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JPH0242403B2 - - Google Patents
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JPH0242403B2 - - Google Patents

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Publication number
JPH0242403B2
JPH0242403B2 JP13167283A JP13167283A JPH0242403B2 JP H0242403 B2 JPH0242403 B2 JP H0242403B2 JP 13167283 A JP13167283 A JP 13167283A JP 13167283 A JP13167283 A JP 13167283A JP H0242403 B2 JPH0242403 B2 JP H0242403B2
Authority
JP
Japan
Prior art keywords
measured
light
scanning
reference gauge
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13167283A
Other languages
Japanese (ja)
Other versions
JPS6022614A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13167283A priority Critical patent/JPS6022614A/en
Publication of JPS6022614A publication Critical patent/JPS6022614A/en
Publication of JPH0242403B2 publication Critical patent/JPH0242403B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 この発明は光学的形状測定装置、殊にクラウニ
ング等が施された円筒ころ、円すいころ等の回転
体、或はその他の物体の前記クラウニング面等の
形状を測定する装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical shape measuring device, particularly a device for measuring the shape of a crowned surface of a rotating body such as a cylindrical roller or tapered roller, or other object that has been subjected to crowning. Regarding.

金属加工物等の精密加工部品の外形形状を測定
する従来方法として拡大投影法がある。この方法
は、拡大投影機によりスクリーンに写し出された
被測定物像を、被測定物の理想外形を現わす一種
の姿ゲージと重ね合わせて、その一致程度を測定
するものであつて、測定精度の向上は主に拡大率
の増大によりはかられるが、被測定物エツジから
の光の回折現象により投影像のぼけが生じ、或は
スクリーン面積の制約などの理由から拡大率に限
界があり、また投影像と姿ゲージとの一致度の測
定を、通常は目分量により行うため、定量的な一
致度測定がきわめて困難であつて精度低下の大き
な要因となる。
An enlarged projection method is a conventional method for measuring the external shape of precision machined parts such as metal workpieces. In this method, the image of the object to be measured projected onto a screen by a magnifying projector is superimposed on a type of figure gauge that shows the ideal external shape of the object to be measured, and the degree of agreement is measured. Improvement is mainly achieved by increasing the magnification ratio, but there is a limit to the magnification ratio due to reasons such as blurring of the projected image due to the phenomenon of diffraction of light from the edge of the object to be measured, or constraints on the screen area. Furthermore, since the degree of coincidence between the projected image and the figure gauge is usually measured by eye, it is extremely difficult to quantitatively measure the degree of coincidence, which is a major factor in reducing accuracy.

一方、測定者の個人差による測定値のバラツキ
を軽減するのに、近年X−Yテーブル、リニア・
エンコーダーによる座標の読込み、コンピユータ
による演算処理等の技術が併用されているが、座
標の読込み精度が依然として測定者の個性に大き
く左右されるという欠点がある。
On the other hand, in recent years, X-Y tables, linear
Although technologies such as reading coordinates using an encoder and arithmetic processing using a computer are used in combination, the accuracy of reading the coordinates still largely depends on the individuality of the measurer.

この発明は、拡大投影法の場合のように拡大率
を増大するうえでの制限、或は測定者の個人差に
よる測定精度のバラツキ等がなく、高い測定精度
をうる光学的形状測定装置を提供することを目的
とするものである。
The present invention provides an optical shape measuring device that achieves high measurement accuracy without restrictions on increasing the magnification rate or variations in measurement accuracy due to individual differences in measurers as in the case of the enlarged projection method. The purpose is to

