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JPH0227646B2 - - Google Patents
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JPH0227646B2 - - Google Patents

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Publication number
JPH0227646B2
JPH0227646B2 JP58054146A JP5414683A JPH0227646B2 JP H0227646 B2 JPH0227646 B2 JP H0227646B2 JP 58054146 A JP58054146 A JP 58054146A JP 5414683 A JP5414683 A JP 5414683A JP H0227646 B2 JPH0227646 B2 JP H0227646B2
Authority
JP
Japan
Prior art keywords
scanning optical
detector
optical system
scanning
aperture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58054146A
Other languages
Japanese (ja)
Other versions
JPS59178425A (en
Inventor
Tooru Tajime
Satoshi Wakabayashi
Toshio Takei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP58054146A priority Critical patent/JPS59178425A/en
Publication of JPS59178425A publication Critical patent/JPS59178425A/en
Publication of JPH0227646B2 publication Critical patent/JPH0227646B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10Scanning systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • Optical Radar Systems And Details Thereof (AREA)

Description

【発明の詳細な説明】 この発明は視野を例えばスパイラル走査し、視
野内の物体から放射される赤外線を検出し、物体
の方位情報を得るための走査形光学系の構成方法
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of configuring a scanning optical system for scanning a field of view in a spiral manner, detecting infrared rays emitted from an object within the field of view, and obtaining azimuth information of the object.

このような走査形光学系を利用した装置には追
尾装置がある。第1図をもとに従来の走査形光学
系の構成方法の一例を説明する。
A tracking device is an example of a device that uses such a scanning optical system. An example of a method for configuring a conventional scanning optical system will be explained based on FIG.

第1図において、3は検出器、9は1次鏡、1
0は1次鏡の反射面、11は1次鏡の非反射面、
12は2次鏡、13は回転軸、20は2次鏡の反
射面、21は2次鏡の非反射面、aは視野の端か
らの入射赤外線、bは視野の中心からの入射赤外
線、cは不要な赤外線である。なお、回転軸13
は走査形光学系の光軸に一致している。ここで、
1次鏡9と2次鏡12が走査光学部を構成してお
り、回転軸13に対してそれぞれ少しの角度傾
け、同期させて回転させることによつてスパイラ
ル走査やロゼツト走査を行う。なお、1次鏡9の
非反射面11は開口絞りの役割を果たしており、
2次鏡12には入射赤外線がケラレないように反
射面20が設けられている。
In Fig. 1, 3 is a detector, 9 is a primary mirror, 1
0 is the reflective surface of the primary mirror, 11 is the non-reflective surface of the primary mirror,
12 is a secondary mirror, 13 is a rotation axis, 20 is a reflective surface of the secondary mirror, 21 is a non-reflective surface of the secondary mirror, a is an incident infrared ray from the edge of the field of view, b is an incident infrared ray from the center of the field of view, c is unnecessary infrared rays. Note that the rotating shaft 13
coincides with the optical axis of the scanning optical system. here,
The primary mirror 9 and the secondary mirror 12 constitute a scanning optical section, and are tilted at a slight angle with respect to the rotation axis 13 and rotated in synchronization to perform spiral scanning or rosette scanning. Note that the non-reflective surface 11 of the primary mirror 9 plays the role of an aperture stop.
A reflective surface 20 is provided on the secondary mirror 12 so that the incident infrared rays are not obscured.

第1図に示した走査形光学系の構成方法では、
視野の端と視野の中心からの入射赤外線a,bの
光束が2次鏡12に当つている部分は1次鏡9の
回転によつて変位する。2次鏡12の反射面20
の大きさは入射赤外線a,bの光束がケラレない
ように設けられているから、例えば視野の中心か
らの入射赤外線bを受けているときには、2次鏡
12の反射面20の一部分しか使用していない。
In the configuration method of the scanning optical system shown in Fig. 1,
The portion where the incident infrared rays a and b from the edge of the field of view and the center of the field of view hit the secondary mirror 12 is displaced by the rotation of the primary mirror 9. Reflection surface 20 of secondary mirror 12
The size of is set so that the beams of incident infrared rays a and b are not eclipsed, so, for example, when receiving incoming infrared rays b from the center of the field of view, only a part of the reflecting surface 20 of the secondary mirror 12 is used. Not yet.

したがつて、検出器3は2次鏡12の反射によ
つて1次鏡9の反射面10や非反射面11以外の
光学系内部からの不要な赤外線c1,c2の放射を受
ける。前記光学系内部から検出器3に達する赤外
線量は、前記光学系内部に赤外線放射分布がある
と1次鏡9と2次鏡12の回転走査によつて検出
器3が見ている前記光学系内部の場所が変わるた
め変動する。また、前記光学系内部に赤外線放射
分布がなくても外界からの入射赤外線が検出器3
に入射する角度が走査によつて変化するため、外
界と光学系内部の温度が異なると検出器3に入射
する赤外線量が変化する。
Therefore, the detector 3 receives radiation of unnecessary infrared rays c 1 and c 2 from inside the optical system other than the reflective surface 10 and non-reflective surface 11 of the primary mirror 9 due to reflection from the secondary mirror 12 . If there is an infrared radiation distribution inside the optical system, the amount of infrared rays reaching the detector 3 from inside the optical system is determined by the rotational scanning of the primary mirror 9 and the secondary mirror 12. It fluctuates because the internal location changes. Furthermore, even if there is no infrared radiation distribution inside the optical system, incident infrared rays from the outside can be detected by the detector 3.
Since the angle at which the infrared rays enter the detector 3 changes depending on the scanning, the amount of infrared rays that enter the detector 3 changes if the outside world and the temperature inside the optical system differ.

さらに第2図は第1図に示した2次鏡12と検
出器3の部分の詳細図で、17はフード、18は
モータ、19はシヤフト、20はフードの一部分
である。2次鏡12はモータ18のシヤフト19
に取り付けられ回転軸走査するように構成されて
おり、2次鏡12の外径の形状は通常回転軸13
に平行な線に沿つてか、あるいは2次鏡12の反
射面20に垂直な線に沿つてカツトされている。
図において、2次鏡12が180゜回転すると、フー
ドの一部分20は検出器3から見ると2次鏡12
によつて見え隠れする。フード17はモータ18
の発熱によつて温度分布を有する上、2次鏡12
によつてフードの一部分20から放射される赤外
線がチヨツピングを受けるため検出器3に入射す
る赤外線の量が2次鏡12の走査と共に変化す
る。したがつて、従来の走査形光学系の構成方法
では赤外線放射の均一な視野を走査しても検出器
3の出力が変動し雑音となるため、装置の検出性
能が低下するという欠点があつた。
Furthermore, FIG. 2 is a detailed view of the secondary mirror 12 and the detector 3 shown in FIG. 1, in which 17 is a hood, 18 is a motor, 19 is a shaft, and 20 is a part of the hood. The secondary mirror 12 is connected to the shaft 19 of the motor 18.
The outer diameter of the secondary mirror 12 is usually attached to the rotation axis 13 and configured to scan the rotation axis.
The cut is made along a line parallel to or perpendicular to the reflective surface 20 of the secondary mirror 12.
In the figure, when the secondary mirror 12 is rotated 180 degrees, the portion 20 of the hood is visible from the secondary mirror 12 as seen from the detector 3.
appear and disappear depending on The hood 17 is the motor 18
The secondary mirror 12 has a temperature distribution due to the heat generated by the secondary mirror 12.
Since the infrared rays emitted from the hood portion 20 are subjected to chopping, the amount of infrared rays incident on the detector 3 changes as the secondary mirror 12 scans. Therefore, the conventional method of configuring a scanning optical system has the disadvantage that even if a uniform field of infrared radiation is scanned, the output of the detector 3 fluctuates and becomes noise, reducing the detection performance of the device. .

この発明はこれらの欠点を除去するために検出
器に最も近い走査光学部中に開口絞りを設けたも
ので、以下、図面によつて説明する。
In order to eliminate these drawbacks, the present invention provides an aperture stop in the scanning optical section closest to the detector, and will be explained below with reference to the drawings.

第3図はこの発明の一実施例であつて、1次鏡
9と2次鏡12がこの光学系の走査光学部を構成
している。第4図は第3図に示した2次鏡12を
回転軸13方向に投影したときの図で、15は非
反射面、16は反射面である。ここで非反射面1
5は開口絞りの役割を果しており、検出器3の受
光面上の任意の点と前記開口絞りの開口部である
2次鏡12の反射面16とを結ぶ光線は全て1次
鏡9の反射面10に当たるように1次鏡9の反射
面10の大きさは充分確保されておりケラレがな
いようになつている。このようにすれば視野の端
及び視野の中心からの入射赤外線a,bの光束の
広がりは前記開口絞りの開口部によつてのみ制限
されていることになり、入射赤外線が検出器3の
受光面に入射する角度は走査によつて変化しない
上、光学系内部からの不要な赤外線も検出器は受
けない。
FIG. 3 shows one embodiment of the present invention, in which a primary mirror 9 and a secondary mirror 12 constitute a scanning optical section of this optical system. FIG. 4 is a diagram of the secondary mirror 12 shown in FIG. 3 projected in the direction of the rotation axis 13, where 15 is a non-reflective surface and 16 is a reflective surface. Here, non-reflective surface 1
5 plays the role of an aperture stop, and all light rays connecting any point on the light-receiving surface of the detector 3 and the reflecting surface 16 of the secondary mirror 12, which is the aperture of the aperture stop, are reflected by the primary mirror 9. The size of the reflective surface 10 of the primary mirror 9 is ensured to be sufficient so that it hits the surface 10, so that there is no vignetting. In this way, the spread of the incident infrared rays a and b from the edge of the field of view and the center of the field of view is limited only by the aperture of the aperture stop, and the incident infrared rays are received by the detector 3. The angle of incidence on the surface does not change due to scanning, and the detector does not receive unnecessary infrared rays from inside the optical system.

また第5図に示すように、検出器3の受光面を
含む平面と回転軸13との交点から2次鏡12の
外周部を見込む角度が回転軸13に対して回転対
称になるように2次鏡13の形状は構成されてい
るものとする。このとき前記交点からフード17
を見る部分は2次鏡12の回転走査によつて変化
することはない。
Furthermore, as shown in FIG. It is assumed that the shape of the secondary mirror 13 is configured. At this time, from the intersection point to the hood 17
The part viewed does not change due to rotational scanning of the secondary mirror 12.

したがつて検出器3の受光面の形状あるいは前
記開口絞りの形状が回転軸13に対して回転対称
であると検出器3の受光面全体にわたつてみたと
きの検出器3へ集光される赤外線量は2次鏡12
の回転走査によつて変化しない。
Therefore, if the shape of the light-receiving surface of the detector 3 or the shape of the aperture stop is rotationally symmetrical with respect to the rotation axis 13, the light will be focused on the detector 3 when viewed over the entire light-receiving surface of the detector 3. The amount of infrared rays is secondary mirror 12
does not change due to rotational scanning.

したがつて、この発明によれば検出器3へ集光
される赤外線量は2次鏡12の回転走査によつて
変化しないから、赤外線放射の均一な視野を走査
すれば検出器3の出力も一定となり、検出性能の
優れた走査形光学系を構成できる利点がある。
Therefore, according to the present invention, since the amount of infrared light focused on the detector 3 does not change due to rotational scanning of the secondary mirror 12, the output of the detector 3 also changes if a uniform field of infrared radiation is scanned. This has the advantage of being able to constitute a scanning optical system with excellent detection performance.

なお、以上は2次鏡として傾けた反射鏡を用い
た走査光学部の場合について説明したが、ウエツ
ジ形裏面鏡を回転軸に垂直に配置した走査光学部
を用いた場合についてもこの発明を適用できる。
また1次鏡、2次鏡あるいはウエツジ裏面鏡の形
状は球面以外の曲面を用いてもよいことは言う迄
もない。
Although the above description has been made regarding the case of a scanning optical section that uses an inclined reflecting mirror as a secondary mirror, the present invention can also be applied to a case where a scanning optical section that uses a wedge-shaped back mirror arranged perpendicularly to the rotation axis is used. can.
It goes without saying that the primary mirror, secondary mirror, or wedge back mirror may have a curved surface other than a spherical surface.

また、以上は走査光学部が2つの場合について
説明したが、例えば視野をコニカル走査するため
に2次鏡のみを回転軸に対して傾けた単一の走査
光学部から成る走査形光学系の場合にも前記走査
光学部に対して今迄に述べてきたことを適用すれ
ば同様な効果を有することは言う迄もない。
In addition, although the case where there are two scanning optical sections has been described above, for example, in the case of a scanning optical system consisting of a single scanning optical section in which only the secondary mirror is tilted with respect to the rotation axis in order to perform conical scanning of the field of view. It goes without saying that the same effect can be obtained if what has been described so far is applied to the scanning optical section.

以上のように、この発明に係る走査形光学系の
構成方法では、検出器に最も近い第1の走査光学
部中に開口絞りを設けると共に、検出器の受光面
上の任意の点と開口絞りを結ぶ光線がレンズ枠等
によつてケラレのないように構成することによつ
て光学系内部の赤外線放射分布の影響を受けず、
かつ入射赤外線による検出器受光面上の赤外線量
も走査によつて変化しないようにできるため検出
性能の優れた光学系を実現できる効果を有する。
As described above, in the method for configuring a scanning optical system according to the present invention, an aperture stop is provided in the first scanning optical section closest to the detector, and an arbitrary point on the light-receiving surface of the detector is connected to the aperture stop. By configuring the light rays connecting them so that they are not vignetted by the lens frame, etc., they are not affected by the infrared radiation distribution inside the optical system.
Furthermore, since the amount of infrared rays on the detector light-receiving surface due to incident infrared rays can be prevented from changing due to scanning, it is possible to realize an optical system with excellent detection performance.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の走査形光学系の構成方法を示す
図、第2図は従来の光学系における2次鏡と検出
器の部分の詳細図、第3図はこの発明の一実施例
を示す構成図、第4図は第3図に示した光学系の
2次鏡を光軸方向へ投影した図、第5図は第3図
に示した光学系における2次鏡と検出器の部分の
詳細図である。 図中、3は検出器、9は1次鏡、10は1次鏡
9の反射面、11は1次鏡9の非反射面、12は
2次鏡、13は回転軸、15は2次鏡12の非反
射面、16は2次鏡12の反射面、17はフー
ド、18はモータ、19はシヤフト、aは視野の
端からの入射赤外線、bは視野の中心からの入射
赤外線、cは不要な赤外線である。なお、図中、
同一あるいは相当部分には同一符号を付して示し
てある。
Fig. 1 is a diagram showing the construction method of a conventional scanning optical system, Fig. 2 is a detailed view of the secondary mirror and detector portion in the conventional optical system, and Fig. 3 is a diagram showing an embodiment of the present invention. The configuration diagram, Figure 4 is a diagram of the secondary mirror of the optical system shown in Figure 3 projected in the optical axis direction, and Figure 5 is a diagram of the secondary mirror and detector portion of the optical system shown in Figure 3. It is a detailed view. In the figure, 3 is the detector, 9 is the primary mirror, 10 is the reflective surface of the primary mirror 9, 11 is the non-reflective surface of the primary mirror 9, 12 is the secondary mirror, 13 is the rotation axis, and 15 is the secondary mirror. 16 is the reflective surface of the secondary mirror 12, 17 is the hood, 18 is the motor, 19 is the shaft, a is the incident infrared rays from the edge of the field of view, b is the incident infrared rays from the center of the field of view, c is unnecessary infrared radiation. In addition, in the figure,
Identical or equivalent parts are designated by the same reference numerals.

Claims (1)

【特許請求の範囲】 1 レンズや反射鏡等から構成される集光光学系
と、視野を走査するための単一または複数の走査
光学部と、前記集光光学系によつて集光された赤
外線等を検出するための検出器と、開口を制限す
る開口絞りとを備えた走査形光学系において、前
記走査光学部のうち前記検出器に最も近い第1の
走査光学部中に開口絞りを設けると共に、前記検
出器の受光面上の任意の点から出射し、前記第1
の走査光学部に到達した光線のうち前記開口絞り
の開口部を経た光線がレンズ枠等によつてケラレ
ないように開口絞りの形状、寸法を設定し、かつ
前記第1の走査光学部に到達した光線の残りの部
分が前記第1の走査光学部を構成する非透過面で
あると同時に非反射面でもある面で遮断されるよ
うに前記第1の走査光学部を構成したことを特徴
とする走査形光学系の構成方法。 2 前記第1の走査光学部の回転軸と前記検出器
の受光面を含む平面との交点から出射した光線の
うち前記第1の走査光学部に到達した光線の集合
が前記回転軸に垂直な断面で作る形状が前記回転
軸を中心とする円となるように構成した特許請求
の範囲第1項記載の走査形光学系の構成方法。 3 前記検出器の受光面あるいは前記開口絞りの
開口部として前記第1の走査光学部の回転軸に対
して回転対称な形状のものを用いた特許請求の範
囲第1項記載の走査形光学系の構成方法。
[Scope of Claims] 1. A condensing optical system composed of a lens, a reflecting mirror, etc., a single or multiple scanning optical section for scanning a field of view, and a condensing optical system comprising a lens, a reflecting mirror, etc.; In a scanning optical system equipped with a detector for detecting infrared rays, etc., and an aperture diaphragm for limiting an aperture, an aperture diaphragm is provided in a first scanning optical part closest to the detector among the scanning optical parts. is provided, and emits from any point on the light receiving surface of the detector, and the first
The shape and dimensions of the aperture diaphragm are set so that among the rays that have reached the first scanning optical section, the rays that have passed through the aperture of the aperture diaphragm are not eclipsed by a lens frame, etc., and reach the first scanning optical section. The first scanning optical section is configured such that the remaining part of the light beam is blocked by a surface that is a non-transmissive surface and a non-reflective surface constituting the first scanning optical section. How to configure a scanning optical system. 2. A set of light rays that reach the first scanning optical section among the light rays emitted from the intersection of the rotation axis of the first scanning optical section and a plane including the light-receiving surface of the detector are perpendicular to the rotation axis. 2. The method of configuring a scanning optical system according to claim 1, wherein the cross-sectional shape is a circle centered on the rotation axis. 3. The scanning optical system according to claim 1, wherein the light-receiving surface of the detector or the aperture of the aperture stop has a shape that is rotationally symmetrical with respect to the rotation axis of the first scanning optical section. How to configure.
JP58054146A 1983-03-30 1983-03-30 Constituting method of scanning type optical system Granted JPS59178425A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58054146A JPS59178425A (en) 1983-03-30 1983-03-30 Constituting method of scanning type optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58054146A JPS59178425A (en) 1983-03-30 1983-03-30 Constituting method of scanning type optical system

Publications (2)

Publication Number Publication Date
JPS59178425A JPS59178425A (en) 1984-10-09
JPH0227646B2 true JPH0227646B2 (en) 1990-06-19

Family

ID=12962415

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58054146A Granted JPS59178425A (en) 1983-03-30 1983-03-30 Constituting method of scanning type optical system

Country Status (1)

Country Link
JP (1) JPS59178425A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6340851B2 (en) * 2014-03-19 2018-06-13 株式会社リコー Object detection device and sensing device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
THERMAL IMAGING SRSTEMS *

Also Published As

Publication number Publication date
JPS59178425A (en) 1984-10-09

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