200 Å or less at a reaction temperature of approximately 900°C using a low-temperature plasma CVD method.
to form a coating layer on the mirror surface of the substrate.
[作用]
まず、基板のガラス成形面を高い形状精度で、
細かい面粗度の鏡面に加工する。次に、加工され
た鏡面に約900℃で、低温プラズマCVD法によ
り、耐酸化性に優れる窒化ケイ素を沈着させる。
窒化ケイ素の被覆層の厚さは、0.2〜2μmとする。
通常のCVD法は窒化ケイ素の沈着を1350℃前後
で行うのに対し、低温プラズマCVD法では、約
900℃の低い温度で行なわれるため、成長粒子径
が100Å以下の細かい粒子が沈着し、面粗度に影
響を及ぼさない。また、被覆層が薄く鏡面に均一
に被覆されるため、形状精度にも影響を及ぼさな
い。従つて、被覆後の仕上加工を必要としない。[Operation] First, the glass molding surface of the substrate is molded with high shape accuracy.
Processed into a mirror surface with fine surface roughness. Next, silicon nitride, which has excellent oxidation resistance, is deposited on the processed mirror surface at approximately 900°C using low-temperature plasma CVD.
The thickness of the silicon nitride coating layer is 0.2 to 2 μm.
While conventional CVD methods deposit silicon nitride at around 1350°C, low-temperature plasma CVD methods deposit silicon nitride at around 1350°C.
Since the process is carried out at a low temperature of 900°C, fine particles with a grown particle size of 100 Å or less are deposited and do not affect the surface roughness. Furthermore, since the coating layer is thin and uniformly coats the mirror surface, it does not affect the shape accuracy. Therefore, no finishing work is required after coating.
次に、基板材料について説明する。 Next, the substrate material will be explained.
基板材料としては緻密で鏡面加工ができ、かつ
窒化ケイ素と熱膨脹係数が著るしく違わないもの
であればよく、モリブデン、ステンレス、焼結炭
化ケイ等でもよいが炭化タングステンがより望ま
しい。例えば、コバルト(Co)をバインダーと
する炭化タングステンは耐酸化性の点でそのまま
型として使用するには充分とは言えないが、この
型表面を高い形状精度で、かつ、約100Åの面粗
度に仕上げておき、これに低温プラズマCVD法
により約900℃で窒化ケイ素層を約0.2〜2μm沈着
させると型表面に均一な厚さの透明膜が形成され
て形状精度が狂うことがなく、成長粒子径が100
Å以下であるため、前述のように面粗度にも変化
がほとんど見られない。被覆層は純粋な窒化ケイ
素であり、気孔もなく、耐酸化性に極めて優れて
いる。しかしながら成形における寿命を長くする
ために不活性ガス雰囲気で使用することが望まし
い。また、高精度に加工するのは比較的加工のし
やすい炭化タングステンであり、チツピングを起
しやすい材質である窒化ケイ素層は加工の必要が
なく、また、層の厚さが極めて薄いため、ガラス
成形の際にもチツピングを起す心配がない。窒化
ケイ素層の厚さを2μmより厚くすると、成長粒
子径が徐々に大きくなり、膜厚を均一にすること
も容易でなくなり、基板材料との熱膨脹係数差も
問題になつてくるので、約0.2〜2μmの厚さが望
ましい。このようにすると、被覆後の再研磨など
の仕上加工を必要としない。 The substrate material may be any material as long as it is dense, can be mirror-finished, and has a coefficient of thermal expansion not significantly different from that of silicon nitride, and may be molybdenum, stainless steel, sintered silicon carbide, etc., but tungsten carbide is more preferable. For example, tungsten carbide with cobalt (Co) as a binder cannot be said to have sufficient oxidation resistance to be used as a mold as it is, but it is possible to create a mold surface with high shape accuracy and a surface roughness of about 100 Å. By depositing a silicon nitride layer of approximately 0.2 to 2 μm on the mold surface using the low-temperature plasma CVD method at approximately 900°C, a transparent film with a uniform thickness is formed on the mold surface and the shape accuracy is maintained, allowing growth. Particle size is 100
Since it is less than Å, almost no change is observed in the surface roughness as mentioned above. The coating layer is pure silicon nitride, has no pores, and has excellent oxidation resistance. However, in order to prolong the life in molding, it is desirable to use it in an inert gas atmosphere. In addition, tungsten carbide, which is relatively easy to process, can be processed with high precision, and the silicon nitride layer, which is a material that is prone to chipping, does not need to be processed. There is no need to worry about chipping during molding. If the thickness of the silicon nitride layer is made thicker than 2 μm, the diameter of the grown particles gradually increases, making it difficult to make the film thickness uniform, and the difference in coefficient of thermal expansion with the substrate material becomes a problem, so approximately 0.2 A thickness of ~2 μm is desirable. In this way, finishing processing such as repolishing after coating is not required.