而してこの発明は、前記ころ等の被測定物の外
形面にナイフエツジ状の直線縁をもつ基準ゲージ
を対接させ、その対接部をレーザー光、或は他の
適宜の光源より照射されるスポツト光により前記
対接方向に走査すると共に、その走査位置を被測
定物の例えば軸方向に順次移動させ、前記対接部
を透過した走査光を光電変換し、そのフーリエ級
数成分のうちの所定高調波成分をロツクインアン
プにより検波して出力し、各走査位置に対応する
ロツクインアンプ出力を、X−Y記録計等に記録
して読みとるようにしたことを特徴とするもので
ある。
In this invention, a reference gauge having a knife-edge straight edge is brought into contact with the external surface of the object to be measured, such as the roller, and the contact portion is irradiated with a laser beam or other appropriate light source. The spot light is scanned in the contact direction, and the scanning position is sequentially moved, for example, in the axial direction of the object to be measured, and the scanning light transmitted through the contact portion is photoelectrically converted, and its Fourier series components are A lock-in amplifier detects and outputs a predetermined harmonic component, and the lock-in amplifier output corresponding to each scanning position is recorded and read on an X-Y recorder or the like.

以下この発明を図示の実施例について詳述す
る。図面はクラウニングを施された円筒ころ外形
面(円筒面)のクラウニング形状を測定する場合
について示してある。
The present invention will be described in detail below with reference to the illustrated embodiments. The drawings show a case where the crowning shape of the crowned outer surface (cylindrical surface) of a cylindrical roller is measured.

被測定物である円筒ころ1のクラウニングを施
された外形面1aに対し、下端縁をナイフエツジ
状の直線縁2aとした基準ゲージ2の前記直線縁
2aを、円筒ころ1の軸線に平行となる配置で対
接させ、その対接部の円筒ころ1の軸方向(X
軸)の全領域を、X軸に直交する対接方向(Z
軸)に、該X、Z両軸に直交する方向より投光す
るスポツト光で走査し、この光走査により前記対
接部を透過した光を、集光レンズ3a,3bから
なる受光系3で集光して光電子増倍管4に入射さ
せ、光電変換させて透過光強度に相当する電気信
号を得、この電気信号と対接部のスキマ幅ΔZと
の間に成立つ関係に基づき、走査位置に対応する
実際の対接部のスキマ幅ΔZを算出し、それによ
つてクラウニング形状を測定する。
With respect to the crowned outer surface 1a of the cylindrical roller 1 that is the object to be measured, the straight edge 2a of the reference gauge 2 whose lower end edge is a knife-edge straight edge 2a is parallel to the axis of the cylindrical roller 1. The cylindrical rollers 1 are arranged in such a way that they face each other, and the axial direction (X
axis) in the opposite direction (Z axis) perpendicular to the X axis.
(axis) with a spot light projected from a direction perpendicular to both the X and Z axes, and the light transmitted through the contact portion by this light scanning is sent to the light receiving system 3 consisting of condensing lenses 3a and 3b. The focused light is incident on the photomultiplier tube 4, photoelectrically converted to obtain an electrical signal corresponding to the transmitted light intensity, and scanning is performed based on the relationship established between this electrical signal and the gap width ΔZ of the contact part. The actual gap width ΔZ of the contact portion corresponding to the position is calculated, and the crowning shape is measured accordingly.

前記対接部のスキマを走査するスポツト光は、
He−Neガスレーザー5を光源とするレーザー光
であり、ピンホール6を介してそのビーム径を適
当に細くしたあと、ビームスプリツター7で2方
向に分光し、直進するスポツト光を反射ミラー8
を介して振動ミラー9に入射させる。
The spot light that scans the gap between the contact parts is
The laser light is from a He-Ne gas laser 5 as a light source. After the beam diameter is appropriately narrowed through a pinhole 6, the beam is split into two directions by a beam splitter 7, and the straight spot light is reflected by a reflecting mirror 8.
The beam is made incident on the vibrating mirror 9 via the oscillating mirror 9.

振動ミラー9は、これに付属する図示しないタ
コ・ゼネレーターと発振ドライバ12で構成され
る発振回路の一部をなし、振動ミラー9の自己共
振周波数fcで振動する。
The vibrating mirror 9 forms part of an oscillation circuit including an attached tacho generator (not shown) and an oscillation driver 12, and vibrates at the self-resonant frequency f c of the vibrating mirror 9.

振動ミラー9で反射されるスポツト光は、振動
ミラー9の発振により扇状の所定角度範囲内でそ
の反射方向を変えるが、振動ミラー9と対向スキ
マとの間に、振動ミラー9とレンズ11との間の
距離を、自己の焦点距離と等しくしたレンズ11
を配置し、走査方向(Z軸)に対して直角な平行
走査ビームに変換する。
The spot light reflected by the vibrating mirror 9 changes its reflection direction within a predetermined fan-shaped angle range due to the oscillation of the vibrating mirror 9. A lens 11 whose distance between the lenses is equal to its own focal length.
is placed and converted into a parallel scanning beam perpendicular to the scanning direction (Z-axis).

ビームスプリツター7で光路を直角に変えられ
た分光は、フオトダイオード10等で光電変換
し、その出力を後述の補正用信号として供する。
The beam splitter 7 changes the optical path at right angles, and the spectral light is photoelectrically converted by a photodiode 10 or the like, and its output is used as a correction signal to be described later.

被測定物取付台21上に載置した円筒ころ1の
外形面に対接させる基準ゲージ2に対し、その後
端(図では上端)に、セツテイング位置調節用電
気マイクロ・プローブ13を押しあつて、円筒こ
ろ1に対し基準ゲージ2を最適位置に突き合せ
る。そして被測定物取付台21と、基準ゲージ
2、電気マイクロ・プローブ13を組付けた一方
向スライド基台14を図示しない駆動手段により
X軸方向に移動(スライド)させて、対接部の全
測定領域にわたる光走査を行う。
The electric micro probe 13 for adjusting the setting position is pressed against the rear end (the upper end in the figure) of the reference gauge 2 which is placed in contact with the external surface of the cylindrical roller 1 placed on the measuring object mounting base 21. The reference gauge 2 is matched against the cylindrical roller 1 at the optimum position. Then, the one-way slide base 14 on which the measurement object mounting base 21, the reference gauge 2, and the electric micro-probe 13 are assembled is moved (slided) in the X-axis direction by a drive means (not shown), and the Perform optical scanning over the measurement area.

受光系3と光電子増倍管4との間には、6328Å
波長光を透過する干渉フイルタ15を介在させ、
周囲から混入する外光の影響を最小に抑えるよう
にしている。
There is a distance of 6328 Å between the light receiving system 3 and the photomultiplier tube 4.
An interference filter 15 that transmits wavelength light is interposed,
Efforts are made to minimize the effects of outside light coming in from the surrounding area.

光電子増倍管4より出力した電気信号は、プリ
アンプ16により第3図に示すような信号波形V
に増巾し、次段のロツクインアンプ17に入力す
る。
The electrical signal output from the photomultiplier tube 4 is converted into a signal waveform V as shown in FIG. 3 by the preamplifier 16.
The signal is amplified and input to the lock-in amplifier 17 at the next stage.

前記の信号波形Vのピーク値Vpeakとパルス
幅Vwidthとは、対接部のスキマ幅ΔZと密接に関
係する。この関係は、対接部のスキマ幅ΔZに比
して走査光のビーム径を十分に大きくすることに
より顕著にあらわる。従つて実施例の場合、対接
部のスキマ幅ΔZに対しビーム径を十分に大きく
し前記条件を十分に満足するように構成してあ
る。
The peak value Vpeak and pulse width Vwidth of the signal waveform V are closely related to the clearance width ΔZ of the contact portion. This relationship becomes more apparent when the beam diameter of the scanning light is made sufficiently larger than the gap width ΔZ of the contact portion. Therefore, in the case of the embodiment, the beam diameter is made sufficiently large relative to the gap width ΔZ of the contact portion, so that the above-mentioned conditions are fully satisfied.

