JPH0240590B2 - - Google Patents

Description

[Detailed description of the invention]

[Industrial Field of Application] The present invention relates to an elevator testing device, and particularly to a device suitable for elevators that uses a microcomputer (hereinafter abbreviated as microcomputer) in the elevator signal control section. [Conventional technology] Due to recent advances in semiconductor integration technology, the degree of integration has increased.
Progressing from MSI to LSI, microcontrollers have recently become widespread. This microcontroller is being incorporated into various industrial products because of its small size, low price, high functionality, and low power consumption. A microcontroller is an MPU (Micro Processor Unit),
ROM (Read Only Memory), RAM (Random
Access Memory), I/O (Input/Output) ports, etc., but as the prices of these products have fallen, so-called one-chip MPUs that incorporate these into one chip have also been commercialized. Such a microcomputer is also suitable for elevator control. In other words, conventional elevator control is mainly based on relays, and there are hundreds of relays, which increases the size of the control device, complicates the relay sequence, and limits the ability to improve functionality.
It had many problems, including a lack of scalability. Most of these problems can be solved by applying a microcomputer to the elevator control device, and reliability can be improved if only the signal control section using the microcomputer is considered. However, in an elevator, a large number of electrical devices such as various mechanical switches and car drive devices, protective equipment, etc. are scattered in the car, hoistway, landing, machine room, etc. Therefore, even if the signal control section of the elevator control device is a microcomputer,
The overall number of failures does not decrease dramatically. Therefore, it is necessary to monitor the control status in the same way as in elevators configured with conventional relays.
In addition, when the elevator is delivered, and as necessary thereafter, it is also necessary to conduct a test run for adjustment, inspection, maintenance, etc. [Problems to be Solved by the Invention] In the conventional relay circuit, the elevator can be monitored by checking whether each relay is on or off. On the other hand, if the system is configured using a microcomputer, it is impossible to check how the sequence is operating. However, regarding this point, the control data of the microcomputer
It is thought that this can be handled by displaying it on a CRT display. Regarding the above-mentioned test operation, in conventional relay circuits, a maintenance person or the like conducts the test operation by manually turning on the relay or by continuously turning on the relay with a clip. However, in elevators that use microcomputers, there are only a few locations that can be tested using conventional methods, making it impossible to perform sufficient adjustment, inspection, or maintenance. For this reason, some kind of testing device is desired. Furthermore, the conventional testing method described above has the following drawbacks, and it would be extremely beneficial if these points could be improved at the same time. (1) Ensuring safety: As mentioned above, test runs are performed by continuously closing or blocking relays with clips, so if you forget to put them back at the end of the test run, an abnormal state may occur even under normal service conditions. There is a risk that it will happen. (2) Improving test accuracy: Conventionally, test runs can be performed by:
Since the relays could only be opened and closed manually, it was difficult to test the entire control system. (3) Simplification of test runs: Previously, experienced maintenance personnel were required, and test runs required long hours. This is even more noticeable in group control elevators in which a plurality of elevators are installed side by side. SUMMARY OF THE INVENTION An object of the present invention is to provide an elevator test operation device that allows easy test operation of an elevator using a microcomputer as a signal control section. [Means for Solving the Problems] The features of the present invention for achieving the above object include providing an elevator control device using a microcomputer with a means for shortening the timer time limit and performing a test run; The present invention includes means for generating a test run signal including a timer time shortening command in order to start the test run control means. [Function] As a result, an elevator using a microcomputer, for which sufficient test operation cannot be performed at present, can be easily and quickly test-operated by maintenance personnel or the like simply by operating the test-operation signal generating means. [Example] Hereinafter, an example of the present invention will be described in detail with reference to the drawings. In the following explanation, an example will be explained in which the elevators of No. 1 and No. 2 are managed as a group. FIG. 1 is a block diagram for explaining the overall configuration of an embodiment according to the present invention. The elevator control system 1 of the first unit includes a control circuit 15 having several relays used for safety and for configuring sequences such as elevator driving.