[実施例]
以下、本発明の実施例を図面により説明する。
窒化ケイ素の沈着を行なうための本実施例で用い
たプラズマCVD装置を第1図に示す。[Examples] Examples of the present invention will be described below with reference to the drawings.
The plasma CVD apparatus used in this example for depositing silicon nitride is shown in FIG.
プラズマCVD装置は、窒化ケイ素の沈着を行
なわせる反応管1の下部に原料ガスを供給する供
給系、上部に排気系を配置した構造である。 The plasma CVD apparatus has a structure in which a supply system for supplying raw material gas is arranged at the lower part of a reaction tube 1 in which silicon nitride is deposited, and an exhaust system is arranged at the upper part.
縦型の反応管1は、石英で作られ、反応管1の
内部に、レンズ成形用型の基板2を設置する。反
応管1の外側に取付けられヒーター3により基板
2は加熱される。基板2の温度は、熱電対4によ
り検出され、一定に保たれる。 A vertical reaction tube 1 is made of quartz, and a lens molding mold substrate 2 is installed inside the reaction tube 1. The substrate 2 is heated by a heater 3 attached to the outside of the reaction tube 1. The temperature of the substrate 2 is detected by a thermocouple 4 and kept constant.
原料ガスは、反応管1の下部に設置されたガス
供給系により反応管1に供給される。原料の塩化
ケイ素を気化させるバブラー5は、20℃に保たれ
た恒温槽6の中に設置されている。原料の塩化ケ
イ素は、バブラー5で気化され、マスフローコン
トローラ7aにより流量調節されたキヤリアガス
H2と共に混合器8に送り込まれる。一方、原料
のN2ガスもマスフローコントローラ7bで流量
調節され、混合器8に流入する。キヤリアガスの
H2、原料の塩化ケイ素およびN2とが、混合器8
で混合される。 The raw material gas is supplied to the reaction tube 1 by a gas supply system installed at the bottom of the reaction tube 1. A bubbler 5 that vaporizes silicon chloride as a raw material is installed in a constant temperature bath 6 maintained at 20°C. Silicon chloride as a raw material is vaporized in a bubbler 5, and a carrier gas whose flow rate is adjusted by a mass flow controller 7a is used.
It is fed into the mixer 8 together with H 2 . On the other hand, the flow rate of the raw material N 2 gas is also regulated by the mass flow controller 7b and flows into the mixer 8. carrier gas
H 2 , raw material silicon chloride and N 2 are mixed in a mixer 8
mixed in.
混合されたN2、H2および塩化ケイ素は反応管
1の下部より反応管1内に導入される。また、全
体のH2量を一定に保つために、別のラインから、
マスフローコントローラ7cにより流量調節され
たH2が反応管1の下部より反応管1内に供給さ
れる。 The mixed N 2 , H 2 and silicon chloride are introduced into the reaction tube 1 from the lower part of the reaction tube 1 . Also, in order to keep the overall amount of H2 constant, from another line,
H 2 whose flow rate is adjusted by the mass flow controller 7c is supplied into the reaction tube 1 from the lower part of the reaction tube 1.
反応管1に供給された原料の塩化ケイ素および
N2は、R.F.ジエネレータ9、マツチングボツク
ス10、ワークコイル11によりプラズマ化さ
れ、窒化ケイ素が基板2の鏡面に沈着する。 Silicon chloride as a raw material supplied to reaction tube 1 and
N2 is turned into plasma by the RF generator 9, matching box 10, and work coil 11, and silicon nitride is deposited on the mirror surface of the substrate 2.
油回転ポンプ12により反応管1内の排気が行
われる。排出された気体中に存在する未反応ガス
および反応副生成物は、油回転ポンプ12と反応
管1との間に設置されたトラツプ13で除去され
る。 The interior of the reaction tube 1 is evacuated by the oil rotary pump 12. Unreacted gas and reaction by-products present in the discharged gas are removed by a trap 13 installed between the oil rotary pump 12 and the reaction tube 1.
また、反応管1内の圧力はピラニゲージ14に
より制御される。 Further, the pressure inside the reaction tube 1 is controlled by a Pirani gauge 14.