ロツクインアンプ17は、その入力電気信号の
フーリエ級数成分のうちの所定高調波成分を検波
して出力する。すなわち、ロツクインアンプ17
には、前記電気信号と共に、発振器ドライバ12
から出力される振動ミラー9の発振周波数fcの2
倍の周波数の信号を参照信号として入力する。従
つて、スキマ幅ΔZの光走査に対応するロツクイ
ンアンプ17の出力Voutは、スキマ幅ΔZとの間
に、 Vout=K0/πΔZsin2πΔZ ……(1) の関係を有する。
The lock-in amplifier 17 detects and outputs a predetermined harmonic component of the Fourier series components of the input electrical signal. In other words, the lock-in amplifier 17
In addition to the electrical signal, the oscillator driver 12
2 of the oscillation frequency f c of the vibrating mirror 9 output from
A signal with twice the frequency is input as a reference signal. Therefore, the output Vout of the lock-in amplifier 17 corresponding to optical scanning with the gap width ΔZ has the following relationship with the gap width ΔZ: Vout=K 0 /πΔZsin2πΔZ (1).

次段の出力補正部18では、ロツクインアンプ
17の出力Voutを入力する一方、フオトダイオ
ード10の出力信号を、出力補正用信号として入
力し、He−Neガスレーザー5の光強度ゆらぎに
起因する出力Voutの変動分を補正する。
In the output correction section 18 at the next stage, the output Vout of the lock-in amplifier 17 is inputted, while the output signal of the photodiode 10 is inputted as an output correction signal, and the output correction unit 18 inputs the output signal of the photodiode 10 as an output correction signal. Correct the variation in output Vout.

X−Y記録計19は、出力補正部18で補正さ
れた出力VoutをY軸信号として入力する一方、
スライド基台14のX軸方向の移動に連動するリ
ニアー・ポテンシヨメータ20の出力をX軸信号
として入力し、それぞれを第4図のX軸とY軸に
とることにより図示の如き出力特性のグラフを得
る。
The X-Y recorder 19 inputs the output Vout corrected by the output correction section 18 as a Y-axis signal, while
By inputting the output of the linear potentiometer 20 that is linked to the movement of the slide base 14 in the X-axis direction as an X-axis signal, and taking these as the X-axis and Y-axis in FIG. 4, the output characteristics as shown in the figure can be obtained. Get the graph.

X軸信号(スライド基台14の移動量に対応す
る)は、前記のリニアー・ポテンシヨメータ20
に限らず、リニアー・エンコーダ、ロータリー・
エンコーダ等を用いて発生させるようにしてもよ
い。
The X-axis signal (corresponding to the amount of movement of the slide base 14) is transmitted from the linear potentiometer 20 described above.
Not limited to linear encoders, rotary encoders,
It may also be generated using an encoder or the like.

この測定系のようにスキマ幅ΔZが微小である
ときには、近似的にsin2πΔZ/2πΔZ=1の関係式が
成 り立つので、前記の(1)式は一般に Vout=K1(ΔZ)2 ……(2) ただしK1;定数 と置き換えることができる。
When the gap width ΔZ is minute as in this measurement system, the relational expression sin2πΔZ/2πΔZ=1 holds approximately, so the above equation (1) is generally Vout=K 1 (ΔZ) 2 ...(2 ) However, K 1 ; can be replaced with a constant.

ところがロツクインアンプ17に入力される電
気信号は、光電子増倍管4およびプリアンプ16
の応答速度を下げることにより、そのパルス幅を
スキマ幅ΔZと関係なく一定にすることができる
ので、このような条件のもとでは、前記(2)式は、 Vout=K2ΔZ ……(3) ただしK2;定数 と置き換えられる。すなわちロツクインアンプ1
7の出力Vout(実際は出力補正部18より取出さ
れる出力)より前記スキマ幅ΔZを測定すること
ができる。
However, the electrical signal input to the lock-in amplifier 17 is transmitted through the photomultiplier tube 4 and the preamplifier 16.
By lowering the response speed of , the pulse width can be made constant regardless of the clearance width ΔZ, so under these conditions, the above equation (2) becomes Vout=K 2 ΔZ ……( 3) However, K 2 ; can be replaced with a constant. In other words, lock-in amplifier 1
The gap width ΔZ can be measured from the output Vout of No. 7 (actually, the output taken out from the output correction section 18).

なお、走査光としては、実施例のようにレーザ
ー光を採用すれば、測定精度のうえで有利ではあ
るが、必ずしもこのようなコヒーレント光に限ら
ないことは云うまでもない。
It should be noted that if a laser beam is used as the scanning light as in the embodiment, it is advantageous in terms of measurement accuracy, but it goes without saying that the scanning light is not necessarily limited to such coherent light.

この発明は以上のように、基準ゲージに対する
被測定物外径面の対接部のスキマ幅を、その軸方
向(X軸方向)の全域に亘つて測定することによ
り、例えば円筒ころ、円すいころ等に施されたク
ラウニング形状をきわめて精度よく測定すること
が可能となり、従来の拡大投影法のように、個人
差により測定精度にバラツキが生じたり、拡大率
の制約による精度の限界が生ずるというような不
都合が皆無となる。
As described above, the present invention measures the clearance width of the contact portion of the outer diameter surface of the object to be measured with respect to the reference gauge over the entire area in the axial direction (X-axis direction). It is now possible to measure crowning shapes applied to objects etc. with extremely high accuracy, and unlike conventional magnification projection methods, measurement accuracy may vary due to individual differences, or there may be limits to accuracy due to restrictions on magnification. There will be no inconvenience.

また対接部のスキマを透過した光の光電変換に
光電子増倍管を用い、検波処理にロツクインアン
プを採用しているので、測定精度の一層の向上を
はかることができる。
In addition, a photomultiplier tube is used for photoelectric conversion of the light transmitted through the gap between the opposing parts, and a lock-in amplifier is used for detection processing, making it possible to further improve measurement accuracy.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は実施例の系統図、第2図a,bは対接
部を拡大して示す正面図と側面図、第3図は光電
変換して得られる電気信号の波形図、第4図は測
定結果を例示するグラフである。 1……円筒ころ(被測定物)、2……基準ゲー
ジ、3……受光系、4……光電子増倍管、5……
He−Neガスレーザー、9……振動ミラー、14
……スライド基台、17……ロツクインアンプ、
18……出力補正部、19……X−Y記録計、2
0……リニアー・ポテンシヨメータ、21……被
測定物取付台、ΔZ……対接部のスキマ幅。
Fig. 1 is a system diagram of the embodiment, Fig. 2 a and b are front and side views showing enlarged contact parts, Fig. 3 is a waveform diagram of the electrical signal obtained by photoelectric conversion, Fig. 4 is a graph illustrating measurement results. 1... Cylindrical roller (object to be measured), 2... Reference gauge, 3... Light receiving system, 4... Photomultiplier tube, 5...
He-Ne gas laser, 9... vibrating mirror, 14
...Slide base, 17...Lock-in amplifier,
18...Output correction section, 19...X-Y recorder, 2
0... Linear potentiometer, 21... Measured object mounting base, ΔZ... Clearance width of opposing part.

Claims (1)

【特許請求の範囲】 1 被測定物取付台と、被測定物取付台に取付け
られた被測定物の外形面に対接させかつ端縁が前
記被測定物との対接方向に直交する向きに延びる
直線縁に形成された基準ゲージと、スポツト光を
照射する投光手段と、被測定と基準ゲージとの対
接部を前記スポツト光でその対接方向に所定周期
で走査する光走査手段と、光走査位置を前記走査
方向に直交する向きに順次移動させる光走査位置
変更手段と、前記対接部を透過した光を受光して
光電変換する光電子増倍管と、光電子増倍管が出
力する電気信号を受けてそのフーリエ級数成分の
うちの所定高調波成分を検波して出力するロツク
インアンプと、ロツクインアンプの出力を対接部
の各光走査位置に対応させて読みとる測定値記録
手段とを備えた光学的形状測定装置。 2 被測定物がその外形にクラウニングを施され
た円筒ころ、円すいころ等の回転体である特許請
求の範囲1記載の光学的形状測定装置。 3 基準ゲージの前記直線縁がナイフエツジ状に
形成されている特許請求の範囲1または2に記載
の光学的形状測定装置。 4 光走査位置変更手段が、前記走査方向に直交
する向きに被測定物と基準ゲージとを同時に移動
させる特許請求の範囲1から3のいずれか1つに
記載の光学的形状測定装置。
[Scope of Claims] 1. An object to be measured mount, and an orientation in which the edge thereof is orthogonal to the direction of contact with the object to be measured, and the edge thereof is in contact with the outer surface of the object to be measured attached to the mount to be measured. a reference gauge formed on a straight edge extending to the reference gauge, a light projecting means for irradiating spot light, and a light scanning means for scanning the contact portion between the object to be measured and the reference gauge with the spot light in the direction of the contact at a predetermined period. a light scanning position changing means for sequentially moving the light scanning position in a direction perpendicular to the scanning direction; a photomultiplier tube that receives and photoelectrically converts the light transmitted through the contact portion; A lock-in amplifier that receives an output electrical signal, detects and outputs a predetermined harmonic component of its Fourier series component, and a measurement value that reads the output of the lock-in amplifier in correspondence to each optical scanning position of the contact part. An optical shape measuring device comprising a recording means. 2. The optical shape measuring device according to claim 1, wherein the object to be measured is a rotating body such as a cylindrical roller or a tapered roller whose outer shape is crowned. 3. The optical shape measuring device according to claim 1 or 2, wherein the straight edge of the reference gauge is formed in a knife edge shape. 4. The optical shape measuring device according to claim 1, wherein the optical scanning position changing means moves the object to be measured and the reference gauge simultaneously in a direction perpendicular to the scanning direction.
JP13167283A 1983-07-18 1983-07-18 Optical device for measuring shape Granted JPS6022614A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13167283A JPS6022614A (en) 1983-07-18 1983-07-18 Optical device for measuring shape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13167283A JPS6022614A (en) 1983-07-18 1983-07-18 Optical device for measuring shape

Publications (2)

Publication Number Publication Date
JPS6022614A JPS6022614A (en) 1985-02-05
JPH0242403B2 true JPH0242403B2 (en) 1990-09-21

Family

ID=15063524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13167283A Granted JPS6022614A (en) 1983-07-18 1983-07-18 Optical device for measuring shape

Country Status (1)

Country Link
JP (1) JPS6022614A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08191005A (en) * 1995-01-10 1996-07-23 Rohm Co Ltd Chip type variable resistor

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6287805A (en) * 1985-10-14 1987-04-22 Mitsutoyo Mfg Corp Apparatus for measuring shape or round-shaft like member
JPS6332308A (en) * 1986-07-25 1988-02-12 Mitsutoyo Corp Method and device for measuring noncontact shape of crank shaft
JPH0833292B2 (en) * 1991-08-31 1996-03-29 バンドー化学株式会社 Cleaning blade ridge line inspection device
JP3540648B2 (en) * 1999-01-19 2004-07-07 シャープ株式会社 Gap measuring device used for plasma reactor
JP5079562B2 (en) * 2008-03-24 2012-11-21 株式会社ハーモニック・ドライブ・システムズ Contour shape measurement method
DE102008060621B3 (en) 2008-12-05 2010-08-12 Carl Zeiss Ag Optical arrangement for the contactless measurement or testing of a body surface
GB2507828B (en) 2013-02-04 2015-05-13 Messier Dowty Ltd Deformation Detection Tool & Method for Detecting Deformation
CN111811439B (en) * 2020-05-13 2022-03-08 河北省计量监督检测研究院廊坊分院 Method for automatically measuring straightness of working edge of knife edge-shaped ruler

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08191005A (en) * 1995-01-10 1996-07-23 Rohm Co Ltd Chip type variable resistor

Also Published As

Publication number Publication date
JPS6022614A (en) 1985-02-05

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