Button 11 for car call, etc., switch 1 for operation selection, etc.
2, limit switches 13 for confirming the safety of the elevator, and an indicator 14 such as a car call response lamp. The signal control device 2 of the elevator of No. 1 has an input/output interface circuit 21 with the elevator control system 1.
, a microcomputer 22 that performs signal control, an interrupt pulse generation circuit 24 that interrupts the microcomputer 22 in order to preferentially process the elevator sequence program PGM2 at regular intervals, and a microcomputer 22 that performs test operation according to the present invention. The elevator controller 20 is composed of an interface circuit 23 that transmits and receives data and the contents of the elevator control data table to and from the signal line DL1, and an interface circuit 25 that transmits and receives data to and from the group management control device 7. The test device 3 includes an interface circuit 31 that sends and receives data to and from the elevator signal control device 2, a microcomputer 32, and a CRT that displays conventional data sent from the elevator signal control device 2 and other information necessary for operating the test device. (Cathode Ray Tube)
A display device 34 such as a device, a video control circuit 33 that outputs display signals to the display device 34, a signal input device 36 such as a control console such as a keyboard or a cassette tape, and input/output between the signal input device 36 and the microcomputer 32. A modem (MODEM) that communicates between the interface circuit 35 and the remote maintenance device 4
38, a modem 38, and an input/output interface circuit 37 for the microcomputer 32. The No. 2 elevator control system 2 and the No. 6 elevator signal control device 5 have the same configuration as the device of the No. 2 elevator, and are connected to the test device 3 by a signal line DL1. The group management control device 7 differs from the No. 1 elevator signal control device 2 in that it does not have anything equivalent to the input/output interface circuit 21 in terms of hardware, and can be used in the No. 2 elevator or in the case of a larger number of elevators, such as the elevator signal control device 5 of the No. 1 elevator. The configuration is the same except that an interface circuit is added. However, although the signal processing program by the microcomputer described later is completely different, it is easy for those skilled in the art to understand that the present invention, which will be explained later, can be applied to the group management control device 7. A detailed explanation will be omitted. Further, the elevator control systems 1 and 6 and the elevator signal control devices 2 and 5, which constitute the entire elevator control device, are not limited to such configurations. The configuration may be such that the control processing is performed by the devices 2 and 5. Further, although the traffic light DL1 and the signal lines DL3 and DL4 can be used in common, an example is given here in which separate signal lines are used in order to briefly explain the content of the present invention. In addition, with the aim of expanding maintenance functions, a microcomputer 32 was used in the test equipment 3.
It is possible to have a simple configuration in which the signal input device 36 and the interface circuit 23 are directly connected. That is, the test device 3 generates a test signal, and is not limited to its specific configuration. Next, the general operation of the present invention will be explained using FIG. The elevator signal control device 2 inputs and outputs control input signals from buttons 11 including a hall call button at a landing, a destination floor button in a car (abbreviated as a car call button), a door open/close button on a driving panel in a car, etc. The signal is input to the microcomputer 22 via the interface circuit 21. The microcomputer 22 starts a program that controls the elevator signals using pulses from the interrupt pulse generation circuit 24 at a cycle earlier than the time required for practical use.
It controls so that the above-mentioned calls are serviced efficiently and safely, and drives and controls the relays, devices, lamps, etc. of the elevator control system 1 through the input/output interface 21. This is sufficient if the elevator control device and the entire elevator drive mechanism are always normal, and the signal input/output interface circuit 23 and the like according to the present invention are unnecessary. However, as mentioned above, elevators may experience problems of various sizes several times a year. For this reason, a monitoring person who constantly monitors the status of the elevator and a monitoring panel that displays information necessary for monitoring and issues an alarm are still required as before. The test device 3 in FIG. 1 also has the function of this monitoring panel, and inputs elevator control information from the microcomputer 22 to the microcomputer 32 via the interface circuit 23, signal line DL1, and interface circuit 31. Therefore, the test device 3 can diagnose the failure of the elevator based on the information input from the microcomputer 22, and when it is normal, the supervisor can be informed of the service status, and when a trouble occurs, the contents and countermeasures can be informed by the CRT 34. . Furthermore, recently, in order to improve maintenance services, there has been a demand for a centralized monitoring system at maintenance centers. In such a case, the modem 38 can control communication with the remote maintenance device 4 installed at the maintenance center of the maintenance company. Furthermore, microcontroller 3
If it is necessary to send and receive information only when a failure is diagnosed according to 2 or when a request for confirmation is received from the maintenance center, a telephone line network control unit (abbreviated as NCU) is added to the modem 38. By this,
Information can be transmitted using general subscriber telephone lines with low maintenance costs. A test machine is a necessary function when using a microcomputer in an elevator control device. Highly efficient and reliable test equipment is required not only for test runs and adjustment operations after elevator installation is complete, but also for service function checks and group management operation checks during periodic inspections. For example, by constantly registering the car calls for both ends of the floors, you can check the elevator position indicators on each floor for breakage, perform a sequence check when the car is fully occupied by setting the car weight arbitrarily, and perform other functions as required in group control elevators. It is necessary to check the traffic detection function. Such test data may be input from the signal input device 36. If you want to test automatically,
By inputting data using cassette tapes, etc., maintenance staff can concentrate on checking on the CRT, resulting in even higher efficiency. Furthermore, if the microcomputer 32 has sufficient capacity, pass/fail judgment and failure diagnosis can be made using correct operation mode information from the cassette tape. In order to perform the test functions necessary for these monitoring and maintenance, this embodiment includes an input/output interface circuit 23 that connects the microcomputer 22 that forms the center of the elevator signal control device 2 and the test device 3; It has a program that controls input and output. According to the embodiment shown in FIG. 1 described above, there is no need to provide an individual output circuit for displaying a specific signal that requires displaying a sequence state. In addition, a specific input circuit corresponding to a specific control input signal required for test operation of the elevator is provided, and a signal from a specific test control signal generator (for example, a button) and a corresponding control input signal line of the elevator control system 1 are provided. There is no need to provide means for serial insertion, switching, or parallel connection. As a result, according to the embodiment shown in FIG. 1, the following effects can be obtained. (1) The code signal interface circuit 23, which can be used for input/output for various purposes, can be connected to the test equipment using a small number of signal lines DL1, so the test equipment can be installed in the same cubicle as the elevator signal control equipment 2. Without being limited to implementation, the signal line DL1 can be made into a single cable, and the test device 3 can be attached and detached freely to make the device easy to carry. Furthermore, if the noise margin is improved by increasing the drive voltage level of the code signal interface circuit 23, the test device 2 can be installed several hundred meters away. Therefore, since it can be moved to any location in the machine room, used in the building manager's room, inside the car, or on the car, it has the effect of finding faults and shortening recovery time, and the test equipment can be shared by many elevators. It has an effect that can be used as (2) The test device can be just a numeric keypad, or it can be equipped with a microcomputer 32 and a modem 38, allowing for sophisticated monitoring and elevator control of test functions as needed. It becomes easy to add it to the device. These can be dealt with by adding or changing some programs of the test device 3 and microcomputer 22. Therefore, improvements after delivery have become extremely easy. An embodiment of the present invention and its effects have been generally described above. Next, a specific embodiment will be described with reference to FIGS. 2 to 19. FIG. 2 is a circuit diagram of an embodiment of the test device,
The relationship with the code signal interface circuit 23 is shown. The microcomputer 32 is composed of a microprocessor (abbreviated as MPU) 320, a random access memory (abbreviated as RAM) 321, and a read-only memory (abbreviated as ROM) 322. MPU320 has address bus AB,
There are a data bus DB and a control bus CB, and these buses include a RAM 321 that stores signals sent from the elevator signal control device 2 and other key input signals from the keyboard 36, which is a type of signal input device. , memorize programs designed to demonstrate various functions of the test device 3.
ROM322 is connected. Furthermore, these buses include pre-area interface adapters (PIA) 311 and 312 that interface with the outside, a video control circuit 33 that outputs display signals to the CRT 34, and an unsynchronized cloner that interfaces with the modem 38. A communications interface adapter (abbreviated as ACIA) 37 is connected. The microcomputer 22 also has the same circuit configuration as the microcomputer 32, and interfaces code signals. The PIA 23 is connected to the above three types of buses controlled by the microcomputer 22. Next, an outline of the operation of the microcomputer 22 of the first machine will be explained with reference to FIGS. 3 to 5. FIG. 3 is a flowchart of the program PGM1 that starts processing as soon as the power is turned on. The initialization program M100 initializes the internal registers of the PIA used for the input/output interface circuit 21 and the code signal interface circuit ,
Initialize RAM (generally clear all areas to “0”). The stack pointer is also set at the same time. In the next step M110, it is determined based on the signal of the bus assignment signal line BC1 shown in FIG. do. If so, the program advances to program M200, where control is performed to input test data to the microcomputer 22 based on commands input from the keyboard 36. Next, the program proceeds to program M300, where a monitor data transmission program to be transmitted from the No. 1 elevator signal control device 2 to the test device 3 is processed. In these two programs, if the group management control unit 4 is allowed to use the bus, the bus use permission signal BC1 of the first car is "0".
At this time, the determination result at step M100 is NO and the program waits at step M110, and if bus use is granted, these two programs perform loop processing. (Details will be described later.) Figure 4 illustrates the microcomputer 22 of the first machine, which will be explained in detail later, as an example.
2 is a conceptual diagram of an address map showing the allocation status of RAM, ROM, etc.; FIG. There are areas a to k as address areas,
a belongs to an address with a small address value, and k belongs to an address with a large address value. Address area a is a work memory area used for multiple purposes necessary for calculations by the MPU. Address area b is an area for storing control input data input from the elevator control system 1. Address area C is an internal data memory area and is created by a program stored in k area. Address area d is an area for storing control output data to be output to the elevator control system 1, and is created by a program stored in area k.
These a, b, c, and d areas are also address areas of the first RAM ₁ that constitutes the microcomputer 22. Next, the address area e is a test data memory area that stores signals transmitted from the test device 3. Address area f is a test flag area that stores setting data and test flag signals created by the test data receiving program stored in area i. The e and f areas are also address areas of the second RAM ₂ that constitutes the microcomputer 22. Address area g is a register area of the input/output interface PIA shown in FIG. 1, and address area g is a register area of the PIA for the code signal interface circuit 23 with the test device. Address areas i, j, and k are program areas, where i is a program area for receiving and processing test data, and j is for transmitting data required by test equipment 3 among the information stored in RAM ₁ . The program area k is the machine number control program area. Area k is also an area of the first ROM ₁ constituting the microcomputer 22, and areas i and j are also areas of the second ROM ₂ . As mentioned above, within one microcontroller, memory,
Duplicate allocation of input/output interface circuits to the same address space is not allowed. In an elevator control device where the test device 3 is not always required, RAM ₂ , code signal interface circuit 23, and ROM ₂ can be omitted, so these circuits can be mounted separately from other circuits. For example, it can be added only during test runs or maintenance. As a result, it is sufficient to prepare one set of circuits for each of a plurality of test and maintenance circuits, resulting in an inexpensive test system. FIG. 5 shows a general flowchart (hereinafter abbreviated as GFC) of the machine control program PGM2 activated by the interrupt pulse _CL2 from the interrupt pulse generating circuit 24 of FIG. When an interrupt signal is input from the outside to the MPU of the microcomputer 22, first steps M110, programs M200 and M3 related to the test equipment described in FIG.
00 processing is temporarily interrupted, various registers are saved, and then the program shown in FIG. 5 is processed. First, the process of the timer control program of program M400 is executed, and the sequence program
The PGM 21 determines whether a programmed predetermined time limit has expired based on the time limit elapsed count of the timer requested to count and the size of the count value of the timer, and performs timer control such as setting a timer output flag. When all timer processing is completed, the program advances to program M440, where a program for inputting control input signals from the elevator control system 1 is processed. Next, the newly input control input data and the
Sequence program PGM21 that uses internal data stored in RAM ₁ and RAM ₂ as input data
Process. Sequence program PGM21
Control the main functions of. Although seven task programs consisting of program M470 to program M650 are shown in FIG. 5 as task programs, generally far more programs than these are incorporated. The present invention relates to the machine control program shown in FIG. 5, but for the sake of brevity, a description of these general functions will be omitted, and a description of the program directly related to the present invention will be given later. This will be done when explaining FIGS. 17 to 19. By outputting the processing results of these sequence programs PGM21, that is, the data stored in the control output data memory area e, to the elevator control system 1 by the program M690,
For example, it issues commands to turn on a car response light and control door opening/closing. When the above processing is completed, all the processing of the interrupt program is completed, and the process returns to the processing of the program related to the test device that performs the repetitive processing shown in FIG. 3. Next, an outline of the operation of the microcomputer 32 of the test device 3 will be explained with reference to FIGS. 6 and 7. Figure 6 is a flowchart of program PGM70, which starts at the same time as the power is turned on, and the initialization program M710 starts with PIA311 shown in Figure 2.
, the initial settings of the internal registers of the PIA 312, the PIA which is an embodiment of the interface circuit 35, the ACI 37, the RAM 321, and the initial settings of the internal memory of the video control circuit 33 (the RAM 321 is
Generally, all areas are cleared to "0"). Next, programs M720 and M730 are processed in a loop. Program M720 performs input/output control of the signal input device 36 for inputting commands necessary for test driving operations, and program M730 performs output control of data to be displayed on the CRT. FIG. 7 shows a program PGM80 activated by the interrupt signal RC from the elevator control block (2, 4, 5 in FIG. 2), which controls the use permission signal of the common data bus DCB, transmits test data, and controls Controls data reception, failure detection, automatic recording and notification, etc. Prior to the detailed explanation of FIG. 7, according to FIG.
The control method of the common bus DCB and the overall operation of FIG. 2 to which the present invention is specifically applied will be explained with reference to the time chart of FIG. 8. Interrupt processing program that controls the operation of Unit 1 when bus use permission signal BC1 of Unit 1 is “1”
Immediately after PGM2 is completed, programs M200 and M300 (symbols) are executed for transmitting and receiving encoded signals necessary for testing and maintenance, processing test data, and controlling test operation.
At the same time as this processing is completed, a bus use permission signal is sent.
BC1 becomes “0” and the program PGM of the first machine
1 will loop step M110. Since the program PGM2 is activated at regular intervals by the fall of the interrupt pulse CL2 at times _t1 and _t2 , the operation of the elevator is smoothly controlled by the microcomputer 22 having the necessary response speed. As shown in FIG. 8, the bus permission signals BC1 to BC3 are cyclically controlled without ever lapping, so that the other control device blocks are equally controlled. As shown in FIG. 8, the test device 3 performs interface processing with an input device such as a keyboard and creation of display data on a CRT by connecting time periods in which the interrupt processing program PGM 80 is not activated. Program M720 and M
730 is looped. Returning to the explanation of FIG. 7 again. In step M805, once the program PGM80 is started by the interrupt signal RC, the transmission/reception control signal is sent and received until the program is finished.
Mask interrupts to use RC as a data establishment signal rather than as an interrupt signal. Step M810, as shown in FIG.
Check that the integer l indicating the block signal of the control device outputting the bus use permission signal matches the block signal sent to the bus. If NO because there is a mismatch, record the current l and the received block number, and jump to program M850 since the next block may be normal. If YES, test data transmission program M
820 and the control data reception program M840,
Processing is performed using the handshake method with the microcontroller of the permitted block. When this is completed, the bus use permission signal is temporarily turned OFF in step M849, and the test equipment executes the processing corresponding to the program PGM1 in each block using the failure-related program M.
This prevents unnecessary progress during execution of steps 890 to M894. Next, in step 892, the result of processing the program M890 that checks the rationality and safety of the received signal in the program M840.
If it is determined to be a failure, the ACIA 37 and modem 38 are used to send an alarm or report information to a remote maintenance device installed in the building's manager's office or a maintenance company in another building, and also to store this information. Controls such as keeping the Since the processing of block 1 has been completed, program M850 performs cyclic control of 1, program M870 outputs this, and step M880 releases the interrupt, and the test equipment completes preparations for transition to block processing. As a countermeasure for when a certain block is completely stopped, program M740 is added to FIG. 6, and the program is improved so that it will proceed to the next block if no interrupt pulse RC is input for a certain period of time. Next, an embodiment of the test data receiving program M200, which is the core of the present invention, will be described in detail with reference to FIG. First, in step M202, a code for making the test device confirm that it is a request to transmit its own block number and test data is sent to the test device as the first transmission/reception data, and a code is sent to the test device as the first transmission/reception data.
"1" is sent to the communication control signal RC that starts the interrupt program PGM80 shown in the figure. Next, initial settings for receiving and processing the five data shown in FIG. 10 from the test device 3 are performed in step M204. Next, through a loop of steps M206 and M207, RTB, which serves as a 1-byte data transmission completion signal from the test device 3, is held until it becomes "1". It is confirmed whether the block number of the first transmission/reception data ELNO of the data bus DTB to which this data is input matches the own block number, and if they match, the steps M210 and M218 for monitoring the signal RTB are looped again. When the second reception data TSTCD is transmitted from the test device 3 to the data bus DTB, the determination of this loop becomes YES in step M210, and the process returns to step M210.
At step 212, the second received data is stored in area e in FIG. Next, in step M214, the counter C is +
Perform 1 count UP. Note that since the counter C has been set to the numerical value 0 in step M204, the counter C has the numerical value 1. When storing the third, fourth, and fifth received data that are received one after another in the respective addresses in step M212, the numerical value of the counter C is used, so it has the role of incrementing it by 1, 2, and 3. In step M216, when the fifth received data is received, reception is completed in this embodiment, so it is determined whether the value of counter C has reached 4, and the process proceeds to step M220. Here we have already selected the test data memory area e.
The test code TSTCD stored in the test code TSTCD is checked and the start address of the program corresponding to this is selected.In the next step M222, the test program at the selected start address is jumped to and executed. Incidentally, steps M207 and M218 are for detecting that test data is not being transmitted due to the test operation being stopped in the test device 3 or due to software or hardware trouble related to test data transmission. It is programmed for longer periods of overtime. It is also assumed that upon completion of the test, the test device 3 is disconnected from the elevator signal control device 2 by a removable connector 26 such as a socket and a connector. As a result, test data is not received, so step M207 or M21
8, it is determined that it is overtime, and step M
224 is activated and all test data flags created in the past are cleared. Here, the bus use permission signal of the separated block is configured to be "1", and step M110 in FIG.
The determination is made to be YES. In addition, due to a problem with the test device 3, if test data is not sent within a predetermined time interval, it will be determined that overtime has occurred, and if there is a malfunction, step M2 will be executed.
The determination at step M224 is NO, and the program at step M224 is started. When step M224 is executed, all test functions can be stopped, so functionally the failed test device is automatically disconnected. The effect of the embodiment related to FIG. 9 is that the mutual influence between the reliability of the test device and the reliability of the elevator signal control device can be extremely reduced. Further, it is possible to prevent troubles such as forgetting an instruction to cancel a test operation through an input operation of the test device. An example of the test code TSTCD and its test function is shown in FIG. 10 and Table 1 below.

[Table] Here, the test program M23 for timer early control of test code 02 is shown in Figures 11 to 15.
A specific example of the test program M270 from test code 0 to car weight setting control of test code 10 will be described. Other test operation control programs can be created in the same way, but detailed explanations will be omitted. Note that from the third received data to the fifth received data shown in FIG.
The type of information indicated by the test data included in the received data differs depending on the test code. Furthermore, if the number of service floors exceeds 24, a large amount of test data will be required, and in this case, the judgment value 4 in step M216 in FIG. 9 may be increased. Furthermore, it is easy to control by making the data length of the signal variable in accordance with the test code TSTCD, by making part of the test code independent, and by adding codes indicating the data lengths before and after the test code. In such a case, the value 4 in step M216 becomes a variable, and the flow shown in FIG. 9 requires a slight change, but this can be easily done by a person in charge. Now, one embodiment of timer early test control will be described in detail with reference to FIGS. 11, 16, and 17. The program M230 in FIG. 11 is a test program M230 for timer early control that is activated and executed in step M222 in FIG. 9 when the value of the second received data TSTCD is 02. In step M232, the first step shown in FIG.
By determining the numerical value of the test data TSTDT1 and determining whether it is 01 or not, it is determined whether the test command is a test command to start timer advance control or a test command to terminate timer advance control. In the former case (TSTDT1=01), it will be YES,
At step M234, the timer early test flag FTIM is set to "1". In the latter case, the answer is NO, and the timer early test flag FTIM is cleared to "0" in step M236. Also, as explained earlier, step M2 in FIG.
Test flag is also set when 24 programs are executed.
FTIM is cleared to "0". In this way, the test data reception program M200
The test flag FTIM controlled by is used by the timer control program M400 to control whether or not to advance the timer. Timer control program M40 shown in FIG.
In order to facilitate the explanation of timer control, an overview of timer control in general will be given. The timer control program M400 is activated every cycle of the interrupt pulse CL2, as shown in FIG. For example, if this cycle is 10mS, the timer control program that forms part of the program PG2 is started every 100mS, so if the MPU of the microcomputer 22 is an 8-bit microcomputer,
One byte (8 bits) shall be used as the internal data register for the sequence timer counter. The maximum delay time that can be obtained at this time is
2 ⁸ × 10 mS = 256 × 10 mS = 2.56 seconds. This includes automatic door closing time, M-G automatic stop time, door opening extension time, rope stretch compensation termination time,
It is not possible to create timers that require a long time limit, such as timers for clocks or timers that sample traffic volume. In addition, it is preferable to advance the timer or shorten the timer time limit based on instructions from the test device 3 (including all of the seven cases mentioned above), and for example, it is preferable to advance the safety timer, such as the Y-A switching time of M-G. In some cases, there are cases where the test efficiency does not improve even if the timer is set earlier, such as with a timer of less than 1 second. Based on the above-mentioned two circumstances, this embodiment provides reference pulse registers PTMA and PTMB for two types of timers, each of which is 1 byte, and in program M418 shown in FIG. 17, the count of each sequence timer is based on these standards. An arbitrary pulse is selected from among the pulses, and the count is increased only when this pulse is "1", and the count value is held when it is "0". However, only the reference pulse jitter PTMB is configured so that the pulse interval can be shortened to 1/32 by instructing the test flag to advance the timer.
Therefore, a sequence timer that requires a faster timer uses the pulse in register PTMB as a reference pulse. For example, in a 60-second sequence timer A that requires an early timer, the program is configured so that the output of this sequence timer A becomes "1" after 94 counts of the 0.64 mS (described later) reference pulse in the 0th bit of the register PTMB. do. If the 60-second timer is set to early operation using the timer early test function, it will operate in approximately 2 seconds, resulting in the effect of speeding up the sequence check. FIG. 16 explains the specific operation of the program M401 for creating the reference pulse PTMA. First, the internal data of the counter CTMA is loaded into ACC _A (accumulator A) in step M402, and then the complement is obtained. That is, the process "ACC _A ←CTMA" shown in FIG. 16 is performed. At step M404, the counter CTMA is incremented by one. In other words, “CTMA←
CTMAt1” processing. Next, in step M406, the result of logical ANDing of ACC _A and counter CTMA for each bit is stored in the reference pulse register PTMA. In other words, the process "PTMA←CTMA・ACC _A " is performed. Register CTMB with program M407
is basically created by the above operations. This can be summarized as follows. In both programs, the bit in the reference pulse register that is the same as the bit that changes from "0" to "1" in each bit of the counter becomes "1" only during the 10 mS period when program M400 is started next. . The difference between program 407 and program M401 is that step M410 and step 412 are added;
8, M414, and M416 are processed in the same manner as program M401. Step M410 is the test flag mentioned above.
Determine whether FTIM is set to "1" by the timer advance command. If it is “0”, it becomes NO and step M41
2, the 4th bit reference pulse PTMA4 of the reference pulse register PTMA is determined. If “1”
If so, proceed to step M414 and counter
CTMB is counted up by 1, and if it is "0", the value of counter CTMB is held and in step M416, all bits of register PTMB are set to "0".
becomes. In other words, 0bit of the reference pulse register PTMB
The pulse interval of the eye reference pulse PTMB ₀ is 640mS
(2×2 ¹⁺⁴ ×10mS). This is because the program M401 is started every 10 mS and a reference pulse is created by detecting the rising edge, so the pulse interval of the reference pulse PTMA ₀ is 20 mS (2
×10mS). Therefore, the reference pulse PTMA ₄ is
This is because it becomes 320mS (2 × 2 ⁴ × 10mS). On the other hand, the test flag is set due to the early timer command.
If FTIM="1", the determination in step M410 is YES, and the counter CTMB is reset every time as in the reference pulse register PTMA program M401.
is counted up, so the reference pulse PTMB ₀
The pulse interval was shortened from 640mS to 20mS. Therefore, among the sequence timers controlled by step M418, those using the reference pulse register PTMB as the reference pulse can operate earlier by 1/32 of the timer time limit, improving sequence check efficiency during maintenance. Next, an embodiment of the test program M240 for car call set control will be described with reference to FIG. When the value of the second received data TSTCD is 04, the first
A test program M240 shown in FIG. 2 is started. Next, in step M242, the interrupt pulse CL is
2, interrupt masking is performed to prevent this program from being interrupted. (The reason will be explained later)
Next, in step M244, the test test data is
Store TSTDT1 and TSTDT2 in the car call button input data table. The next step constitutes a part of the machine control program PGM2 shown in FIG. The subroutine of the car call registration program M500 (details will be described later) is used as is, started up, and executed. As a result, new registration (setting) of some or all car calls can be performed using the test data signal sent from the test device. In step M246, the interrupt mask is canceled and control is performed so that the program PGM2 can be activated. In this embodiment, the test data for car call setting is stored at the address where the control input data from the car button is stored, and the original car control program PGM2 is stored.
A part of this is used for testing purposes. For this reason, if an interrupt occurs during this test processing and program PGM2 is started, the test data will be destroyed by program M440, so to prevent this, it is necessary to block interrupt processing for a short period of time. be. Next, an embodiment of car call registration cancellation test control will be described in detail with reference to FIGS. 13 and 19. The test program M250 in FIG. 13 executes step M2 in FIG. 9 when the value of the second received data is 06.
It will be launched at 22. When the test flag FCRGCR for clearing all car calls is set to "1" in step M252 and subroutine M500 is started in the next step, if the test flag FCRGCR is "1",
All car calls are cleared. In the next step M254, the test flag is
Return FCRGCR to “0” and program after that.
When the subroutine is executed by PGM2, the car call all cancellation test control is not performed. FIG. 19 is a flowchart illustrating in detail the subroutine car call registration program M500. In the first step M502, it is determined whether the value of the service mode SMNO, which is internal data created by the service method selection control program M470, is 8 or more. Table 2 shows an example of the relationship between the value of this test mode number SMNO and the service method.

【table】

Claims (1)

[Scope of Claims] 1. In an elevator in which a microcomputer is used in the signal control unit of an elevator in service between multiple floors to control the operation of the elevator, a means for controlling a test operation by shortening a timer time period, and a method for controlling the test operation 1. A test operation device for an elevator, comprising means for generating a test operation signal including a timer time shortening command to start an operation control means. 2. An elevator test operation device according to claim 1, wherein the timer time shortening means shortens a door opening/closing time and an operation pattern switching time.