以上説明してきたプラズマCVD装置を用いて、
第1実施例として、次の条件で炭化タングステン
の基板に窒化ケイ素の沈着を行なつた。反応温度
は900℃、反応管1内の圧力は0.3torrで、塩化ケ
イ素およびH2の混合ガス流量は300ml/min、N2
のガス流量は100ml/min、別ラインで供給され
るH2のガス流量は450ml/minで反応時間は1時
間とした。基板2は面粗度約100Åの工学的鏡面
に加工したものを用いた。反応により基板2の鏡
面に厚さ約1μmの窒化ケイ素が沈着した。窒化
ケイ素により被覆された鏡面の面粗度は、第2図
に示すように120ÅRzであり、鏡面の面粗度は保
たれていた。 Using the plasma CVD equipment explained above,
As a first example, silicon nitride was deposited on a tungsten carbide substrate under the following conditions. The reaction temperature was 900°C, the pressure inside reaction tube 1 was 0.3 torr, the mixed gas flow rate of silicon chloride and H 2 was 300 ml/min, and N 2
The gas flow rate was 100 ml/min, the gas flow rate of H 2 supplied from a separate line was 450 ml/min, and the reaction time was 1 hour. The substrate 2 used was one processed into an engineering mirror surface with a surface roughness of about 100 Å. As a result of the reaction, silicon nitride with a thickness of about 1 μm was deposited on the mirror surface of the substrate 2. The surface roughness of the mirror surface coated with silicon nitride was 120 ÅRz, as shown in FIG. 2, and the surface roughness of the mirror surface was maintained.
また、第2実施例として、炭化タングステンの
基板2に、次の条件で、窒化ケイ素を沈着させ
た。反応温度は1050℃、反応管1内の圧力は
1torrで、塩化ケイ素とH2との混合ガス流量を
300ml/min、N2ガス流量を60ml/min、別ライ
ンで供給するH2ガス流量を150ml/minに調節
し、反応時間を30分とした。 Further, as a second example, silicon nitride was deposited on a tungsten carbide substrate 2 under the following conditions. The reaction temperature is 1050℃, and the pressure inside reaction tube 1 is
Mixed gas flow rate of silicon chloride and H2 at 1 torr
The reaction time was adjusted to 300 ml/min, the N 2 gas flow rate to 60 ml/min, and the H 2 gas flow rate supplied from a separate line to 150 ml/min, and the reaction time was 30 minutes.
反応により窒化ケイ素が基板2上に沈着し、厚
さ約1.8μmの被覆層が形成され、第1実施例と同
様の光学性能の面が得らた。 As a result of the reaction, silicon nitride was deposited on the substrate 2, forming a coating layer with a thickness of about 1.8 μm, and the same optical performance as in the first example was obtained.
一方、窒化ケイ素の被覆層による耐酸化性能を
調べるために次の実験を行なつた。 On the other hand, the following experiment was conducted to investigate the oxidation resistance of the silicon nitride coating layer.
全く被覆層のない炭化タングステンの基板試料
と、炭化タングステンの基板に厚さ約1μmの窒
化ケイ素を被覆した試料とを600℃に保たれた大
気中に10時間放置した。その後、面粗度の測定を
行なつた結果、窒化ケイ素を被覆した試料は面粗
度に変化が認められなかつたが、被覆していなか
つた試料は、酸化による肌荒れで面粗度が550Å
Rzに変化していた。 A tungsten carbide substrate sample without any coating layer and a sample in which a tungsten carbide substrate was coated with silicon nitride to a thickness of about 1 μm were left in the atmosphere maintained at 600° C. for 10 hours. After that, we measured the surface roughness and found that there was no change in the surface roughness of the sample coated with silicon nitride, but the surface roughness of the uncoated sample was 550 Å due to roughness due to oxidation.
It had changed to Rz.
