JPH0226722B2 - - Google Patents
Info
- Publication number
- JPH0226722B2 JPH0226722B2 JP14828281A JP14828281A JPH0226722B2 JP H0226722 B2 JPH0226722 B2 JP H0226722B2 JP 14828281 A JP14828281 A JP 14828281A JP 14828281 A JP14828281 A JP 14828281A JP H0226722 B2 JPH0226722 B2 JP H0226722B2
- Authority
- JP
- Japan
- Prior art keywords
- measured
- strain
- points
- measuring
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 claims description 21
- 238000006073 displacement reaction Methods 0.000 claims description 13
- 239000003989 dielectric material Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 description 10
- 239000002184 metal Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 229910000856 hastalloy Inorganic materials 0.000 description 1
- 229910001026 inconel Inorganic materials 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B7/22—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in capacitance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Description
【発明の詳細な説明】
本発明は、ひずみの測定方法、特に、2点間の
変位を測定し、この2点間で囲まれる範囲のひず
みを測定するひずみの測定方法および測定装置に
関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a strain measuring method, and particularly to a strain measuring method and a measuring device that measure displacement between two points and measure strain in a range surrounded by these two points. be.
従来、高温(ここでは高温とは、有機材料が安
定した性能を発揮できない温度領域とする)にお
けるひずみ測定には、(1)ひずみ検出器のひずみ検
出部分を直接高温の被測定物に接触させる方法、
(2)検出棒により被測定物に生じる変形を外部で測
定する方法、(3)光学的方法がある。このうち、(1)
の方法には、溶接型抵抗線ひずみゲージ、また
は、溶接型容量型高温ゲージが用いられるが、何
れも、ゲージ長が10mm以上となるため、切欠き底
あるいはフイレツトコーナ部等の局部ひずみの測
定には用いることができない。また、抵抗線ひず
みゲージは大ひずみの繰返しで疲労により破断す
る欠点がある。そして、(2)および(3)の方法は空間
的制約があるため測定位置が厳しく限定される。 Conventionally, strain measurement at high temperatures (here, high temperature is defined as a temperature range in which organic materials cannot exhibit stable performance) involves (1) bringing the strain detection part of a strain detector into direct contact with a high-temperature object to be measured; Method,
There are two methods: (2) a method of externally measuring the deformation that occurs in the object to be measured using a detection rod, and (3) an optical method. Of these, (1)
In this method, welded resistance wire strain gauges or welded capacitive high temperature gauges are used, but since the gauge length is 10 mm or more, they are not suitable for measuring local strain at the bottom of a notch or fillet corner. cannot be used. Furthermore, resistance wire strain gauges have the disadvantage of breaking due to fatigue when subjected to repeated large strains. Furthermore, methods (2) and (3) have spatial constraints, so the measurement positions are strictly limited.
この他に、両端部で接合された同一方向に凸な
曲率半径の異なる二枚の板状弾性体の間に、これ
らの板状弾性体のそれぞれに固定され相対向する
二枚の電極が設けられ、この二枚の電極間の電気
容量を測定する手段を有するものを、その両端部
で被測定物にスポツト溶接し、被測定物にスポツ
ト溶接した板状弾性体の両端間の距離の変化に伴
う二枚の板状弾性体の変形によつておこる二枚の
電極間の静電容量の変化を測定して2点間のひず
みを測定する方法も用いられている。この方法は
電気抵抗型ひずみゲージに比べて、くり返して測
定を行う場合における測定値の変化は小さくはな
るが、スポツト溶接される両端間の長さは約25mm
あるため、前述の方法と同様に、切欠き底、ある
いはフイレツトコーナ部等の局部ひずみの測定に
は用いることができない。 In addition, two electrodes fixed to each of these elastic plates and facing each other are provided between two elastic plates having different radii of curvature and convex in the same direction, which are joined at both ends. A plate-like elastic body having a means for measuring the capacitance between the two electrodes is spot-welded to the object to be measured at both ends, and the change in the distance between the two ends of the plate-shaped elastic body spot-welded to the object to be measured is measured. A method is also used in which the strain between two points is measured by measuring the change in capacitance between two electrodes caused by the deformation of two elastic plates. Compared to electric resistance strain gauges, this method results in smaller changes in measured values when repeated measurements are taken, but the length between the two ends to be spot welded is approximately 25 mm.
Therefore, like the above-mentioned method, it cannot be used to measure local strain at the bottom of a notch or a fillet corner.
本発明は、これらの欠点を除去し、高温環境下
でかつ応力集中部等の測定空間の狭い部分のひず
みの測定を可能とすることを目的とし、2点間の
変位を測定し、この2点間で囲まれる範囲のひず
みを測定する方法において、相対向する二枚の薄
板状の電極の一端を所定の距離に保持し、変位可
能な他端を被測定物に当接させ、2点間の変位に
基づく電気電極間の静電容量変化を測定して2点
間のひずみを測定することを第1の特徴とし、2
点間の変位を測定し、該2点間で囲まれる範囲の
ひずみを測定する装置において、一端が所定の距
離に保持されて固定され、他端が変位可能に被測
定物に当接させる相対向する二枚の薄板状の電極
と、該相対向する二枚の電極間の被測定物に当接
している他端の位置の相対変位を、被測定物に当
接している二枚の電極間の静電容量の変化として
測定する手段とを備えていることを第2の特徴と
し、2点間の変位を測定し、該2点間で囲まれる
範囲のひずみを測定する装置において、表面に誘
電体が被着された相対向する二枚の薄板状の電極
と、該電極の一端側に設けられ被測定物に当接さ
せる絶縁部材と、前記電極に誘電体を介して設け
られ、温度変化に伴う電極の静電容量変化を補償
する補償電極とを備えていることを第3の特徴と
するものである。 The purpose of the present invention is to eliminate these drawbacks and make it possible to measure strain in a narrow part of the measurement space, such as a stress concentration area, in a high-temperature environment. In the method of measuring strain in a range surrounded by points, one end of two thin plate-shaped electrodes facing each other is held at a predetermined distance, the other movable end is brought into contact with the object to be measured, and two points are measured. The first feature is that the strain between two points is measured by measuring the capacitance change between the electric electrodes based on the displacement between them, and the second feature is that the strain between two points is measured.
In a device that measures the displacement between points and the strain in the range surrounded by the two points, one end is held and fixed at a predetermined distance, and the other end is movably brought into contact with the object to be measured. The relative displacement of the position of the other end in contact with the object to be measured between two thin plate electrodes facing each other and the two electrodes in contact with the object to be measured is calculated as follows: A second feature of the device is that the device measures displacement between two points and measures strain in a range surrounded by the two points. two thin plate-shaped electrodes facing each other with a dielectric adhered thereto; an insulating member provided at one end of the electrode and brought into contact with the object to be measured; and an insulating member provided on the electrode via the dielectric, A third feature is that the device includes a compensation electrode that compensates for changes in capacitance of the electrodes due to temperature changes.
すなわち、微少な2点間の位置の相対変位をそ
れに当接させた2個の導体間の静電容量の変化と
して測定することを可能としたものである。 In other words, it is possible to measure a minute relative displacement between two points as a change in capacitance between two conductors that are in contact with it.
2枚の金属板の静電容量Cは、金属板の間隔を
D、金属板の対向面積Sおよび金属板間の比誘電
率をεとすれば、
C=A・ε・S/D ……(1)
となる。したがつて、環境温度および金属板間の
間隔が変化した場合には、
ΔC/C=Δε/ε−ΔD/D ……(2)
となり、Δε/εを補償すれば、ΔCを電気的に測
定することにより、ΔDを測定することができ
る。Δε/εの補償は、同じ温度にさらされる第
3の金属板を対向する2枚の金属板の一方に設置
し、ΔC測定用の電気平衝回路のダミーとして使
用することにより行うことができる。 The capacitance C of two metal plates is as follows: C=A・ε・S/D, where D is the distance between the metal plates, S is the facing area of the metal plates, and ε is the relative dielectric constant between the metal plates. (1) becomes. Therefore, when the environmental temperature and the distance between the metal plates change, ΔC/C=Δε/ε−ΔD/D...(2) If Δε/ε is compensated, ΔC can be changed electrically. By measuring, ΔD can be determined. Compensation for Δε/ε can be achieved by placing a third metal plate exposed to the same temperature on one of the two opposing metal plates and using it as a dummy in the electrical balancing circuit for measuring ΔC. .
以下、実施例について説明する。 Examples will be described below.
第1図は、本発明のひずみの測定装置の一実施
例の要部断面図で、1および2は、例えば、
SUS304、インコネル(商品名)、ハステロイX
(商品名)等よりなる金属板(以下電極と称す
る)、3aおよび3bは電極1および2の先端に
取り付けられ被測定物4に点接触するように設け
られている、例えば、マコール(商品名)のよう
な耐熱性の磁器よりなる絶縁部材、5aは電極1
および2の両面に被覆されている、例えば、アル
ミナ(Al2O3)のような耐熱性の誘電体、6は電
極2に誘電体5bを介して固着されている温度補
償用の電極、7a,7bおよび7cは容量測定用
平衝回路を構成するリード線、A,Bは絶縁部材
3aおよび3bが被測定物4に接している点を示
している。 FIG. 1 is a sectional view of a main part of an embodiment of the strain measuring device of the present invention, and 1 and 2 are, for example,
SUS304, Inconel (product name), Hastelloy X
Metal plates (hereinafter referred to as electrodes), 3a and 3b, are attached to the tips of the electrodes 1 and 2 and are provided in point contact with the object 4 to be measured. ), 5a is the electrode 1
and 2 is coated with a heat-resistant dielectric such as alumina (Al 2 O 3 ); 6 is a temperature compensation electrode fixed to the electrode 2 via the dielectric 5b; 7a; , 7b and 7c are lead wires constituting a capacitance measurement balancing circuit, and A and B indicate points where the insulating members 3a and 3b are in contact with the object to be measured 4.
このひずみの測定装置は、第2図の実線で示す
ように、電極1および2が平行な状態で被測定物
4の表面に絶縁部材3aおよび3bによつて設置
され、電極1および2の一端は支持部8に固定さ
れる。Dはこの状態における電極1と電極2との
間隔、Lは絶縁部材3aと3bとの間の距離を示
している。 This strain measuring device is installed on the surface of the object to be measured 4 with insulating members 3a and 3b, with electrodes 1 and 2 parallel to each other, and one end of the electrodes 1 and 2. is fixed to the support part 8. D indicates the distance between electrode 1 and electrode 2 in this state, and L indicates the distance between insulating members 3a and 3b.
いま、被測定物4に力が作用し、A点とB点と
の間に第2図の点線で示すような相対変位が生
じ、A点とB点との間隔がLから広がつてL+
ΔLになつたとすると、このときの電極1と電極
2との間隔は、被測定物側で、D+ΔL、その反
対側でDとなる。すなわち、2電極間の距離の相
対変位量は、横軸、縦軸にそれぞれ電極の端部か
らの距離X、ΔDを示してある第3図の示すよう
に、OからΔLまで直線的に変化する。 Now, a force acts on the object to be measured 4, and a relative displacement occurs between points A and B as shown by the dotted line in Figure 2, and the distance between points A and B increases from L to L+.
Assuming that ΔL is reached, the distance between electrode 1 and electrode 2 at this time is D+ΔL on the side to be measured, and D on the opposite side. In other words, the relative displacement of the distance between the two electrodes changes linearly from O to ΔL, as shown in Figure 3, where the horizontal and vertical axes show the distances X and ΔD from the ends of the electrodes, respectively. do.
次に、このひずみの測定方法における静電容量
の変化量の計算を第4図を用いて説明する。電極
の長さがa幅がbで電極の絶縁部材間の間隔の広
がりがΔLである場合には、全体の容量変化は、
C=εa・b/D ……(3)
dx・bの面素による静電容量dCは、
dC=ε・b・dx/D ……(4)
dx・bの面素の間隔がDからD+Δl・x/aに変化
した場合の容量d(C+ΔC)は、
d(C+ΔC)=ε・b・dx/D+Δl・x/a……(5
)
d(ΔC)=ε・b(−Δl/ax・dx)/D ……(6)
よつて、
ΔC=∫a pd(ΔC)=∫a pε・b・(−Δl/a)/D
x・dx
=−ε・b・a/2・Δl/D=−Δl×C/2D……(7
)
ΔC/C=−Δl/2D ……(8)
従つて、電極1と電極2との間隔の変化Δlは
2つの電極1,2間の容量変化ΔCに比例する。
ΔCは第5図に示すような電気平衝回路により不
平衝量ΔEを測定することよつて求めることがで
きる。第5図で、CAは電極1と電極2との間の
静電容量、CDは電極2と電極6との間の静電容
量、ROは固定抵抗、Rbalはバランス抵抗で、L1,
L2,L3には第1図に示したリード線7a,7b,
7cが接続される。 Next, calculation of the amount of change in capacitance in this strain measurement method will be explained using FIG. 4. When the length of the electrode is a, the width is b, and the spread of the distance between the insulating members of the electrode is ΔL, the overall capacitance change is C=εa・b/D...(3) The surface of dx・b The electrostatic capacitance dC due to the element is dC=ε・b・dx/D...(4) When the distance between the surface elements of dx・b changes from D to D+Δl・x/a, the capacitance d(C+ΔC) is, d(C+ΔC)=ε・b・dx/D+Δl・x/a...(5
) d(ΔC)=ε・b(−Δl/ax・dx)/D……(6) Therefore, ΔC=∫ a p d(ΔC)=∫ a p ε・b・(−Δl/a) /D
x・dx =−ε・b・a/2・Δl/D=−Δl×C/2D……(7
) ΔC/C=−Δl/2D (8) Therefore, the change Δl in the distance between electrode 1 and electrode 2 is proportional to the capacitance change ΔC between the two electrodes 1 and 2.
ΔC can be determined by measuring the imbalance amount ΔE using an electrical equalization circuit as shown in FIG. In Figure 5, C A is the capacitance between electrodes 1 and 2, C D is the capacitance between electrodes 2 and 6, R O is a fixed resistance, and R bal is a balanced resistance. L1 ,
L 2 and L 3 have lead wires 7a and 7b shown in FIG.
7c is connected.
第6図は、本発明のひずみの測定方法の一実施
例として、切欠部の測定を行う場合の取付け方法
説明する断面図であり、第1図と同一部分には同
一符号が付してあり、9は電極1,2を被測定物
4に当接させる押え治具で、この押え治具9は底
部に電極1,2の支持部となる係合部10を有
し、被測定物4側には鍔部11が設けられ胴部中
間にベローズ12が設けられている。 FIG. 6 is a cross-sectional view illustrating a mounting method when measuring a notch as an embodiment of the strain measuring method of the present invention, and the same parts as in FIG. 1 are given the same reference numerals. , 9 is a holding jig for bringing the electrodes 1 and 2 into contact with the object to be measured 4, and this holding jig 9 has an engaging portion 10 at the bottom that serves as a support for the electrodes 1 and 2, and A flange 11 is provided on the side, and a bellows 12 is provided in the middle of the body.
このひずみの測定装置を用いてひずみの測定を
行なうには、電極1,2をその絶縁部材3a,3
bの先端A,Bが被測定物4の切欠部の内壁に接
触する如く設置した後、押え治具9をかぶせ、そ
の鍔部11を被測定物4にスポツト溶接で固着す
る。この押え治具9にはベローズ12が設けられ
ているので、電極1,2の支持部を係合部10で
固定し、かつ、電極1,2を被測定物4に弾性的
に当接させることができる。そして、リード線7
a,7bおよび7cをそれぞれ第5図のL1,L2
およびL3に接続して測定が行なわれる。なお、
この押え治具9は、被測定物4が高温となる場合
に用いられる断熱被覆材13が電極1,2に触れ
るのを防ぐ保護カバーの役割もはたしている。な
お、この押え治具は、断面U字型の帯状部材で構
成しても、あるいは筒状型のキヤツプ状部材で構
成してもよい。 To measure strain using this strain measuring device, electrodes 1 and 2 are connected to their insulating members 3a and 3.
After the tips A and B of b are installed so that they are in contact with the inner wall of the notch of the object to be measured 4, the holding jig 9 is placed over the holding jig 9, and the flange 11 is fixed to the object to be measured 4 by spot welding. Since this holding jig 9 is provided with a bellows 12, the supporting parts of the electrodes 1 and 2 are fixed by the engaging part 10, and the electrodes 1 and 2 are brought into elastic contact with the object to be measured 4. be able to. And lead wire 7
a, 7b and 7c as L 1 and L 2 in Fig. 5, respectively.
and L 3 for measurements. In addition,
This holding jig 9 also serves as a protective cover that prevents the heat insulating coating 13 used when the object to be measured 4 reaches a high temperature from touching the electrodes 1 and 2. Note that this holding jig may be constructed of a band-like member having a U-shaped cross section, or may be constructed of a cylindrical cap-like member.
第7図は、本発明のひずみの測定方法の他の実
施例として、フイレツト部の測定を行う場合の取
付け方法を説明する断面図であり、第6図と同一
部分には同一符号が付してある。この実施例が第
6図の実施例と異る点は、押え治具9の形状が異
なる点で、押え治具9の鍔部11が、被測定物4
の直角をなす二辺に取付け可能な形状になつてい
る点で、その作用、効果は、第6図の実施例の場
合と同様である。 FIG. 7 is a sectional view illustrating an installation method when measuring a fillet portion as another embodiment of the strain measuring method of the present invention, and the same parts as in FIG. 6 are given the same reference numerals. There is. This embodiment differs from the embodiment shown in FIG. 6 in that the shape of the presser jig 9 is different, and the flange 11 of the presser jig 9 is attached to the object to be measured.
The function and effect are the same as those of the embodiment shown in FIG. 6 in that the shape is such that it can be attached to two sides forming a right angle to each other.
これらの実施例のひずみの測定装置は、薄板状
の電極を用い、電極表面に耐熱性誘電体を使用
し、電極を薄くし、約1〜0.5mm程度までの厚さ
とすることができるため、高温で、非常に小さい
領域の2点間の距離の変化量を測定することがで
きる。そして、切欠きあるいはフイレツトコーナ
等の局部ひずみの測定方法を行なうことができる
のみならず、くり返しによる測定値の変化は殆ん
ど生せず、測定精度の高い測定を行なうことがで
きる。 The strain measuring device of these embodiments uses a thin plate-like electrode, uses a heat-resistant dielectric material on the electrode surface, and can make the electrode thin and have a thickness of about 1 to 0.5 mm. At high temperatures, it is possible to measure the change in distance between two points over a very small area. Not only is it possible to measure local strains such as notches or fillet corners, but there is almost no change in measured values due to repeated measurements, making it possible to perform highly accurate measurements.
すなわち、本発明のひずみの測定方法および測
定装置は、高温環境下でかつ応力集中部等の測定
空間の狭い部分のひずみの測定を可能とするもの
で、産業上の効果の大なるものである。 That is, the strain measuring method and measuring device of the present invention can measure strain in a narrow part of the measurement space such as a stress concentration area in a high temperature environment, and has a great industrial effect. .
第1図は、本発明のひずみの測定装置の一実施
例の要部断面図、第2図は同じく電極間の位置関
係の説明図、第3図は同じく電極内の位置と電極
間隔との関係を示す線図、第4図は静電容量の変
化量の計算のための説明図、第5図は、本発明の
ひずみの測定装置の一実施例の静電容量測定用の
電気平衝回路の回路図、第6図および第7図は、
本発明のひずみの測定方法のそれぞれ異なる実施
例を説明する断面図である。
1,2……電極、3a,3b……絶縁部材、4
……被測定物、5a,5b……誘電体、6……温
度補償用の電極、7a,7b,7c……リード
線、9……押え治具、10……係合部、11……
鍔部、12……ベローズ。
FIG. 1 is a sectional view of a main part of an embodiment of the strain measuring device of the present invention, FIG. 2 is an explanatory diagram of the positional relationship between the electrodes, and FIG. 3 is a diagram showing the position within the electrodes and the electrode spacing. A diagram showing the relationship, FIG. 4 is an explanatory diagram for calculating the amount of change in capacitance, and FIG. 5 is an electrical balance diagram for capacitance measurement of an embodiment of the strain measuring device of the present invention. The circuit diagrams of the circuit, Figures 6 and 7, are
FIG. 3 is a cross-sectional view illustrating different embodiments of the strain measurement method of the present invention. 1, 2... Electrode, 3a, 3b... Insulating member, 4
...Object to be measured, 5a, 5b...Dielectric material, 6...Electrode for temperature compensation, 7a, 7b, 7c...Lead wire, 9...Press jig, 10...Engaging portion, 11...
Tsubabe, 12... bellows.
Claims (1)
範囲のひずみを測定する方法において、相対向す
る二枚の薄板状の電極の一端を所定の距離に保持
し、変位可能な他端を被測定物に当接させ、2点
間の変位に基づく前記電極間の静電容量変化を測
定して2点間のひずみを測定することを特徴とす
るひずみの測定方法。 2 前記相対向する二枚の薄板状の電極の他端
を、前記被測定物にほぼ垂直で、かつ、弾性的に
当接させる特許請求の範囲第1項記載のひずみの
測定方法。 3 前記電極の被測定物への弾性的な当接は、中
間部にベローズが設けられているU字型、又は筒
状型の押当て治具をその開口端で前記被測定物に
固着して行なわれる特許請求の範囲第2項記載の
ひずみ測定方法。 4 2点間の変位を測定し、該2点間で囲まれる
範囲のひずみを測定する装置において、一端が所
定の距離に保持されて固走され、他端が変位可能
に被測定物に当接させる相対向する二枚の薄板状
の電極と、該相対向する二枚の電極間の被測定物
に当接している他端の位置の相対変位を、被測定
物に当接している二枚の電極間の静電容量の変化
として測定する手段とを備えていることを特徴と
するひずみの測定装置。 5 2点間の変位を測定し、該2点間で囲まれる
範囲のひずみを測定する装置において、表面に誘
電体が被着された相対向する二枚の薄板状の電極
と、該電極の一端側に設けられ被測定物に当接さ
せる絶縁部材と、前記電極に誘電体を介して設け
られ、温度変化に伴う電極の静電容量変化を補償
する補償電極とを備えていることを特徴とするひ
ずみの測定装置。[Claims] 1. In a method of measuring displacement between two points and measuring strain in a range surrounded by the two points, one end of two thin plate electrodes facing each other is held at a predetermined distance. and the strain between the two points is measured by bringing the other displaceable end into contact with the object to be measured and measuring the change in capacitance between the electrodes based on the displacement between the two points. Measuring method. 2. The method for measuring strain according to claim 1, wherein the other ends of the two thin plate-like electrodes facing each other are brought into contact with the object to be measured substantially perpendicularly and elastically. 3. The elastic contact of the electrode to the object to be measured is achieved by fixing a U-shaped or cylindrical pressing jig with a bellows in the middle to the object to be measured at its open end. A strain measuring method according to claim 2, which is carried out. 4 In a device that measures displacement between two points and measures strain in the range surrounded by the two points, one end is held at a predetermined distance and runs fixedly, and the other end is movable and touches the object to be measured. The relative displacement of the position of two thin plate electrodes that are in contact with each other and the other end that is in contact with the object to be measured between the two electrodes that are in contact with the object to be measured is calculated as follows. A strain measuring device characterized by comprising: means for measuring changes in capacitance between two electrodes. 5. A device that measures the displacement between two points and the strain in the range surrounded by the two points, which consists of two thin plate-shaped electrodes facing each other with dielectrics coated on their surfaces, and It is characterized by comprising an insulating member provided on one end side and brought into contact with the object to be measured, and a compensation electrode provided on the electrode via a dielectric material to compensate for changes in capacitance of the electrode due to temperature changes. Strain measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14828281A JPS5850406A (en) | 1981-09-19 | 1981-09-19 | Strain measurement method and measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14828281A JPS5850406A (en) | 1981-09-19 | 1981-09-19 | Strain measurement method and measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5850406A JPS5850406A (en) | 1983-03-24 |
| JPH0226722B2 true JPH0226722B2 (en) | 1990-06-12 |
Family
ID=15449274
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14828281A Granted JPS5850406A (en) | 1981-09-19 | 1981-09-19 | Strain measurement method and measurement device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5850406A (en) |
-
1981
- 1981-09-19 JP JP14828281A patent/JPS5850406A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5850406A (en) | 1983-03-24 |
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