[発明の効果]
加工が比較的容易な炭化タングステンを高い形
状精度、細かい面粗度(200Å以下)の鏡面に加
工し、その鏡面に低温プラズマCVD法により厚
さ0.2〜2μmの薄い窒化ケイ素層を被覆しても、
面粗度および形状精度に影響がないため、被覆後
の仕上げ加工を必要としない。従つて、チツピン
グを起しやすい窒化ケイ素層を加工しなくてよ
い。また被覆層が非常に薄いためガラスレンズ成
形時に被覆層がチツピングを起す必配がない。ま
た、窒化ケイ素層で基板を被覆することにより耐
酸化性が著しく向上するため、型の寿命を長くす
ることができる。[Effects of the invention] Tungsten carbide, which is relatively easy to process, is processed into a mirror surface with high shape accuracy and fine surface roughness (200 Å or less), and a thin silicon nitride layer with a thickness of 0.2 to 2 μm is applied to the mirror surface using a low-temperature plasma CVD method. Even if it is covered with
There is no need for finishing machining after coating, as it does not affect surface roughness or shape accuracy. Therefore, there is no need to process the silicon nitride layer, which is prone to chipping. Furthermore, since the coating layer is very thin, there is no possibility that the coating layer will cause chipping during molding of the glass lens. Furthermore, coating the substrate with a silicon nitride layer significantly improves oxidation resistance, thereby extending the life of the mold.
第1図は本発明の型製造のための低温プラズマ
CVD装置図、第2図は窒化ケイ素を被覆した後
の面粗度の測定結果を示す図である。
1…反応管、2…基板、3…ヒーター、4…熱
電対、5…バブラー、6…恒温槽、7a,7b,
7c…マスフローコントローラ、8…混合器、9
…R.F.ジエネレータ、10…マツチングボツク
ス、11…ワークコイル、12…油回転ポンプ、
13…トラツプ、14…ピラニーゲージ。
Figure 1 shows low-temperature plasma for mold manufacturing according to the present invention.
The CVD apparatus diagram and FIG. 2 are diagrams showing the measurement results of the surface roughness after coating with silicon nitride. DESCRIPTION OF SYMBOLS 1... Reaction tube, 2... Substrate, 3... Heater, 4... Thermocouple, 5... Bubbler, 6... Constant temperature bath, 7a, 7b,
7c...Mass flow controller, 8...Mixer, 9
...RF generator, 10...Matching box, 11...Work coil, 12...Oil rotary pump,
13...Trap, 14...Pirani gauge.
Claims (1)
た基板に、0.2〜2μm厚みの窒化ケイ素層を被覆
させることからなるガラスレンズ用型の製造方
法。 2 鏡面を有する基板の材質が炭化タングステン
である特許請求の範囲第1項記載のガラスレンズ
成形用型の製造方法。 3 基板のガラス成形面を光学的鏡面に研磨した
後、鏡面精度が損われない程度に、プラズマ
CVD法を用いて窒化ケイ素で被覆することを特
徴とする特許請求の範囲第1項記載のガラスレン
ズ成形用型の製造方法。 4 プラズマCVD法による窒化ケイ素の被覆を
約900℃で行う特許請求の範囲第1項記載のガラ
スレンズ成形用型の製造方法。[Scope of Claims] 1. A method for manufacturing a mold for a glass lens, which comprises coating a substrate finished with an optical mirror surface with a surface roughness of 200 Å or less with a silicon nitride layer having a thickness of 0.2 to 2 μm. 2. The method for manufacturing a glass lens mold according to claim 1, wherein the material of the substrate having a mirror surface is tungsten carbide. 3 After polishing the glass molding surface of the substrate to an optical mirror surface, apply plasma to an extent that does not impair mirror precision.
2. A method for manufacturing a mold for molding a glass lens according to claim 1, wherein the mold is coated with silicon nitride using a CVD method. 4. The method for manufacturing a mold for molding a glass lens according to claim 1, wherein the silicon nitride coating is carried out at about 900° C. by plasma CVD.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12432585A JPS61286235A (en) | 1985-06-10 | 1985-06-10 | Mold for molding glass lens and preparation of the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12432585A JPS61286235A (en) | 1985-06-10 | 1985-06-10 | Mold for molding glass lens and preparation of the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61286235A JPS61286235A (en) | 1986-12-16 |
| JPH0224770B2 true JPH0224770B2 (en) | 1990-05-30 |
Family
ID=14882543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12432585A Granted JPS61286235A (en) | 1985-06-10 | 1985-06-10 | Mold for molding glass lens and preparation of the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61286235A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3729281A1 (en) * | 1987-09-02 | 1989-03-16 | Schott Glaswerke | METHOD FOR PRODUCING PRESSED GLASS MOLDED BODIES FOR PRECISION-OPTICAL PURPOSES |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61174128A (en) * | 1985-01-28 | 1986-08-05 | Sumitomo Electric Ind Ltd | Lens molding mold |
-
1985
- 1985-06-10 JP JP12432585A patent/JPS61286235A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61286235A (en) | 1986-12-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |